JPH0676277B2 - Single crystal growth equipment - Google Patents

Single crystal growth equipment

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Publication number
JPH0676277B2
JPH0676277B2 JP62234345A JP23434587A JPH0676277B2 JP H0676277 B2 JPH0676277 B2 JP H0676277B2 JP 62234345 A JP62234345 A JP 62234345A JP 23434587 A JP23434587 A JP 23434587A JP H0676277 B2 JPH0676277 B2 JP H0676277B2
Authority
JP
Japan
Prior art keywords
cover member
vapor
single crystal
crucible
shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62234345A
Other languages
Japanese (ja)
Other versions
JPS6479098A (en
Inventor
裕正 山本
雅之 森
小田  修
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eneos Corp
Original Assignee
Japan Energy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Energy Corp filed Critical Japan Energy Corp
Priority to JP62234345A priority Critical patent/JPH0676277B2/en
Publication of JPS6479098A publication Critical patent/JPS6479098A/en
Publication of JPH0676277B2 publication Critical patent/JPH0676277B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は化合物半導体単結晶の育成技術さらには蒸気圧
の高い構成元素を含む単結晶の製造装置に関し、例えば
液体封止チョクラルスキー法による化合物半導体単結晶
の製造に利用して効果的な技術に関する。
Description: TECHNICAL FIELD The present invention relates to a technique for growing a compound semiconductor single crystal and an apparatus for producing a single crystal containing constituent elements having a high vapor pressure, for example, by a liquid sealed Czochralski method. The present invention relates to a technique effectively used for manufacturing a compound semiconductor single crystal.

[従来の技術] 従来の単結晶育成技術、とりわけ液体封止チョクラルス
キー法(LEC法)においては、化合物半導体単結晶の育
成を開放系において実施してきたため、構成元素の1つ
の蒸気圧高い場合には育成結晶および融液からのこの構
成元素の揮散を阻止することができず、均一な組成で、
低欠陥密度でかつ電気的特性の優れた高品質結晶の育成
がが困難であった。そこで、このような結晶育成法の欠
陥を克服し、結晶育成雰囲気中の蒸気圧を制御すること
により、高蒸気圧元素の揮散を防止して高品質の結晶を
育成する蒸気圧制御法と呼ばれる結晶育成技術が提案さ
れている。
[Prior Art] In the conventional single crystal growth technology, especially the liquid-encapsulated Czochralski method (LEC method), since the growth of the compound semiconductor single crystal has been performed in an open system, when the vapor pressure of one of the constituent elements is high. Can not prevent volatilization of this constituent element from the grown crystal and the melt, with a uniform composition,
It was difficult to grow a high quality crystal with a low defect density and excellent electrical characteristics. Therefore, it is called a vapor pressure control method for overcoming the defects of the crystal growth method and controlling the vapor pressure in the crystal growth atmosphere to prevent the vaporization of the high vapor pressure element and grow a high quality crystal. Crystal growth techniques have been proposed.

この種の蒸気圧制御法では、容器を密閉することが必要
不可欠と考えられ、例えばるつぼ軸および引上げ軸をB2
O3等の低融点のガラスや、Ga等の低融点の金属でシール
することにより容器の密閉を行なうようにした2重融液
シールの引上げ法に関する発明が提案された(特開昭54
-123585号)。また、ガラスや低融点金属等の融液シー
ルを使用せず、石英等の封管(アンプル)中で育成する
こともあった。
In this type of vapor pressure control method, it is considered essential to hermetically close the container, and for example, the crucible shaft and the pulling shaft should be B 2
An invention relating to a method for pulling up a double melt seal in which a container is hermetically sealed by sealing with a glass having a low melting point such as O 3 or a metal having a low melting point such as Ga has been proposed (JP-A-54).
-123585). In addition, instead of using a melt seal made of glass or a low melting point metal, it was sometimes grown in a sealed tube (ampule) made of quartz or the like.

しかしながら、前者の2重融液シール法は、装置や操
作が複雑であり、生産性が低い、室温まで冷却したと
き、ガラスや金属の固化に伴い軸と容器が密着してしま
い、繰り返し連続して使用することができない、ガラ
スや金属からの不純物の汚染がある、ガラスや金属の
シール部から剥離あるいは脱落した付着物が結晶成長部
へ侵入することにより多結晶等の発生が起こり、単結晶
収率が低下する、等の欠点がある。一方、封管を使用す
る場合は、使用ごとに高価な石英等の容器を破損しなけ
ればならないという欠点を有していた。
However, in the former double melt sealing method, the equipment and operation are complicated, the productivity is low, and when cooled to room temperature, the shaft and the container come into close contact with each other due to the solidification of the glass or metal, resulting in repeated continuous operation. Cannot be used as a single crystal, there is contamination by impurities from glass or metal, and deposits that have peeled off or fallen from the seal of glass or metal enter the crystal growth part to cause polycrystal, etc. There are drawbacks such as a decrease in yield. On the other hand, when a sealed tube is used, it has a drawback that an expensive container such as quartz must be damaged each time it is used.

