JPH0714924Y2 - In-circuit tester with discharge power supply circuit and in-circuit tester with power supply circuit for both measurement and discharge - Google Patents
In-circuit tester with discharge power supply circuit and in-circuit tester with power supply circuit for both measurement and dischargeInfo
- Publication number
- JPH0714924Y2 JPH0714924Y2 JP1886588U JP1886588U JPH0714924Y2 JP H0714924 Y2 JPH0714924 Y2 JP H0714924Y2 JP 1886588 U JP1886588 U JP 1886588U JP 1886588 U JP1886588 U JP 1886588U JP H0714924 Y2 JPH0714924 Y2 JP H0714924Y2
- Authority
- JP
- Japan
- Prior art keywords
- discharge
- circuit
- voltage
- power supply
- capacitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
【考案の詳細な説明】 産業上の利用分野 本考案は被測定物とコンデンサとの並列回路を対象とす
る放電電源回路や測定、放電兼用電源回路を備えたイン
サーキットテスタに関する。DETAILED DESCRIPTION OF THE INVENTION Industrial Field of the Invention The present invention relates to an in-circuit tester equipped with a discharge power supply circuit for a parallel circuit of an object to be measured and a capacitor and a power supply circuit for both measurement and discharge.
従来の技術 従来、種々の電子機器等はその電気回路を構成するた
め、抵抗やインダクタンスとコンデンサとの並列回路を
使用している。又、抵抗やインダクタンスに対し、コン
デンサが等価的に並列状態になっているものもある。こ
のような電気回路は、通常小形化と取り扱い等に好適な
実装基板の形にして機器の組み立てを行なっている。し
かし、プリント基板に電気部品を半田付けし、単に実装
基板を構成しただけのものをそのまま用いると、当然製
品化後の修理コストが増大する。そこで、実装基板は装
着前にインサーキットテスタを用い、基板に実装された
部品の電気的特性を測定して検査を行ない、実装基板の
良否の判定を行なっている。2. Description of the Related Art Conventionally, various electronic devices and the like use parallel circuits of resistors and inductances and capacitors in order to configure their electric circuits. In addition, there is a capacitor in which a capacitor is equivalently in parallel with a resistor or an inductance. Such an electric circuit is usually assembled in the form of a mounting board suitable for miniaturization and handling. However, if an electric component is soldered to a printed circuit board and a printed circuit board is simply used as it is, the repair cost after the product is naturally increased. Therefore, before mounting, the mounting board uses an in-circuit tester to measure and inspect the electrical characteristics of the components mounted on the board to determine the quality of the mounting board.
このようなインサーキットテスタには測定時における実
装基板のテスタに対する固定方式の違いからプレス式と
バキューム式がある。前者では実装基板を検査治具たる
フィクスチャー(ピンポード)上に乗せ、多数の押え棒
を突設したプレス板を上方から下降させて挟持し、固定
するのに対し、後者ではプレス板はなく、実装基板をフ
ィクスチャー上に吸引し、固定する。固定後には第3図
に示す放電機能付き測定電源回路を用い、プレス式イン
サーキットテスタではピンボード10上に乗せたプリント
基板(図示なし)に実装され、並列接続したコンデンサ
12を有する被測定物14の抵抗値R1の測定を行ない、更に
コンデンサ12に蓄えられている電荷の放電を行なってい
る。即ち、電源16から被測定物14に定電圧(その値E1)
を印加し、そこに流れる電流を定常値I1に達してから電
流計18で測定し、マイクロコンピュータ等の演算手段を
含む計測部20で抵抗値R1をR1=E1/I1の式から算出す
る。又、この抵抗値R1を計測部20において、更に適正が
判断すれば、実装基板の良否の判定が行なえる。なお、
22、24は配線抵抗(それらの抵抗値r1、r1′)である。
測定後には直ちにスイッチ26を閉じ、保護抵抗(その値
R2)28を通じて、コンデンサ12の電荷を放電する。因み
に、配線抵抗値r1、r1′が保護抵抗値として十分の大き
さであれば、この保護抵抗28は必要ない。Such in-circuit testers are classified into a press type and a vacuum type due to the difference in the fixing method of the mounting board to the tester during measurement. In the former, the mounting board is placed on a fixture (pinpod) that is an inspection jig, and a press plate with a large number of holding bars is lowered from above to clamp and fix it, whereas in the latter, there is no press plate. The mounting board is sucked onto the fixture and fixed. After fixing, the measurement power supply circuit with discharge function shown in Fig. 3 was used, and in the press-type in-circuit tester, it was mounted on a printed circuit board (not shown) mounted on the pin board 10 and connected in parallel.
