JPH067590B2 - Polymerized phthalocyanine derivative and MSM or MIS type device using the same as a semiconductor layer - Google Patents
Polymerized phthalocyanine derivative and MSM or MIS type device using the same as a semiconductor layerInfo
- Publication number
- JPH067590B2 JPH067590B2 JP60047296A JP4729685A JPH067590B2 JP H067590 B2 JPH067590 B2 JP H067590B2 JP 60047296 A JP60047296 A JP 60047296A JP 4729685 A JP4729685 A JP 4729685A JP H067590 B2 JPH067590 B2 JP H067590B2
- Authority
- JP
- Japan
- Prior art keywords
- msm
- semiconductor layer
- phthalocyanine derivative
- layer
- work function
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/311—Phthalocyanine
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Photovoltaic Devices (AREA)
- Polyethers (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、新規な重合化フタロシアニン誘導体ならび
に、仕事関数の大きい導電性材料層、半導体層および仕
事関数の小さい導電性材料層をこの順に積層してなるM
SM型素子、仕事関数の大きい導電性材料層、半導体
層、絶縁層および仕事関数の小さい導電性材料層をこの
順に積層してなるMIS型素子に関する。The present invention relates to a novel polymerized phthalocyanine derivative, a conductive material layer having a large work function, a semiconductor layer, and a conductive material layer having a small work function, which are laminated in this order. Will be M
The present invention relates to a MIS type element formed by laminating an SM type element, a conductive material layer having a large work function, a semiconductor layer, an insulating layer, and a conductive material layer having a small work function in this order.
仕事関数の大きい金属(MA)と仕事関数の小さい金属
(MB)の間にポリ(アセチレン)、ポリ(ジアセチレ
ン)、ポリ(ピロール)、ポリ(チエニレン)等の有機
半導体(S)の薄層をはさんで成るMSM型、あるいは
さらにSとMB間に絶縁体(I)の薄層を組み入れたM
IS型の素子は、多数考案されている。〔“フィズィッ
クス・オブ・セミコンダクタ・デバイス”第2版、S.
M.スツェ、ジョン・ウィリィ・アンド・サン・ニュー
ヨーク(1981)“Physics of Seimconductor Devic
es”2nd Ed., S.M. Sze,John Wiluy & Sons,N.Y.
(1981)、“合成金属(化学増刊87)”白川ほ
か、化学同人(1980)、R.C.ウェスト、N.J.アスト
ル編“CRCハンドブック・オブ・ケミストリィ・アン
ド・フィズィックス CRCプレス,クリーブランド
(1979)、第59版、E−81:R.C.West,N.
J.Astel Ed.,“CRC Handbook of Cheimstiy and Physi
cs”CRC Press,Cleaveland(1979)、59th E
d.,E−81,M.オザキ他、アプライド・フィズィック
ス・レターズ:M.Ozaki他、Appl.Phys.Lett353
(1979)〕。しかし、これらは一般に、S層の構造
及び素子作成法に起因する不確定要素が著しく、いずれ
も実用化されるに到っていない。例えば、これらS層
は、通常MA基板上での気相重合、回相重合あるいは電
解酸化重合等により作成されるが、重合時の伸縮あるい
は電解質イオンの流出入等の理由によりその微細構造は
フィブリルや山/谷の多いへき解状を成しており、一般
に多孔質であると言える。従って、S層厚が大きくなけ
れば、蒸着やスパッタリング等でMB層を固定する際
に、MB粒子がその微細孔へもぐり込み、MAとMBが
直接導通して素子としての機能を失いやすい。また、こ
れら有機半導体は、化学ドーピング、電気化学ドーピン
グ等の処理を施した時は、例えばポリ(アセチレン)/
ヨウ素ドープで約102S/cm、ポリ(ピロール)/ヨウ素
ドープで約102S/cm、のごとく高電導性を与える
が、脱ドープ状態では電導性が極めて低い。しかもドー
ピング処理を施したS層をMA、MBと組み合わせる
と、ドーピング剤により、MA/S及びMB/S、特に
MB/S界面で腐食が進行し、経時安定性が著しく乏し
くなる。それがため、一般にこれらS層は電導性の低い
脱ドープ状態で用いられるが、既述したMB粒子のもぐ
り込みを防ぐためS層を厚くすると素子内抵抗が著しく
高くなり、実用に供せるほどの電流を通じることができ
ない。さらに、上述のS層は既述したごとく膜表面の凹
凸が激しい。従って、MSM型素子では、ショットキー
接合を形成する重要なS/MB界面に不純物準位を生じ
やすく、結果的に素子の整流比、ダンオード特性等を著
しく損う。例えば、ポリ(アセチレン)に関するダイオ
ードパラメータはたかだか1.9でしか無く、他もほぼ
同様の値であり、理想状態の1.0からほど遠いと言え
る。なお、MIS型素子では、I層厚を、トンネル効果
が期待できる位(約20Å)薄くする必要があるので、
S層表面の凹凸が激しければI層が著しく乱れ、上述し
たMSM型と同様の理由で素子の特性が損われる。Metal having a large work function (M A) and poly (acetylene) between small metal (M B) work function, poly (diacetylene), poly (pyrrole), poly etc. (thienylene) organic semiconductor (S) M incorporating a thin layer of insulator (I) MSM type comprising across the thin layer, or even between S and M B
Many IS type elements have been devised. ["Physics of Semiconductor Devices," 2nd Edition, S.
M. Sutse, John Willy and Sun New York (1981) “Physics of Seimconductor Devic
es ”2nd Ed., SM Sze, John Wiluy & Sons, NY
(1981), “Synthetic Metals (Chemical Special Issue 87)” Shirakawa et al., Kagaku Dojin (1980), RC West, NJ Astor, “CRC Handbook of Chemistry and Physics CRC Press, Cleveland (1979), 59th. Edition, E-81: RC West, N.
J. Astel Ed., “CRC Handbook of Cheimstiy and Physi
cs ”CRC Press, Cleaveland (1979), 59th E
d., E-81, M.I. Ozaki et al., Applied Physics Letters: M.M. Ozaki et al., Appl. Phys. Lett 35 3
(1979)]. However, in general, uncertainties due to the structure of the S layer and the method of manufacturing the device are remarkable, and none of them has been put to practical use. For example, these S layer, gas-phase polymerization in the normal M A substrate, but is created by rotating phase polymerization or electrolytic oxidation polymerization, the microstructure because of inflow and outflow, etc. during polymerization of the telescopic or an electrolyte ion It is in the form of a fibril with many fibrils and peaks / valleys, and is generally porous. Therefore, if the S layer thickness is not large, when fixing the M B layer by vapor deposition, sputtering, etc., the M B particles sneak into the fine pores, and M A and M B are directly conducted to function as an element. Easy to lose. Further, when these organic semiconductors are subjected to treatments such as chemical doping and electrochemical doping, for example, poly (acetylene) /
About 10 2 S / cm iodine doped poly (pyrrole) / iodine doped with about 10 2 S / cm, gives a high conductivity as described, a very low conductivity in the undoped state. Moreover the combination of S layer subjected to doping treatment M A, and M B, the doping agent, M A / S and M B / S, proceeds particularly corrosion M B / S interface, significantly poor stability over time Become. Because it has generally these S layer is used in low conductivity undoped state, remarkably high in the element when the thickness of the S layer resistance to prevent underrun described above the M B particles, Kyoseru practical It cannot pass as much current. Furthermore, the above-mentioned S layer has severe irregularities on the film surface as described above. Accordingly, the MSM element, prone to impurity level critical S / M B interface forming a Schottky junction, rectification ratio as a result, the device, intends significantly impair the Dan'odo characteristics. For example, the diode parameter for poly (acetylene) is at most 1.9, and the other values are almost the same, which is far from the ideal state of 1.0. In addition, in the MIS type device, since the I layer needs to be thin enough to expect a tunnel effect (about 20Å),
If the unevenness of the surface of the S layer is severe, the I layer is significantly disturbed, and the characteristics of the element are impaired for the same reason as the above-mentioned MSM type.
S層の抵抗が大きく、しかも凹凸の激しい場合、換言す
れば局所的な膜厚が一定しない場合は、電流を通じた時
に最もS層厚の小さい部位で局所的な大電流が流れるこ
とになる。従って、このような場合、薄膜の付可逆的な
破壊が起こりやすい欠点がある。When the resistance of the S layer is large and the unevenness is severe, in other words, when the local film thickness is not constant, a local large current flows in a portion having the smallest S layer thickness when a current is passed. Therefore, in such a case, there is a disadvantage that the reversible destruction of the thin film is likely to occur.
