JPH0620980A - Vertical heat treatment furnace - Google Patents

Vertical heat treatment furnace

Info

Publication number
JPH0620980A
JPH0620980A JP17392692A JP17392692A JPH0620980A JP H0620980 A JPH0620980 A JP H0620980A JP 17392692 A JP17392692 A JP 17392692A JP 17392692 A JP17392692 A JP 17392692A JP H0620980 A JPH0620980 A JP H0620980A
Authority
JP
Japan
Prior art keywords
gas
pipe
gas discharge
heat treatment
reaction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17392692A
Other languages
Japanese (ja)
Inventor
Koji Hirose
功治 廣瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP17392692A priority Critical patent/JPH0620980A/en
Publication of JPH0620980A publication Critical patent/JPH0620980A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve a flow of gas and enhance uniformity within the surface in a film thickness to be formed in a semiconductor wafer. CONSTITUTION:This embodiment is a vertical heat treatment furnace and is provided with an inner pipe 5b which has a plurality of gas guide holes 9 in a head part and a plurality of gas discharge holes 10 downwardly, and an outer pipe 5a which envelops the upper side of this inner pipe 5b and which has a gas guide pipe 7 downwardly. This reaction pipe has such a structure that comprises a enclosure chamber 5c which encloses a wall part 5d forming the gas discharge holes 10 of the inner pipe 5b and which has a gas discharge pipe 8, and gas supplied from the gas guide pipe 7 passes through the gas guide holes 9 and flows downwardly and comes into contact with the surface of wafers 1 arranged in parallel to each other and received within the inner pipe 5b, while gas flows in the radial direction and passes through the gas discharge holes 10 to discharge from the gas discharge pipe 8 to outside the pipe.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体素子製造工程に
おいて使用する半導体基板であるウェハを酸化・拡散処
理する熱処理炉に関し、特に反応管が縦に配置される縦
型熱処理炉に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a heat treatment furnace for oxidizing and diffusing a wafer which is a semiconductor substrate used in a semiconductor element manufacturing process, and more particularly to a vertical heat treatment furnace in which reaction tubes are arranged vertically.

【0002】[0002]

【従来の技術】図2(a)及び(b)は従来の縦型熱処
理炉の一例を示す縦断面図及び横断面図である。従来、
この種の熱処理炉は、図2に示すように、ウェハ1の複
数枚が水平に並べ収納される縦型ボート2と、この縦型
ボート2とこの縦型ボート2を搭載する保温断熱塔3を
収納し、上部にガス導入穴9を有するとともに下部にガ
ス排出口管8を取付ける内管11bと、この内管11b
を囲み反応室11を形成する外管11aと、反応管11
の外周囲に固定されるヒータと、反応管11に縦型ボー
ト2を搬入・搬出するとともに反応管11の開口を開閉
するボート上下駆動機構4を備えている。また、反応管
11はヒータ6により600〜1200℃程度の中・高
温に一定に保たれている。
2. Description of the Related Art FIGS. 2A and 2B are a longitudinal sectional view and a lateral sectional view showing an example of a conventional vertical heat treatment furnace. Conventionally,
In this type of heat treatment furnace, as shown in FIG. 2, a vertical boat 2 in which a plurality of wafers 1 are horizontally arranged and stored, a vertical boat 2 and a heat insulation and heat insulation tower 3 in which the vertical boat 2 is mounted. And an inner pipe 11b having a gas introduction hole 9 in the upper part and a gas discharge port pipe 8 in the lower part, and the inner pipe 11b.
An outer tube 11a that surrounds the reaction chamber 11 and forms a reaction chamber 11,
And a boat vertical drive mechanism 4 for loading / unloading the vertical boat 2 into / from the reaction tube 11 and opening / closing the opening of the reaction tube 11. Further, the reaction tube 11 is kept at a medium to high temperature of about 600 to 1200 ° C. by the heater 6.

【0003】次に、この縦型熱処理炉の動作について説
明する。まず、ウェハ1を積載した縦型ボート2は、ボ
ート上下駆動機構4により上昇し、反応ガスで一定の雰
囲気に保たれた反応管11の内管11bにゆっくりと挿
入される。次に、縦型ボート2が上限まで上昇し、反応
管11への挿入が終了すると、ウェハ1の酸化・拡散等
の処理が開始される。
Next, the operation of this vertical heat treatment furnace will be described. First, the vertical boat 2 loaded with the wafers 1 is lifted by the boat vertical drive mechanism 4 and slowly inserted into the inner tube 11b of the reaction tube 11 kept in a constant atmosphere by the reaction gas. Next, when the vertical boat 2 is raised to the upper limit and the insertion into the reaction tube 11 is completed, the processes such as the oxidation / diffusion of the wafer 1 are started.

