JPH0732632A - Circuit board connection terminal laminated structure and thermal head using the structure - Google Patents

Circuit board connection terminal laminated structure and thermal head using the structure

Info

Publication number
JPH0732632A
JPH0732632A JP5181060A JP18106093A JPH0732632A JP H0732632 A JPH0732632 A JP H0732632A JP 5181060 A JP5181060 A JP 5181060A JP 18106093 A JP18106093 A JP 18106093A JP H0732632 A JPH0732632 A JP H0732632A
Authority
JP
Japan
Prior art keywords
connection terminal
circuit board
layer
solder
coating layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5181060A
Other languages
Japanese (ja)
Inventor
Hideaki Masatsu
秀明 正津
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP5181060A priority Critical patent/JPH0732632A/en
Publication of JPH0732632A publication Critical patent/JPH0732632A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/036Multilayers with layers of different types
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistors
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings

Landscapes

  • Electronic Switches (AREA)

Abstract

PURPOSE:To obtain a connection terminal laminated structure of a circuit board generating no crack due to thermal expansion difference by forming a fragile coating layer on the upper surface of a first circuit board and laminating a connection terminal composed of a metal on the upper surface of the coating layer and providing an elastic layer between the coating layer and the connection terminal of the first circuit board. CONSTITUTION:A fragile coating layer 22 is formed on the upper surface of a first circuit substrate 20 and a connection terminal 60 (70) composed of a metal is laminated to the upper surface of the coating layer 22 and the connection terminal 60 (70) and the connection terminal 90 of a second circuit substrate 80 are thermally fused through solder. In the laminated structure of the connection terminal of the circuit board, an elastic layer 1 is provided between the coating layer 2 and the connection terminal 60 (70) of the first circuit board 20. As a result, even when two circuit boards different in the coefficient of thermal expansion are bonded under heating and pressure by solder, a problem such as a crack or the like due to thermal expansion difference is not generated.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、熱膨張係数の異なる材
料を積層して形成した積層回路基板の接続端子構造およ
びその構造を用いたサ−マルヘッドの改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a connection terminal structure of a laminated circuit board formed by laminating materials having different coefficients of thermal expansion and an improvement of a thermal head using the structure.

【0002】[0002]

【従来の技術】図5に示す従来の積層回路基板の接続端
子構造を図6ないし図7に示す一般的なサ−マルヘッド
を例にとって以下に説明する。
2. Description of the Related Art A connection terminal structure of a conventional laminated circuit board shown in FIG. 5 will be described below by taking a general thermal head shown in FIGS. 6 to 7 as an example.

【0003】図6、図7において符号10は、アルミ等
の金属板製の放熱板を、符号20は、前記放熱板10の
上面に接着材や両面テ−プで装着したヘッド基板を示
す。
In FIGS. 6 and 7, reference numeral 10 denotes a heat dissipation plate made of a metal plate such as aluminum, and reference numeral 20 denotes a head substrate mounted on the upper surface of the heat dissipation plate 10 with an adhesive material or a double-sided tape.

【0004】前記ヘッド基板20は、1ミリメ−トル程
度の板厚のセラミック製の板21の上面に、70マイク
ロメ−トル程度のガラスを主成分とするグレ−ズ層22
が被覆形成される。このグレ−ズ層22は後述する発熱
抵抗体30の蓄熱の役割や、前記板21の上面を滑らか
にして、後述する電源用配線50および信号配線51を
無機金または/および有機金ペ−ストを印刷焼成して形
成する場合、印刷不良が発生しないように設けられるも
のである。
The head substrate 20 comprises a ceramic plate 21 having a plate thickness of about 1 mm, and a glaze layer 22 containing glass of about 70 μm as a main component on the upper surface of the plate 21.
Are coated. The glaze layer 22 plays a role of heat storage of a heating resistor 30 which will be described later and smoothes the upper surface of the plate 21 so that a power supply wiring 50 and a signal wiring 51 which will be described later are made of inorganic gold and / or organic gold paste. Is formed by printing and baking, it is provided so that printing defects do not occur.