フタロシアニン誘導体は、可視部〜近赤外部にかけて巾
広い極大吸収を有する有機系p−型半導体であり、化学
的にも安定なため電子材料として好適である。しかしな
がら、一般の(金属)フタロシアニンは濃硫酸、熱DM
F等にわずかに溶けるのみであり、薄膜形成は熱蒸着等
に依らざるを得ない。従ってその微細構造は、多結晶状
であり、やはり膜表面の凹凸が激しいため、ショットキ
ー接合等を施したとき、前述と同様の理由により良好な
素子特性が得られない。リチウムフタロシアニンを特殊
な多元系溶剤に溶解し、それをラングミュア・ブロジェ
ット法に適用して気/水界面に薄膜を形成させ、さらに
基板上に移し取って素子化した例はあるが(例えばS.
ベイカー多、スィソ・ソリッド・フィルムス:S.Baker
他、Thin Solid Films.99 53(1983)な
ど)、薄膜表面の状態に関しては明確でなく、またこの
方法ではリチウムフタロシアニンが水界面に接触する際
に加水分解されるため、結果的に金属を含まないフタロ
シアニンの薄膜が得られるのみである。The phthalocyanine derivative is an organic p-type semiconductor having a wide maximum absorption in the visible region to the near infrared region, and is chemically stable, and thus is suitable as an electronic material. However, general (metal) phthalocyanine is concentrated sulfuric acid, heat DM
It only slightly dissolves in F and the like, and the thin film formation must rely on thermal evaporation or the like. Therefore, since the fine structure is polycrystalline and the surface of the film is highly uneven, good element characteristics cannot be obtained when the Schottky junction or the like is performed for the same reason as described above. There is an example of dissolving lithium phthalocyanine in a special multi-component solvent, applying it to the Langmuir-Blodgett method to form a thin film at the air / water interface, and then transferring it to a substrate to form an element (for example, S .
Baker, Siso Solid Films: S.Baker
Others, such as Thin Solid Films. 99 53 (1983)), the state of the thin film surface is not clear, and in this method, lithium phthalocyanine is hydrolyzed when it contacts the water interface, and as a result, it contains metal. Only a thin film of no phthalocyanine is obtained.
以上に述べた有機系のS層薄膜は、その製造方法のいか
んにかかわらず化学的強度に乏しい欠点がある。従っ
て、MBをその表面に蒸着、高周波スパッタリング、イ
オンビームスパッタリング等で被覆してMSM型素子等
を作成する際、高い運動エネルギーを有する金属原子、
金属イオンあるいは金属微粒子の衝突によりS/MB界
面に凹凸が生じやすく、はなはだしい場合はMBが原子
状ないし微粒子状でS層内に埋め込まれる。このような
界面の乱れは、既述したように素子の整流特性、ダイオ
ード特性を著しく損い、かつ印加可能な電圧の範囲が狭
くなるだけでなく、非可逆的な破壊が起こりやすくな
る。The organic S-layer thin film described above has a drawback that it has poor chemical strength regardless of the manufacturing method. Therefore, when the surface of M B is coated with vapor deposition, high frequency sputtering, ion beam sputtering or the like to produce an MSM type element or the like, metal atoms having high kinetic energy,
Irregularities easily occur at the S / M B interface due to collisions of metal ions or metal fine particles, and in the worst case, M B is embedded in the S layer in the form of atoms or fine particles. As described above, such an interface disorder not only impairs the rectification characteristics and diode characteristics of the element, narrows the range of voltage that can be applied, but also causes irreversible breakdown.
したがって本発明の目的は、半導体特性のすぐれた新規
な重合化フタロシアリン誘導体を提供することである。
本発明のもう1つの目的は従来のMSMまたはMIS型
素子の欠点をもたない、新規なMSMまたはMIS型素
子を提供することである。Therefore, it is an object of the present invention to provide a novel polymerized phthalocyanine derivative having excellent semiconductor properties.
Another object of the present invention is to provide a new MSM or MIS type device that does not have the drawbacks of conventional MSM or MIS type devices.
(発明の構成〕 本発明の目的は、特定のフタロシアニン誘導体の蒸気に
高周波を照射して生成する活性種を自然重合させて得ら
れる、重合化フタロシアニン誘導体により達成される。(Structure of the Invention) The object of the present invention is achieved by a polymerized phthalocyanine derivative obtained by spontaneously polymerizing active species generated by irradiating a vapor of a specific phthalocyanine derivative with a high frequency.
本発明は、式(1)で表わされるフタロシアニン誘導体の
蒸気に高周波を照射して生成する活性種を自然重合させ
て得られる重合化フタロシアニン誘導体を提供するもの
であり、この誘導体は下記の式(2)を有するものと推定
される。The present invention provides a polymerized phthalocyanine derivative obtained by spontaneously polymerizing active species produced by irradiating the vapor of the phthalocyanine derivative represented by the formula (1) with high frequency, and the derivative has the following formula ( It is presumed to have 2).
但しRは水素、ハロゲンまたは炭素数5以下の直鎖ない
し枝分れ炭化水素のアルコキシ基を示し、MeはH2、
マグネシウムまたは遷移金属イオンを示し、Rの置換位
置は上式のイソインドリン基において5−位または6−
位である。 However, R represents hydrogen, halogen, or a linear or branched hydrocarbon alkoxy group having 5 or less carbon atoms, and Me represents H 2 ,
A magnesium or transition metal ion is shown, and the substitution position of R is 5-position or 6-position in the isoindoline group of the above formula.
Rank.
本発明はまた、仕事関数の大きい導電性材料層、半導体
層および仕事関数の小さい導電性材料層をこの順に積層
してなるMSM型素子、または、仕事関数の大きい導電
性材料層、半導体層、絶縁層および仕事関数の小さい導
電性材料層をこの順に積層してなるMIS型素子におい
て、上記半導体層として、上記推定構造式(2)で表され
る重合化フタロシアニン誘導体の薄膜を使用したことを
特徴とするMSMまたはMIS型素子を提供するもので
ある。 The present invention also provides an MSM element formed by laminating a conductive material layer having a large work function, a semiconductor layer, and a conductive material layer having a small work function in this order, or a conductive material layer having a large work function, a semiconductor layer, In a MIS-type device in which an insulating layer and a conductive material layer having a small work function are laminated in this order, a thin film of a polymerized phthalocyanine derivative represented by the above-described estimated structural formula (2) is used as the semiconductor layer. A characteristic MSM or MIS type device is provided.
式(1)で示されるフタロシアニン誘導体の蒸気に高周波
を照射して生成する活性種を平滑な基板平面に導き、自
然重合させて得られる薄膜は表面が平滑で欠陥が無く極
めて強じんである。従って、ショットキー接合、ヘテロ
接合等によりMSMないしMIS型素子を形成する際、
既述した既存の技術ないし既存の有機半導体層における
界面の乱れ等の無い、良好な整流特性、ダイオード特性
を有する材料系を与えることができる。また、重合の際
に、基板にMAを用いればもちろんそのままMSMない
しMIS型素子を形成できる。また例えば、便宜的に平
滑ガラス表面に重合膜を形成させ、リフトオフ等適当な
手法で表面よりはく離して両側よりMAとMBを蒸着、
スパッタ等で積層化してMSM素子とする、あるいはガ
ラス基板上のままMA(またはMB)を積層化してはく
離し、しかる後にMB(またはMA)を裏面に積層化し
てMSM素子とする、等の手法が可能になる。これによ
れば、高価なMAないしMBの使用量を減ずることがで
きるだけでは無く、全体厚が数百μm以下の積層化薄膜
状のMSMないしMIS型素子が作成でき、それらは適
当な大きさに切って、例えば導電性接着剤でプリント基
板上に固定するだけで任意の回路を設計できる。The thin film obtained by introducing active species generated by irradiating the vapor of the phthalocyanine derivative represented by the formula (1) with high frequency to a smooth substrate plane and spontaneously polymerizing the film has a smooth surface and no defects and is extremely strong. Therefore, when forming an MSM or MIS type element by a Schottky junction, a hetero junction, or the like,
It is possible to provide a material system having good rectification characteristics and diode characteristics without any disturbance of the interface in the existing technology or the existing organic semiconductor layer described above. Furthermore, during the polymerization, to course it is no MSM With the M A to the substrate can be formed MIS type device. Further, for example, for convenience, a polymerized film is formed on a smooth glass surface, peeled off from the surface by an appropriate method such as lift-off, and M A and M B are deposited from both sides,
The MSM element is laminated by sputtering or the like, or M A (or M B ) is laminated on the glass substrate and peeled off, and then M B (or M A ) is laminated on the back surface to form an MSM element. , Etc. become possible. According to this, not only the amount of expensive M A or M B used can be reduced, but also an MSM or MIS type device in the form of a laminated thin film having a total thickness of several hundreds μm or less can be produced, and they can be appropriately sized. Any circuit can be designed simply by cutting it and fixing it on a printed circuit board with, for example, a conductive adhesive.