The resistance value R1 of the DUT 14 having 12 is measured, and the electric charge stored in the capacitor 12 is discharged. That is, a constant voltage from the power supply 16 to the DUT 14 (its value E1)
Is applied, and the current flowing therethrough reaches a steady value I1 and is then measured by the ammeter 18, and the resistance value R1 is calculated from the equation of R1 = E1 / I1 by the measuring unit 20 including an arithmetic means such as a microcomputer. Further, if the measuring unit 20 further determines that the resistance value R1 is appropriate, the quality of the mounting substrate can be determined. In addition,
22 and 24 are wiring resistances (their resistance values r1 and r1 ').
Immediately after measurement, switch 26 is closed and the protective resistance (value
The capacitor 12 is discharged through R2) 28. Incidentally, if the wiring resistance values r1 and r1 ′ are sufficiently large as the protection resistance value, the protection resistance 28 is not necessary.
このようにコンデンサ12を測定後に直ちに放電させるの
は、いつまでも電荷が残っていると、その後の取り扱い
や他の部品の測定等に不都合があるためである。しか
し、スイッチ26を閉じている時間を長くすれば、確かに
種々の静電容量のコンデンサ12に対し、いずれも良く放
電させることができるが、当然実装基板の良否の判定を
短時間に終了することができなくなる。そこで、スイッ
チ26を一定時間例えば数msの間だけ閉じ、又は電圧計30
をコンデンサ12の両端に接続して、その両端電圧が0に
なるまで閉じ、再び開放して測定を終了している。The reason why the capacitor 12 is discharged immediately after the measurement as described above is because if the electric charge remains forever, it is inconvenient for subsequent handling and measurement of other parts. However, if the time during which the switch 26 is closed is lengthened, it is possible to surely discharge all the capacitors 12 having various electrostatic capacities, but of course, the determination of the quality of the mounting board is completed in a short time. Can't do it. Therefore, the switch 26 is closed for a certain period of time, for example, a few ms, or the voltmeter 30
Is connected to both ends of the capacitor 12, closed until the voltage across both ends becomes 0, and is opened again to complete the measurement.
考案が解決しようとする課題 しかしながら、このような放電機能付き測定電源回路に
おいて、前者のようにスイッチ26を一定時間だけ閉じる
ものではコンデンサ12の静電容量が大きいと放電時間が
不足して電荷が残り、逆に小さいと放電時間が不必要に
長いことになる。又、後者のようにスイッチ26を電圧計
30の目盛が0になるまで閉じるものでは、例え電圧が0
になってもコンデンサ12の内部抵抗や配線抵抗22、24等
により、依然として電荷が残る。何故なら、電流が流れ
ていても、コンデンサ12の静電容量に基づく電圧はそれ
らの内部抵抗等の電圧降下により相殺され、電圧計30の
目盛は0を示すようになるからである。DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention However, in such a measurement power supply circuit with a discharging function, if the capacitance of the capacitor 12 is large when the switch 26 is closed for a certain period of time like the former, the discharging time becomes insufficient and the electric charge is On the contrary, if it is small, the discharge time becomes unnecessarily long. Also, like the latter, switch 26 to a voltmeter.
If the 30 scale is closed until it reaches 0, the voltage will be 0.
However, the electric charge still remains due to the internal resistance of the capacitor 12, the wiring resistances 22 and 24, and the like. This is because, even if a current is flowing, the voltage based on the electrostatic capacity of the capacitor 12 is canceled by the voltage drop of their internal resistance and the like, and the scale of the voltmeter 30 shows 0.
本考案はこのような従来の問題点に着目してなされたも
のであり、被測定物に並列接続しているコンデンサの静
電容量に応じた放電時間で、確実に放電を行うことによ
り、実装基板を短時間に測定して検査し、その良否の判
定を正確に行える放電電源回路付きインサーキットテス
タと、更に被測定物の測定も行える測定、放電兼用電源
回路付きインサーキットテスタを提供することを目的と
する。The present invention has been made by paying attention to such a conventional problem, and it is mounted by surely discharging the discharge time according to the capacitance of the capacitor connected in parallel to the DUT. To provide an in-circuit tester with a discharge power supply circuit that can measure and inspect a board in a short time and accurately judge whether it is good or bad, and an in-circuit tester with a power supply circuit that also measures and can measure an object to be measured. With the goal.
