JPH0584867B2 - - Google Patents
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- Publication number
- JPH0584867B2 JPH0584867B2 JP61232885A JP23288586A JPH0584867B2 JP H0584867 B2 JPH0584867 B2 JP H0584867B2 JP 61232885 A JP61232885 A JP 61232885A JP 23288586 A JP23288586 A JP 23288586A JP H0584867 B2 JPH0584867 B2 JP H0584867B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- fluid
- resistor
- measured
- heat generating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P5/00—Measuring speed of fluids, e.g. of air stream; Measuring speed of bodies relative to fluids, e.g. of ship, of aircraft
- G01P5/10—Measuring speed of fluids, e.g. of air stream; Measuring speed of bodies relative to fluids, e.g. of ship, of aircraft by measuring thermal variables
Landscapes
- Engineering & Computer Science (AREA)
- Aviation & Aerospace Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Indicating Or Recording The Presence, Absence, Or Direction Of Movement (AREA)
- Measuring Volume Flow (AREA)
Description
〈産業上の利用分野〉
本発明は、流体の流れの二次元的な方向と流速
を検出することのできるフローセンサに関する。
〈従来の技術とその問題点〉
従来より提唱されている熱式で方向検知可能な
フローセンサとしては特開昭60−247169号に記載
されている半導体式流速検出器がある。このフロ
ーセンサは基板にシリコンを使用しているため、
熱の伝導が非常に良く、気体の流れによつて生じ
るチツプ内の温度差は1/100〜1/10℃程度である
(電子材料、1983年12月号、p38〜43)。したがつ
て、この温度差を正確に求めるには感度の高い測
温トランジスタを2個1組としてブリツジに組
み、平衡状態からのずれで検出するしかない。シ
リコンフローセンサの検出回路例を第2図に示
す。このフローセンサは、シリコンプロセス技術
を利用しているので量産性に優れるが、反面素子
間の温度特性のバラツキが大きく、また発熱温度
を高く設定することができないなどの欠点を有し
ている。
〈発明の目的〉
本発明は上述の欠点を解消するためになされた
ものであり、半導体プロセスを利用して量産性及
び均質性に優れ、かつ高温においても安定した動
作が得られるフローセンサを提供することを目的
とするものである。
〈発明の概要〉
本発明は熱絶縁基板の中央に発熱用抵抗体とこ
の発熱用抵抗体を挾んで両側の対称な位置に温度
測定用抵抗体を設置したフローセンサにおいて発
熱用抵抗体の温度が流体の温度よりも一定温度高
く保持されるように制御し、流体の流速に応じて
変化する発熱用抵抗体に流れる電流又はその電流
に対応して変化する電位もしくは電圧により流体
の流速を検出すると同時に2個の温度測定用抵抗
体間に生じる温度差を電流差あるいは電圧差とし
て検知し、流れ方向を検出するものである。
本発明は、熱伝導率が2w/mk以下の熱絶縁基
板例えばガラス基板を利用することにより、チツ
プ内の温度差を十分に大きくすることができ、流
体の流れによつて生じるチツプ内の発熱抵抗体を
挾んだ対称な位置の温度差を大きくすることがで
きるという特徴を持つている。ガラスはシリコン
に比べ熱伝導率が1/130と十分に小さいため、温
度勾配を小チツプ内で十分に大きくすることがで
きるが、このことをモデルによつて説明する。
第3図に示したような細い丸棒またはフインに
そつて熱が定常的に伝る場合について考える。フ
インのつけ根の温度をT1,xだけ離れた点にお
ける温度をT、周囲の温度をT0とする。熱は対
流によつてフインの表面から移動すること、また
単位面積当り失われる熱流束は次式で与えられる
と仮定する。
q=h(T−T0) ……(1)
さらに簡単にするために、局所的な伝熱係数h
はフインの全表面にわたつて一定であると仮定す
る。フインの断面積をa、周囲の長さをpとす
る。断面での温度変化は無視する。すなわちT=
f(x)と仮定する。
第3図において、長さdxの要素を考える。こ
の場合
熱伝導により失われる熱量=(dQ/dx)dx
=−ak(d2T/dx2)dx
対流によつて表面から失われる熱量=h(T−
T0)pdx
熱収支から akd2T/dx2dx−h(T−T0)pdx=
0
またはd2T/dx2−hp/ak(T−T0)=0 ……(2)
であるから、θ=T−T0を代入すれば、式(2)は
d2θ/dx2−λ2θ=0 ……(3)
となる。ここでλ=√である。
式(3)の解は
θ=Acosh〓x+Bsinh〓x ……(4)
となる。境界条件は
x=0でθ=θ1∴A=θ1
x=Lでd〓/dx=0(フインの端から熱は逃げ
ないとする)
であるから〓Asinh〓L+〓Bcosh〓L=0
したがつてB=−θ1sinh〓L/cosh〓L
となるから、温度分布は次式で与えられる。
<Industrial Application Field> The present invention relates to a flow sensor that can detect the two-dimensional direction and flow velocity of fluid flow. <Prior Art and its Problems> As a conventionally proposed thermal type flow sensor capable of detecting direction, there is a semiconductor type flow velocity detector described in Japanese Patent Application Laid-Open No. 60-247169. This flow sensor uses silicon for the substrate, so