本発明の重合化フタロシアニン誘導体は、式(3)に示す
4−ニトロフタロニトリルとR’−OH(R’は炭素数
5以下の直鎖状あるいは枝分れアルキル基)の反応によ
り相当する4−アルコキシフタロニトリルを得て、さら
に脱水メタノール中ナトリウムメトキシドを触媒として
アンモニアガスと反応させてジイミノイソインドリン中
間体(式(4))を経て、マグネシウムまたは遷移金属の
塩の存在下または無存在下に2−ジメチルアミノエタノ
ール中で沸点還流下に閉環縮合して得られるフタロシア
ニン誘導体(式(5))、あるいは式(1)においてR=ハロ
ゲンあるいは水素の市販のフタロシアニン誘導体を、減
圧下に加熱して生成する蒸気に高周波を照射して発生す
る活性種を平滑な基板上に導き、自然重合させることに
より得られる。The polymerized phthalocyanine derivative of the present invention is obtained by reacting 4-nitrophthalonitrile represented by the formula (3) with R′—OH (R ′ is a linear or branched alkyl group having 5 or less carbon atoms). -Alkoxyphthalonitrile is obtained and further reacted with ammonia gas using sodium methoxide in dehydrated methanol as a catalyst to give a diiminoisoindoline intermediate (formula (4)) in the presence or absence of a magnesium or transition metal salt. A phthalocyanine derivative (formula (5)) obtained by ring-closing condensation in 2-dimethylaminoethanol in the presence of a solvent under boiling point reflux, or a commercially available phthalocyanine derivative in which R = halogen or hydrogen in formula (1) is reduced under reduced pressure. It is obtained by irradiating steam generated by heating with high frequency to generate active species generated on a smooth substrate and spontaneously polymerizing the active species.
このようにして得られる厚さ20Å〜100μmの重合
化フタロシアニン誘導体の半導性薄膜(以下「S」と略
する。)を半導体層として用いたものが本発明のMSM
またはMIS型素子である。 The MSM of the present invention is obtained by using a semiconductive thin film (hereinafter abbreviated as "S") of a polymerized phthalocyanine derivative having a thickness of 20Å to 100 µm thus obtained as a semiconductor layer.
Alternatively, it is a MIS type element.
このとき、基板の材質が、シート抵抗30Ω/sq以下の
酸化インジウムスズ、あるいはグラファイト、グラッシ
ーカーボン、ヒ素、パラジウム、テルル、レニウム、イ
リジウム、白金、金、ロジウム、ルテニウム、セレン、
ゲルマニウムのような仕事関数の大きい導電性材料(M
A)のいずれかであるときは、S層の上にベリリウム、
リチウム、ナトリウム、マグネシウム、アルミニウム、
カリウム、カルシウム、スカンジウム、チタン、マンガ
ン、ジルコニウム、アンチモン、ランタニド類、タリウ
ム、鉛より選ばれる仕事関数の小さい導電性材料
(MB)を通常の熱蒸着あるいはスパッタリング等によ
り被覆すれば、MSM型の素子が得られる。At this time, the substrate material is indium tin oxide having a sheet resistance of 30 Ω / sq or less, or graphite, glassy carbon, arsenic, palladium, tellurium, rhenium, iridium, platinum, gold, rhodium, ruthenium, selenium,
Conductive material with high work function (M
A ) is either beryllium on the S layer,
Lithium, sodium, magnesium, aluminum,
Potassium, calcium, scandium, titanium, manganese, zirconium, antimony, lanthanides, thallium, if the coating less conductive work function material selected from lead and (M B) by conventional thermal vapor deposition or sputtering or the like, the MSM type The device is obtained.
また、SとMBの間に、炭素数16〜22の直鎖飽和脂
肪酸の金属塩、好ましくはカドミウウ塩、水銀塩または
アルカリ土類金属塩の単分子絶縁層(以下Iと略)を形
成させておけば、MIS型素子が得られる。S層形成の
標準的な条件は、式(1)のフタロシアニン誘導体1〜1
00mg、300〜400℃、0.1〜1.0torr、加熱
されたフタロシアニン誘導体から基板までの距離1〜1
0cm、高周波出力1〜300W、重合時間3秒〜5分で
あり、使用するフタロシアニン誘導体の種類、形成しよ
うとするS層厚により、条件が決定される。Further, formed between the S and M B, metal salts of straight-chain saturated fatty acid of 16 to 22 carbon atoms, preferably Kadomiuu salts, monomolecular insulating layer of mercury salts or alkaline earth metal salt (hereinafter I substantially) By doing so, a MIS type element can be obtained. The standard conditions for forming the S layer are phthalocyanine derivatives 1 to 1 of the formula (1).
00 mg, 300-400 ° C., 0.1-1.0 torr, distance from heated phthalocyanine derivative to substrate 1-1
0 cm, high frequency output 1 to 300 W, polymerization time 3 seconds to 5 minutes, and the conditions are determined by the type of phthalocyanine derivative used and the S layer thickness to be formed.
たとえば、R=既述のアルコキシ基のフタロシアニン誘
導体を用いてS層厚約100Åの薄膜をガラス基板上に
形成するときは、好ましくは試料量約30mg、350〜
370℃、0.1〜0.3Torr、距離3〜5cm、高周波
出力、10〜30W、重合時間30秒〜1分であり、R
=ハロゲンのときの式(1)のフタロシアニン誘導体を用
いてS層厚約500Åの薄膜をガラス基板上に形成する
ときは試料量約40mg、300〜330℃、0.3〜
0.5Torr、距離2〜4cm、高周波出力5〜15W、重
合時間1分〜2分であり、R=Hのときの式(1)のフタ
ロシアニン誘導体を用いてS層厚約100Åの薄膜をガ
ラス基板上に形成するときは試料量約30mg、330〜
350℃、0.5〜0.7Torr、距離4〜6cm、高周波
出力30〜50W、重合時間30秒〜1分が適当であ
る。For example, when a thin film having an S layer thickness of about 100 Å is formed on a glass substrate by using R = the above-mentioned phthalocyanine derivative of an alkoxy group, the sample amount is preferably about 30 mg, 350 to
370 ° C., 0.1 to 0.3 Torr, distance 3 to 5 cm, high frequency output, 10 to 30 W, polymerization time 30 seconds to 1 minute, R
= When a thin film having an S layer thickness of about 500Å is formed on a glass substrate using the phthalocyanine derivative of the formula (1) when halogen is used, the sample amount is about 40 mg, 300 to 330 ° C, 0.3 to
0.5 Torr, distance 2 to 4 cm, high frequency output 5 to 15 W, polymerization time 1 to 2 minutes, and glass of a thin film having an S layer thickness of about 100 Å using the phthalocyanine derivative of the formula (1) when R = H. When formed on a substrate, the sample amount is about 30 mg, 330-
350 ° C., 0.5 to 0.7 Torr, distance 4 to 6 cm, high frequency output 30 to 50 W, and polymerization time 30 seconds to 1 minute are suitable.
このようにして作成されたS層の厚さが約0.1μmを
超えるときにはリフトオフ等の方式により平滑基板上よ
りはく離できる。例えば、はく離したS膜の両面には各
々MAとMB(又はI/MB)を積層すれば、MA及び
MB層はたかだか150Å程度あれば充分であるので全
体厚数百μm以下の積層化薄膜状のMSMないしMIS
型の素子が作成できる。また、基板上のS層の上にMA
(あるいはMBないしI/MB)薄膜を形成してからは
く離し、しかる後に反対側の面にMBないしI/M
B(あるいはMA)薄膜を形成させても良い。When the thickness of the S layer thus formed exceeds about 0.1 μm, it can be peeled off from the surface of the smooth substrate by a method such as lift-off. For example, if M A and M B (or I / M B ) are laminated on both sides of the separated S film, it is sufficient for the M A and M B layers to be at most 150 Å, so the total thickness is several hundred μm or less. Stacked thin film MSM or MIS
A mold element can be created. Also, on the S layer on the substrate, M A
(Or to no M B I / M B) was peeled off after forming a thin film, to no M B on the opposite side thereafter I / M
A B (or M A ) thin film may be formed.
〔発明の効果〕 本発明の重合化フタロシアニン誘導体はすぐれた半導体
特性を有し、これを半導体層として用いた本発明のMS
MないしMIS型素子は、整流特性、ダイオード特性に
優れ、数百mA/cm2の大電流ないし電圧印加±10V
の範囲でも破壊されない。従ってダイオード等の整流素
子、電界効果トランジスタ等に利用できる。また、推定
構造式(2)に示したように半導体層がフタロシアニン骨
核を有しており緑〜青緑色を呈し、可視部〜近赤外部に
巾広い吸収帯を有する。従って、太陽電池として利用で
きる。また、既述したように、全体厚が数百μm以下の
積層化薄膜を形成でき、使用時に必要とする特性に見合
った任意の大きさに切って利用できる。[Effects of the Invention] The polymerized phthalocyanine derivative of the present invention has excellent semiconductor properties, and the MS of the present invention using the same as a semiconductor layer.
