JPH07222902A - Processor - Google Patents

Processor

Info

Publication number
JPH07222902A
JPH07222902A JP6040396A JP4039694A JPH07222902A JP H07222902 A JPH07222902 A JP H07222902A JP 6040396 A JP6040396 A JP 6040396A JP 4039694 A JP4039694 A JP 4039694A JP H07222902 A JPH07222902 A JP H07222902A
Authority
JP
Japan
Prior art keywords
processing
treatment
liquid
pipe
tank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6040396A
Other languages
Japanese (ja)
Other versions
JP3273282B2 (en
Inventor
Yuji Tanaka
裕司 田中
Kenji Yokomizo
賢治 横溝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Tokyo Electron Kyushu Ltd
Original Assignee
Tokyo Electron Ltd
Tokyo Electron Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd, Tokyo Electron Kyushu Ltd filed Critical Tokyo Electron Ltd
Priority to JP04039694A priority Critical patent/JP3273282B2/en
Priority to US08/330,793 priority patent/US5575079A/en
Priority to KR1019940028107A priority patent/KR100338534B1/en
Priority to TW083110221A priority patent/TW294823B/zh
Publication of JPH07222902A publication Critical patent/JPH07222902A/en
Priority to US08/697,132 priority patent/US5671544A/en
Priority to KR1020010051301A priority patent/KR100357316B1/en
Application granted granted Critical
Publication of JP3273282B2 publication Critical patent/JP3273282B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Extraction Or Liquid Replacement (AREA)

Abstract

(57)【要約】 [目的]処理液の蒸気を用いて被処理体表面から水分を
脱離させる処理装置において、凝縮液化した処理液を効
率的または清潔的に回収して、処理液消費量の節約化を
はかる。 [構成]受皿24の底の排液口24bに接続された排液
管26には、トラップ部26aよりも下流側に開閉弁3
0が設けられるとともに、処理槽14内で該トラップ部
26aの上端よりも高い排液管26の位置(箇所)に処
理液回収用の枝管32が設けられている。冷却蛇管36
の真下に設けられた板樋38は周回方向において高低差
を有し、最も低い板樋部分付近の処理槽14の側壁に処
理液排出口14aが形成されている。この処理液排出口
38aは処理液回収用の排出管42を介して装置容器1
0の外に配置されているフィルタ44の入口に接続さ
れ、フィルタ44の出口は処理液回収用の導入管46を
介して処理槽14の側壁の処理液導入口14bに接続さ
れている。
(57) [Summary] [Purpose] In a processing device that uses the vapor of the processing liquid to desorb water from the surface of the object to be processed, the processing liquid that has been condensed and liquefied can be collected efficiently or cleanly, and the consumption of the processing liquid can be increased. To save money. [Configuration] In the drainage pipe 26 connected to the drainage port 24b at the bottom of the tray 24, the on-off valve 3 is provided on the downstream side of the trap portion 26a.
0 is provided, and a branch pipe 32 for collecting the treatment liquid is provided in the treatment tank 14 at a position (location) of the drain pipe 26 higher than the upper end of the trap portion 26a. Cooling pipe 36
The plate gutter 38 provided directly under the plate has a height difference in the circumferential direction, and the processing liquid discharge port 14a is formed on the side wall of the processing tank 14 near the lowest part of the gutter. The processing liquid discharge port 38a is connected to the apparatus container 1 via a discharging pipe 42 for collecting the processing liquid.
0 is connected to the inlet of the filter 44 disposed outside the filter 0, and the outlet of the filter 44 is connected to the treatment liquid introduction port 14b on the side wall of the treatment tank 14 via the treatment liquid recovery introduction pipe 46.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、処理装置に関する。FIELD OF THE INVENTION The present invention relates to a processing apparatus.

【0002】[0002]

【従来の技術】この種の処理装置では、処理槽の底部で
揮発性を有する所定の処理液たとえばIPA(イソプロ
ピルアルコール)を加熱して気化させ、このIPAの蒸
気を被処理体たとえば半導体ウエハの表面に付着してい
る水分と置換させることによって、ウエハ表面から水分
を落下させるようにしている。そして、ウエハ表面から
脱離した水分を処理槽内に設置した受皿に落とし、この
受皿より排液管を介して処理槽の外のドレインタンクへ
排液するようにしている。また、IPAの蒸気を処理槽
の外へ逃がさないように、処理槽の上部側壁に沿って冷
却蛇管を配設し、この冷却蛇管でIPAの蒸気を凝縮
(液化)させ、IPAの液滴を処理槽底部の処理液溜部
へ戻すようにしている。
2. Description of the Related Art In a processing apparatus of this type, a volatile predetermined processing liquid such as IPA (isopropyl alcohol) is heated and vaporized at the bottom of a processing tank, and vapor of the IPA is transferred to an object to be processed such as a semiconductor wafer. By replacing the water adhering to the surface, the water is dropped from the wafer surface. Then, the water desorbed from the surface of the wafer is dropped onto a tray installed in the processing tank, and the water is drained from the tray to a drain tank outside the processing tank through a drain pipe. Further, in order to prevent the vapor of IPA from escaping to the outside of the treatment tank, a cooling corrugated pipe is arranged along the upper side wall of the treatment tank, and the vapor of IPA is condensed (liquefied) by this cooling corrugated pipe, and IPA droplets are condensed. It is designed to be returned to the processing liquid reservoir at the bottom of the processing tank.

【0003】[0003]

【発明が解決しようとする課題】ところで、上記の受皿
には、処理液の蒸気が凝縮してできた処理液の液滴も溜
る。処理槽内の雰囲気温度はほぼ均一な温度たとえば約
80゜Cに保たれているが、配液管を通じて外気の温度
が受皿に伝わり、受皿付近で処理液の蒸気が冷えて凝縮
してしまう。このような受皿における処理液の凝縮は水
分脱離処理の間に行われるのはもちろんであるが、待機
中であっても受皿によって処理液は凝縮され排液され
る。
By the way, droplets of the processing liquid formed by condensation of the processing liquid vapor are also accumulated in the tray. Although the atmospheric temperature in the processing tank is maintained at a substantially uniform temperature, for example, about 80 ° C., the temperature of the outside air is transmitted to the pan through the distribution pipe, and the steam of the processing liquid is cooled and condensed near the pan. Condensation of the processing liquid in such a tray is, of course, performed during the moisture desorption process, but the processing liquid is condensed and discharged by the tray even during standby.

