JPH07106943A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPH07106943A
JPH07106943A JP5251271A JP25127193A JPH07106943A JP H07106943 A JPH07106943 A JP H07106943A JP 5251271 A JP5251271 A JP 5251271A JP 25127193 A JP25127193 A JP 25127193A JP H07106943 A JPH07106943 A JP H07106943A
Authority
JP
Japan
Prior art keywords
matching
output
semiconductor integrated
integrated circuit
circuit device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5251271A
Other languages
Japanese (ja)
Inventor
Yoshitaka Umeki
義孝 梅木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP5251271A priority Critical patent/JPH07106943A/en
Publication of JPH07106943A publication Critical patent/JPH07106943A/en
Pending legal-status Critical Current

Links

Landscapes

  • Logic Circuits (AREA)

Abstract

PURPOSE:To unnecessitate the insertion of an impedance matching resistor and to eliminate the distortion of an output waveform by providing a selecting/ connecting means for selecting the combination of connection between the 1st and 2nd matching means and connecting these means to an external line. CONSTITUTION:The ON resistance value of transfer gates Tr1 and Tr2 are used for the impedance matching resistance in a matching circuit 8. As the ON resistance deffers between both gates Tr1 and Tr2, three types of matching resistance are available by combination of control between external control signals C1 and C2. Therefore the matching is secured between the characteristic impedance ZO of wiring of a printed board connected to a terminal 4 and the output impedance value of the terminal 4. Then the distortion of a waveform is eliminated. Furthermore each of >=3 transfer gates is controlled by the external control signal so that more types of matching resistance value are available. Thus the best one of many types of matching resistance value is selected.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体集積回路装置に関
し、特に論理回路から成りこの論理回路の出力を外部回
路に供給するための出力バッファ回路を備える半導体集
積回路装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit device, and more particularly to a semiconductor integrated circuit device including a logic circuit and an output buffer circuit for supplying the output of the logic circuit to an external circuit.

【0002】[0002]

【従来の技術】この種の半導体集積回路装置(以下LS
I)としてバイポーラ技術によるECL回路やMOS技
術によるCMOS回路などが広く用いられている。通
常、所要の機能を実現するために複数のLSIがプリン
ト基板に実装され、このプリント基板上の配線により、
個々のLSI相互間が接続される構成となっている。こ
の構成において、1つのLSIの出力端子(送端側)
と、その信号を入力とする他のLSIの入力端子(受端
側)間の配線接続方法として、受端側抵抗終端方法と受
端側開放方法の2種類がよく知られている。
2. Description of the Related Art This type of semiconductor integrated circuit device (hereinafter referred to as LS
As I), an ECL circuit based on bipolar technology and a CMOS circuit based on MOS technology are widely used. Usually, a plurality of LSIs are mounted on a printed circuit board in order to realize the required functions.
The individual LSIs are connected to each other. In this configuration, one LSI output terminal (sending side)
There are two well-known wiring connection methods between the input terminals (reception end side) of other LSIs to which the signal is input, that is, the reception end resistance termination method and the reception end open method.

【0003】受端側抵抗終端方法の代表例としてECL
回路があり、受端側は通常50Ωで終端される。この理
由としてプリント基板配線の特性インピーダンス(Z
0)が一般的に50Ωにて設計されているためであり、
各々のECL回路の入力端子には高速動作の出力波形が
そのまま伝搬される。
ECL is a typical example of the resistance termination method on the receiving end side.
There is a circuit, and the receiving end is normally terminated with 50Ω. The reason for this is that the characteristic impedance (Z
0) is generally designed with 50Ω,
The output waveform of the high speed operation is directly transmitted to the input terminal of each ECL circuit.

【0004】受端側開放方法の代表例はCMOS回路で
ある。受端側が抵抗終端されずに開放されており、かつ
CMOS出力の出力インピーダンス(ZC)がプリント
基板配線の特性インピーダンス(Z0)よりはるかに大
きいことが多く、また、もともとCMOS回路の動作速
度はECL回路に比して低速であり、したがって出力波
形もECLの出力波形より低速であり立ち上がり速度も
遅いので、実質的な波形の歪はほとんどなく、使用上の
不具合が生じることはなかった。
A typical example of the receiving end side opening method is a CMOS circuit. The receiving end is open without being resistance-terminated, and the output impedance (ZC) of the CMOS output is often much higher than the characteristic impedance (Z0) of the printed circuit board wiring. Also, the operating speed of the CMOS circuit is originally ECL. Since it is slower than the circuit and therefore the output waveform is slower than the ECL output waveform and the rising speed is also slow, there is practically no distortion of the waveform and no trouble occurs during use.