The M or MIS type element has excellent rectification characteristics and diode characteristics, and a large current or voltage application of several hundred mA / cm 2 ± 10 V
It is not destroyed even in the range of. Therefore, it can be used as a rectifying element such as a diode or a field effect transistor. Further, as shown in the estimated structural formula (2), the semiconductor layer has a phthalocyanine skeleton, exhibits green to blue-green, and has a wide absorption band in the visible region to the near infrared region. Therefore, it can be used as a solar cell. In addition, as described above, a laminated thin film having a total thickness of several hundreds of μm or less can be formed, and the thin film can be cut into any size suitable for the characteristics required at the time of use.
次に本発明を実施例および参考例によりさらに詳細に説
明する。Next, the present invention will be described in more detail with reference to Examples and Reference Examples.
参考例1 4−ニトロ−1,2−フタロニトリル(NPNと略)5
0g(0.29モル)、メタノール11.21g(0.
35モル)を100mlの脱水DMFに溶解し、CaC
l2乾燥管付き還流管、窒素導入管を備えた300ml
4ツ口フラスコに入れ、撹拌しながら窒素雰囲気下に
1,8−ジアザビシクロ〔5,4,0〕ウンデセン−
(7)(DBUと略)を43.07ml(0.29モル)を加
え、60℃にて10時間反応させた。冷却後40℃以下
にて減圧濃縮し、適量のクロロホルムを加えて600ml
の氷冷6N−HCl中に投じ、クロロホルム相を分離す
る。水相を100ml×3回のクロロホルムで抽出して
光のクロロホルム相と合わせ、無水硫酸ナトリウムで乾
燥、濾過、活性炭脱色し、減圧濃縮する。冷却後析出す
る黄色結晶(未反応のNPN)を取り除き、母液をさら
に濃縮して再結晶し、白色結晶42.7g(93.1
%)を得た。分析の結果、目的の4−メトキシ−1,2
−フタロニトリルであることがわかった。Reference Example 1 4-Nitro-1,2-phthalonitrile (abbreviated as NPN) 5
0 g (0.29 mol), 11.21 g of methanol (0.
35 mol) was dissolved in 100 ml of dehydrated DMF to give CaC.
l 2 drying tube equipped with a reflux tube, a nitrogen inlet tube 300ml
The mixture was placed in a 4-necked flask and stirred under a nitrogen atmosphere to give 1,8-diazabicyclo [5,4,0] undecene-.
43.07 ml (0.29 mol) of (7) (abbreviated as DBU) was added and reacted at 60 ° C. for 10 hours. After cooling, concentrate under reduced pressure below 40 ° C, add an appropriate amount of chloroform, and add 600 ml.
Pour into ice-cold 6N HCl and separate the chloroform phase. The aqueous phase is extracted with 100 ml × 3 times of chloroform, combined with the light chloroform phase, dried over anhydrous sodium sulfate, filtered, decolorized with activated carbon, and concentrated under reduced pressure. After cooling, the yellow crystals (unreacted NPN) that had precipitated were removed, and the mother liquor was further concentrated and recrystallized to yield 42.7 g (93.1) of white crystals.
%) Was obtained. As a result of the analysis, the desired 4-methoxy-1,2-
Found to be phthalonitrile.
4−メトキシ−1,2−フタロニトリル NMR(CDCl3,δppm):Ha7.1、7.2
(1H)、Hb7.2(1H)、Hc7.65、7.7
(1H)、CH33.9(3H)IR(KBr錠剤、cm
-1):νφH3100、3050、3000、 2950、2850、νC≡N2250、νring161
0 このもの全量を既述と同様の装置に入れ、脱水メタノー
ル200ml中、ナトリウムメトキシド2gを加え、乾
燥アンモニアガスを激しく通じながら常温で2時間、沸
点還流下に1時間反応させた。冷却後生じる白色沈澱を
濾集し、真空乾燥して5−メトキシジイミノイソインド
リン43.1g(91.1%)を得た。このものは強吸
湿性であり、IR(KBr錠剤、cm-1)よりνNH340
0、δNH1640の出現及びνC=N2250の消失に
より構造を確認した。4-methoxy-1,2-phthalonitrile NMR (CDCl 3 , δppm): Ha7.1, 7.2
(1H), Hb7.2 (1H), Hc7.65, 7.7
(1H), CH 3 3.9 (3H) IR (KBr tablet, cm
-1 ): ν φH 3100, 3050, 3000, 2950, 2850, νC≡N2250, ν ring 161
0 The whole amount of this was put in the same apparatus as described above, 2 g of sodium methoxide was added to 200 ml of dehydrated methanol, and the reaction was carried out at room temperature for 2 hours while vigorously passing dry ammonia gas, and for 1 hour under boiling point reflux. The white precipitate formed after cooling was collected by filtration and dried in vacuum to obtain 43.1 g (91.1%) of 5-methoxydiiminoisoindoline. This product has a strong hygroscopic property, and IR (KBr tablets, cm -1 ) gives ν NH 340.
The structure was confirmed by the appearance of 0, δ NH 1640 and the disappearance of ν C = N 2250.
参考例2〜7 参考例1と同様の装置にて、第1表に記載の仕込みで反
応を行い、相当する4−アルコキシ−1,2−フタロニ
トリルを得た。但し、炭素数4以上のものは油状であ
り、再結晶の替りにφ10×30cmのシリカゲルカラム
(100〜200メッシュ)を用い、クロロホルムを展
開溶媒とし、第1表に記載のRf値の主流出部を分取し
て溶媒を減圧留去して得た。Reference Examples 2 to 7 The same apparatus as in Reference Example 1 was used to carry out the reaction described in Table 1 to obtain the corresponding 4-alkoxy-1,2-phthalonitrile. However, those having 4 or more carbons are oily, and instead of recrystallization, a φ10 × 30 cm silica gel column (100 to 200 mesh) was used, chloroform was used as a developing solvent, and the main outflow of the Rf value shown in Table 1 was used. Part was collected and the solvent was distilled off under reduced pressure.
参考例8〜13 参考例2〜7で得た4−アルコキシフタロニトリル類の
各々全量を参考例1の後段と全く同様に処理し、IRに
より同様に構造を確認し、各々相当する5−エトキシジ
イミノイソインドリン49.2g(96.3%)、5−
(n−プロポキシ)ジイミノイソインドリン51.8g
(96.2%)、5−(n−ブトキシ)ジイミノイソイ
ンドリン57.6g(96.4%)、5−(tert−ブト
キシ)ジイミノイソインドリン59.8g(98.2
%)、5−(n−ペントキシ)ジイミノイソインドリン
59.0g(98.1%)、5−(1−メチルブトキ
シ)ジイミノイソインドリン60.1g(97.4)を
得た。 Reference Examples 8 to 13 All the 4-alkoxyphthalonitriles obtained in Reference Examples 2 to 7 were treated in exactly the same manner as in the latter stage of Reference Example 1, and the structure was similarly confirmed by IR. Diiminoisoindoline 49.2 g (96.3%), 5-
(N-propoxy) diiminoisoindoline 51.8 g
(96.2%), 5- (n-butoxy) diiminoisoindoline 57.6 g (96.4%), 5- (tert-butoxy) diiminoisoindoline 59.8 g (98.2)
%), 5- (n-pentoxy) diiminoisoindoline 59.0 g (98.1%), and 5- (1-methylbutoxy) diiminoisoindoline 60.1 g (97.4).
参考例14 参考例1の5−メトキシジイミノイソインドリン17.
5g(0.1モル)を50mlの脱水2−ジメチルアミ
ノエタノールに分散し、CaCl2乾燥管付還流管を備
えた200ml三角フラスコ中で撹拌しながら5時間沸
点還流する。内容を1の温メタノール中に撹拌しなが
ら投じ、生成する緑色沈澱を濾集、乾燥して、式(1)に
おいてR=メトキシ、Me=H2のフタロシアニン誘導
体12.1g(76.3%)を得た。このものはクロロ
ホルムに10-5モル/程度溶解する他は、殆んど全て
の有機溶剤に不溶である。Reference Example 14 5-methoxydiiminoisoindoline of Reference Example 1 17.
5 g (0.1 mol) is dispersed in 50 ml of dehydrated 2-dimethylaminoethanol, and boiling point is refluxed for 5 hours while stirring in a 200 ml Erlenmeyer flask equipped with a reflux tube with a CaCl 2 drying tube. The content was thrown into 1 warm methanol with stirring, and the green precipitate formed was collected by filtration and dried to obtain 12.1 g (76.3%) of a phthalocyanine derivative of R = methoxy and Me = H 2 in the formula (1). Got It is insoluble in almost all organic solvents except that it dissolves in chloroform at about 10 -5 mol / about.
