JPH07307795A - Subscriber line test connection method - Google Patents

Abstract

(57) [Abstract] [Purpose] A subscriber line test connection method capable of downsizing the test section and switches of an analog telephone subscriber circuit (SLIC) having a BORSCHT function and performing all necessary maintenance test connections. provide. [Configuration] In addition to the channel (Bch) used for communication and the channel (Cch) used for control in the normal service, both the same speed as Bch is used for maintenance test in the switch interface between the switch of the exchange and the SLIC. A bidirectional channel (TCch) having the same speed as the directional channel (TBch) and Cch is provided, and these are connected according to the test content.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a maintenance test of a subscriber line in a subscriber line exchange that accommodates analog telephone terminals.

[0002]

2. Description of the Related Art Conventionally, when carrying out a maintenance test of a subscriber line accommodating an analog telephone terminal, a maintenance test connection configuration as shown in FIGS. First, items common to FIGS. 7 to 10 will be described. For access to the subscriber line for performing the maintenance test, the subscriber lead-in switch (hereinafter referred to as LT switch) of the SLIC is turned on and the subscriber line is connected to the subscriber line lead-in line (hereinafter referred to as LT line). It is done by LT line has multiple SLIC
It is controlled so that only the LT switch of the SLIC which is multi-connected to and which houses the subscriber line to be subjected to the maintenance test is turned on. When accommodating a large number of SLICs, the number of LT lines that can be connected to each other is limited. Therefore, a plurality of LT lines are used to pull in the subscriber line test unit and a switch (test switch) inside the subscriber line test unit Select an arbitrary LT line and connect it to the test circuit. In this way, only one subscriber line of interest is connected to the test circuit. next,
Each connection form will be described.

FIG. 7 shows a bidirectional monitor connection.
When the subscriber is calling, disconnecting, dialing or in a call,
Monitor the subscriber line using the LT line. The test circuit has the function of monitoring with high input impedance, and the maintenance tester monitors the call origination, disconnection, dial signal and call quality.

FIG. 8 shows a bidirectional folded connection. The subscriber's telephone is either unconnected or on-hook. The test circuit is connected to the SLIC via the LT line, and from the SLIC to the various trunks via the switch. The test circuit has the function of simulating a telephone terminal and performs a series of operation tests (transmission test) from the call to the call to the disconnection of the exchange.

FIG. 9 shows an interrupt connection. When the subscriber is in a call, the test circuit is connected via the LT line. The test circuit has a bidirectional voice signal coupling function and is capable of three-way communication including maintenance testers. The maintenance tester can obtain more detailed information about the call status by interacting with the subscriber.

FIG. 10 shows the retractable connection. The subscriber line is pulled into the subscriber line test unit via the LT line. The test circuit allows a call between the subscriber and the maintenance tester,
It sends out call signals, tests dial signals, and sends out howler signals.

In the maintenance test connection of the subscriber line as described above, since the access is performed via the LT line, the subscriber line test section has a switch, a pseudo terminal function, and an SL.
There is a problem that it is difficult to downsize the subscriber line test unit because IC functions and the like are required and these functions need to be configured using high voltage analog circuit technology.

Next, a second conventional example will be described with reference to FIGS.
5 shows. First, items common to FIGS. 11 to 15 will be described. The subscriber line test unit is installed after the switch for telephone calls. That is, access to the subscriber's line is made by a digital signal, and line selection is made by using a call switch. For this reason, the subscriber line test unit is shown in FIG.
The test switch shown in 0 is not required. Next, each connection form will be described.

FIG. 11 shows a one-way monitor connection. When the subscriber is in a calling, disconnecting or dialing state, these signals are monitored by multi-connecting the Cch upstream information or the Bch upstream information to the subscriber line test unit by a switch.

FIG. 12 shows a bidirectional monitor connection. When the subscriber is in a call state, the switch multi-connects Bch upstream information and information coming from the other party (that is, Bch downstream information) to the subscriber line test unit. In the subscriber line test section, bidirectional information is mixed by a mixing circuit. The maintenance tester monitors the call quality.

FIG. 13 shows a one-way folded connection. The subscriber's telephone is either unconnected or on-hook. For example, Bch is SL
It is possible to connect the uplink information and the downlink information by looping back on the analog side of the codec in the IC, and connect to the subscriber line test section by a switch. Similarly, Cch can be turned back by providing a turnback function in the SLIC, but in any case, since it is unidirectional, a call origination test including a telephone call cannot be performed.