【0005】しかし、近年の半導体技術の進歩により、
CMOS回路から成るLSIデバイスも高速化され、出
力波形の立上がり、立下り速度が著しく向上してきた。
またこれに伴なって出力回路の出力インピーダンスも低
下傾向にあり、プリント基板配線の特性インピーダンス
との不整合に起因して出力波形の歪を生じるという不具
合がでてきた。
However, due to recent advances in semiconductor technology,
The speed of LSI devices made of CMOS circuits has also been increased, and the rising and falling speeds of output waveforms have been significantly improved.
Along with this, the output impedance of the output circuit also tends to decrease, causing a problem that the output waveform is distorted due to the mismatch with the characteristic impedance of the printed circuit board wiring.

【0006】図3を参照すると、この図には従来のCM
OS回路から構成された半導体集積回路装置(LSI)
1,2と、これらLSI1,2相互間を接続するプリン
ト基板上の配線3とを示す。LSI1は、出力用の端子
(パッド)4と、出力バッファ6とを備え、LSI2は
入力用の端子5と、入力バッファ7とを備える。
Referring to FIG. 3, this figure shows a conventional CM.
Semiconductor integrated circuit device (LSI) including an OS circuit
1 and 2 and a wiring 3 on a printed circuit board that connects these LSIs 1 and 2 to each other. The LSI 1 includes an output terminal (pad) 4 and an output buffer 6, and the LSI 2 includes an input terminal 5 and an input buffer 7.

【0007】LSI1の端子4の波形の一例を示す図4
を参照すると、出力バッファ6の出力インピーダンスZ
Cがプリント基板配線の特性インピーダンスZ0と等し
い、すなわち整合状態にある場合は、曲線Bのように出
力波形に歪はない。また、出力インピーダンスZCが特
性インピーダンスZ0より小さい場合および大きい場合
は、それぞれ曲線A,Cのように出力波形に歪が生じ
る。
FIG. 4 showing an example of the waveform of the terminal 4 of the LSI 1.
Referring to, the output impedance Z of the output buffer 6
When C is equal to the characteristic impedance Z0 of the printed circuit board wiring, that is, in the matched state, there is no distortion in the output waveform as shown by the curve B. When the output impedance ZC is smaller than or larger than the characteristic impedance Z0, the output waveform is distorted as shown by curves A and C, respectively.

【0008】この問題を解決する方法として、配線3の
特性インピーダンスZ0を低くすることが考えられる。
特性インピーダンスZ0の低減方法としては、基板材質
をアルミナ等の高誘電率のものに変更することや、配線
幅の拡大などがある。
As a method of solving this problem, it can be considered to lower the characteristic impedance Z0 of the wiring 3.
Methods for reducing the characteristic impedance Z0 include changing the substrate material to one having a high dielectric constant such as alumina, and expanding the wiring width.

【0009】さらに、送端側すなわち端子4と配線3と
の間に整合用の抵抗を挿入してインピーダンスの整合化
をはかり、波形の歪を解消する方法もある。
Further, there is also a method of inserting a matching resistor between the sending end side, that is, between the terminal 4 and the wiring 3 to achieve impedance matching and eliminate waveform distortion.

【0010】[0010]

【発明が解決しようとする課題】上述した従来の半導体
集積回路装置は、半導体技術の進歩に伴なう、動作の高
速化に対応して出力インピーダンスが低下してきている
ので、プリント基板配線の特性インピーダンスとの不整
合に起因して出力波形の歪を生じるという問題点があ
り、その解決方法の一つの上記配線の特性インピーダン
スを低減する方法は、プリント基板材質の変更により価
格が上昇したり、配線幅の拡大により実装密度が低下す
るという欠点がある。
In the above-mentioned conventional semiconductor integrated circuit device, the output impedance has been reduced in response to the speeding up of the operation accompanying the progress of semiconductor technology. There is a problem that the output waveform is distorted due to the mismatch with the impedance, and a method of reducing the characteristic impedance of the wiring, which is one of the solutions, is that the price rises due to the change of the printed circuit board material, There is a drawback in that the packaging density decreases due to the expansion of the wiring width.