課題を解決するための手段 上記目的を達成するための手段を、以下実施例に対応す
る第1図及び第2図を用いて説明する。Means for Solving the Problems Means for achieving the above object will be described below with reference to FIGS. 1 and 2 corresponding to the embodiments.
この放電電源回路付きインサーキットテスタは被測定物
36に並列接続しているコンデンサ38を対象にし、その並
列回路40の一端42にアースを介して接続する電源44と、
その並列回路40に印加する電源電圧E2をアース電位に切
り換える印加電圧切換器46と、その印加電圧を入力端子
を介して並列回路40の他端48に直接加えるオペアンプ50
と、そのオペアンプ50の出力端子と並列回路40の他端48
との間に介在する放電電流検出抵抗52と、その検出抵抗
52の両端電圧Vを測定する電圧計54と、その測定電圧V
をコンデンサ38の放電を終了するしきい値電圧Vdと比較
して放電終了信号S1を出力する電圧比較器56とからなる
放電電源回路を備えるものである。This in-circuit tester with discharge power circuit is the object to be measured.
A power supply 44 connected to one end 42 of the parallel circuit 40 via the ground, targeting the capacitor 38 connected in parallel to the 36.
An applied voltage switch 46 that switches the power supply voltage E2 applied to the parallel circuit 40 to the ground potential, and an operational amplifier 50 that directly applies the applied voltage to the other end 48 of the parallel circuit 40 via an input terminal.
And the output terminal of the operational amplifier 50 and the other end 48 of the parallel circuit 40.
And the discharge current detection resistor 52 that is interposed between
A voltmeter 54 for measuring the voltage V across 52 and the measured voltage V
And a voltage comparator 56 that outputs a discharge end signal S1 by comparing with a threshold voltage Vd for ending the discharge of the capacitor 38.
又、測定、放電兼用電源回路付きインサーキットテスタ
では上記並列回路40の一端42とアースとの間に直列接続
により、更に定常電流値検出信号S2を出力する電流計64
を付加する。Further, in the in-circuit tester with a power supply circuit for both measurement and discharge, the ammeter 64 for outputting the steady current value detection signal S2 is further connected in series between the one end 42 of the parallel circuit 40 and the ground.
Is added.
作用 上記のように構成した放電電源回路を備えると、並列接
続しているコンデンサ38を有する被測定物36に定電圧を
印加して測定した後、印加電圧切換器46により、オペア
ンプ50の非反転入力端子(+)に加わる電圧を0(アー
ス電位)に切り換えることができる。すると、オペアン
プ50のイマジナリショートにより、反転入力端子(−)
の電位も0になる。そこで、コンデンサ38に蓄えられた
電荷は放電電流検出抵抗52を通って、オペアンプ50の出
力端子に流れ込む。この検出抵抗52の両端電圧Vは電圧
計54で測定し、電圧比較器56に入れる。電圧比較器56で
はその測定電圧Vとコンデンサ38の静電容量に応じた放
電を終了するしきい値電圧Vdとを比較し、放電終了信号
S1を出力する。なお、印加電圧切換器46により、電源44
からオペアンプ50の非反転入力端子(+)に加わる電圧
を一旦マイナスにした後、0にするとコンデンサ38の放
電を一層早めて、放電電流検出抵抗52の両端電圧Vをし
きい値以下にすることができる。When the discharge power supply circuit configured as described above is provided, a constant voltage is applied to the DUT 36 having the capacitor 38 connected in parallel to perform measurement, and then the applied voltage switch 46 causes the non-inversion of the operational amplifier 50. The voltage applied to the input terminal (+) can be switched to 0 (ground potential). Then, due to the imaginary short circuit of the operational amplifier 50, the inverting input terminal (-)
Also becomes 0. Therefore, the electric charge stored in the capacitor 38 flows into the output terminal of the operational amplifier 50 through the discharge current detection resistor 52. The voltage V across the detection resistor 52 is measured by a voltmeter 54 and input to a voltage comparator 56. The voltage comparator 56 compares the measured voltage V with a threshold voltage Vd for ending the discharge according to the capacitance of the capacitor 38, and outputs a discharge end signal.
