JPH0629861B2 - Wiring pattern detection device on printed circuit board - Google Patents

Wiring pattern detection device on printed circuit board

Info

Publication number
JPH0629861B2
JPH0629861B2 JP5641289A JP5641289A JPH0629861B2 JP H0629861 B2 JPH0629861 B2 JP H0629861B2 JP 5641289 A JP5641289 A JP 5641289A JP 5641289 A JP5641289 A JP 5641289A JP H0629861 B2 JPH0629861 B2 JP H0629861B2
Authority
JP
Japan
Prior art keywords
circuit board
printed circuit
wiring pattern
light
fluorescence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP5641289A
Other languages
Japanese (ja)
Other versions
JPH01272946A (en
Inventor
靖彦 原
晃一 柄崎
典明 氏家
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5641289A priority Critical patent/JPH0629861B2/en
Publication of JPH01272946A publication Critical patent/JPH01272946A/en
Publication of JPH0629861B2 publication Critical patent/JPH0629861B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、基材上に配線パターンを形成したプリント基
板において、少なくとも配線パターン上の傷および変色
並びに配線パターン間の薄膜残留欠陥を誤検出すること
なく配線パターンの欠陥を高信頼度で検出するプリント
基板上の配線パターン検出装置に関するものである。
TECHNICAL FIELD The present invention erroneously detects at least scratches and discoloration on a wiring pattern and a thin film residual defect between the wiring patterns in a printed circuit board having a wiring pattern formed on a base material. The present invention relates to a wiring pattern detection device on a printed circuit board that detects a defect in a wiring pattern with high reliability without performing the above.

〔従来の技術〕[Conventional technology]

例えばプリント基板などの表面に形成された配線パター
ンの欠陥の有無を検出するには、従来一般に第1図に示
すような反射方式の検出装置が用いられている。
For example, in order to detect the presence or absence of a defect in a wiring pattern formed on the surface of a printed circuit board or the like, a reflection type detection device as shown in FIG. 1 has been generally used conventionally.

本従来例の配線パターン検出装置は、プリント基板(若
しくはセラミック基板)1の配線面2に光31を照射する
ための高輝度光源11と、コンデンサレンズ21と、ハーフ
ミラー23および、前記配線面2からの反射光45を検出す
るための検出器13および、該検出器13に配線パターン像
を結像させるための結像レンズ25から構成され、プリン
ト基板1の配線面2の配線パターン3からの反射光45に
比し、基材4の表面からの反射光が暗レベルに近いた
め、これを利用して、2値化を行ない、配線パターンを
検出する。
The conventional wiring pattern detection apparatus includes a high-intensity light source 11 for irradiating a wiring surface 2 of a printed circuit board (or a ceramic substrate) 1 with light 31, a condenser lens 21, a half mirror 23, and the wiring surface 2 described above. The detector 13 for detecting the reflected light 45 from and the imaging lens 25 for forming a wiring pattern image on the detector 13 are provided from the wiring pattern 3 on the wiring surface 2 of the printed circuit board 1. Compared with the reflected light 45, the reflected light from the surface of the base material 4 is closer to the dark level, so that this is utilized to perform binarization to detect the wiring pattern.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

第2図は検出対称物であるプリント基板の一例を示す。
基材4の配線面2に配線パターン3が形成されている。
FIG. 2 shows an example of a printed circuit board which is a symmetrical object.
The wiring pattern 3 is formed on the wiring surface 2 of the base material 4.

本例のプリント基板1は、配線パターン3の上に配線パ
ターンとして正常な傷5,変色部7を生じており、また
配線パターンに誇って残銅6が存在している。
In the printed circuit board 1 of this example, a normal scratch 5 and a discolored portion 7 are formed as a wiring pattern on the wiring pattern 3, and residual copper 6 is proudly present in the wiring pattern.

上記の傷5を通るA−A断面を第3図(a)に、残銅6を
通るB−B断面を第3図(b)に、変色部7を通るC−C
断面を第3図(c)に、それぞれ示す。
The cross section AA passing through the scratch 5 is shown in FIG. 3 (a), the cross section BB passing through the residual copper 6 is shown in FIG. 3 (b), and the cross section CC passing through the discolored portion 7 is shown.
Sections are shown in FIG. 3 (c), respectively.

第1図に示した従来の配線パターン検出器によって第2
図のような欠陥を有するプリント基板1を検査した場
合、傷5や変色部7には配線パターンが存在していて機
能的には正常であるにも拘らずこれを断線と誤検出す
る。また、残銅6はパターン間をショートせしめている
欠陥であるにも拘らず、この残銅の表面か暗く見えるの
で欠陥として検出できないという不具合が有る。
The conventional wiring pattern detector shown in FIG.
When the printed circuit board 1 having a defect as shown in the figure is inspected, it is erroneously detected as a disconnection although the scratches 5 and the discolored portion 7 have a wiring pattern and are functionally normal. Further, although the residual copper 6 is a defect that short-circuits the patterns, the surface of the residual copper looks dark so that it cannot be detected as a defect.

