JPH059455A - Adhesive for airtight sealing - Google Patents

Adhesive for airtight sealing

Info

Publication number
JPH059455A
JPH059455A JP16158191A JP16158191A JPH059455A JP H059455 A JPH059455 A JP H059455A JP 16158191 A JP16158191 A JP 16158191A JP 16158191 A JP16158191 A JP 16158191A JP H059455 A JPH059455 A JP H059455A
Authority
JP
Japan
Prior art keywords
adhesive
group
polymer
powder
airtight sealing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16158191A
Other languages
Japanese (ja)
Inventor
Takashi Suzuki
隆 鈴木
Masuo Mizuno
増雄 水野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP16158191A priority Critical patent/JPH059455A/en
Publication of JPH059455A publication Critical patent/JPH059455A/en
Pending legal-status Critical Current

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  • Adhesives Or Adhesive Processes (AREA)

Abstract

PURPOSE:To provide the title adhesive which is excellent in heat resistance and adhesive properties and generates little water and few voids by incorporating a specific polymer and a specific metal powder into the adhesive. CONSTITUTION:The title adhesive contains a polymer having at least 10mol% repeating units of formula I [wherein X is a group of formula II or III (wherein R1 is H or a monovalent org. group; and R2 is a tetravalent org. group)] in the molecule [e.g. a polyimide resin prepd. from 1,3-bis(3-aminophenoxy)benzene and 3,3',4,4'-oxydiphthalic dianhydride] and at least one metal powder selected from the group consisting of powders of Al, Mg, Zn, and Fe.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体素子を気密封止用
セラミックパッケージにダイボンディングする場合に用
いられる接着剤に関するものである。更に詳しくは、半
導体素子を接着後、セラミックパッケージ封止時の熱処
理による高温に対しても、樹脂の分解による接着強度の
低下がなく、封止した容器内の水分量が極めて少ない低
ボイドの接着剤に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an adhesive used when die-bonding a semiconductor element to a hermetically sealed ceramic package. More specifically, after the semiconductor element is bonded, the bonding strength does not decrease due to the decomposition of the resin even with the high temperature due to the heat treatment during the sealing of the ceramic package, and the low void bonding in which the water content in the sealed container is extremely small It is related to agents.

【0002】[0002]

【従来の技術】従来、半導体素子をセラミックパッケー
ジにマウントする場合、Au−Si共晶、低融点ガラス
等の無機系マウント材や、エポキシ樹脂やポリイミド樹
脂を使用した有機系ペーストが使用されていた。しか
し、半導体素子の大型化により、セラミックパッケージ
と素子との熱膨張率の差を熱ストレスがかかったとき、
無機系マウント材では吸収できず、チップ割れが発生し
た。また、無機系マウント材は弾性率が高いため、機械
的衝撃がかかったとき、チップ剥れ等が起こった。この
ような欠点に対して、弾性率の低い樹脂をベースとし金
属フィラーを充填した有機系ペーストを使うことによ
り、上記の欠点を改良しようという試みもなされてい
る。しかしこれら有機系ペーストでは、やはり無機系マ
ウント材と比較して耐熱性に劣りセラミックパッケージ
封止時の高温により、樹脂が分解し、接着力が低下した
り、多量のガスを発生し封止を損なったり、あるいは、
多量の水分を発生し、信頼性を低下させ、特に、紫外線
消去型のリードオンリーメモリー(EPROM)では結
露した水によりいちじるしく機能低下をきたすという問
題があった。
2. Description of the Related Art Conventionally, when a semiconductor element is mounted on a ceramic package, an inorganic mounting material such as Au-Si eutectic or low melting point glass, or an organic paste using an epoxy resin or a polyimide resin has been used. .. However, due to the increase in size of semiconductor devices, when thermal stress is applied to the difference in the coefficient of thermal expansion between the ceramic package and the device,
The inorganic mount material could not be absorbed and chip cracks occurred. In addition, since the inorganic mount material has a high elastic modulus, chipping and the like occurred when mechanical shock was applied. With respect to such defects, attempts have been made to improve the above defects by using an organic paste containing a resin having a low elastic modulus as a base and filled with a metal filler. However, these organic pastes are still inferior in heat resistance to the inorganic mount materials, and the resin decomposes due to the high temperature at the time of sealing the ceramic package, the adhesive strength is reduced, and a large amount of gas is generated to perform sealing. Damage, or
There is a problem in that a large amount of water is generated and reliability is lowered, and especially in an ultraviolet erasable read-only memory (EPROM), dew condensation causes a drastic decrease in function.

