JPH0635994B2 - デジタル・データ取り込み装置 - Google Patents

デジタル・データ取り込み装置

Info

Publication number
JPH0635994B2
JPH0635994B2 JP2289211A JP28921190A JPH0635994B2 JP H0635994 B2 JPH0635994 B2 JP H0635994B2 JP 2289211 A JP2289211 A JP 2289211A JP 28921190 A JP28921190 A JP 28921190A JP H0635994 B2 JPH0635994 B2 JP H0635994B2
Authority
JP
Japan
Prior art keywords
signal
counter
timer
gate
cycle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2289211A
Other languages
English (en)
Japanese (ja)
Other versions
JPH03170069A (ja
Inventor
ロナルド・エム・ジャクソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Publication of JPH03170069A publication Critical patent/JPH03170069A/ja
Publication of JPH0635994B2 publication Critical patent/JPH0635994B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/04—Apparatus for measuring unknown time intervals by electric means by counting pulses or half-cycles of an AC
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G06F1/14—Time supervision arrangements, e.g. real time clock
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Analogue/Digital Conversion (AREA)
JP2289211A 1989-10-26 1990-10-26 デジタル・データ取り込み装置 Expired - Lifetime JPH0635994B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US427157 1982-09-29
US07/427,157 US4979177A (en) 1989-10-26 1989-10-26 Enhanced counter/timer resolution in a logic analyzer

Publications (2)

Publication Number Publication Date
JPH03170069A JPH03170069A (ja) 1991-07-23
JPH0635994B2 true JPH0635994B2 (ja) 1994-05-11

Family

ID=23693715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2289211A Expired - Lifetime JPH0635994B2 (ja) 1989-10-26 1990-10-26 デジタル・データ取り込み装置

Country Status (3)

Country Link
US (1) US4979177A (de)
EP (1) EP0425080A3 (de)
JP (1) JPH0635994B2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5862369A (en) * 1991-12-30 1999-01-19 Dell Usa, L.P. Method and apparatus for state machine optimization using device delay characteristics
US5446650A (en) * 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction
US5526286A (en) * 1994-02-16 1996-06-11 Tektronix, Inc. Oversampled logic analyzer
JP2776321B2 (ja) * 1995-09-13 1998-07-16 日本電気株式会社 ロジックアナライザ
SE510390C2 (sv) * 1996-02-14 1999-05-17 Ericsson Telefon Ab L M Räkningsanordning och räkningsförfarande samt tele- kommunikationssystem innefattande räkningsanordning och förfarande
CA2245914A1 (en) * 1996-02-14 1997-08-21 Telefonaktiebolaget Lm Ericsson Counting circuit
SE508585C2 (sv) 1996-02-14 1998-10-19 Ericsson Telefon Ab L M Fas och frekvensdetekorer för ett på förhand bestämt antal insignaler, jämte förfarande för mätning av fas och frekvens
US6194918B1 (en) 1997-02-12 2001-02-27 Telefonaktiebolaget Lm Ericsson (Publ) Phase and frequency detector with high resolution
US7409617B2 (en) * 2004-09-30 2008-08-05 Credence Systems Corporation System for measuring characteristics of a digital signal
US7627790B2 (en) * 2003-08-21 2009-12-01 Credence Systems Corporation Apparatus for jitter testing an IC
JP2005244479A (ja) * 2004-02-25 2005-09-08 Fujitsu Ltd 伝送装置
US7332929B1 (en) 2006-03-03 2008-02-19 Azul Systems, Inc. Wide-scan on-chip logic analyzer with global trigger and interleaved SRAM capture buffers
US8788867B2 (en) 2011-01-07 2014-07-22 Anue Systems, Inc. Systems and methods for playback of detected timing events
US8683254B2 (en) 2011-01-07 2014-03-25 Anue Systems, Inc. Systems and methods for precise event timing measurements
US8850259B2 (en) 2011-01-07 2014-09-30 Anue Systems, Inc. Systems and methods for precise generation of phase variation in digital signals
US8533518B2 (en) 2011-01-07 2013-09-10 Anue Systems, Inc. Systems and methods for precise timing measurements using high-speed deserializers
US9952956B2 (en) 2015-07-06 2018-04-24 International Business Machines Corporation Calculating the clock frequency of a processor

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4250562A (en) * 1979-05-22 1981-02-10 Hewlett-Packard Company Digital signal state analyzer and display
FR2458181A1 (fr) * 1979-06-01 1980-12-26 Thomson Csf Dispositif de synchronisation d'un signal d'horloge et systemes de transmission de donnees synchrones comportant un tel dispositif
US4468746A (en) * 1981-12-01 1984-08-28 Cincinnati Electronics Corporation Apparatus for determining interval between two events
DE3149460C2 (de) * 1981-12-14 1984-04-12 Rohde & Schwarz GmbH & Co KG, 8000 München Logikanalysator
JPS58106464A (ja) * 1981-12-21 1983-06-24 Advantest Corp グリツチ検出測定器
EP0094976B1 (de) * 1982-05-24 1986-08-27 Ibm Deutschland Gmbh Logik-Analysator
DE3328540A1 (de) * 1983-08-06 1985-02-14 Robert Bosch Gmbh, 7000 Stuttgart Vorrichtung zur messung der zeit zwischen zwei ereignissen
US4584695A (en) * 1983-11-09 1986-04-22 National Semiconductor Corporation Digital PLL decoder
US4546487A (en) * 1983-12-30 1985-10-08 Rca Corporation Auto ranging counter
US4849924A (en) * 1985-06-13 1989-07-18 Tektronix, Inc. Event counting prescaler
WO1987001207A1 (en) * 1985-08-23 1987-02-26 Outlook Technology, Inc. Harmonic sampling logic analyzer
US4789789A (en) * 1986-02-17 1988-12-06 Tektronix, Inc. Event distribution and combination system
US4777616A (en) * 1986-05-12 1988-10-11 Outlook Technology, Inc. Increased resolution logic analyzer using asynchronous sampling
JPS62280679A (ja) * 1986-05-30 1987-12-05 Fuji Electric Co Ltd 計時装置
JPS6430324A (en) * 1987-07-27 1989-02-01 Advantest Corp Continuous counter
US4868430A (en) * 1988-02-11 1989-09-19 Ncr Corporation Self-correcting digitally controlled timing circuit
US4912734A (en) * 1989-02-14 1990-03-27 Ail Systems, Inc. High resolution event occurrance time counter

Also Published As

Publication number Publication date
EP0425080A2 (de) 1991-05-02
US4979177A (en) 1990-12-18
JPH03170069A (ja) 1991-07-23
EP0425080A3 (en) 1992-05-06

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