上に述べた従来装置(第1図)による誤検出の状態を、
第4図について次に説明する。本図の横軸は位置を示
し、縦軸は検出器13で光電変換された電圧を示す。電圧
はスルーホール8のレベル即ち暗レベルを示し、電
圧Vは基材4のレベルを示し、電圧Vは配線パター
ン3のレベルを示し、電圧Vは検出器13の飽和レベル
を示し、電圧VTはシュレッショルドレベルを示す。傷
5については第4図(a)に示すごとく、傷5からの異常
に強い正反射光が検出器13に入り、検出器13は飽和電圧
に達し、ブルーミング現象を起こしてA′の位置は
シュレッショルドレベルVTに対して上下を往復する電
圧と成り、異常として検出される。変色部7については
第4図(c)に示すごとく、該変色部7の光の反射率が低
いため、本来の配線パターン3に相当した電圧Vに比
し、シュレッショルドレベルVTりも低い電圧Vしか
得られずC′の位置はあたかも配線パターン3が存在し
ないものと、即ち断線していると誤検出される。残銅6
については第3図(b)に示すごとく、肉厚が通常の配線
パターン3に比べ薄く、かつ表面反射率が低いため本来
の配線パターン3に相当した電圧Vに比して低く、シ
ュレッショルドレベルVTよりも低い電圧Vしか得ら
れずB′の位置はあたかも残銅6が存在しないごとく検
出される。
The state of erroneous detection by the conventional device (FIG. 1) described above is
Next, FIG. 4 will be described. The horizontal axis of this figure shows the position, and the vertical axis shows the voltage photoelectrically converted by the detector 13. The voltage V 0 indicates the level of the through hole 8, that is, the dark level, the voltage V 1 indicates the level of the base material 4, the voltage V 2 indicates the level of the wiring pattern 3, and the voltage V 3 indicates the saturation level of the detector 13. The voltage VT indicates the threshold level. As for the scratch 5, as shown in FIG. 4 (a), the abnormally strong specular reflection light from the scratch 5 enters the detector 13, and the detector 13 reaches the saturation voltage V 3 to cause the blooming phenomenon to cause A '. The position is a voltage that goes up and down with respect to the threshold level VT and is detected as an abnormality. As shown in FIG. 4 (c), the discoloration portion 7 has a low light reflectance of the discoloration portion 7, so that the threshold level VT is lower than the voltage V 2 corresponding to the original wiring pattern 3. Only the voltage V 5 is obtained and the position of C ′ is erroneously detected as if the wiring pattern 3 does not exist, that is, if the wiring is broken. Copper 6
As shown in FIG. 3 (b), since the thickness is smaller than that of the normal wiring pattern 3 and the surface reflectance is low, the voltage is lower than the voltage V 2 corresponding to the original wiring pattern 3 and the threshold voltage is low. Only the voltage V 4 lower than the level VT is obtained, and the position of B ′ is detected as if the residual copper 6 does not exist.

また、配線パターン3の表面が、光沢半田めっきででき
ているいわゆる半田パターンにおいては光沢のためピカ
ット光る異常に強い正反射光が検出器13に入るため、配
線パターン3上に傷5が存在する場合と同様の現象が発
生し、プリント基板1としては正常であるにもかかわら
ず、異常として検出されるため第1図に示すごとき従来
のパターン検出装置では正確にパターンを検出できない
という問題があった。
Further, in the case of a so-called solder pattern in which the surface of the wiring pattern 3 is made of bright solder plating, abnormally strong specular reflection light that shines vividly enters the detector 13 because of the luster, so that the scratch 5 exists on the wiring pattern 3. A phenomenon similar to the case occurs, and although the printed circuit board 1 is normal, it is detected as an abnormality, so that there is a problem that the conventional pattern detection device as shown in FIG. 1 cannot accurately detect the pattern. It was

本発明の目的は、上記従来技術の課題を解決すべく、基
材上に配線パターンを形成したプリント基板において、
配線パターン上の傷や変色を異常として検出することな
く、且つプリント基板として欠陥となる薄膜残留欠陥を
見逃しすることなく2値化画像信号により配線パターン
のネガチブパターンを検知して配線パターンの欠陥を高
信頼度で検出できるようにしたプリント基板上の配線パ
ターン検出装置を提供することにある。
An object of the present invention is to solve the above-mentioned problems of the prior art in a printed circuit board having a wiring pattern formed on a base material,
The negative pattern of the wiring pattern is detected by the binary image signal without detecting the defect or the discoloration on the wiring pattern as an abnormality and the thin film residual defect which is a defect as the printed circuit board is not overlooked to detect the defect of the wiring pattern. An object of the present invention is to provide a wiring pattern detection device on a printed circuit board that can be detected with high reliability.

