JPH06280018A - Method and device for production of thin film superconductor - Google Patents
Method and device for production of thin film superconductorInfo
- Publication number
- JPH06280018A JPH06280018A JP5068526A JP6852693A JPH06280018A JP H06280018 A JPH06280018 A JP H06280018A JP 5068526 A JP5068526 A JP 5068526A JP 6852693 A JP6852693 A JP 6852693A JP H06280018 A JPH06280018 A JP H06280018A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- hydrogen
- treatment
- oxygen
- superconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- Y02E40/641—
Landscapes
- Physical Vapour Deposition (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Abstract
(57)【要約】
【目的】 超伝導臨界電流密度が高い酸化物超伝導体の
製造方法の提供。
【構成】 Bi2Sr2Ca2Cu3Oy蒸着源としては、
ターゲット13、マグネトロンカソード14とシャッ
タ、高周波原等で構成される高周波マグネトロンスパッ
タ装置、水素照射装置にはカウフマン型の小型水素イオ
ンガンを加速電圧2kVで、酸素処理装置としては、プ
ラズマ生成室16、マグネット18、マイクロ波電源等
からなるECR酸素プラズマ発生装置を用い、処理条件
は、マイクロ波パワー200W、ガス圧8.5×10-4
Torr、バイアス電圧50Vで行ったところ、反応性
水素照射と酸素処理を行っていない材料に比べ、77K
において超伝導臨界電流密度が約10倍程度改善でき
た。
(57) [Summary] [Objective] To provide a method for producing an oxide superconductor having a high superconducting critical current density. [Structure] As a Bi 2 Sr 2 Ca 2 Cu 3 O y vapor deposition source,
A high-frequency magnetron sputtering device including a target 13, a magnetron cathode 14, a shutter, and a high-frequency source, a hydrogen irradiation device is a small Kaufman type hydrogen ion gun with an acceleration voltage of 2 kV, and an oxygen treatment device is a plasma generation chamber 16 and a magnet. 18. Using an ECR oxygen plasma generator consisting of a microwave power source, etc., the processing conditions are as follows: microwave power 200 W, gas pressure 8.5 × 10 −4
Torr, bias voltage 50V, 77K compared to the material without reactive hydrogen irradiation and oxygen treatment
, The superconducting critical current density could be improved about 10 times.
Description
【0001】[0001]
【産業上の利用分野】本発明は、高温酸化物超伝導体の
製造方法および製造装置に関し、特に、Bi−Sr−C
a−Cu−O、および Tl−Ba−Ca−Cu−O系
薄膜超伝導体の製造方法および製造装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for manufacturing a high temperature oxide superconductor, and in particular to Bi-Sr-C.
The present invention relates to a method and an apparatus for manufacturing a-Cu-O and Tl-Ba-Ca-Cu-O based thin film superconductors.
【0002】[0002]
【従来の技術】Y−Ba−Cu−O系に代表される酸化
物超伝導材料は、超伝導機構の詳細は明かではないが、
転移温度が液体窒素温度以上と高く、薄膜化する事によ
り量子干渉素子等各種エレクトロニクス分野への応用が
期待されている。2. Description of the Related Art The details of the superconducting mechanism of oxide superconducting materials represented by the Y-Ba-Cu-O system are not clear.
The transition temperature is as high as the temperature of liquid nitrogen or higher, and it is expected to be applied to various electronic fields such as quantum interference devices by thinning it.
【0003】この酸化物超伝導材料は、その結晶構造と
作製条件により超伝導特性が変化するが、結晶性がよく
制御されたものほど、超伝導転移温度が高いとされてい
る。そして結晶性の高い酸化物超伝導体が、臨界温度の
初期特性並びに長期的安定性に優れており、作製中ある
いは作製直後の結晶性、および酸素含有量の制御によ
り、良好な超伝導特性をもたらすことが確認されてい
る。The superconducting properties of this oxide superconducting material change depending on its crystal structure and production conditions, but it is said that the more well-controlled the crystallinity, the higher the superconducting transition temperature. Oxide superconductors with high crystallinity are excellent in initial characteristics at critical temperature and long-term stability, and good superconducting characteristics can be obtained by controlling crystallinity during production or immediately after production, and oxygen content. It is confirmed to bring.
【0004】しかし臨界電流密度特性は、結晶性制御並
びに作製条件の最適化によってある程度改善することは
出来るものの、基本的には結晶材料中のピン止め中心の
配置を設計することが出来なければ向上は望めない。However, the critical current density characteristics can be improved to some extent by controlling the crystallinity and optimizing the manufacturing conditions, but basically they are improved unless the arrangement of pinning centers in the crystal material can be designed. Can't hope
【0005】酸化物超伝導体においてこのピン止め中心
は、結晶中に含まれる各種の結晶欠陥、結晶粒界、不純
物等の微細な非超伝導部分ではないかと推測されている
が、新しく発見された高温酸化物超伝導体に於けるピン
止めの機構については、現在のところほとんど解明され
ていない。It is presumed that the pinning center in an oxide superconductor is a fine non-superconducting portion such as various crystal defects, crystal grain boundaries and impurities contained in the crystal, but it has been newly discovered. The pinning mechanism in high-temperature oxide superconductors has not been clarified at present.
【0006】このピン止めの効果を得るため、従来では
焼結材料を合成する場合には、不純物を混入したり、焼
成条件の制御により不純物を析出させてピン止め中心の
効果を得ようとする試みが行われている。例えば薄膜材
料の場合には、数10KV以上の電圧で加速した各種イ
オン、あるいは高速中性子のような高エネルギーの粒子
を酸化物薄膜超伝導体に照射し、結晶中に欠陥を生じさ
せたり、不純物を注入したりする試みが行われた。ま
た、X線、電子線や紫外線のようなエネルギービームの
照射なども行われた。In order to obtain this pinning effect, in the conventional case, when synthesizing a sintered material, impurities are mixed or impurities are precipitated by controlling firing conditions to obtain the effect of the pinning center. Attempts are being made. For example, in the case of a thin film material, various ions accelerated by a voltage of several tens of KV or higher, or high-energy particles such as fast neutrons are irradiated on the oxide thin film superconductor to cause defects in crystals or impurities. Attempts were made to inject or. Also, irradiation with energy beams such as X-rays, electron beams and ultraviolet rays was performed.