そこで、上記欠点を克服し、実用性に優れた蒸気圧制御
装置を実現するため、特開昭59-182297号記載の発明が
提案されるに至った。
Therefore, the invention described in JP-A-59-182297 has been proposed in order to overcome the above-mentioned drawbacks and realize a vapor pressure control device excellent in practicality.

第2図は特開昭59-182297号で開示されている装置を示
すもので、直径20mmの引上げ軸29の周囲に嵌合する内径
22mm、長さ20mmの円筒部30を有する保温筒28を、るつぼ
21の上方を覆うように設置し、この両者の間隙をもっ
て、揮発性元素が対流により流出することを防止したこ
とを特徴とするものである。
FIG. 2 shows an apparatus disclosed in Japanese Patent Laid-Open No. 59-182297, which has an inner diameter fitted around a pulling shaft 29 having a diameter of 20 mm.
A heat insulating cylinder 28 having a cylindrical portion 30 having a length of 22 mm and a length of 20 mm is attached to the crucible.
It is characterized in that it is installed so as to cover the upper part of 21 and has a gap between the two to prevent volatile elements from flowing out by convection.

[発明が解決しようとする問題点]] この先願発明は前述した2重融液シール法の問題点を克
服することは可能であるが、揮発性元素の容器外への流
出を防止し、もって一定蒸気圧下で結晶育成を行なうた
めの蒸気圧制御性能に関して重大な欠点を有しているこ
とが、本願発明者らの実験によって明らかにされた。す
なわち、特開昭59-182297号の明細書で述べられている
ような対流を防止する対策のみでは揮発性元素の流出は
充分に防止できず、これを防止するためには拡散による
流出をも防止するように装置を設計しなければ、蒸気圧
制御は実施できないことが明らかとなった。また、上記
装置では流出する蒸気に対して補給がないため、結晶の
育成中に容器内の揮発性元素蒸気圧が時間の経過に伴っ
てしだいに低下してしまい、通常、数〜10数時間要する
結晶育成中、一定の蒸気圧を保ことが原理的に不可能で
あるという問題があった。
[Problems to be Solved by the Invention] Although the invention of this prior application can overcome the problems of the double melt sealing method described above, it prevents volatile elements from flowing out of the container, Experiments by the inventors of the present application have revealed that there is a serious drawback regarding the vapor pressure control performance for growing crystals under a constant vapor pressure. That is, outflow of volatile elements cannot be sufficiently prevented only by the measures for preventing convection as described in the specification of JP-A-59-182297, and in order to prevent this, outflow due to diffusion is also required. It became clear that vapor pressure control cannot be implemented unless the device is designed to prevent it. Further, since there is no replenishment for the outflowing vapor in the above apparatus, the volatile element vapor pressure in the container gradually decreases with the passage of time during the growth of the crystal, usually several to several tens of hours. There is a problem that it is impossible in principle to maintain a constant vapor pressure during the required crystal growth.

この発明は、上記のような問題点に着目してなされたも
ので、蒸気圧の高い元素を含む単結晶を引上げ法により
育成する場合において、原料融液および引上げ中の単結
晶からの揮発性元素の揮散を防止し、かつ装置の繰返し
使用が可能で、しかも不純物の混入の少ない高品質な結
晶体を再現性よく育成できるような単結晶製造装置を提
供することにある。
This invention has been made in view of the above problems, in the case of growing a single crystal containing a high vapor pressure element by the pulling method, the volatility from the raw material melt and the single crystal during pulling An object of the present invention is to provide a single crystal production apparatus capable of preventing element volatilization, allowing repeated use of the apparatus, and capable of growing a high-quality crystal body with less impurities mixed therein with good reproducibility.