〔課題を解決するための手段〕[Means for Solving the Problems]

本発明は、上記目的を達成するために、レーザ光源と、
該レーザ光源から発した光の中から蛍光励起能力の大き
い波長の蛍光励起光を選別して、基材上に配線パターン
を形成したプリント基板表面にほぼ垂直に照射する蛍光
励起光選別・照射手段と、上記蛍光励起光と上記プリン
ト基板とを相対的に2次元に走査する走査手段と、上記
蛍光励起光選別・照射手段により選別照射された蛍光励
起光により励起されて上記プリント基板の基材から発生
した蛍光を受光して導き、且つ上記プリント基板の表面
からの励起光の正反射光が入射しないように上記垂直照
射光軸に対して傾斜させ、且つ該垂直照射光軸に対して
対称に複数方向に配置された蛍光集光光学系と、該蛍光
集光光学系によって導かれた光から上記プリント基板の
表面からの励起光による反射光を遮光して上記プリント
基板の基材から発する蛍光を分離する分離手段と、該分
離手段により分離された蛍光を検出して信号に変換する
検出器と、上記走査手段によって2次元に走査されるこ
とによって、上記検出器から検出されるプリント基板の
基材から発生する蛍光の画像信号を所望の閾値で2値化
して少なくとも配線パターン上の傷および変色並びに配
線パターン間の薄膜残留欠陥を配線パターンと同じ暗レ
ベルにして検出する2値化回路とを備え、該2値化回路
から得られる2値化画像信号により少なくとも配線パタ
ーン上の傷および変色並びに配線パターン間の薄膜残留
欠陥を誤検出することなく、配線パターンのネガチブパ
ターンを検知し得べく構成したことを特徴とするプリン
ト基板上の配線パターン検出装置である。また、本発明
は、上記プリント基板上の配線パターン検出装置におい
て、上記蛍光集光光学系として、光ファイバー束で構成
したことを特徴とするものである。
The present invention, in order to achieve the above object, a laser light source,
Fluorescence excitation light selection / irradiation means for selecting fluorescence excitation light of a wavelength having a large fluorescence excitation ability from the light emitted from the laser light source and irradiating the surface of a printed board on which a wiring pattern is formed on a base material substantially vertically. And a scanning means for relatively two-dimensionally scanning the fluorescent excitation light and the printed circuit board, and a substrate of the printed circuit board excited by the fluorescent excitation light selectively irradiated by the fluorescent excitation light selecting / irradiating means. Is received and guided by the fluorescent light emitted from the printed circuit board, and is inclined with respect to the vertical irradiation optical axis so that specular reflection light of the excitation light from the surface of the printed circuit board does not enter, and is symmetrical with respect to the vertical irradiation optical axis. And a fluorescent light collecting optical system arranged in a plurality of directions, and the light guided by the fluorescent light collecting optical system is shielded from reflected light due to excitation light from the surface of the printed circuit board to emit light from the base material of the printed circuit board. Means for separating the fluorescent light, a detector for detecting the fluorescent light separated by the separating means and converting it into a signal, and a print detected by the scanning means by being two-dimensionally scanned. Binarization to detect the image signal of fluorescence generated from the substrate of the substrate with a desired threshold value and detect at least scratches and discoloration on the wiring pattern and thin film residual defects between the wiring patterns at the same dark level as the wiring pattern. Circuit, and detects a negative pattern of a wiring pattern without erroneously detecting at least scratches and discoloration on the wiring pattern and residual thin film defects between the wiring patterns by a binarized image signal obtained from the binarization circuit. It is a wiring pattern detection device on a printed circuit board, which is configured to be obtained. Further, the present invention is characterized in that, in the wiring pattern detecting device on the printed circuit board, the fluorescence focusing optical system is configured by an optical fiber bundle.

〔作用〕[Action]