【0004】従来のこの種処理装置は、受皿より排液管
を介して垂れ流しで排液する方式であるため、受皿に溜
った処理液を水分脱離処理中でも待機中でも一律に排液
していた。しかし、受皿に溜る処理液は、水分脱離処理
中は被処理体から脱離した水分と混じるためこれを排液
するのは致し方ないにしても、待機中は水分と混じらな
い純な処理液であり、これを排液するのは無駄である。
実際、この種の処理装置は24時間稼働するのも珍しく
はなく、そのうち実働時間(水分脱離処理に費やす実時
間)は1/3程度で、残りは待機時間に費やされてい
る。したがって、待機時間中に受皿から無駄に排液され
る処理液は、単位時間当たりでは微量であっても、一日
を通じてみるとかなりの量(たとえば20リットル程)
になる。
Since this type of conventional processing apparatus drains liquid from the receiving tray through the drainage pipe, the processing liquid accumulated in the receiving tray is uniformly drained during the water desorption process or during standby. . However, the treatment liquid that collects in the saucer mixes with the moisture desorbed from the object to be treated during the moisture desorption process, so even if it is unavoidable to drain it, it is a pure treatment liquid that does not mix with the moisture during standby. It is wasteful to drain this.
In fact, it is not uncommon for this type of processing device to operate for 24 hours, of which the actual working time (actual time spent for water desorption treatment) is about 1/3 and the rest is spent for waiting time. Therefore, the amount of processing liquid that is wastefully drained from the saucer during the standby time is considerably small (for example, about 20 liters) throughout the day, even if the amount is small per unit time.
become.

【0005】また、従来のこの種処理装置では、冷却蛇
管の真下に冷却蛇管から自然落下する処理液の液滴を受
ける樋を処理槽の側壁に沿って設け、この樋で受けた処
理液を樋と内壁との隙間から処理槽底部の処理液溜部側
へ落として回収していた。しかし、このような従来の処
理液回収方式においては、回収される処理液と一緒に樋
や処理槽内壁に付着している汚れ、塵芥等も処理液溜部
へ流れ落ちやすく、このため、処理液が劣化しやすく、
処理液の入れ替えを頻繁に行わなくてはならなかった。
また、樋と処理槽内壁との隙間から落ちた処理液が跳ね
て被処理体や受皿に付着するおそれもあった。
Further, in the conventional processing apparatus of this kind, a trough for receiving the droplets of the processing solution that naturally drops from the cooling corrugated tube is provided just below the cooling corrugated tube along the side wall of the processing tank, and the processing solution received by this trough is provided. It was collected by dropping from the gap between the gutter and the inner wall to the side of the processing liquid reservoir at the bottom of the processing tank. However, in such a conventional processing liquid recovery method, dirt, dust, and the like adhering to the trough and the inner wall of the processing tank together with the processing liquid to be recovered easily flow down to the processing liquid storage portion. Easily deteriorates,
The processing solution had to be changed frequently.
Further, there is a possibility that the processing liquid dropped from the gap between the gutter and the inner wall of the processing tank may splash and adhere to the object to be processed or the saucer.

【0006】本発明は、かかる問題点に鑑みてなされた
もので、その第1の目的は、処理液の蒸気によって被処
理体から脱離した水分を受けるための器に該処理液の蒸
気が凝縮して溜った処理液を待機時間中は無駄に排液す
ることなく処理槽内の処理液溜部に効率的に回収して、
処理液消費量の節約化をはかる処理装置を提供すること
にある。
The present invention has been made in view of the above problems, and a first object of the present invention is to provide a vessel for receiving the moisture desorbed from the object to be treated by the vapor of the treatment liquid, so that the vapor of the treatment liquid During the waiting time, the condensed and accumulated processing liquid is efficiently collected in the processing liquid storage section in the processing tank without being wastefully discharged,
It is an object of the present invention to provide a processing apparatus that saves the consumption of processing liquid.

【0007】本発明の第2の目的は、処理槽の上部内壁
に沿って設けられた冷却体の冷却によって蒸気から凝縮
液化した処理液をきれいな状態で処理槽内の処理液溜部
に回収して、処理液の劣化を抑制し、ひいては処理液消
費量の節約化をはかる処理装置を提供することにある。
A second object of the present invention is to collect the processing liquid condensed and liquefied from the steam by cooling the cooling body provided along the inner wall of the upper portion of the processing tank in the processing liquid reservoir in the processing tank in a clean state. Therefore, it is an object of the present invention to provide a processing apparatus that suppresses deterioration of the processing liquid and thus saves consumption of the processing liquid.

【0008】[0008]

【課題を解決するための手段】上記第1の目的を達成す
るために、本発明の第1の処理装置は、処理槽の中で所
定の揮発性処理液の蒸気の雰囲気中で被処理体の表面か
ら落下した揮発性処理液を含む水分を、前記処理槽内に
設置した所定の器に集め、前記器より配液管を介して排
液するようにした処理装置において、前記排液管の途中
に開閉弁を設けるとともに、処理液溜部へ処理液を戻す
ために前記開閉弁よりも前記器側に近い所定の位置で前
記排液管より分岐し、かつ先端の開口している管を設け
る構成とした。
In order to achieve the above first object, the first processing apparatus of the present invention is an object to be processed in an atmosphere of vapor of a predetermined volatile processing liquid in a processing tank. In the processing device, the water containing the volatile processing liquid that has fallen from the surface of the processing device is collected in a predetermined container installed in the processing tank and drained from the container via a liquid distribution pipe. An on-off valve is provided in the middle of the pipe, and a pipe is branched from the drain pipe at a predetermined position closer to the container side than the on-off valve to return the treatment liquid to the treatment liquid reservoir and has an open tip. Is provided.

【0009】また、上記第2の目的を達成するために、
本発明の第2の処理装置は、処理槽の中で被処理体表面
の水分脱離処理に用いられる所定の揮発性処理液の蒸気
を冷却して凝縮させるために蒸気処理部よりも上方の位
置にて前記処理槽の側壁に沿って延在する冷却体と、前
記冷却体より下方の位置にて前記冷却体より落下した前
記処理液の液滴を受ける樋手段と、前記処理液を濾過す
るためのフィルタ手段と、前記樋手段で集められた前記
処理液を前記フィルタ手段へ送り、前記フィルタ手段で
濾過された前記処理液を前記処理槽内の処理液溜部に戻
す処理液回収用の管とを具備する構成とした。
In order to achieve the second object,
The second processing apparatus of the present invention is arranged above the steam processing unit in order to cool and condense the steam of a predetermined volatile processing liquid used for the moisture desorption processing on the surface of the object to be processed in the processing tank. A cooling body extending along the side wall of the processing tank at a position, a gutter means for receiving a droplet of the processing liquid dropped from the cooling body at a position below the cooling body, and a filtering of the processing liquid. And a processing means for returning the processing solution collected by the gutter means to the filtering means and returning the processing solution filtered by the filtering means to the processing solution reservoir in the processing tank. And a tube of.

【0010】[0010]

【作用】本発明の第1の処理装置では、被処理体表面か
ら脱離した水分はいったん器に集められてから排液管を
通って配液される。器に凝縮した処理液も水分と一緒に
排液管を通って配液される。処理時間の間、開閉弁は開
いている。待機時間に入って開閉弁が閉じると、器に凝
縮した処理液は処理槽内の排液管の途中で処理液回収用
の管(枝管)から排出され、そのまま処理槽内に回収さ
れる。
In the first processing apparatus of the present invention, the water desorbed from the surface of the object to be processed is once collected in the container and then distributed through the drain pipe. The treatment liquid condensed in the container is also distributed together with water through the drain pipe. The open / close valve is open during the processing time. When the on-off valve closes during the waiting time, the processing liquid condensed in the container is discharged from the processing liquid recovery pipe (branch pipe) in the middle of the drainage pipe in the processing tank, and is recovered as it is in the processing tank. .

