JPH0712948A - Scattered ray detector, and detecting device for scattered ray and quality thereof - Google Patents
Scattered ray detector, and detecting device for scattered ray and quality thereofInfo
- Publication number
- JPH0712948A JPH0712948A JP5178546A JP17854693A JPH0712948A JP H0712948 A JPH0712948 A JP H0712948A JP 5178546 A JP5178546 A JP 5178546A JP 17854693 A JP17854693 A JP 17854693A JP H0712948 A JPH0712948 A JP H0712948A
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- Prior art keywords
- scattered
- detector
- scattered radiation
- quality
- radiation
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- 230000005855 radiation Effects 0.000 claims description 101
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 abstract description 4
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
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- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Nuclear Medicine (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、例えばX線CT装置な
どの放射線画像診断装置における散乱線や線質変化の影
響による放射線検出器の出力を補正するための散乱線検
出器及び散乱線・線質検出装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a scattered radiation detector and a scattered radiation detector for correcting the output of a radiation detector due to the influence of scattered radiation or radiation quality changes in a radiation image diagnostic apparatus such as an X-ray CT apparatus. The present invention relates to a radiation quality detecting device.
【0002】[0002]
【従来の技術】放射線を用いた画像診断装置、例えばX
線CT装置においては、散乱線及び線質変化の影響を排
除することが画質向上の重要な要素である。散乱線の影
響を排除する方法としては、従来からコリメータやグリ
ッドを用いる方法や、散乱線検出用の放射線検出器(散
乱線検出器)により散乱線量を測定し、補正する方法な
どがある。また、線質変化についても大きさの異なった
ファントムを用いたデータによるものなど、種々の補正
方法がある。2. Description of the Related Art An image diagnostic apparatus using radiation, for example X
In the X-ray CT apparatus, eliminating the influence of scattered rays and changes in radiation quality is an important factor for improving image quality. As a method of eliminating the influence of scattered radiation, there are conventionally used a method using a collimator and a grid, a method of measuring and correcting a scattered dose by a radiation detector for detecting scattered radiation (scattered radiation detector), and the like. Further, there are various correction methods for the change in the radiation quality, such as using the data obtained by using phantoms having different sizes.
【0003】散乱線検出器により散乱線の影響を排除す
る方法は、X線の主線を外れた領域に散乱線専用の検出
器、すなわち散乱線検出器を設置し、この検出器からの
信号を基に散乱線量を推定し、補正するものである。従
来、この方法で用いられている検出器は、例えば特願平
3−221826号に述べられているように、X線を阻
止し、最終的に信号電流に変換する1段の検出素子から
の出力信号により散乱線補正量を決定していた。A method of eliminating the influence of scattered radiation by the scattered radiation detector is to install a detector dedicated to scattered radiation, that is, a scattered radiation detector, in a region outside the main line of X-rays, and to output the signal from this detector. Based on this, the scattered dose is estimated and corrected. Conventionally, the detector used in this method is, for example, as described in Japanese Patent Application No. 3-221826, a detector from a single stage for blocking X-rays and finally converting it into a signal current. The scattered radiation correction amount was determined by the output signal.
【0004】図3において、X線焦点1からコリメータ
2を通して被検体3にX線(主線)4が照射され、X線
検出器(主検出器)6によりX線を電流に変換する。ま
た、散乱線5は散乱線検出器7により検出され、データ
処理装置8に送られる。データ処理装置8では散乱線検
出器7からの信号により散乱線補正量を決定し、X線検
出器6からの信号を補正する。In FIG. 3, an object 3 is irradiated with an X-ray (main line) 4 from an X-ray focal point 1 through a collimator 2, and an X-ray detector (main detector) 6 converts the X-ray into an electric current. The scattered radiation 5 is detected by the scattered radiation detector 7 and sent to the data processor 8. The data processing device 8 determines the scattered radiation correction amount based on the signal from the scattered radiation detector 7, and corrects the signal from the X-ray detector 6.
