JPH06342009A - Substrate probe - Google Patents

Abstract

(57) [Summary] [Object] An object of the present invention is to realize a substrate probe capable of reliably and accurately abutting a contact pin at a corresponding predetermined position on an electric substrate to be inspected. In the substrate probe, a component guide that follows the outer shape of at least one of the components mounted on the electrical board to be inspected is provided on the substrate probe, and when the pin for signal extraction is pressed against the electrical board to be inspected Since the pin is positioned by the guide so that the pin comes into pressure contact with the predetermined position of the electric board to be inspected, the pin can be surely brought into press contact with the predetermined position on the electric board to be inspected, and thus, surely. Further, it is possible to realize a substrate probe that can accurately bring the contact pin into contact with a predetermined position on the electric substrate to be inspected.

Description

Detailed Description of the Invention

[0001]

[Table of Contents] The present invention will be described in the following order. Field of Industrial Application Conventional Technology Problems to be Solved by the Invention Means for Solving the Problems (FIGS. 1 to 6) Actions (FIGS. 1 to 6) Examples (FIGS. 1 to 6) Effects of the Invention

[0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate probe, and is suitable for application to, for example, a substrate probe for taking out a signal from the circuit board of an electric device when inspecting the circuit board.

[0003]

2. Description of the Related Art In conventional electric equipment, signals are often taken out from a circuit board mounted on the equipment body in order to inspect and adjust the performance of the electric equipment. A substrate probe (hereinafter referred to as a pin board) is used as one of the means for taking out. The pinboard is associated with a predetermined position (hereinafter referred to as a signal extraction position) on a circuit pattern formed on the circuit board to be inspected or adjusted, and one or more pinboards are arranged in the same positional relationship as the signal extraction position. Contact pins made of a conductor are sequentially arranged so as to penetrate a plate-shaped board member, and the board members are pressed against the circuit board so that the tips of the contact pins come into contact with corresponding signal extraction positions. As a result, signals can be taken out from the respective signal taking-out positions via the contact pins.

In this case, in the method of inspecting and adjusting a circuit board using such a pin board, it is necessary to surely bring each contact pin into contact with a corresponding signal extraction position on the circuit board. For this reason, in the method of inspecting and adjusting a circuit board using a pin board, usually, a hole formed at a predetermined position of the circuit board for the purpose of accurately mounting the circuit board on the main body of the electric device (hereinafter referred to as a mounting position fixing hole). The circuit board is accurately attached to the device main body by passing it through the corresponding protrusion of the device main body, and the device main body is positioned in a predetermined state in this state, so that the predetermined moving mechanism is operated. The contact pins of the pin board to be moved are securely brought into contact with the corresponding signal extraction positions.

[0005]

However, with the recent miniaturization of products, the circuit boards of each electric equipment product are also miniaturized and highly densified. For this reason, in this type of circuit board, it is becoming difficult to secure a space for forming the mounting position fixing hole as described above, and as a result, the circuit board cannot be accurately mounted to the device main body, so It is becoming difficult to surely bring the contact pin into contact with each signal extraction position on the circuit board.

The present invention has been made in consideration of the above points, and is intended to realize a substrate probe which can surely and accurately bring a contact pin into contact with a corresponding signal extraction position on an electric substrate to be inspected. Is.

[0007]

In order to solve the above problems, in the present invention, at least one or more pins 18A are provided.
To 18C, and the pins 18A to 18C are pressed into contact with predetermined positions 34A to 34C on the electrical board 5 to be inspected on which at least one or more components 21 are mounted.
-18C, the board probe 16 for extracting a signal is provided with a component guide 33 that follows the outer shape of at least one of the components 21 mounted on the electrical board 5 to be inspected, and the pins 18A to 18C are pressed against the electrical board 5 to be inspected. When this is done, the pins 18A to 18C are positioned by the component guide 33 so that the pins 18A to 18C are in pressure contact with the predetermined positions 34A to 34C of the electrical board 5 to be inspected.

Further, in the present invention, the parts guide 33
Has elasticity so that it can move in a substantially vertical direction with respect to the electrical board 5 to be inspected.

Further, in the present invention, the substrate probe 1
Reference numeral 6 is provided with a position copying means 15 having elasticity capable of moving and rotating in parallel to the electric board 5 to be inspected.

