JPH0613759B2 - Plating equipment and cleaning equipment - Google Patents

Plating equipment and cleaning equipment

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Publication number
JPH0613759B2
JPH0613759B2 JP15629489A JP15629489A JPH0613759B2 JP H0613759 B2 JPH0613759 B2 JP H0613759B2 JP 15629489 A JP15629489 A JP 15629489A JP 15629489 A JP15629489 A JP 15629489A JP H0613759 B2 JPH0613759 B2 JP H0613759B2
Authority
JP
Japan
Prior art keywords
strip
anode
plating
insulator
liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15629489A
Other languages
Japanese (ja)
Other versions
JPH0320494A (en
Inventor
正 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Kohan Co Ltd
Original Assignee
Toyo Kohan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Kohan Co Ltd filed Critical Toyo Kohan Co Ltd
Priority to JP15629489A priority Critical patent/JPH0613759B2/en
Publication of JPH0320494A publication Critical patent/JPH0320494A/en
Publication of JPH0613759B2 publication Critical patent/JPH0613759B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 「産業上の利用分野」 本発明はストリップのメッキおよびクリーニング装置に
関するものである。
FIELD OF THE INVENTION The present invention relates to strip plating and cleaning apparatus.

「従来の技術」 メッキ鋼板の増産、生産性向上には不溶性アノードによ
る高電流密度メッキの実施が不可欠である。このために
は次の設備技術上の問題を解決する必要がある。
"Prior art" High current density plating with an insoluble anode is indispensable for increasing the production of plated steel sheets and improving productivity. To this end, it is necessary to solve the following problems in equipment technology.

(1)ストリップとアノードの極間の短縮 (2)ストリップとアノードの極間内のメッキ液の撹拌 (3)ストリップとアノードの極間へのイオンの供給 従来の極間は30〜40mmであったが上記(1)のように
極間を短縮するとアノードタッチという重大事故を起す
危険がある。又上記(2)の撹拌のためアノードの内面に
邪魔板を設ける装置(特開昭55−148798号、特
開昭62−211399号)が考案されているが邪魔板
とメッキ面との接触によるメッキ面損傷が生じるおそれ
がある。さらに上記(3)のイオンの供給装置にはメッキ
液をストリップの走向と向流方向に供給するもの(特開
昭40−56092号、特開昭62−211399号)
が考えられたが、この方法では大量のメッキ液の吹き込
み量が必要で、そのための装置が膨大になり、かつこの
方法では低速(50m/min)では有効であるが、速度が
100〜500m/minと速くなると効果が少なくなるこ
とが明らかである。又圧延工程を経たストリップの表面
の圧延油などの汚物をアルカリ液中で電気分解によって
洗浄するクリーニング装置も上記メッキ装置と同様の上
記条件(1)(2)(3)を解決する必要がある。
(1) Shortening the distance between the strip and the anode (2) Agitating the plating solution between the strip and the anode (3) Supplying ions between the strip and the anode The conventional distance between the electrodes was 30-40 mm. However, if the gap is shortened as in (1) above, there is a danger of causing a serious accident called anode touch. Further, a device (a Japanese Patent Laid-Open No. 55-148798 and a Japanese Patent Laid-Open No. 62-212399) in which a baffle plate is provided on the inner surface of the anode for the agitation of (2) has been devised. The plated surface may be damaged. Further, the above-mentioned (3) ion supply device supplies the plating liquid in the strip running direction and the countercurrent direction (JP-A-40-56092, JP-A-62-212399).
However, this method requires a large amount of plating solution to be blown in, which requires a huge amount of equipment, and this method is effective at low speeds (50 m / min), but the speed is 100-500 m / min. It is clear that the faster the min, the less effective. In addition, a cleaning device for cleaning contaminants such as rolling oil on the surface of the strip that has undergone the rolling process by electrolysis in an alkaline solution also needs to solve the above conditions (1) (2) (3) similar to the above plating device. .

「発明が解決しようとする課題」 本発明は上記(1)(2)(3)の課題を解決し、安全迅速にス
トリップの高電流密度メッキ又はクリーニングを実施す
る装置を得ることを目的とする。
[Problems to be Solved by the Invention] The present invention is intended to solve the above problems (1), (2) and (3), and to obtain an apparatus for safely and quickly performing high current density plating or cleaning of strips. .