Heat conduction is very good, and the temperature difference within the chip caused by the gas flow is about 1/100 to 1/10 degrees Celsius (Electronic Materials, December 1983 issue, p. 38-43). Therefore, the only way to accurately determine this temperature difference is to assemble pairs of highly sensitive temperature measuring transistors in a bridge and detect deviations from the equilibrium state. An example of a detection circuit for a silicon flow sensor is shown in FIG. This flow sensor uses silicon process technology and is therefore excellent in mass production. However, it has drawbacks such as large variations in temperature characteristics between elements and the inability to set a high heat generation temperature. <Object of the Invention> The present invention has been made in order to eliminate the above-mentioned drawbacks, and provides a flow sensor that utilizes a semiconductor process, has excellent mass productivity and homogeneity, and is capable of stable operation even at high temperatures. The purpose is to <Summary of the Invention> The present invention provides a flow sensor in which a heat-generating resistor is placed in the center of a thermally insulated substrate and temperature-measuring resistors are installed at symmetrical positions on both sides of the heat-generating resistor. The flow rate of the fluid is controlled so that it is maintained at a constant temperature higher than the temperature of the fluid, and the flow rate of the fluid is detected by the current flowing through the heating resistor, which changes according to the flow rate of the fluid, or the electric potential or voltage, which changes in response to the current. At the same time, the temperature difference generated between the two temperature measuring resistors is detected as a current difference or a voltage difference, and the flow direction is detected. The present invention makes it possible to sufficiently increase the temperature difference within the chip by using a thermally insulating substrate, such as a glass substrate, with a thermal conductivity of 2w/mk or less. It has the feature of being able to increase the temperature difference between symmetrical positions that sandwich the resistor. Since glass has a sufficiently low thermal conductivity of 1/130 compared to silicon, it is possible to make the temperature gradient sufficiently large within a small chip, but this will be explained using a model. Consider the case where heat is constantly transmitted along a thin round rod or fin as shown in Figure 3. Let T 1 be the temperature at the base of the fin, T be the temperature at a point x apart, and T 0 be the ambient temperature. Assume that heat moves from the surface of the fins by convection, and that the heat flux lost per unit area is given by the following equation: q=h(T-T 0 )...(1) For further simplification, the local heat transfer coefficient h
is assumed to be constant over the entire surface of the fin. Let the cross-sectional area of the fin be a and the circumference length be p. Temperature changes in the cross section are ignored. That is, T=
Assume that f(x). In FIG. 3, consider an element of length dx. In this case, the amount of heat lost by conduction = (dQ/dx) dx = -ak (d 2 T/dx 2 ) dx The amount of heat lost from the surface by convection = h (T-
T 0 ) pdx From the heat balance, akd 2 T/dx 2 dx−h(T−T 0 )pdx=0 or d 2 T/dx 2 −hp/ak(T−T 0 )=0 ……(2) Therefore, by substituting θ=T−T 0 , equation (2) becomes d 2 θ/dx 2 −λ 2 θ=0 (3). Here λ=√. The solution to equation (3) is θ=Acosh〓x+Bsinh〓x...(4). The boundary conditions are x=0 and θ=θ 1 ∴A=θ 1 x=L and d〓/dx=0 (assuming that heat does not escape from the edge of the fin), so〓Asinh〓L+〓Bcosh〓L= 0 Therefore, since B=-θ 1 sinh〓L/cosh〓L, the temperature distribution is given by the following equation.