【0011】さらに、出力端子とプリント基板配線間に
インピーダンス整合用の抵抗を挿入する方法は、抵抗素
子の追加により実装密度が低下したり部品接続数の増加
により装置全体の信頼度が低下するという欠点がある。
Further, in the method of inserting a resistor for impedance matching between the output terminal and the printed circuit board wiring, the mounting density is lowered by the addition of the resistance element and the reliability of the entire device is lowered by the increase in the number of connected parts. There are drawbacks.

【0012】[0012]

【課題を解決するための手段】本発明の半導体集積回路
装置は、予め定めた特性インピーダンスの外部線路に出
力信号を供給する出力バッファ回路を有する半導体集積
回路装置において、前記出力バッファ回路が前記出力信
号の出力インピーダンスを前記特性インピーダンス近傍
の第1および第2の出力インピーダンスにそれぞれ整合
する第1および第2の整合手段と、前記第1および第2
の整合手段の接続の組合せを選択して前記外部線路に接
続する選択接続手段とを備える。
A semiconductor integrated circuit device of the present invention is a semiconductor integrated circuit device having an output buffer circuit for supplying an output signal to an external line having a predetermined characteristic impedance, wherein the output buffer circuit outputs the output signal. First and second matching means for respectively matching the output impedance of the signal with the first and second output impedances in the vicinity of the characteristic impedance; and the first and second matching means.
Selective connection means for selecting a combination of connection of the matching means and connecting to the external line.

【0013】[0013]

【実施例】次に本発明について図面を参照して説明す
る。
The present invention will be described below with reference to the drawings.

【0014】本発明の半導体集積回路装置(LSI)の
第1の実施例を示す回路図である図1を参照すると、こ
の図に示す本実施例のLSI1Aは、従来と同様の出力
バッファ6と、端子4とに加えて、出力バッファ6と端
子4との間に挿入されプリント基板の配線3の特性イン
ピーダンスZ0との整合をとるための整合回路8を備え
る。
Referring to FIG. 1 which is a circuit diagram showing a first embodiment of a semiconductor integrated circuit device (LSI) of the present invention, an LSI 1A of the present embodiment shown in this drawing has an output buffer 6 similar to the conventional one. In addition to the terminals 4, a matching circuit 8 inserted between the output buffer 6 and the terminals 4 for matching with the characteristic impedance Z0 of the wiring 3 of the printed circuit board is provided.

【0015】整合回路8は出力バッファ6の出力信号が
供給され外部制御信号C1,C2にそれぞれ応答してオ
ンオフ制御されそれぞれオン抵抗値が異なる2つのトラ
ンスファゲートTr1,Tr2と、外部制御信号C1,
C2の各々の供給を受ける端子T1,T2とを備える。
The matching circuit 8 is supplied with the output signal of the output buffer 6 and is controlled to be turned on / off in response to the external control signals C1 and C2, respectively.
And terminals T1 and T2 for receiving the respective supply of C2.

【0016】動作について説明すると、端子T1,T2
の各々にそれぞれ外部制御信号C1,C2として論理
“0”を供給した場合トランスファーゲートTr1,T
r2がそれぞれオン状態になる。トランスファーゲート
Tr1,Tr2のオンオン抵抗値をインピーダンス整合
用の整合抵抗として用いる。トランスファーゲートTr
1とTr2のオン抵抗値が異なるので、外部制御信号C
1,C2の制御の組合せにより3種類の整合抵抗を得る
ことができる。これにより端子4に接続されたプリント
基板の配線の特性インピーダンスZ0と端子4の出力イ
ンピーダンス値との整合が可能となり、波形の歪を解消
することができる。
The operation will be described. Terminals T1 and T2
When a logic "0" is supplied as external control signals C1 and C2 to each of the transfer gates Tr1 and T
r2 is turned on. The on-on resistance values of the transfer gates Tr1 and Tr2 are used as matching resistors for impedance matching. Transfer gate Tr
1 and Tr2 have different on-resistance values, the external control signal C
Three types of matching resistors can be obtained by combining the control of 1 and C2. As a result, the characteristic impedance Z0 of the wiring of the printed circuit board connected to the terminal 4 and the output impedance value of the terminal 4 can be matched, and the distortion of the waveform can be eliminated.

