JPH0593625A - Optical displacement gage - Google Patents

Optical displacement gage

Info

Publication number
JPH0593625A
JPH0593625A JP3282066A JP28206691A JPH0593625A JP H0593625 A JPH0593625 A JP H0593625A JP 3282066 A JP3282066 A JP 3282066A JP 28206691 A JP28206691 A JP 28206691A JP H0593625 A JPH0593625 A JP H0593625A
Authority
JP
Japan
Prior art keywords
circuit
light beam
signal
light
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3282066A
Other languages
Japanese (ja)
Other versions
JP2505332B2 (en
Inventor
Yuuji Yunaka
裕士 柚中
Mamoru Kuwajima
守 桑島
Osamu Nara
治 奈良
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Original Assignee
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp, Mitsutoyo Kiko Co Ltd filed Critical Mitutoyo Corp
Priority to JP3282066A priority Critical patent/JP2505332B2/en
Publication of JPH0593625A publication Critical patent/JPH0593625A/en
Application granted granted Critical
Publication of JP2505332B2 publication Critical patent/JP2505332B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To make it possible to perform high-speed measurement by limiting the emitting time of the optical beam from a processing circuit, which integrates the detected signals when the scanning speed of the optical beam is approximately constant and generates a center-of-gravity signal, to only an integrating section. CONSTITUTION:A processing circuit 50 has an oscillator 22, a laser driving circuit 24, amplifiers 54c and 54d, synchronous detectors 56c and 56d, an integration timing circuit 66 and the like. The circuit 24 is turned ON and OFF not with the pulse modulating signal outputted from the oscillator 22 but with an integration timing signal (f) outputted from the circuit 66. Thus, the emitting time of a laser beam 14 is limited to only an integrating section. At the same time, the detection timings of the detectors 56c and 56d are changed with the ON/OFF of the circuit 24. Furthermore, integrating circuits 64c and 64d and sample/hold circuits 68c and 68d are provided at the front stage of a subtractor 58, an adder 60 and divider 62. Since the emitting time of the optical beam is limited to only in the integrating section of the detected signals, the high-speed measurement can be performed without using expensive special electric parts.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、光学式変位計に係り、
特に、遠隔物体の厚さや変位等を三角測量方式により非
接触で測定する際に用いるのに好適な、パルス変調され
た光ビームを走査しながら測定面に照射する照明系と、
測定面からの前記光ビームの反射光を集めて結像する受
光レンズと、結像された像の光量分布に対応した検出信
号を生成する光電センサと、前記光ビームの走査速度が
略一定である時の該検出信号を積分して、前記光量分布
の重心位置に対応した重心信号を生成する処理回路とを
含み、該重心信号の変化から測定面の位置又は変位を求
める光学式変位計の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical displacement meter,
In particular, an illumination system that irradiates the measurement surface while scanning a pulse-modulated light beam, which is suitable for non-contact measurement of the thickness and displacement of a remote object by a triangulation method,
A light receiving lens that collects the reflected light of the light beam from the measurement surface to form an image, a photoelectric sensor that generates a detection signal corresponding to the light amount distribution of the formed image, and a scanning speed of the light beam that is substantially constant. A processing circuit that integrates the detection signal at a certain time to generate a center-of-gravity signal corresponding to the center-of-gravity position of the light-quantity distribution, and calculates the position or displacement of the measurement surface from the change of the center-of-gravity signal. Regarding improvement.

【0002】[0002]

【従来の技術】産業界における生産の自動化、ロボット
導入等に伴い、計測のインプロセス化、高速度化、高精
度化が急速に要請されており、赤熱した鉄板の圧延工程
における厚さのインプロセス測定のように、遠隔物体の
厚さや変位等を非接触で測定できる変位計の必要性も大
となっている。
2. Description of the Related Art With the automation of production in the industrial world, introduction of robots, etc., there is a rapid demand for in-process measurement, high speed, and high accuracy. There is also a great need for a displacement meter that can measure the thickness and displacement of a remote object in a non-contact manner like process measurement.

【0003】このような非接触変位計の一例として、出
願人が既に特開昭63−200011で提案したよう
に、図4に示す如く、測定面10にレーザビーム14等
の光ビームを照射して、三角測量方式で位置や変位を検
出する光学式変位計が知られている。
As an example of such a non-contact displacement meter, as previously proposed by the applicant in Japanese Patent Laid-Open No. 63-200011, the measuring surface 10 is irradiated with a light beam such as a laser beam 14 as shown in FIG. As a result, there is known an optical displacement meter that detects a position and a displacement by a triangulation method.