[問題点を解決するための手段] この発明は、引上げ法による化合物半導体単結晶の育成
における揮発性元素の流出量が1時間あたり1g以下であ
れば、蒸気圧をほぼ一定に制御することができるという
実証に基づいて、るつぼの周囲を半密閉型容器で覆い、
この半密閉型容器には引上げ軸と嵌合する円筒部を設
け、引上げ軸と円筒部との隙間の断面積Aと円筒部の長
さLとの比A/Lが、0.015cm以下になるようにするもので
ある。さらに、るつぼ周囲に揮発性元素を供給するリザ
ーバを設け、引上げ軸周囲の隙間から流出する蒸気量に
見合った量の蒸気を補給させるようにするものである。
[Means for Solving the Problems] The present invention can control the vapor pressure to be substantially constant if the outflow amount of the volatile element in the growth of the compound semiconductor single crystal by the pulling method is 1 g or less per hour. Based on the demonstration that it is possible, cover the crucible with a semi-enclosed container,
This semi-enclosed container is provided with a cylindrical portion that fits with the pulling shaft, and the ratio A / L between the cross-sectional area A of the gap between the pulling shaft and the cylindrical portion and the length L of the cylindrical portion is 0.015 cm or less. To do so. Further, a reservoir for supplying a volatile element is provided around the crucible so that an amount of vapor corresponding to the amount of vapor flowing out from the gap around the pulling shaft is replenished.

[作用] 上記した手段によれば、引上げ法による化合物半導体単
結晶の育成において、引上げ軸周囲の隙間からの揮発性
成分の流出を0.1g/hr以下に抑えて、るつぼ周辺の蒸気
圧をほぼ一定に保つことができ、これによって高品質の
結晶体を再現性良く育成できるような単結晶製造装置を
提供するという上記目的を達成することができる。
[Operation] According to the means described above, in growing a compound semiconductor single crystal by the pulling method, the outflow of volatile components from the gap around the pulling shaft is suppressed to 0.1 g / hr or less, and the vapor pressure around the crucible is almost reduced. It is possible to achieve the above-mentioned object of providing a single crystal manufacturing apparatus which can be kept constant and by which a high quality crystal can be grown with good reproducibility.

[実施例] 本発明を提案するにあたって、本発明者らは、化合物半
導体単結晶であるGaAsについて、揮発性成分であるAs蒸
気の容器の隙間からの流出量について調べた。実験に用
いた装置の概略図を第3図に示す。同図の装置は、高圧
容器11内に回転軸12により支持された半密閉型容器13を
配置し、半密閉型容器13の上壁には円筒部13aを形成
し、上方よりこの円筒部13aを貫通するように軸14を垂
下させるとともに、半密閉型容器13の周囲にはヒータ15
を配置してある。
[Example] In proposing the present invention, the present inventors investigated the outflow amount of As vapor, which is a volatile component, from the gap of the container for GaAs, which is a compound semiconductor single crystal. A schematic diagram of the apparatus used for the experiment is shown in FIG. In the apparatus shown in the figure, a semi-enclosed container 13 supported by a rotary shaft 12 is arranged in a high-pressure container 11, a cylindrical portion 13a is formed on an upper wall of the semi-enclosed container 13, and the cylindrical portion 13a is arranged from above. A shaft 14 is hung so as to penetrate through the heater, and a heater 15 is provided around the semi-enclosed container 13.
Has been placed.

この装置において、半密閉型容器13の円筒部13aの内径
と軸14の外径を変え、容器13内に金属Asを収容し、外部
のヒータ15で加熱してAsを揮発させ、蒸気圧をGaAsの結
晶成長時の分解圧にほぼ等しい1気圧とした場合の容器
外部へのAs蒸気の流出量を調べた。
In this apparatus, the inner diameter of the cylindrical portion 13a of the semi-hermetically sealed container 13 and the outer diameter of the shaft 14 are changed, metal As is housed in the container 13, and is heated by an external heater 15 to volatilize As and vaporize the vapor pressure. The outflow amount of As vapor to the outside of the container was examined under the condition of 1 atm, which is almost equal to the decomposition pressure during GaAs crystal growth.

第4図に、円筒部13aと軸14との隙間断面積Aに対する
円筒部13aの長さLの比A/L(cm)と1時間あたりのAs蒸
気の流出量VAS(g/hr)との関係を示す。同図よりA/Lを
小さくすることによりAs蒸気の流出抑制効果があること
が分かった。A/LとVASがほぼ比例関係にあるのは、As蒸
気の流出機構が拡散によるものと推定される。
Fig. 4 shows the ratio A / L (cm) of the length L of the cylindrical portion 13a to the clearance cross-sectional area A between the cylindrical portion 13a and the shaft 14 and the outflow amount of As vapor V AS (g / hr) per hour. Shows the relationship with. From the figure, it was found that reducing the A / L has the effect of suppressing the outflow of As vapor. It is estimated that the outflow mechanism of As vapor is due to diffusion that A / L and V AS have a nearly proportional relationship.