【0017】本実施例では2個のトランスファーゲート
を用いることとして説明しているが、3個以上のトラン
スファーゲートを用いて、各々のトランスファーゲート
を外部制御信号にて制御することによりより多種類の整
合用抵抗値を実現することも可能である。その場合、多
数の整合用抵抗値の中から最適値を選択することができ
る。また、上記外部制御信号を符号化し各々のトランス
ファーゲートと外部制御端子との間にデコーダ回路等を
挿入して上記符号をデコードする構成とすれば上記外部
制御端子数の低減がはかれる。
In this embodiment, two transfer gates are used, but three or more transfer gates are used and each transfer gate is controlled by an external control signal, so that more kinds of transfer gates can be used. It is also possible to realize a matching resistance value. In that case, the optimum value can be selected from many matching resistance values. If the external control signal is encoded and a decoder circuit or the like is inserted between each transfer gate and the external control terminal to decode the code, the number of external control terminals can be reduced.

【0018】本発明の半導体集積回路装置(LSI)の
第2の実施例を示す回路図である図2を参照すると、こ
の図に示す本実施例のLSI1Bの前述の第1の実施例
のLSI1Aに対する相違点は整合回路8の代りに、こ
のLSI1Bおよび実装対象のプリント基板を含む機能
回路の設計開始時点で予め設定されたプリント基板の配
線の特性インピーダンスZ0に対応した整合用の抵抗値
のオン抵抗を有するトランスファゲートを予め端子4に
接続した整合回路9を備えることである。
Referring to FIG. 2, which is a circuit diagram showing a second embodiment of the semiconductor integrated circuit device (LSI) of the present invention, the LSI 1A of the first embodiment of the LSI 1B of the present embodiment shown in the drawing is shown. Is different from the matching circuit 8 in that instead of the matching circuit 8, the matching resistance value corresponding to the characteristic impedance Z0 of the wiring of the printed circuit board which is preset at the start of the design of the functional circuit including the LSI 1B and the printed circuit board to be mounted is turned on. That is, a matching circuit 9 in which a transfer gate having a resistance is connected to the terminal 4 in advance is provided.

【0019】整合回路9は、第1の実施例と同様の各々
オン抵抗が異なるトランスファーゲートTr1,Tr2
と、上記設計時に選択されたトランスファゲートを出力
バッファ6と端子4の間に挿入するよう接続するため準
備された配線素子91とを備える。
The matching circuit 9 includes transfer gates Tr1 and Tr2 having different on-state resistances as in the first embodiment.
And a wiring element 91 prepared for connecting the transfer gate selected at the time of designing so as to be inserted between the output buffer 6 and the terminal 4.

【0020】本実施例は、LSI1Bがゲートアレーで
ある場合であり、予め整合回路9の内容をLSI1Bの
ゲートアレーの標準の機能回路ブロックの1つとして登
録しておく。機能回路設計者は、実装対象のプリント基
板を含む機能回路の設計開始前に、特性インピーダンス
Z0の値に対応した整合抵抗値を選択決定しておく。上
記設計者は上記整合抵抗値に最も近い値となるようトラ
ンスファーゲートTr1,Tr2の組合せを選定し、配
線素子91によるその組合せの配線の実施を製造仕様書
に指示する。
In this embodiment, the LSI 1B is a gate array, and the contents of the matching circuit 9 are registered in advance as one of the standard functional circuit blocks of the gate array of the LSI 1B. The functional circuit designer selects and determines the matching resistance value corresponding to the value of the characteristic impedance Z0 before starting the design of the functional circuit including the printed circuit board to be mounted. The designer selects a combination of the transfer gates Tr1 and Tr2 so as to have a value closest to the matching resistance value, and instructs the manufacturing specification sheet to carry out the wiring of the combination by the wiring element 91.