元素分析(wt%、カッコ内計算値): C68.15(68.13)、H4.17(4.1
3)、N17.70(17.66) 可視吸収スペクトル(クロロホルム、nm、カッコ内lo
g ε):702(4.96)、664(4.88)、
642(4.53)、605.5(4.30) 参考例15〜20 参考例14と同様に、但し第2表に示す5−アルコキシ
ジイミノイソインドリンを用い、第2表に示すR=アル
コキシ、Me=H2のフタロシアニン誘導体を得た。Elemental analysis (wt%, calculated value in parentheses): C68.15 (68.13), H4.17 (4.1)
3), N17.70 (17.66) visible absorption spectrum (chloroform, nm, parenthesized lo)
g ε): 702 (4.96), 664 (4.88),
642 (4.53), 605.5 (4.30) Reference Examples 15 to 20 Similar to Reference Example 14, except that 5-alkoxydiiminoisoindoline shown in Table 2 was used and R = shown in Table 2 was used. A phthalocyanine derivative of alkoxy, Me = H 2 , was obtained.
参考例21 参考例14と同様に、但し塩化第一銅14.9g(0.
15モル)を加えて反応を行い、粗生成物を20%塩酸
−メタノール1中に投じ、生じる沈澱を濾集、メタノ
ールで洗浄をくり返し、減圧乾燥して、式(1)において
R=メトキシ、Me=銅(II)のフタロシアニン誘導体
12.3g(70.7%)を得た。Reference Example 21 Similar to Reference Example 14, except that 14.9 g of cuprous chloride (0.
(15 mol) to carry out the reaction, throw the crude product in 20% hydrochloric acid-methanol 1, collect the resulting precipitate by filtration, repeat washing with methanol, and dry under reduced pressure to obtain R = methoxy in the formula (1), 12.3 g (70.7%) of Me = copper (II) phthalocyanine derivative was obtained.
元素分析(wt%、カッコ内計算値): C62.07(62.11)、H3.44(3.4
7)、N16.16(16.10) 可視吸収スペクトル(クロロホルム、nm、カッコ内lo
g ε):680(5.04)、615(4.60)、
567sh、381(4.40) 参考例22〜27 参考例21と同様に、但し第3表に示す仕込で反応さ
せ、同様に処理して相当するテトラアルコキシ金属フタ
ロシアニン誘導体を得た。但し、Me=マグネシウム
(II)、亜鉛(II)のときは酸性メタノールの替りに温
メタノールを用いて再沈操作を行った。Elemental analysis (wt%, calculated value in parentheses): C62.07 (62.11), H3.44 (3.4)
7), N16.16 (16.10) visible absorption spectrum (chloroform, nm, parenthesized lo)
g ε): 680 (5.04), 615 (4.60),
567 sh , 381 (4.40) Reference Examples 22 to 27 In the same manner as in Reference Example 21, except that the charges shown in Table 3 were reacted and treated in the same manner, corresponding tetraalkoxy metal phthalocyanine derivatives were obtained. However, when Me = magnesium (II) and zinc (II), the reprecipitation operation was performed using warm methanol instead of acidic methanol.
以上のように、4−ニトロ−1,2−フタロニトリルを
出発物質として塩基触媒存在下にアルコールと反応させ
て4−アルコキシ−1,2−フタロニトリルを得、さら
にアンモニアガスと反応させて5−アルコキシジイミノ
イソインドリン中間体を経て、金属塩の無存在下ないし
存在下に環化反応を行うと相当するテトラアルコキシ
(金属)フタロシアニン誘導体が得られる。なお、本参
考例では金属塩化物を用いたが、一般に酸化力を持たな
い対アニオン(例えばClO4 −、ClO3、Cl
O−、NO3 −、▲SO2- 4▼などを除く)の金属塩で
あれば良く、例えば酢酸塩などが好適であり、また配位
の結果総電荷数が0となるアセチルアセトナト錯体など
も好ましい。As described above, 4-nitro-1,2-phthalonitrile was used as a starting material to react with alcohol in the presence of a base catalyst to obtain 4-alkoxy-1,2-phthalonitrile, and further reacted with ammonia gas to give 5 The corresponding tetraalkoxy (metal) phthalocyanine derivative is obtained by carrying out the cyclization reaction in the absence or presence of a metal salt via an alkoxydiiminoisoindoline intermediate. Although metal chlorides were used in this reference example, generally, a counter anion having no oxidizing power (for example, ClO 4 − , ClO 3 , Cl) is used.
O -, NO 3 -, ▲ SO 2- 4 ▼ it may be a metal salt of an excluded) such as, for example, acetates are preferred, and coordination of the results acetylacetonato complexes total charge number becomes 0 Are also preferable.
実施例1 参考例14のテトラメトキシフタロシアニン10mgを添
付図面に示す装置の6の部分を設置し、半導体層作成用
基板として市販のITOネサガラス(2.5×5cm、厚
さ1.5mm、図中では3で表示)を6の真上2cm(2′
より真上2.5cm)に設置し、図において2は2′より
4.5cmの位置、4は3と6の中間に位置させた。7で
表示される排気管より排気して10-3torrとし、一旦排
気を中断して8で表示される吸気管よりアルゴンガスを
注入した。この排気−アルゴンガス注入操作を3回くり
返した後、10-1torrに保ち、6に電流を通じて加熱し
て300℃に保った。4で表示されるシャッター板の表
面にテトラメトキシフタロシアニンが付着しはじめた事
を確認した後、2−2′間に10W13.56MHzの
高周波を発生するよう電流を通じ、約5秒経過してから
シャッター板を3と6の中間の位置から側方にずらし、
試料の蒸気に高周波が印加されて発生する活性種が直接
3の基板に衝突するようにした。20秒間この状態を保
って後シャッターを閉じ直ちに高周波及び加熱用電源を
断って放冷した。装置内にアルゴンを注入して常圧に戻
し、基板を取出して熱蒸着装置に設置し、通常の方法で
アルミニウムを基板上に約3.5×5mmのスリット状、
厚さ150Åになるように蒸着した。この後半導体薄層
の一部をけずり取って元素分析を行い、またITO面が
露出した部分とアルミニウム蒸着部分にリード線を設置
してMSM型素子の構成とし直流電導度測定装置に接続
した。暗下で、あるいは白色光照射下で2mV/秒の速
度で電圧掃引し、そのときの電流値より電圧電流特性を
調べ、各種のパラメータを決定してMSM型素子として
の特性評価を行った。また、アルミニウムを蒸着してい
ない部分に関し可視吸収スペクトル測定を行った。また
触針式表面粗さ計により半導体層厚を求めた。 Example 1 10 mg of tetramethoxyphthalocyanine of Reference Example 14 was placed in the 6th part of the apparatus shown in the attached drawing, and a commercially available ITO Nesa glass (2.5 × 5 cm, thickness 1.5 mm, in the figure) was used as a substrate for forming a semiconductor layer. Then, it is indicated by 3) and 2 cm (2 'directly above 6)
2.5 cm above), 2 is located 4.5 cm from 2 ', and 4 is located between 3 and 6. The gas was exhausted from the exhaust pipe indicated by 7 to 10 -3 torr, the exhaust was temporarily stopped, and the argon gas was injected from the intake pipe indicated by 8. After repeating this evacuation-injection of argon gas three times, the temperature was maintained at 10 -1 torr, and a current was passed through 6 to maintain the temperature at 300 ° C. After confirming that tetramethoxyphthalocyanine has begun to adhere to the surface of the shutter plate indicated by 4, the electric current is applied to generate a high frequency of 10W 13.56MHz between 2-2 ', and the shutter is released for about 5 seconds. Move the plate to the side from the middle position between 3 and 6,
The active species generated by applying a high frequency to the vapor of the sample were made to directly collide with the substrate of 3. After maintaining this state for 20 seconds, the shutter was closed and the power supply for high frequency and heating was immediately cut off and the mixture was allowed to cool. Argon was injected into the device to return it to normal pressure, the substrate was taken out and placed in a thermal evaporation device, and aluminum was slit on the substrate in the usual manner into a slit shape of about 3.5 × 5 mm,
It was vapor-deposited to a thickness of 150Å. After that, a part of the semiconductor thin layer was scraped off for elemental analysis, and lead wires were installed on the exposed portion of the ITO surface and the aluminum vapor deposition portion to form an MSM type element and connected to a DC conductivity measuring device. The voltage was swept at a rate of 2 mV / sec in the dark or under the irradiation of white light, the voltage-current characteristics were examined from the current value at that time, various parameters were determined, and the characteristics of the MSM type element were evaluated. Further, visible absorption spectrum measurement was performed on a portion where aluminum was not vapor-deposited. Further, the semiconductor layer thickness was determined by a stylus type surface roughness meter.
半導体層の元素分析(wt%):C72,16、H3.