【0007】[0007]
【発明が解決しようとする課題】薄膜超伝導体に要求さ
れる重要な特性の1つである臨界電流密度に関して、こ
れらエネルギービームの照射の効果については詳細な検
討はまだ不完全であり、必ずしも特性改善につながって
いなかった。また、超伝導臨界電流が改善された場合で
も、その理由は解明されていない状況である。Regarding the critical current density, which is one of the important characteristics required for thin film superconductors, detailed examination of the effect of irradiation with these energy beams has not yet been completed, and is not necessarily complete. It did not improve the characteristics. Moreover, even if the superconducting critical current is improved, the reason for this is still unknown.
【0008】つまり、一般的には、Y−Ba−Cu−O
系薄膜には効果があっても、Bi−Sr−Ca−Cu−
O系、および Tl−Ba−Ca−Cu−O系薄膜には
効果がなく、効果的なピン止め中心を制御性良く形成す
ることは困難であり、従って、この種の薄膜の超伝導臨
界電流密度もなかなか改善の見通しが得られていなかっ
た。That is, in general, Y-Ba-Cu-O
Bi-Sr-Ca-Cu-
There is no effect on O-based and Tl-Ba-Ca-Cu-O-based thin films, and it is difficult to form effective pinning centers with good controllability. The density could not be expected to improve easily.
【0009】また一方では、このような酸化物超伝導材
料の実用化のためにはY−Ba−Cu−O系は酸素欠陥
構造が不安定であり、長期的な安定性、信頼性に問題が
あるので、そのような問題の小さい、さらに超伝導臨界
温度の高いBi−Sr−Ca−Cu−O系、および T
l−Ba−Ca−Cu−O系の利用が望まれている。On the other hand, in order to put such an oxide superconducting material into practical use, the Y-Ba-Cu-O system has an unstable oxygen defect structure, which causes problems in long-term stability and reliability. Therefore, the Bi-Sr-Ca-Cu-O system having a small superconducting temperature and a high superconducting critical temperature, and T
Utilization of the 1-Ba-Ca-Cu-O system is desired.
【0010】さらに、従来の方法では、イオンを高電圧
で加速したり、X線装置を使用しなければならず、実用
を考えると問題があり、簡便な装置により上述の効果を
実現することが望まれていた。Further, in the conventional method, it is necessary to accelerate the ions at a high voltage and to use an X-ray apparatus, which is problematic in practical use, and the above-mentioned effects can be realized by a simple apparatus. Was wanted.
【0011】本発明はこのような従来の課題に鑑みてな
した発明であり、超伝導臨界電流密度が高い酸化物超伝
導体の製造方法、および簡便で安全な製造装置を提供す
ることを目的とする。The present invention has been made in view of such conventional problems, and an object thereof is to provide a method for manufacturing an oxide superconductor having a high superconducting critical current density, and a simple and safe manufacturing apparatus. And
【0012】[0012]
【課題を解決するための手段】本発明にかかる酸化物薄
膜超伝導体は、活性水素、あるいは水素イオン等の反応
性水素を照射する事により酸化物薄膜超伝導体と水素を
反応させ、酸素雰囲気下、あるいは活性酸素中での熱処
理とあわせて結晶性の向上や酸素含有量の精密制御を可
能とするものである。本発明では、このような水素処理
を薄膜作製後、薄膜作製中、あるいは薄膜作製を中断し
て行い、結晶化促進、および超伝導発現のために必要な
酸素の供給のための酸素処理についても薄膜作製中、あ
るいは薄膜作製を中断して、前述の水素処理と合わせ行
う。これらの処理は場合により、作製した薄膜を加熱し
て行う。また水素照射源に簡便な方法として水素イオン
を加速して用いる。すなわち、水素処理と酸素処理によ
る酸素制御を薄膜作製中交互に繰り返すことにより、あ
るいは薄膜作製後処理する事により高性能の薄膜超伝導
体を制御性、安定性良く実現しようとする点に大きな特
色がある。The oxide thin film superconductor according to the present invention is irradiated with active hydrogen or reactive hydrogen such as hydrogen ions to react the oxide thin film superconductor with hydrogen to generate oxygen. It is possible to improve the crystallinity and precisely control the oxygen content in combination with heat treatment in an atmosphere or in active oxygen. In the present invention, such a hydrogen treatment is also performed during thin film production, during the thin film production, or while the thin film production is interrupted to perform oxygen treatment for promoting crystallization and supplying oxygen necessary for manifestation of superconductivity. During the thin film production or while the thin film production is interrupted, the above hydrogen treatment is performed together. In some cases, these treatments are performed by heating the produced thin film. As a simple method for hydrogen irradiation source, hydrogen ions are accelerated and used. In other words, a major feature is that high-performance thin film superconductors are realized with good controllability and stability by alternately repeating oxygen control by hydrogen treatment and oxygen treatment during thin film production, or by performing post-treatment after thin film production. There is.
【0013】[0013]
【作用】酸化物超伝導体においては、前述のように臨界
電流密度特性は、結晶性制御並びに作製条件の最適化に
よってある程度改善することは出来るものの、基本的に
は、結晶材料中のピン止め中心の配置を設計することが
必要であるといわれている。[Function] In the oxide superconductor, although the critical current density characteristics can be improved to some extent by controlling the crystallinity and optimizing the manufacturing conditions as described above, basically, the pinning in the crystalline material is performed. It is said that it is necessary to design a central arrangement.
【0014】本発明者らは、上述の酸化物薄膜超伝導体
作製時またはその後に水素照射を行い、更にその照射
中、あるいは照射後に適切な酸素処理を行なうことによ
り、酸化物超伝導体に対する酸素含有量の制御を行い、
良好な超伝導臨界電流特性を有する酸化物薄膜超伝導体
を制御性、安定性良く実現できることを見いだした。The inventors of the present invention performed hydrogen irradiation during or after the above-mentioned oxide thin film superconductor was manufactured, and further performed appropriate oxygen treatment during or after the irradiation, to thereby remove oxide superconductor. Control the oxygen content,
It was found that an oxide thin film superconductor having excellent superconducting critical current characteristics can be realized with good controllability and stability.