【0004】図4の光学式変位計は、パルス変調された
レーザビーム14を往復走査しながら測定面10に照射
する照明系20と、測定面10からのレーザビームの反
射光を集めて結像面上に結像する受光レンズ40と、結
像された像の光量分布に対応した検出信号c 、d を生成
する光電センサとしての半導体位置検出器(PSD)4
2と、前記レーザビーム14の走査速度が略一定である
時の該検出信号c 、dを積分して、前記光量分布の重心
位置に対応した重心信号e を生成する処理回路50とを
含んで構成されている。
The optical displacement meter shown in FIG. 4 forms an image by collecting an illumination system 20 for irradiating the measurement surface 10 while reciprocally scanning the pulse-modulated laser beam 14 and reflected light of the laser beam from the measurement surface 10. A light receiving lens 40 that forms an image on a surface, and a semiconductor position detector (PSD) 4 as a photoelectric sensor that generates detection signals c 1 and d 2 corresponding to the light amount distribution of the formed image.
2 and a processing circuit 50 that integrates the detection signals c 1 and d 2 when the scanning speed of the laser beam 14 is substantially constant to generate a centroid signal e 2 corresponding to the centroid position of the light amount distribution. It is configured.

【0005】前記照明系20は、例えば、レーザビーム
14をパルス変調するための発振器22と、該発振器2
2出力のパルス変調信号によって周期的にオンオフされ
るレーザ駆動回路24と、該レーザ駆動回路24から出
力されるパルス状のレーザ駆動信号a によって駆動さ
れ、パルス変調されたレーザビーム14を発生する半導
体レーザ26と、該半導体レーザ26から発生されたレ
ーザビーム14を往復走査するための振動ミラー28
と、該振動ミラー28を振動させるための音叉30と、
正弦波状の音叉駆動信号b によって該音叉30を駆動す
るための音叉駆動回路32と、前記振動ミラー28によ
って往復走査されるレーザビーム14を互いに平行なビ
ームとするための投光レンズ34と、から構成されてい
る。
The illumination system 20 includes, for example, an oscillator 22 for pulse-modulating the laser beam 14 and the oscillator 2.
A laser drive circuit 24 that is periodically turned on and off by a two-output pulse modulation signal, and a semiconductor that is driven by a pulsed laser drive signal a output from the laser drive circuit 24 and generates a pulse-modulated laser beam 14. A laser 26 and an oscillating mirror 28 for reciprocally scanning the laser beam 14 generated from the semiconductor laser 26.
And a tuning fork 30 for vibrating the vibrating mirror 28,
From a tuning fork driving circuit 32 for driving the tuning fork 30 by a sinusoidal tuning fork driving signal b, and a projection lens 34 for making the laser beam 14 reciprocally scanned by the vibrating mirror 28 parallel to each other. It is configured.