上記実験より、軸と円筒部との隙間から拡散により流出
する蒸気量VAS(g/hr)が1g/hr以下であれば、半密閉型
容器内のAs蒸気圧の時間経過に対する変動はほとんどな
いが、1g/hr程度以上の場合は結晶成長の時間経過に伴
い、As蒸気圧が減少し、蒸気圧を一定にする制御は不可
能となる。また、流出量が多少あったとしても、内部に
設置したリザーバ等からのAs蒸気の補給によりかなえる
程度であれば、蒸気圧一定の制御は可能となる。実際に
蒸気流出量VAS1g/hr程度であれば、リザーバを併用する
ことにより、結晶育成中のAs蒸気圧を容易に一定に保つ
ことができることが分かった。
From the above experiment, if the vapor amount V AS (g / hr) flowing out from the gap between the shaft and the cylindrical portion due to diffusion is 1 g / hr or less, the fluctuation of As vapor pressure in the semi-hermetic container hardly changes with time. However, when it is about 1 g / hr or more, the As vapor pressure decreases with the lapse of time for crystal growth, and it becomes impossible to control the vapor pressure to be constant. Further, even if the outflow amount is a little, it is possible to control the vapor pressure at a constant level as long as it can be satisfied by supplying As vapor from a reservoir or the like installed inside. It has been found that the vapor pressure of As can be easily kept constant during the crystal growth by actually using the reservoir if the vapor outflow rate V AS is about 1 g / hr.

本発明者は、上記実証に基づいて、第1図に示すような
単結晶引上げ装置を提案する。
The present inventor proposes a single crystal pulling apparatus as shown in FIG. 1 based on the above demonstration.

しかも、覆い部材の周囲にヒータを設けているため、こ
のヒータで覆い部材を適当に加熱してやることにより、
As等の蒸気が温度の低い覆い部材によって冷やされて内
壁面に析出するのを防止することができるとともに、炉
内温度分布をより精密に制御することができ、封止剤中
の温度勾配の調整が容易になる。
Moreover, since the heater is provided around the cover member, by appropriately heating the cover member with this heater,
It is possible to prevent vapor such as As from being cooled by the cover member that has a low temperature and to be deposited on the inner wall surface, and it is possible to control the temperature distribution in the furnace more precisely and to control the temperature gradient in the sealant. Adjustment becomes easy.

第1図において、1は不活性ガスもしくは窒素ガスによ
って加圧される高圧容器、2は高圧容器1の中央に配置
され、回転軸3によって支持されたるつぼで、このるつ
ぼ2内にGa,Asのような原料元素とB2O3のような封止剤
4が収納される。また、高圧容器1の上方からは、るつ
ぼ2内に向かって引上げ軸5が回転可能かつ上下動可能
に垂下されている。
In FIG. 1, 1 is a high-pressure container pressurized by an inert gas or nitrogen gas, 2 is a crucible which is arranged in the center of the high-pressure container 1 and which is supported by a rotating shaft 3. Ga, As is contained in the crucible 2. A raw material element such as and a sealant 4 such as B 2 O 3 are stored. Further, from above the high-pressure container 1, a pull-up shaft 5 is rotatably and vertically movable toward the inside of the crucible 2.

この実施例では、上記るつぼ2の周囲にカバー部材6が
設けられ、その外側に加熱用ヒータ7が配置されてい
る。カバー部材6の底壁には、るつぼを支持する回転軸
3と嵌合する円筒部6aが形成されている。また、カバー
部材6の上部には、覆い部材8が取り付けられ、カバー
部材6と覆い部材8とにより半密閉型容器が構成されて
いる。そして、上記覆い部材8の周囲には保温用ヒータ
9が配置され、覆い部材8の上端には、上記引上げ軸5
と嵌合する円筒部8aが形成されている。
In this embodiment, a cover member 6 is provided around the crucible 2 and a heating heater 7 is arranged outside the cover member 6. On the bottom wall of the cover member 6, a cylindrical portion 6a that fits with the rotating shaft 3 that supports the crucible is formed. A cover member 8 is attached to the upper portion of the cover member 6, and the cover member 6 and the cover member 8 constitute a semi-hermetic container. A heat retaining heater 9 is arranged around the cover member 8, and the pulling shaft 5 is provided at the upper end of the cover member 8.
A cylindrical portion 8a that fits with is formed.