【0005】前記グレ−ズ層22の上面には、帯状の発
熱抵抗体30が、当該ヘッド基板20の長手方向に沿っ
て一直線のライン状に形成されているとともに、この発
熱抵抗体30を発熱制御する複数の駆動IC40が、前
記発熱抵抗体30に沿って一列状に搭載されている。更
に、前記グレ−ズ層22の上面には、前記発熱抵抗体3
0に対する印字電源用配線50が形成されている。
On the upper surface of the glaze layer 22, a strip-shaped heating resistor 30 is formed in a straight line along the longitudinal direction of the head substrate 20, and the heating resistor 30 generates heat. A plurality of drive ICs 40 to be controlled are mounted in a line along the heating resistor 30. Further, the heating resistor 3 is formed on the upper surface of the glaze layer 22.
The print power supply wiring 50 for 0 is formed.

【0006】そして、前記ヘッド基板20における上面
のうち一側縁に、前記各駆動IC40に対する電源、ク
ロック信号、ラッチ信号又はイネ−ブル信号配線51
や、前記印字電源用配線50と接続される銀−パラジュ
ウム系導伝性ペ−ストからなるる接続端子60(70)
を印刷焼成して形成している。
Then, on one side edge of the upper surface of the head substrate 20, a power source, a clock signal, a latch signal or an enable signal wiring 51 for each driving IC 40 is provided.
And a connection terminal 60 (70) made of a silver-paradium-based conductive paste that is connected to the print power wiring 50.
Is formed by printing and baking.

【0007】このように、前記ヘッド基板20の前記接
続端子60(70)の形成箇所では、セラミック製の板
21とグレ−ズ層22と配線50、51および接続端子
60(70)との積層構造となっている。(図5参照)
一方、符号80は、軟質合成樹脂のフレキシブル回路基
板を示し、このフレキシブル回路基板80には、前記ヘ
ッド基板20における複数の接続端子60(70)の各
々に対して接続される接続端子90が形成されていると
ともに、該各接続端子90を当該フレキシブル回路基板
80に固着したソケット100に対して接続するための
配線パタ−ン(図示せず)が形成されている。
As described above, at the place where the connection terminal 60 (70) is formed on the head substrate 20, the ceramic plate 21, the glaze layer 22, the wirings 50 and 51, and the connection terminal 60 (70) are laminated. It has a structure. (See Figure 5)
On the other hand, reference numeral 80 indicates a flexible circuit board made of soft synthetic resin, and the flexible circuit board 80 is formed with connection terminals 90 connected to each of the plurality of connection terminals 60 (70) on the head board 20. In addition, a wiring pattern (not shown) for connecting each of the connection terminals 90 to the socket 100 fixed to the flexible circuit board 80 is formed.

【0008】なお、符号110は、発熱抵抗体30に対
するガラス等の保護膜を、符号120は各駆動IC40
をパッケ−ジする合成樹脂をそれぞれ示す。
Reference numeral 110 is a protective film such as glass for the heating resistor 30, and reference numeral 120 is each drive IC 40.
The synthetic resins for packaging are shown respectively.

【0009】そして、前記フレキシブル回路基板80
を、前記ヘッド基板20における長手方向の一側縁に対
して、当該フレキシブル基板80の配線パタ−ンにおけ
る各接続端子90がヘッド基板20における接続端子6
0(70)の各々に接触するように重ね合わせた後、前
記フレキシブル基板80における各接続端子90をヘッ
ド基板20における各々の接続端子60(70)に対し
半田付けにて熱溶着する。
The flexible circuit board 80
With respect to one side edge in the longitudinal direction of the head substrate 20, each connection terminal 90 in the wiring pattern of the flexible substrate 80 is connected to the connection terminal 6 in the head substrate 20.
0 (70) so as to come into contact with each other, and then each connecting terminal 90 on the flexible substrate 80 is heat-welded to each connecting terminal 60 (70) on the head substrate 20 by soldering.