【0006】又、前記処理回路50は、例えば、前記P
SD42からの検出(電流)信号c、d を、それぞれ電
圧信号に変換するための電流−電圧(I−V)変換器5
2c、52d と、該I−V変換器52c 、52d の出力
を、それぞれ増幅するための増幅器54c 、54d と、
該増幅器54c 、54d の出力を、前記発振器22の出
力と同期して、それぞれ検波することにより、検出信号
c 、d に含まれる直流成分、即ち、外乱光成分を除去す
るための同期検波器56c 、56d と、該同期検波器5
6c 、56d の出力の差及び和を、それぞれ演算する引
算器58及び加算器60と、該引算器58の出力を該加
算器60の出力で割ることによって、PSD42上の光
量分布の重心位置に対応する重心信号e を求めるための
除算器62と、該除算器62の出力を、音叉30による
レーザビーム14の走査速度が略一定である音叉の中立
領域で積分して積分信号g を得るための積分回路64
と、前記音叉駆動回路32及び発振器22の出力に応じ
て、音叉30が中立領域に有り、且つ、レーザビーム1
4が照射されているタイミングでのみ、該積分回路64
をオンとするための積分タイミング信号f を出力する積
分タイミング回路66と、前記積分回路64の出力をサ
ンプリングしてホールドするためのサンプル/ホールド
(S/H)回路68と、該S/H回路68の出力(アナ
ログ信号)をデジタル信号に変換するためのA/D変換
器70と、該A/D変換器70の出力に対して直線性を
補正して測定値として出力するリニア補正器72と、か
ら構成されている。
Further, the processing circuit 50 is, for example, the P
A current-voltage (IV) converter 5 for converting the detection (current) signals c and d from SD42 into voltage signals, respectively.
2c and 52d, and amplifiers 54c and 54d for amplifying the outputs of the IV converters 52c and 52d, respectively.
The output signals of the amplifiers 54c and 54d are detected in synchronism with the output signal of the oscillator 22 to obtain a detection signal.
synchronous detectors 56c and 56d for removing the direct current component contained in c and d, that is, the disturbance light component, and the synchronous detector 5
6c and 56d, the difference and the sum of the outputs are calculated by a subtracter 58 and an adder 60, respectively. By dividing the output of the subtractor 58 by the output of the adder 60, the center of gravity of the light amount distribution on PSD 42 is calculated. The divider 62 for obtaining the center of gravity signal e corresponding to the position, and the output of the divider 62 are integrated in the neutral region of the tuning fork where the scanning speed of the laser beam 14 by the tuning fork 30 is substantially constant to obtain an integrated signal g. Integrating circuit 64 for obtaining
According to the outputs of the tuning fork drive circuit 32 and the oscillator 22, the tuning fork 30 is in the neutral region, and the laser beam 1
4 is emitted only when the integrating circuit 64 is irradiated.
An integration timing circuit 66 for outputting an integration timing signal f for turning on, a sample / hold (S / H) circuit 68 for sampling and holding the output of the integration circuit 64, and the S / H circuit An A / D converter 70 for converting the output (analog signal) of 68 to a digital signal, and a linear corrector 72 for correcting the linearity of the output of the A / D converter 70 and outputting it as a measurement value. It consists of and.

【0007】ここで測定面10が図の上下方向(Z方
向)にZ1 からZ2 へ変位すると、レーザビーム14の
照射点も上下方向に変化し、それに伴って受光レンズ4
0による結像位置の重心がPSD42上を図の左右方向
に移動して、重心信号e も図5に例示する如く e1 から
e2へ変化する。従って、測定面10の変位ΔZの測定
が可能である。
When the measurement surface 10 is displaced from Z1 to Z2 in the vertical direction (Z direction) in the figure, the irradiation point of the laser beam 14 also changes in the vertical direction, and accordingly the light receiving lens 4 is moved.
The center of gravity of the image forming position due to 0 moves on the PSD 42 in the left and right direction of the figure, and the center of gravity signal e also changes from e 1 as illustrated in FIG.
Change to e 2 . Therefore, the displacement ΔZ of the measurement surface 10 can be measured.

【0008】又、図4の光学式変位計においては、図6
に示す如く、発振器22によりレーザビーム14をパル
ス変調し、同期検波器56c 、56d で、レーザビーム
14が照射されている時の検出信号c 、d のみを検波す
るようにしているので、外乱光の影響を排除できる。
Further, in the optical displacement meter of FIG.
As shown in, the oscillator 22 pulse-modulates the laser beam 14, and the synchronous detectors 56c and 56d detect only the detection signals c and d when the laser beam 14 is irradiated. The effect of can be eliminated.

【0009】更に、音叉30によりレーザビーム14を
往復走査し、且つ、振動ミラー28の往復動が不安定な
領域を除くため、積分タイミング回路66及び積分回路
64で、図7に示す如く、該レーザビームの走査速度が
略一定である音叉30の中立領域でのみ重心信号e を積
分するようにしているので、測定面10の表面性状によ
る測定誤差を解消することができる。
Further, since the laser beam 14 is reciprocally scanned by the tuning fork 30 and the region in which the reciprocating movement of the vibrating mirror 28 is unstable is eliminated, the integration timing circuit 66 and the integration circuit 64 use the integration timing circuit 66 and integration circuit 64 as shown in FIG. Since the center of gravity signal e is integrated only in the neutral region of the tuning fork 30 where the scanning speed of the laser beam is substantially constant, the measurement error due to the surface texture of the measurement surface 10 can be eliminated.