「課題を解決するための手段」 上記の目的を達成するため本発明は 液槽内にアノードを対向配置し、該アノード間にストリ
ップを走行させるストリップ処理装置において、上記ア
ノードの内面に対向位置に絶縁体を突設し、該絶縁体に
ストリップの走行方向に向ってアノード側からストリッ
プ側に向って傾斜するテーパ面を形成してなるメッキ装
置、 対向位置に代えて千鳥位置である上記発明記載のメッキ
装置、 絶縁体の間隔部アノードの内外面に連通する透孔を穿設
し、該アノードの内外に処理液を流通させる上記第1又
は第2発明記載のメッキ装置、 ストリップの走行方向が上下方向である上記第1、第2
又は第3発明にそれぞれ記載のメッキ装置、 液槽の液面より高い位置にあるアノード上部に上記絶縁
体を対向位置に設けた上記第4発明記載のメッキ装置、 ストリップの走行方向が横向である上記第1、第2又は
第3発明記載のメッキ装置、 絶縁体の間隔部に処理液強制供給装置を接続した上記第
1、第2、第3、第4、第5又は第6発明にそれぞれ記
載したメッキ装置、 アノードに代えてカソードを対向配置し、かつメッキ装
置に代えて上記第1、第2、第3、第4、第5、第6又
は第7発明にそれぞれ記載のクリーニング装置によって
達成される。
[Means for Solving the Problems] In order to achieve the above-mentioned object, the present invention is a strip treating apparatus in which an anode is arranged in a liquid tank so as to face each other, and a strip travels between the anodes. A plating apparatus comprising an insulator provided in a projecting manner, and a taper surface inclined from the anode side toward the strip side in the traveling direction of the strip is formed on the insulator, and the zigzag position is used instead of the facing position. The plating device according to the first or second aspect of the present invention, in which a through hole that communicates with the inner and outer surfaces of the anode of the insulator is provided to allow the processing liquid to flow in and out of the anode. The above-mentioned first and second in the vertical direction
Alternatively, the plating apparatus according to the third invention, the plating apparatus according to the fourth invention in which the insulator is provided at a facing position above the anode above the liquid surface of the liquid tank, and the running direction of the strip is horizontal. The plating apparatus according to the first, second or third invention, and the first, second, third, fourth, fifth or sixth invention in which a treatment liquid forced supply device is connected to a gap between insulators By the plating device described above, the cathode is arranged opposite to the anode, and the cleaning device described in each of the first, second, third, fourth, fifth, sixth or seventh invention is replaced by the plating device. To be achieved.

「作用」 従ってアノード2,2間のストリップ3と絶縁体4のテ
ーパ面5との間にはストリップ3の走行に伴ってメッキ
液9が引込まれ(連行され)、それによってストリップ
3とテーパ面5との間に液膜が形成される。該液膜には
テーパ面5の作用で揚力を発生するからストリップ3と
絶縁体4とは接触しない。そのためストリップ3とアノ
ード2とが接触することは勿論ないし、形状の良くない
ストリップ3即ち走行方向と直角方向の反り、両耳部の
蛇行襞などを有するストリップ3であっても上記揚力を
受けて上記絶縁体4に接触することはない。
"Operation" Therefore, the plating solution 9 is drawn (conveyed) between the strip 3 between the anodes 2 and 2 and the tapered surface 5 of the insulator 4 as the strip 3 travels, whereby the strip 3 and the tapered surface 5 are carried. A liquid film is formed between the liquid film and the liquid. Since the lift force is generated on the liquid film by the action of the tapered surface 5, the strip 3 and the insulator 4 do not come into contact with each other. Therefore, the strip 3 and the anode 2 do not come into contact with each other, and even the strip 3 having a bad shape, that is, the strip 3 having a warp in a direction perpendicular to the traveling direction and a meandering fold of both ears receives the lift force. There is no contact with the insulator 4.