【0004】この酸化・拡散等の処理は、つぎの一連の
装置動作が連続して繰り返し一定時間行われることによ
り処理される。まず、外管11aの底部にあるガス導入
管7から導入された反応ガスは反応管外管11aと反応
管内管11bの間の反応管11の頭部方向へ上昇する。
そしてヒータ6により加熱されながら反応管の外管11
aと内管11bの間を上昇した反応ガスは、内管11b
の頭部にある多数のガス導入穴9を通るより整流され均
一に反応管11の内部に流入し、縦型ボート2に積載さ
れたウェハ1の酸化・拡散が行われる。ここで、反応後
の反応ガスや、余剰反応ガスはガス排出管8より排出さ
れる。
The processing such as oxidation and diffusion is carried out by continuously repeating the following series of device operations for a certain period of time. First, the reaction gas introduced from the gas introduction pipe 7 at the bottom of the outer pipe 11a rises toward the head of the reaction pipe 11 between the outer reaction pipe 11a and the inner reaction pipe 11b.
The outer tube 11 of the reaction tube is heated by the heater 6.
The reaction gas that has risen between a and the inner pipe 11b is
The wafers 1 loaded on the vertical boat 2 are oxidized / diffused by being rectified and flowing evenly into the reaction tube 11 through a large number of gas introduction holes 9 in the head. Here, the reaction gas after the reaction and the surplus reaction gas are discharged from the gas discharge pipe 8.

【0005】この一連の装置動作が一定の時間繰り返し
行われた後、ウェハ1が積載されている縦型ボート2
は、ボート上下駆動機構4により下側に駆動され下降
し、酸化・拡散工程が終了する。
After the series of operations of the apparatus are repeatedly performed for a predetermined time, the vertical boat 2 on which the wafers 1 are loaded.
Is driven downward by the boat up-and-down drive mechanism 4 to descend, and the oxidation / diffusion step is completed.

【0006】[0006]

【発明が解決しようとする課題】この従来の縦型熱処理
炉では、反応管の構造がガス導入管を有するガス導入側
のみが内外2重構造で、ガス排出管は1本のみが反応管
内管に直接取り付けられている1重構造であるので、ガ
スの排出が水平に保持されたウェハ面に均一に流れず、
ガス排出管が取り付けられている一方向へのみガスが流
れ、排出されるので反応管挿入時に反応管の底部付近に
位置するウェハの酸化膜厚の面内均一性が反応管頭部付
近のものより悪くなる傾向がある。更に従来の構造で
は、ウェハの酸化膜厚面内均一性に対するガス排出圧力
等のガス排出の諸条件の影響度が高く、最適条件とする
為の条件決定評価に多大な工数と時間を要するという問
題があった。そして評価により決定した最適条件に一定
に保つ為にガス排出圧力の日常管理を常に行う必要があ
り、この日常管理が煩しく誤りをしばしば引き起すとい
う問題があった。
In this conventional vertical heat treatment furnace, the structure of the reaction tube has an inner / outer double structure only on the gas introduction side having the gas introduction tube, and only one gas discharge tube is the inner tube of the reaction tube. Since it has a single-layer structure directly attached to, the discharge of gas does not flow evenly over the horizontally held wafer surface,
Since the gas flows and is discharged only in one direction where the gas discharge tube is attached, the in-plane uniformity of the oxide film thickness of the wafer located near the bottom of the reaction tube when the reaction tube is inserted is near the reaction tube head. Tends to get worse. Further, in the conventional structure, the degree of influence of various conditions of gas discharge such as gas discharge pressure on the in-plane uniformity of the oxide film thickness of the wafer is high, and it takes a lot of man-hours and time to determine and evaluate the conditions for obtaining the optimum conditions. There was a problem. In order to keep constant the optimum conditions determined by the evaluation, it is necessary to constantly manage the gas discharge pressure, and this daily management is troublesome and often causes errors.