Output S1. The applied voltage switch 46 allows
Once the voltage applied to the non-inverting input terminal (+) of the operational amplifier 50 is made negative and then set to 0, the discharge of the capacitor 38 is further accelerated, and the voltage V across the discharge current detection resistor 52 is set below the threshold value. You can
又、測定、放電兼用電源回路を備えると、電流計64を付
加することにより、コンデンサ38の放電に先立つ、被測
定物36の測定にも使える。即ち、電源44から印加電圧切
換器46を経て、オペアンプ50の非反転入力端子(+)に
定電圧E2を印加すると、イマジナリショートにより、そ
の反転入力端子(−)に定電圧E2が現われ、被測定物36
に印加する。そこで、被測定物36とコンデンサ38との並
列回路40の一端42とアースとの間に介在する電流計64
で、被測定物36に流れる電流を、定常電流値I2に達して
から測定して検出信号S2を出力する。この結果、被測定
物36の抵抗値R4は定電圧値E2と定常電流値I2の商から算
出可能となる。Further, when a power supply circuit for both measurement and discharge is provided, by adding an ammeter 64, it can be used for measuring the DUT 36 prior to discharging the capacitor 38. That is, when the constant voltage E2 is applied from the power source 44 to the non-inverting input terminal (+) of the operational amplifier 50 through the applied voltage switch 46, the constant voltage E2 appears at the inverting input terminal (-) due to an imaginary short circuit, and the constant voltage E2 appears. Measured object 36
Apply to. Therefore, an ammeter 64 interposed between one end 42 of the parallel circuit 40 of the DUT 36 and the capacitor 38 and the ground.
Then, the current flowing through the DUT 36 is measured after reaching the steady current value I2, and the detection signal S2 is output. As a result, the resistance value R4 of the DUT 36 can be calculated from the quotient of the constant voltage value E2 and the steady current value I2.
実施例 以下、添付図面に基づいて、本考案の実施例を説明す
る。Embodiment An embodiment of the present invention will be described below with reference to the accompanying drawings.
第1図は本考案を適用したプレス式インサーキットテス
タの放電電源回路を含む要部を示す構成図である。図
中、32は上方に突出したプローブピン34(34a、34b)を
有するピンボード、36はその上に乗せたプリント基板
(図示なし)に実装され、並列接続したコンデンサ38を
有する抵抗器、コイル等の被測定物である。このような
被測定物36を測定する場合、そこに並列接続しているコ
ンデンサ38には当然電荷が蓄えられているので、測定後
には直ちにその電荷を放電させる必要がある。そこで、
コンデンサ38を対象とする放電電源回路を備える。この
放電電源回路はその並列回路40の一端42にアースを介し
て接続する電源44と、その並列回路40に印加する電源電
圧E2をアース電位に切り換える印加電圧切換器例えば切
換スイッチ46と、その印加電圧を入力端子を介して並列
回路40の他端48に直接加えるオペアンプ50と、そのオペ
アンプ50の出力端子と並列回路40の他端48との間に介在
する放電電流検出抵抗52と、その検出抵抗52の両端電圧
Vを測定する電圧計54と、その測定電圧Vをコンデンサ
38の静電容量に応じた放電を終了するしきい値電圧Vd例
えば10mVと比較して放電終了信号S2を出力する電圧比較
器56とからなり、その放電終了信号S2はマイクロコンピ
ュータ等の演算手段を含む計測部58に入る。なお、配線
抵抗60、62の各抵抗値r2、r2′は放電電流検出抵抗52の
抵抗値R3に比べ小さく、無視できる。FIG. 1 is a configuration diagram showing a main part including a discharge power supply circuit of a press-type in-circuit tester to which the present invention is applied. In the figure, 32 is a pin board having upwardly protruding probe pins 34 (34a, 34b), 36 is a resistor mounted with a capacitor 38 mounted in parallel on a printed circuit board (not shown) and a coil Is the object to be measured. When measuring the DUT 36 as described above, the electric charge is naturally stored in the capacitor 38 connected in parallel to the DUT 36. Therefore, it is necessary to immediately discharge the electric charge after the measurement. Therefore,
A discharge power supply circuit for the capacitor 38 is provided. This discharge power supply circuit includes a power supply 44 connected to one end 42 of the parallel circuit 40 via a ground, an applied voltage switcher for switching the power supply voltage E2 applied to the parallel circuit 40 to a ground potential, and a changeover switch 46, and its application. An operational amplifier 50 that directly applies a voltage to the other end 48 of the parallel circuit 40 via an input terminal, a discharge current detection resistor 52 interposed between the output terminal of the operational amplifier 50 and the other end 48 of the parallel circuit 40, and its detection. A voltmeter 54 that measures the voltage V across the resistor 52, and the measured voltage V
And a voltage comparator 56 that outputs a discharge end signal S2 in comparison with a threshold voltage Vd for ending discharge according to the electrostatic capacitance of 38, for example, 10 mV, and the discharge end signal S2 is a calculating means such as a microcomputer. Enter the measuring unit 58 including. The resistance values r2 and r2 'of the wiring resistors 60 and 62 are smaller than the resistance value R3 of the discharge current detection resistor 52 and can be ignored.