【化】
第3図の具体的な形状を第4図に示し、材質の
差による違いについてガラス(熱伝導率:
1.10wm-1k-1)、シリコン(熱伝導率:148wm-1
k-1)を例として計算した結果を第5図に示す。
第5図では、フインのつけ根の温度T1=100℃、
周囲の温度T0=25℃、伝熱係数h=10kcal/
(hr・m2・deg)として計算を行なつている。第
5図からわかるように、基板にガラスなど熱絶縁
物を使用することによつて、十分に大きな温度差
を小チツプ内で作ることができ、流体の流れによ
つて生じるチツプ内の発熱用抵抗体を挾んだ対称
な位置の温度差を大きく設定することができる。
また、発熱用抵抗体、発熱用抵抗体温度モニタ
ー、温度測定用抵抗体に用いる材料のうち、例え
ば白金等の貴金属類はガラスとの密着性がやや弱
く、信頼性という点で問題があるが、ガラス上に
アルミナをコーテイングした基板を使用すれば、
基板と発熱用抵抗体、発熱用抵抗体温度モニタ
ー、温度測定用抵抗体との間に充分強い密着力を
付与することができる。
以上の如く本発明は、発熱用抵抗体、発熱用抵
抗体温度モニター、温度測定用抵抗体とを同一素
子内に一体化した信頼性の高いフローセンサを提
供することを目的とするものである。
〈実施例〉
第1図A,Bは本発明の1実施例を示すフロー
センサの模式平面及び断面図である。ガラス基板
1の上にアルミナ薄膜2を真空蒸着法、スパツタ
リング法、プラズマCVD法等の薄膜生成技術を
適宜利用して堆積させる。アルミナ薄膜2上に例
えば白金等の抵抗温度係数の大きな金属薄膜を同
様に真空蒸着法、スパツタリング法あるいはプラ
ズマCVD法等により堆積された後、エツチング
技術によりパターン化し、発熱用抵抗体3a、発
熱用抵抗体温度モニター3b及び1対の温度測定
用抵抗体4a,4bを適宜の距離だけ隔てて配置
し第1図Aの如くとする。温度測定用抵抗体4
a,4bは発熱用抵抗体3aに対して左右対称の
位置に置かれている。次に発熱用抵抗体3aと発
熱用抵抗体温度モニター3b及び温度測定用抵抗
体4a,4bを1組としてガラス基板1を切断
し、個々のセンサ素子とする。得られたセンサ素
子はガラス基板1に発熱用抵抗体3aと発熱用抵
抗体温度モニター3b、温度測定用抵抗体4a,
4bが配置された構造となる。またその大きさは
数ミリ程度と微小であり、一枚の基板上に多数個
並べて同時に作製するいわゆるウエハー処理を行
なうことにより、特性の均一なセンサ素子を量産
することができる。得られたセンサ素子を支持台
(図示せず)に接着し、発熱用抵抗体3a、発熱
用抵抗体温度モニター3b及び温度測定用抵抗体
4a,4bのリード接続を行ない本実施例のフロ
ーセンサとする。
なお、金属薄膜の材料としては、白金以外に抵
抗温度係数が大きいニツケル若しくはニツケル合
金あるいは金属薄膜の代わりにサーミスタ等の感
温抵抗体材料を用いてもよい。
このようにして作製した発熱用抵抗体3a、発
熱用抵抗体温度モニター3b、温度測定用抵抗体
4a,4bを用いたフローセンサの模式回路構成
図を第6図に示す。流体が通過す流路(図示せ
ず)内に上記製法により作製された発熱用抵抗体
3a、発熱用抵抗体温度モニター3b、温度測定
用抵抗体4a,4bおよび流体温度補償用抵抗体
5が設置されることとなる。流体温度補償用抵抗
体5および発熱用抵抗体温度モニター3bはそれ
ぞれ他の電気抵抗体6,7と連結されてブリツジ
Aを構成している。流体温度補償用抵抗体5と発
熱用抵抗体温度モニター3bの中間接続点はアー
スされている。これらのブリツジAはブリツジ抵
抗の差電圧を増幅器8で差動増幅し、スイツチン
グ用トランジスタ9のベース電位を制御してトラ
ンジスタ9を駆動するフイードバツク回路に接続
され、発熱用抵抗体3aの電圧を制御している。
温度測定用抵抗体4a,4bはそれぞれ他の定電
流源10,11と連結されてブリツジBを構成し
ている。温度測定用抵抗体4a,4bの中間接続
点はアースされている。
第7図は流速vfに応じて変化する発熱用抵抗体
3aの電圧Vhの流速−出力特性である。ブリツ
ジAにおいて、発熱用抵抗体3aは流体の温度よ
りも一定温度高い状態に電気抵抗体12により保
たれる。流体の速度が早い場合、発熱用抵抗体3
aから多量の熱が奪われる。逆に流体の速度が遅
い場合、発熱用抵抗体3aから奪われる熱量も少
ない。従つて、流体温度補償用抵抗体5で流体の
温度を測定し流体温度と発熱用抵抗体3aの温度
差を一定に保つようにフイードバツク回路を介
し、発熱用抵抗体3aに流す電流値を制御し、流
体の流速(流量)に対応した電流(電圧)値を求
める。
第8図は、流体の流れ方向θと温度測定用抵抗
体4a,4b間の温度差の関係をブリツジ回路B
による電圧差として求めたものである。ブリツジ
回路Bにおいて、温度測定用抵抗体4a,4bは
それぞれ定電流源10,11と連結していて、流
体の流れ方向変化によつて生じる基板内の温度分
布の変化を電圧変化に変換し、電圧差として出力
VDを求める。
本実施例では発熱用抵抗体温度モニター3bと
流体温度補償用抵抗体5を用いたブリツジ回路に
より流体の流速を求めているが、発熱用抵抗体温
度モニター3bを省略し、発熱用抵抗体3aと流
体温度補償用抵抗体5を用いたブリツジ回路によ
り流体の流速を求める構成にしてもよい。
〈発明の効果〉
以上のように本発明のフローセンサは、熱伝導
率が2w/m・k以下の熱絶縁可能な材質の基板
の被測定流体に接する面上の中央付近にパターン
化されて形成された金属薄膜よりなる発熱用抵抗
体と、該発熱用抵抗体を挟んで両側のほぼ対称の
位置の上記基板の被測定流体に接する面上にパタ
ーン化されて形成された金属薄膜よりなる温度測
定用抵抗体とを備え、上記発熱用抵抗体の温度を
被測定流体の温度よりも所定の温度だけ高く保持
するに必要なエネルギーを検出することによつて
被測定流体の流速を検出するとともに、このとき
に上記温度測定用抵抗体間に生じる温度差を検出
することによつて被測定流体の流れ方向を検出す
るように構成しているため、十分に大きな温度差
を小チツプ内で作ることができ、その結果流体の
流れ方向の検出を従来に比してより小さいセンサ
チツプ内で精度良く行うことができる。[C] The specific shape of Figure 3 is shown in Figure 4.
1.10wm -1 k -1 ), silicon (thermal conductivity: 148wm -1
Figure 5 shows the results of calculations using the case (k -1 ) as an example.
In Figure 5, the temperature at the base of the fin is T 1 = 100℃,
Ambient temperature T 0 = 25℃, heat transfer coefficient h = 10kcal/
The calculation is performed as (hr・m 2・deg). As can be seen from Figure 5, by using a thermal insulator such as glass for the substrate, a sufficiently large temperature difference can be created within a small chip, and the heat generated within the chip due to the flow of fluid can be reduced. It is possible to set a large temperature difference between symmetrical positions across the resistor. Furthermore, among the materials used for heat generating resistors, heat generating resistor temperature monitors, and temperature measuring resistors, noble metals such as platinum have somewhat weak adhesion to glass, which poses problems in terms of reliability. If you use a glass substrate coated with alumina,