Further, in the present invention, the position copying means 1
5 is a first plate-shaped member 40 whose first surface is always held in parallel with one surface of the electrical board 5 to be inspected by a predetermined holding means 17, and a first plate-shaped member 40 of the first plate-shaped member 40. The first surface of the first plate-shaped member 40 is arranged so that the second surface on the back surface side and the first surface of the second plate-shaped member 41 face the surface 1 in parallel with each other at a predetermined distance. The first plate-like member bridging between the end faces 40A, 40B and the first end faces 41A, 41B of the second plate member 41 facing the same direction as the first end faces 40A, 40B of the first plate member 40. Of the elastic members 42A to 42D and the third plate-shaped member 44 in which the substrate probe 16 is attached to the second surface and the first surface on the back surface side with respect to the first surface of the second plate-shaped member 41. The first end surface 40A of the second plate-shaped member 41 is arranged so that the second surface on the back surface side of the first surface faces in parallel with a predetermined distance. The second end face of the second plate-shaped member 41 facing the direction different from 40B and the first end face 43A of the third plate-shaped member 43 facing the same direction as the second end face of the second plate-shaped member 41. Second plate-shaped elastic member 4 bridging between the first and the second portions 43B, 43B.
4A to 44D are provided, and when the component guide 33 follows the outer shape of the component mounted on the electrical board 5 to be inspected, according to the horizontal external force applied from the component 21 to the substrate probe 16 via the component guide 33. Second plate member 41 and third
By moving and / or rotating the plate-shaped member 44 of the first plate-shaped member 40 in parallel with the first plate-shaped member 40, the pins 18A to 18C are pressed against the predetermined positions 34A to 34C of the electric board 5 to be inspected. 16 is moved and / or rotated in parallel with the electric board 5 to be inspected.

[0011]

When the pins 18A to 18C are brought into pressure contact with the electric board 5 to be inspected, the parts guide 33 is used to move the pins 18A to 18C.
Since the pins 18A to 18C are positioned so that C contacts the predetermined positions 34A to 34C of the electric board 5 to be inspected, the pins 18A to 18C are surely fixed to the predetermined positions 34A to 34C on the electric board 5 to be inspected. It can be pressed against 34C.

[0012]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings.

In FIG. 1, reference numeral 1 denotes a board inspection apparatus as a whole, and an apparatus body 2 of an electronic apparatus to be inspected is designated by positioning blocks 4A, 4B, 4C and 4D on a plate-shaped base member 3. By mounting on the mounting position, the circuit board 5 attached to the device main body 2 can be roughly set at a predetermined position without special positioning. In this case, a plate-shaped guide mounting member 10 is planted at one end of the base member 3 vertically to the base member 3, and a rod-shaped guide plate 11 is vertically mounted to the front surface of the guide mounting member 10. Is attached to.

The guide plate 11 is slidably fitted into a groove 12A formed in one side surface (hereinafter, this surface is referred to as a rear surface) of a rectangular parallelepiped slide member 12, whereby the slide member 12 slides. It is designed to guide the direction. In the slide member 12, a plate-shaped output shaft connecting member 13 is arranged on the side surface adjacent to the rear surface, and the output of the air cylinder 14 arranged at one end of the upper surface of the base member 3 in the output shaft connecting member 13. The guide plate 11 is connected to the shaft 14A and thereby moves in the guide plate 11 in response to an upward force indicated by an arrow a perpendicular to the base member 3 supplied from the air cylinder 14 via the output shaft 14A and a downward force opposite thereto. It is designed to be slidable in the vertical direction.

On the side surface of the slide member 12 which faces the rear surface, a pin board 16 and a pattern surface of the circuit board 5 are provided via a fine adjustment section 15 having elasticity capable of moving and rotating in parallel with the base member 3. The base member 3 is attached so as to be opposed to the base member 3 so as to project in a front direction parallel to the base member 3 and perpendicular to the upward direction. In this case, a plurality of contact pins 18A, 18 are provided at the tip of the pin board 16 so that the tips face a plurality of signal extraction positions on the circuit board 3.
B and 18C are arranged so as to penetrate the pin board 16.

Further, the contact pins 18A to 18C.
, Codes 19A, 19B and 19C respectively
Is electrically connected to the measuring instrument 20 via the, and thereby the signals taken out from the respective signal taking-out positions are supplied to the measuring instrument 20. As a result, in the board inspection apparatus 1, in the inspection mode, the pin board 16 is slid downward by the up-and-down mechanism 17 so that the contact pins 18A to 18C come into contact with the corresponding signal extraction positions. The circuit board 5 can be inspected based on the signals supplied from the signal extraction positions to the measuring instrument 20 via the contact pins 18A to 18C and the cords 19A to 19C.

In addition to this structure, in the case of this board inspection apparatus 1, the tip end portion of the pin board 16 faces a predetermined electronic component 21 mounted on the circuit board 5 (hereinafter referred to as a reference electronic component 21). The following mechanism unit 30 is formed. As shown in FIG. 2, the following mechanism 22
First and second through holes 16A arranged in parallel so as to face the reference electronic component 21 following the tip of the pin board 16,
A mounting block 31 having a rectangular parallelepiped shape is arranged so as to block 16B.

The mounting block 31 has first and second through holes 16A and 16B of the pin board 16 having a diameter smaller than that of the first and second through holes 16A and 16B of the pin board 16 respectively. Through-holes 31A and 31B are formed respectively, so that the mounting block 31
Of the first through hole 31A of the pin board 16 and the first through hole 16A of the pin board 16 are connected to communicate with the upper surface of the mounting block 31 from the lower surface of the pin board 16 (hereinafter referred to as the first support member insertion hole). ) Is formed, the second through hole of the pin board and the second through hole of the mounting block are connected to each other so that the mounting block 31 is attached from the lower surface of the pin board 16.
Through hole (hereinafter, referred to as a second support member insertion hole) that communicates with the upper surface of the. A rod-shaped first support member 32 is provided in each of the first and second support member insertion holes.
A rectangular guide having a groove 33A having a trapezoidal cross section formed on the lower surface at the lower ends of the first and second support members 32A and 32B. Block 33 is attached.

Therefore, in the board inspecting apparatus 1, the reference electronic member 21 following the groove 33A of the guide block 33 is fitted in the inspection mode, so that the pin board 16 is fitted to the circuit board 5 in accordance with the reference electronic component. The contact pins 18A to 18C can be reliably brought into contact with the predetermined signal extraction positions 34A, 34B and 34C, respectively. Further, disc-shaped falling-off preventing members 35A and 35B are attached to the upper ends of the first and second supporting members 32A and 32B, respectively.
The second support member 32A and the second support member 32B do not fall out from the first and second support member through holes, respectively. Further, coil springs 36A and 36B are fitted between the guide block 33 and the mounting block 30 of the first and second support members 32A and 32B, respectively, and thus the coil springs 36A and 36B are added to the guide block 33 in the vertical direction. When the groove 33A of the guide block 33 is fitted into the profile reference electronic component 21 by absorbing the unnecessary force, the profile reference electronic component 21
It is designed not to give unnecessary power to.

In the case of this embodiment, in the fine adjustment section 15, as is apparent from FIG. 1, the first plate-shaped member 40 projects forward from the lower end of the front surface of the slide member 12 in parallel with the base member 3. As shown in FIG. 3, a second plate-shaped member 41 having the same lateral width as that of the first plate-shaped member 40 is fixed to the upper side of the first plate-shaped member 40. It is attached via 42A, 42B, 42C and 42D. In this case, in the leaf springs 42A to 42D, both end portions of the side surface 41A facing leftward indicated by the arrow c orthogonal to the upward direction and the forward direction of the second plate-shaped member,
And the second plate-shaped member 41 is provided so as to bridge between the first plate-shaped member 40 and the second plate-shaped member 41 at both ends of the side surface 41B facing the side surface.
Are held so as to be stacked in parallel with the first plate member 40 with a gap.

Therefore, in the second plate-shaped member 41, the elasticity of the plate springs 42A to 42D keeps the state parallel to the first plate-shaped member 40 (and the base member 5) and the left direction and It can be moved by a minute distance so as to slide in the right direction opposite to this (hereinafter collectively referred to as lateral direction), and the state parallel to the first plate member 40 (and the base member 5) can be achieved. It can be rotated clockwise or counterclockwise by a slight angle while holding.

Above the second plate member 41, a third plate member 43 having the same vertical width as the second plate member 41 is provided.
Are attached via leaf springs 44A, 44B, 44C and 44D. In this case, in the leaf springs 44A to 44D, the side surface 43A of the third plate member 43 facing the front direction.
Are arranged so as to bridge between the second plate-shaped member 41 and the third plate-shaped member 43 at both end portions of the side surface 43B facing the side surface and the side surface 43B, and thereby the third plate-shaped member. 43 is held so as to be laminated in parallel with the second plate-like member 41 with a gap.

Therefore, in the third plate-shaped member 43, the elasticity of the plate springs 44A to 44D keeps the state parallel to the first plate-shaped member 40 (and the base member 5) in the front-back direction. It is possible to move by a slight distance so as to slide, and further to be able to rotate clockwise and counterclockwise by a slight angle while maintaining a state parallel to the first plate member 40 (and the base member 5). Has been done. Therefore, in the fine adjustment unit 15, the third plate-shaped member 43
The pinboard 16 attached to the upper surface of the is given a degree of freedom that it can slide in the front-rear and left-right directions by a minute distance, and at the same time, a degree of freedom that it can rotate clockwise and counterclockwise by a minute angle. It is done like this.

In the above configuration, the board inspection apparatus 1 concerned
Then, when inspecting the electronic device, the device body 2 is mounted on the mounting position specified by the positioning blocks 4A to 4D on the base member 3. In this case, since the circuit board 5 of the electronic device is attached to the device body 2 without any special positioning, the position of the profile reference electronic component 21 mounted on the circuit board 5 as shown in FIG. There may be a slight deviation Δx from a predetermined position facing the groove 33A of the guide block 33 of the tracing mechanism section 30.

In such a case, as is apparent from FIG. 4, the contact pins 18A to 18C are also displaced from the positions directly above the corresponding signal extraction positions 34A to 34C by a distance Δx, and accordingly, the pin board. If 16 is slid downward as it is, each contact pin 18
There is no guarantee that the tips of A to 18C will surely contact the corresponding signal extraction positions 34A to 34C. However, in the board inspection apparatus 1, the pinboard 16 has the degrees of freedom in the front-rear, left-right direction, rightward rotation, and leftward rotation by the fine adjustment unit 15, so that the guide block of the tracing mechanism unit 30 is provided as shown in FIG. The groove 33 of the guide block 33 is fitted in the reference electronic component 21 following the groove 33A of the guide 33.
The position of the guide block 33 is gradually corrected (followed) to a predetermined fitting position because the side wall of A slides on the upper end portion of the follower reference component 21, and as a result, the pinboard 16 concerned.
Is corrected with respect to the circuit board 5.

Therefore, in the board inspecting apparatus 1, as shown in FIG. 6, the pin board 1 is at a stage where the groove 33A of the guide block 33 is fitted into the conforming reference electronic component 21.
The position of 6 with respect to the circuit board 5 is accurately corrected so as not to be displaced from the predetermined position, and thus each contact pin 18
The tips of A to 18C can be surely brought into contact with the corresponding signal extraction positions 35A to 35C.

According to the above construction, the pinboard 16 is provided with a degree of freedom for parallel movement in the front-rear, left-right direction and the rotational direction, and the mechanism portion 3 following the pinboard 16 is provided.
Since 0 is provided, the pinboard 16 can be used in the inspection mode.
Is a reference 21 based on predetermined electronic components mounted on the circuit board 5.
Is corrected so as to be located at a predetermined position. Accordingly, each contact pin 18A arranged on the pin board 16 concerned
The signal extraction position 35A corresponding to the tip of 18C
Therefore, it is possible to realize a board inspecting device that can inspect the circuit board to be inspected reliably and accurately.

In the above embodiment, the fine adjustment unit 1
5 to the first to third plate members 40, 41 and 43 and 8
The case where the leaf springs 42A to 42D and 44A to 44D are formed is described, but the present invention is not limited to this, and the point is that the pinboard 16 can be moved in the front-rear, left-right direction, clockwise, and counterclockwise. Various other structures can be applied as the structure of the fine adjustment unit 15 as long as the structure has a small degree of freedom.

Further, in the above-described embodiment, the case where only one mechanism unit 30 following the pinboard 16 is provided has been described, but the present invention is not limited to this, and the pinboard 16 can follow two or more mechanisms. The mechanism section 30 may be formed so that each tracing mechanism section 30 can be made to follow the corresponding electronic component on the circuit board 5.

Further, in the above-mentioned embodiment, the case where the coil springs 36A and 36B are used as means for giving the guide block 33 elasticity in the vertical direction has been described, but the present invention is not limited to this, and the guide block 33 is not limited to this.
An elastic member formed of, for example, a rubber material may be used as the means for imparting vertical elasticity to the above, and various other elastic members can be applied.

Further, in the above-mentioned embodiment, the case where the tracing mechanism portion 30 is formed by the mounting block 31, the first and second supporting members 36A and 36B, the guide block 33, etc. has been described. Is not limited to this, and various other configurations can be applied.

Further, in the above embodiment, the case where the tracing mechanism section 30 is made to follow the electronic component 21 mounted on the circuit board 5 has been described, but the present invention is not limited to this, and the tracing mechanism section 30 is not limited to this. May follow other components other than the electronic component 21 mounted on the circuit board 5.

[0033]

As described above, according to the present invention, in the board probe, the board probe is provided with a part guide that follows at least one outer shape of the part mounted on the electrical board to be inspected, and the pin for signal extraction is provided. When press-contacting the electric board to the electric board to be inspected, the pin is positioned so that the pin is pressed to a predetermined position of the electric board to be inspected by the component guide, so that the pin is surely placed on the electric board to be inspected. Thus, it is possible to realize a substrate probe that can be pressed into contact with a predetermined position of the contact pin, and can surely and accurately bring the contact pin into contact with a corresponding signal extraction position on the electric substrate to be inspected.

[Brief description of drawings]

FIG. 1 is a perspective view showing an overall configuration of a board inspection apparatus according to an embodiment.

FIG. 2 is a side view showing a configuration of a tracing mechanism part partially with a cross section.

FIG. 3 is a perspective view showing details of a fine adjustment unit.

FIG. 4 is a partial cross-sectional side view for explaining the operation of the following mechanism in the inspection mode.

FIG. 5 is a partial cross-sectional side view for explaining the operation of the following mechanism in the inspection mode.

FIG. 6 is a partial cross-sectional side view for explaining the operation of the following mechanism in the inspection mode.

[Explanation of reference numerals] 1 ... Board inspection device, 5 ... Circuit board, 15 ... Fine adjustment section, 16 ... Pin board, 17 ... Vertical mechanism section, 18A
~ 18C ... contact pin, 21 ... follow-up reference electronic component, 30 ... follow-up mechanism part, 33 ... guide block, 33A ... groove, 34A to 34C ... signal extraction position, 36A, 36B ... coil spring, 40 ... First plate-shaped member, 41 ... Second plate-shaped member, 42A to 42D, 4
4A to 44D ... Leaf spring, 43 ... Third plate-shaped member.

Claims (4)

[Claims] 1. A signal is taken out through the pin by pressing the pin at a predetermined position on an electric board to be inspected, which has at least one pin and has at least one component mounted thereon. The board probe includes a component guide that follows the outer shape of at least one of the components mounted on the electrical board to be inspected, and the pin guides the pin when the pin is pressed against the electrical board to be inspected. The board probe is characterized in that the pin is positioned so as to press-contact with the predetermined position of the electric board to be inspected. 2. The substrate probe according to claim 1, wherein the component guide has elasticity capable of moving in a substantially vertical direction with respect to the electrical board to be inspected. 3. The substrate probe according to claim 1, wherein the substrate probe is provided with a position copying means having elasticity capable of moving and rotating in parallel to the electrical board to be inspected. 4. The position copying means comprises a first plate-shaped member which is held by a predetermined holding means such that the first surface thereof is always parallel to one surface of the electrical board to be inspected, and the first plate-shaped member. The first plate of the first plate so that the second surface on the back surface side of the first plate of the plate member and the first surface of the second plate member face each other in parallel at a predetermined distance. First plate-shaped elastic member bridging between the first end surface of the plate-shaped member and the first end surface of the second plate-shaped member facing the same direction as the first end surface of the first plate-shaped member And the first surface of the third plate-shaped member in which the substrate probe is attached to the second surface and the first surface on the back surface side with respect to the first surface of the second plate-shaped member. The second surface on the back surface side of the second surface of the second surface so that they face each other in parallel at a predetermined distance.
The second end face of the second plate member facing the direction different from the first end face of the plate member and the second end face of the second plate member facing the same direction as the third end face of the second plate member. A second plate-shaped elastic member bridging between the first end faces of the plate-shaped member of
When the component guide follows the outer shape of the component mounted on the electrical board to be inspected, the second plate shape is produced in accordance with the horizontal external force applied from the component to the substrate probe via the component guide. By moving and / or rotating the member and the third plate-shaped member in parallel with the first plate-shaped member, the board is pressed against the predetermined position of the electrical board under test. 4. The substrate probe according to claim 3, wherein the probe is moved and / or rotated in parallel with the electric board to be inspected.