【0015】この原因は定かではないが、水素照射によ
りCu−O結合軌道の価電子が励起され、O2-が中性化
されて結晶中から離脱し、Cu酸化物が還元された結
果、超伝導特性が劣化した欠陥領域がピン止め中心とし
て働くと考えられる。Although the cause of this is not clear, the valence electrons of the Cu—O bond orbital are excited by hydrogen irradiation, the O 2− is neutralized, and is removed from the crystal, resulting in the reduction of the Cu oxide. It is considered that the defective region with deteriorated superconducting properties acts as the pinning center.
【0016】この作用のため、従来Y−Ba−Cu−O
系でしか効果が得られていなかったピン止め中心の形成
が、Bi系およびTl系でも可能になると考えられる。Due to this action, the conventional Y-Ba-Cu-O
It is considered that the formation of the pinning center, which has been effective only in the system, is possible in the Bi system and the Tl system.
【0017】工程としては、まず水素処理により非超伝
導領域を作製した後、酸素処理を行い、超伝導性を支配
している平面Cu−O部分の欠陥に酸素を導入して超伝
導化する事により、薄膜材料中の平面Cu−O以外の酸
素原子の位置に制御制よくピン止めのための結晶欠陥が
導入され、これが磁束に対するピン止め中心となると考
えられる。そしてこれを薄膜超伝導体作製に対して応用
することにより、発明に至ったものである。In the process, first, a non-superconducting region is formed by hydrogen treatment, and then oxygen treatment is performed to introduce oxygen into the defects in the planar Cu--O portion that controls superconductivity to make it superconducting. As a result, it is considered that crystal defects for pinning are controllably introduced into the positions of oxygen atoms other than the plane Cu—O in the thin film material, and this becomes the pinning center for the magnetic flux. Then, the invention was achieved by applying this to the production of a thin film superconductor.
【0018】この方法は、酸素処理の際、材料を高温で
処理するため、安定な材料を供給できる利点がある。ま
た、薄膜材料に応用した場合、水素照射により薄膜全体
に水素を供給する事が容易になり、特に薄膜作製中に極
薄膜堆積ごとに水素処理を行う事により、低加速エネル
ギーの反応性水素が使用可能となり均一性、再現性、制
御性、信頼性に優れた特性改善が可能となる。This method has an advantage that a stable material can be supplied because the material is processed at a high temperature during oxygen treatment. In addition, when applied to thin film materials, it becomes easy to supply hydrogen to the entire thin film by hydrogen irradiation, and in particular, by performing hydrogen treatment for each extremely thin film deposition during thin film production, reactive hydrogen with low acceleration energy can be generated. It can be used, and it is possible to improve the characteristics with excellent uniformity, reproducibility, controllability, and reliability.
【0019】[0019]
【実施例】本発明の実施例を図面と共に説明する。Embodiments of the present invention will be described with reference to the drawings.
【0020】本発明の製造方法は、水素処理と酸素処理
とを施すため、水素照射装置と酸素処理装置とが必要で
ある。水素照射のための装置は、様々のものが利用可能
であるが、基本的にはおもに活性水素を利用するもの
と、おもに水素イオンを利用するものに区別できる。こ
れらは紫外線照射、高周波励起、高周波放電、あるいは
高熱フィラメントでの熱分解などにより得られるので、
このような機能を持つ水素発生源が使用可能である。ま
た、酸素処理のための装置としては、通常酸素を含むガ
スを導入出来る加熱炉装置が一般的であるが、これら水
素照射の為の装置も酸素処理に使用可能である。Since the manufacturing method of the present invention performs hydrogen treatment and oxygen treatment, it requires a hydrogen irradiation device and an oxygen treatment device. Various devices can be used for hydrogen irradiation, but basically, a device that mainly uses active hydrogen and a device that mainly uses hydrogen ions can be distinguished. Since these can be obtained by ultraviolet irradiation, high frequency excitation, high frequency discharge, or thermal decomposition with a high heat filament,
A hydrogen source having such a function can be used. Further, as an apparatus for oxygen treatment, a heating furnace apparatus which can usually introduce a gas containing oxygen is generally used, but these hydrogen irradiation apparatuses can also be used for oxygen treatment.
【0021】まず酸化物薄膜を、例えばスパッタリング
法で作製する。この場合、基板としては、結晶性の高い
酸化物薄膜を作製するため単結晶の基板が有効であり、
酸化マグネシウム、LaAlO3,LaGaO3 、チタ
ン酸ストロンチウム等の単結晶を用いる。First, an oxide thin film is formed by, for example, a sputtering method. In this case, as the substrate, a single crystal substrate is effective for producing an oxide thin film having high crystallinity,
A single crystal such as magnesium oxide, LaAlO 3 , LaGaO 3 , or strontium titanate is used.
【0022】本発明者らは、酸化物薄膜を基板の表面に
付着させる場合、超伝導特性を持つ結晶構造を得るため
には、基板の温度範囲として300℃以上が必要であり
500〜850℃が適当であることを確認した。酸化物
薄膜の結晶性、組成、表面状態を最適なものとするため
の最適基板温度は、この範囲に存在する。このような薄
膜作製条件により酸化物薄膜超伝導体の結晶構造を構築
し、1000Å程度堆積した後、例えば水素イオン照射
装置内にこれを設置し、加速電圧1KV,電流密度0.
6mA/cm2の条件で15分照射する。When the oxide thin film is attached to the surface of the substrate, the present inventors need to have a substrate temperature range of 300 ° C. or higher in order to obtain a crystal structure having superconducting properties. Was confirmed to be appropriate. The optimum substrate temperature for optimizing the crystallinity, composition, and surface state of the oxide thin film exists in this range. A crystal structure of an oxide thin film superconductor is constructed under such a thin film production condition, and after depositing about 1000 Å, this is installed in, for example, a hydrogen ion irradiation device, an acceleration voltage of 1 KV, a current density of 0.
Irradiation is performed for 15 minutes under the condition of 6 mA / cm 2 .