Sufficiently strong adhesion can be provided between the substrate and the heat generating resistor, the heat generating resistor temperature monitor, and the temperature measuring resistor. As described above, an object of the present invention is to provide a highly reliable flow sensor in which a heat generating resistor, a heat generating resistor temperature monitor, and a temperature measuring resistor are integrated into the same element. . <Example> FIGS. 1A and 1B are a schematic plan view and a cross-sectional view of a flow sensor showing an example of the present invention. An alumina thin film 2 is deposited on a glass substrate 1 by appropriately using a thin film forming technique such as a vacuum evaporation method, a sputtering method, or a plasma CVD method. A metal thin film having a large temperature coefficient of resistance, such as platinum, is similarly deposited on the alumina thin film 2 by vacuum evaporation, sputtering, plasma CVD, etc., and then patterned by etching technology to form a heat generating resistor 3a, a heat generating resistor 3a, etc. A resistor temperature monitor 3b and a pair of temperature measuring resistors 4a, 4b are arranged at an appropriate distance apart, as shown in FIG. 1A. Temperature measurement resistor 4
a and 4b are placed in symmetrical positions with respect to the heating resistor 3a. Next, the glass substrate 1 is cut into a set of the heating resistor 3a, the heating resistor temperature monitor 3b, and the temperature measuring resistors 4a and 4b to form individual sensor elements. The obtained sensor element has a glass substrate 1, a heat generating resistor 3a, a heat generating resistor temperature monitor 3b, a temperature measuring resistor 4a,
4b is arranged. Moreover, the size of the sensor elements is minute, on the order of several millimeters, and sensor elements with uniform characteristics can be mass-produced by performing so-called wafer processing, in which a large number of sensor elements are simultaneously fabricated on one substrate. The obtained sensor element is adhered to a support stand (not shown), and the leads of the heat generating resistor 3a, the heat generating resistor temperature monitor 3b, and the temperature measuring resistors 4a and 4b are connected to form the flow sensor of this embodiment. shall be. As the material for the metal thin film, nickel or a nickel alloy having a large resistance temperature coefficient other than platinum, or a temperature-sensitive resistor material such as a thermistor may be used instead of the metal thin film. FIG. 6 shows a schematic circuit diagram of a flow sensor using the heat generating resistor 3a, the heat generating resistor temperature monitor 3b, and the temperature measuring resistors 4a and 4b manufactured in this way. A heat generating resistor 3a, a heat generating resistor temperature monitor 3b, temperature measuring resistors 4a and 4b, and a fluid temperature compensating resistor 5 manufactured by the above manufacturing method are placed in a flow path (not shown) through which the fluid passes. It will be installed. The fluid temperature compensating resistor 5 and the heat generating resistor temperature monitor 3b are connected to other electrical resistors 6 and 7, respectively, to form a bridge A. An intermediate connection point between the fluid temperature compensating resistor 5 and the heat generating resistor temperature monitor 3b is grounded. These bridges A are connected to a feedback circuit that differentially amplifies the voltage difference between the bridge resistors with an amplifier 8, controls the base potential of the switching transistor 9, and drives the transistor 9, and controls the voltage of the heating resistor 3a. are doing.