【0011】本発明の第2の処理装置では、冷却体で冷
やされて凝縮した処理液は、樋手段に受けられて、処理
液回収用の管を介してフィルタに送られ、そこで不純物
や塵芥等を除去されてから、処理液回収用の管を通って
処理槽内の処理液溜部に回収される。
In the second treatment apparatus of the present invention, the treatment liquid cooled by the cooling body and condensed is received by the gutter means and sent to the filter through the pipe for collecting the treatment liquid, where impurities and dust are collected. And the like are removed, and then are collected in the processing liquid reservoir in the processing tank through the processing liquid recovery pipe.

【0012】[0012]

【実施例】以下、添付図を参照して本発明の実施例を説
明する。
Embodiments of the present invention will be described below with reference to the accompanying drawings.

【0013】図1および図2は、本発明の一実施例によ
る処理装置の構成を示す一部断面正面図および一部断面
側面図である。なお、図解の簡略化のため、図1におけ
る搬送アーム22は、図2では省かれて図示されていな
い。
FIG. 1 and FIG. 2 are a partial sectional front view and a partial sectional side view showing the structure of a processing apparatus according to an embodiment of the present invention. Note that the transport arm 22 in FIG. 1 is omitted in FIG. 2 for simplicity of illustration.

【0014】この処理装置は、たとえばステンレスから
なる有底角筒状の容器10の底に加熱装置12を配置
し、この加熱装置12の上に容器10の側壁と幾らか隙
間を空けてたとえば石英からなる有底角筒状の処理槽1
4を載置してなる。
In this processing apparatus, a heating device 12 is arranged at the bottom of a square-bottomed cylindrical container 10 made of, for example, stainless steel, and a side wall of the container 10 is provided on the heating device 12 with some gap left therebetween, for example, quartz. Square bottomed processing tank consisting of 1
4 is mounted.

【0015】処理槽14の底には、揮発性を有する所定
の処理液たとえばIPA(イソプロピルアルコール)1
6が所定の液面レベルまで貯留され、処理槽14の壁面
または底面に設けられた処理液導入口および排液口(図
示せず)を介して必要に応じて処理液16の入れ替えま
たは補充が行われるようになっている。このように、処
理槽14の底部が処理液溜部18を形成している。
At the bottom of the processing tank 14, a predetermined volatile processing liquid such as IPA (isopropyl alcohol) 1
6 is stored up to a predetermined liquid level, and the treatment liquid 16 can be replaced or replenished as needed through treatment liquid inlets and drainage ports (not shown) provided on the wall surface or bottom surface of the treatment tank 14. It is supposed to be done. In this way, the bottom of the processing tank 14 forms the processing liquid reservoir 18.

【0016】この処理装置に電源が投入されている間は
常時つまり処理中でも待機中でも処理液溜部18の処理
液16は加熱装置12からの加熱で蒸発し、処理液溜部
18の上方に処理液16の蒸気の雰囲気が形成される。
しかして、処理槽14内のほぼ中間の高さ位置に蒸気処
理部または空間20が設定されており、処理時にはこの
蒸気処理部20に複数枚たとえば50枚の被処理体たと
えば半導体ウエハW1〜W50が搬送アーム22に把持ま
たは担持された状態で置かれるようになっている。
The processing liquid 16 in the processing liquid reservoir 18 evaporates by heating from the heating device 12 at all times while the power is applied to the processing device, that is, during processing or in standby, and the processing liquid 16 is processed above the processing liquid reservoir 18. An atmosphere of vapor of liquid 16 is formed.
Therefore, the vapor processing section or space 20 is set at a substantially intermediate height position in the processing tank 14, and a plurality of, for example, 50 objects to be processed such as semiconductor wafers W1 to W50 are set in the vapor processing section 20 during processing. Are held by the transfer arm 22 while being held or carried.

【0017】処理槽14の底部には、蒸気処理部20の
真下で、かつ処理液16の液面よりは高い位置に、たと
えば石英製の受皿24が設置されている。受皿24の下
面に一体に取付された脚24aは処理槽14の底に付い
ている。図3に示すように、受皿24の上面(水分受
面)は被処理体Wの蒸気処理部20よりも広い面積に選
ばれており、処理中に半導体ウエハW1 〜W50より脱離
・落下した処理液を含む水分は真下の受皿24に受けら
れるようになっている。
A quartz tray 24, for example, is installed at the bottom of the processing tank 14 just below the vapor processing section 20 and at a position higher than the liquid level of the processing liquid 16. The legs 24 a integrally attached to the lower surface of the tray 24 are attached to the bottom of the processing tank 14. As shown in FIG. 3, the upper surface (moisture receiving surface) of the tray 24 is selected to have a larger area than that of the vapor processing section 20 of the object W to be processed, and it is detached / dropped from the semiconductor wafers W1 to W50 during processing. The water containing the processing liquid can be received by the saucer 24 directly below.

【0018】受皿24の底には排液口24bが設けら
れ、この排液口24bに排液管26が接続されている。
排液管26は、処理液溜部18内を通り、処理槽14お
よび装置容器10を貫通して、外部の排液回収部たとえ
ばドレインタンク(図示せず)に通じている。排液管2
6は、少なくとも処理槽14内では石英またはテフロン
製の管で構成されるのが好ましい。また、排液管26を
通す処理槽14および装置容器10の壁穴には適当なシ
ール部材(図示せず)が設けられてよい。
A drain port 24b is provided at the bottom of the tray 24, and a drain pipe 26 is connected to the drain port 24b.
The drainage pipe 26 passes through the treatment liquid reservoir 18, penetrates the treatment tank 14 and the apparatus container 10, and communicates with an external drainage recovery unit such as a drain tank (not shown). Drainage pipe 2
It is preferable that 6 is composed of a tube made of quartz or Teflon at least in the processing tank 14. Further, a suitable sealing member (not shown) may be provided in the wall hole of the processing vessel 14 and the apparatus container 10 through which the drainage pipe 26 is passed.

【0019】本実施例では、装置容器10の外で排液管
26にU字状のトラップ部26aが設けられるととも
に、このトラップ部26aよりも下流側つまりドレイン
タンク側にたとえばエアオペバルブからなる開閉弁30
が設けられている。そして、処理槽14内で該トラップ
部26aの上端よりも高い排液管26の位置(箇所)か
ら斜め上方に分岐する処理液回収用の枝管32が排液管
26に一体形成されており、この枝管32の上端は受皿
排液口24bよりも低い位置にて開口している。後述す
るように、待機時間中に受皿24に凝縮した処理液は枝
管32を通って処理液溜部18へ回収されるようになっ
ている。
In this embodiment, the drain pipe 26 is provided with a U-shaped trap portion 26a outside the apparatus container 10, and an opening / closing valve formed of, for example, an air-operated valve is provided downstream of the trap portion 26a, that is, on the drain tank side. Thirty
Is provided. Further, a branch pipe 32 for recovering the treatment liquid, which branches obliquely upward from a position (location) of the drain pipe 26 higher than the upper end of the trap portion 26a in the treatment tank 14, is integrally formed with the drain pipe 26. The upper end of the branch pipe 32 opens at a position lower than the pan drainage port 24b. As will be described later, the processing liquid condensed in the tray 24 during the standby time is collected in the processing liquid reservoir 18 through the branch pipe 32.