この実施例では、上記円筒部8aと引上げ軸5との隙間お
よび回転軸3と円筒部6aとの隙間が、その隙間の断面積
Aと円筒部6a、8aの長さLとの比A/Lが各々0.06cm以下
となるように設計している。これによって、引上げ軸5
と回転軸3の両者の隙間から流出するヒ素の蒸気量はそ
れぞれ0.5g/hr以下となり、全体としてヒ素の流出量を1
g/hrに抑えることができ、対流による流出のみならず、
拡散によるヒ素の流出をも抑えることができる。
In this embodiment, the gap between the cylindrical portion 8a and the pulling shaft 5 and the gap between the rotating shaft 3 and the cylindrical portion 6a are the ratio A / of the sectional area A of the gap and the length L of the cylindrical portions 6a and 8a. It is designed so that each L is 0.06 cm or less. As a result, the pulling shaft 5
The amount of arsenic vapor flowing out of the gap between the rotating shaft 3 and the rotating shaft 3 is 0.5 g / hr or less, and the total amount of arsenic outflow is 1
It can be suppressed to g / hr, not only convection outflow,
Arsenic outflow due to diffusion can also be suppressed.

さらに、この実施例では、カバー部材6の底壁の一部か
ら下方に向かって下端が閉塞された導管6bが延設されて
おり、導管6bの下部周囲には補助ヒータ10が配置されて
いる。この導管6b内にヒ素のような揮発性元素を入れ、
補助ヒータ10により加熱することによって、その蒸気を
適宜量だけカバー部材6と覆い部材8とで囲まれた結晶
成長雰囲気となる空間内に供給できるようにされてい
る。つまり、導管6bの一部と補助ヒータ10とにより、蒸
気補給手段としてのリザーバが構成されている。
Further, in this embodiment, a conduit 6b whose lower end is closed is extended downward from a part of the bottom wall of the cover member 6, and an auxiliary heater 10 is arranged around the lower part of the conduit 6b. . Put a volatile element such as arsenic in this conduit 6b,
By heating with the auxiliary heater 10, a suitable amount of the vapor can be supplied into a space surrounded by the cover member 6 and the cover member 8 and serving as a crystal growth atmosphere. That is, a part of the conduit 6b and the auxiliary heater 10 form a reservoir as a vapor replenishing means.

このリザーバを構成するヒータ10の温度を調節すること
により、引上げ軸5と回転軸3の隙間から流出するヒ素
の蒸気量に見合った量の蒸気を発生させて補うことがで
きる。これにより、るつぼ2の周囲のヒ素蒸気圧を、長
時間(十数時間)の結晶育成中ずっと一定に保ることが
できる。
By adjusting the temperature of the heater 10 that constitutes this reservoir, it is possible to generate and compensate the amount of vapor corresponding to the amount of arsenic vapor flowing out from the gap between the pulling shaft 5 and the rotating shaft 3. As a result, the arsenic vapor pressure around the crucible 2 can be kept constant during the crystal growth for a long time (tens of hours).

このように、ヒ素の蒸気圧が、一定に保たれると、るつ
ぼ内の原料融液16および成長結晶体17の表面からのヒ素
の揮散を極力防止することができる。また、本実施例は
装置の構造が簡単であるとともに、2重融液シール法で
問題となっていた軸と容器との密着が回避され、装置を
繰り返し使用できるようになり、生産性が飛躍的に向上
するとともに、融液シール部からのシール材料の滴下に
よる汚染が防止され、高品質の単結晶を再現性良く製造
することができる。
In this way, if the vapor pressure of arsenic is kept constant, it is possible to prevent the volatilization of arsenic from the surfaces of the raw material melt 16 and the growth crystal body 17 in the crucible as much as possible. Further, in this embodiment, the structure of the device is simple, the close contact between the shaft and the container, which has been a problem in the double melt sealing method, is avoided, and the device can be repeatedly used, resulting in a dramatic increase in productivity. In addition, the contamination due to the dropping of the sealing material from the melt sealing portion is prevented, and a high-quality single crystal can be manufactured with good reproducibility.

次に、第1図に示す単結晶引上げ装置を用いて、GaAs単
結晶の成長を行なった場合の具体例について説明する。
Next, a specific example of growing a GaAs single crystal using the single crystal pulling apparatus shown in FIG. 1 will be described.