The temperature measuring resistors 4a and 4b are connected to other constant current sources 10 and 11, respectively, to form a bridge B. An intermediate connection point between the temperature measuring resistors 4a and 4b is grounded. FIG. 7 shows the flow velocity-output characteristic of the voltage V h of the heating resistor 3a which changes depending on the flow velocity v f . In the bridge A, the heating resistor 3a is maintained at a constant temperature higher than the temperature of the fluid by the electric resistor 12. If the fluid velocity is high, heat generating resistor 3
A large amount of heat is removed from a. Conversely, when the velocity of the fluid is slow, the amount of heat taken away from the heat generating resistor 3a is also small. Therefore, the temperature of the fluid is measured by the fluid temperature compensating resistor 5, and the current value flowing through the heat generating resistor 3a is controlled via the feedback circuit so as to keep the temperature difference between the fluid temperature and the heat generating resistor 3a constant. Then, find the current (voltage) value corresponding to the fluid flow rate (flow rate). FIG. 8 shows the relationship between the fluid flow direction θ and the temperature difference between the temperature measuring resistors 4a and 4b in the bridge circuit B.
It is calculated as the voltage difference due to . In the bridge circuit B, the temperature measuring resistors 4a and 4b are connected to constant current sources 10 and 11, respectively, and convert changes in the temperature distribution within the substrate caused by changes in the flow direction of the fluid into voltage changes, Output as voltage difference
Find V D. In this embodiment, the flow velocity of the fluid is determined by a bridge circuit using a heat generating resistor temperature monitor 3b and a fluid temperature compensating resistor 5, but the heat generating resistor temperature monitor 3b is omitted and the heat generating resistor 3a is omitted. The fluid flow velocity may be determined by a bridge circuit using a fluid temperature compensating resistor 5 and a fluid temperature compensating resistor 5. <Effects of the Invention> As described above, the flow sensor of the present invention has a pattern near the center of the surface in contact with the fluid to be measured of the substrate made of a thermally insulating material with a thermal conductivity of 2 w/m·k or less. A heating resistor made of a formed metal thin film, and a patterned metal thin film formed on the surface of the substrate in contact with the fluid to be measured at substantially symmetrical positions on both sides of the heating resistor. and a temperature measuring resistor, and detects the flow velocity of the fluid to be measured by detecting the energy necessary to maintain the temperature of the heat generating resistor higher than the temperature of the fluid to be measured by a predetermined temperature. At the same time, the flow direction of the fluid to be measured is detected by detecting the temperature difference that occurs between the temperature measurement resistors at this time, so a sufficiently large temperature difference can be detected within the small chip. As a result, the direction of fluid flow can be detected with high precision within a smaller sensor chip than in the past.