【0010】即ち、測定面10には、微視的には不規則
な凹凸が形成されており、結像面上の光量分布もそれに
応じて不規則な分布となっている。従って、測定面10
のZ方向の位置が同じ場合でも、表面性状が異なると光
量分布も異なり、重心信号eには一種のノイズ信号が混
入するため、測定精度が悪化してしまう。
That is, microscopically irregular irregularities are formed on the measurement surface 10, and the light quantity distribution on the image plane is also irregularly distributed accordingly. Therefore, the measurement surface 10
Even if the position in the Z direction is the same, if the surface texture is different, the light amount distribution is also different, and a kind of noise signal is mixed in the center-of-gravity signal e, which deteriorates the measurement accuracy.

【0011】これに対して、図4の光学式変位計のよう
に、レーザビーム14を測定面10上で走査して、検出
信号を積分するようにすれば、表面性状の違いによる光
量分布の違いが平均化され、表面性状の影響を受け難く
なる。
On the other hand, as in the optical displacement meter of FIG. 4, if the laser beam 14 is scanned on the measurement surface 10 and the detection signal is integrated, the light quantity distribution due to the difference in surface texture is obtained. Differences are averaged and less susceptible to surface texture.

【0012】[0012]

【発明が解決しようとする問題点】しかしながら、前記
のように、外乱光除去のためにレーザをパルス変調し、
且つ、表面性状による測定誤差を無くすためにレーザビ
ームを走査する場合、多数のデータを得るために、図6
にPSD42からの出力信号の構成を示した如く、パル
ス変調の周波数は走査の周波数より、かなり(100倍
程度)速くする必要がある。又、この場合、走査速度が
変化している領域では、振動ミラー28の往復動等が不
安定であるため、測定データは、走査速度が略一定の中
立領域でのみ有効である。
However, as described above, the laser is pulse-modulated to remove ambient light,
In addition, when a laser beam is scanned to eliminate measurement errors due to surface texture, in order to obtain a large amount of data, as shown in FIG.
As shown in the structure of the output signal from the PSD 42, the pulse modulation frequency needs to be considerably (about 100 times) faster than the scanning frequency. Further, in this case, since the reciprocating movement of the vibrating mirror 28 is unstable in the area where the scanning speed is changing, the measurement data is valid only in the neutral area where the scanning speed is substantially constant.

【0013】一方、測定速度は走査周波数で決まってく
るため、測定速度を高くするためには、走査周波数を高
くしなければならない。この場合、レーザのパルス変調
周波数は更に高くなるので、汎用のオペアンプでは電気
的応答性に問題があり、高価な電気部品を使用しなけれ
ばならない。又、高速になると電気的なタイミングの取
り方も難しくなるため、測定速度を高くするのは困難で
あった。
On the other hand, since the measuring speed is determined by the scanning frequency, the scanning frequency must be increased in order to increase the measuring speed. In this case, since the pulse modulation frequency of the laser is further increased, a general-purpose operational amplifier has a problem in electric response, and expensive electric parts must be used. Further, it becomes difficult to increase the measurement speed because it becomes difficult to take electrical timing at high speed.

【0014】本発明は、前記従来の問題点を解消するべ
くなされたもので、光ビームをパルス変調し、且つ、光
ビームを走査するようにした光学式変位計において、高
価な特殊電気部品を使用することなく、高速測定を可能
とすることを目的とする。
The present invention has been made to solve the above-mentioned conventional problems. In an optical displacement meter in which a light beam is pulse-modulated and the light beam is scanned, expensive special electrical parts are used. The purpose is to enable high-speed measurement without using it.

【0015】[0015]

【問題点を解決するための手段】本発明は、パルス変調
された光ビームを走査しながら測定面に照射する照明系
と、測定面からの前記光ビームの反射光を集めて結像す
る受光レンズと、結像された像の光量分布に対応した検
出信号を生成する光電センサと、前記光ビームの走査速
度が略一定である時の該検出信号を積分して、前記光量
分布の重心位置に対応した重心信号を生成する処理回路
とを含み、該重心信号の変化から測定面の位置又は変位
を求める光学式変位計において、前記光ビームの照射時
間を、前記積分区間のみとすることにより、前記目的を
達成したものである。
SUMMARY OF THE INVENTION The present invention is directed to an illumination system for irradiating a measurement surface with a pulse-modulated light beam while scanning, and a light receiving device for collecting and forming an image of reflected light of the light beam from the measurement surface. A lens, a photoelectric sensor that generates a detection signal corresponding to the light amount distribution of the formed image, the detection signal when the scanning speed of the light beam is substantially constant, and the barycentric position of the light amount distribution is integrated. In the optical displacement meter, which includes a processing circuit that generates a center-of-gravity signal corresponding to, and obtains the position or displacement of the measurement surface from the change of the center-of-gravity signal, the irradiation time of the light beam is limited to the integration section. The above-mentioned object is achieved.

