JPH0626838Y2 - 走査型電子顕微鏡付き材料試験機 - Google Patents

走査型電子顕微鏡付き材料試験機

Info

Publication number
JPH0626838Y2
JPH0626838Y2 JP16696488U JP16696488U JPH0626838Y2 JP H0626838 Y2 JPH0626838 Y2 JP H0626838Y2 JP 16696488 U JP16696488 U JP 16696488U JP 16696488 U JP16696488 U JP 16696488U JP H0626838 Y2 JPH0626838 Y2 JP H0626838Y2
Authority
JP
Japan
Prior art keywords
electron microscope
testing machine
scanning electron
material testing
load
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP16696488U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0288152U (2
Inventor
修一 原口
純 堀川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP16696488U priority Critical patent/JPH0626838Y2/ja
Publication of JPH0288152U publication Critical patent/JPH0288152U/ja
Application granted granted Critical
Publication of JPH0626838Y2 publication Critical patent/JPH0626838Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP16696488U 1988-12-23 1988-12-23 走査型電子顕微鏡付き材料試験機 Expired - Fee Related JPH0626838Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16696488U JPH0626838Y2 (ja) 1988-12-23 1988-12-23 走査型電子顕微鏡付き材料試験機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16696488U JPH0626838Y2 (ja) 1988-12-23 1988-12-23 走査型電子顕微鏡付き材料試験機

Publications (2)

Publication Number Publication Date
JPH0288152U JPH0288152U (2) 1990-07-12
JPH0626838Y2 true JPH0626838Y2 (ja) 1994-07-20

Family

ID=31454828

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16696488U Expired - Fee Related JPH0626838Y2 (ja) 1988-12-23 1988-12-23 走査型電子顕微鏡付き材料試験機

Country Status (1)

Country Link
JP (1) JPH0626838Y2 (2)

Also Published As

Publication number Publication date
JPH0288152U (2) 1990-07-12

Similar Documents

Publication Publication Date Title
US3415582A (en) Tetrahedron isolator and methods of making the same
JPH0626838Y2 (ja) 走査型電子顕微鏡付き材料試験機
JP2009097673A (ja) 防振継手
JP2002115741A (ja) 空気圧制御の油圧式振動防止支持装置およびこのような支持装置を含む自動車
TW302317B (2)
JPS58187589A (ja) 密閉型電動圧縮機の防振装置
CN114599920A (zh) 空调装置的室外机以及空调装置的室外机的组装方法
JP2019160449A (ja) 真空用接続機構、電子光学装置
JPH0614400Y2 (ja) 走査電子顕微鏡付き材料試験機
CN119057190A (zh) 一种发动机气门室盖自动化电弧焊接装置
JPS6113115B2 (2)
JP2004335510A (ja) ステージ装置及び露光装置
JP3926255B2 (ja) 除振台
JP2004103650A (ja) 部品実装装置及びエアベアリングシリンダ
JPH051804Y2 (2)
JPH0628776Y2 (ja) 試料ステージ
JPH0584857B2 (2)
JP2002172486A (ja) ３軸ポジショナ
WO2001096057A1 (en) Cutting machine
JP4185485B2 (ja) 振動制御装置
JPS6272500A (ja) プレス機の光学装置用防振装置
JP2004084779A (ja) 精密機器における除振装置
JP5110592B2 (ja) レーザ加工機
TWI905998B (zh) 振動衰減設備及方法
JPS60131443A (ja) 共試体の試験装置

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees