JPH06350184A - Thin film waveguide crystal and manufacturing method thereof - Google Patents
Thin film waveguide crystal and manufacturing method thereofInfo
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- JPH06350184A JPH06350184A JP13754493A JP13754493A JPH06350184A JP H06350184 A JPH06350184 A JP H06350184A JP 13754493 A JP13754493 A JP 13754493A JP 13754493 A JP13754493 A JP 13754493A JP H06350184 A JPH06350184 A JP H06350184A
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- thin film
- crystal
- perovskite
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- doped
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Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、発光材料として有用で
あり又、光計測、光情報処理、光医療、光プロセッシン
グ等コヒーレント光を利用する分野において、各種光デ
バイス、例えばレーザー素子、光増幅素子の小型、高効
率化さらにファイバーとのカップリングに有効なエルビ
ウム又はプラセオジウム希土類ドープペロブスカイト光
導波路結晶およびその製造方法に関する。BACKGROUND OF THE INVENTION The present invention is useful as a light-emitting material, and in the field of utilizing coherent light such as optical measurement, optical information processing, optical medical treatment, optical processing, various optical devices such as laser elements and optical amplifiers. The present invention relates to an erbium- or praseodymium-rare-earth-doped perovskite optical waveguide crystal which is effective in reducing the size and efficiency of an element and coupling with a fiber, and a manufacturing method thereof.
【0002】[0002]
【従来の技術】従来、光導波路結晶としてはレーザー用
半導体が知られている。また、非半導体では、例えば、
イオン交換法を利用した光導波路を形成したものとして
Ndを添加したLiNdO3 導波路結晶、KTiOPO
4 結晶などが知られている。2. Description of the Related Art Conventionally, a semiconductor for a laser is known as an optical waveguide crystal. Also, in non-semiconductors, for example,
LiNdO 3 waveguide crystal added with Nd as an optical waveguide formed by using an ion exchange method, KTiOPO
4 crystals are known.
【0003】スパッタ法により薄膜光導波路を形成した
ものは、NdあるいはCrを添加したY3 Ga5 O
12(M.YAMAGA et al、Japanese Journal of Applied Ph
ysics.23,312(1984)、Journal of Luminesence 39,335
(1988))が知られている。又、イオン注入により光導波
路を作成したものはHe+ イオン注入によるNd:Y3
Al5 O12(S.J.Field et al,IEEE Journal of QUANTU
M Electoronics 27,423(1991) 、P.J.Chandler et al,
Nuclear Instruments and Methods in Physics Researc
h B59/60,1223(1991))、He+ イオン注入によるKNb
O3 (D.Flick et al,Applied Physics Letter 59,3213
(1991))、C+ イオン注入によるサファイア( P.D.Towns
end et al,ElectronicsLetter 26,1193(1990)) 等が知
られている。The thin-film optical waveguide formed by the sputtering method is a Y 3 Ga 5 O containing Nd or Cr.
12 (M.YAMAGA et al, Japanese Journal of Applied Ph
ysics.23,312 (1984), Journal of Luminesence 39,335
(1988)) is known. In addition, an optical waveguide prepared by ion implantation is Nd: Y 3 produced by He + ion implantation.
Al 5 O 12 (SJField et al, IEEE Journal of QUANTU
M Electoronics 27,423 (1991), PJChandler et al,
Nuclear Instruments and Methods in Physics Researc
h B59 / 60,1223 (1991)), KNb by He + ion implantation
O 3 (D.Flick et al, Applied Physics Letter 59,3213
(1991)), C + ion implanted sapphire (PDTowns
end et al, Electronics Letter 26, 1193 (1990)) are known.
【0004】しかし、本発明の組成式ABAlO4 で表
されるペロブスカイト型単結晶基板上に、組成式ABx
Ln1-xGayAlO4 で表されるペロブスカイト型薄膜
結晶を成長させた希土類ドープペロブスカイト薄膜導波
路結晶は知られていない。However, the composition formula AB x is formed on the perovskite type single crystal substrate represented by the composition formula ABAlO 4 of the present invention.
Ln 1-x Ga y AlO 4 in the rare earth-doped perovskite thin film waveguide crystals grown perovskite thin film crystal represented is not known.
【0005】[0005]
【発明が解決しようとする課題】本発明は、近赤外域
(1500〜1650nm)で波長可変レーザー発振材料
として又はアップコンバージョンレーザーとして有用な
Erドープペロブスカイト単結晶および、1050〜1
200nmでレーザー発振材料として又はアップコンバー
ジョンレーザーとして有用なPrドープペロブスカイ単
結晶で、素子の小型化、レーザー発振効率の高効率化が
可能な薄膜光導波路を有する結晶及びその製造法を提供
することを目的とするものある。DISCLOSURE OF THE INVENTION The present invention provides an Er-doped perovskite single crystal useful as a wavelength tunable laser oscillation material or as an up-conversion laser in the near infrared region (1500-1650 nm) and 1050-1.
PROBLEM TO BE SOLVED: To provide a crystal having a thin film optical waveguide, which is a Pr-doped perovskite single crystal useful as a lasing material at 200 nm or as an up-conversion laser, and which enables device miniaturization and high lasing efficiency, and a manufacturing method thereof There is something aimed at.
【0006】[0006]
【課題を解決するための手段】本発明者らは、上記した
目的を達成するために種々の検討を重ねた結果、プペロ
ブスカイト単結晶の表面に、スパッタ法によりEr又は
Prドープペロブスカイト薄膜導波路を形成するのに、
これらとGaを共ドープして薄膜を形成したものは、T
i単独ドープで得たもの(屈折率約1.93〜1.9
6)に比較して薄膜結晶の屈折率が高くなるとの知見を
得て本発明を完成した。As a result of various studies to achieve the above object, the inventors of the present invention have found that Er or Pr-doped perovskite thin film waveguides are sputtered on the surface of a perovskite single crystal. To form
The thin film formed by co-doping these with Ga is T
obtained by i alone doping (refractive index of about 1.93 to 1.9
The present invention has been completed based on the finding that the refractive index of the thin film crystal is higher than that of 6).
【0007】即ち本発明は、組成式ABAlO4 (A:
Ca2+又はSr2+、B:Y3+、Gd3+、から選ばれる一
種)で表されるペロブスカイト型単結晶基板上に、組成
式ABxLn1-xGayAlO4 (A:Ca2+又はS
r2+、B:Er3+又はPr3+、Ln:Y3+、Gd3+、L
a3+から選ばれる一種、x:0.001≦x≦0.2、
y:0.01≦y≦0.1)で表されるペロブスカイト
型薄膜結晶を成長させた希土類ドープペロブスカイト薄
膜導波路結晶に関するものである。That is, the present invention is based on the composition formula ABAlO 4 (A:
Ca 2+ or Sr 2+, B: Y 3+, Gd 3+, the perovskite single crystal substrate represented by the selected one element) from a composition formula AB x Ln 1-x Ga y AlO 4 (A: Ca 2+ or S
r 2+ , B: Er 3+ or Pr 3+ , Ln: Y 3+ , Gd 3+ , L
one selected from a 3+ , x: 0.001 ≦ x ≦ 0.2,
The present invention relates to a rare earth-doped perovskite thin film waveguide crystal obtained by growing a perovskite thin film crystal represented by y: 0.01 ≦ y ≦ 0.1).
【0008】次に本発明を詳細に説明する。本発明で基
板として用いるペロブスカイト型単結晶は、組成式AB
AlO4 (A:Ca2+又はSr2+、B::Y3+、G
d3+、La3+から選ばれる一種)で表されるアンドープ
ペロブスカイト型単結晶である。本発明の結晶の薄膜導
波路は、Er又はPrとGaを共ドープしたペロブスカ
イト結晶で、組成式ABxLn1-xGayAlO4 (A:
Ca2+又はSr2+、B:Er3+又はPr3+、Ln:
Y3+、Gd3+、La3+から選ばれる一種、x:0.00
1≦x≦0.2、y:0.01≦y≦0.1)で表され
る。Next, the present invention will be described in detail. The perovskite type single crystal used as the substrate in the present invention has a composition formula AB
AlO 4 (A: Ca 2+ or Sr 2+ , B :: Y 3+ , G
It is an undoped perovskite type single crystal represented by (a type selected from d 3+ and La 3+ ). The crystalline thin film waveguide of the present invention is a perovskite crystal co-doped with Er or Pr and Ga, and has a composition formula of AB x Ln 1-x Ga y AlO 4 (A:
Ca 2+ or Sr 2+ , B: Er 3+ or Pr 3+ , Ln:
One selected from Y 3+ , Gd 3+ and La 3+ , x: 0.00
1 ≦ x ≦ 0.2, y: 0.01 ≦ y ≦ 0.1).
【0009】本発明の結晶の薄膜導波路の厚さは1〜1
0μm で、薄膜導波路部分の屈折率は1.980〜1.
990近辺である。この薄膜部分の膜厚は必要以上に薄
すぎると導波路が形成されず、又、厚すぎると導波モー
ドがマルチモードとなり好ましくない。導波路として単
一モードとするには2μm 以下の膜厚が好ましく、この
場合の屈折率は1.990以下である。The crystal thin film waveguide of the present invention has a thickness of 1 to 1.
0 .mu.m, the refractive index of the thin film waveguide portion is 1.980-1.
It is around 990. If the film thickness of this thin film portion is unnecessarily thin, the waveguide is not formed, and if it is too thick, the waveguide mode becomes multimode, which is not preferable. A film thickness of 2 μm or less is preferable for making the waveguide a single mode, and the refractive index in this case is 1.990 or less.
【0010】又、薄膜導波路部分は前記した組成式で示
した組成であるが、組成式中、xが0.001未満の場
合は活性イオン濃度が薄く従って発光強度が弱く、0.
2より大の場合は濃度消光により発光が弱い。又、yが
0.01より小さいと屈折率差が小さく導波層となら
ず、0.1より大であるとマルチ導波モードとなる。Further, the thin film waveguide portion has the composition shown by the above composition formula. In the composition formula, when x is less than 0.001, the active ion concentration is low and the emission intensity is weak.
When it is larger than 2, the emission is weak due to concentration quenching. Further, when y is smaller than 0.01, the difference in refractive index is small and the wave guide layer is not formed. When y is larger than 0.1, the multi-waveguide mode is formed.
【0011】本発明の希土類ドープペロブスカイト薄膜
導波路結晶の製造法について以下に説明する。本発明の
製造法で用いる基板は、前記したように組成式ABAl
O4 (A:Ca2+又はSr2+、B::Y3+、Gd3+、La
3+から選ばれる一種)で表されるアンドープペロブスカ
イト型単結晶である。A method for manufacturing the rare earth-doped perovskite thin film waveguide crystal of the present invention will be described below. The substrate used in the manufacturing method of the present invention has the composition formula ABAl as described above.
O 4 ( A: Ca 2+ or Sr 2+ , B :: Y 3+ , Gd 3+ , La
It is an undoped perovskite type single crystal represented by (a type selected from 3+ ).
【0012】この単結晶表面に薄膜導波路を形成するに
は下記のターゲットを用いてスパッタ法にてこれを行
う。即ち、Ca2+又はSr2+(A)の炭酸塩又は酸化
物、Er3+又はPr3+(B)の酸化物、Y3+、Gd3+、
La3+(Ln)から選ばれる一種の酸化物、Ga3+およ
びAl3+の酸化物を、A:B:Ln:Ga:Al(原子
比)=1:x:1−x:y:1−y(ここで、x:0.
001≦x≦0.2、y:0.01≦y≦0.1)の量
比となるように調整して焼結した焼結体をターゲットを
用いる。The thin film waveguide is formed on the surface of this single crystal by the sputtering method using the following target. That is, Ca 2+ or Sr 2+ (A) carbonate or oxide, Er 3+ or Pr 3+ (B) oxide, Y 3+ , Gd 3+ ,
One kind of oxide selected from La 3+ (Ln), and oxides of Ga 3+ and Al 3+ are prepared by A: B: Ln: Ga: Al (atomic ratio) = 1: x: 1-x: y: 1-y (where x: 0.
001 ≦ x ≦ 0.2, y: 0.01 ≦ y ≦ 0.1) is adjusted and the sintered body is used as a target.
【0013】この際のスパッタは通常のrfスパッタ法
が用いられ、スパッタリングガスは不活性ガス、例えば
10-3〜10-4 torr のArガス雰囲気で行う。又、ス
パッタに際しては基板を加熱して行うことが好ましく、
700℃以上に加熱してスパッタを行うと直接単結晶表
面に薄膜導波路が形成されるが、700℃より低い温度
の場合は形成される薄膜は非晶質の部分があり、これを
結晶化させるために酸化性、還元性、又は不活性雰囲気
で1200℃以上で加熱熟成することにより目的とする
希土類ドープペロブスカイト薄膜導波路結晶とすること
ができる。For the sputtering at this time, a normal rf sputtering method is used, and the sputtering gas is an inert gas, for example, an Ar gas atmosphere of 10 −3 to 10 −4 torr. Also, it is preferable to heat the substrate during sputtering,
A thin film waveguide is formed directly on the surface of a single crystal when it is heated to 700 ° C. or higher and sputtered. However, when the temperature is lower than 700 ° C., the thin film formed has an amorphous portion and is crystallized. For this purpose, the desired rare earth-doped perovskite thin film waveguide crystal can be obtained by heating and aging at 1200 ° C. or higher in an oxidizing, reducing, or inert atmosphere.
【0014】[0014]
【実施例】次に本発明を実施例により更に詳細に説明す
る。EXAMPLES The present invention will now be described in more detail with reference to Examples.
【0015】実施例1 組成式CaYAlO4 のプペロブスカイトの板状単結晶
を基板として用い、スパッタ用ターゲットとしてCaC
O3 、Er2 O3 、Y2 O3 、Ga2 O3 、Al2 O3
を原子比でCa:Er:Y:Ga:Al=1:0.0
2:0.98:0.05:0.95に調整して焼結した
焼結体を用い、4×10-4 torr のArを用い基板を8
00℃に加熱して10A/min でスパッタを行った。得
られた結晶の薄膜部分の厚みは1.2μm であった。
又、薄膜部分はX線マイクロアナライザーで元素分析の
結果ほぼ上記の組成であった。さらに電子線回折により
薄膜部分はErドープペロブスカイトであることを確認
した。Example 1 A plate-shaped single crystal of perovskite of the composition formula CaYAlO 4 was used as a substrate, and CaC was used as a sputtering target.
O 3, Er 2 O 3, Y 2 O 3, Ga 2 O 3, Al 2 O 3
In an atomic ratio of Ca: Er: Y: Ga: Al = 1: 0.0
Using a sintered body adjusted to 2: 0.98: 0.05: 0.95 and sintered, 4 × 10 −4 torr of Ar was used for the substrate 8.
It was heated to 00 ° C. and sputtered at 10 A / min. The thickness of the thin film portion of the obtained crystal was 1.2 μm.
Further, the thin film portion had almost the above composition as a result of elemental analysis by an X-ray microanalyzer. Further, it was confirmed by electron diffraction that the thin film portion was Er-doped perovskite.
【0016】実施例2 実施例1で用いた板状単結晶を基板として用い、CaC
O3 、Pr2 O3 、Y2 O3 、Ga2 O3 、Al2 O3
を原子比でCa:Pr:Y:Ga:Al=1:0.0
2:0.98:0.05:0.95に調整して焼結した
焼結体を用い、基板を600℃に加熱した以外は実施例
1と同じにスパッタを行った。得られた結晶の薄膜部分
を1750℃、水素0.5% を含むAr雰囲気中で
min 加熱熟成した。得られた薄膜部分の膜厚は1.5μ
m であった。この薄膜部分は実施例1と同様に分析した
結果Prを含むペロブスカイトであった。Example 2 Using the plate-like single crystal used in Example 1 as a substrate, CaC
O 3, Pr 2 O 3, Y 2 O 3, Ga 2 O 3, Al 2 O 3
In an atomic ratio of Ca: Pr: Y: Ga: Al = 1: 0.0
Sputtering was performed in the same manner as in Example 1 except that the sintered body was adjusted to 2: 0.98: 0.05: 0.95 and sintered, and the substrate was heated to 600 ° C. The thin film portion of the obtained crystal was placed at 1750 ° C. in an Ar atmosphere containing 0.5% hydrogen.
min Heat aged. The thickness of the obtained thin film is 1.5μ.