【0023】この照射により薄膜の抵抗率は、温度変化
に対し半導体的な応答を示し、水素照射以前に超伝導臨
界温度で10-4ohm・cm程度の値が、照射により0.1ohm
・cm程度となり、超伝導ゼロ抵抗を示さなくなった。By this irradiation, the resistivity of the thin film shows a semiconductor-like response to the temperature change, and the value of about 10 −4 Ω · cm at the superconducting critical temperature before hydrogen irradiation is 0.1 ohm by the irradiation.
・ It became about cm and no superconducting zero resistance was exhibited.
【0024】この試料を酸素ガスを導入した加熱炉に設
置し、5時間、800℃の高温処理を行い、これに引き
続き、80℃/時の徐冷プロセスによって酸素供給と結
晶性改善を行なった。This sample was placed in a heating furnace introduced with oxygen gas, subjected to high temperature treatment at 800 ° C. for 5 hours, and subsequently, oxygen supply and crystallinity improvement were carried out by a slow cooling process at 80 ° C./hour. .
【0025】このとき同時に水素処理を施さなかった薄
膜試料を加熱炉に設置して、水素処理の効果を確認する
事が出来た。つまり、水素処理を施した試料と施さない
試料において、超伝導転移温度はほとんど変化がなかっ
たが、臨界電流密度では、例えば77Kにおいて1×1
05A/cm2が10倍程度改善された。この改善の度合
いは、薄膜作製の条件に左右されるが、結晶性の良好な
薄膜に対する水素照射程、効果が安定に発現する事を発
明者らは確認した。At the same time, it was possible to confirm the effect of the hydrogen treatment by placing the thin film sample not subjected to the hydrogen treatment at the same time in the heating furnace. That is, there was almost no change in the superconducting transition temperature between the sample subjected to the hydrogen treatment and the sample not subjected to the hydrogen treatment, but at the critical current density, for example, 1 × 1 at 77K.
0 5 A / cm 2 was improved about 10 times. The degree of this improvement depends on the conditions for forming the thin film, but the inventors have confirmed that the effect of hydrogen irradiation on a thin film having good crystallinity is more stable.
【0026】このような処理は、薄膜作製後試料を装置
より取り出して行ったが、薄膜作製が完了した後に、試
料を装置より取り出さず真空漕内で連続して水素処理と
酸素処理を行う事により、より安定した効果が得られる
と考えられる。Such a treatment was carried out by taking out the sample from the apparatus after the thin film was formed. However, after the thin film preparation was completed, the sample was not taken out from the apparatus and the hydrogen treatment and the oxygen treatment were continuously carried out in the vacuum chamber. By this, it is considered that a more stable effect can be obtained.
【0027】さらに、本発明者らは、結晶性の高い酸化
物薄膜超伝導体が、初期特性並びに長期的安定性に優れ
ており、成膜中あるいは直後の結晶性および酸素含有量
の制御がより良好な超伝導特性をもたらすことを確認し
た。とくに、Y系超伝導体では、一旦、薄膜作製槽の外
に薄膜を取り出すと、空気中の水分等が表面に吸着し、
薄膜の構成元素と反応して特性を劣化させてしまうた
め、この水素処理と酸素処理を酸化物薄膜作製工程の一
部として組み入れる必要がある。Further, the inventors of the present invention have found that the oxide thin film superconductor having high crystallinity is excellent in initial characteristics and long-term stability, and the crystallinity and oxygen content can be controlled during or immediately after film formation. It was confirmed that it brings about better superconducting properties. Especially in the Y-based superconductor, once the thin film is taken out of the thin film production tank, water in the air is adsorbed on the surface,
Since the hydrogen treatment and the oxygen treatment react with the constituent elements of the thin film and deteriorate the characteristics, it is necessary to incorporate the hydrogen treatment and the oxygen treatment as part of the oxide thin film production process.
【0028】薄膜作製工程における水素処理と酸素処理
の仕方として、(1)薄膜堆積と同時に行う、あるい
は、(2)薄膜堆積を中断して行う、すなわち、薄膜堆
積工程と水素処理工程と酸素処理工程とを交互に周期的
に繰り返す (3)酸素雰囲気中での薄膜作製中に水素
照射のみを行う。(4)酸素雰囲気中での薄膜作製中に
酸素供給水素照射に切り替えて水素処理を行う、といっ
た方法が考えられる。As a method of hydrogen treatment and oxygen treatment in the thin film manufacturing process, (1) the thin film deposition is performed at the same time, or (2) the thin film deposition is interrupted, that is, the thin film deposition process, the hydrogen treatment process and the oxygen treatment. (3) Only hydrogen irradiation is performed during thin film formation in an oxygen atmosphere. (4) A method of performing hydrogen treatment by switching to oxygen supply hydrogen irradiation during thin film formation in an oxygen atmosphere can be considered.
【0029】まず、本発明者らは、(1)に相当する工
程として、酸化物薄膜作製中に水素照射を行ない薄膜作
製後直ちに作製槽内に酸素ガスを導入し、焼結体と同様
の徐冷プロセスによって後処理として酸素処理を施せば
良好な超伝導特性を得ることができることを確認した。First, as a step corresponding to (1), the present inventors performed hydrogen irradiation during the production of an oxide thin film, introduced oxygen gas into the production tank immediately after the production of the thin film, and carried out the same process as the sintered body. It was confirmed that good superconducting properties can be obtained by performing oxygen treatment as a post-treatment by the slow cooling process.
【0030】本発明者らは、更に、水素照射により欠陥
が制御性良く作製され、かつ酸素処理により酸素が薄膜
中に最も有効に取り込まれるのは、薄膜作製の基板温度
以下かつ常温以上のある限られた温度範囲であることを
発見し、水素処理と酸素処理は、この温度範囲で一定時
間行うことによって最も効率的かつ簡便に行えることを
発見した。この効果は、(2)の工程においても得られ
ることを本発明者らは確認した。The present inventors further found that defects were produced with good controllability by hydrogen irradiation and that oxygen was most effectively incorporated into the thin film by the oxygen treatment at a temperature lower than the substrate temperature for forming the thin film and higher than room temperature. It was discovered that the temperature range was limited, and that hydrogen treatment and oxygen treatment could be most efficiently and simply performed by performing the treatment in this temperature range for a certain period of time. The present inventors have confirmed that this effect can be obtained also in the step (2).
