JPH0724264B2 - Semiconductor substrate washing equipment - Google Patents

Semiconductor substrate washing equipment

Info

Publication number
JPH0724264B2
JPH0724264B2 JP63070551A JP7055188A JPH0724264B2 JP H0724264 B2 JPH0724264 B2 JP H0724264B2 JP 63070551 A JP63070551 A JP 63070551A JP 7055188 A JP7055188 A JP 7055188A JP H0724264 B2 JPH0724264 B2 JP H0724264B2
Authority
JP
Japan
Prior art keywords
water
tank
inner tank
pure water
semiconductor substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63070551A
Other languages
Japanese (ja)
Other versions
JPH01241824A (en
Inventor
祐史 瀬尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63070551A priority Critical patent/JPH0724264B2/en
Publication of JPH01241824A publication Critical patent/JPH01241824A/en
Publication of JPH0724264B2 publication Critical patent/JPH0724264B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体製造工程において半導体基板の水洗を行
う装置に関する。
The present invention relates to an apparatus for washing a semiconductor substrate with water in a semiconductor manufacturing process.

〔従来の技術〕[Conventional technology]

従来、この種の半導体基板(以後、ウエハと称する)の
水洗は、超純水製造装置から供給される超純水(以後純
水と称する)を直接用いて行っている。
Conventionally, this kind of semiconductor substrate (hereinafter, referred to as a wafer) is washed with water by directly using ultrapure water (hereinafter referred to as pure water) supplied from an ultrapure water production apparatus.

第2図は、従来一般的に使われている装置の一配管図で
ある。第2図に於いて、純水供給用バルブ10を開けるこ
とにより、純水供給用バルブ10と流量計11で設定された
流量の純水が、内槽12の槽底部から給水され、その結果
内槽12は純水により満たされ、内槽12の上縁部より外槽
13内にあふれ出し、オーバーフロー配管14から排水され
る。従来、この状態に於いて、ウエハ15を内槽12に投入
し、その直後純水供給用バルブ10を閉じると同時に急速
排水弁16を開け、数秒で排水完了させる。その後、純水
供給用バルブ10を開けると同時に急速排水弁16を閉じ、
内槽12が満水となる。その給排水のサイクルを繰り返す
ことにより水洗を行うものであった。
FIG. 2 is a piping diagram of a device generally used conventionally. In FIG. 2, by opening the pure water supply valve 10, pure water of the flow rate set by the pure water supply valve 10 and the flow meter 11 is supplied from the bottom of the inner tank 12, and as a result, The inner tank 12 is filled with pure water, and the outer tank is
It overflows into 13 and is drained from the overflow pipe 14. Conventionally, in this state, the wafer 15 is put into the inner tank 12, immediately after which the pure water supply valve 10 is closed and at the same time the rapid drainage valve 16 is opened to complete drainage in a few seconds. Then, open the pure water supply valve 10 and at the same time close the quick drain valve 16,
The inner tank 12 becomes full. Rinsing was performed by repeating the water supply and drainage cycle.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

水洗効果は、主にウエハの面上を通過する純水の流速と
量、その比抵抗値等に依存するものであるが、前述した
従来の半導体基板水洗装置は、給水時間が半導体製造工
場から供給される純水の圧力及び流量に依存するため、
半導体製造工場の純水精製能力により限定される。従っ
て、純水精製能力不足のとき、排水完了後から満水に至
るまでの時間が長くなるため、ウエハ上の残液によるウ
エハのエッチングやゴミの付着等が生じる欠点がある。
The water washing effect mainly depends on the flow velocity and amount of pure water passing on the surface of the wafer, its specific resistance value, etc. Since it depends on the pressure and flow rate of pure water supplied,
Limited by the pure water purification capacity of semiconductor manufacturing plants. Therefore, when the pure water purification capacity is insufficient, it takes a long time from the completion of drainage until the water is full, so that there is a disadvantage that etching of the wafer and adhesion of dusts are caused by the residual liquid on the wafer.

本発明の目的は、前記欠点が解決され、半導体製造工場
の純水精製能力に限定されずに貯水槽から落差により、
瞬時に処理槽への給水を完了させることが出来、更に通
常の処理槽への給水も貯水槽を経由して行うようにした
半導体基板水洗装置を提供することにある。
The object of the present invention is to solve the above-mentioned drawbacks, and not only by the pure water purification capacity of a semiconductor manufacturing plant, but by a drop from a water storage tank,
It is an object of the present invention to provide a semiconductor substrate rinsing apparatus capable of instantaneously completing water supply to a processing tank and further supplying water to a normal processing tank via a water storage tank.