【0003】[0003]

【発明が解決しようとする課題】本発明の目的は、ポリ
イミド樹脂を基にし、有機系の低応力性を生かしながら
無機系と同等以上の耐熱性を有し、極めて発生水分量の
少ない低ボイドの接着性に優れた気密封止用接着剤を提
供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to use a polyimide resin as a base material, which has heat resistance equal to or higher than that of an inorganic type while utilizing the low stress of an organic type and has a very small amount of generated water. An object of the present invention is to provide an adhesive for airtight sealing having excellent adhesiveness.

【0004】[0004]

【課題を解決するための手段】本発明は、下記一般式
(1)で表わされる繰り返し単位を重合体分子中に10
モル%以上有する重合体と、アルミニウム粉、マグネシ
ウム粉、亜鉛粉、鉄粉の少なくとも一種を含有する気密
封止用接着剤である。
According to the present invention, a repeating unit represented by the following general formula (1) is added to a polymer molecule in an amount of 10
An adhesive for hermetic sealing containing a polymer having a mol% or more and at least one of aluminum powder, magnesium powder, zinc powder, and iron powder.

【0005】[0005]

【化2】 1 の1価の有機基として好ましいものの例を挙げると[Chemical 2] Examples of preferable monovalent organic groups for R 1 are:

【0006】[0006]

【化3】 等であるが、特にこれらに限定されるものではない。ま
た2種以上併用しても差し支えない。R2 の4価の有機
基として好ましいものの例を挙げると
[Chemical 3] However, the present invention is not limited to these. Also, two or more kinds may be used in combination. Examples of preferred tetravalent organic groups for R 2 include

【0007】[0007]

【化4】
であるが、特にこれらに限定されるものではない。また
2種以上併用しても差し支えない。
[Chemical 4]
etc However, the present invention is not limited to these. Also, two or more kinds may be used in combination.

【0008】重合体中の一般式(1)で表わされる繰り
返し単位は、10モル%以上であることが必要であり、
20モル%以上であることが好ましい。10モル%未満
であると、充分な接着強度が得られなくなったり、ボイ
ドの発生量が多くなったりする。一般式(1)で表され
る繰り返し単位以外の繰り返し単位を、90モル%未満
の範囲で共重合および/またはブレンドしても差し支え
ない。共重合および/またはブレンドするものとして好
ましいものの例を挙げると、
The repeating unit represented by the general formula (1) in the polymer must be 10 mol% or more,
It is preferably 20 mol% or more. If it is less than 10 mol%, sufficient adhesive strength may not be obtained, or the amount of voids may increase. Repeating units other than the repeating unit represented by the general formula (1) may be copolymerized and / or blended in a range of less than 90 mol%. Examples of preferable ones for copolymerization and / or blending include:

【0009】[0009]

【化5】 [Chemical 5]

【0010】等のポリイミドおよび/またはポリイミド
前駆体であるが、特にこれらに限定されるものではな
い。また、2種以上を併用しても差し支えない。一般式
(1)で表される繰り返し単位は、前記R1 、R2 の構
造を持つテトラカルボン酸二無水物と、1、3−ビス
(3−アミノフェノキシ)ベンゼンを反応させることに
より得ることができる。このポリイミド樹脂の特徴とし
て、分子中にエーテル結合を有するため、低弾性率で、
半導体素子をマウントした場合の応力緩和に優れている
ことと接着力が強いということが挙げられる。
Polyimides and / or polyimide precursors such as, but not limited to these. Also, two or more kinds may be used in combination. The repeating unit represented by the general formula (1) is obtained by reacting the tetracarboxylic dianhydride having the structure of R 1 and R 2 with 1,3-bis (3-aminophenoxy) benzene. You can As a feature of this polyimide resin, since it has an ether bond in the molecule, it has a low elastic modulus,
It can be mentioned that it is excellent in stress relaxation when a semiconductor element is mounted and has a strong adhesive force.