【0031】これらの水素処理と酸素処理を施すべき温
度は、薄膜の構成元素の種類、表面状態によっても異な
るため、各場合について最適なものを選ぶ必要がある
が、本発明者らは500℃以下300℃以上の温度範囲
にあることを確認した。なお、処理時間についても、薄
膜の種類、膜厚、表面状態に応じて最適の値が存在す
る。Since the temperature at which these hydrogen treatment and oxygen treatment should be performed differs depending on the type of the constituent elements of the thin film and the surface condition, it is necessary to select the optimum one for each case. It was confirmed that the temperature was below 300 ° C. The processing time also has an optimum value depending on the type of thin film, the film thickness, and the surface condition.
【0032】本発明者らは、水素処理と酸素処理を薄膜
堆積と同時に行う場合、あるいは、薄膜堆積を中断して
行う場合、すなわち、薄膜堆積工程と水素処理と酸素処
理工程とを交互に繰り返す場合に用いる水素処理、およ
び酸素処理の方法としては、少なくとも水素ガス、ある
いは酸素ガスの放電により生成されるイオンにより処理
する、あるいは励起状態にある中性原子を照射すること
が効果的かつ簡便であることを発見した。例えば、EC
Rプラズマ発生装置を用い、作製槽に連結されたプラズ
マ生成室内に水素、あるいは酸素を含むガスを導入し、
このガスにマイクロ波を照射して放電プラズマを発生さ
せ、これにマグネットによって磁場を印加し、イオン化
の確率を上げることで、イオンおよび中性原子による酸
化物薄膜の処理を効率的に行えることを見いだした。The inventors of the present invention carry out the hydrogen treatment and the oxygen treatment simultaneously with the thin film deposition, or when the thin film deposition is interrupted, that is, the thin film deposition step and the hydrogen treatment and the oxygen treatment step are alternately repeated. As a method of hydrogen treatment and oxygen treatment used in some cases, it is effective and convenient to treat with at least hydrogen gas or ions generated by discharge of oxygen gas, or to irradiate excited neutral atoms. I found that. For example, EC
Using the R plasma generator, a gas containing hydrogen or oxygen is introduced into the plasma generation chamber connected to the production tank,
By irradiating this gas with microwaves to generate discharge plasma and applying a magnetic field to this to increase the probability of ionization, it is possible to efficiently process the oxide thin film with ions and neutral atoms. I found it.
【0033】この様な処理を酸化物薄膜作製後、蒸着糟
から取り出して後処理工程として用いた場合、臨界温度
の改善は短時間でなされるが、臨界電流密度について
は、酸素処理が十数時間のオーダーの時間を要する。こ
のことは、酸素処理が酸素の拡散挙動によって律速さ
れ、複合酸化物薄膜全体に行き渡るのに大変長い時間を
要することを意味していると考えられる。酸素処理を薄
膜堆積、水素処理と同時に行うか、あるいは、薄膜堆
積、水素処理を中断して、すなわち、薄膜堆積工程と水
素処理工程と酸素処理工程とを交互に繰り返しながら行
うことにより、短時間で効果的な処理が可能となる。When such a treatment is carried out after forming an oxide thin film and used as a post-treatment step after being taken out from the vapor-deposition bowl, the critical temperature is improved in a short time, but with respect to the critical current density, oxygen treatment is more than ten. It takes time to order. This is considered to mean that the oxygen treatment is rate-controlled by the diffusion behavior of oxygen, and it takes a very long time to reach the entire complex oxide thin film. Oxygen treatment is performed at the same time as thin film deposition and hydrogen treatment, or by interrupting thin film deposition and hydrogen treatment, that is, performing thin film deposition step, hydrogen treatment step and oxygen treatment step alternately This enables effective processing.
【0034】水素処理並びに酸素処理を施すという点か
らだけでは、これらの処理は薄膜堆積と同時に行うのが
最も望ましいが、薄膜堆積過程の種類によっては、処理
温度が堆積基板温度に限定されるために十分な効果が得
られない、あるいは高エネルギー粒子がかえって悪影響
を及ぼす場合もあることが確認された。From the point of view of performing hydrogen treatment and oxygen treatment, it is most desirable to perform these treatments at the same time as the thin film deposition, but the treatment temperature is limited to the deposition substrate temperature depending on the kind of the thin film deposition process. It was confirmed that the sufficient effect could not be obtained, or that high-energy particles might adversely affect.
【0035】本発明者らは、むしろこれら処理を薄膜堆
積を中断して行う、すなわち薄膜堆積工程と水素処理と
酸素処理工程とを交互に繰り返しながら行なった場合
に、同等もしくはそれ以上の効果が得られることを確認
した。The inventors of the present invention rather have the same or higher effect when the thin film deposition is interrupted, that is, the thin film deposition process and the hydrogen treatment and the oxygen treatment process are alternately repeated. It was confirmed that it was obtained.
【0036】これら薄膜堆積過程においては、堆積直後
の各構成元素は励起状態にあり、場合によっては、安定
化するのに数分のオーダーの時間を要するものも多く、
特に積層構造をとるものについては、1周期構造分堆積
させる毎に堆積を中断して安定化が図られている場合も
ある。この様な堆積中断時間に水素処理と酸素処理を施
せば、短時間で理想的な水素処理と酸素処理を施せると
考えられる。In these thin film deposition processes, the respective constituent elements immediately after deposition are in an excited state, and in some cases, it takes a few minutes to stabilize,
In particular, in the case of a laminated structure, the deposition may be interrupted every time one period of the structure is deposited to stabilize the structure. It is considered that if hydrogen treatment and oxygen treatment are performed during such a deposition interruption time, ideal hydrogen treatment and oxygen treatment can be performed in a short time.