FIG. 14 shows an interrupt connection. When the subscriber is in a call state, the call channel on the switch interface connected to Bch and the call partner is pulled into the subscriber line test section by the switch. here,
The three parties including the call channel of the maintenance tester are mixed in the mixing circuit to establish a three-way call connection. The maintenance tester can interact with the subscriber and can obtain more detailed information about the call status.

FIG. 15 shows the retractable connection. B
The ch and Cch are pulled into the subscriber test section by the switch. The test circuit is used to make a call between the subscriber and the maintenance tester, control the sending of a calling signal, test the dial signal, send a howler signal, and so on.

In the second conventional example of the maintenance test connection of the subscriber line as described above, the switch is required to have a multi-connection function because the subscriber line is accessed by using the switch in the digital section. At the same time, a digital call information mixing circuit is required in the subscriber line test section.
In addition, there is a problem that a transmission test cannot be performed because bidirectional loopback connection cannot be performed.

[0015]

As described above in the conventional embodiment, in the first example, since the subscriber line maintenance test access is performed by the analog individual line, the subscriber line test section is used. There is a problem that it is difficult to downsize. Second
In the above example, the maintenance test access is performed digitally, and the subscriber line test unit can be miniaturized. However, a new mixed line function is required for the subscriber line test unit and multiple connections are required for the switch, and bidirectional loopback connection is also possible. However, there is a problem that the outgoing connection test cannot be performed because it cannot be realized.

An object of the present invention is to provide a subscriber line test connection method capable of downsizing the hardware of a subscriber line test unit and a switch and capable of performing all the maintenance test connections shown in the first example. Is.

[0017]

SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention provides a subscriber line exchange containing an analog telephone subscriber circuit (SLIC) having a BORSCHT function, in which the switch and the SLIC of the exchange are provided. For the switch interface between the two, a channel (Bch) used for communication and a channel (Cc) used for control in the normal service.
In addition to h), a bidirectional channel (TBch) having the same speed as Bch and a bidirectional channel (TCch) having the same speed as Cch are provided for maintenance test, and these are connected according to the test content.

In the first example, in the SLIC internal circuit, the upstream information of Bch is multi-connected to the upstream side of TBch, or the upstream information of Cch is TCch.
Multi-connection (that is, one-way monitor connection) on the upstream side of.

In the second example, in the SLIC internal circuit, the upstream side of Bch and the Bc input to the SLIC.
Information on the downstream side of h is mixed and output to the upstream side of TBch (that is, bidirectional monitor connection).

In the third example, in the SLIC internal circuit, the downstream side information of Bch is connected to the upstream side of TBch,
The downlink side information of TBch is connected to the uplink side of Bch, and Cc
The downlink side information of h is connected to the uplink side of TCch,
Of the downlink information of Cch to the uplink side of Cch (that is,
Bidirectional connection between Bch and TBch and between Cch and TCch).

In the fourth example, in the SLIC internal circuit, the upstream digital output information of the SLIC codec and the downstream information of TBch are mixed and output as upstream information of Bch, and the downstream information of Bch is combined. The downstream side information of TBch is mixed and input to the downstream side digital input of the codec, and the information of the upstream side digital output of the codec and B
Downstream information of ch is mixed and output to the upstream side of TBch (that is, three-way call connection).

In the fifth example, in the SLIC internal circuit, TBch is connected instead of Bch connected to the digital input / output of the SLIC codec, and the SLIC is connected.
TCch instead of Cch connected to the internal control circuit
Connect.

In yet another example, the switch interface of the subscriber line switch is used as a switch interface that enables mutual compatibility between the SLIC and the ISDN basic interface intra-office line termination unit (IOCU), and is used on the switch interface of the SLIC. TBc that is not used
Used as h and TCch.

In still another example, one TBch and one TCch are provided and shared for each of the plurality of SLICs.

[0025]

According to the method of the present invention, with the above-described structure, the subscriber line test unit and the devices such as switches can be downsized, and all necessary maintenance test connections can be performed.

[0026]

EXAMPLES Examples of the present invention are shown in FIGS. 1 to 5 and FIGS. 6 (a) and 6 (b). First, items common to FIGS. 1 to 5 will be described. The subscriber line test unit will be installed after the switch for communication. That is, access is performed by a digital signal and line selection is performed using a call switch. Therefore, the subscriber line test section does not require the test switch shown in FIGS. Bch and Cch on the switch interface of SLIC are usually SLIC, respectively.
It is connected to a control circuit for controlling the codec and SLIC in the inside. Next, individual connection forms in the present invention will be described.