【0007】図3(a)及び(b)は従来の縦型熱処理
で処理したウェハ面内均一性について説明するための図
である。ちなみに図2に示す熱処理炉で、反応管内90
0℃程度に保ち、酸水素を用いてウェハを酸化すると、
図3に示すように、反応管の構造と酸化膜厚の面内分布
との関係を等厚線(同一膜厚点を結んで得られる線)を
用いて示したようになる。また、直線グラフで示すとウ
ェハの膜厚は右側と左側では大きくばらついていた。こ
のようにガス排出管の取り付け位置に近い程膜厚が厚
く、ガス排出管の取り付け位置から離れている程膜厚が
薄くなる傾向にあることを示しており、ガス排出管の取
り付け位置依存性が高い事を示している。本発明の目的
は、これらの課題を解決するためにガスの流れを改善
し、面内を均一に処理出来る縦型熱処理炉を提供するこ
とにある。
FIGS. 3A and 3B are views for explaining the in-plane uniformity of the wafer processed by the conventional vertical heat treatment. By the way, in the heat treatment furnace shown in FIG.
When kept at about 0 ° C and oxidizing the wafer using oxyhydrogen,
As shown in FIG. 3, the relationship between the structure of the reaction tube and the in-plane distribution of the oxide film thickness is shown by using isobaric lines (lines obtained by connecting the same film thickness points). Further, as shown by the straight line graph, the film thickness of the wafer was greatly varied between the right side and the left side. Thus, it is shown that the film thickness tends to be thicker as it is closer to the mounting position of the gas exhaust pipe, and thinner as it is farther from the mounting position of the gas exhaust pipe. Is high. An object of the present invention is to provide a vertical heat treatment furnace capable of improving the gas flow and uniformly processing the in-plane in order to solve these problems.

【0008】[0008]

【課題を解決するための手段】本発明の縦型熱処理炉
は、頭部に複数のガス導入穴を有し下部の側壁に複数の
ガス排出穴をもつとともに半導体基板が複数枚並べて積
載されるボートを収納する内管と、この内管の頭部を含
む上側部を包むとともに下側にガス導入管が取付けられ
る外管と、前記内管の側壁を囲み、閉鎖するとともにガ
ス排気管をもつ外囲室とを備えている。
A vertical heat treatment furnace of the present invention has a plurality of gas introduction holes in its head and a plurality of gas discharge holes in its lower side wall, and a plurality of semiconductor substrates are stacked side by side. It has an inner pipe for accommodating the boat, an outer pipe that wraps the upper part including the head of the inner pipe and has a gas introduction pipe attached to the lower side, and surrounds and closes the side wall of the inner pipe and has a gas exhaust pipe. It has an outside room.

【0009】[0009]

【実施例】次に、本発明について参照しながら説明す
る。
The present invention will be described below with reference to the present invention.

【0010】図1(a)及び(b)は、本発明の縦型熱
処理炉の一実施例を示す縦断面図及び横断面図である。
この縦型熱処理炉は、その反応管5の構造を図1に示す
ように、頂部の壁部に複数のガス導入のガス導入穴9を
もつ内管5bの下側の壁部5dに複数のガス排出穴10
を明け、このガス排出穴10をもつ包む外囲室5cと、
この外囲室5cに取付けられるガス排出管8を設けた構
造にしたことである。また、反応管の外管5aの下側に
取付けられるガス導入管7は、図1(b)に示すよう
に、2本のガス排出管8に対し半径方向に伸びるように
外管5aの下部に接合されており、外囲室5cとは内壁
で仕切られている。
1 (a) and 1 (b) are a longitudinal sectional view and a lateral sectional view showing an embodiment of the vertical heat treatment furnace of the present invention.
In this vertical heat treatment furnace, as shown in FIG. 1, the structure of the reaction tube 5 has a plurality of wall portions 5d below the inner tube 5b having a plurality of gas introduction holes 9 for introducing gas into the top wall portion. Gas discharge hole 10
And the surrounding chamber 5c having the gas discharge hole 10 and
This is the structure in which the gas exhaust pipe 8 attached to the outer chamber 5c is provided. Further, the gas introduction pipe 7 attached to the lower side of the outer pipe 5a of the reaction pipe is, as shown in FIG. 1B, a lower portion of the outer pipe 5a so as to extend in the radial direction with respect to the two gas discharge pipes 8. And is separated from the outer chamber 5c by an inner wall.