【0037】本発明者らは、適当な堆積時間毎に中断
し、水素処理と酸素処理を施すことによって、優れた特
性を有する薄膜超伝導体を得ることが出来ることを確認
した。更に、その堆積時間間隔として、その間に堆積さ
れる薄膜の厚みが10Å以上100Å以下とするものが
有効であることを確認した。また、このような工程では
特に低加速エネルギーの水素イオンが使用でき、5KV
以下の加速電圧でも効果のある事を確認した。The present inventors have confirmed that a thin film superconductor having excellent characteristics can be obtained by interrupting every suitable deposition time and performing hydrogen treatment and oxygen treatment. Furthermore, it was confirmed that it is effective to set the deposition time interval such that the thickness of the thin film deposited during that time is 10 Å or more and 100 Å or less. Further, in such a process, hydrogen ions having a particularly low acceleration energy can be used, and 5 KV
It was confirmed that the following accelerating voltage is also effective.
【0038】また、この水素処理を含めた処理プロセス
を採用する事により、従来効果が確認されなかったBi
系およびTl系超伝導体に対して超伝導臨界電流が改善
されることを確認した。そしてもちろんこの新規な方法
と装置は、従来のLn(原子番号63〜71)で構成さ
れるY系にたいしても効果のある事を確認した。Further, by adopting the treatment process including this hydrogen treatment, Bi effect, which has not been confirmed to be the conventional effect, is obtained.
It has been confirmed that the superconducting critical current is improved for the system and Tl superconductors. And, of course, it was confirmed that this new method and apparatus are effective even for the Y system composed of the conventional Ln (atomic numbers 63 to 71).
【0039】(具体的実施例)このような構成の薄膜作
製装置において、酸化マグネシウム単結晶(100)面
を基板11として用い、高周波プレーナーマグネトロン
スパッタ法により、焼結した酸化物高温超伝導材料で作
製したターゲット13をArとO2 の混合ガス雰囲気で
スパッタリング蒸着して、上記基板上に結晶性のBi−
Sr−Ca−Cu−O薄膜として堆積させた。(Specific Example) In a thin film forming apparatus having such a structure, a magnesium oxide single crystal (100) surface was used as a substrate 11, and a high temperature oxide superconducting material was sintered by high frequency planar magnetron sputtering. The prepared target 13 is sputter-deposited in a mixed gas atmosphere of Ar and O 2 , and crystalline Bi- is formed on the substrate.
It was deposited as a Sr-Ca-Cu-O thin film.
【0040】この場合、ガス圧力は、0.4 Pa、スパ
ッタリング電力160W、スパッタリング時間30分、
薄膜の膜厚0.5 μm、基板温度600℃であった。In this case, the gas pressure is 0.4 Pa, the sputtering power is 160 W, the sputtering time is 30 minutes,
The film thickness was 0.5 μm, and the substrate temperature was 600 ° C.
【0041】薄膜作製後試料を2分割し、片方の試料を
イオン照射装置のステージに設置し、ステージの温度を
10℃から500℃の間に設定し、カウフマン型のイオ
ン源で発生させた水素イオンを300Vから2KVの間
で加速して照射した。After the thin film was formed, the sample was divided into two, one sample was placed on the stage of the ion irradiation apparatus, the temperature of the stage was set between 10 ° C. and 500 ° C., and hydrogen generated by the Kauffman type ion source was used. Ions were accelerated and irradiated between 300 V and 2 KV.
【0042】その後、この試料と水素処理を行わなかっ
た試料の両方について、酸素を含んだ雰囲気中に設置し
て700℃から900℃の間で熱処理を行い、100℃
/時以下で徐冷して熱処理炉から取りだした。これら2
つの試料を比較した結果、水素照射の条件として、基板
加熱を100℃、加速電圧1KV、イオン照射量2.5
×1018/cm2の場合に77Kにおいて水素処理をしな
い場合の超伝導臨界電流密度1.0×105A/cm2が1
0倍程度改善された。Thereafter, both this sample and the sample not subjected to the hydrogen treatment were placed in an atmosphere containing oxygen and heat-treated at a temperature between 700 ° C. and 900 ° C., and a temperature of 100 ° C.
It was slowly cooled at less than / hour and taken out from the heat treatment furnace. These two
As a result of comparing two samples, as the conditions of hydrogen irradiation, the substrate heating was 100 ° C., the acceleration voltage was 1 KV, and the ion irradiation amount was 2.5.
In the case of × 10 18 / cm 2, the superconducting critical current density 1.0 × 10 5 A / cm 2 without hydrogen treatment at 77K is 1
It was improved about 0 times.
【0043】また、これら2つの試料について結晶性、
および組成を調べた結果、変化は観測されなかった。こ
の熱処理を施した試料のX線回折パターンは、良好な結
晶性のBi2Sr2Ca2Cu3Oyが作製されている事を示してお
り、このパターンは2つの試料間で差はなかった。The crystallinity of these two samples was
As a result of examining the composition and composition, no change was observed. The X-ray diffraction pattern of the sample subjected to this heat treatment shows that Bi 2 Sr 2 Ca 2 Cu 3 O y with good crystallinity was produced, and there is no difference in this pattern between the two samples. It was
【0044】これより水素活性種が酸化物超伝導体の結
晶構造には変化を与えず、臨界電流特性の改善に効果の
ある事が確認された。図1は水素処理を施した場合とそ
うでない場合の臨界電流密度の温度依存性を示す図であ
る。From this, it was confirmed that the active hydrogen species did not change the crystal structure of the oxide superconductor and was effective in improving the critical current characteristics. FIG. 1 is a diagram showing the temperature dependence of the critical current density when hydrogen treatment is performed and when hydrogen treatment is not performed.
【0045】このような水素照射は、加速電圧が小さい
ために水素が表面近傍で留まり、膜厚が大きい場合、効
果のおよぶ範囲が表面近傍に限られると考えられる。加
速電圧を大きくすることにより、効果を膜中で均一に出
来ると考えられるが、そのためには大がかりなイオン注
入装置を必要とする。一方、素活性種発生源として小型
イオンガン、高周波励起法、およびECRプラズマ法な
どは簡便な方法として良く利用されているが、上述の結
果から薄膜作製中にこれらの水素活性種発生源を用いて
臨界電流改善の効果を得る事が期待される。It is considered that such an irradiation of hydrogen is such that hydrogen stays in the vicinity of the surface because the acceleration voltage is small and the effect is limited to the vicinity of the surface when the film thickness is large. It is considered that the effect can be made uniform in the film by increasing the accelerating voltage, but for that purpose, a large-scale ion implantation device is required. On the other hand, small ion guns, high-frequency excitation method, ECR plasma method, etc. are often used as a simple source for the source of elementary species, but from the above results, it is possible to use these sources of hydrogen species during thin film formation. It is expected to obtain the effect of improving the critical current.
