JPH0720620Y2 - テストフィクスチュアの校正治具 - Google Patents

テストフィクスチュアの校正治具

Info

Publication number
JPH0720620Y2
JPH0720620Y2 JP10083987U JP10083987U JPH0720620Y2 JP H0720620 Y2 JPH0720620 Y2 JP H0720620Y2 JP 10083987 U JP10083987 U JP 10083987U JP 10083987 U JP10083987 U JP 10083987U JP H0720620 Y2 JPH0720620 Y2 JP H0720620Y2
Authority
JP
Japan
Prior art keywords
test fixture
test
calibration jig
calibration
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP10083987U
Other languages
English (en)
Japanese (ja)
Other versions
JPS646568U (cs
Inventor
博 白鳥
秀行 高橋
Original Assignee
横河・ヒューレット・パッカード株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 横河・ヒューレット・パッカード株式会社 filed Critical 横河・ヒューレット・パッカード株式会社
Priority to JP10083987U priority Critical patent/JPH0720620Y2/ja
Publication of JPS646568U publication Critical patent/JPS646568U/ja
Application granted granted Critical
Publication of JPH0720620Y2 publication Critical patent/JPH0720620Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
JP10083987U 1987-06-30 1987-06-30 テストフィクスチュアの校正治具 Expired - Lifetime JPH0720620Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10083987U JPH0720620Y2 (ja) 1987-06-30 1987-06-30 テストフィクスチュアの校正治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10083987U JPH0720620Y2 (ja) 1987-06-30 1987-06-30 テストフィクスチュアの校正治具

Publications (2)

Publication Number Publication Date
JPS646568U JPS646568U (cs) 1989-01-13
JPH0720620Y2 true JPH0720620Y2 (ja) 1995-05-15

Family

ID=31329282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10083987U Expired - Lifetime JPH0720620Y2 (ja) 1987-06-30 1987-06-30 テストフィクスチュアの校正治具

Country Status (1)

Country Link
JP (1) JPH0720620Y2 (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6144984B2 (ja) * 2013-07-16 2017-06-07 日置電機株式会社 補正用治具
JP7869247B2 (ja) * 2021-12-21 2026-06-02 株式会社Fuji 電気的特性取得装置

Also Published As

Publication number Publication date
JPS646568U (cs) 1989-01-13

Similar Documents

Publication Publication Date Title
US20060114004A1 (en) Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer
US5528153A (en) Method for non-destructive, non-contact measurement of dielectric constant of thin films
US4763534A (en) Pressure sensing device
US8174283B2 (en) Calibration technique for measuring gate resistance of power MOS gate device at wafer level
US6300757B1 (en) Procedure for the calibration of a measuring device
US6876935B2 (en) Method for correcting measurement error, method of determining quality of electronic component, and device for measuring characteristic of electronic component
JP2764517B2 (ja) チップ抵抗器、ならびに、これを用いる電流検出回路および電流検出方法
JPS6211501B2 (cs)
JP3558080B2 (ja) 測定誤差の補正方法、電子部品の良否判定方法および電子部品特性測定装置
US5331305A (en) Chip network resistor
JP2003156551A (ja) 容量計の校正方法、校正用標準容量ボックス、静電容量の測定方法、容量測定用ボックス及び容量計
Boser et al. High frequency behavior of ceramic multilayer capacitors
JP2001013186A (ja) 高周波デバイス用測定治具装置
JP2006170700A (ja) プローブ校正用治具、校正用治具付きプローブカードおよび半導体ウェハ測定装置
JP6144984B2 (ja) 補正用治具
CN115200747A (zh) 温度传感器的校准装置
JP2000105262A (ja) 測定用治具
Obrecht Simple Offset Elimination Technique for Two-Wire Measurements
JP2661528B2 (ja) 半導体集積回路装置
JP2765527B2 (ja) 半導体装置の評価方法
JPH0611540A (ja) 測定治具の校正部品
US20040008037A1 (en) Capacity measuring device and capacity measuring method
JPS62156090A (ja) レ−ザ加工におけるギヤツプ量検出装置
WO2023233889A1 (ja) 測定装置、測定用回路、及び測定方法
JP2000105263A (ja) 校正用レバーを備えたｄｕｔ置き台及びそれらを用いた校正方法