【0010】この半田付けは、図6に示すように、フレ
キシブル基板80の接続端子90およびヘッド基板20
の接続端子60(70)のうちいずれか一方又は両方の
表面に予め半田ペ−ストを塗着、もしくは半田メッキな
どで半田膜を形成し、次いで、フレキシブル回路基板8
0をヘッド基板20に対して重ね合わせ、図6に示す上
下押圧加熱手段Pにより、適宜の圧力で押圧した状態で
加熱することによって行うものであり、このような半田
付けにより、フレキシブル基板80における各接続端子
90をヘッド基板20における各接続端子60(70)
の各々に対して熱溶着されるものである。この熱溶着時
の温度は通常摂氏230〜250度である。
As shown in FIG. 6, this soldering is performed by connecting terminals 90 of the flexible substrate 80 and the head substrate 20.
Of either or both of the connection terminals 60 (70) of FIG. 1 are coated with a solder paste in advance or a solder film is formed by solder plating, and then the flexible circuit board 8
0 is superposed on the head substrate 20 and is heated by being pressed with an appropriate pressure by the vertical pressing and heating means P shown in FIG. 6. By such soldering, the flexible substrate 80 Connect each connection terminal 90 to each connection terminal 60 (70) on the head substrate 20.
Of each of which is heat-welded. The temperature during this heat welding is usually 230 to 250 degrees Celsius.

【0011】[0011]

【発明が解決しようとする課題】前記ヘッド基板20の
前記接続端子60(70)の形成箇所で、セラミック製
の板21とグレ−ズ層22と配線50、51および接続
端子60(70)との積層構造となっているから、加熱
手段Pによって半田熱溶着する場合、その溶着熱によっ
て、前記積層構造におけるグレ−ズ層22と、その上部
の配線50、51および接続端子60(70)との熱膨
張係数の違いにより両者間に応力が発生し、比較的薄
く、脆性であるグレ−ズ層22にクラックが生じる問題
があった。
A ceramic plate 21, a glaze layer 22, wirings 50 and 51, and connection terminals 60 (70) are formed on the head substrate 20 where the connection terminals 60 (70) are formed. When the solder is heat-welded by the heating means P, the glaze layer 22 in the laminated structure, and the wirings 50 and 51 and the connection terminals 60 (70) on the glaze layer 22 in the laminated structure are formed. Due to the difference in the coefficient of thermal expansion between the two, stress is generated between the two, and there is a problem that cracks occur in the relatively thin and brittle glaze layer 22.

【0012】このクラックによって、接続端子60(7
0)部分で層剥離が発生したり、配線50、51と接続
端子60(70)およびフレキシブル基板80の接続端
子90とが断線状態で半田熱溶着されるなどして、製品
不良となる問題があった。
Due to this crack, the connection terminal 60 (7
Delamination occurs in the 0) portion, and the wiring 50, 51 and the connection terminal 60 (70) and the connection terminal 90 of the flexible substrate 80 are thermally welded in a disconnected state. there were.

【0013】特に、例えば可動式の(シリアル)サ−マ
ルヘッドにおいては、ヘッド基板20が可動して被印字
体(紙、感熱紙等)に印字するから、フレキシブル基板
80とヘッド基板20との接続箇所にヘッド基板20の
移動による過負荷が掛かり易く、前記クラックが発生し
ていると断線等の故障の原因になることが多かった。
In particular, for example, in a movable (serial) thermal head, the head substrate 20 moves and prints on a printing object (paper, thermal paper, etc.), so the flexible substrate 80 and the head substrate 20 are connected. Overload due to the movement of the head substrate 20 is easily applied to the location, and the occurrence of the crack often causes a failure such as disconnection.

【0014】本発明は前述したようなクラックの発生を
防止し、上記問題をことごとく解決することを目的とす
る。
An object of the present invention is to prevent the occurrence of cracks as described above and solve all the above problems.

【0015】[0015]

【課題を解決するための手段】上記問題を解決するため
本発明は、次のような技術的手段を講じている。
In order to solve the above problems, the present invention takes the following technical means.

【0016】すなわち、第1の回路基板と、該第1の回
路基板の上面に脆性である被覆層を形成するとともに、
この被覆層の上面側に金属からなる接続端子を積層して
形成し、該接続端子と第2の回路基板の接続端子とを半
田を介して熱溶着する回路基板の接続端子積層構造にお
いて、前記被覆層と前記第1の回路基板の接続端子との
間に弾性層を設けてなることを特徴としている。
That is, a first circuit board and a brittle coating layer are formed on the upper surface of the first circuit board, and
In the connection terminal laminated structure of the circuit board, the connection terminal made of metal is laminated on the upper surface side of the coating layer, and the connection terminal and the connection terminal of the second circuit board are heat-welded via solder. An elastic layer is provided between the cover layer and the connection terminal of the first circuit board.