It was m. The thin film portion was a perovskite containing Pr as a result of the same analysis as in Example 1.
【0017】実施例3 実施例1で用いた板状単結晶を基板として用い、CaC
O3 、Er2 O3 、La2 O3 、Ga2 O3 、Al2 O
3 を原子比でCa:Er:La:Ga:Al=1:0.
02:0.98:0.05:0.95に調整して焼結し
た焼結体を用いた以外は実施例1と同じにスパッタを行
った。得られた結晶の薄膜部分の膜厚は1.5μm であ
った。この薄膜部分は実施例1と同様に分析した結果E
rを含むペロブスカイトであった。Example 3 Using the plate-shaped single crystal used in Example 1 as a substrate, CaC
O 3 , Er 2 O 3 , La 2 O 3 , Ga 2 O 3 , Al 2 O
3 in an atomic ratio of Ca: Er: La: Ga: Al = 1: 0.
Sputtering was performed in the same manner as in Example 1 except that a sintered body obtained by adjusting the ratio to 02: 0.98: 0.05: 0.95 and sintering was used. The thin film portion of the obtained crystal had a thickness of 1.5 μm. This thin film portion was analyzed in the same manner as in Example 1 and the result E
It was a perovskite containing r.
【0018】[0018]
【発明の効果】本発明の構成の希土類ドープペロブスカ
イト光導波路結晶は、レーザー発振効率が高く、小型の
波長可変レーザー、光増幅素子として利用できる。INDUSTRIAL APPLICABILITY The rare earth-doped perovskite optical waveguide crystal having the constitution of the present invention has a high laser oscillation efficiency and can be used as a small wavelength tunable laser and an optical amplifying device.
【0019】[0019]
Claims (4)
2+、B:Y3+、Gd3+、から選ばれる一種)で表される
ペロブスカイト型単結晶基板上に、組成式ABxLn1-x
GayAlO4 (A:Ca2+又はSr2+、B:Er3+又
はPr3+、Ln:Y3+、Gd3+、La3+から選ばれる一
種、x:0.001≦x≦0.2、y:0.01≦y≦
0.1)で表されるペロブスカイト型薄膜結晶を成長さ
せた希土類ドープペロブスカイト薄膜導波路結晶。1. A composition formula ABAlO 4 (A: Ca 2+ or Sr
2+ , B: Y 3+ , Gd 3+ ), a composition formula AB x Ln 1-x on a perovskite type single crystal substrate represented by
Ga y AlO 4 (A: Ca 2+ or Sr 2+, B: Er 3+ or Pr 3+, Ln: Y 3+, Gd 3+, one selected from La 3+, x: 0.001 ≦ x ≦ 0.2, y: 0.01 ≦ y ≦
0.1) A rare-earth-doped perovskite thin film waveguide crystal obtained by growing a perovskite thin film crystal.
2+、B:Y3+、Gd3+、から選ばれる一種)で表される
ペロブスカイト型単結晶基板上に、A(Ca2+又はSr
2+)の炭酸塩又は酸化物、B(Er3+又はPr3+)の酸
化物、Ln(Y3+、Gd3+、La3+から選ばれる一種)
の酸化物、Ga3+およびAl3+の酸化物を、A:B:L
n:Ga:Al(原子比)=1:x:1−x:y:1−
y(ここで、x:0.001≦x≦0.2、y:0.0
1≦y≦0.1)の量比となるように調整して焼結した
焼結体をターゲットとして用いてスパッタ法により薄膜
を形成することを特徴とする希土類ドープペロブスカイ
ト薄膜導波路結晶の製造法。2. The composition formula ABAlO 4 (A: Ca 2+ or Sr
2+ , B: Y 3+ , Gd 3+ , a perovskite-type single-crystal substrate represented by the formula A) (Ca 2+ or Sr
2+ ) carbonate or oxide, B (Er 3+ or Pr 3+ ) oxide, Ln (one selected from Y 3+ , Gd 3+ , La 3+ )
Oxides of Ga 3+ and Al 3+ with A: B: L
n: Ga: Al (atomic ratio) = 1: x: 1-x: y: 1-
y (where x: 0.001 ≦ x ≦ 0.2, y: 0.0
(1 ≦ y ≦ 0.1) A rare earth-doped perovskite thin film waveguide crystal characterized by forming a thin film by a sputtering method using a sintered body that is adjusted and sintered as a target. Law.