〔課題を解決するための手段〕[Means for Solving the Problems]

本発明の構成は、半導体ウェハが純水で洗浄される洗浄
層と、前記洗浄層内に供給する前記純水を貯えた貯水槽
とを備えた半導体基板水洗装置において、前記洗浄層は
処理される前記半導体ウェハが入る内槽とこの内槽であ
ふれた前記純水が流れ込む外槽とを有し、前記貯水槽
は、前記内槽に給水するのに必要な落差がある位置にあ
り、かつ前記内槽の容量と少なくとも同等量の純水を貯
える層を有し、前記貯水槽から前記落差により前記内槽
内に給水する配管と、この配管に設けた給水弁と、前記
貯水槽に前記内槽量以上の純水を蓄えた時の波面に入水
口が位置し、かつ前記内槽に給水するオーバーフロー配
管と、前記内槽内の純水を排水する排水弁とを備えたこ
とを特徴とする。
According to the configuration of the present invention, in a semiconductor substrate rinsing apparatus including a cleaning layer for cleaning a semiconductor wafer with pure water and a water tank for storing the pure water supplied into the cleaning layer, the cleaning layer is treated. An inner tank containing the semiconductor wafer and an outer tank into which the pure water overflowing in the inner tank flows, and the water storage tank is at a position where there is a drop necessary for supplying water to the inner tank, and A pipe having a layer that stores at least an amount of pure water equal to the capacity of the inner tank, and a pipe for supplying water into the inner tank from the water reservoir by the drop, a water supply valve provided in the pipe, and the water tank An inlet port is located on the wave surface when storing more than the amount of pure water in the inner tank, and an overflow pipe for supplying water to the inner tank and a drain valve for draining the pure water in the inner tank are provided. And

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be described with reference to the drawings.

第1図は本発明の一実施例の半導体基板水洗装置の配管
図である。同図において、本実施例は、給水供給用バル
ブ1が工場内の超純水製造装置から純水を貯水槽2に給
水する上で、流量計3がその流量をモニターするため必
要である。貯水槽2と急速給水弁4と給水配管5とは、
貯水槽2内の純水を数秒で内槽6に給水できるものであ
り、オーバーフロー配管7は、貯水槽2からあふれ出し
た純水を内槽6に給水するためのものである。急速排水
弁8は、内槽6の純水を数秒で排水するためのものであ
る。外槽9は、内槽6内からあふれ出した純水を回収
し、排水するためのものである。
FIG. 1 is a piping diagram of a semiconductor substrate washing apparatus according to an embodiment of the present invention. In the figure, this embodiment is necessary because the flow meter 3 monitors the flow rate when the feed water supply valve 1 feeds pure water from the ultrapure water producing apparatus in the factory to the water storage tank 2. The water tank 2, the quick water supply valve 4, and the water supply pipe 5 are
The pure water in the water storage tank 2 can be supplied to the inner tank 6 in a few seconds, and the overflow pipe 7 is used to supply the pure water overflowing from the water storage tank 2 to the inner tank 6. The quick drain valve 8 is for draining the pure water in the inner tank 6 in a few seconds. The outer tank 9 is for collecting and draining the pure water overflowing from the inner tank 6.

この半導体基板水洗装置に於いて、貯水槽2に常時給水
することにより、貯水槽2からオーバーフローした純水
がオーバーフロー配管7を通り内槽6に給水され、内槽
6が満水となり、あふれ出した純水が外槽9に流れ込
み、排水されている状態で、急速排水弁8を開にし、数
秒で内槽6の純水が排水完了されると同時に、急速排水
弁8を閉、急速給水弁4を開にすることにより、数秒で
内槽6に給水完了させ、この状態を水洗が終了するまで
保持する。水洗終了後、急速給水弁4を閉じ、初期状態
になるようにコントロールする。
In this semiconductor substrate rinsing apparatus, by constantly supplying water to the water storage tank 2, pure water overflowing from the water storage tank 2 is supplied to the inner tank 6 through the overflow pipe 7, and the inner tank 6 becomes full and overflows. With the pure water flowing into the outer tank 9 and being drained, the quick drain valve 8 is opened, and the pure water in the inner tank 6 is completely drained in a few seconds, and at the same time, the quick drain valve 8 is closed and the quick water supply valve is opened. By opening 4, the water supply to the inner tank 6 is completed in a few seconds, and this state is maintained until the water washing is completed. After the completion of washing with water, the quick water supply valve 4 is closed and the initial state is controlled.