【0020】受皿24の下側には、処理液溜部18を覆
うように無数の通孔を有するたとえばテフロンからなる
保護板34が設置されている。この保護板34の各脚3
4aも処理槽14の底に付いている。誤って半導体ウエ
ハWi が搬送アーム22から脱落しても、この保護板3
4で受け止められ、処理槽12の底には当たらないよう
になっている。
A protective plate 34 made of, for example, Teflon having a large number of through holes is installed below the tray 24 so as to cover the processing liquid reservoir 18. Each leg 3 of this protection plate 34
4a is also attached to the bottom of the processing tank 14. Even if the semiconductor wafer Wi is accidentally dropped from the transfer arm 22, the protective plate 3
4, so that it does not hit the bottom of the processing tank 12.

【0021】処理槽14内の上部にはスパイラル状の冷
却蛇管36が側壁に沿って延在するように設けられてい
る。この冷却蛇管36には冷却媒体たとえば冷却水が循
環供給されており、蒸気処理部20より上昇してきた処
理液の蒸気は冷却蛇管36で冷やされて凝縮(液化)す
ることで、処理槽14の外へ逃げないようになってい
る。
A spiral cooling pipe 36 is provided in the upper part of the processing tank 14 so as to extend along the side wall. A cooling medium, for example, cooling water is circulated and supplied to the cooling spiral pipe 36, and the steam of the processing liquid rising from the steam processing unit 20 is cooled by the cooling spiral pipe 36 and condensed (liquefied), whereby the processing tank 14 is cooled. It doesn't run away.

【0022】冷却蛇管36の下には、蛇管36より落ち
た処理液を受けるためのたとえば石英からなる板樋38
が処理槽14の側壁に沿って回廊状に設けられている。
この板樋38は、その外周縁部を処理槽14の側壁に密
着させて内周縁部に向かうほど板面が高くなるように、
つまり外周縁部側に底を形成するように傾いた姿勢で支
持部材40に固定支持されており、内周縁部38aを起
立させて返し部38aを形成している。また、板樋38
は周回方向において高低差をもって延在しており、最も
低い板樋部分付近の処理槽14の側壁に処理液排出口1
4aが形成されている。
Below the cooling flexible pipe 36, a plate gutter 38 made of, for example, quartz for receiving the processing liquid dropped from the flexible pipe 36.
Are provided in a corridor shape along the side wall of the processing tank 14.
The plate gutter 38 has its outer peripheral edge portion closely contacted with the side wall of the processing tank 14 so that the plate surface becomes higher toward the inner peripheral edge portion.
That is, it is fixedly supported by the support member 40 in an inclined posture so as to form a bottom on the outer peripheral edge portion side, and the inner peripheral edge portion 38a is erected to form the return portion 38a. Also, the board gutter 38
Extend at a height difference in the orbiting direction, and the treatment liquid discharge port 1 is provided on the side wall of the treatment tank 14 near the lowest plate gutter.
4a is formed.

【0023】板樋38の処理液排出口14aは処理液回
収用の排出管42を介して装置容器10の外に配置され
ているフィルタ44の入口に接続され、フィルタ44の
出口は処理液回収用の導入管46を介して処理槽14の
側壁の処理液導入口14bに接続されている。この処理
液導入口14bは、処理液溜部18に貯留される処理液
16の液面よりも高い位置に形成されている。
The processing liquid discharge port 14a of the board gutter 38 is connected to the inlet of a filter 44 arranged outside the apparatus container 10 via a processing liquid collection discharge pipe 42, and the outlet of the filter 44 collects the processing liquid. It is connected to the processing liquid introduction port 14b on the side wall of the processing tank 14 via the introduction pipe 46 for. The processing liquid introduction port 14b is formed at a position higher than the liquid surface of the processing liquid 16 stored in the processing liquid reservoir 18.

【0024】次に、図4〜図6をも参照して本実施例に
おける処理装置の作用を説明する。なお、図4および図
5では図解の簡略化のため保護板34が省かれている。
Next, the operation of the processing apparatus in this embodiment will be described with reference to FIGS. 4 and 5, the protective plate 34 is omitted for simplification of illustration.

【0025】搬送アーム22は、たとえば純水スプレー
による洗浄処理を受けた直後の1ロット分の半導体ウエ
ハW1 〜W50を搬送してきて、図1に示すように処理槽
14内の蒸気処理部20まで下ろし、処理時間中その位
置20で半導体ウエハW1 〜W50を保持する。処理の開
始に先立って、図示しない制御装置により開閉弁30が
開けられる。上記したように、この処理装置に電源が入
っている間は、つまり加熱装置12が作動している間
は、処理槽14の底部の処理液溜部18より処理液16
の蒸気が立ち籠めて槽内とりわけ蒸気処理部20付近は
処理液の蒸気がほぼ飽和状態で充満している。この雰囲
気の中に半導体ウエハWi が被処理体として置かれるこ
とによって、ウエハ表面に付着している水分が処理液の
蒸気で置換され、ウエハ表面から脱離した水分は真下の
受皿24に落ちる。
The transfer arm 22 transfers one lot of semiconductor wafers W1 to W50 immediately after being subjected to a cleaning process with, for example, pure water spray, and reaches the steam processing section 20 in the processing tank 14 as shown in FIG. Lowering and holding the semiconductor wafers W1 to W50 at the position 20 during the processing time. Prior to the start of processing, the opening / closing valve 30 is opened by a control device (not shown). As described above, while the processing apparatus is powered on, that is, while the heating apparatus 12 is operating, the processing solution 16 is supplied from the processing solution reservoir 18 at the bottom of the processing tank 14.
The steam of the treatment liquid is filled up in the tank, particularly in the vicinity of the steam treatment unit 20, with the vapor of the treatment liquid being almost saturated. By placing the semiconductor wafer Wi as the object to be processed in this atmosphere, the water adhering to the wafer surface is replaced by the vapor of the processing liquid, and the water desorbed from the wafer surface falls to the saucer 24 directly below.

【0026】このようにして受皿24に溜った水分は、
図4に示すように、皿底の排液口24bより出て排液管
26を流れ、開閉弁30を通ってドレインタンク側へ送
られる。また、処理中に受皿24付近で処理液の蒸気が
凝縮して生じた処理液は、水分に混じって排液管26を
通って排液される。
The water accumulated in the tray 24 in this way is
As shown in FIG. 4, the liquid flows out of the drain port 24b at the bottom of the dish, flows through the drain pipe 26, and is sent to the drain tank side through the opening / closing valve 30. Further, the treatment liquid generated by the vapor of the treatment liquid condensing in the vicinity of the tray 24 during the treatment is mixed with water and discharged through the drain pipe 26.