【0021】本実施例は、ゲートアレーなど予め標準の
機能回路ブロックを準備した特定用途向けLSI(AS
IC)に適用する場合のように、このLSIの設計開始
時点で実装対象のプリント基板とその配線の特性インピ
ーダンスZ0が決定されている場合に有効である。
This embodiment is an application-specific LSI (AS) in which standard functional circuit blocks such as a gate array are prepared in advance.
This is effective when the characteristic impedance Z0 of the printed circuit board to be mounted and its wiring is determined at the start of designing this LSI, as in the case of application to IC).

【0022】[0022]

【発明の効果】以上説明したように本発明の半導体集積
回路装置は、出力バッファ回路が出力インピーダンスを
外部線路の特性インピーダンス近傍に整合する第1およ
び第2の整合手段と、これら第1および第2の整合手段
の接続の組合せの選択接続手段とを備え、上記出力イン
ピーダンスとプリント基板配線の特性インピーダンスと
の最適な整合により、費用増大の要因となる上記配線の
特性インピーダンスの低減や、信頼性の劣化要因となる
インピーダンス整合用の抵抗器の挿入を不要として、出
力波形の歪が解消されるという効果がある。
As described above, in the semiconductor integrated circuit device of the present invention, the output buffer circuit matches the output impedance to the vicinity of the characteristic impedance of the external line, and the first and second matching means. 2) a selection connection means for selecting a combination of connection of the matching means, and by the optimum matching between the output impedance and the characteristic impedance of the printed circuit board wiring, the characteristic impedance of the wiring, which causes a cost increase, and the reliability are reduced. The effect of eliminating the distortion of the output waveform by eliminating the need for inserting a resistor for impedance matching, which is a factor of deterioration, is obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の半導体集積回路装置の第1の実施例を
示すブロック図である。
FIG. 1 is a block diagram showing a first embodiment of a semiconductor integrated circuit device of the present invention.

【図2】本発明の半導体集積回路装置の第2の実施例を
示すブロック図である。
FIG. 2 is a block diagram showing a second embodiment of the semiconductor integrated circuit device of the present invention.

【図3】従来の半導体集積回路装置とプリント基板の配
線との接続を示すブロック図である。
FIG. 3 is a block diagram showing a connection between a conventional semiconductor integrated circuit device and a wiring of a printed circuit board.

【図4】半導体集積回路装置の出力信号の波形の歪をあ
らわす波形図である。
FIG. 4 is a waveform diagram showing distortion of a waveform of an output signal of the semiconductor integrated circuit device.

【符号の説明】 1,1A,1B,2 半導体集積回路装置 3 配線 4,5,T1,T2 端子 6 出力バッファ 7 入力バッファ 8,9 整合回路 91 配線素子 Tr1,Tr2 トラスファーゲート[Description of Reference Signs] 1, 1A, 1B, 2 Semiconductor integrated circuit device 3 Wiring 4,5, T1, T2 terminal 6 Output buffer 7 Input buffer 8, 9 Matching circuit 91 Wiring element Tr1, Tr2 Transfer gate

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 予め定めた特性インピーダンスの外部線
路に出力信号を供給する出力バッファ回路を有する半導
体集積回路装置において、 前記出力バッファ回路が前記出力信号の出力インピーダ
ンスを前記特性インピーダンス近傍の第1および第2の
出力インピーダンスにそれぞれ整合する第1および第2
の整合手段と、 前記第1および第2の整合手段の接続の組合せを選択し
て前記外部線路に接続する選択接続手段とを備えること
を特徴とする半導体集積回路装置。
1. A semiconductor integrated circuit device having an output buffer circuit for supplying an output signal to an external line having a predetermined characteristic impedance, wherein the output buffer circuit outputs an output impedance of the output signal in the vicinity of the characteristic impedance. First and second matching respective second output impedances
2. The semiconductor integrated circuit device according to claim 1, further comprising: a matching unit and a selective connecting unit that selects a combination of connections of the first and second matching units to connect to the external line.
【請求項2】 前記第1および第2の整合手段がそれぞ
れ導通抵抗値の異なる第1および第2のトランスファゲ
ートを備えることを特徴とする請求項1記載の半導体集
積回路装置。
2. The semiconductor integrated circuit device according to claim 1, wherein the first and second matching means respectively include first and second transfer gates having different conduction resistance values.
【請求項3】 前記選択接続手段が制御信号により前記
第1および第2のトランスファゲートのいずれか一方ま
たは両方を導通させることにより前記接続の組合せを選
択することを特徴とする請求項1および2記載の半導体
集積回路装置。
3. The combination according to claim 1, wherein the selective connection means selects the combination of the connections by making either or both of the first and second transfer gates conductive by a control signal. The semiconductor integrated circuit device described.
【請求項4】 前記出力バッファ回路が予め準備された
前記第1および第2のトランスファゲートを含む機能回
路ブロックを備え、 予め定めた設計時点で前記第1および第2のトランスフ
ァゲートのいずれか一方または両方を導通させる接続の
組合せを選択して前記機能ブロックの接続を完成させる
ことを特徴とする請求項1および2記載の半導体集積回
路装置。
4. The output buffer circuit comprises a functional circuit block including the first and second transfer gates prepared in advance, and one of the first and second transfer gates is set at a predetermined design time. 3. The semiconductor integrated circuit device according to claim 1, wherein the connection of the functional blocks is completed by selecting a combination of connections that make both conductive.
JP5251271A 1993-10-07 1993-10-07 Semiconductor integrated circuit device Pending JPH07106943A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5251271A JPH07106943A (en) 1993-10-07 1993-10-07 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5251271A JPH07106943A (en) 1993-10-07 1993-10-07 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPH07106943A true JPH07106943A (en) 1995-04-21