このような放電電源回路を備えておくと、並列接続して
いるコンデンサ38を有する被測定物36に定電圧を印加し
て抵抗値等を測定した後、印加電圧切換器たる切換スイ
ッチ46を操作して速やかに、オペアンプ50の非反転入力
端子(+)をアース側に切り換え、そこに加わる電圧を
0に調整することができる。すると、オペアンプ50のイ
マジナリショートにより、反転入力端子(−)の電位も
0になる。そこで、コンデンサ38に蓄えられた電荷は放
電電流検出抵抗52を通って、オペアンプ50の出力端子に
流れ込む。因みに、オペアンプの入力インピダンスは非
常に大きく、出力インピダンスは非常に小さい。この検
出抵抗52の両端電圧Vは電圧計54で測定し、電圧比較器
56に入れる。電圧比較器56ではその測定電圧Vとコンデ
ンサ38の静電容量に応じた放電を終了するしきい値電圧
Vdとを比較し、確実に放電終了信号S2を出力する。この
放電終了信号S2は計測部58に入ると確認されるため、他
の部品の測定等に速やかに移行できる。なお、印加電圧
切換器46により、電源44からオペアンプ50の非反転入力
端子(+)に加わる電圧を一旦マイナスにした後、0に
するとコンデンサ38の放電を一層早めて、放電電流検出
抵抗の両端電圧Vを速やかにしきい値以下にすることが
できる。If such a discharge power supply circuit is provided, a constant voltage is applied to the DUT 36 having the capacitor 38 connected in parallel to measure the resistance value and the like, and then the changeover switch 46 as an applied voltage changer is operated. Then, the non-inverting input terminal (+) of the operational amplifier 50 can be quickly switched to the ground side and the voltage applied thereto can be adjusted to zero. Then, the potential of the inverting input terminal (-) becomes 0 due to the imaginary short circuit of the operational amplifier 50. Therefore, the electric charge stored in the capacitor 38 flows into the output terminal of the operational amplifier 50 through the discharge current detection resistor 52. Incidentally, the input impedance of the operational amplifier is very large, and the output impedance is very small. The voltage V across the detection resistor 52 is measured by a voltmeter 54 and a voltage comparator
Put in 56. In the voltage comparator 56, the threshold voltage for ending the discharge according to the measured voltage V and the electrostatic capacity of the capacitor 38.
The discharge end signal S2 is surely output by comparing with Vd. Since this discharge end signal S2 is confirmed to enter the measuring unit 58, it is possible to quickly shift to measurement of other components. It should be noted that the voltage applied from the power supply 44 to the non-inverting input terminal (+) of the operational amplifier 50 is once made negative by the applied voltage switch 46, and then set to 0, whereby the discharge of the capacitor 38 is further accelerated, and both ends of the discharge current detection resistor are made. The voltage V can be quickly reduced to the threshold value or less.
第2図は本考案を適用したプレス式インサーキットテス
タの測定、放電兼用電源回路を含む要部を示す構成図で
ある。この実施例は上記実施例に比べ、上記実施例で示
した並列回路40の一端42とアースとの間に直列接続によ
り、更に電流計64を介在させ、そこで測定した定常電流
値検出信号S2を計測部に与える点が異なっているが、他
は全て等しい。従って、以下では同一のものには同一の
符号を用いて説明する。FIG. 2 is a configuration diagram showing a main part including a power supply circuit for both measurement and discharge of a press-type in-circuit tester to which the present invention is applied. In this embodiment, as compared with the above embodiment, a series connection is provided between the one end 42 of the parallel circuit 40 and the ground shown in the above embodiment, further an ammeter 64 is interposed, and a steady current value detection signal S2 measured there is provided. All are the same except that they are given to the measurement unit. Therefore, in the following description, the same components are designated by the same reference numerals.