43、N20.10 参考1 フタロシアニンの理論値: C74.99、H3.15、N21.86 参考2 テトラメトキシフタロシアニンの理論値 C68.35、H3.82、N17.71 可視吸収スペクトル(nm):700、665、64
0、602、555 参考 フタロシアニンのスペクトル:698、665、
638、602、554 素子特性 暗下:整流比 1.42・103(但し1V
における値;以下同様)、ダイオードパラメータ1.6
開放電圧0.75V、閉路電流0.25nA/cm2 明下:開放電圧0.70V、閉路電流850nA/c
m2、フィルファクター0.32、光電変換効率2.8・
10-2% 半導体層厚:220Å この半導体層はあらゆる有機溶剤、濃硫酸等に不溶であ
り(出発物質のテトラメトキシフタロシアリンは、クロ
ロホルム、熱クロロナフタレンに微溶、濃硫酸に可
溶)、その可視吸収スペクトルからフタロシアニン骨核
は維持されているが、フタロシアニンとテトラメトキシ
フタロシアニンの中間的なスペクトルであり、また元素
分析からはメトキシ基4つのうち2.5個を失った構造
に対応し、そのメトキシ基を失った部位でフタロシアニ
ン骨核同士が結合して重合化された推定構造式(2)に類
似の構造となっているものと思われる。またこの半導体
層をSとし、MAにITO、MBにアルミニウムを用い
たMSM型素子は上述のごとく良好な特性を示し、整流
素子、ダイオード、フォトダイオード等に利用できるこ
とがわかった。また、この素子は±10Vの範囲内の電
圧印加でも破壊されない。Elemental analysis of semiconductor layer (wt%): C72, 16, H3.
43, N20.10 Reference 1 Theoretical value of phthalocyanine: C74.99, H3.15, N21.86 Reference 2 Theoretical value of tetramethoxyphthalocyanine C68.35, H3.82, N17.71 Visible absorption spectrum (nm): 700 , 665, 64
0,602,555 Reference phthalocyanine spectrum: 698,665,
638, 602, 554 Device characteristics Dark: Rectification ratio 1.42 · 10 3 (However, 1V
In the following; the same applies hereinafter), diode parameter 1.6
Open circuit voltage 0.75 V, closed current 0.25nA / cm 2 Akirashita: open-circuit voltage 0.70 V, closed current 850nA / c
m 2 , fill factor 0.32, photoelectric conversion efficiency 2.8
10 -2 % Semiconductor layer thickness: 220Å This semiconductor layer is insoluble in all organic solvents, concentrated sulfuric acid, etc. (The starting material tetramethoxyphthalocyanine is slightly soluble in chloroform, hot chloronaphthalene, soluble in concentrated sulfuric acid) , Its visible absorption spectrum shows that the phthalocyanine skeleton is maintained, but it is an intermediate spectrum between phthalocyanine and tetramethoxyphthalocyanine, and elemental analysis shows that 2.5 of 4 methoxy groups have been lost. , It is considered that the phthalocyanine skeleton has a structure similar to the putative structural formula (2) in which phthalocyanine skeletons are polymerized by bonding with each other at the site where the methoxy group is lost. Further to the semiconductor layer and S, ITO to M A, MSM element using aluminum to M B exhibited good characteristics as described above, the rectifying element, a diode, can be utilized in the photodiode or the like was found. Further, this element is not destroyed even by applying a voltage within the range of ± 10V.
実施例2 実施例1と同様に、但しフタロシアニン30mgを用い、
ボートよりの直接加熱ではなく、添付図面において5で
示されたヒーターを用いて試料温度を340℃、真空度
0.6Torr、3と6の距離5cm、2と2’の距離を10
cm、高周波出力を40Wとし、2.5×2.5cm厚さ1
mmの白金板上に相当する半導体層を40秒間作成した。
この後は実施例1と同様にMSM型素子とし、元素分
析、スペクトル測定、特性測定、膜厚測定を行った。Example 2 As in Example 1, but using 30 mg of phthalocyanine,
Rather than direct heating from the boat, the temperature of the sample was 340 ° C., the degree of vacuum was 0.6 Torr, the distance between 3 and 6 was 5 cm, and the distance between 2 and 2 ′ was 10 by using the heater shown in FIG.
cm, high frequency output 40W, 2.5 × 2.5cm thickness 1
A semiconductor layer corresponding to a platinum plate of mm was formed for 40 seconds.
After this, an MSM element was prepared in the same manner as in Example 1, and elemental analysis, spectrum measurement, characteristic measurement, and film thickness measurement were performed.
半導体層の元素分析(wt%):C75.44、H2.
57、N21.99 可視吸収スペクトル(nm):699、665、63
8、602 素子特性 暗下:整流比 1.62・103、ダイオー
ドパラメータ1.55開放電圧0.76V、閉路電流
0.92nA/cm2 明下:開放電圧0.71V、閉路電流910nA/c
m2、フィルファクター0.33、光電変換効率3.4・
10-2% 半導体層厚:100Å この半導体層はあらゆる有機溶剤、濃硫酸等に不溶であ
り、スペクトル及び元素分析より、フタロシアニンのベ
ンゼン核の水素を3つ失い結合した重合化フタロシアニ
ンに対応する。また、一般の蒸着により作成したフタロ
シアニン薄膜が触れただけでこすり取られるもろい形状
であるのに対し、この半導体層は鋭利な刃先でない限り
傷がつきにくい等の優れた力学的強度を有する。さらに
素子特性で示したように、整流素子、ダイオード、フォ
トダイオード等に使用可能であることがわかる。Elemental analysis of semiconductor layer (wt%): C75.44, H2.
57, N21.99 visible absorption spectrum (nm): 699, 665, 63
8,602 Element characteristics Dark: Rectification ratio 1.62 · 10 3 , diode parameter 1.55 Open voltage 0.76V, closed current 0.92nA / cm 2 Bright: Open voltage 0.71V, closed current 910nA / c
m 2 , fill factor 0.33, photoelectric conversion efficiency 3.4
10 -2 % Semiconductor layer thickness: 100Å This semiconductor layer is insoluble in all organic solvents, concentrated sulfuric acid, etc., and corresponds to polymerized phthalocyanine which is bonded by losing 3 hydrogen atoms in the benzene nucleus of phthalocyanine by spectrum and elemental analysis. Further, while the phthalocyanine thin film formed by general vapor deposition has a fragile shape that can be scraped off just by touching it, this semiconductor layer has excellent mechanical strength such that it is not easily scratched unless it has a sharp cutting edge. Further, as shown in the element characteristics, it can be seen that it can be used as a rectifying element, a diode, a photodiode and the like.
実施例3〜23 実施例1と同様に、但し第4表にまとめて示す条件で半
導体層を作成し、MBを蒸着してMSM型素子とし、第
5表に示す結果を得た。また、第4表に示した各半導体
層の上に、気/水界面に作成した直鎖飽和脂肪酸の単層
膜を形成させ、さらにMBを蒸着ないし高周波スパッタ
リングしてMIS型素子として第6表に示す結果を得
た。In the same manner as in Example 3 to 23 Example 1, except to create a semiconductor layer under the conditions summarized in Table 4, the MSM element by depositing a M B, to give the results shown in Table 5. Further, on each semiconductor layer shown in Table 4, as the air / water interface to form a single layer film of straight-chain saturated fatty acids created, MIS type device further deposited to a high frequency sputtering M B 6 The results shown in the table were obtained.
なお表中において、VOC:ISC、R.R.、D.P.、
ηはそれぞれ開放電圧、閉路電流、電流比、ダイオード
パラメータ、フィルファクター、光電変換効率を示す。
なお、元素分析と可視吸収スペクトルより、半導体層の
構成はR基が3つ(実施例3〜5、7〜11、14〜1
6)ないし2.5個(6、12、13)ないし3.5個
(17)失われ、その部位で重合化した式(2)に類似の
構造と思われる。In the table, V OC : I SC , R. R. , D. P. ,
η indicates an open circuit voltage, a closed circuit current, a current ratio, a diode parameter, a fill factor, and a photoelectric conversion efficiency.
From the elemental analysis and the visible absorption spectrum, the structure of the semiconductor layer has three R groups (Examples 3 to 5, 7 to 11, and 14 to 1).
6) to 2.5 (6, 12, 13) to 3.5 (17) are lost, and the structure seems to be similar to the formula (2) polymerized at the site.