【0027】処理が終わると、搬送アーム22は半導体
ウエハW1 〜W50を持ち上げて処理槽14から取り出
す。この際に、ウエハ表面に付着していた洗浄液の蒸気
が拡散分離して、ウエハ表面は乾燥状態になる。もっと
も、被処理体の乾燥を早めるために、処理槽14の上部
開口付近で被処理体に向けてエアまたはN2 ガス等の不
活性ガスを吹き付けるような乾燥機構を設けてもよい。
When the processing is completed, the transfer arm 22 lifts the semiconductor wafers W1 to W50 and takes them out of the processing bath 14. At this time, the vapor of the cleaning liquid adhering to the surface of the wafer is diffused and separated, and the surface of the wafer is dried. However, in order to accelerate the drying of the object to be processed, a drying mechanism may be provided in the vicinity of the upper opening of the processing tank 14 to blow air or an inert gas such as N2 gas toward the object to be processed.

【0028】処理槽14内では、半導体ウエハW1 〜W
50が搬出されると、もはや蒸気処理部20から受皿24
に水分は落ちなくなるが、しばらく受皿24に残ってい
る水分が排液管26を介して排液される。そして、処理
終了時から所定時間が経過した後、つまり受皿24から
水分が完全に排出され、かつ排液管26内の水分が少な
くとも枝管32よりも低い位置まで下がった頃合いに、
制御部によって開閉弁30が閉じられる。なお、開閉弁
30が閉じる前に、排液管26内の水分が枝管32より
も低い位置まで下がったときは、トラップ部26aより
も上流部分に排液が滞留するので、外気の雰囲気はここ
で遮断され、処理槽14内に上がってくることはない。
このようにして、待機時間に入ってから所定時間経過後
に開閉弁30が閉じられる。
In the processing bath 14, semiconductor wafers W1 to W
When 50 is carried out, the steam processing unit 20 no longer receives the saucer 24.
However, the water remaining in the tray 24 for a while is drained through the drain pipe 26. Then, after a lapse of a predetermined time from the end of the processing, that is, at the time when the water is completely discharged from the tray 24 and the water in the drain pipe 26 is lowered to a position lower than at least the branch pipe 32,
The opening / closing valve 30 is closed by the control unit. Before the opening / closing valve 30 is closed, when the water content in the drainage pipe 26 drops to a position lower than that in the branch pipe 32, the drainage liquid stays in the upstream portion of the trap portion 26a, so that the atmosphere of the outside air is It is blocked here and does not rise into the processing tank 14.
In this way, the opening / closing valve 30 is closed after a lapse of a predetermined time after entering the standby time.

【0029】開閉弁30が閉じた後、受皿24に溜る液
は処理液16の蒸気が冷えて凝縮したものであり、水分
を含んでいない処理液16である。図5に示すように、
この受皿24に溜った処理液16は、受皿排液口24a
より排液管26に送られるや否や枝管32に入り、枝管
32の口から液滴16bとして落下し、処理液溜部18
へ回収される。
After the on-off valve 30 is closed, the liquid accumulated in the receiving tray 24 is the liquid of the processing liquid 16 that has cooled and condensed, and is the processing liquid 16 containing no water. As shown in FIG.
The processing liquid 16 accumulated in the saucer 24 is the saucer drainage port 24a.
As soon as it is sent to the drainage pipe 26, it enters the branch pipe 32, drops from the mouth of the branch pipe 32 as droplets 16b, and leaves the treatment liquid reservoir 18
Be recovered to.

【0030】このように、待機時間に入って所定時間
(残留水分除去時間)経過後は、受皿24に凝縮した処
理液16は、排液管26および枝管32を介して処理槽
14内の処理液溜部18に回収される。運転時間に占め
る割合は処理時間よりも待機時間の方がずっと大きいの
で、一日単位あるいは1月単位でみると、かなりの量の
処理液が節減されることになる。
As described above, after a lapse of a predetermined time (residual water removal time) after entering the standby time, the processing liquid 16 condensed in the tray 24 is stored in the processing tank 14 via the drain pipe 26 and the branch pipe 32. It is collected in the processing liquid reservoir 18. Since the ratio of the operating time to the standby time is much larger than the processing time, a considerable amount of the processing liquid can be saved in the unit of day or month.

【0031】一方、処理槽14内の上部では、処理時間
中も待機時間中も本処理装置が運転している間は、処理
液16の蒸気が冷却蛇管36で冷やされて凝縮液化す
る。
On the other hand, in the upper portion of the processing tank 14, the vapor of the processing liquid 16 is cooled by the cooling spiral pipe 36 and condensed and liquefied while the processing apparatus is operating during the processing time and the standby time.

【0032】図6に示すように、冷却蛇管36の各段の
管の表面に凝縮して付いた処理液の滴は、垂直方向に下
段の管の外周面を順次伝って、最下段の管付近で大きな
液滴16aに成長して蛇管から離脱落下する。その離脱
落下の際に、処理液の液滴16aが管の側方へ跳ねるこ
とがある。本実施例では、蛇管36の内側つまり処理槽
中心部側へ跳ねた液滴16aは、板樋38の返し部38
aで捕捉されるようになっており、被処理体Wや受皿2
4等にかかるおそれはない。
As shown in FIG. 6, the droplets of the treatment liquid condensed and attached to the surfaces of the tubes of each stage of the cooling corrugated pipe 36 are vertically propagated sequentially along the outer peripheral surface of the tube of the lower stage, and the tubes of the lowest stage. In the vicinity, it grows into a large liquid droplet 16a and falls off from the flexible pipe. During the detachment and dropping, the droplet 16a of the processing liquid may splash to the side of the tube. In the present embodiment, the liquid droplet 16a splashed to the inside of the flexible tube 36, that is, toward the center of the treatment tank, has the return portion 38 of the board gutter 38.
The object W to be processed and the saucer 2 are to be captured by a.
There is no danger of hitting the 4th grade.

【0033】冷却蛇管36より板樋38に落ちた処理液
は、板樋38を周回方向に低い方へ移動して処理液排出
口14aより排出管42を通ってフィルタ44に送ら
れ、そこで不純物や塵芥等を除去されてから、導入管4
6を通って処理液導入口14bへ導かれ、そこから処理
槽14の壁伝いに処理液溜部18に落ちるようになって
いる。なお、処理液導入管46を処理液導入口14bよ
り内側に突出させ、管46の出口から処理液が処理液溜
部18へ直接落ちるようにしてもよい。
The processing liquid dropped from the cooling spiral pipe 36 to the board gutter 38 moves to a lower position in the orbiting direction of the board gutter 38 and is sent from the processing solution discharge port 14a to the filter 44 through the discharge pipe 42, where impurities are contained. After removing dust and dirt, the introduction pipe 4
It is configured to be guided to the processing liquid introduction port 14b through 6 and fall from there to the processing liquid reservoir 18 along the wall of the processing tank 14. Alternatively, the treatment liquid introducing pipe 46 may be projected inward from the treatment liquid introducing port 14b so that the treatment liquid directly drops from the outlet of the pipe 46 to the treatment liquid reservoir 18.