先ず、原料として純度7NのGaとAsを総量で4kgるつぼ2
内に仕込み、その上に封止剤としてB2O3を600g入れた。
使用したるつぼはpBN製で、内径が6インチの大きさで
ある。また、引上げ軸5と回転軸3の隙間面積と円筒部
の長さとの比A/Lは、各々0.05cmとするとともに、高圧
容器1内は20atmのアルゴンガスで満たし、リザーバに
より補給するヒ素の蒸気圧は1atmとした。そして、引上
げ軸5を6rpmの速度で、またるつぼ2の回転軸3を30rp
mの速度で引上げ軸と逆方向に回転させながら、9mm/hr
の速さで引上げ軸5を上昇させ、およそ17時間かけて結
晶の成長を行なった。
First, the total amount of Ga and As having a purity of 7N is 4 kg as a raw material.
Then, 600 g of B 2 O 3 as a sealant was put therein.
The crucible used is made of pBN and has an inner diameter of 6 inches. Further, the ratio A / L of the clearance area between the pulling shaft 5 and the rotating shaft 3 to the length of the cylindrical portion is 0.05 cm, and the inside of the high-pressure container 1 is filled with 20 atm of argon gas, and arsenic of arsenic supplied by the reservoir The vapor pressure was 1 atm. Then, the pulling shaft 5 is rotated at a speed of 6 rpm, and the rotary shaft 3 of the crucible 2 is rotated at 30 rp.
While rotating in the opposite direction to the pulling shaft at a speed of m, 9 mm / hr
The pulling shaft 5 was raised at the speed of, and the crystal was grown for about 17 hours.

その結果、直胴部の直径80mm、長さ150mm、重量約3.4kg
の大口径GaAs単結晶が得られた。結晶の表面は金属光沢
を有し、Asの分解のないことを示していた。容器を半密
閉とせず開放系とし、蒸気圧を制御しないで育成した結
晶は表面分解が大きく、成長方向に垂直に切断してウエ
ーハを切り出すと周辺部に分解に起因するGaのドロップ
レットがみられたが、上記実施例の蒸気圧制御を行なっ
て育成した結晶ではGaドロップレットの発生はなかっ
た。また、育成された結晶は全域にわたり107Ωcm以上
の高抵抗率であり、かつ良好な熱安定性を有していた。
さらに、第1図の装置のシールド部は、繰り返し行なっ
た育成実験を通して、破損することなく連続して使用す
ることができた。しかも、20回以上の結晶育成を通し
て、単結晶化率は90%以上であり、再現性良く、高品質
単結晶を得ることができることが分かった。
As a result, the diameter of the straight body part is 80 mm, the length is 150 mm, and the weight is about 3.4 kg.
A large-diameter GaAs single crystal was obtained. The surface of the crystals had a metallic luster, indicating no decomposition of As. Crystals grown in an open system without semi-sealing the container without controlling the vapor pressure have large surface decomposition, and when the wafer is cut by cutting perpendicular to the growth direction, Ga droplets due to decomposition are seen in the peripheral part. However, Ga droplets were not generated in the crystal grown by controlling the vapor pressure in the above example. The grown crystal had a high resistivity of 10 7 Ωcm or more over the entire area and had good thermal stability.
Further, the shield part of the apparatus shown in FIG. 1 could be continuously used without being damaged through repeated growth experiments. Moreover, it was found that the single crystallization rate was 90% or more through the crystal growth of 20 times or more, and a high quality single crystal could be obtained with good reproducibility.

なお、上記実施例では、引上げ軸5と回転軸3の両方の
隙間を調整するようにした実施例について説明したが、
軸と半密閉型容器との隙間が引上げ軸5と覆い部材8と
の間だけの場合(例えば、カバー部材6が回転軸3に固
定され、るつぼと半密閉型容器が一体に回転する構造の
場合)には、A/Lを0.1cm以下とすることにより、揮発性
成分の流出量を1g/hr以下に抑えることができる。ま
た、リザーバを併用することによって、より容易に蒸気
圧を一定に制御することができる。
In addition, in the above-mentioned embodiment, the embodiment in which the clearance between both the pulling shaft 5 and the rotating shaft 3 is adjusted has been described.
In the case where the gap between the shaft and the semi-hermetic container is only between the pulling shaft 5 and the cover member 8 (for example, the cover member 6 is fixed to the rotating shaft 3 and the crucible and the semi-hermetic container are integrally rotated). In this case, by setting A / L to 0.1 cm or less, the outflow rate of volatile components can be suppressed to 1 g / hr or less. Further, by using the reservoir together, the vapor pressure can be controlled to be constant more easily.

さらに、揮発性成分の流出量を0.1g/hr以下つまり隙間
断面積Aと長さLとの比で0.015以下とすることによ
り、リザーバを設けることなく蒸気圧制御を行なうこと
が可能となる。
Furthermore, by setting the outflow rate of the volatile component to be 0.1 g / hr or less, that is, the ratio of the gap cross-sectional area A to the length L is 0.015 or less, it becomes possible to control the vapor pressure without providing a reservoir.