このように電流計64を付加すると、コンデンサ38の放電
に先立つ、被測定物36の測定にも使えるようになるた
め、測定、放電兼用電源回路を備えたことになる。そこ
で、被測定物36の抵抗値R4の測定を行なうには、先ず電
源44から印加電圧切換器46を経て、オペアンプ50の非反
転入力端子(+)に定電圧E2を印加し、イマジナリショ
ートを利用して、その反転入力端子(−)に定電圧E2を
発生させ、被測定物36に印加する。すると、電流計64
で、被測定物36に流れる電流を、定常電流値I2に達して
から測定して検出信号S2を出力することができる。この
検出信号S2は計測部58に入るので、被測定物36の抵抗値
R4は定電圧値E2と定常電流値I2の商から算出可能とな
る。又、コンデンサ38の放電動作は上記実施例と同様で
ある。この結果、被測定物36の抵抗値R4の測定とそこに
並列接続しているコンデンサ38の放電とを合せた一連の
動作を短時間に、確実に行なえる。When the ammeter 64 is added in this manner, it can be used for the measurement of the DUT 36 prior to the discharge of the capacitor 38, and thus the power supply circuit for both measurement and discharge is provided. Therefore, in order to measure the resistance value R4 of the DUT 36, first, the constant voltage E2 is applied to the non-inverting input terminal (+) of the operational amplifier 50 from the power supply 44 through the applied voltage switching device 46 to cause an imaginary short circuit. Utilizing this, a constant voltage E2 is generated at the inverting input terminal (-) and applied to the DUT 36. Then the ammeter 64
Then, the current flowing through the DUT 36 can be measured after reaching the steady current value I2 and the detection signal S2 can be output. Since this detection signal S2 enters the measuring section 58, the resistance value of the DUT 36 is
R4 can be calculated from the quotient of the constant voltage value E2 and the steady current value I2. Further, the discharging operation of the capacitor 38 is the same as that in the above embodiment. As a result, a series of operations including the measurement of the resistance value R4 of the DUT 36 and the discharging of the capacitor 38 connected in parallel therewith can be reliably performed in a short time.
なお、上記各実施例ではプレス式インサーキットテスタ
について説明したが、バキューム式インサーキットテス
タでも同様である。Although the press-type in-circuit tester is described in each of the above embodiments, the same applies to the vacuum-type in-circuit tester.
考案の効果 以上説明した本考案によれば、請求項1では放電電源回
路を備えて被測定物に並列接続しているコンデンサを放
電し、その放電電流を測定することにより、コンデンサ
の静電容量に応じた短い放電時間で、確実に放電を行え
る。それ故、実装基板を短時間で測定して検査し、その
良否を正確に判定できる。又、請求項2では測定、放電
兼用回路を備えるため、測定と放電とに電源回路を共用
でき、測定から放電終了までの一連の動作を短時間で、
確実に行える。According to the present invention described above, according to the first aspect of the present invention, the capacitance of the capacitor, which is provided with the discharge power supply circuit and is connected in parallel to the DUT, is discharged and the discharge current is measured. The discharge can be reliably performed in a short discharge time according to. Therefore, the mounting substrate can be measured and inspected in a short time, and its quality can be accurately determined. Further, in claim 2, since the circuit for both measurement and discharge is provided, the power supply circuit can be shared for measurement and discharge, and a series of operations from measurement to end of discharge can be performed in a short time.
Can be done reliably.
第1図は本考案を適用したプレス式インサーキットテス
タの放電電源回路を含む要部を示す構成図である。 第2図は本考案を適用したプレス式インサーキットテス
タの測定、放電兼用電源回路を含む要部を示す構成図で
ある。 第3図は従来のプレス式インサーキットテスタの放電機
能付き測定電源回路を含む要部を示す構成図である。 32…ピンボード、36…被測定物、38…コンデンサ、40…
並列回路、42、48…その一端、他端、44…電源、46…印
加電圧切換器、50…オペアンプ、52…放電電流検出抵
抗、54…電圧計、56…電圧比較器、64…電流計FIG. 1 is a configuration diagram showing a main part including a discharge power supply circuit of a press-type in-circuit tester to which the present invention is applied. FIG. 2 is a configuration diagram showing a main part including a power supply circuit for both measurement and discharge of a press-type in-circuit tester to which the present invention is applied. FIG. 3 is a configuration diagram showing a main part including a measurement power supply circuit with a discharge function of a conventional press-type in-circuit tester. 32 ... Pin board, 36 ... DUT, 38 ... Capacitor, 40 ...