【0034】このように、本実施例の処理装置では、冷
却蛇管36で凝縮液化した処理液16が、板樋38によ
って安全確実に捕捉されるとともに、処理液回収用の排
出管42および導入管46ならびにフィルタ44によっ
て不純物や塵芥等を除去してから処理液溜部18に回収
されるので、処理槽14において処理液16は劣化しに
くく、そのぶん処理液16の入れ替え回数が少なくな
り、処理液16の消費量が少なくなっている。
As described above, in the processing apparatus of the present embodiment, the processing liquid 16 condensed and liquefied by the cooling flexible pipe 36 is safely and reliably captured by the plate gutter 38, and the discharge pipe 42 and the introduction pipe for collecting the processing liquid are provided. Since the impurities and dust are removed by the filter 46 and the filter 44 and then collected in the treatment liquid reservoir 18, the treatment liquid 16 is less likely to deteriorate in the treatment tank 14, and the number of times the treatment liquid 16 is replaced is reduced accordingly. The consumption of the liquid 16 is low.

【0035】なお、処理槽14の内壁に板樋38(ない
し支持材40)を取付するに当たっては、最初から枠状
に形成された板樋38を正しく位置合わせして設置する
のは寸法精度の点から難しいことが多い。そこで、図7
に示すように、複数たとえば4つの板樋片38A,38
B,38C,38Dに分割形成し、各板樋片38iを別
々に各内壁に取付するようにすると、寸法精度にバラツ
キがあっても、正しい位置合わせで板樋38を設置する
ことができる。
When mounting the plate gutter 38 (or the support member 40) on the inner wall of the processing tank 14, it is necessary to properly align and install the frame-shaped plate gutter 38 from the beginning because of dimensional accuracy. It is often difficult from the point. Therefore, FIG.
, A plurality of, for example, four board gutter pieces 38A, 38
If the board gutter 38 is divided into B, 38C, and 38D, and the board gutter pieces 38i are separately attached to the inner walls, the board gutter 38 can be installed in correct alignment even if the dimensional accuracy varies.

【0036】また、図8および図9に示すように、この
分割式の樋構造を、板樋と処理槽との間に隙間を設けて
その隙間から処理液を落とすような場合にも適用するこ
とが可能である。この構成例において、枠状に構成され
た樋支持部材40は処理槽14の内壁面に所定の間隔を
置いて数箇所たとえば6箇所に溶接で突設された石英製
の樋受座50に担持され、この樋支持部材40の上に4
分割式の板樋38(38A,38B,38C,38D)
がその外周面を処理槽14の内壁面に可及的に(たとえ
ば0〜0.5mm)に接近させて配設される。かかる構
成によれば、蛇管36から板樋38に落ちた処理液は、
板樋38と処理槽14の内壁面との間のわずかな隙間か
ら内壁伝いにスムースに流れ、被処理体や受皿24側へ
跳ねてそれらに付着するようなことはない。
Further, as shown in FIGS. 8 and 9, this split type gutter structure is also applied to the case where a gap is provided between the plate gutter and the treatment tank and the treatment liquid is dropped from the gap. It is possible. In this configuration example, the frame-shaped gutter support member 40 is carried on a quartz gutter receiving seat 50 which is formed by welding at several places, for example, six places at predetermined intervals on the inner wall surface of the processing tank 14. On the gutter support member 40
Split type board gutter 38 (38A, 38B, 38C, 38D)
Is arranged with its outer peripheral surface as close as possible (for example, 0 to 0.5 mm) to the inner wall surface of the processing tank 14. According to this configuration, the treatment liquid that has fallen from the flexible pipe 36 to the board gutter 38 is
It does not flow smoothly from the small gap between the plate gutter 38 and the inner wall surface of the processing tank 14 along the inner wall, and does not bounce toward the object to be processed or the tray 24 and adhere to them.

【0037】上記した実施例では、排液管26において
開閉弁30をトラップ部26aより下流側に設けたが、
トラップ部26aより上流側に設けることも可能であ
り、処理槽14内に設けることも可能である。また、枝
管32の形状・寸法も任意のものが可能であり、必要に
応じて複数の箇所に設けることも可能である。本発明の
処理装置において被処理体から脱離落下した処理液を受
ける器は、上記実施例における受皿24のような形状・
構造に限るわけではなく、任意の形状・構造が可能であ
り、たとえば箱形や椀形のものでもよい。
In the embodiment described above, the opening / closing valve 30 is provided in the drain pipe 26 on the downstream side of the trap portion 26a.
It may be provided upstream of the trap portion 26a, or may be provided inside the processing tank 14. Further, the branch pipe 32 may have any shape and size, and may be provided at a plurality of locations as required. In the processing apparatus of the present invention, the container for receiving the processing liquid detached and dropped from the object to be processed has a shape similar to the tray 24 in the above embodiment.
The shape is not limited to the above, and any shape and structure are possible, for example, a box shape or a bowl shape may be used.

【0038】樋手段も、上記実施例の板樋38に限ら
ず、任意の形状・構造が可能であり、たとえば断面が湾
曲したものでもよい。また、周回方向における傾斜を連
続的にして処理液をより迅速・円滑に排出口14a側へ
送るようにしてもよく、排出口14aの個数または処理
液回収用の管42,46の本数を複数にすることも可能
である。また、必要に応じて、処理液回収用の管42,
46にポンプを取り付けてもよく、フィルタ44を省く
ことも可能である。また、冷却体も蛇管構造に限るもの
ではなく、たとえばパネル構造のものでも可能である。
The gutter means is not limited to the plate gutter 38 of the above-described embodiment, but may have any shape and structure, and may have a curved cross section, for example. Further, the treatment liquid may be sent to the discharge port 14a side more rapidly and smoothly by continuously sloping in the circulation direction, and the number of the discharge port 14a or the number of the treatment liquid recovery pipes 42, 46 may be plural. It is also possible to In addition, if necessary, a pipe 42 for collecting the processing liquid,
A pump may be attached to 46, and the filter 44 may be omitted. Further, the cooling body is not limited to the flexible tube structure, and may be a panel structure, for example.

【0039】図10は、上記した実施例による搬送アー
ム洗浄装置の適用可能な半導体ウエハ洗浄システムの一
構成例を示す。
FIG. 10 shows an example of the configuration of a semiconductor wafer cleaning system to which the transfer arm cleaning device according to the above-described embodiment can be applied.