なお、隙間断面積Aは対流による揮発性成分の流出を防
止できる範囲に選択され、本実施例の引上軸の径が2.5c
mの場合では5cm2以下とされる。また、長さLについて
も現状の装置の引上軸のストロークは60cmであるが装置
の大幅な改良を要しない30cm以下の範囲で選択される。
The clearance cross-sectional area A is selected in a range that can prevent the outflow of volatile components due to convection, and the diameter of the pulling shaft of this embodiment is 2.5c.
In case of m, it is less than 5 cm 2 . Also, the length L is selected within the range of 30 cm or less, which does not require a significant improvement of the apparatus, although the stroke of the lifting shaft of the present apparatus is 60 cm.

[発明の効果] 以上説明したように、この発明は、るつぼの周囲を半密
閉型容器で覆い、この半密閉型容器には引上げ軸と嵌合
する円筒部を設け、引上げ軸と円筒部との隙間の断面積
Aと円筒部の長さLとの比A/Lが、0.015cm以下になるよ
うにしたので、引上げ法による化合物半導体単結晶の育
成において、引上げ軸周囲の隙間からの揮発性成分の流
出を0.1g/hr以下に抑えて、るつぼ周辺の蒸気圧をほぼ
一定に保つことができ、これによって高品質の結晶体を
再現性良く育成できるという効果がある。
[Effects of the Invention] As described above, according to the present invention, the circumference of the crucible is covered with a semi-enclosed container, and the semi-enclosed container is provided with a cylindrical portion fitted with the pulling shaft. The ratio A / L between the cross-sectional area A of the gap and the length L of the cylindrical portion is set to 0.015 cm or less. Therefore, in growing the compound semiconductor single crystal by the pulling method, volatilization from the gap around the pulling axis is performed. It is possible to keep the vapor pressure around the crucible almost constant by suppressing the outflow of the sexual component to 0.1 g / hr or less, which has the effect of growing a high quality crystal with good reproducibility.

さらに、るつぼ周囲に揮発性元素を供給するリザーバを
設け、引上げ軸周囲の隙間から流出する蒸気量に見合っ
た量の蒸気を補給させるようにすると、より一層容易に
るつぼ周囲の蒸気圧を一定に保つことができ、高品質の
単結晶を得易いという効果がある。
Furthermore, by providing a reservoir that supplies volatile elements around the crucible so that the amount of vapor that corresponds to the amount of vapor flowing out from the gap around the pulling shaft can be replenished, the vapor pressure around the crucible can be made even easier. It has an effect that it can be maintained and a high quality single crystal can be easily obtained.

しかも、リザーバには独立したヒータを設けているた
め、このヒータを制御することによりリザーバ内のAs等
の揮発性元素を安定に供給することができる。
Moreover, since the reservoir is provided with an independent heater, the volatile element such as As in the reservoir can be stably supplied by controlling this heater.

なお、実施例ではLEC法を適用した場合について説明し
たが、この発明は封止剤を用いない引上げ法に利用する
こともできる。
Although the case where the LEC method is applied has been described in the embodiments, the present invention can also be applied to a pulling method that does not use a sealant.

【図面の簡単な説明】[Brief description of drawings]

第1図は、本発明に係る単結晶成長装置の一実施例を示
す断面図、 第2図は従来の蒸気圧制御を適用した結晶引上げ装置の
一例を示す断面図、 第3図は、本発明の提案に先立って引上げ軸の隙間面積
を流出蒸気量との関係を調べるのに使用した装置の断面
図、 第4図は引上げ軸の隙間面積と流出蒸気量との関係を示
すグラフである。 1……高圧容器、2……るつぼ、3……回転軸、5……
引上げ軸、6、8……半密閉型容器を構成する部材、7
……ヒータ、6a、8a……円筒部、6b,10……蒸気補給手
段(リザーバ)。
FIG. 1 is a sectional view showing an embodiment of a single crystal growth apparatus according to the present invention, FIG. 2 is a sectional view showing an example of a conventional crystal pulling apparatus to which vapor pressure control is applied, and FIG. Prior to the proposal of the invention, a sectional view of an apparatus used to investigate the relationship between the clearance area of the pulling shaft and the outflow vapor amount, and FIG. 4 is a graph showing the relationship between the clearance area of the pulling shaft and the outflow vapor amount. . 1 ... High-pressure container, 2 ... Crucible, 3 ... Rotating shaft, 5 ...
Pull-up shafts 6, 8 ... Members constituting a semi-enclosed container, 7
...... Heater, 6a, 8a …… Cylindrical part, 6b, 10 …… Steam supply means (reservoir).