【0011】本発明に用いられる充填材はアルミニウム
粉、マグネシウム粉、亜鉛粉、鉄粉の少なくとも一種を
用いたものである。形状としては、フレーク状、樹脂状
や球状等のものが用いられる。異なる粒径や粒状のもの
を混合して用いても差し支えない。充填材として、アル
ミニウム粉、マグネシウム粉、亜鉛粉、鉄粉の少なくと
も一種を用いる理由としては、ポリイミド樹脂の耐熱性
を損なうことなく硬化後の接着層の熱伝導率の向上によ
る熱抵抗の低減、高強度化、低ボイド化の他に、特に、
セラミックパッケージ封止後の内部水分量が低減すると
いったことがあげられる。この際の充填材/一般式
(1)で表わされる重合体の混合比は0.05〜10
(重合比)が好ましい。混合比が0.05未満である
と、充填材の効果が得られにくくなり、また10を超え
ると重合体の量が少なすぎるため、接着強度の低下を招
きやすい。
The filler used in the present invention is at least one of aluminum powder, magnesium powder, zinc powder and iron powder. As the shape, a flake shape, a resin shape, a spherical shape, or the like is used. There is no problem even if a mixture of particles having different particle diameters or particles is used. As the filler, aluminum powder, magnesium powder, zinc powder, the reason for using at least one of the iron powder, reduction of thermal resistance by improving the thermal conductivity of the adhesive layer after curing without impairing the heat resistance of the polyimide resin, In addition to high strength and low voids,
It is possible to reduce the amount of internal moisture after the ceramic package is sealed. In this case, the mixing ratio of the filler / the polymer represented by the general formula (1) is 0.05 to 10
(Polymerization ratio) is preferable. If the mixing ratio is less than 0.05, it becomes difficult to obtain the effect of the filler, and if the mixing ratio exceeds 10, the amount of the polymer is too small, so that the adhesive strength is likely to decrease.

【0012】本接着剤の組成は固形分が10〜90重量
%であり、残余成分が溶剤であることが好ましい。固形
分がこれ以外であると充分な接着層の厚みが得られにく
く、むらになり、結果として接着強度の低下を招きやす
い。また、これ以上であると、ペーストが高粘度化し、
接着剤としての取扱いが困難となる。上記溶剤として好
ましいものの例を挙げると、N−メチル−2−ピロリド
ン、ベンジルピロリドン、N、N−ジメチルアセトアミ
ド、N、N−ジメチルホルムアミド、テトラヒドロフラ
ン、ジメチルスルホキシド、ジエチレングリコールジメ
チルメチルエーテル(ジグライム)、テトラエチレング
リコールジメチルエーテル(テトラグライム)、γ−ブ
チロラクトン、エチルセルソルブアセテート、ブチルセ
ルソルブアセテート、シクロヘキサノン等があるが、特
にこれらに限定されるものではない。また、2種以上を
併用しても差し支えない。さらに、均一にできる範囲で
重合体の貧溶媒を揮散調節剤、被膜平滑剤などとして使
用することもできる。
It is preferable that the composition of the present adhesive has a solid content of 10 to 90% by weight, and the remaining component is a solvent. If the solid content is other than this, it is difficult to obtain a sufficient thickness of the adhesive layer, which causes unevenness, and as a result, the adhesive strength is likely to be lowered. Further, if it is more than this, the paste has a high viscosity,
Handling as an adhesive becomes difficult. Preferred examples of the solvent include N-methyl-2-pyrrolidone, benzylpyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, tetrahydrofuran, dimethyl sulfoxide, diethylene glycol dimethyl methyl ether (diglyme), tetraethylene. There are glycol dimethyl ether (tetraglyme), γ-butyrolactone, ethyl cellosolve acetate, butyl cellosolve acetate, cyclohexanone, etc., but not limited thereto. Also, two or more kinds may be used in combination. Further, a poor solvent for the polymer may be used as a volatilization regulator, a film smoothing agent, etc. within a range where it can be made uniform.

【0013】さらに本発明においては必要により消泡剤
を添加することもできる。気密封止用接着剤の製造方法
は次の通りである。一般式(1)で表される繰り返し単
位を有する重合体またはその溶液、充填材、溶剤を秤量
し、必要に応じ消泡剤等を添加して撹拌機、乳鉢、三本
ロール、ニーダー等を単独または適宜組み合わせて均一
のペースト状にする。本発明の気密封止用接着剤の使用
方法としては、通常のディスペンサー等で塗布すること
ができる。半導体素子のマウント後、オーブン中または
熱盤上で加熱硬化し接着することができる。
Further, in the present invention, an antifoaming agent can be added if necessary. The method for producing the airtight sealing adhesive is as follows. A polymer having a repeating unit represented by the general formula (1) or a solution thereof, a filler, a solvent is weighed, and an antifoaming agent or the like is added if necessary, and a stirrer, a mortar, a triple roll, a kneader, etc. A single paste or a proper combination is used to form a uniform paste. As a method of using the airtight sealing adhesive of the present invention, the adhesive can be applied by an ordinary dispenser or the like. After mounting the semiconductor element, it can be heat-cured and adhered in an oven or on a heating plate.