【0005】[0005]
【発明が解決しようとする課題】上記のような従来技術
では、散乱線5の線質に関する情報は得られず、特にX
線CT装置において、各角度データ毎に主線4の線質変
化を推定して散乱線量も含めた総合的な補正をすること
ができなという問題点があった。In the above-mentioned prior art, no information on the quality of the scattered radiation 5 can be obtained.
In the line CT apparatus, there is a problem in that it is not possible to estimate the quality change of the main line 4 for each angle data and perform comprehensive correction including the scattered dose.
【0006】本発明の目的は、散乱線量及びX線の線質
変化を同時に、かつ各検出データ(X線CT装置の場合
は角度データ)毎に検出し、それらの補正を可能とした
散乱線検出器及び散乱線・線質検出装置を提供すること
にある。An object of the present invention is to detect a scattered dose and a change in X-ray quality at the same time and for each detection data (angle data in the case of an X-ray CT apparatus), and to correct them. An object is to provide a detector and a scattered radiation / ray quality detecting device.
【0007】[0007]
【課題を解決するための手段】上記目的は、放射線を電
流に変換する2つの放射線検出器を2段重ねて散乱線検
出器を構成することにより達成される。The above object can be achieved by constructing a scattered radiation detector by stacking two radiation detectors for converting radiation into an electric current in two stages.
【0008】[0008]
【作用】散乱線検出器の散乱線入射側(上段)の放射線
検出器では比較的エネルギの低いX線を検出し、下段の
放射線検出器では上段の放射線検出器を透過した比較的
エネルギの高いX線を検出する。上段の放射線検出器か
らの出力と、下段の放射線検出器からの出力の比によ
り、入射するX線の線質を推定することができる。散乱
線の線質と主線の線質との間には、一定の関係があるた
め、前記上段の放射線検出器と下段の放射線検出器の出
力の比により主線の線質を推定することができ、線質変
化の補正量を算出することができる。散乱線の補正量
は、いずれかの放射線検出器、通常は上段の放射線検出
器の出力により、従来技術と同様にして算出できる。The radiation detector on the scattered radiation incident side (upper stage) of the scattered radiation detector detects X-rays having relatively low energy, and the lower radiation detector has relatively high energy transmitted through the upper radiation detector. Detect X-rays. The quality of the incident X-ray can be estimated from the ratio of the output from the upper radiation detector and the output from the lower radiation detector. Since there is a fixed relationship between the quality of scattered radiation and the quality of the main line, it is possible to estimate the quality of the main line from the ratio of the outputs of the upper radiation detector and the lower radiation detector. It is possible to calculate the correction amount of the change in the radiation quality. The amount of correction of scattered radiation can be calculated in the same manner as in the prior art by the output of any radiation detector, usually the upper radiation detector.
【0009】[0009]
【実施例】以下、図面を参照して本発明の実施例を説明
する。図1は、本発明による散乱線検出器及び散乱線・
線質検出装置が適用されたX線CT装置の一例を示すブ
ロック図である。この図1において、1〜6は図3と同
様である。7及び8も図3と同様に散乱線検出器及びデ
ータ処理装置を示すが、本発明では以下のように構成さ
れている。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows a scattered radiation detector and scattered radiation according to the present invention.
It is a block diagram which shows an example of the X-ray CT apparatus to which the radiation quality detection apparatus was applied. In FIG. 1, 1 to 6 are the same as in FIG. 7 and 8 also show a scattered radiation detector and a data processing device as in FIG. 3, but the present invention is configured as follows.