FIG. 1 shows an example of a unidirectional monitor connection of the present invention. In the SLIC internal circuit, the information on the upstream side of Bch is multi-connected to the upstream side of TBch, or the information on the upstream side of Cch is multi-connected to the upstream side of TCch. Thus, when the subscriber is in a calling state, a disconnection state, a dialing state, etc., if the switch connects the TBch or TCch to the subscriber line test unit, the calling line, the disconnection, and the dial signal can be monitored.

FIG. 2 shows an example of the bidirectional monitor connection of the present invention. In the SLIC internal circuit, the Bch upstream side information and the Bch downstream side information input to the SLIC are mixed and output to the TBch upstream side. Thus, when the subscriber is in a call state, the switch connects the TBch to the subscriber line test section. Through the subscriber line test section, the maintenance tester can monitor the call status and check the call quality. At the same time, if the upstream Cch is multi-connected to the upstream TCch, it is possible to monitor a calling signal, a disconnection signal and the like.

FIG. 3 shows an example of the bidirectional loopback connection of the present invention. In the SLIC internal circuit, the downlink information of Bch is connected to the upstream side of TBch, the downlink information of TBch is connected to the upstream side of Bch, and the downlink information of Cch is TC.
Connect to the upstream side of ch, and send the downstream side information of TC ch to Cch
Connection to the upstream side of Cch (that is, between Bch and TBch and C
ch and TC ch are connected in both directions).
The subscriber's telephone is either unconnected or on-hook. TBch and TCch are connected to the subscriber line test unit by a switch. A transmission test can be performed by providing the subscriber line test unit with a switch interface pseudo function of the SLIC according to the operation of the terminal.

FIG. 4 shows an example of the interrupt connection of the present invention. In the SLIC internal circuit, the information of the upstream digital output of the SLIC codec and the downstream information of TBch are mixed and output as upstream information of Bch,
Downlink side information and TBch downlink side information are mixed and input to the downlink side digital input of the codec, and the upstream side digital output information of the codec and Bch downlink side information are mixed and output to the TBch upstream side. (That is, three-way call connection). When the subscriber is in a call state, Bch is connected to the other party by the switch and TBch is connected to the maintenance tester via the subscriber line test unit. The maintenance tester can interact with the subscriber and can obtain more detailed information about the call status. At the same time, if the upstream Cch is multi-connected to the upstream TCch, it is possible to monitor a calling signal, a disconnection signal and the like.

FIG. 5 shows an example of the retractable connection of the present invention. In the SLIC internal circuit, TBch is connected instead of the Bch connected to the SLIC codec, and TCch is connected instead of the Cch connected to the control circuit in the SLIC. TBch and TCch are pulled into the subscriber line test unit by the switch. The test circuit enables a call between the subscriber and the maintenance tester, transmission of a calling signal, testing of a tire signal and transmission of a howler signal.

FIG. 6A shows an example of the switch interface of the present invention. It is assumed that the SLIC and the intra-office line terminating unit (IOCU) for ISDN basic interface are compatible with each other. IOCU
Requires two B channels (64 kbit / s) and D channel (16 kbit / s) and control channel, but SLIC has a channel for communication (64 kbit / s)
Since the control channel is a required channel, at least one B channel and D channel band in the IOCU is unused. Here, Cch of SLIC requires the highest speed at the time of transfer of the dial pulse signal (speed 20PPS, dial pulse make rate 33%).
There is enough margin at about kbit / s. Therefore, in SLIC, it is possible to allocate TBch and TCch using the bands of B channel and D channel.

FIG. 6 (a) is an example of a switch interface which enables mutual compatibility between SLIC and IOCU, and four tom slots (one time slot corresponds to one time slot per subscriber on the time division multiplexing highway). (Corresponding to 64 kbit / s) is used. Here, the two B channels, the D channel and the control channel of the IOCU are respectively B1
It is assigned to ch, B2ch, Dch (including empty), and Cch.

FIG. 6B shows another example of the switch interface of the present invention. Four time slots (one time slot corresponds to 64 kbit / s) are used per subscriber on the time division multiplexing highway. TB
One time slot is allocated to each of ch and TC ch as a channel shared by a plurality of SLICs.

All explanations relating to the present invention described above are as follows.
The switch interface and the switch are valid for both STM (synchronous transfer mode) and ATM (asynchronous transfer mode).