Family

ID=17220315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5251271A Pending JPH07106943A (en) 1993-10-07 1993-10-07 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPH07106943A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011114488A (en) * 2009-11-25 2011-06-09 Panasonic Electric Works Co Ltd Semiconductor integrated circuit and adjustment method thereof
JP2016015717A (en) * 2014-06-30 2016-01-28 富士通株式会社 Circuit and method for impedance matching

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03272167A (en) * 1990-03-22 1991-12-03 Mitsubishi Electric Corp Semiconductor integrated circuit
JPH05276004A (en) * 1992-03-30 1993-10-22 Mitsubishi Electric Corp Output circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03272167A (en) * 1990-03-22 1991-12-03 Mitsubishi Electric Corp Semiconductor integrated circuit
JPH05276004A (en) * 1992-03-30 1993-10-22 Mitsubishi Electric Corp Output circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011114488A (en) * 2009-11-25 2011-06-09 Panasonic Electric Works Co Ltd Semiconductor integrated circuit and adjustment method thereof
JP2016015717A (en) * 2014-06-30 2016-01-28 富士通株式会社 Circuit and method for impedance matching

Similar Documents

Publication Publication Date Title
US5977797A (en) Method and apparatus for transferring data on a voltage biased data line
KR100437233B1 (en) Integrated circuit chip with adaptive input-output port
US6642740B2 (en) Programmable termination circuit and method
US6970369B2 (en) Memory device
US7129739B2 (en) Method and apparatus for selectably providing single-ended and differential signaling with controllable impedence and transition time
US6054881A (en) Input/output (I/O) buffer selectively providing resistive termination for a transmission line coupled thereto
US6362644B1 (en) Programmable termination for integrated circuits
US4713827A (en) Terminator for a cmos transceiver device
US5311081A (en) Data bus using open drain drivers and differential receivers together with distributed termination impedances
WO1998004041A1 (en) Programmable dynamic line-termination circuit
GB2317515A (en) Binary data link with reduced termination resistor dissipation
JPH06224731A (en) Control impedance transistor switching circuit
US6625206B1 (en) Simultaneous bidirectional data transmission system and method
JP3368861B2 (en) Method and system for increasing data transmission rate over a parallel bus
JPH11177189A (en) Termination structure of wiring on printed circuit board
US6084424A (en) Adjustable biasing voltage for a bus line and associated method
US6232814B1 (en) Method and apparatus for controlling impedance on an input-output node of an integrated circuit
US6515501B2 (en) Signal buffers for printed circuit boards
US6838900B2 (en) Middle pull-up point-to-point transceiving bus structure
EP1410589B1 (en) Transmitter with active differential termination
US6014037A (en) Method and component arrangement for enhancing signal integrity
JPH07106943A (en) Semiconductor integrated circuit device
US6072943A (en) Integrated bus controller and terminating chip
US20060119380A1 (en) Integrated circuit input/output signal termination with reduced power dissipation
US6765406B2 (en) Circuit board configured to provide multiple interfaces

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 19961210