【0010】すなわち、散乱線検出器7は上下2段構造
とされ、上,下部散乱線検出器7a,7bから信号を取
り出すように構成されている。また、データ処理装置8
は、散乱線検出器7の例えば上部散乱線検出器7aから
の信号により散乱線補正量を決定し、X線検出器6から
の信号を補正するのみならず、上,下部散乱線検出器7
a,7bからの信号(大きさ)の比により、入射するX
線(散乱線5)の線質を推定する。散乱線5の線質と主
線4の線質との間には、一定の関係があるため、前記
上,下部散乱線検出器7a,7bの出力信号の比により
主線4の線質を推定することができるもので、データ処
理装置8は、これにより主線4の線質を推定し、従来か
らの散乱線量の補正に加えて線質変化についての補正も
同時に行う。That is, the scattered radiation detector 7 has an upper and lower two-stage structure, and is configured to extract signals from the upper and lower scattered radiation detectors 7a and 7b. In addition, the data processing device 8
Not only determines the scattered radiation correction amount based on the signal from the scattered radiation detector 7 such as the upper scattered radiation detector 7a and corrects the signal from the X-ray detector 6, but also determines the upper and lower scattered radiation detectors 7
The incident X depends on the ratio of the signals (magnitude) from a and 7b.
The quality of the ray (scattered ray 5) is estimated. Since there is a fixed relationship between the quality of the scattered ray 5 and the quality of the main line 4, the quality of the main line 4 is estimated by the ratio of the output signals of the upper and lower scattered ray detectors 7a and 7b. Therefore, the data processing device 8 estimates the quality of the main line 4 by this, and in addition to the conventional correction of the scattered dose, also corrects the change in the quality of the beam.
【0011】データ処理装置8による補正処理を以下に
述べる。すなわち、被検体3において発生した散乱線5
は2段重ねの散乱線検出器7(上,下部散乱線検出器7
a,7b)に入射する。上,下部散乱線検出器7a,7
bからの信号はデータ処理装置8の送られ、補正すべき
量が決定される。この補正すべき量は例えば次のように
表される。The correction processing by the data processing device 8 will be described below. That is, the scattered radiation 5 generated in the subject 3
Is a two-tiered scattered radiation detector 7 (upper and lower scattered radiation detector 7
a, 7b). Upper and lower scattered radiation detectors 7a, 7
The signal from b is sent to the data processor 8 and the amount to be corrected is determined. The amount to be corrected is represented as follows, for example.
【0012】 α=f1(I1) ……(1) β=f2(I1,I2) ……(2) γ=f3(α,β) ……(3) XH=X+γ ……(4)Α = f1 (I1) (1) β = f2 (I1, I2) (2) γ = f3 (α, β) (3) XH = X + γ (4)
【0013】ここで、α:散乱線補正量 I1:上部散乱線検出器7aの出力 f1:(I1)の関数 β:線質補正量 I2:下部散乱線検出器7bの出力 f2:(I1,I2)の関数 γ:総合補正量 f3:(α,β)の関数 XH:補正後のデータ X:X線検出器6の出力 である。(2)式の線質補正分については、現実的には
予めI1とI2の比と線質の関係を例えばRIなどを用い
てファントムに照射することにより求めておけばよい。Here, α: scattered radiation correction amount I1: output of upper scattered radiation detector 7a f1: function of (I1) β: amount of radiation quality correction I2: output of lower scattered radiation detector 7b f2: (I1, I2) function γ: total correction amount f3: function of (α, β) XH: corrected data X: output of X-ray detector 6. Regarding the ray quality correction amount in the equation (2), in practice, the relationship between the ratio of I1 and I2 and the ray quality may be obtained in advance by irradiating the phantom with RI or the like.
【0014】図1のX線CT装置において、散乱線検出
器7をX線検出器6近傍の適宜位置に配置しておけば、
散乱線補正と線質補正に必要なデータを同時に取得する
ことができる。In the X-ray CT apparatus of FIG. 1, if the scattered radiation detector 7 is arranged at an appropriate position near the X-ray detector 6,
It is possible to acquire the data necessary for the scattered radiation correction and the radiation quality correction at the same time.