【0011】次に、各部の相互の関係と働きを説明しな
がら、本発明の縦型熱処理炉を用いた場合の処理動作を
説明する。まず、ウェハ1は、縦型ボート2内に水平か
つ平行に積載される。次に、この縦型ボート2は保温断
熱塔3の上に搭載され、保温断熱塔3はボート上下駆動
機構4に搭載され内管5bに挿入される。次に、縦型ボ
ート2が上限まで上昇し、反応管5への挿入が終了する
と、ウェハ1の酸化・拡散等の処理が開始される。
Next, the processing operation in the case of using the vertical heat treatment furnace of the present invention will be described while explaining the mutual relation and function of each part. First, the wafers 1 are loaded horizontally and in parallel in the vertical boat 2. Next, the vertical boat 2 is mounted on the heat insulation and heat insulation tower 3, and the heat insulation and heat insulation tower 3 is mounted on the boat vertical drive mechanism 4 and inserted into the inner pipe 5b. Next, when the vertical boat 2 is raised to the upper limit and the insertion into the reaction tube 5 is completed, the processing such as oxidation / diffusion of the wafer 1 is started.

【0012】この酸化・拡散の処理は、次の一連の装置
動作が連続して繰り返し一定時間行われることにより処
理される。すなわち、まず、反応管5の外管5aの底部
にあるガス導入管7から導入された反応ガスは、外管5
aと内管5bの間を通り反応管5の頭部方向へ上昇す
る。そしてヒータ6により加熱されながら外管5aと内
管5b上段の間を上昇した反応ガスは、内管5bの頭部
にある多数のガス導入穴9を通ることにより内管5b内
に分散・整流され、均一に管5b内に流れる。このこと
により縦型ボート2に積載されたウェハ1の酸化・拡散
が行われる。反応後のガスや余剰反応ガスは反応管下段
の内管5bの壁部5dに半径方向に放射状に開けられた
多数のガス排出穴10から均一に吸引される。吸引され
た反応後のガスや余剰反応ガスはウェハ1の半径方向に
放射状に均一に流れ、ガス排出穴10を通り反応管下段
の外囲室5cに接合されている2本のガス排出管8から
反応管5外へ排出される。
The oxidation / diffusion process is carried out by continuously repeating the following series of device operations for a certain period of time. That is, first, the reaction gas introduced from the gas introduction pipe 7 at the bottom of the outer pipe 5 a of the reaction pipe 5 is
It passes between a and the inner tube 5b and rises toward the head of the reaction tube 5. Then, the reaction gas heated between the outer pipe 5a and the upper part of the inner pipe 5b while being heated by the heater 6 is dispersed and rectified in the inner pipe 5b by passing through a large number of gas introduction holes 9 at the head of the inner pipe 5b. And flows uniformly into the tube 5b. As a result, the wafers 1 loaded on the vertical boat 2 are oxidized and diffused. The post-reaction gas and the surplus reaction gas are uniformly sucked through a large number of gas discharge holes 10 radially formed in the wall portion 5d of the inner tube 5b in the lower stage of the reaction tube. The sucked reaction gas and surplus reaction gas radially and uniformly flow in the radial direction of the wafer 1, pass through the gas discharge holes 10, and are connected to the lower chamber outer chamber 5c of the two gas discharge pipes 8 Is discharged to the outside of the reaction tube 5.

【0013】これら一連の装置動作が一定の時間繰り返
し行われた後、ウェハ1が積載されている縦型ボート2
は、ボート上下駆動機構4により下側に駆動され下降
し、酸化・拡散工程が終了する。ここで、この実施例で
は反応ガスを排出するガス排出管8は2本としてある
が、別の実施例としては、ガスの排出をより一層均一に
することを目的として、ガス排出管8を3本や4本等に
する例が考えられる。
After the series of operations of the apparatus are repeatedly performed for a predetermined time, the vertical boat 2 on which the wafer 1 is loaded.
Is driven downward by the boat up-and-down drive mechanism 4 to descend, and the oxidation / diffusion step is completed. Here, in this embodiment, the number of the gas discharge pipes 8 for discharging the reaction gas is two, but as another embodiment, the gas discharge pipes 8 are 3 for the purpose of making the discharge of the gas more uniform. An example in which a book or four books is used can be considered.

【0014】[0014]