第1図は本発明の1実施例を示すフローセンサ
の模式平面図及び断面図である。第2図は従来の
シリコンフローセンサの検出回路図である。第3
図及び第4図は熱式フローセンサの原理説明に供
する説明図である。第5図は第4図における各部
位の温度を計算によつて求めた結果を示す説明図
である。第6図は第1図に示すフローセンサの模
式回路構成図である。第7図は第1図に示すフロ
ーセンサの流速対出力特性図である。第8図は流
体の流れ方向を電圧差として求めた特性図であ
る。
1……ガラス基板、2……アルミナ薄膜、3a
……発熱用抵抗体、3b……発熱用抵抗体温度モ
ニター、4a,4b……温度測定用抵抗体。
FIG. 1 is a schematic plan view and a sectional view of a flow sensor showing one embodiment of the present invention. FIG. 2 is a detection circuit diagram of a conventional silicon flow sensor. Third
4 and 4 are explanatory diagrams for explaining the principle of the thermal flow sensor. FIG. 5 is an explanatory diagram showing the results of calculating the temperature of each part in FIG. 4. FIG. 6 is a schematic circuit diagram of the flow sensor shown in FIG. 1. FIG. 7 is a flow rate vs. output characteristic diagram of the flow sensor shown in FIG. 1. FIG. 8 is a characteristic diagram obtained by determining the fluid flow direction as a voltage difference. 1...Glass substrate, 2...Alumina thin film, 3a
...Heating resistor, 3b...Heating resistor temperature monitor, 4a, 4b...Resistor for temperature measurement.
Claims (1)
材質の基板と、 該基板の被測定流体に接する面上の中央付近に
パターン化されて形成された金属薄膜よりなる発
熱用抵抗体と、 該発熱用抵抗体を挟んで両側のほぼ対称の位置
の上記基板の被測定流体に接する面上にパターン
化されて形成された金属薄膜よりなる温度測定用
抵抗体とを備え、 上記発熱用抵抗体の温度を被測定流体の温度よ
りも所定の温度だけ高く保持するに必要なエネル
ギーを検出することによつて被測定流体の流速を
検出するとともに、このときに上記温度測定用抵
抗体間に生じる温度差を検出することによつて被
測定流体の流れ方向を検出することを特徴とする
フローセンサ。[Claims] 1. A substrate made of a thermally insulating material with a thermal conductivity of 2 w/m·k or less, and a metal thin film formed in a pattern near the center of the surface of the substrate that is in contact with the fluid to be measured. a temperature measuring resistor comprising a metal thin film formed in a pattern on the surface of the substrate in contact with the fluid to be measured at substantially symmetrical positions on both sides of the heating resistor; Detecting the flow velocity of the fluid to be measured by detecting the energy necessary to maintain the temperature of the heating resistor higher than the temperature of the fluid to be measured by a predetermined temperature, and at this time, A flow sensor characterized in that a flow direction of a fluid to be measured is detected by detecting a temperature difference occurring between the temperature measuring resistors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61232885A JPS6385364A (en) | 1986-09-29 | 1986-09-29 | Flow velocity detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61232885A JPS6385364A (en) | 1986-09-29 | 1986-09-29 | Flow velocity detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6385364A JPS6385364A (en) | 1988-04-15 |
| JPH0584867B2 true JPH0584867B2 (en) | 1993-12-03 |
Family
ID=16946366
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61232885A Granted JPS6385364A (en) | 1986-09-29 | 1986-09-29 | Flow velocity detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6385364A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04240566A (en) * | 1991-01-24 | 1992-08-27 | Anritsu Corp | Flow rate direction sensor |
| JP3175887B2 (en) | 1992-10-27 | 2001-06-11 | 株式会社半導体エネルギー研究所 | measuring device |
| JPH06281666A (en) * | 1993-03-26 | 1994-10-07 | Takuwa:Kk | Method and device for measuring flow direction of fluid |
| DE19509555B4 (en) * | 1995-03-16 | 2006-01-19 | Robert Bosch Gmbh | flow sensor |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3485381D1 (en) * | 1983-05-18 | 1992-02-06 | Bronkhorst High Tech Bv | FLOW MEASURING DEVICE. |
| JPS60131466A (en) * | 1983-12-20 | 1985-07-13 | Toshiba Corp | Semiconductor flow rate detector |
-
1986
- 1986-09-29 JP JP61232885A patent/JPS6385364A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6385364A (en) | 1988-04-15 |
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