対向位置に代えて千鳥位置に絶縁体4を突設した場合は
第5図に示すように上記揚力によってストリップ3は絶
縁体4を避けて蛇行し、絶縁体4に接触することはな
い。
When the insulators 4 are projected at the staggered positions instead of the facing positions, the strips 3 meander by avoiding the insulators 4 by the above-mentioned lift force and do not come into contact with the insulators 4 as shown in FIG.

即ち上記絶縁体4を設けることによってアノード2とス
トリップ3との極間を小さくしてもストリップ3とアノ
ード2との接触は防止される。
That is, by providing the insulator 4, even if the gap between the anode 2 and the strip 3 is reduced, the contact between the strip 3 and the anode 2 is prevented.

又絶縁体4はアノード2の内面に突出しているためスト
リップ3に連行されるメッキ液9は第2図、第3図に示
すように該絶縁体4に当って逆流bし、テーパ面5内に
引込まれる直前にアノード2とストリップ3との間にお
いて回動し連行流cと逆流bとの間に剪断力(第3図)
を生じて撹拌される。
Further, since the insulator 4 projects to the inner surface of the anode 2, the plating liquid 9 carried along with the strip 3 hits the insulator 4 and flows backward as shown in FIGS. Immediately before being drawn into the space, it is rotated between the anode 2 and the strip 3 and shearing force is generated between the entrained flow c and the backflow b (Fig. 3).
And stirred.

上記絶縁体4は千鳥位置(第5図)に突設することによ
ってアノード2,2の極間をさらに小となすことができ
る。
The insulator 4 can be provided in a staggered position (FIG. 5) so as to further reduce the gap between the anodes 2 and 2.

メッキ液9は透孔6,6からアノード2の内外側に流通
しアノード2の外側のメッキ液9をアノード2とストリ
ップ3間に取込むことができアノード2内に外側のイオ
ンを撹拌供給することができる。
The plating solution 9 flows from the through holes 6 and 6 to the inside and outside of the anode 2, and the plating solution 9 on the outside of the anode 2 can be taken in between the anode 2 and the strip 3, and the ions on the outside are stirred and supplied into the anode 2. be able to.

第6図に示すように液面7の上位にあるアノード2,2
の対向絶縁体4,4のテーパ面5,5間にストリップ3
によって連行上昇するメッキ液9は対向絶縁体4,4に
よって上昇を阻止される。
As shown in FIG. 6, the anodes 2, 2 above the liquid level 7
Strip 3 between the tapered surfaces 5, 5 of the opposing insulators 4, 4 of
The plating liquid 9 that is continuously lifted up by the counter insulators 4 and 4 is prevented from rising.

強制供給装置8によって絶縁体4の間隔部にメッキ液9
を外部から供給しイオン濃度を増すことができる。
The plating liquid 9 is applied to the gap between the insulators 4 by the forced supply device 8.
Can be supplied from the outside to increase the ion concentration.

上記の作用はストリップ表面の汚物をアルカリもしくは
酸液で電気分解するクリーニング装置においても同様で
ある。この場合は、ストリップ3をアノード側に、前述
のアノード2をカソードとする電極切換えを行う。
The above operation is the same in the cleaning device that electrolyzes the dirt on the strip surface with an alkali or acid solution. In this case, the electrodes are switched using the strip 3 on the anode side and the anode 2 on the cathode side.