上記構成により、基材上に配線パターンを形成したプリ
ント基板に対してレーザ光をほぼ垂直に照射して、基材
から励起されて発生する微弱な蛍光を強めることがで
き、更にプリント基板の表面から反射する正反射光が入
射しないように蛍光集光光学系を垂直照射光軸に対して
傾斜させ、且つ該垂直照射光軸に対して対称に複数方向
に配置して構成して蛍光集光光学系自体で蛍光を発生す
るのをなくす共に分離手段により微弱な蛍光像のみを分
離できるようにして少なくとも配線パターン上の傷およ
び変色並びに配線パターン間の薄膜残留欠陥を配線パタ
ーンと同じ暗レベルにし、その結果検出器から検出され
るプリント基板の基材から発生する蛍光の画像の信号を
所望の閾値で2値化して配線パターンのネガチブパター
ンを検知することにより配線パターン上の傷および変色
並びに配線パターン間の薄膜残留欠陥を誤検出すること
なく、配線パターンの欠陥を高信頼度で検出することが
できる。
With the above configuration, a laser beam is irradiated almost perpendicularly to a printed circuit board having a wiring pattern formed on the base material, and weak fluorescence generated by being excited by the base material can be intensified. The fluorescent light condensing optical system is tilted with respect to the vertical irradiation optical axis so that the specularly reflected light reflected from it does not enter, and is arranged symmetrically with respect to the vertical irradiation optical axis in a plurality of directions to collect the fluorescent light. The fluorescence is not generated in the optical system itself, and only the weak fluorescent image can be separated by the separating means so that at least scratches and discoloration on the wiring pattern and thin film residual defects between the wiring patterns are made to be the same dark level as the wiring pattern. As a result, a negative image of a wiring pattern is detected by binarizing a signal of a fluorescent image generated from a substrate of a printed circuit board detected by a detector with a desired threshold value. Ri without erroneously detecting the thin residual defects between scratches and discoloration, as well as the wiring pattern on the wiring pattern, a defect of the wiring pattern can be detected with high reliability.

〔実施例〕〔Example〕

以下、本発明に係わる一実施例を第5図乃至第8図に基
づいて説明する。
An embodiment according to the present invention will be described below with reference to FIGS.

第7図に示すように、基材4上に配線パターン3を形成
したプリント基板1において、有機物質を含む基材4か
ら発生する蛍光の画像を検出して配線パターンのネガチ
ブパターンを得るプリント基板上の配線パターン検出装
置は、例えば第5図に示すように、波長が300nmか
ら460nmまでの波長を有する蛍光励起レーザ光34
を照射するレーザ光源16と、該レーザ光源16より照
射された蛍光励起レーザ光34を拡大するビーム拡大器
17と、該ビーム拡大器17によって拡大された蛍光励
起レーザビームを偏向走査する回転ミラー18と、該回
転ミラー18で反射して走査される蛍光励起レーザビー
ムを、基材4上に配線パターン3を形成したプリント基
板1の表面にスポット光に絞ってほぼ垂直に照射するた
めのスキャンニングレンズ19と、図示するごとく、蛍
光励起レーザスポット光によりプリント基板1の有機物
を含む基材4から励起されて発生した蛍光を効率良く集
光して検出器に導くように、プリント基板1の表面から
の励起光の正反射光が入射しないように上記スキャンニ
ングレンズ19による垂直照射光軸に対して傾斜させ、
且つ該垂直照射光軸に対して対称に複数方向に配置され
た多数の光ファイバーを束ねた形の光ファイバー束20
と、プリント基板1の配線パターンの表面2および基材
4の表面で主として乱反射して光ファイバー束20に入
射する励起光をカット(遮光)し、前記基材4から発生
する蛍光のみを透過するフィルタ24と、該フィルタ2
4を透過した蛍光を受光して信号に変換する検出器であ
るフォトマルチプライヤー15とを備えている。
As shown in FIG. 7, in a printed board 1 having a wiring pattern 3 formed on a base material 4, a printed board for obtaining a negative pattern of the wiring pattern by detecting an image of fluorescence generated from the base material 4 containing an organic substance. As shown in FIG. 5, for example, the above wiring pattern detecting device has a fluorescence excitation laser beam 34 having a wavelength of 300 nm to 460 nm.
A laser light source 16 for irradiating the laser beam, a beam expander 17 for expanding the fluorescence excitation laser beam 34 emitted from the laser light source 16, and a rotating mirror 18 for deflecting and scanning the fluorescence excitation laser beam expanded by the beam expander 17. And a scanning for irradiating the surface of the printed circuit board 1 having the wiring pattern 3 formed on the substrate 4 with the fluorescence excitation laser beam reflected and scanned by the rotating mirror 18 so that the spot light is irradiated almost vertically. The surface of the printed circuit board 1 so as to efficiently collect and guide the fluorescence generated by the lens 19 and, as shown in the drawing, excited by the fluorescent excitation laser spot light from the substrate 4 containing the organic substance of the printed circuit board 1 to the detector. Tilted with respect to the vertical irradiation optical axis by the scanning lens 19 so that the regular reflection light of the excitation light from
Further, an optical fiber bundle 20 formed by bundling a large number of optical fibers arranged in a plurality of directions symmetrically with respect to the vertical irradiation optical axis.
And a filter that cuts (shields) the excitation light mainly diffused and reflected on the surface 2 of the wiring pattern of the printed circuit board 1 and the surface of the base material 4 and enters the optical fiber bundle 20, and transmits only the fluorescence generated from the base material 4. 24 and the filter 2
And a photomultiplier 15 which is a detector for receiving the fluorescence transmitted through 4 and converting it into a signal.