【0046】この水素処理と酸素処理を酸化物薄膜作製
工程の一部として組み入れる場合、酸化物薄膜作製装置
の装置構成として、図2に示すように、薄膜作製真空槽
内に、薄膜堆積のための蒸着源と水素照射のための装
置、そして酸素処理のための装置を取り付け、水素供給
口、および酸素供給口を設ける。図2の例では、蒸着源
としては、ターゲット13、マグネトロンカソード14
とシャッタ、高周波電源などで構成される高周波マグネ
トロンスパッタ装置、水素照射のための装置には水素イ
オンガンを、酸素処理のための装置としては、プラズマ
生成室16、マグネット18、マイクロ波電源等からな
るECR酸素プラズマ発生装置を用いている。蒸着源と
水素照射のための装置、そして酸素処理のための装置の
組合せの種類によっては、作製槽を分離し、ロードロッ
ク機構を設けて、基板11をホルダーごと移動出来るも
のとする。When the hydrogen treatment and the oxygen treatment are incorporated as a part of the oxide thin film production process, the oxide thin film production apparatus has a device configuration as shown in FIG. A vapor deposition source, a device for hydrogen irradiation, and a device for oxygen treatment are attached, and a hydrogen supply port and an oxygen supply port are provided. In the example of FIG. 2, the target 13 and the magnetron cathode 14 are used as the vapor deposition source.
And a shutter, a high-frequency magnetron sputtering device including a high-frequency power source, a hydrogen ion gun for hydrogen irradiation, and a plasma generation chamber 16, a magnet 18, a microwave power source, etc. for oxygen treatment. An ECR oxygen plasma generator is used. Depending on the combination of the vapor deposition source, the apparatus for irradiating hydrogen, and the apparatus for oxygen treatment, the production tank is separated, a load lock mechanism is provided, and the substrate 11 can be moved together with the holder.
【0047】酸素処理法はECRプラズマ法を用い、処
理条件は、マイクロ波パワー200W、ガス圧8.5x10-4
Torr、バイアス電圧50Vで行ない、水素処理はカ
ウフマン型の小型イオンガンを加速電圧2KVで使用し
た。この組み合わせ以外にも、酸素処理を高周波励振に
よるオゾナイザーを使用し、高周波パワー800Wで酸
素ガスを流して得られたオゾンを含む酸素ガスを真空層
に導入した。The oxygen treatment method uses the ECR plasma method, and the treatment conditions are as follows: microwave power 200 W, gas pressure 8.5 × 10 −4
Torr was performed at a bias voltage of 50 V, and the hydrogen treatment was performed using a Kauffman type small ion gun at an acceleration voltage of 2 KV. In addition to this combination, an ozonizer with high-frequency excitation was used for oxygen treatment, and oxygen gas containing ozone obtained by flowing oxygen gas with high-frequency power of 800 W was introduced into the vacuum layer.
【0048】薄膜堆積工程と水素処理工程と酸素処理工
程とを交互に周期的に繰り返す場合、1周期に堆積させ
る薄膜の厚み、および水素処理時間と酸素処理時間を、
それぞれ約100Å、5分、72秒とした。この場合薄
膜堆積は通常酸素雰囲気中で行われるため、薄膜作製条
件によっては、特に酸素処理のために時間を取らなくて
も良い。When the thin film deposition step, the hydrogen treatment step, and the oxygen treatment step are alternately repeated periodically, the thickness of the thin film to be deposited in one cycle and the hydrogen treatment time and the oxygen treatment time are
It was set to about 100Å, 5 minutes and 72 seconds, respectively. In this case, the thin film deposition is usually carried out in an oxygen atmosphere, so that it is not necessary to take a long time for the oxygen treatment depending on the thin film manufacturing conditions.
【0049】このような薄膜作製装置において行った水
素処理と酸素処理をふくめた薄膜処理工程の結果、前述
の(1)、(2)、(4)の何れの薄膜堆積工程と水素
処理工程と酸素処理工程との組合せを用いても、全く水
素処理と酸素処理を施さない場合に比べ高い転移温度を
得ることが出来、また大きな臨界電流密度が得られるこ
とを本発明者らは確認した。これに対し、(3)の場合
には薄膜の組成が変化し結晶性が劣化した。しかし最適
条件を設定する事によりこの場合でも、上述の本発明者
らの基本的な照射実験から、特性改善できる可能性は充
分にあると類推できる。As a result of the thin film processing steps including the hydrogen treatment and the oxygen treatment performed in such a thin film forming apparatus, any of the thin film deposition step and the hydrogen treatment step of (1), (2) and (4) described above is performed. The present inventors have confirmed that even when a combination with an oxygen treatment step is used, a higher transition temperature can be obtained and a larger critical current density can be obtained as compared with the case where no hydrogen treatment and oxygen treatment are performed. On the other hand, in the case of (3), the composition of the thin film changed and the crystallinity deteriorated. However, even in this case by setting the optimum conditions, it can be inferred from the above-mentioned basic irradiation experiments by the inventors that there is a sufficient possibility that the characteristics can be improved.
【0050】以上のように、これらの水素処理と酸素処
理の最適条件の変化の詳細は明かではないが、従来の方
法では改善が見られなかったBi−Sr−Ca−Cu−
O系、およびTl−Ba−Ca−Cu−O系薄膜超伝導
体の臨界電流密度を改善できる事は間違いなく、本発明
は薄膜超伝導体作製の水素処理と酸素処理の工程を確立
するものである。As described above, the details of the changes in the optimum conditions of the hydrogen treatment and the oxygen treatment are not clear, but no improvement was observed by the conventional method. Bi-Sr-Ca-Cu-
There is no doubt that the critical current densities of O-based and Tl-Ba-Ca-Cu-O-based thin film superconductors can be improved, and the present invention establishes the hydrogen treatment and oxygen treatment steps in the production of thin film superconductors. Is.
