JPH0714910A - Workpiece transfer plate - Google Patents
Workpiece transfer plateInfo
- Publication number
- JPH0714910A JPH0714910A JP15557193A JP15557193A JPH0714910A JP H0714910 A JPH0714910 A JP H0714910A JP 15557193 A JP15557193 A JP 15557193A JP 15557193 A JP15557193 A JP 15557193A JP H0714910 A JPH0714910 A JP H0714910A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- wafer
- workpiece
- plate body
- transfer device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 abstract description 11
- 239000002245 particle Substances 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 4
- 238000011949 advanced processing technology Methods 0.000 abstract description 2
- 238000009792 diffusion process Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000003028 elevating effect Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
(57)【要約】
【目的】 被処理物保持部の制作工程における加工時間
を短縮し、高度な加工技術を必要とせず、制作コストの
低減を図り、表面に付着したパーティクル除去を容易に
行う。
【構成】 プレート本体1の遊端側に、ウェーハのオリ
エンテーションフラットの形状に合わせて内側の段差3
がプレート中心線5に対し直角になるよう被処理物保持
部3a,3bを設置し、プレート本体1のサポート側に
はウェーハの外周の円形形状に合わせて内側の段差3が
プレート中心線5に対し中心を通る向きθの線6に直角
になるよう被処理物保持部3c,3dを設置する。
(57) [Abstract] [Purpose] Shortens the processing time in the process of producing the workpiece holder, does not require advanced processing technology, reduces production costs, and easily removes particles adhering to the surface. . [Structure] An inner step 3 is formed on the free end side of the plate body 1 in accordance with the shape of the orientation flat of the wafer.
The workpiece holders 3a and 3b are installed so that the plate is perpendicular to the plate center line 5, and on the support side of the plate body 1, an inner step 3 is formed on the plate center line 5 according to the circular shape of the outer periphery of the wafer. On the other hand, the workpiece holders 3c and 3d are installed so as to be perpendicular to the line 6 of the direction θ passing through the center.
Description
【0001】[0001]
【産業上の利用分野】本発明は、主に、半導体製造装置
におけるシリコン等のウェーハである被処理物を移載,
搬送するために用いる被処理物搬送装置の被処理物搬送
プレートに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is mainly used for transferring an object to be processed which is a wafer such as silicon in a semiconductor manufacturing apparatus.
The present invention relates to an object transfer plate of an object transfer device used for transfer.
【0002】[0002]
【従来の技術】まず、被処理物搬送プレートを使用して
いる半導体製造装置の1つである縦型拡散CVD装置を
例に説明する。図3は縦型拡散CVD装置の1例の構成
を示す斜視図である。本体11には加熱炉12と、被処
理物保持手段,例えばカセット棚13と、装置の動作等
を制御する制御装置14と、被処理物,例えばウェーハ
10を搭載するボート15と、ボート15を加熱炉12
内に搬入するボート昇降装置18と、ウェーハを収納す
る被処理物収納手段例えばカセット16と、ウェーハ1
0をカセット棚13上のカセット16内からボート15
に移載搬送するための被処理物搬送装置17と、被処理
物搬送装置17を上下方向に移動させる移載機昇降機構
19とを有している。2. Description of the Related Art First, a vertical diffusion CVD apparatus, which is one of the semiconductor manufacturing apparatuses using an object transfer plate, will be described as an example. FIG. 3 is a perspective view showing the configuration of an example of a vertical diffusion CVD apparatus. The main body 11 includes a heating furnace 12, an object holding means, for example, a cassette shelf 13, a control device 14 for controlling the operation of the apparatus, a boat 15 for mounting an object to be treated, for example, the wafer 10, and a boat 15. Heating furnace 12
A boat elevating / lowering device 18 to be loaded into the inside, an object storage means such as a cassette 16 for storing a wafer, and a wafer 1
0 from the cassette 16 on the cassette shelf 13 to the boat 15
It has an object transfer device 17 for transferring and transferring to and from, and a transfer device lifting mechanism 19 for moving the object transfer device 17 in the vertical direction.