上記フィルタ24は、プリント基板1の配線パターン3
の表面2で主として乱反射する励起レーザ光32の波長
域の反射光を遮光して基材4で励起された蛍光のみを透
過して分離するための分離手段であり、例えば、第6図
に示すように一般にイエローフィルタY50と呼称され
ているもので、波長500nm以下の光を反射し、波長
500nm以上の蛍光を透過させるものである。
The filter 24 is the wiring pattern 3 of the printed circuit board 1.
Is a separating means for shielding the reflected light in the wavelength range of the excitation laser light 32 which is mainly diffused on the surface 2 of the above, and transmitting and separating only the fluorescence excited by the base material 4, for example, shown in FIG. As described above, the yellow filter Y50 is generally called, which reflects light having a wavelength of 500 nm or less and transmits fluorescence having a wavelength of 500 nm or more.

また、光ファイバー束24によって導かれ、フィルタ2
4を透過した基材4から発生する蛍光がフォトマルチプ
ライヤー15の受光面に結像される状態になり、上記回
転ミラー18による蛍光励起レーザスポット光の走査と
プリント基板1の走行による走査とにより2次元的走査
されてフォトマルチプライヤー15からプリント基板1
の配線パターン3のネガチブパターンの画像信号が得ら
れる。
The filter 2 is guided by the optical fiber bundle 24.
The fluorescence emitted from the base material 4 that has passed through 4 is imaged on the light-receiving surface of the photomultiplier 15, and by the scanning of the fluorescence excitation laser spot light by the rotating mirror 18 and the scanning of the printed board 1 traveling. Two-dimensionally scanned and printed from the photomultiplier 15 to the printed circuit board 1.
The image signal of the negative pattern of the wiring pattern 3 is obtained.

即ち、前記基材4から蛍光が発生しやすい波長が限定さ
れた蛍光励起レーザ光34をレーザ光源16から照射
し、ビーム拡大器17で拡大し、ビーム拡大器17によ
って拡大された蛍光励起レーザビームを回転ミラー18
でプリント基板1の表面を所定方向に偏向走査しなが
ら、スキャンニングレンズ19でスポット光にしてプリ
ント基板1の表面を照射する。すると、蛍光励起レーザ
スポット光により、有機物質を含有する基材4から励起
されて蛍光が発生し、基材上の配線パターン3からは蛍
光を発生しない。プリント基板1の表面で正反射した励
起光がほぼ垂直に戻ることになり、光ファイバー束20
に入射されない状態になる。一方基材4から発生した蛍
光とプリント基板1の表面で乱反射した光とは、合わさ
った光44として、光ファイバー束20で集光され、蛍
光励起レーザ光の波長域の光の透過率を0%にして蛍光
のみを透過するフィルタ24を通して検出器であるフォ
トマルチプライヤー15で検出する。
That is, the fluorescence excitation laser beam 34 having a limited wavelength in which fluorescence is easily emitted from the base material 4 is emitted from the laser light source 16, expanded by the beam expander 17, and expanded by the beam expander 17. The rotating mirror 18
While deflecting and scanning the surface of the printed circuit board 1 in a predetermined direction, the scanning lens 19 makes spot light to irradiate the surface of the printed circuit board 1. Then, the fluorescent excitation laser spot light excites the base material 4 containing the organic substance to generate fluorescence, and the wiring pattern 3 on the base material does not generate fluorescence. The excitation light specularly reflected by the surface of the printed circuit board 1 returns substantially vertically, and the optical fiber bundle 20
Will not be incident on. On the other hand, the fluorescence generated from the base material 4 and the light diffusedly reflected on the surface of the printed board 1 are collected by the optical fiber bundle 20 as the combined light 44, and the transmittance of the light in the wavelength region of the fluorescence excitation laser light is 0%. Then, it is detected by the photomultiplier 15 which is a detector through the filter 24 which transmits only fluorescence.

従って、上記回転ミラー18による蛍光励起レーザスポ
ット光の走査とプリント基板1の走行による走査とによ
り2次元的走査されてフォトマルチプライヤー15から
プリント基板1の配線パターン3のネガチブパターンの
画像信号が得られる。
Therefore, two-dimensional scanning is performed by scanning the fluorescent excitation laser spot light by the rotating mirror 18 and scanning by the traveling of the printed circuit board 1 to obtain an image signal of the negative pattern of the wiring pattern 3 of the printed circuit board 1 from the photomultiplier 15. To be