【0016】又、前記光ビームのパルス変調周波数を、
該光ビームの走査周波数の略2倍としたものである。
The pulse modulation frequency of the light beam is
The scanning frequency of the light beam is approximately doubled.

【0017】[0017]

【作用】本発明においては、パルス変調された光ビーム
の照射時間を、該光ビームの走査速度が略一定である、
検出信号の積分区分のみとしたので、走査周波数を高め
てもパルス変調周波数を高める必要がなくなり、光ビー
ムのパルス変調周波数を、該光ビームの走査周波数の2
倍程度に抑えることができる。
In the present invention, the irradiation time of the pulse-modulated light beam is such that the scanning speed of the light beam is substantially constant.
Since only the integration section of the detection signal is used, it is not necessary to increase the pulse modulation frequency even if the scanning frequency is increased, and the pulse modulation frequency of the light beam is set to 2 times the scanning frequency of the light beam.
It can be doubled.

【0018】従って、汎用の電気部品を使用でき、しか
も、タイミングの取り方も難しくないので、測定速度を
高めることが可能となる。
Therefore, general-purpose electric parts can be used, and the timing is not difficult to set, so that the measurement speed can be increased.

【0019】特に、前記光ビームの照射時間を、前記積
分区間と略一致させて、該光ビームのパルス変調周波数
を、該光ビームの走査周波数の略2倍とした場合には、
照射した光ビームが全て測定に用いられることになり、
効率が良い。
Particularly, in the case where the irradiation time of the light beam is made to substantially coincide with the integration section and the pulse modulation frequency of the light beam is set to be approximately twice the scanning frequency of the light beam,
All the irradiated light beam will be used for measurement,
Good efficiency.

【0020】これに対して従来は、図6に示した如く、
前記積分区間内においても、多数のデータを得る必要が
あるため、パルス変調周波数は、走査周波数より、かな
り速くする必要があるだけでなく、測定が行われない区
間でも光ビームを照射する必要があり、効率も悪かっ
た。
On the other hand, conventionally, as shown in FIG.
Since it is necessary to obtain a large amount of data even in the integration section, the pulse modulation frequency needs to be considerably faster than the scanning frequency, and the light beam needs to be emitted even in the section where measurement is not performed. Yes, it was inefficient.

【0021】[0021]

【実施例】以下、図面を参照して、本発明の実施例を詳
細に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0022】本実施例は、前出図4に示したような、発
振器22、レーザ駆動回路24、半導体レーザ26、振
動ミラー28、音叉30、音叉駆動回路32、投光レン
ズ34を含む照明系20と、受光レンズ40と、PSD
42と、I−V変換器52c、52d 、増幅器54c 、
54d 、同期検波器56c 、56d 、引算器58、加算
器60、除算器62、積分タイミング回路66、A/D
変換器70、リニア補正器72を含む処理回路50と、
を有する光学式変位計において、図1に示す如く、前記
レーザ駆動回路24を、発振器22出力のパルス変調信
号でなく積分タイミング回路66出力の積分タイミング
信号f でオンオフすることにより、レーザビーム14の
照射時間を積分区間のみとすると共に、前記同期検波器
56c 、56d の検波タイミングも、これに合わせて変
更し、更に、積分回路64c 、64d 及びS/H回路6
8c 、68d を、引算器58、加算器60及び除算器6
2の後段ではなく、前段に設けたものである。
In this embodiment, as shown in FIG. 4, the illumination system including the oscillator 22, the laser driving circuit 24, the semiconductor laser 26, the vibrating mirror 28, the tuning fork 30, the tuning fork driving circuit 32, and the light projecting lens 34 is used. 20, light receiving lens 40, PSD
42, IV converters 52c and 52d, an amplifier 54c,
54d, synchronous detectors 56c and 56d, subtractor 58, adder 60, divider 62, integration timing circuit 66, A / D
A processing circuit 50 including a converter 70 and a linear corrector 72,
In the optical displacement meter having the above, as shown in FIG. 1, the laser drive circuit 24 is turned on and off not by the pulse modulation signal of the oscillator 22 output but by the integration timing signal f of the integration timing circuit 66 output. The irradiation time is limited to the integration section, and the detection timings of the synchronous detectors 56c and 56d are also changed accordingly, and further the integration circuits 64c and 64d and the S / H circuit 6 are used.
8c and 68d are added to a subtractor 58, an adder 60 and a divider 6
It is provided not in the second stage but in the first stage.