【発明の効果】以上説明したように本発明の縦型熱処理
炉は、複数のガス導入穴を頭部にもつとともに下部側に
複数のガス排出穴をもつ内管と、この内管の頭部側を包
むとともに下部側にガス導入管をもつ外管と、前記内管
の前記ガス排出穴のある壁部を包むとともに複数のガス
排出管をもつ外囲室とを設ける構造の反応管にし、前記
ガス導入管より供給されるガスの流れを、前記内管の頭
部のガス導入穴を通って前記内管内のウェハ面内を一様
に接触しながら半径方向に流出させ、下側の前記ガス排
出穴を通って前記ガス排出管より管外より排出させるこ
とによって、反応管内に収納される半導体基板であるウ
ェハに面内に一様な膜厚を生成出来るという効果があ
る。また、二次的効果としてウェハの酸化膜厚面内均一
性に対するガス排出圧力等の諸条件の影響度が低くな
り、前記諸条件を最適化するための条件決定評価や日常
管理に費やしていた多大な工数と時間を大幅に削減でき
るという効果がある。
As described above, the vertical heat treatment furnace of the present invention has an inner pipe having a plurality of gas introduction holes in the head and a plurality of gas discharge holes in the lower side, and the head of the inner pipe. A reaction tube having a structure in which an outer tube that wraps the side and has a gas introduction tube on the lower side, and an outer chamber that wraps the wall portion of the inner tube having the gas discharge hole and that has a plurality of gas discharge tubes is provided, The flow of gas supplied from the gas introduction pipe is made to flow radially through the gas introduction hole of the head of the inner pipe while uniformly contacting the wafer surface in the inner pipe, By discharging the gas from the outside through the gas discharge pipe through the gas discharge hole, there is an effect that a uniform film thickness can be formed in-plane on the wafer which is the semiconductor substrate accommodated in the reaction pipe. Also, as a secondary effect, the degree of influence of various conditions such as the gas discharge pressure on the in-plane uniformity of the oxide film thickness of the wafer is reduced, and it has been spent on condition determination evaluation and daily management for optimizing the various conditions. This has the effect of significantly reducing man-hours and time.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の縦型熱処理炉の一実施例を示す。FIG. 1 shows an example of a vertical heat treatment furnace of the present invention.

【図2】従来の縦型熱処理炉の一例を示す縦断面図及び
横断面図である。
FIG. 2 is a vertical sectional view and a horizontal sectional view showing an example of a conventional vertical heat treatment furnace.

【図3】従来の縦型熱処理炉で処理したウェハ面内の均
一性について説明する図である。
FIG. 3 is a diagram illustrating uniformity within a wafer surface processed in a conventional vertical heat treatment furnace.

【符号の説明】[Explanation of symbols]

1 ウェハ 2 縦型ボート 3 保温断熱塔 4 ボート上下駆動機構 5,11 反応管 5a,11a 外管 5b,11b 内管 5c 外囲室 5d 壁部 6 ヒータ 7 ガス導入管 8 ガス排出管 9 ガス導入穴 10 ガス排出穴 DESCRIPTION OF SYMBOLS 1 Wafer 2 Vertical boat 3 Insulating heat insulation tower 4 Boat vertical drive mechanism 5,11 Reaction tube 5a, 11a Outer tube 5b, 11b Inner tube 5c Outer chamber 5d Wall part 6 Heater 7 Gas introduction tube 8 Gas exhaust tube 9 Gas introduction Hole 10 gas discharge hole

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 頭部に複数のガス導入穴を有し下部の側
壁に複数のガス排出穴をもつとともに半導体基板が複数
枚並べて積載されるボートを収納する内管と、この内管
の頭部を含む上側部を包むとともに下側にガス導入管が
取付けられる外管と、前記内管の側壁を囲み、閉鎖する
とともにガス排気管をもつ外囲室とを備えることを特徴
とする縦型熱処理炉。
1. An inner pipe for accommodating a boat having a plurality of gas introduction holes in a head portion, a plurality of gas discharge holes in a lower side wall, and a plurality of semiconductor substrates arranged side by side, and a head of the inner pipe. A vertical type that is provided with an outer tube that encloses an upper part including a portion and a gas introduction tube is attached to the lower side, and an outer chamber that surrounds and closes a side wall of the inner tube and that has a gas exhaust pipe. Heat treatment furnace.
JP17392692A 1992-07-01 1992-07-01 Vertical heat treatment furnace Pending JPH0620980A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17392692A JPH0620980A (en) 1992-07-01 1992-07-01 Vertical heat treatment furnace

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17392692A JPH0620980A (en) 1992-07-01 1992-07-01 Vertical heat treatment furnace

Publications (1)

Publication Number Publication Date
JPH0620980A true JPH0620980A (en) 1994-01-28

Family

ID=15969639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17392692A Pending JPH0620980A (en) 1992-07-01 1992-07-01 Vertical heat treatment furnace

Country Status (1)

Country Link
JP (1) JPH0620980A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100559198B1 (en) * 1999-12-21 2006-03-10 액셀리스 테크놀로지스, 인크. Bell jar having integral gas distribution channeling

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100559198B1 (en) * 1999-12-21 2006-03-10 액셀리스 테크놀로지스, 인크. Bell jar having integral gas distribution channeling

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