以上説明したように、基材4から発生する蛍光を検出す
るプリント基板上の配線パターン検出装置として作用す
るので、第2図に示した配線パターン3上に存在する配
線パターンとして正常な傷5や変色部7の影響はなく、
また配線パターンに光沢があっても問題なく配線パター
ンのネガチブパターンの検出が可能である。更に第2図
に示したような基材4の表面上に反射率の小さい残銅
(薄膜残留欠陥)6が存在すると基材4から発する蛍光
が遮断されるため、その部分の蛍光は検出されず、配線
パターンの部分とほぼ同じ暗レベルとなり、基準の配線
パターンと相違することにより、欠陥ありとして検出さ
れる。これらの状態を、検出結果に示す第8図を用いて
次に説明する。即ち、第8図は、第4図と同様、横軸は
位置を示し、縦軸は検出器であるフォトマルチプライヤ
ー15で光電変換された電圧を示す。電圧Vはスルー
ホール8のレベル、即ち暗レベルを示し、電圧Vは配
線パターンの暗レベルを示し、電圧Vは基材4の明レ
ベルを示し、電圧VTは所望の閾値であるスレッショル
ドレベルを示す。また第8図(a),(b),(c)の各図は第4
図(a),(b),(c)と同様、それぞれ第2図および第3図に
示した傷5、残銅6、変色部7の各部を検出器であるフ
ォトマルチプライヤー15が捕えた検出結果を示すもの
である。傷5については、第8図(a)に示すごとく、蛍
光が検出されないので、A′の位置は電圧Vの暗レベ
ルとなり、スレッショルドレベルVTよりも低くなって
配線パターンとして正常に検出される。また変色部7に
ついては、第8図(c)に示すごとく、蛍光が検出されな
いのでC′の位置は電圧Vの暗レベルとなり、スレッ
ショルドレベルVTよりも低くなって配線パターンとし
て正常に検出される。更に残銅6については、第8図
(b)に示すごとく、蛍光が検出されないのでB′の位置
は、電圧Vの暗レベルとなり、スレッショルドレベル
VTよりも低くなり、基準の配線パターンと相違するこ
とにより異常として検出され、残銅6の存在が認識され
ることになる。
As described above, since it functions as a wiring pattern detecting device on the printed circuit board for detecting the fluorescence generated from the base material 4, the normal scratches 5 or the like as the wiring pattern existing on the wiring pattern 3 shown in FIG. There is no influence of the discoloration part 7,
Further, even if the wiring pattern has gloss, the negative pattern of the wiring pattern can be detected without any problem. Further, when residual copper (thin film residual defect) 6 having a small reflectance is present on the surface of the base material 4 as shown in FIG. 2, the fluorescence emitted from the base material 4 is blocked, and the fluorescence of that portion is detected. However, the dark level is almost the same as that of the wiring pattern portion, and it is detected as having a defect because it is different from the reference wiring pattern. These states will be described below with reference to FIG. 8 showing the detection results. That is, in FIG. 8, as in FIG. 4, the horizontal axis indicates the position, and the vertical axis indicates the voltage photoelectrically converted by the photomultiplier 15 as the detector. The voltage V 0 indicates the level of the through hole 8, that is, the dark level, the voltage V 6 indicates the dark level of the wiring pattern, the voltage V 7 indicates the bright level of the base material 4, and the voltage VT is a threshold value that is a desired threshold value. Indicates the level. In addition, each figure of (a), (b), (c) of FIG.
Similar to FIGS. (A), (b), and (c), the photomultiplier 15 as a detector captured each of the scratch 5, the residual copper 6, and the discolored portion 7 shown in FIGS. 2 and 3, respectively. It shows a detection result. The wound 5, as shown in Figure 8 (a), since the fluorescence is not detected, the position of the A 'becomes a dark level voltage V 6, is normally detected as a wiring pattern is lower than the threshold level VT . With respect to the discoloration 7, as shown in Figure 8 (c), the position of C 'because fluorescence is not detected becomes a dark level voltage V 6, is normally detected as a wiring pattern is lower than the threshold level VT It For residual copper 6, see Fig. 8.
As (b), the position of the so fluorescence is not detected B 'becomes a dark level voltage V 6, is lower than the threshold level VT, is detected as an abnormal By differs from the reference wiring patterns, copper remaining The existence of 6 will be recognized.

また、プリント基板1において、配線パターン3の表面
2が、光沢はんだめっきでできているいわゆるはんだパ
ターンにおいても、第2図における基材4の部分の蛍光
を検出することについては詳細に説明した前記実施例と
変わることがないため、正確に配線パターンを検出する
ことができる。
Further, in the printed circuit board 1, even in the case where the surface 2 of the wiring pattern 3 is made of bright solder plating, so-called solder pattern, detecting fluorescence of the portion of the base material 4 in FIG. 2 has been described in detail above. Since there is no difference from the embodiment, the wiring pattern can be accurately detected.