【0023】他の構成及び全体的な作用に関しては、前
記従来例と同じであるので説明は省略する。
The rest of the configuration and the overall operation are the same as in the prior art example, so a description thereof will be omitted.

【0024】本実施例における、PSD42からの出力
信号の構成は、図2に示す如く、レーザ走査成分に、そ
の2倍の周波数のレーザパルス変調成分が含まれるもの
となり、図6の従来例に比べて、レーザパルス変調成分
の周波数が格段に低下する。
In the configuration of the output signal from the PSD 42 in the present embodiment, as shown in FIG. 2, the laser scanning component includes a laser pulse modulation component having a frequency twice that of the laser scanning component. In comparison, the frequency of the laser pulse modulation component is significantly reduced.

【0025】本実施例における、PSD42からの出力
信号、同期検波後の信号及び積分した信号の波形の例
を、図3に示す。
FIG. 3 shows an example of waveforms of the output signal from the PSD 42, the signal after synchronous detection, and the integrated signal in this embodiment.

【0026】なお、前記実施例においては、レーザビー
ム14を走査するためのスキャナとして音叉30が用い
られているが、スキャナの種類は、これに限定されず、
例えば出願人が特開昭63−200011で提案したよ
うな、磁性体フレームと、永久磁石38と、加振信号と
して例えば正弦波状の交流電流が流されるコイルと、鉄
片を含む回動軸とを含んで構成され、該回動軸に振動ミ
ラーが固定された、ガルバノメータ方式の加振器を用い
ることもできる。
In the above embodiment, the tuning fork 30 is used as a scanner for scanning the laser beam 14, but the type of scanner is not limited to this.
For example, as proposed by the applicant in Japanese Patent Laid-Open No. 63-200011, a magnetic body frame, a permanent magnet 38, a coil to which a sinusoidal alternating current is applied as an excitation signal, and a rotating shaft including an iron piece are provided. It is also possible to use a galvanometer-type vibration exciter that is configured to include a vibration mirror and is fixed to the rotation shaft.

【0027】又、前記実施例においては、光電センサと
してPSD42が用いられていたが、光電センサの種類
も、これに限定されず、2分割のフォトダイオード等も
使用可能である。
Although the PSD 42 is used as the photoelectric sensor in the above embodiment, the type of the photoelectric sensor is not limited to this, and a two-divided photodiode or the like can be used.

【0028】[0028]

【発明の効果】以上説明した通り、本発明によれば、外
乱光除去のために、光ビームをパルス変調し、且つ、表
面性状による測定誤差を無くすために、光ビームを走査
するようにした光学式変位計においても、高価な特殊電
気部品を使用することなく、高速測定が可能となる。従
って、高速、高精度な測定が行える。
As described above, according to the present invention, the light beam is pulse-modulated in order to remove ambient light, and the light beam is scanned in order to eliminate a measurement error due to surface texture. Even with an optical displacement meter, high-speed measurement is possible without using expensive special electric parts. Therefore, high-speed and highly accurate measurement can be performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】図1は、本発明に係る光学式変位計の実施例の
構成を示す、一部光路図を含むブロック線図である。
FIG. 1 is a block diagram including a partial optical path diagram showing a configuration of an embodiment of an optical displacement meter according to the present invention.

【図2】図2は、前記実施例におけるPSDからの出力
信号の構成を示す線図である。
FIG. 2 is a diagram showing a configuration of an output signal from a PSD in the above embodiment.

【図3】図3は、同じく各部信号波形の例を示す線図で
ある。
FIG. 3 is a diagram similarly showing an example of signal waveforms of respective parts.

【図4】図4は、出願人が特開昭63−200011で
提案した、従来の光学式変位計の構成例を示す、一部光
路図を含むブロック線図である。
FIG. 4 is a block diagram including a partial optical path diagram showing a configuration example of a conventional optical displacement meter proposed by the applicant in JP-A-63-200011.