───────────────────────────────────────────────────── フロントページの続き (72)発明者 小田 修 埼玉県戸田市新曽南3丁目17番35号 日本 鉱業株式会社電子材料・部品研究所内 (56)参考文献 特開 昭59−182297(JP,A) 特開 昭62−207799(JP,A) 特開 昭61−158896(JP,A) 特公 昭61−27358(JP,B2) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Osamu Oda Inventor Osamu Osamu 3-17-35, Shinzonan, Toda City, Saitama Prefecture, Japan Mining Co., Ltd. Electronic Materials and Parts Research Laboratories (56) Reference JP-A-59-182297 (JP, A) JP-A-62-207799 (JP, A) JP-A-61-158896 (JP, A) JP-B-61-27358 (JP, B2)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】原料を入れたるつぼを高圧容器内に設置し
ヒータにより加熱、融解させ、その原料融液表面に種結
晶を接触させてこれを徐々に引き上げることにより蒸気
圧の高い元素を含む化合物半導体単結晶の成長を行なう
単結晶成長装置において、上記高圧容器内に上記るつぼ
の周囲を囲繞するほぼ円筒状のカバー部材と該カバー部
材の上面に接合され上記るつぼの上部を覆う覆い部材と
からなる半密閉型容器を設け、上記覆い部材の周囲およ
び上記カバー部材の周囲にはそれぞれヒータを配置する
とともに、少なくとも結晶引き上げ軸が上記覆い部材を
貫通する部位に上記引上げ軸と嵌合する円筒部を形成
し、該円筒部と引上げ軸との隙間からの揮発性元素の対
流および拡散による流出量を0.1g/hr以下に抑えるよう
に、上記円筒部と引上げ軸との隙間断面積と円筒部の長
さとの比を0.015cm以下に設定し、さらに上記カバー部
材には、有底円筒状の導管とその下部周囲に取り付けら
れたヒータとからなり上記引上げ軸の隙間から流出する
揮発性元素の蒸気の量に見合った量の蒸気を補給する蒸
気補給手段を接続してなることを特徴とする単結晶成長
装置。
1. A crucible containing a raw material is placed in a high-pressure vessel, heated and melted by a heater, a seed crystal is brought into contact with the surface of the raw material melt, and this is gradually pulled up to contain an element having a high vapor pressure. In a single crystal growth apparatus for growing a compound semiconductor single crystal, a substantially cylindrical cover member that surrounds the periphery of the crucible in the high-pressure container, and a cover member that is joined to the upper surface of the cover member and covers the upper portion of the crucible. A semi-hermetic container comprising a heater and heaters arranged around the cover member and the cover member, respectively, and a cylinder fitted with the pulling shaft at least at a portion where the crystal pulling shaft penetrates the cover member. Part is formed, and the cylindrical part and the cylindrical part are pulled up so that the flow rate of convection and diffusion of volatile elements from the gap between the cylindrical part and the pulling shaft is suppressed to 0.1 g / hr or less. The ratio of the clearance cross-sectional area with the shaft to the length of the cylindrical portion is set to 0.015 cm or less, and the cover member is composed of a bottomed cylindrical conduit and a heater mounted around the lower part of the conduit. A single crystal growth apparatus comprising a vapor replenishing means for replenishing an amount of vapor corresponding to the amount of volatile element vapor flowing out from the gap.
JP62234345A 1987-09-18 1987-09-18 Single crystal growth equipment Expired - Lifetime JPH0676277B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62234345A JPH0676277B2 (en) 1987-09-18 1987-09-18 Single crystal growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62234345A JPH0676277B2 (en) 1987-09-18 1987-09-18 Single crystal growth equipment

Publications (2)

Publication Number Publication Date
JPS6479098A JPS6479098A (en) 1989-03-24
JPH0676277B2 true JPH0676277B2 (en) 1994-09-28

Family

ID=16969538

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62234345A Expired - Lifetime JPH0676277B2 (en) 1987-09-18 1987-09-18 Single crystal growth equipment

Country Status (1)

Country Link
JP (1) JPH0676277B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2576239B2 (en) * 1989-10-19 1997-01-29 日立電線株式会社 Compound semiconductor crystal growth equipment

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59182297A (en) * 1983-03-30 1984-10-17 Toshiba Corp Production of single crystal
JPH0684277B2 (en) * 1986-03-07 1994-10-26 日立電線株式会社 (III) -Group V compound semiconductor single crystal manufacturing method and apparatus thereof

Also Published As

Publication number Publication date
JPS6479098A (en) 1989-03-24

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