【0014】本発明の気密封止用接着剤はセラミックパ
ッケージへの半導体素子の接着に用いることができ、低
弾性率であるため、セラミックパッケージと半導体素子
との熱膨張率の差によるチップ割れや、機械的衝撃によ
るチップ剥れを防ぐことができる。さらに、耐熱性、接
着強度に優れ、セラミックパッケージ封止後の内部水分
量が充填材の還元作用により極めて少い、低ボイドの気
密封止用接着剤である。
Since the airtight sealing adhesive of the present invention can be used for bonding a semiconductor element to a ceramic package and has a low elastic modulus, chip cracking due to a difference in coefficient of thermal expansion between the ceramic package and the semiconductor element, It is possible to prevent chipping due to mechanical shock. Furthermore, it is a low-void airtight sealing adhesive that has excellent heat resistance and adhesive strength, and has a very small amount of internal water after sealing the ceramic package due to the reducing action of the filler.

【0015】[0015]

【実施例】以下、本発明を実施例で具体的に説明する。EXAMPLES The present invention will be specifically described below with reference to examples.

【0016】合成例1 温度計、撹拌機、原料投入口、乾燥窒素ガス導入管を備
えた四ツ口セパラブルフラスコに1、3−ビス(3−ア
ミノフェノキシ)ベンゼン23.39g(0.08モル)
をN−メチル−2−ピロリドン193gに溶解させる。
乾燥窒素ガス流入下、3、3’、4、4’−オキシジフ
タル酸二無水物24.82g(0.08モル)を一気に投
入し、20℃に保ちながら5時間撹拌をつづけてポリア
ミド酸ワニスを得た。得られたポリアミド酸ワニスにト
ルエン58gを添加し、乾燥窒素ガス導入管を外して代
わりにディーンスターチ還流冷却管を取り付け、系の温
度を上昇させる。イミド化に伴って生じる水をトルエン
との共沸により系外へ除去しながら加熱を続け、140
〜150℃でイミド化を進めて水が生成しなくなった5
時間後に反応を終了させた。得られたポリイミドワニス
を30リットルのメタノール中に撹拌しながら1時間か
けて滴下し、樹脂を沈澱させ、濾過して固形分のみを回
収した後、乾燥器中にて120℃で8時間乾燥させた。
このようにして得たポリイミド樹脂のFT−IRスペク
トルを測定し、1650cm-1に現れるイミド化前のアミ
ド結合に基づく吸収と、1780cm-1に現われるイミド
環に基づく吸収からイミド化率を求めたところ、100
%イミド化されていることが判った。
Synthesis Example 1 23.39 g (0.08 g) of 1,3-bis (3-aminophenoxy) benzene was placed in a four-neck separable flask equipped with a thermometer, a stirrer, a raw material inlet, and a dry nitrogen gas inlet tube. Mol)
Is dissolved in 193 g of N-methyl-2-pyrrolidone.
Under a dry nitrogen gas inflow, 24.82 g (0.08 mol) of 3,3 ′, 4,4′-oxydiphthalic acid dianhydride was added all at once, and stirring was continued for 5 hours while maintaining the temperature at 20 ° C. to form a polyamic acid varnish. Obtained. To the obtained polyamic acid varnish, 58 g of toluene was added, the dry nitrogen gas introduction pipe was removed, and a Dean Starch reflux cooling pipe was attached instead, to raise the temperature of the system. Continue heating while removing water generated by imidization from the system by azeotropic distillation with toluene.
Water no longer formed due to imidization at ~ 150 ° C 5
The reaction was terminated after a lapse of time. The obtained polyimide varnish was dropped into 30 liters of methanol with stirring for 1 hour to precipitate the resin, and the solid content was collected by filtration, followed by drying in a dryer at 120 ° C. for 8 hours. It was
The FT-IR spectrum of the polyimide resin thus obtained was measured, and the imidation ratio was determined from the absorption based on the amide bond before imidization appearing at 1650 cm −1 and the absorption based on the imide ring appearing at 1780 cm −1 . By the way, 100
It was found to be% imidized.