基板を700℃以上に加熱してスパッタを行う請求項2
記載の製造法。3. A perovskite type single crystal substrate is heated to 700 ° C. or higher using Ar gas to perform sputtering.
The manufacturing method described.
満の温度で加熱してスパッタを行ない得られた希土類ド
ープペロブスカイト薄膜導波路結晶を、酸化性又は還元
性雰囲気もしくは不活性雰囲気中で1200℃以上に加
熱する請求項2記載の製造法。4. A rare earth-doped perovskite thin film waveguide crystal obtained by heating a perovskite type single crystal substrate at a temperature of less than 700 ° C. to obtain a rare earth-doped perovskite thin film waveguide crystal at 1200 ° C. or higher in an oxidizing or reducing atmosphere or an inert atmosphere. The manufacturing method according to claim 2, wherein the heating is carried out.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13754493A JPH06350184A (en) | 1993-06-08 | 1993-06-08 | Thin film waveguide crystal and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13754493A JPH06350184A (en) | 1993-06-08 | 1993-06-08 | Thin film waveguide crystal and manufacturing method thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06350184A true JPH06350184A (en) | 1994-12-22 |
Family
ID=15201176
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13754493A Pending JPH06350184A (en) | 1993-06-08 | 1993-06-08 | Thin film waveguide crystal and manufacturing method thereof |
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| Country | Link |
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| JP (1) | JPH06350184A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2227622A (en) * | 1988-12-31 | 1990-08-01 | Samsung Electronics Co Ltd | Method for preventing access to unsuitable video material |
| GB2287721A (en) * | 1994-03-22 | 1995-09-27 | British Tech Group | Laser waveguide |
| WO2002009245A3 (en) * | 2000-07-21 | 2002-03-21 | Utar Scient Inc | An upconversion active gain medium and a micro-laser on the basis thereof |
| CN1316700C (en) * | 2003-08-22 | 2007-05-16 | 南京大学 | Nd2 YVO4 light waveguide film device on Sio2 Substrate and its prepn |
| JP2013048136A (en) * | 2011-08-29 | 2013-03-07 | Nippon Telegr & Teleph Corp <Ntt> | Optical element and manufacturing method thereof |
| CN109193327A (en) * | 2018-10-22 | 2019-01-11 | 长春理工大学 | A kind of preparation method of perovskite microlaser |
| WO2024069856A1 (en) * | 2022-09-29 | 2024-04-04 | ソニーグループ株式会社 | Laser device, optical circuit system, sensing system, laser beam generation unit, and metamaterial |
-
1993
- 1993-06-08 JP JP13754493A patent/JPH06350184A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2227622A (en) * | 1988-12-31 | 1990-08-01 | Samsung Electronics Co Ltd | Method for preventing access to unsuitable video material |
| GB2287721A (en) * | 1994-03-22 | 1995-09-27 | British Tech Group | Laser waveguide |
| WO2002009245A3 (en) * | 2000-07-21 | 2002-03-21 | Utar Scient Inc | An upconversion active gain medium and a micro-laser on the basis thereof |
| CN1316700C (en) * | 2003-08-22 | 2007-05-16 | 南京大学 | Nd2 YVO4 light waveguide film device on Sio2 Substrate and its prepn |
| JP2013048136A (en) * | 2011-08-29 | 2013-03-07 | Nippon Telegr & Teleph Corp <Ntt> | Optical element and manufacturing method thereof |
| CN109193327A (en) * | 2018-10-22 | 2019-01-11 | 长春理工大学 | A kind of preparation method of perovskite microlaser |
| WO2024069856A1 (en) * | 2022-09-29 | 2024-04-04 | ソニーグループ株式会社 | Laser device, optical circuit system, sensing system, laser beam generation unit, and metamaterial |
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