【0003】被処理物搬送プレートは、被処理物搬送装
置17に取付けられている。被処理物搬送装置17は、
図4に示すように本体を回転させる回転部23と横方向
(図中X軸方向)に移動するプレート取付け部22と、
プレート取付け部22に取付けられた被処理物搬送プレ
ート21を有した構成となっている。次に従来プレート
の具体的構造を図2で説明する。プレート本体30は、
主として石英、もしくはSiC等の材質で作られてい
る。従って、その精密な加工は時間と高度の技術を要す
るものである。プレート本体は、被処理物と直接接触す
る接触部34と、被処理物とは直接には接触せず、前記
接触部34より図2に示す例においては0.1mm薄くな
っている非接触部35と、被処理物の外周を保持し、プ
レート本体30上から被処理物が落ちたり、もしくは、
ずれたりしないようにするための突起部32と、被処理
物もプレート本体30からの離れを容易にするための通
気孔31を有した構造である。The object transfer plate is attached to the object transfer device 17. The object transfer device 17 is
As shown in FIG. 4, a rotating portion 23 for rotating the main body, a plate mounting portion 22 for moving in the lateral direction (X-axis direction in the drawing),
It is configured to have a workpiece transfer plate 21 attached to the plate attachment portion 22. Next, the specific structure of the conventional plate will be described with reference to FIG. The plate body 30 is
It is mainly made of quartz or a material such as SiC. Therefore, the precise processing requires time and high skill. The plate body has a contact portion 34 that comes into direct contact with the object to be processed, and a non-contact portion that does not come into direct contact with the object to be processed and is thinner than the contact portion 34 by 0.1 mm in the example shown in FIG. 35 and the outer periphery of the object to be processed, and the object to be processed falls from the plate body 30, or
It has a structure having a protrusion 32 for preventing the plate from being displaced and a vent hole 31 for facilitating separation of the object to be processed from the plate body 30.
【0004】上記従来の構成において、ウェーハの搬送
動作を、カセット16に収納されたウェーハ10をボー
ト15に移載搬送する場合を例に説明する。被処理物搬
送装置17は、移載機昇降機構19により上下方向に移
動する。被処理物移載装置17のプレート取付け部22
はその回転部23によってカセット16内のウェーハ方
向に向けられる。被処理物搬送プレート21を構成する
プレート本体30がウェーハに正対した位置で、プレー
ト取付け部22にサポート36を取付けられた被処理物
搬送プレート21はカセット方向に移動し、プレート本
体30はウェーハ10の間に接触せずに挿入される。被
処理物搬送装置17は、プレート本体30がウェーハ1
0に接触するだけ上昇する。このとき実際にウェーハ1
0と接触するのはプレート本体30の接触部34のみで
あり、ウェーハ10の外周はプレート本体30の突起3
2内におさまっている。プレート本体30上にウェーハ
10を載せた被処理物搬送装置17のプレート取付け部
22はカセット16からウェーハ10を取り出す、すな
わち元の位置に移動する。ウェーハ10を載せた被処理
物搬送装置17は回転部23で180度回転し、プレー
ト本体30はボート15の方向を向く。移載機昇降機構
19で被処理物搬送装置17のプレート本体30上のウ
ェーハ10がボート15のウェーハ10を搭載する溝、
もしくは突起に適合した位置に被処理物搬送装置17を
上下動する。被処理物搬送装置17のプレート取付け部
22及びこれに取付けられた被処理物搬送プレート21
がボート側に移動し、ウェーハ10をボート15内に搭
載する。被処理物搬送装置17は移載機昇降機構19に
より、プレート本体30からウェーハ10が離れるだけ
下降し、プレート取付け部22が元の位置にもどり、ウ
ェーハ10のカセット16からボートへの移載搬送は完
了する。In the above-mentioned conventional structure, the wafer transfer operation will be described by taking the case where the wafer 10 stored in the cassette 16 is transferred and transferred to the boat 15. The object transfer device 17 moves up and down by the transfer device lifting mechanism 19. Plate attachment portion 22 of the workpiece transfer device 17
Is directed toward the wafer in the cassette 16 by its rotating part 23. At the position where the plate main body 30 constituting the workpiece transfer plate 21 faces the wafer, the workpiece transfer plate 21 having the support 36 attached to the plate mounting portion 22 moves in the cassette direction, and the plate body 30 moves to the wafer. It is inserted between 10 without contact. In the object transfer device 17, the plate body 30 has the wafer 1
It rises as it touches 0. At this time, the wafer 1 is actually
Only the contact portion 34 of the plate body 30 is in contact with 0, and the outer periphery of the wafer 10 is the protrusion 3 of the plate body 30.
It stays within 2. The plate mounting portion 22 of the workpiece transfer device 17 in which the wafer 10 is placed on the plate body 30 takes out the wafer 10 from the cassette 16, that is, moves to the original position. The object transfer device 17 on which the wafer 10 is placed is rotated 180 degrees by the rotating part 23, and the plate body 30 faces the boat 15. A groove in which the wafer 10 on the plate body 30 of the workpiece transport device 17 is mounted with the wafer 10 of the boat 15 by the transfer machine lifting mechanism 19.
Alternatively, the object transfer device 17 is moved up and down to a position suitable for the protrusion. The plate mounting portion 22 of the processing object transfer device 17 and the processing object transfer plate 21 attached to the plate mounting part 22.