〔発明の効果〕 以上詳述したように、本発明によれば、基材上に配線パ
ターンを形成したプリント基板に対してレーザ光をほぼ
垂直に照射して、基材から励起されて発生する微弱な蛍
光を強めることができ、更にプリント基板の表面から反
射する正反射光が入射しないように蛍光集光光学系を垂
直照射光軸に対して傾斜させ、且つ該垂直照射光軸に対
して対称に複数方向に配置して構成して蛍光集光光学系
自体で蛍光を発生するのをなくす共に分離手段により微
弱な蛍光像のみを分離できるようにして少なくとも配線
パターン上の傷および変色並びに配線パターン間の薄膜
残留欠陥を配線パターンと同じ暗レベルにし、その結果
検出器から検出されるプリント基板の基材から発生する
蛍光の画像の信号を所望の閾値で2値化して配線パター
ンのネガチブパターンを検知することにより配線パター
ン上の傷および変色並びに配線パターン間の薄膜残留欠
陥を誤検出することなく、配線パターンの欠陥を高信頼
度で検出することができる優れた実用的な効果を奏す
る。
[Effects of the Invention] As described in detail above, according to the present invention, a printed circuit board having a wiring pattern formed on a base material is irradiated with laser light substantially perpendicularly and is excited by the base material. The fluorescent condensing optical system can be tilted with respect to the vertical irradiation optical axis so that weak fluorescence can be strengthened, and further, specular reflection light reflected from the surface of the printed circuit board does not enter, and with respect to the vertical irradiation optical axis. The fluorescent light condensing optical system itself is arranged symmetrically in a plurality of directions so as to eliminate the generation of fluorescence, and at least the weak fluorescent image can be separated by the separating means so that at least scratches and discoloration on the wiring pattern and wiring The thin film residual defect between the patterns is set to the same dark level as the wiring pattern, and as a result, the signal of the fluorescence image generated from the substrate of the printed circuit board detected by the detector is binarized with a desired threshold value By detecting the negative pattern of the wiring pattern, it is possible to detect wiring pattern defects with high reliability without erroneously detecting scratches and discoloration on wiring patterns and thin film residual defects between wiring patterns. Play.

【図面の簡単な説明】[Brief description of drawings]

第1図は従来の配線パターン検出装置の側面図、第2図
はプリント基板の平面図、第3図は(a)は第2図のA−
A断面図、第3図(b)は第2図のB−B断面図、第3図
(c)は第2図のC−C断面図、第4図(a),(b),(c)はそれ
ぞれ従来の配線パターン検出装置における検出結果を示
す図、第5図及び第6図は本発明の実施例で用いるフィ
ルタ等の特性を示す図、第7図は本発明のプリント基板
上の配線パターン検出装置の一実施例を示す側面図、第
8図(a),(b),(c)はそれぞれ第7図に示す実施例におけ
る検出結果を示す図である。 1…プリント基板、3…配線パターン、4…基材、5…
傷、6…残銅(薄膜残留欠陥)、7…変色部、8…スル
ーホール、15…フォトマルチプライヤー、16…レーザ光
源、17…ビーム拡大器、18…回転ミラー、19…スキャン
ニングレンズ、20…光ファイバー束、24…フィルタ。
FIG. 1 is a side view of a conventional wiring pattern detecting device, FIG. 2 is a plan view of a printed circuit board, and FIG. 3 (a) is A- of FIG.
Sectional view A, FIG. 3B is a sectional view taken along line BB in FIG. 2, and FIG.
(c) is a cross-sectional view taken along the line CC of FIG. 2, and FIGS. 4 (a), (b), and (c) are diagrams showing the detection results of the conventional wiring pattern detection device, FIG. 5, and FIG. 6, respectively. FIG. 7 is a diagram showing characteristics of filters and the like used in the embodiment of the present invention, FIG. 7 is a side view showing an embodiment of a wiring pattern detecting device on a printed circuit board of the present invention, and FIGS. 8 (a) and 8 (b). , (c) are diagrams showing detection results in the embodiment shown in FIG. 7, respectively. 1 ... Printed circuit board, 3 ... Wiring pattern, 4 ... Base material, 5 ...
Scratches, 6 ... residual copper (thin film residual defects), 7 ... discolored part, 8 ... through hole, 15 ... photomultiplier, 16 ... laser light source, 17 ... beam expander, 18 ... rotating mirror, 19 ... scanning lens, 20… optical fiber bundle, 24… filter.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭56−82544(JP,A) 特開 昭53−45180(JP,A) 「顕微鏡の使い方」第5版,石澤政男・ 田中克巳、裳革房P165〜169 ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-56-82544 (JP, A) JP-A-53-45180 (JP, A) "How to use a microscope" 5th edition, Masao Ishizawa, Katsumi Tanaka, Nobu Leather tassel P165-169