【0017】また、セラミック製のヘッド基板の上面全
面に脆性であるグレ−ズ層を形成し、このグレ−ズ層上
面に帯状の発熱抵抗体と、この発熱抵抗体を選択発熱駆
動するための駆動ICと、前記発熱抵抗体と駆動ICお
よび前記グレ−ズ上面側に外部信号等導出用の接続端子
とをそれぞれ設け、前記発熱抵抗体と駆動ICと接続端
子とを配線にて電気的に接続する一方、前記ヘッド基板
の接続端子とフレキシブル基板の接続端子とを半田で熱
溶着してなるサ−マルヘッドにおいて、前記グレ−ズ層
とヘッド基板の接続端子との間には、弾性層を設けてな
ることを特徴とする。
Further, a brittle glaze layer is formed on the entire upper surface of the ceramic head substrate, and a strip-shaped heating resistor is provided on the upper surface of the glaze layer, and the heating resistor is selectively driven to generate heat. A driving IC, the heating resistor, the driving IC, and a connection terminal for deriving an external signal or the like are provided on the upper surface of the glaze, and the heating resistor, the driving IC, and the connection terminal are electrically connected by wiring. On the other hand, in the thermal head in which the connection terminals of the head substrate and the connection terminals of the flexible substrate are heat-welded with solder while connecting, an elastic layer is provided between the glaze layer and the connection terminals of the head substrate. It is characterized by being provided.

【0018】前記弾性層は、脆性である被覆層またはグ
レ−ズ層と接続端子との間に位置し、半田で熱溶着する
際に生じる応力を緩和し、脆性である被覆層またはグレ
−ズ層にクラックが発生するのを防止でき得る程度の弾
性を有するものであれば何でも良い。例えば弾性層とし
ては、後述するミックスボンドタイプのペ−ストを印刷
焼成したものや、高圧雰囲気中でスパッタリングするな
どして形成し、層内に適度な空洞部分を含有させる構造
をとっても良い。
The elastic layer is located between the brittle coating layer or glaze layer and the connection terminal, relaxes the stress generated during heat welding with solder, and is brittle in the coating layer or glaze. Any material may be used as long as it has elasticity enough to prevent cracks from being generated in the layer. For example, the elastic layer may be formed by printing and firing a mix-bond type paste described later, or may be formed by sputtering in a high-pressure atmosphere so that an appropriate hollow portion is contained in the layer.

【0019】[0019]

【作用】上記構成による本発明によれば、セラミック製
の第1の回路基板またはヘッド基板に形成された被覆層
またはグ−レズ層と、第2の回路基板またはフレキシブ
ル基板の接続端子との間に弾性層を設けているから、当
該弾性層が、前記両基板の接続端子と、第2の回路基板
またはフレキシブル基板の接続端子とを半田で熱溶着す
る際などにおける、前記グレ−ズ層と接続端子などの他
の層との熱膨張係数の違いによる応力を緩和してクラッ
クが発生することを防止する。
According to the present invention having the above-mentioned structure, between the coating layer or the glaze layer formed on the first circuit board or the head board made of ceramic and the connection terminal of the second circuit board or the flexible board. Since the elastic layer is provided on the glaze layer, the elastic layer is used to heat the connection terminals of the both boards and the connection terminals of the second circuit board or the flexible board by soldering. The stress caused by the difference in thermal expansion coefficient from other layers such as connection terminals is relaxed to prevent cracks from occurring.

【0020】[0020]

【実施例】以下本発明をサ−マルヘッドに適用した場合
の好ましい実施例を、図面を参照しつつ具体的に説明す
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of the present invention applied to a thermal head will be specifically described below with reference to the drawings.

【0021】本実施例に用いられるサ−マルヘッドの基
本構成は、図6および図7に示したものと同様であるの
で、詳細の説明は省略する。
Since the basic structure of the thermal head used in this embodiment is the same as that shown in FIGS. 6 and 7, detailed description will be omitted.