【0015】図2は、図1中の散乱線検出器7の具体例
を示した断面図である。2段重ねの散乱線検出器7を構
成する上,下部散乱線検出器7a,7bは、各々、主と
して蛍光体(シンチレータ)と光電変換素子(フォトダ
イオード)とで構成されている。FIG. 2 is a sectional view showing a concrete example of the scattered radiation detector 7 in FIG. The upper and lower scattered radiation detectors 7a and 7b that constitute the two-layered scattered radiation detector 7 are each mainly composed of a phosphor (scintillator) and a photoelectric conversion element (photodiode).
【0016】このような2段重ねの散乱線検出器7
(上,下部散乱線検出器7a,7b)において、散乱線
5は、上部散乱線検出器7aのシンチレータ11に入射
し、蛍光に変換され、フォトダイオード12により電流
(I1)に変換する。この電流は、配線基板13を経由
して前記データ処理装置8(図1参照)に導かれる。こ
の上部散乱線検出器7aでは、比較的エネルギの低いX
線が検出される。Such a two-layered scattered radiation detector 7
In the (upper and lower scattered radiation detectors 7a and 7b), the scattered radiation 5 enters the scintillator 11 of the upper scattered radiation detector 7a, is converted into fluorescence, and is converted into a current (I1) by the photodiode 12. This current is led to the data processing device 8 (see FIG. 1) via the wiring board 13. In this upper scattered radiation detector 7a, X having a relatively low energy is used.
The line is detected.
【0017】上部散乱線検出器7aを透過した散乱線5
´は、下部散乱線検出器7bのシンチレータ16に入射
し、フォトダイオード17により電流(I2)に変換さ
れ、配線基板18を経て前記データ処理装置8に導かれ
る。この下部散乱線検出器7bでは、上部散乱線検出器
7aを透過した比較的エネルギの高いX線が検出され
る。Scattered rays 5 transmitted through the upper scattered ray detector 7a
′ Is incident on the scintillator 16 of the lower scattered radiation detector 7b, converted into a current (I2) by the photodiode 17, and guided to the data processing device 8 via the wiring board 18. The lower scattered radiation detector 7b detects X-rays having a relatively high energy that have passed through the upper scattered radiation detector 7a.
【0018】14及び19は、各々上,下部散乱線検出
器7a,7bを収納する容器である。また、21は上,
下部散乱線検出器7a,7bからの出力I1,I2の比を
適正にするための調整用金属板である。Reference numerals 14 and 19 are containers for housing the upper and lower scattered radiation detectors 7a and 7b, respectively. Also, 21 is above,
This is an adjusting metal plate for making the ratio of the outputs I1 and I2 from the lower scattered radiation detectors 7a and 7b proper.
【0019】上記散乱線検出器7は、主検出器6近傍に
1個あるいは複数個配列するが、複数個配列する場合
は、それぞれの散乱線検出器7に対し補正すべき主検出
器6の素子を区分して割り当てる。One or a plurality of the scattered ray detectors 7 are arranged in the vicinity of the main detector 6, and when a plurality of scattered ray detectors 7 are arranged, the main detector 6 to be corrected for each scattered ray detector 7. The elements are divided and assigned.
【0020】[0020]
【発明の効果】以上説明したように本発明によれば、散
乱線検出器により散乱線と線質変化に関する補正に必要
なデータを同時に取得することができる。これにより、
従来のファントムによる補正のように、散乱線の影響と
線質変化の影響を分離できずにまとめて補正する方法に
比べて、散乱線と線質変化の影響を個別に、しかも各検
出時毎に(各角度データ毎に)把握することができ、よ
り精度の高い補正が可能になるという効果がある。As described above, according to the present invention, the scattered radiation detector can simultaneously obtain the data necessary for the correction regarding the scattered radiation and the change in the radiation quality. This allows
Compared to the conventional method that corrects the influence of scattered radiation and the influence of change in radiation quality without being separated, like the correction using the phantom, the influence of scattered radiation and change in radiation quality can be corrected individually and at each detection time. Can be grasped (for each angle data), and there is an effect that a more accurate correction can be performed.