「実施例」 メッキ液9の液槽1内に板状アノード2,2を上下方向
に対向して配置し、該アノード2,2の上部を液面7の
上位に保持し、かつこの対向板状アノード2,2を2組
宛各液槽1内に保持する(第6図)。一方の対向板状ア
ノード2,2間にはストリップ3を下向に走行させ、誘
導ローラ10を迂回させて他方の上記アノード2,2間
を上向に走行させる。この状態において、上記アノード
2,2に陽極を接続し、ストリップ3に向って電流を流
すとメッキ液9内の金属イオンがストリップ3に析出し
てメッキ処理を行うことができる。上記板状アノード
2,2の対向面(内面)には第1図、第2図、第4図に
示すように互に対向位置に複数のセラミックス製絶縁体
4,4を突設し、又は第5図に示すように千鳥位置に突
設する。この絶縁体4の走行方向の長さは第4図に示す
ように可及的に短くすることによってアノード2の電極
面積を広く保持することができる。このようにした絶縁
体4にはストリップ3に対面する部分にテーパ面5を形
成し、該テーパ面5は走行方向に向ってアノード2側か
らストリップ3側に向って傾斜させる。この絶縁体4,
4の走行方向間隔部にあるアノード2には内面(対向
面)と外側面とを連通する透孔6,6を突設するもので
あって第2図に示すようにストリップ3に連行されるメ
ッキ液9は絶縁体4に当って透孔6から外側面に排出さ
れ(矢印d)、他方の透孔6から内面側に流入するよう
になっている。板状アノード2,2は上下方向のみなら
ず横向(水平方向)に配置されたものであっても差支え
ない。又第2図に示すように透孔6′に配管11を接続
し、ポンプ12によって貯槽内のメッキ液9を外部から
強制的に供給する強制供給装置8を設け、それによって
新しいメッキ液9を極間に供給しイオン濃度を向上させ
ることができる。本発明は、ストリップ3の走行速度が
高速(および300〜1000m/min)になる程効果的
であるが、アノード2,2の極間を約5mm程度とし、走
行速度を30〜300m/minの低速までに設計すること
ができる。ストリップ3の速度が低速の場合には、アノ
ード2と絶縁体4とを貫通する別の透孔を適当な配置と
なるよう設け、この透孔から液9を強制的に吹出すこと
により、この時の動圧あるいは静圧でストリップ3に及
ぼす揚力を助勢することもできる。又ストリップの両エ
ッジは揚力の発生が減少するため、ごく低速では絶縁体
に接触することもありうる。しかし電気的には短絡しな
いし又ストリップのエッジにスリ疵が発生しても後工程
で切り落すため製品には影響しない。
[Example] Plate-shaped anodes 2, 2 are arranged in a liquid tank 1 of a plating liquid 9 so as to face each other in the vertical direction, the upper portions of the anodes 2, 2 are held above the liquid surface 7, and the facing plate The pair of anodes 2 and 2 are held in each liquid tank 1 for two sets (FIG. 6). The strip 3 is run downward between the facing plate-shaped anodes 2 and 2 on one side, and the guide roller 10 is bypassed to run upward between the anodes 2 and 2 on the other side. In this state, when an anode is connected to the anodes 2 and 2 and a current is passed toward the strip 3, the metal ions in the plating solution 9 are deposited on the strip 3 and the plating process can be performed. As shown in FIGS. 1, 2, and 4, a plurality of ceramic insulators 4 and 4 are provided so as to protrude from each other on the facing surfaces (inner surfaces) of the plate-like anodes 2 and 2, or As shown in FIG. By making the length of the insulator 4 in the traveling direction as short as possible as shown in FIG. 4, the electrode area of the anode 2 can be kept wide. A taper surface 5 is formed on a portion of the insulator 4 facing the strip 3 in this manner, and the taper surface 5 is inclined from the anode 2 side toward the strip 3 side in the traveling direction. This insulator 4,
The anode 2 at the interval in the traveling direction of 4 is provided with through holes 6 and 6 for communicating the inner surface (opposing surface) and the outer surface, and is carried along with the strip 3 as shown in FIG. The plating liquid 9 hits the insulator 4 and is discharged from the through hole 6 to the outer surface (arrow d), and flows from the other through hole 6 to the inner surface side. The plate-shaped anodes 2, 2 may be arranged not only in the vertical direction but also in the horizontal direction (horizontal direction). Further, as shown in FIG. 2, a pipe 11 is connected to the through hole 6 ', and a forced supply device 8 for forcibly supplying the plating solution 9 in the storage tank from the outside by a pump 12 is provided, whereby a new plating solution 9 is supplied. The ion concentration can be improved by supplying it between the electrodes. The present invention is more effective as the traveling speed of the strip 3 becomes higher (and 300 to 1000 m / min), but the distance between the anodes 2 and 2 is about 5 mm, and the traveling speed is 30 to 300 m / min. Can be designed up to low speed. When the speed of the strip 3 is low, another through hole penetrating the anode 2 and the insulator 4 is provided so as to have an appropriate arrangement, and the liquid 9 is forcibly blown out from this through hole. The lift force exerted on the strip 3 can be assisted by the dynamic pressure or static pressure at that time. Also, both edges of the strip may come into contact with the insulator at very low speeds due to reduced lift. However, it is not electrically short-circuited, and even if scratches occur on the edges of the strip, they will be cut off in a later process and will not affect the product.