Moves to the boat side and mounts the wafer 10 in the boat 15. The object transfer device 17 is moved down by the transfer device elevating mechanism 19 as far as the wafer 10 is separated from the plate body 30, the plate mounting portion 22 is returned to the original position, and the wafer 10 is transferred from the cassette 16 to the boat. Is complete.
【0005】[0005]
【発明が解決しようとする課題】上記従来の被処理物搬
送プレートにあっては、プレート本体30の接触部3
4、非接触部35及び突起部32の形状が複雑で、その
製作工程における加工時間がかかり、かつ加工公差通り
の加工を行うには高度な技術が必要であるばかりでな
く、複雑な表面形状であるため、表面にパーティクル
(微細ゴミ)が付着するとその除去が難しいという課題
がある。In the above-mentioned conventional object transfer plate, the contact portion 3 of the plate body 30 is used.
4. The shapes of the non-contact portion 35 and the protruding portion 32 are complicated, it takes a long processing time in the manufacturing process, and not only advanced technology is required to perform processing according to the processing tolerance, but also complicated surface shape Therefore, if particles (fine dust) adhere to the surface, it is difficult to remove them.
【0006】[0006]
【課題を解決するための手段】本発明プレートは上記の
課題を解決するため、プレート本体1の所要位置に、所
要の向きに被処理物を保持するための段差3を有する被
処理物保持部3a,3b・・・を設けたことを特徴とす
る。換言すれば、本発明プレートは、プレート本体1
と、直接プレート取付け部(図4の22)に取付ける際
に厚みの調整をするサポート2と、プレート本体1に直
接接触させず、かつ被処理物を保持し、搬送中に落ちた
り、もしくは、ずれたりしないための段差3を有する被
処理物保持部3a,3b・・・と、被処理物とプレート
本体1が容易に離れるように設けた通気孔4を有した被
処理物搬送装置のプレートである。In order to solve the above problems, the plate of the present invention has a stepped portion 3 for holding an object to be treated in a desired direction at a required position of the plate body 1 to be treated. .. is provided. In other words, the plate of the present invention is the plate body 1
And the support 2 for adjusting the thickness when directly attached to the plate attachment portion (22 in FIG. 4) and the plate body 1 are not brought into direct contact with each other and hold the object to be processed and fall during transportation, or A plate for a workpiece transfer device having workpiece holders 3a, 3b ... Having a step 3 for preventing deviation and a vent hole 4 provided so that the workpiece and the plate body 1 are easily separated from each other. Is.
【0007】[0007]
【作用】このような構成とすることにより被処理物保持
部3a,3b・・・の形状を単純な形状にでき、その制
作工程における加工時間を短縮することができると共
に、高度な加工技術を必要とせず、制作コストの低減を
図ることができ、又単純な表面形状であるため、表面に
パーティクルが付着してもその除去を容易に行うことが
できることになる。With such a structure, the workpiece holders 3a, 3b, ... Can be made into a simple shape, the processing time in the production process can be shortened, and at the same time, an advanced processing technique can be applied. It is not necessary, the production cost can be reduced, and since the surface shape is simple, even if particles adhere to the surface, they can be easily removed.
【0008】[0008]
【実施例】図1(A),(B)はそれぞれ本発明プレー
トの1実施例の構成を示す平面図及びそのA−A線矢視
拡大図である。本実施例は、被処理物保持部を3a〜3
dの4個とし、プレート本体1の遊端側、サポート側と
もにそれぞれ3a,3bと3c,3dの2個ずつとす
る。遊端側の2個の被処理物保持部3a,3bは該保持
部3a,3bに保持されるウェーハのオリエンテーショ
ンフラットの形状に合わせ、内側の段差3がプレート中
心線5に対し直角になるよう設置されている。又、サポ
ート側の2個の被処理物保持部3c,3dは該保持部3
c,3dに保持されるウェーハの外周の円形形状に合わ
せ、内側の段差3がプレート中心線5に対し中心を通る
向きθの線6に直角になるように設置されている。1 (A) and 1 (B) are a plan view and a magnified view taken along the line AA of the plate of one embodiment of the plate of the present invention, respectively. In the present embodiment, the workpiece holders 3a to 3 are provided.
There are four pieces of d, and two pieces of the free end side and the support side of the plate body 1 are two pieces 3a, 3b and 3c, 3d, respectively. The two workpiece holding portions 3a, 3b on the free end side are matched with the orientation flat shape of the wafer held by the holding portions 3a, 3b so that the inner step 3 is perpendicular to the plate center line 5. is set up. In addition, the two holding parts 3c and 3d on the support side are the holding parts 3c.
According to the circular shape of the outer circumference of the wafer held by c and 3d, the inner step 3 is installed so as to be perpendicular to the line 6 of the direction θ passing through the center with respect to the plate center line 5.