【0017】合成例2 温度計、撹拌機、原料投入口、乾燥窒素ガス導入管を備
えた四ツ口セパラブルフラスコに1、3−ビス(3−ア
ミノフェノキシ)ベンゼン22.98g(0.0786モ
ル)と(2)式のシリコーンジアミン
Synthesis Example 2 22.98 g (0.0786 g) of 1,3-bis (3-aminophenoxy) benzene was placed in a four-necked separable flask equipped with a thermometer, a stirrer, a raw material inlet, and a dry nitrogen gas inlet tube. Mol) and silicone diamine of formula (2)

【0018】[0018]

【化6】 17.10g(0.0224モル)をN−メチル−2−ピ
ロリドン166gに溶解させる。乾燥窒素ガス流入下、
3、3’、4、4’−オキシジフタル酸無水物31.02
g(0.1モル)を一気に投入し20℃に保ちながら5時
間撹拌をつづけてポリアミド酸ワニスを得た。得られた
ポリアミド酸ワニスにトルエン63gを添加し、以下合
成例1と同様の方法によりシリコーン変性ポリイミド樹
脂を得た。得られた樹脂のイミド化率は100%であっ
た。
[Chemical 6] 17.10 g (0.0224 mol) are dissolved in 166 g N-methyl-2-pyrrolidone. Under the inflow of dry nitrogen gas,
3,3 ', 4,4'-oxydiphthalic anhydride 31.02
g (0.1 mol) was added all at once, and stirring was continued for 5 hours while maintaining the temperature at 20 ° C. to obtain a polyamic acid varnish. 63 g of toluene was added to the obtained polyamic acid varnish, and a silicone-modified polyimide resin was obtained in the same manner as in Synthesis Example 1 below. The imidation ratio of the obtained resin was 100%.

【0019】実施例1 合成例1で得たポリイミド樹脂100重量部、平均粒径
5μmのアルミニウム粉100重量部、γ−ブチロラク
トン110重量部、テトラグライム75重量部を撹拌
後、三本ロールで混練し、均一なペースト状接着剤を得
た。得られた接着剤をセラミックスパッケージに塗付
し、10×7mm角のシリコンチップを150gfの圧力
でマウントし、120℃で1時間加熱後150℃、25
0℃、350℃でそれぞれ30分硬化後、390℃で2
0分間熱処理し接着強度をテンシロン万能試験機で測定
(MIL−STD−883C2027に拠る)した。同
様に15×15mm角のシリコンチップを使用し硬化後、
SOFTX線で接着部分のボイド面積を観察(MIL−
STD−883C2012に拠る)した。またボイド観
察を行なったサンプルと同様にして作成したサンプルに
蓋を載せ、1Kgfの荷重をかけ390℃で20分間処理し
封止した。封止したパッケージ内部の水分量を質量分析
(MIL−STD−883C1018に拠る)した。熱
分解温度は硬化した接着剤を熱天秤で測定した。その評
価結果を表1に示す。
Example 1 100 parts by weight of the polyimide resin obtained in Synthesis Example 1, 100 parts by weight of aluminum powder having an average particle size of 5 μm, 110 parts by weight of γ-butyrolactone, and 75 parts by weight of tetraglyme were stirred and then kneaded with a three-roll mill. Then, a uniform paste-like adhesive was obtained. The obtained adhesive is applied to a ceramic package, a silicon chip of 10 × 7 mm square is mounted at a pressure of 150 gf, heated at 120 ° C. for 1 hour, and then at 150 ° C., 25
After curing at 0 ℃ and 350 ℃ for 30 minutes respectively, at 390 ℃ 2
After heat treatment for 0 minutes, the adhesive strength was measured by a Tensilon universal testing machine (according to MIL-STD-883C2027). Similarly, after curing using a 15 x 15 mm square silicon chip,
Observe the void area of the bonded part with SOFTX (MIL-
STD-883C2012). A lid was placed on the sample prepared in the same manner as the sample subjected to the void observation, a load of 1 Kgf was applied, and the sample was treated at 390 ° C. for 20 minutes and sealed. The amount of water in the sealed package was analyzed by mass spectrometry (according to MIL-STD-883C1018). The thermal decomposition temperature was measured by a thermobalance of the cured adhesive. The evaluation results are shown in Table 1.

【0020】実施例2、3、比較例1〜3 表1に示す配合割合で実施例1と同様にして接着剤を作
成し、評価した。その評価結果を表1に示す。
Examples 2 and 3 and Comparative Examples 1 to 3 Adhesives were prepared and evaluated in the same manner as in Example 1 with the compounding ratios shown in Table 1. The evaluation results are shown in Table 1.