上記はメッキ装置について述べたが、ストリップ3の表
面附着汚物のアルカリ処理液中における電気分解による
クリーニング装置にも適用することができる。尚図中1
2で示すものはストリップ3の上部誘導ローラ、第3図
及び第9図中13は速度分布曲線である。
Although the plating apparatus has been described above, it can be applied to a cleaning apparatus by electrolysis of the dirt attached to the surface of the strip 3 in an alkaline treatment liquid. 1 in the figure
2 shows the upper guide roller of the strip 3, and 13 in FIGS. 3 and 9 shows the velocity distribution curve.

「発明の効果」 本発明は上述のように構成したので対向配置されるアノ
ード又はカソード2,2の極間を著しく短縮し得るばか
りでなくストリップ3とアノード又はカソード2,2と
の接触のおそれがなく安全に高電流密度メッキ又はクリ
ーニングを実施し得るし、ストリップ3の走行速度を著
しく向上し得る。
[Advantages of the Invention] Since the present invention is configured as described above, not only can the distance between the anodes or cathodes 2 and 2 facing each other be remarkably shortened, but there is a risk of contact between the strip 3 and the anodes or cathodes 2 and 2. It is possible to safely carry out high current density plating or cleaning, and to significantly improve the running speed of the strip 3.

さらに極間内の液撹拌及び極間へのイオン供給を充分行
い得てメッキ又はクリーニング処理能率を著しく向上す
ることができる。
Further, it is possible to sufficiently stir the liquid in the gaps and supply the ions to the gaps, and it is possible to remarkably improve the efficiency of the plating or cleaning treatment.

又液面7の上位にある対向絶縁体4,4がストリップ3
に連行される処理液を阻止するため上部のストリップ誘
導ローラ12,12の水準を液面7に向って低下せしめ
得て設備を小形化し得る効果がある。
Further, the opposing insulators 4 and 4 above the liquid surface 7 are strips 3
The level of the upper strip guide rollers 12 and 12 can be lowered toward the liquid surface 7 in order to prevent the processing liquid entrained in the equipment, which has the effect of downsizing the equipment.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明のメッキ装置を示す斜視図、第2図は対
向アノードの拡大縦断正面図、第3図はメッキ液の流速
曲線図、第4図はアノードの他の実施例の正面図、第5
図はアノードの千鳥配置状態の正面図、第6図は往復走
行ストリップの正面図、第7図は従来のメッキ装置の斜
視図、第8図は第7図示のアノード、ストリップの正面
図、第9図は第8図のアノード間処理液の速度分布曲線
である。 1……液槽、2……アノード又はカソード、3……スト
リップ、4……絶縁体、a……走行方向、5……テーパ
面、6……透孔、7……液面、8……処理液強制供給装
置。
FIG. 1 is a perspective view showing a plating apparatus of the present invention, FIG. 2 is an enlarged vertical front view of an opposed anode, FIG. 3 is a flow velocity curve diagram of a plating solution, and FIG. 4 is a front view of another embodiment of the anode. , Fifth
FIG. 7 is a front view of the staggered arrangement of the anodes, FIG. 6 is a front view of the reciprocating strip, FIG. 7 is a perspective view of a conventional plating apparatus, and FIG. 8 is a front view of the anodes and strips shown in FIG. FIG. 9 is a velocity distribution curve of the treatment liquid between anodes in FIG. 1 ... Liquid tank, 2 ... Anode or cathode, 3 ... Strip, 4 ... Insulator, a ... Running direction, 5 ... Tapered surface, 6 ... Through hole, 7 ... Liquid surface, 8 ... ... Processing liquid forced supply device.