[0036]

According to the present invention, all the maintenance test connection functions which were conventionally carried out by the method of performing the maintenance test access using the LT line are possible, and the subscriber line test section can be placed after the switch. The subscriber line test unit, which was configured with a high-voltage analog circuit, can be configured with a digital circuit, enabling a significant downsizing. Further, since the multi-connection by the switch and the mixed function in the subscriber line test unit can be placed in the SLIC, it can be expected that the hardware can be ignored by incorporating it in the LSI circuit of the SLIC. Furthermore, in the configuration that is placed remotely from the SLIC switch, it is difficult to install the subscriber line test unit and the SLIC at a distance by the conventional method for performing the maintenance test access using the metallic LT line. Although the number of SLICs accommodated per subscriber line test unit is small and the configuration is uneconomical, the configuration of the present invention allows the subscriber line test unit to be placed on the switch side, so that the accommodation efficiency can be improved. A cost-effective maintenance test system can be constructed.

[Brief description of drawings]

FIG. 1 is a diagram showing a first embodiment of the present invention.

FIG. 2 is a diagram showing a second embodiment of the present invention.

FIG. 3 is a diagram showing a third embodiment of the present invention.

FIG. 4 is a diagram showing a fourth embodiment of the present invention.

FIG. 5 is a diagram showing a fifth embodiment of the present invention.

FIG. 6 is a diagram showing another embodiment of the present invention.

FIG. 7 is a diagram showing a first conventional example.

FIG. 8 is a diagram showing a first conventional example.

FIG. 9 is a diagram showing a first conventional example.

FIG. 10 is a diagram showing a first conventional example.

FIG. 11 is a diagram showing a second conventional example.

FIG. 12 is a diagram showing a second conventional example.

FIG. 13 is a diagram showing a second conventional example.

FIG. 14 is a diagram showing a second conventional example.

FIG. 15 is a diagram showing a second conventional example.

[Explanation of symbols]

SLIC Analog Telephone Subscriber Circuit IOCU ISDN Basic Interface Subscriber Line Termination Device Bch Call Channel Cch SLIC Control Channel TBch Maintenance Test Channel (Call) TCch Maintenance Test Channel (Control) MIX Mixed Circuit B1ch ISDN Basic Interface B1 Channel B2ch ISDN basic interface B2 channel Dch ISDN basic interface D channel

Claims (8)

[Claims] 1. A subscriber line switchboard accommodating an analog telephone subscriber circuit (hereinafter referred to as SLIC) having a BORSCHT function, wherein an interface between the switch of the switch and the SLIC (hereinafter referred to as switch interface) is a normal one. In addition to the channel used for communication in the service (hereinafter referred to as Bch) and the channel used for control (hereinafter referred to as Cch), a bidirectional channel having the same speed as Bch (hereinafter referred to as TBch) and Cch for maintenance test. A subscriber line test connection method characterized in that a bidirectional channel (hereinafter, referred to as TCch) having the same speed as that is provided, and these are connected according to the contents of the test. 2. In the SLIC internal circuit, multi-connection of information in the switch direction of Bch (hereinafter referred to as “upstream side”) to the upstream side of TBch, or multi-connection of upstream information of Cch to the upstream side of TCch. The subscriber line test connection method according to claim 1, wherein 3. The SLIC internal circuit mixes the information of the Bch upstream side and the Bch subscriber terminal direction (hereinafter referred to as the downstream side) input to the SLIC and outputs the mixed information to the TBch upstream side. The subscriber line test connection method according to claim 1. 4. In the SLIC internal circuit, the Bch downlink information is connected to the TBch uplink, the TBch downlink information is connected to the Bch uplink, and the Cch downlink information is connected to the TCch uplink. The subscriber line test connection method according to claim 1, wherein the downlink information of TCch is connected to the uplink side of Cch. 5. In the SLIC internal circuit, the SLIC
Information of the upstream digital output of the codec and the downstream information of the TBch are mixed and output as upstream information of the Bch, and the downstream information of the Bch and the downstream information of the TBch are mixed and the downstream digital input of the codec is mixed. 2. The subscriber line test connection method according to claim 1, wherein the information of the digital output on the upstream side of the codec and the information on the downstream side of Bch are mixed and output to the upstream side of TBch. 6. In the SLIC internal circuit, the SLIC
Bch connected to the digital input / output of this codec
2. The subscriber line test connection method according to claim 1, wherein TBch is connected instead of CCH, and TCch is connected instead of Cch connected to a control circuit in the SLIC. 7. A switch interface of a subscriber line exchange is a switch interface that enables mutual compatibility between an SLIC and an ISDN basic interface intra-station line terminating device (hereinafter referred to as IOCU), and is used on the SLIC switch interface. Not banding TBch
7. The subscriber line test connection method according to claim 1, wherein the subscriber line test connection method is used as a communication channel and a TCch. 8. A TBch and a TCch are provided with a plurality of SLICs.
7. The subscriber line test connection method according to claim 1, wherein one is provided for each and shared.