Parallel circuit, 42, 48 ... One end, the other end, 44 ... Power supply, 46 ... Applied voltage switching device, 50 ... Operation amplifier, 52 ... Discharge current detection resistor, 54 ... Voltmeter, 56 ... Voltage comparator, 64 ... Ammeter
Claims (2)
対象とする、その並列回路の一端にアースを介して接続
する電源と、その並列回路に印加する電源電圧をアース
電位に切り換える印加電圧切換器と、その印加電圧を入
力端子を介して並列回路の他端に直接加えるオペアンプ
と、そのオペアンプの出力端子と並列回路の他端との間
に介在する放電電流検出抵抗と、その検出抵抗の両端電
圧を測定する電圧計と、その測定電圧をコンデンサの放
電を終了するしきい値電圧と比較して放電終了信号を出
力する電圧比較器とからなる放電電源回路を備えること
を特徴とする放電電源回路付きインサーキットテスタ。1. A power supply for a capacitor connected in parallel to an object to be measured, which is connected to one end of the parallel circuit via a ground, and an applied voltage for switching a power supply voltage applied to the parallel circuit to a ground potential. A switching device, an operational amplifier for directly applying the applied voltage to the other end of the parallel circuit through an input terminal, a discharge current detection resistor interposed between the output terminal of the operational amplifier and the other end of the parallel circuit, and the detection resistor A discharge power supply circuit comprising a voltmeter for measuring the voltage across both ends and a voltage comparator for outputting a discharge end signal by comparing the measured voltage with a threshold voltage for ending the discharge of the capacitor. In-circuit tester with discharge power circuit.
対象とする、その並列回路の一端に直列接続した定常電
流値検出信号を出力する電流計とアースを介して接続す
る電源と、その並列回路に印加する電源電圧をアース電
位に切り換える印加電圧切換器と、その印加電圧を入力
端子を介して並列回路の他端に直接加えるオペアンプ
と、そのオペアンプの出力端子と並列回路の他端との間
に介在する放電電流検出抵抗と、その検出抵抗の両端電
圧を測定する電圧計と、その測定電圧をコンデンサの放
電を終了するしきい値電圧と比較して放電終了信号を出
力する電圧比較器とからなる測定、放電兼用電源回路を
備えることを特徴とする測定、放電兼用電源回路付きイ
ンサーキットテスタ。2. A power supply connected to an ammeter for outputting a steady current value detection signal, which is connected in series to one end of a parallel circuit, which is intended for a capacitor connected in parallel to an object to be measured, and a grounded power supply. An applied voltage switcher that switches the power supply voltage applied to the parallel circuit to the ground potential, an operational amplifier that applies the applied voltage directly to the other end of the parallel circuit via an input terminal, an output terminal of the operational amplifier, and the other end of the parallel circuit. Between the discharge current detection resistance and the voltmeter that measures the voltage across the detection resistance, and the voltage comparison that outputs the discharge end signal by comparing the measured voltage with the threshold voltage that ends the discharge of the capacitor. An in-circuit tester with a power supply circuit for both measurement and discharge, which has a power supply circuit for both measurement and discharge.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1886588U JPH0714924Y2 (en) | 1988-02-16 | 1988-02-16 | In-circuit tester with discharge power supply circuit and in-circuit tester with power supply circuit for both measurement and discharge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1886588U JPH0714924Y2 (en) | 1988-02-16 | 1988-02-16 | In-circuit tester with discharge power supply circuit and in-circuit tester with power supply circuit for both measurement and discharge |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01124575U JPH01124575U (en) | 1989-08-24 |
| JPH0714924Y2 true JPH0714924Y2 (en) | 1995-04-10 |
Family
ID=31233882
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1886588U Expired - Lifetime JPH0714924Y2 (en) | 1988-02-16 | 1988-02-16 | In-circuit tester with discharge power supply circuit and in-circuit tester with power supply circuit for both measurement and discharge |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714924Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6143279B2 (en) * | 2013-01-17 | 2017-06-07 | 日置電機株式会社 | Inspection procedure data generation device and inspection procedure data generation program |
-
1988
- 1988-02-16 JP JP1886588U patent/JPH0714924Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01124575U (en) | 1989-08-24 |
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