実施例24 参考例25のコバルト(II)テトラ(tert−ブトキシ)
フタロシアニン150mgを実施例1と同様に、但し5分
間重合化させた。ポリビニルアルコールを表面が平滑な
紙の上に濃厚水溶液から厚く(約1/10mm)展開し、生が
わきのうちに作成した半導体層上に接着した。乾燥後、
半導体層ごとはく離し、水中に投じてポリビニルアルコ
ールを溶解して半導体層を紙面より離し、充分水中に於
いて洗浄した。表面粗さ計及び可視吸収スペクトルの測
定を行った後、片面に白金を高周波スパッタリングで、
反対面にアルミニウムを熱蒸着で薄膜形成させ、三層構
造のMSM型素子とし、その電気特性を測定して次の結
果を得た。 Example 24 Cobalt (II) tetra (tert-butoxy) of Reference Example 25
150 mg of phthalocyanine were polymerized as in Example 1, but for 5 minutes. Polyvinyl alcohol was spread thickly (about 1/10 mm) from a concentrated aqueous solution on a paper with a smooth surface, and was adhered onto the semiconductor layer that was made aside. After drying
The semiconductor layer was peeled off, poured into water to dissolve polyvinyl alcohol, the semiconductor layer was separated from the paper surface, and sufficiently washed in water. After performing the measurement of the surface roughness meter and visible absorption spectrum, by high frequency sputtering platinum on one side,
A thin film of aluminum was formed on the opposite surface by thermal evaporation to form a three-layer structure MSM type element, and its electrical characteristics were measured to obtain the following results.
半導体層の元素分析(wt%):C67.37、H3.
44、N17.52、Co9.24 参考(出発の錯体の理論値):C67.20、H5.4
0、N13.06、Co6.87 可視吸収スペクトル(nm):675、650sh610 参考(出発の錯体の理論値):673:645sh、61
0 素子特性 暗下:整流比1.75・103、ダイオード
パラメータ1.6開放電圧0.77V、閉路電流0.7
7nA/cm2 明下:開放電圧0.71V、閉路電流865nA/c
m2、フィルファクター0.34、光電変換効率3.2・
10-2% 層厚:MA(Pt)570Å S 0.4μm MB(Al)150Å なお、元素分析とスペクトル測定より、この半導体層の
構成はRが3個失われてその部位で重合化された式(2)
に類似の構造と思われる。この素子は全体厚が約0.5
μmの薄膜状であり任意の面積に切って使用できる。Elemental analysis of semiconductor layer (wt%): C67.37, H3.
44, N17.52, Co9.24 Reference (theoretical value of starting complex): C67.20, H5.4
0, N13.06, Co6.87 Visible absorption spectrum (nm): 675, 650 sh 610 Reference (theoretical value of starting complex): 673: 645 sh , 61
0 Element characteristics Dark: Rectification ratio 1.75 · 10 3 , Diode parameter 1.6 Open voltage 0.77 V, Closing current 0.7
7 nA / cm 2 light: Open voltage 0.71 V, closed circuit current 865 nA / c
m 2 , fill factor 0.34, photoelectric conversion efficiency 3.2
10 -2 % Layer thickness: M A (Pt) 570Å S 0.4 μm M B (Al) 150 Å In addition, from the elemental analysis and spectrum measurement, the structure of this semiconductor layer was found to have lost 3 R and was polymerized at that site. Formula (2)
It seems that the structure is similar to. This element has a total thickness of about 0.5
It is in the form of a thin film of μm and can be cut into any area for use.
実施例25 参考例27のルテニウム(II)テトラ(1−メチルブト
キシ)フタロシアニン200mgを実施例1と全く同様
に、但し7分間重合化させた。さらに白金を通常の高周
波スパッタリングで表面被覆した後、実施例24と同様
にしてS+MA層をガラス基板よりはく離した。実施例
24と同様にS+MA層を紙表面より離し、垂直浸漬法
によりアラキン酸カドミウム塩の単層膜を20dyn/cmで
気/水界面より移し取り、さらにアルミニウムを熱蒸着
してMIS型素子とし、下記の結果を得た。Example 25 200 mg of ruthenium (II) tetra (1-methylbutoxy) phthalocyanine of Reference Example 27 was polymerized exactly as in Example 1, but for 7 minutes. After further surface coating of platinum in the usual high-frequency sputtering, the S + M A layer in the same manner as in Example 24 was peeled from the glass substrate. The S + M A layer in the same manner as in Example 24 apart from the paper surface, taking transferred from the air / water interface of the single layer film of arachidic acid cadmium salt 20 dyn / cm by vertical dipping method, MIS type device further thermally depositing aluminum The following results were obtained.
半導体層の元素分析(wt%):C63.74、H3.
52、N16.01、Ru14.55 参考(出発の錯体の理論値):C65.32、H5.6
9、N 11.72、Ru10.57 可視吸収スペクトル(nm):692、661sh620 参考(出発の錯体の吸収帯):689、658sh、61
7 素子特性 暗下:整流比 1.88・103、ダイオー
ドパラメータ1.5開放電圧0.81V、閉路電流0.
75nA/cm2 明下:開放電圧0.77V、閉路電流920nA/c
m2、フィルファクター0.36、光電変換効率3.8・
10-2% 層厚:MA(Pt)750Å S 1.2μm MB(Al)140Å なお、元素分析と可視吸収スペクトル測定より、この半
導体層の構成はR基が3つ失われ、その部位で重合化さ
れた式(2)に類似の構造と思われる。Elemental analysis of semiconductor layer (wt%): C63.74, H3.
52, N16.01, Ru14.55 Reference (theoretical value of starting complex): C65.32, H5.6
9, N 11.72, Ru10.57 Visible absorption spectrum (nm): 692, 661 sh 620 Reference (absorption band of starting complex): 689, 658 sh , 61
7 Device characteristics Dark: Rectification ratio 1.88 · 10 3 , diode parameter 1.5 open circuit voltage 0.81 V, closed circuit current 0.
75 nA / cm 2 light: Open voltage 0.77 V, closed circuit current 920 nA / c
m 2 , fill factor 0.36, photoelectric conversion efficiency 3.8
10 -2 % Layer thickness: M A (Pt) 750Å S 1.2 μm M B (Al) 140 Å In addition, from the elemental analysis and visible absorption spectrum measurement, the structure of this semiconductor layer lost three R groups, A structure similar to that of formula (2) polymerized by
実施例26 実施例24と同様に、但しコバルト(II)テトラ(tert
−ブトキシ)フタロシアニン500mgを用い、20分間
重合化させ、MAとしてセレンを、MBとしてアルミニ
ウムを熱蒸着してMSM型素子とした。Example 26 Similar to Example 24, except that cobalt (II) tetra (tert
- using butoxy) phthalocyanine 500mg, by 20 minutes polymerization, selenium as M A, was MSM type element Aluminum was thermally evaporated as M B.
半導体層の元素分析(wt%):C67.40、H3.
42、N17.55、Co9.21 可視吸収スペクトル(nm):675、650sh610 素子特性 暗下:整流比 1.8・103、ダイオード
パラメータ1.5開放電圧0.79V、閉路電流0.5
2nA/cm2 明下:開放電圧0.72V、閉路電流760nA/c
m2、フィルファクター0.36、光電変換効率3.1・
10-2% 層厚:MA(Se)250Å S 76μm MB(Al)150Å 実施例27 MAにゲルマニウムを用いた他は実施例26と同様にし
てMSM型素子を作成した。Elemental analysis of semiconductor layer (wt%): C67.40, H3.
42, N17.55, Co9.21 Visible absorption spectrum (nm): 675, 650 sh 610 Device characteristics Dark: Rectification ratio 1.8 · 10 3 , Diode parameter 1.5 Open circuit voltage 0.79 V, Closed circuit current 0.5
2 nA / cm 2 light: Open voltage 0.72 V, circuit current 760 nA / c
m 2 , fill factor 0.36, photoelectric conversion efficiency 3.1
10-2% layer thickness: the other using a germanium M A (Se) 250Å S 76μm M B (Al) 150Å Example 27 M A in the same manner as in Example 26 to create the MSM element.
半導体層の元素分析(wt%):C67.42、H3.
44、N17.52、Co9.18 可視吸収スペクトル(nm):675、650sh610 素子特性 暗下:整流比 1.9・103、ダイオード
パラメータ1.5開放電圧0.77V、閉路電流0.4
2nA/cm2 明下:開放電圧0.71V、閉路電流740nA/c
m2、フィルファクター0.36、光電変換効率3.0・
10-2% 層厚:MA(Ge)220Å S 82μm MB(Al)160ÅElemental analysis of semiconductor layer (wt%): C67.42, H3.