【0040】この洗浄システムは、インプットバッファ
機構70と洗浄装置本体72とアウトプットバッファ機
構73とで構成されている。洗浄装置本体72の両端部
にはローダ部(ウエハ搬入部)74およびアンローダ部
(ウエハ搬出部)76がそれぞれ設けられ、中間部には
一列に複数台たとえば9台の処理部78a〜78iが配
置されている。
This cleaning system comprises an input buffer mechanism 70, a cleaning device main body 72, and an output buffer mechanism 73. A loader section (wafer carry-in section) 74 and an unloader section (wafer carry-out section) 76 are provided at both ends of the cleaning apparatus main body 72, and a plurality of, for example, nine processing sections 78a to 78i are arranged in a line in the middle section. Has been done.

【0041】たとえば、第1の処理部78aは搬送アー
ム洗浄・乾燥部、第2の処理部78bはウエハ薬液洗浄
部、第3および第4の処理部78c,78dはそれぞれ
ウエハ水洗部、第5の処理部78eはウエハ薬液洗浄
部、第6および第7の処理部78f,78gはウエハ水
洗部、第8の処理部78hは搬送アーム洗浄・乾燥部、
第9の処理部78iはウエハ乾燥部である。上記した実
施例による処理装置は、第9の処理部78i(ウエハ乾
燥部)に設置されてよい。
For example, the first processing unit 78a is a transfer arm cleaning / drying unit, the second processing unit 78b is a wafer chemical cleaning unit, the third and fourth processing units 78c and 78d are wafer cleaning units and the fifth cleaning unit, respectively. Processing unit 78e is a wafer chemical cleaning unit, sixth and seventh processing units 78f and 78g are wafer cleaning units, an eighth processing unit 78h is a transfer arm cleaning / drying unit,
The ninth processing unit 78i is a wafer drying unit. The processing apparatus according to the above-described embodiments may be installed in the ninth processing unit 78i (wafer drying unit).

【0042】これらの処理部78a〜78iの手前に
は、ウエハチャック106,106,106をそれぞれ
備えた複数台たとえば3台の搬送ロボット102,10
2,102が矢印Y方向に移動可能に配置されている。
各々の搬送ロボット102はY方向において移動または
搬送範囲を制限され、それぞれ割り当てられた処理部7
8にのみアクセスするようになっている。
In front of these processing units 78a to 78i, a plurality of, for example, three transfer robots 102, 10 each equipped with a wafer chuck 106, 106, 106 are provided.
2, 102 are arranged so as to be movable in the arrow Y direction.
Each of the transfer robots 102 is restricted in movement or transfer range in the Y direction, and assigned to each processing unit 7.
Only 8 can be accessed.

【0043】インプットバッファ機構70およびアウト
プットバッファ機構73には、ウエハキャリアCを搬送
するためのキャリア搬送アーム86、ウエハキャリアC
を一時的に保管するためのキャリア収納部88、システ
ム外部とウエハキャリアCの受け渡しを行うためのキャ
リア載置台90、空のウエハキャリアCを上昇または下
降させるためのキャリア昇降機92等が設けられてい
る。洗浄装置本体72においては、ローダ部74の上部
から搬送装置82a〜82cの上方を通ってアンローダ
部76に至るキャリア搬送機構94が設けられている。
The input buffer mechanism 70 and the output buffer mechanism 73 include a carrier transfer arm 86 for transferring the wafer carrier C and a wafer carrier C.
A carrier accommodating portion 88 for temporarily storing the wafer carrier, a carrier mounting table 90 for transferring the wafer carrier C to the outside of the system, a carrier elevator 92 for raising or lowering an empty wafer carrier C, and the like are provided. There is. The cleaning apparatus main body 72 is provided with a carrier transfer mechanism 94 that extends from the upper portion of the loader section 74 to above the transfer apparatuses 82a to 82c and reaches the unloader section 76.

【0044】インプットバッファ機構70で空になった
ウエハキャリアCは、キャリア昇降機92によってキャ
リア搬送機構94に渡され、アウトプットバッファ機構
73まで搬送される。その搬送の途中で、ウエハキャリ
アCは、シャワー装置等の洗浄装置で洗浄され、洗浄後
に乾燥エアー吹付機等の乾燥装置によって乾かされるよ
うになっている。したがって、アウトプットバッファ機
構73においては、洗浄・乾燥された清浄なウエハキャ
リアCに洗浄処理済のウエハが移載収容されるようにな
っている。
The wafer carrier C emptied by the input buffer mechanism 70 is transferred to the carrier transfer mechanism 94 by the carrier lifter 92 and transferred to the output buffer mechanism 73. During the transfer, the wafer carrier C is cleaned by a cleaning device such as a shower device, and after cleaning, it is dried by a drying device such as a dry air sprayer. Therefore, in the output buffer mechanism 73, the cleaned wafers are transferred and stored in the cleaned and dried clean wafer carrier C.

【0045】上記した実施例における被処理体は半導体
ウエハであったが、本発明は他の被処理体たとえばLC
D基板やガラス基板等を乾燥させる処理装置にも適用可
能である。
Although the object to be processed in the above-mentioned embodiment is a semiconductor wafer, the present invention is not limited to the object to be processed, such as LC.
It is also applicable to a processing device for drying a D substrate, a glass substrate, or the like.

【0046】[0046]

【発明の効果】以上説明したように、本発明の第1の処
理装置によれば、排液管に開閉弁と枝管を設けることに
より、処理液の蒸気によって被処理体から脱離した水分
を受けるための器に該処理液の蒸気が凝縮して溜った処
理液を待機時間中は無駄に排液することなく処理槽内の
処理液溜部に効率的に回収して処理液消費量の節約化を
はかることができる。
As described above, according to the first treatment apparatus of the present invention, by providing the drain pipe with the opening / closing valve and the branch pipe, the moisture desorbed from the object to be treated by the vapor of the treatment liquid is provided. The processing liquid that has accumulated due to the condensation of the processing liquid vapor in the receiving vessel is efficiently collected in the processing liquid reservoir inside the processing tank during the waiting time without being wastefully discharged, and the processing liquid consumption amount is increased. Can be saved.

【0047】また、本発明の第2の処理装置によれば、
冷却体の冷却によって蒸気から凝縮液化した処理液を樋
手段から処理液回収用の管によりフィルタ手段を経路さ
せて処理槽内の処理液溜部に回収するようにしたので、
処理液の劣化を抑えひいては処理液消費量の節約化をは
かることができる。
According to the second processing apparatus of the present invention,
Since the processing liquid condensed and liquefied from the vapor by cooling the cooling body is routed through the filter means by the processing liquid recovery pipe from the gutter means, the processing liquid is collected in the processing liquid reservoir in the processing tank.
It is possible to suppress the deterioration of the processing liquid and thus save the consumption of the processing liquid.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による処理装置の全体構成を
示す一部断面正面図である。
FIG. 1 is a partial sectional front view showing the overall configuration of a processing apparatus according to an embodiment of the present invention.

【図2】実施例における処理装置の全体構成を示す一部
断面側面図である。
FIG. 2 is a partial cross-sectional side view showing the overall configuration of the processing apparatus in the embodiment.