【図1】本発明による散乱線検出器及び散乱線・線質検
出装置が適用されたX線CT装置の一例を示すブロック
図である。FIG. 1 is a block diagram showing an example of an X-ray CT apparatus to which a scattered radiation detector and a scattered radiation / ray quality detecting device according to the present invention are applied.
【図2】図1中の散乱線検出器の具体例を示した断面図
である。FIG. 2 is a sectional view showing a specific example of a scattered radiation detector in FIG.
【図3】従来の散乱線検出器及び散乱線・線質検出装置
が適用されたX線CT装置の一例を示すブロック図であ
る。FIG. 3 is a block diagram showing an example of an X-ray CT apparatus to which a conventional scattered radiation detector and a conventional scattered radiation / ray quality detecting device are applied.
1 X線焦点 2 コリメータ 3 被検体 4 X線(主線) 5 散乱線 6 X線検出器(主検出器) 7 散乱線検出器 7a 上部散乱線検出器 7b 下部散乱線検出器 8 データ処理装置 11 シンチレータ(蛍光体) 12 フォトダイオード(光電変換素子) 13 配線基板 14 容器 16 シンチレータ(蛍光体) 17 フォトダイオード(光電変換素子) 18 配線基板 19 容器 21 調整用金属板 1 X-ray focus 2 Collimator 3 Subject 4 X-ray (main line) 5 Scattered line 6 X-ray detector (main detector) 7 Scattered line detector 7a Upper scattered line detector 7b Lower scattered line detector 8 Data processing device 11 Scintillator (phosphor) 12 Photodiode (photoelectric conversion element) 13 Wiring board 14 Container 16 Scintillator (phosphor) 17 Photodiode (photoelectric conversion element) 18 Wiring board 19 Container 21 Adjustment metal plate
Claims (3)
器を2段重ねて構成したことを特徴とする散乱線検出
器。1. A scattered radiation detector comprising two radiation detectors for converting radiation into an electric current, which are stacked in two stages.
換素子とを備えてなることを特徴とする請求項1に記載
の散乱線検出器。2. The scattered radiation detector according to claim 1, wherein the two radiation detectors each include a phosphor and a photoelectric conversion element.
器を2段重ねてなる散乱線検出器と、この散乱線検出器
のうちのいずれか一方の放射線検出器の出力(I1)に
基づき散乱線の補正量を算出すると共に上記出力(I
1)と他方の放射線検出器の出力(I2)とに基づき線質
の補正量を算出する処理装置とを具備することを特徴と
する散乱線・線質検出装置。3. A scattered radiation detector formed by stacking two radiation detectors for converting radiation into an electric current in two stages, and based on the output (I1) of one of the scattered radiation detectors. The correction amount of the scattered radiation is calculated and the output (I
A scattered radiation / ray quality detecting apparatus comprising: a processing device for calculating a radiation quality correction amount based on 1) and the output (I2) of the other radiation detector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5178546A JPH0712948A (en) | 1993-06-28 | 1993-06-28 | Scattered ray detector, and detecting device for scattered ray and quality thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5178546A JPH0712948A (en) | 1993-06-28 | 1993-06-28 | Scattered ray detector, and detecting device for scattered ray and quality thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0712948A true JPH0712948A (en) | 1995-01-17 |
Family
ID=16050378
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5178546A Pending JPH0712948A (en) | 1993-06-28 | 1993-06-28 | Scattered ray detector, and detecting device for scattered ray and quality thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0712948A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009201885A (en) * | 2008-02-29 | 2009-09-10 | Ge Medical Systems Global Technology Co Llc | X-ray ct system |
| JP2011067555A (en) * | 2009-09-28 | 2011-04-07 | Hitachi Medical Corp | X-ray ct apparatus |
-
1993
- 1993-06-28 JP JP5178546A patent/JPH0712948A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009201885A (en) * | 2008-02-29 | 2009-09-10 | Ge Medical Systems Global Technology Co Llc | X-ray ct system |
| JP2011067555A (en) * | 2009-09-28 | 2011-04-07 | Hitachi Medical Corp | X-ray ct apparatus |
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