〔発明の効果〕〔The invention's effect〕

以上説明したように、本発明は、槽にウエハ投入後、瞬
時に排水,給水を行うことにより、ウエハを大気にさら
す時間を最小限にとどめ、純水製造装置の純水供給能力
不足による悪影響を最小限に抑えることができる効果が
あり、ある程度汚れた純水をすべて排水した後に清浄な
純水を入れることができるから、内槽内の純水を高純度
に保つことができる効果もある。
As described above, according to the present invention, the time of exposing a wafer to the atmosphere is minimized by performing the drainage and the water supply immediately after the wafer is put into the tank, and the deionized water supply capacity of the deionized water producing apparatus is insufficient. Has the effect of minimizing the amount of water, and since pure water can be added after draining all pure water that has been contaminated to some extent, there is also the effect that the pure water in the inner tank can be kept at a high purity. .

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例の半導体基板水洗装置の配管
図、第2図は従来の半導体基板水洗装置の配管図であ
る。 1,10……純水供給用バルブ、2……貯水槽、3,11……流
量計、4……急速給水弁、5……給水配管、6,12……内
槽、7,14……オーバーフロー配管、8,16……急速排水
弁、9,13……外槽、15……半導体ウエハ。
FIG. 1 is a piping diagram of a semiconductor substrate washing apparatus according to an embodiment of the present invention, and FIG. 2 is a piping diagram of a conventional semiconductor substrate washing apparatus. 1,10 …… Pure water supply valve, 2 …… Water tank, 3,11 …… Flowmeter, 4 …… Rapid water supply valve, 5 …… Water supply pipe, 6,12 …… Inner tank, 7,14… … Overflow piping, 8,16 …… quick drain valve, 9,13 …… outer tank, 15 …… semiconductor wafer.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】半導体ウェハが純水で洗浄される洗浄槽
と、前記洗浄槽内に供給する前記純水を貯えた貯水槽と
を備えた半導体基板水洗装置において、前記洗浄槽は、
処理される前記半導体ウェハが入る内槽とこの内槽であ
ふれた前記純水が流れ込む外槽とを有し、前記貯水槽
は、前記内槽に給水するのに必要な落差がある位置にあ
り、かつ前記内槽の容量と少なくとも同等量の純水を貯
える槽を有し、前記貯水槽から前記落差により前記内槽
内に給水する配管と、この配管に設けた給水弁と、前記
貯水槽に前記内槽量以上の純水を蓄えた時の液面に入水
口が位置し、かつ前記内槽に給水するオーバーフロー配
管と、前記内槽内の純水を排水する排水弁とを備えたこ
とを特徴とする半導体基板水洗装置。
1. A semiconductor substrate rinsing apparatus comprising: a cleaning tank for cleaning a semiconductor wafer with pure water; and a water tank for storing the pure water supplied into the cleaning tank.
It has an inner tank into which the semiconductor wafer to be processed and an outer tank into which the pure water overflowed in the inner tank flows, and the water storage tank is at a position where there is a drop necessary for supplying water to the inner tank. And a pipe for storing pure water in an amount at least equivalent to the capacity of the inner tank, and a pipe for supplying water from the water reservoir into the inner tank by the drop, a water supply valve provided in the pipe, and the water reservoir An inlet pipe is located on the liquid surface when storing more than the amount of pure water in the inner tank, and an overflow pipe for supplying water to the inner tank and a drain valve for draining the pure water in the inner tank are provided. A semiconductor substrate washing apparatus characterized by the above.
JP63070551A 1988-03-23 1988-03-23 Semiconductor substrate washing equipment Expired - Fee Related JPH0724264B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63070551A JPH0724264B2 (en) 1988-03-23 1988-03-23 Semiconductor substrate washing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63070551A JPH0724264B2 (en) 1988-03-23 1988-03-23 Semiconductor substrate washing equipment

Publications (2)

Publication Number Publication Date
JPH01241824A JPH01241824A (en) 1989-09-26
JPH0724264B2 true JPH0724264B2 (en) 1995-03-15

Family

ID=13434769

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63070551A Expired - Fee Related JPH0724264B2 (en) 1988-03-23 1988-03-23 Semiconductor substrate washing equipment

Country Status (1)

Country Link
JP (1) JPH0724264B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2600476B2 (en) * 1990-10-26 1997-04-16 富士通株式会社 Pure water production apparatus and semiconductor substrate pure water treatment method
JP3146841B2 (en) * 1994-03-28 2001-03-19 信越半導体株式会社 Wafer rinse equipment

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60253428A (en) * 1984-05-30 1985-12-14 住友電気工業株式会社 Fiberscope with bending mechanism
JPS61196702U (en) * 1985-05-31 1986-12-08
JPH0340241Y2 (en) * 1987-04-27 1991-08-23

Also Published As

Publication number Publication date
JPH01241824A (en) 1989-09-26

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