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】液槽内にアノードを対向配置し、該アノー
ド間にストリップを走行させるストリップ処理装置にお
いて、上記アノードの内面に対向位置に絶縁体を突設
し、該絶縁体にストリップの走行方向に向ってアノード
側からストリップ側に向って傾斜するテーパ面を形成し
てなるメッキ装置。
1. A strip processing apparatus in which an anode is arranged to face each other in a liquid tank and a strip runs between the anodes, and an insulator is provided so as to project from the inner surface of the anode at a facing position, and the strip runs on the insulator. A plating apparatus in which a tapered surface is formed that is inclined in the direction from the anode side to the strip side.
【請求項2】対向位置に代えて千鳥位置である請求項
(1)記載のメッキ装置。
2. The staggered position instead of the facing position.
(1) The plating device as described above.
【請求項3】絶縁体の間隔部アノードの内外面に連通す
る透孔を穿設し、該アノードの内外に処理液を流通させ
る請求項(1)又は(2)記載のメッキ装置。
3. The plating apparatus according to claim 1, wherein a through hole communicating with an inner surface and an outer surface of the anode is provided at a gap portion of the insulator, and the treatment liquid is allowed to flow in and out of the anode.
【請求項4】ストリップの走行方向が上下方向である請
求項(1)(2)又は(3)にそれぞれ記載のメッキ装置。
4. The plating apparatus according to claim 1, wherein the running direction of the strip is a vertical direction.
【請求項5】液槽の液面より高い位置にあるアノード上
部に上記絶縁体を対向位置に設けた請求項(4)記載のメ
ッキ装置。
5. The plating apparatus according to claim 4, wherein the insulator is provided at a facing position above the anode above the liquid surface of the liquid tank.
【請求項6】ストリップの走行方向が横向である請求項
(1)(2)又は(3)にそれぞれ記載のメッキ装置。
6. The running direction of the strip is horizontal.
(1) The plating device described in (2) or (3), respectively.
【請求項7】絶縁体の間隔部に処理液強制供給装置を接
続した請求項(1)(2)(3)(4)(5)又は(6)にそれぞれ記載の
メッキ装置。
7. The plating apparatus according to claim 1, wherein a processing liquid forced supply device is connected to the gap between the insulators.
【請求項8】アノードに代えてカソードを対向配置し、
かつメッキ装置に代えて請求項(1)(2)(3)(4)(5)(6)又は
(7)にそれぞれ記載のクリーニング装置。
8. A cathode is arranged opposite to the anode instead of the anode,
And claim (1) (2) (3) (4) (5) (6) or instead of the plating device
The cleaning device described in (7).
JP15629489A 1989-06-19 1989-06-19 Plating equipment and cleaning equipment Expired - Fee Related JPH0613759B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15629489A JPH0613759B2 (en) 1989-06-19 1989-06-19 Plating equipment and cleaning equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15629489A JPH0613759B2 (en) 1989-06-19 1989-06-19 Plating equipment and cleaning equipment

Publications (2)

Publication Number Publication Date
JPH0320494A JPH0320494A (en) 1991-01-29
JPH0613759B2 true JPH0613759B2 (en) 1994-02-23

Family

ID=15624671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15629489A Expired - Fee Related JPH0613759B2 (en) 1989-06-19 1989-06-19 Plating equipment and cleaning equipment

Country Status (1)

Country Link
JP (1) JPH0613759B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014108447B4 (en) * 2014-06-16 2023-05-04 Plasotec Gmbh System for selective plasma polishing and/or cleaning of the electrically conductive surface of components
CN113481561B (en) * 2021-08-02 2023-08-11 浙江米皇新材股份有限公司 Aluminium alloy oxidation equipment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6145164B2 (en) 2013-09-11 2017-06-07 千住金属工業株式会社 Lead-free solder, lead-free solder ball, solder joint using this lead-free solder, and semiconductor circuit having this solder joint

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6145164B2 (en) 2013-09-11 2017-06-07 千住金属工業株式会社 Lead-free solder, lead-free solder ball, solder joint using this lead-free solder, and semiconductor circuit having this solder joint

Also Published As

Publication number Publication date
JPH0320494A (en) 1991-01-29

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