【0051】[0051]
【発明の効果】本発明は、AはLn(原子番号63〜7
1)、Tl、Biのうちの少なくとも一種、Bはアルカ
リ土類族元素のうち少なくとも一種の元素を示すA−B
−Cu−Oで表わされる酸化物薄膜に、反応性水素を照
射し、その後さらに酸素処理を施す薄膜超伝導体の製造
方法であるため、酸化物高温超伝導体を用いる素子の信
頼性、長期安定性を確保するプロセスが提供され、工業
上極めて大きな価値を有するものである。According to the present invention, A is Ln (atomic number 63 to 7).
1), at least one of Tl and Bi, and B is at least one element of alkaline earth group elements AB
Since it is a method of manufacturing a thin film superconductor in which an oxide thin film represented by -Cu-O is irradiated with reactive hydrogen and then further subjected to oxygen treatment, reliability of an element using an oxide high temperature superconductor, long-term A process for ensuring stability is provided, which has extremely great industrial value.
【0052】用いられる超伝導体は、従来の薄膜に比
べ、均質かつ薄膜単結晶化されているが故に、本発明に
より非常に高性能の超伝導素子が実現できる効率的かつ
簡便な水素処理と酸素処理工程を見いだしているところ
に大きな特色がある。Since the superconductor used is homogeneous and thin-film single-crystallized as compared with the conventional thin film, an efficient and simple hydrogen treatment capable of realizing a very high-performance superconducting device according to the present invention. There is a big feature in finding the oxygen treatment process.
【図1】水素処理および酸素処理を行った試料と、酸素
処理のみの試料との超伝導臨界電流密度の温度依存性図FIG. 1 is a temperature dependence diagram of a superconducting critical current density between a sample subjected to hydrogen treatment and oxygen treatment and a sample subjected only to oxygen treatment.
【図2】本発明の一実施例の薄膜超伝導体の製造装置の
基本構成断面図FIG. 2 is a cross-sectional view of the basic structure of a thin-film superconductor manufacturing apparatus according to an embodiment of the present invention.
11 基板 13 ターゲット 14 マグネトロンカソード 19 O2ガス導入口11 substrate 13 target 14 magnetron cathode 19 O 2 gas inlet
Claims (6)
に、反応性水素を照射し、その後さらに酸素処理を施す
ことを特徴とする薄膜超伝導体の製造方法。ここに、A
はLn(原子番号63〜71)、Tl、Biのうちの少
なくとも一種、Bはアルカリ土類族元素のうち少なくと
も一種の元素を示す。1. A method for producing a thin film superconductor, which comprises irradiating an oxide thin film represented by AB-Cu-O with reactive hydrogen and further subjecting it to oxygen treatment. Where A
Is at least one of Ln (atomic numbers 63 to 71), Tl, and Bi, and B is at least one of the alkaline earth group elements.
の作製時に、薄膜作製工程において反応性水素を照射
し、その後さらに酸素処理を施すことを特徴とする薄膜
超伝導体の製造方法。ここに、AはLn(原子番号63
〜71)、Tl、Biのうちの少なくとも一種、Bはア
ルカリ土類族元素のうち少なくとも一種の元素を示す。2. Production of a thin film superconductor characterized by irradiating reactive hydrogen in a thin film producing step during the production of an oxide thin film represented by AB-Cu-O, and then further oxygen treatment. Method. Where A is Ln (atomic number 63
~ 71), at least one of Tl and Bi, and B represents at least one of the alkaline earth group elements.
素イオンであることを特徴とする、請求項1または2何
れかに記載の薄膜超伝導体の製造方法。3. The method for producing a thin film superconductor according to claim 1, wherein the reactive hydrogen is hydrogen ions accelerated at 5 KV or less.
処理と酸素処理工程とを交互に繰り返し、かつ、1回の
薄膜堆積工程で堆積させる薄膜の厚みを100Å以下と
することを特徴とする、請求項2記載の薄膜超伝導体の
製造方法。4. The thin film manufacturing process is characterized in that a thin film deposition process and a hydrogen treatment process and an oxygen treatment process are alternately repeated, and the thickness of the thin film deposited in one thin film deposition process is 100 Å or less. The method for producing a thin film superconductor according to claim 2.
る酸化物薄膜を作製できる蒸発源、薄膜を堆積するため
の基板を設置する加熱できるステージ、酸素を供給する
ための供給孔、および水素照射のための水素供給孔を備
えたことを特徴とする薄膜超伝導体の製造装置。5. An evaporation source capable of producing an oxide thin film represented by AB-Cu-O, a heatable stage for setting a substrate for depositing the thin film, and a supply for supplying oxygen in a vacuum chamber. A thin-film superconductor manufacturing apparatus comprising a hole and a hydrogen supply hole for hydrogen irradiation.
テージに対して5KV以下の電界を印加できる水素イオ
ン源を備えたことを特徴とする請求項5記載の薄膜超伝
導体の製造装置。6. A thin film superconductor according to claim 5, further comprising a hydrogen ion source capable of applying an electric field of 5 KV or less to a stage in which a substrate can be placed and heated in a vacuum chamber. apparatus.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5068526A JPH06280018A (en) | 1993-03-26 | 1993-03-26 | Method and device for production of thin film superconductor |
| EP94302135A EP0617473B1 (en) | 1993-03-26 | 1994-03-24 | Method of fabricating an oxide superconductor |
| DE69415846T DE69415846T2 (en) | 1993-03-26 | 1994-03-24 | Method of manufacturing an oxide superconductor |
| US08/688,687 US5731270A (en) | 1993-03-26 | 1996-07-29 | Oxide superconductor and method and apparatus for fabricating the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5068526A JPH06280018A (en) | 1993-03-26 | 1993-03-26 | Method and device for production of thin film superconductor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06280018A true JPH06280018A (en) | 1994-10-04 |
Family
ID=13376262
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5068526A Pending JPH06280018A (en) | 1993-03-26 | 1993-03-26 | Method and device for production of thin film superconductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06280018A (en) |
-
1993
- 1993-03-26 JP JP5068526A patent/JPH06280018A/en active Pending
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