【図5】図5は、前記従来例における重心信号の変化状
態の例を示す線図である。
FIG. 5 is a diagram showing an example of a change state of a center-of-gravity signal in the conventional example.

【図6】図6は、同じくPSDからの出力信号の構成を
示す線図である。
FIG. 6 is a diagram similarly showing a configuration of an output signal from the PSD.

【図7】図7は、同じく各部信号波形の例を示す線図で
ある。
FIG. 7 is a diagram similarly showing an example of signal waveforms of respective parts.

【符号の説明】[Explanation of symbols]

10…測定面、 14…レーザビーム、 20…照明系、 22…発振器、 24…レーザ駆動回路、 a …レーザ駆動信号、 26…半導体レーザ、 28…振動ミラー、 30…音叉、 32…音叉駆動回路、 b …音叉駆動信号、 34…投光レンズ、 40…受光レンズ、 42…PSD(光電センサ)、 c 、d …検出信号、 50…処理回路、 56c 、56d …同期検波器、 58…引算器、 60…加算器、 62…除算器、 64c 、64d …積分回路、 66…積分タイミング回路、 f …積分タイミング信号。 10 ... Measuring surface, 14 ... Laser beam, 20 ... Illumination system, 22 ... Oscillator, 24 ... Laser drive circuit, a ... Laser drive signal, 26 ... Semiconductor laser, 28 ... Vibration mirror, 30 ... Tuning fork, 32 ... Tuning fork drive circuit , B ... Tuning fork drive signal, 34 ... Emitter lens, 40 ... Light receiving lens, 42 ... PSD (photoelectric sensor), c, d ... Detection signal, 50 ... Processing circuit, 56c, 56d ... Synchronous detector, 58 ... Subtraction Integrator, 60 ... Adder, 62 ... Divider, 64c, 64d ... Integrator circuit, 66 ... Integral timing circuit, f ... Integral timing signal.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】パルス変調された光ビームを走査しながら
測定面に照射する照明系と、測定面からの前記光ビーム
の反射光を集めて結像する受光レンズと、結像された像
の光量分布に対応した検出信号を生成する光電センサ
と、前記光ビームの走査速度が略一定である時の該検出
信号を積分して、前記光量分布の重心位置に対応した重
心信号を生成する処理回路とを含み、該重心信号の変化
から測定面の位置又は変位を求める光学式変位計におい
て、 前記光ビームの照射時間を、前記積分区間のみとしたこ
とを特徴とする光学式変位計。
1. An illumination system for irradiating a measurement surface while scanning a pulse-modulated light beam, a light-receiving lens for collecting reflected light of the light beam from the measurement surface to form an image, and A photoelectric sensor that generates a detection signal corresponding to the light amount distribution, and a process that integrates the detection signal when the scanning speed of the light beam is substantially constant to generate a center of gravity signal corresponding to the center of gravity position of the light amount distribution. An optical displacement meter, including a circuit, for determining the position or displacement of a measurement surface from a change in the center-of-gravity signal, wherein the irradiation time of the light beam is limited to the integration section.
【請求項2】請求項1において、前記光ビームのパルス
変調周波数を、該光ビームの走査周波数の略2倍とした
ことを特徴とする光学式変位計。
2. The optical displacement meter according to claim 1, wherein the pulse modulation frequency of the light beam is approximately twice the scanning frequency of the light beam.
JP3282066A 1991-10-02 1991-10-02 Optical displacement meter Expired - Fee Related JP2505332B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3282066A JP2505332B2 (en) 1991-10-02 1991-10-02 Optical displacement meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3282066A JP2505332B2 (en) 1991-10-02 1991-10-02 Optical displacement meter

Publications (2)

Publication Number Publication Date
JPH0593625A true JPH0593625A (en) 1993-04-16
JP2505332B2 JP2505332B2 (en) 1996-06-05

Family

ID=17647704

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3282066A Expired - Fee Related JP2505332B2 (en) 1991-10-02 1991-10-02 Optical displacement meter

Country Status (1)

Country Link
JP (1) JP2505332B2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63200011A (en) * 1987-02-16 1988-08-18 Mitsutoyo Corp Photoelectric position detector
JPH01180609U (en) * 1988-05-30 1989-12-26

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63200011A (en) * 1987-02-16 1988-08-18 Mitsutoyo Corp Photoelectric position detector
JPH01180609U (en) * 1988-05-30 1989-12-26

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JP2505332B2 (en) 1996-06-05

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