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】レーザ光源と、該レーザ光源から発した光
の中から蛍光励起能力の大きい波長の蛍光励起光を選別
して、基材上に配線パターンを形成したプリント基板表
面にほぼ垂直に照射する蛍光励起光選別・照射手段と、
上記蛍光励起光と上記プリント基板とを相対的に2次元
に走査する走査手段と、上記蛍光励起光選別・照射手段
により選別照射された蛍光励起光により励起されて上記
プリント基板の基材から発生した蛍光を受光して導き、
且つ上記プリント基板の表面からの励起光の正反射光が
入射しないように上記垂直照射光軸に対して傾斜させ、
且つ該垂直照射光軸に対して対称に複数方向に配置され
た蛍光集光光学系と、該蛍光集光光学系によって導かれ
た光から上記プリント基板の表面からの励起光による反
射光を遮光して上記プリント基板の基材から発する蛍光
を分離する分離手段と、該分離手段により分離された蛍
光を検出して信号に変換する検出器と、上記走査手段に
よって2次元に走査されることによって、上記検出器か
ら検出されるプリント基板の基材から発生する蛍光の画
像信号を所望の閾値で2値化して少なくとも配線パター
ン上の傷および変色並びに配線パターン間の薄膜残留欠
陥を配線パターンと同じ暗レベルにして検出する2値化
回路とを備え、該2値化回路から得られる2値化画像信
号により少なくとも配線パターン上の傷および変色並び
に配線パターン間の薄膜残留欠陥を誤検出することな
く、配線パターンのネガチブパターンを検知し得べく構
成したことを特徴とするプリント基板上の配線パターン
検出装置。
1. A laser light source and fluorescent excitation light of a wavelength having a large fluorescence excitation ability are selected from light emitted from the laser light source, and are substantially perpendicular to a surface of a printed circuit board having a wiring pattern formed on a base material. Fluorescence excitation light selection and irradiation means for irradiation,
Scanning means for relatively two-dimensionally scanning the fluorescent excitation light and the printed circuit board, and excitation from the fluorescent excitation light selectively irradiated by the fluorescent excitation light selecting / irradiating means to generate from the substrate of the printed circuit board. Receives and guides the emitted fluorescence,
And tilted with respect to the vertical irradiation optical axis so that the regular reflection light of the excitation light from the surface of the printed circuit board does not enter,
In addition, a fluorescent light condensing optical system is arranged symmetrically with respect to the vertical irradiation optical axis, and light reflected by the excitation light from the surface of the printed circuit board is shielded from the light guided by the fluorescent light condensing optical system. A separating means for separating the fluorescence emitted from the base material of the printed circuit board, a detector for detecting the fluorescence separated by the separating means and converting it into a signal, and two-dimensional scanning by the scanning means. , The image signal of the fluorescence generated from the substrate of the printed circuit board detected by the detector is binarized by a desired threshold value, and at least scratches and discoloration on the wiring pattern and thin film residual defects between the wiring patterns are the same as those of the wiring pattern. A binarization circuit for detecting a dark level and detecting at least scratches and discoloration on wiring patterns and between wiring patterns by a binarized image signal obtained from the binarization circuit. Without erroneously detecting the thin residual defects, the wiring pattern detection device on the printed circuit board, characterized by being configured to obtain detect the negatives pattern of a wiring pattern.
【請求項2】上記蛍光集光光学系として、光ファイバー
束で構成したことを特徴とする特許請求の範囲第1項記
載のプリント基板上の配線パターン検出装置。
2. The wiring pattern detecting device on a printed circuit board according to claim 1, wherein the fluorescence focusing optical system is composed of an optical fiber bundle.
JP5641289A 1989-03-10 1989-03-10 Wiring pattern detection device on printed circuit board Expired - Lifetime JPH0629861B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5641289A JPH0629861B2 (en) 1989-03-10 1989-03-10 Wiring pattern detection device on printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5641289A JPH0629861B2 (en) 1989-03-10 1989-03-10 Wiring pattern detection device on printed circuit board

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP58106750A Division JPS59232344A (en) 1983-06-16 1983-06-16 Detector for wiring pattern

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP3338155A Division JPH0723873B2 (en) 1991-12-20 1991-12-20 Wiring pattern defect detection method on printed circuit board

Publications (2)

Publication Number Publication Date
JPH01272946A JPH01272946A (en) 1989-10-31
JPH0629861B2 true JPH0629861B2 (en) 1994-04-20

Family

ID=13026434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5641289A Expired - Lifetime JPH0629861B2 (en) 1989-03-10 1989-03-10 Wiring pattern detection device on printed circuit board

Country Status (1)

Country Link
JP (1) JPH0629861B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03209152A (en) * 1990-01-11 1991-09-12 Matsushita Electron Corp Inspecting device for electronic parts

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5345180A (en) * 1976-10-06 1978-04-22 Hitachi Ltd Photoetching method
JPS5682544A (en) * 1979-12-06 1981-07-06 Fujitsu Ltd Residual resist inspecting method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
「顕微鏡の使い方」第5版,石澤政男・田中克巳、裳革房P165〜169

Also Published As

Publication number Publication date
JPH01272946A (en) 1989-10-31

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