【0021】実施例1〜3のように特定の割合で一般式
(1)で表わされる繰り返し単位を有する重合体とアル
ミニウム粉、マグネシウム粉、亜鉛粉、鉄粉の少なくと
も1種を使用した充填材、溶剤の特定の割合からなる接
着剤を用いてチップを接着すると封止後の水分量が0.3
%以下と優れており、ボイド面積も20%未満と少なか
った。接着強度も20Kgf 以上(10×7mm角シリコン
チップ)と充分な値であった。これに対し比較例1、3
は水分量が2%以上とかなり多量に発生している。窒化
アルミニウムを使用した比較例2では耐熱性、接着強度
は良好であるが水分量は0.74%と銀粉のみの場合に較
べると良いが基準の0.5%をうわまわっている。ボイド
に関しても80%以上となり、熱伝導率が悪くなること
が考えられる。
A filler containing a polymer having a repeating unit represented by the general formula (1) in a specific ratio as in Examples 1 to 3 and at least one of aluminum powder, magnesium powder, zinc powder and iron powder. When the chips are bonded with an adhesive consisting of a specific ratio of solvent, the water content after sealing is 0.3.
% Or less, and the void area was as small as less than 20%. The adhesive strength was 20 Kgf or more (10 × 7 mm square silicon chip), which was a sufficient value. On the other hand, Comparative Examples 1 and 3
Has a considerably large amount of water of 2% or more. In Comparative Example 2 using aluminum nitride, the heat resistance and the adhesive strength are good, but the water content is 0.74%, which is better than the case of using only silver powder, but the standard 0.5% is known. It is also considered that voids will be 80% or more, and the thermal conductivity will deteriorate.

【0022】[0022]

【表1】 [Table 1]

【0023】[0023]

【発明の効果】本発明の気密封止用接着剤は、優れた接
着強度とボイドの発生が少なく、従来の欠陥である封止
後の水分量が多いといったことが除かれるので、セラミ
ックパッケージの気密封止に好適である。
EFFECTS OF THE INVENTION The airtight sealing adhesive of the present invention is excellent in adhesive strength and less in the generation of voids, and eliminates the conventional defect that the amount of water after sealing is large. Suitable for hermetic sealing.

Claims (1)

【特許請求の範囲】 【請求項1】 下記一般式(1)で表わされる繰り返し
単位を重合体分子中に10モル%以上有する重合体と、
アルミニウム粉、マグネシウム粉、亜鉛粉、鉄粉のうち
少なくとも1種を含有することを特徴とする気密封止用
接着剤。 【化1】
Claims: 1. A polymer having a repeating unit represented by the following general formula (1) in an amount of 10 mol% or more in a polymer molecule:
An airtight sealing adhesive comprising at least one of aluminum powder, magnesium powder, zinc powder and iron powder. [Chemical 1]
JP16158191A 1991-07-02 1991-07-02 Adhesive for airtight sealing Pending JPH059455A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16158191A JPH059455A (en) 1991-07-02 1991-07-02 Adhesive for airtight sealing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16158191A JPH059455A (en) 1991-07-02 1991-07-02 Adhesive for airtight sealing

Publications (1)

Publication Number Publication Date
JPH059455A true JPH059455A (en) 1993-01-19

Family

ID=15737849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16158191A Pending JPH059455A (en) 1991-07-02 1991-07-02 Adhesive for airtight sealing

Country Status (1)

Country Link
JP (1) JPH059455A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61143477A (en) * 1984-12-18 1986-07-01 Mitsui Toatsu Chem Inc Heat-resistant adhesive
JPS6440586A (en) * 1987-08-07 1989-02-10 Hitachi Chemical Co Ltd Adhesive composition
JPS6442136A (en) * 1987-08-07 1989-02-14 Nitto Denko Corp Manufacture of semiconductor device
JPH0291125A (en) * 1988-09-29 1990-03-30 Nippon Steel Chem Co Ltd Silicone polyimide and its manufacturing method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61143477A (en) * 1984-12-18 1986-07-01 Mitsui Toatsu Chem Inc Heat-resistant adhesive
JPS6440586A (en) * 1987-08-07 1989-02-10 Hitachi Chemical Co Ltd Adhesive composition
JPS6442136A (en) * 1987-08-07 1989-02-14 Nitto Denko Corp Manufacture of semiconductor device
JPH0291125A (en) * 1988-09-29 1990-03-30 Nippon Steel Chem Co Ltd Silicone polyimide and its manufacturing method

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