44, N17.52, Co9.18 Visible absorption spectrum (nm): 675, 650 sh 610 Device characteristics Dark: Rectification ratio 1.9.10 3 , Diode parameter 1.5 Open circuit voltage 0.77V, Closed circuit current 0.4
2 nA / cm 2 light: Open voltage 0.71 V, circuit current 740 nA / c
m 2 , fill factor 0.36, photoelectric conversion efficiency 3.0
10-2% layer thickness: M A (Ge) 220Å S 82μm M B (Al) 160Å
添付図面は、本発明の重合化フタロシアニン誘導体の薄
膜から成る半導体層を作成するための装置の一例を示す
概略側断面図である。 (図号番号の説明) 1・・・25φ×30cm程度のベルジャー(肉厚ガラス
製)、2及び2’・・・高周波発生用電極板及びその対
電極板(円盤状φ10×0.3cm)、3・・・半導体層
を表面に作成する基板、4・・・シャッター(φ10×
0.3cm)、5・・・タングステンヒーター(図では6
の真上に書いてあるが、実際は垂直線より60°の角度
で6の斜め上約0.5cmの所に設置される。)、6・・
・タングステンないしタンタル製ボート(試料を内部に
設置し、ヒーターも兼ねる2’の中心線に沿ってその真
上0.5cmの位置に設置)、7・・・真空系へ接続され
る排気管、8・・・アルゴンボンベヘ接続される吸気
管、9・・・テフロン系ゴム製Oリング、10・・・基
盤、11・・・2及び2’5、6に電源を供給するリー
ド線。The accompanying drawings are schematic side sectional views showing an example of an apparatus for producing a semiconductor layer composed of a thin film of a polymerized phthalocyanine derivative of the present invention. (Explanation of figure number) 1 ・ ・ ・ Bell jar (made of thick glass) of about 25φ × 30cm, 2 and 2 '・ ・ ・ High-frequency generating electrode plate and its counter electrode plate (disc-shaped φ10 × 0.3cm) 3 ... Substrate on which semiconductor layer is formed 4 ... Shutter (φ10 ×
0.3 cm), 5 ... Tungsten heater (6 in the figure)
Although it is written right above, it is actually installed about 0.5 cm diagonally above 6 at an angle of 60 ° from the vertical. ), 6 ...
・ Tungsten or tantalum boat (with sample placed inside and 0.5 cm above the center line of 2'which also functions as a heater), 7 ... an exhaust pipe connected to a vacuum system, 8 ... Intake pipe connected to an argon cylinder, 9 ... Teflon rubber O-ring, 10 ... Board, 11 ... 2 and lead wires for supplying power to 2'5 and 6.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 29/784 31/04 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Internal reference number FI technical display location H01L 29/784 31/04
Claims (9)
導体の蒸気に高周波を照射して生成する活性種を自然重
合させて得られる重合化フタロシアニン誘導体。 但しRは水素、ハロゲンまたは炭素数5以下の真鎖ない
し枝分れ炭化水素のアルコキシ基を示し、MeはH2、
マグネシウムまたは遷移金属イオンを示し、Rの置換位
置は上式のイソインドリン基において5−位または6−
位である。1. A polymerized phthalocyanine derivative obtained by spontaneously polymerizing active species produced by irradiating a vapor of a phthalocyanine derivative represented by the following formula (1) with high frequency. However, R represents hydrogen, halogen, or an alkoxy group of a true chain or branched hydrocarbon having 5 or less carbon atoms, Me represents H 2 ,
A magnesium or transition metal ion is shown, and the substitution position of R is 5-position or 6-position in the isoindoline group of the above formula.
Rank.
および仕事関数の小さい導電性材料層をこの順に積層し
てなるMSM型素子、または、仕事関数の大きい導電性
材料層、半導体層、絶縁層および仕事関数の小さい導電
性材料層をこの順に積層してなるMIS型素子におい
て、上記半導体層として、式(1)で表わされるフタロシ
アニン誘導体の蒸気に高周波を照射して生成する活性種
を自然重合させて得られる重合化フタロシアニン誘導体
の薄膜を使用したことを特徴とするMSMまたはMIS
型素子。 但しRは水素、ハロゲンまたは炭素数5以下の直鎖ない
し枝分れ炭化水素のアルコキシ基を示し、MeはH2、
マグネシウムまたは遷移金属イオンを示し、Rは置換位
置は上式のイソインドリン基において5−位または6−
位である。2. An MSM element formed by laminating a conductive material layer having a large work function, a semiconductor layer and a conductive material layer having a small work function in this order, or a conductive material layer having a large work function, a semiconductor layer, In a MIS-type device in which an insulating layer and a conductive material layer having a small work function are stacked in this order, an active species generated by irradiating a vapor of a phthalocyanine derivative represented by the formula (1) with high frequency is used as the semiconductor layer. MSM or MIS characterized by using a thin film of a polymerized phthalocyanine derivative obtained by natural polymerization
Mold element. However, R represents hydrogen, halogen, or a linear or branched hydrocarbon alkoxy group having 5 or less carbon atoms, and Me represents H 2 ,
R represents a magnesium or transition metal ion, and the substitution position of R is 5-position or 6-position in the isoindoline group of the above formula.
Rank.
(1)のフタロシアニン誘導体を減圧下に加熱気化させ、
その蒸気に高周波を照射して生成する活性種を自然重合
させて得られたものであることを特徴とする特許請求の
範囲第(2)項に記載のMSMまたはMIS型素子。3. A polymerized phthalocyanine derivative thin film having the formula:
The phthalocyanine derivative of (1) is heated and vaporized under reduced pressure,
The MSM or MIS type element according to claim (2), which is obtained by spontaneously polymerizing active species generated by irradiating the vapor with a high frequency.
抗30Ω/sq.以下の酸化イソジウムスズ、グラファイ
ト、グラッシーカーボン、ヒ素、パラジウム、テルル、
レニウム、イリジウム、白金、金、ロジウム、ルテニウ
ム、セレンおよびゲルマニウムより選ばれることを特徴
とする特許請求の範囲第(2)項に記載のMSMまたはM
IS型素子。4. A conductive material having a high work function has a sheet resistance of 30 Ω / sq. The following isodium tin oxide, graphite, glassy carbon, arsenic, palladium, tellurium,
MSM or M according to claim (2), characterized in that it is selected from rhenium, iridium, platinum, gold, rhodium, ruthenium, selenium and germanium.
IS type element.
ム、ベリリウム、ナトリウム、マグネシウム、アルミニ
ウム、カリウム、カルシウム、スカンジウム、チタン、
マンガン、ジルコニウム、アンチモン、ランタニド類、
タリウム、鉛より選ばれることを特徴とする特許請求の
範囲第(2)項に記載のMSMまたはMIS型素子。5. A conductive material having a low work function is lithium, beryllium, sodium, magnesium, aluminum, potassium, calcium, scandium, titanium,
Manganese, zirconium, antimony, lanthanides,
The MSM or MIS type element according to claim (2), which is selected from thallium and lead.
酸の金属塩から成る特許請求の範囲第(2)項に記載のM
IS型素子。6. The M according to claim 2, wherein the insulating layer comprises a metal salt of a linear saturated fatty acid having 16 to 22 carbon atoms.
IS type element.
カリ土類金属塩である特許請求の範囲第(2)項に記載の
MIS型素子。7. The MIS type element according to claim (2), wherein the metal salt is a cadmium salt, a mercury salt or an alkaline earth metal salt.
を気/水界面上に単分子膜形成させて垂直浸漬法ないし
水平付着法により半導体層上に移し取って作成されたも
のであることを特徴とする特許請求の範囲第(2)項に記
載のMIS型素子。8. An insulating layer made of a straight-chain fatty acid metal salt is formed by forming a monomolecular film on an air / water interface and transferring it onto a semiconductor layer by a vertical dipping method or a horizontal adhesion method. The MIS type element according to claim (2), which is characterized by being present.
る特許請求の範囲第(2)項〜第(8)項のいずれか一項に記
載のMSMまたはMIS型素子。9. The MSM or MIS type device according to any one of claims (2) to (8), wherein the semiconductor layer has a thickness of 20Å to 100 μm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60047296A JPH067590B2 (en) | 1985-03-09 | 1985-03-09 | Polymerized phthalocyanine derivative and MSM or MIS type device using the same as a semiconductor layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60047296A JPH067590B2 (en) | 1985-03-09 | 1985-03-09 | Polymerized phthalocyanine derivative and MSM or MIS type device using the same as a semiconductor layer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61207431A JPS61207431A (en) | 1986-09-13 |
| JPH067590B2 true JPH067590B2 (en) | 1994-01-26 |
Family
ID=12771318
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60047296A Expired - Lifetime JPH067590B2 (en) | 1985-03-09 | 1985-03-09 | Polymerized phthalocyanine derivative and MSM or MIS type device using the same as a semiconductor layer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH067590B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105817133A (en) * | 2016-05-03 | 2016-08-03 | 黄立维 | Device for removing harmful gases and treatment method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5242664B2 (en) * | 1973-12-19 | 1977-10-26 |
-
1985
- 1985-03-09 JP JP60047296A patent/JPH067590B2/en not_active Expired - Lifetime
Non-Patent Citations (2)
| Title |
|---|
| 応用物理,52〔12〕(1983)pp.1051(53)〜1057(59) |
| 高分子論文集,41〔9〕(Sep.,1984)pp.493〜499 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61207431A (en) | 1986-09-13 |
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