【0009】被処理物保持部3a〜3dの設置方法は、
接着,溶着等特に限定されないし、サポート2はプレー
ト取付け方法等により取付けてもよい。本実施例による
被処理物搬送プレートを上記のような構成とすることに
より、4個の被処理物保持部3a〜3dの形状を単純な
形状にでき、その制作工程における加工時間を短縮する
ことができると共に、高度な加工技術を必要とせず、制
作コストの低減を図ることができ、又単純な表面形状で
あるため、表面にパーティクルが付着してもその除去を
容易に行うことができることになる。又、被処理物保持
部3a〜3dの形状が単純形状であるため、プレート本
体1を予め厚くしておき、本形状に加工してもかまわな
い。The method for installing the workpiece holders 3a to 3d is as follows.
Adhesion, welding, etc. are not particularly limited, and the support 2 may be attached by a plate attachment method or the like. By configuring the workpiece transport plate according to the present embodiment as described above, the shapes of the four workpiece holders 3a to 3d can be simplified and the processing time in the production process can be shortened. In addition, it does not require advanced processing technology, can reduce production costs, and has a simple surface shape, so even if particles adhere to the surface, it can be easily removed. Become. Further, since the workpiece holders 3a to 3d have a simple shape, the plate body 1 may be thickened in advance and processed into the regular shape.
【0010】[0010]
【発明の効果】上述のように本によれば、プレート本体
1の所要位置に、所要の向きに被処理物を保持するため
の段差3を有する被処理物保持部3a,3b・・・を設
けたことにより、被処理物保持部3a,3b・・・の形
状を単純な形状にでき、その制作工程における加工時間
を短縮することができると共に、高度な加工技術を必要
とせず、制作コストの低減を図ることができ、又単純な
表面形状であるため、表面にパーティクルが付着しても
その除去を容易に行うことができる。また、被処理物処
理の歩留りが向上し、高性能な半導体製造装置を提供す
ることができる。As described above, according to the present invention, the workpiece holders 3a, 3b ... Having the step 3 for holding the workpiece in the desired orientation are provided at the required positions of the plate body 1. By providing the workpiece holders 3a, 3b ..., the shape of the holders 3a, 3b ... Can be simplified, the processing time in the manufacturing process can be shortened, and high processing technology is not required, so that the manufacturing cost can be reduced. Can be reduced, and since the surface shape is simple, even if particles adhere to the surface, they can be easily removed. Further, it is possible to provide a high-performance semiconductor manufacturing apparatus in which the yield of processing the object to be processed is improved.
【図1】(A),(B)はそれぞれ本発明プレートの1
実施例の構成を示す平面図及びそのA−A線矢視拡大図
である。FIG. 1 (A) and FIG. 1 (B) are each one of the plate of the present invention.
It is the top view which shows the structure of an Example, and its AA line arrow enlarged view.
【図2】(A),(B)はそれぞれ従来プレートの1例
の構成を示す平面図及びそのA−A線矢視拡大図であ
る。2A and 2B are respectively a plan view and a magnified view taken along the line AA of the conventional plate showing the configuration of one example.
【図3】縦型拡散CVD装置の1例の構成を示す斜視図
である。FIG. 3 is a perspective view showing the configuration of an example of a vertical diffusion CVD apparatus.
【図4】従来プレート及び本発明プレートが適用される
被処理物搬送装置の1例の構成を示す斜視図である。FIG. 4 is a perspective view showing a configuration of an example of a workpiece transfer device to which a conventional plate and a plate of the present invention are applied.
1 プレート本体 2 サポート 3 段差 3a〜3d 被処理物保持部 4 通気孔 5 プレート中心線 6 中心を通る向きθの線 1 Plate Main Body 2 Support 3 Steps 3a to 3d Workpiece Holding Portion 4 Vent Hole 5 Plate Center Line 6 Line with Direction θ Passing through Center
Claims (1)
の向きに被処理物を保持するための段差(3)を有する
被処理物保持部(3a,3b・・・)を設けたことを特
徴とする被処理物搬送プレート。1. An object holding part (3a, 3b ...) Having a step (3) for holding an object in a desired direction is provided at a required position of a plate body (1). An object-carrying plate for processing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15557193A JPH0714910A (en) | 1993-06-25 | 1993-06-25 | Workpiece transfer plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15557193A JPH0714910A (en) | 1993-06-25 | 1993-06-25 | Workpiece transfer plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0714910A true JPH0714910A (en) | 1995-01-17 |
Family
ID=15608956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15557193A Pending JPH0714910A (en) | 1993-06-25 | 1993-06-25 | Workpiece transfer plate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714910A (en) |
-
1993
- 1993-06-25 JP JP15557193A patent/JPH0714910A/en active Pending
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