【図3】実施例の処理装置において水分脱離位置に対す
る受皿の面積を示す略平面図である。
FIG. 3 is a schematic plan view showing the area of the tray with respect to the water desorption position in the processing apparatus of the embodiment.

【図4】実施例の処理装置において処理時間中の作用を
説明するための略部分斜視図である。
FIG. 4 is a schematic partial perspective view for explaining the action during the processing time in the processing apparatus of the embodiment.

【図5】実施例の処理装置において待機時間中の作用を
説明するための略部分斜視図である。
FIG. 5 is a schematic partial perspective view for explaining the operation during the standby time in the processing apparatus of the embodiment.

【図6】実施例の処理装置において冷却蛇管から落ちた
処理液が板樋の返し部によって受けられる様子を示す略
断面図である。
FIG. 6 is a schematic cross-sectional view showing how the processing liquid dropped from the cooling flexible pipe is received by the return portion of the board gutter in the processing apparatus of the embodiment.

【図7】実施例の処理装置において分割式の板樋構造を
示す略平面図である。
FIG. 7 is a schematic plan view showing a split type gutter structure in the processing apparatus of the embodiment.

【図8】冷却体からの処理液を樋手段と処理槽との間の
隙間より落として回収する方式に実施例の分割式板樋構
造を適用した構成例を示す略斜視図である。
FIG. 8 is a schematic perspective view showing a configuration example in which the split type plate gutter structure of the embodiment is applied to a method of collecting the processing liquid from the cooling body by dropping it from the gap between the gutter means and the processing tank.

【図9】図8の分割式板樋構造の作用を示す略側面図で
ある。
9 is a schematic side view showing the operation of the split type gutter structure of FIG. 8. FIG.

【図10】本発明における処理装置が使用される半導体
ウエハ洗浄システムの構成例を示す図である。
FIG. 10 is a diagram showing a configuration example of a semiconductor wafer cleaning system in which the processing apparatus according to the present invention is used.

【符号の説明】[Explanation of symbols]

12 加熱装置 14 処理槽 16 処理液 18 処理液溜部 20 蒸気処理部 24 受皿 26 排液管 30 開閉弁 32 枝管 36 冷却蛇管 38 板樋 42 処理液回収用排出管 44 フィルタ 46 処理液回収用導入管 12 heating device 14 treatment tank 16 treatment liquid 18 treatment liquid reservoir 20 steam treatment unit 24 saucer 26 drainage pipe 30 opening / closing valve 32 branch pipe 36 cooling fluted pipe 38 plate gutter 42 discharge pipe for treatment liquid 44 filter 46 for treatment liquid recovery Introductory pipe

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 被処理体を収容可能に構成され、処理槽
の中に収容された揮発性処理液を加熱して発生させた蒸
気の雰囲気中で前記被処理体の表面から落下した揮発性
処理液を含む水分を、前記処理槽内に設置した所定の器
に集め、前記器より排液管を介して排液するようにした
処理装置において、 前記排液管の途中に開閉弁を設けるとともに、処理液溜
部へ処理液を戻すために前記開閉弁よりも前記器側に近
い所定の位置で前記排液管より分岐し、かつ先端の開口
している管を設けたことを特徴とする処理装置。
1. A volatile substance which is configured to be capable of accommodating an object to be treated and which has fallen from the surface of the object to be treated in an atmosphere of steam generated by heating a volatile treatment liquid accommodated in a treatment tank. In a processing device in which water containing a treatment liquid is collected in a predetermined container installed in the treatment tank and drained from the container through a drain pipe, an opening / closing valve is provided in the middle of the drain pipe. At the same time, in order to return the treatment liquid to the treatment liquid reservoir, a pipe is provided which branches from the drain pipe at a predetermined position closer to the container side than the on-off valve and has an open tip. Processing equipment.
【請求項2】 処理槽の中で被処理体表面の水分脱離処
理に用いられる所定の揮発性処理液の蒸気を冷却して凝
縮させるために蒸気処理部よりも上方の位置にて前記処
理槽の側壁に沿って延在する冷却体と、 前記冷却体より下方の位置にて前記冷却体より落下した
前記処理液の液滴を受ける樋手段と、 前記処理液を濾過するためのフィルタ手段と、 前記樋手段で集められた前記処理液を前記フィルタ手段
へ送り、前記フィルタ手段で濾過された前記処理液を前
記処理槽内の処理液溜部に戻す処理液回収用の管と、を
具備したことを特徴とする処理装置。
2. The above treatment at a position higher than the vapor treatment section in order to cool and condense the vapor of a predetermined volatile treatment liquid used for moisture desorption treatment of the surface of the object to be treated in the treatment tank. A cooling body extending along a side wall of the tank, a gutter means for receiving a droplet of the processing liquid dropped from the cooling body at a position lower than the cooling body, and a filter means for filtering the processing liquid. And a pipe for collecting a treatment liquid that sends the treatment liquid collected by the gutter means to the filter means, and returns the treatment liquid filtered by the filter means to the treatment liquid reservoir in the treatment tank, A processing device characterized by being provided.
JP04039694A 1993-10-29 1994-02-15 Processing equipment Expired - Fee Related JP3273282B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP04039694A JP3273282B2 (en) 1994-02-15 1994-02-15 Processing equipment
US08/330,793 US5575079A (en) 1993-10-29 1994-10-28 Substrate drying apparatus and substrate drying method
KR1019940028107A KR100338534B1 (en) 1993-10-29 1994-10-29 Substrate Drying Equipment and Substrate Drying Method
TW083110221A TW294823B (en) 1993-10-29 1994-11-04
US08/697,132 US5671544A (en) 1993-10-29 1996-08-20 Substrate drying apparatus and substrate drying method
KR1020010051301A KR100357316B1 (en) 1993-10-29 2001-08-24 Substrate drying apparatus and substrate drying method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04039694A JP3273282B2 (en) 1994-02-15 1994-02-15 Processing equipment

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP02918899A Division JP3424119B2 (en) 1999-02-05 1999-02-05 Processing equipment

Publications (2)

Publication Number Publication Date
JPH07222902A true JPH07222902A (en) 1995-08-22
JP3273282B2 JP3273282B2 (en) 2002-04-08

Family

ID=12579514

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04039694A Expired - Fee Related JP3273282B2 (en) 1993-10-29 1994-02-15 Processing equipment

Country Status (1)

Country Link
JP (1) JP3273282B2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201A (en) * 1981-06-24 1983-01-05 島田理化工業株式会社 Drying tank for vapor of "flon(r)"
JPH04171026A (en) * 1990-11-02 1992-06-18 Daicel Chem Ind Ltd Organic solvent reproducing apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201A (en) * 1981-06-24 1983-01-05 島田理化工業株式会社 Drying tank for vapor of "flon(r)"
JPH04171026A (en) * 1990-11-02 1992-06-18 Daicel Chem Ind Ltd Organic solvent reproducing apparatus

Also Published As

Publication number Publication date
JP3273282B2 (en) 2002-04-08

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