【0022】図1ないし図2に示すのは本発明の一実施
例である。図2は、図6の矢印Aから見た接続端子付近
を部分的に拡大した要部拡大断面図であり、図1は、図
2のB−B断面図である。
1 and 2 show an embodiment of the present invention. 2 is an enlarged cross-sectional view of a main part of the vicinity of the connection terminal as seen from the arrow A in FIG. 6, and FIG. 1 is a BB cross-sectional view of FIG.

【0023】図において、20は第1の回路基板の一例
であるヘッド基板、21はセラミック製の板、22はグ
レ−ズ層、50(51)は配線、60(70)は接続端
子、80は第2の回路基板の一例であるフレキシブル基
板、90はフレキシブル基板80の接続端子であり、前
述した従来例と同様の構成のものとしている。接続端子
60(70)と接続端子90との間には図示しない半田
層が介在されている。
In the figure, 20 is a head substrate which is an example of a first circuit board, 21 is a ceramic plate, 22 is a glaze layer, 50 (51) is wiring, 60 (70) is a connecting terminal, and 80 is a connecting terminal. Is a flexible board which is an example of the second circuit board, and 90 is a connection terminal of the flexible board 80, which has the same configuration as the above-mentioned conventional example. A solder layer (not shown) is interposed between the connection terminal 60 (70) and the connection terminal 90.

【0024】1は本発明に係わる弾性層であり、この弾
性層1は、脆性である被覆層としてのグレ−ズ層22表
面に印刷形成した配線50(51)と、接続端子60
(70)との間に、銀または金粒子を含有するミックス
ボンドタイプ(例えば京都エレック社製/品番DD12
04など)のペ−ストを印刷焼成して形成してある。こ
のようなミックスボンドタイプのペ−ストを印刷焼成し
て弾性層1を形成すると、その層はポ−ラスな網目構造
を呈し、弾力性を有する層とすることができる。つまり
ミックスボンドタイプのペ−ストは、ガラス粒子と金属
粒子と有機物などの混合ペ−ストであり、このペ−スト
を800℃程度で焼成すると、含有する有機物が蒸発な
どして消滅し、その有機物が存在していた箇所に微小な
空洞が生じるのである。勿論空洞が生じても導電性は失
っていない。
Reference numeral 1 denotes an elastic layer according to the present invention. The elastic layer 1 is formed by wiring 50 (51) printed on the surface of the glaze layer 22 as a brittle coating layer and a connecting terminal 60.
Mixed bond type containing silver or gold particles between (70) (for example, product number DD12 manufactured by Kyoto Elec Co., Ltd.
04, etc.) is formed by printing and baking. When such a mixed bond type paste is printed and baked to form the elastic layer 1, the layer has a porous network structure and can be made a layer having elasticity. In other words, the mixed bond type paste is a mixed paste of glass particles, metal particles and organic substances, and when the paste is baked at about 800 ° C., the contained organic substances disappear by evaporation and the like. Minute cavities are created where the organic matter was. Of course, the conductivity is not lost even if a cavity is formed.

【0025】この実施例では、弾性層1としてミックス
ボンドタイプのペ−ストを採用したが、これに限らず適
度(グレ−ズ層と配線等との熱膨張差により生じる応力
を吸収できる程度)な弾性を有する素材であれば何でも
良い。例えば後述する変形実施例で説明する薄膜形成方
法により弾性層1を形成することもできる。
In this embodiment, a mixed bond type paste is adopted as the elastic layer 1, but the elastic layer 1 is not limited to this, and is suitable (to the extent that the stress generated by the difference in thermal expansion between the glaze layer and the wiring can be absorbed). Any material can be used as long as it has sufficient elasticity. For example, the elastic layer 1 can be formed by the thin film forming method described in a modified example described later.

【0026】また、前記配線50(51)は有機金ペ−
ストを印刷焼成して形成し、この配線50(51)を覆
い隠すように前記弾性層1を形成し、当該弾性層1上に
銀とパラジュウムを混在したペ−ストを印刷焼成して接
続端子60(70)を形成してある。
The wiring 50 (51) is made of organic gold.
The elastic layer 1 is formed so as to cover the wiring 50 (51), and a paste containing silver and palladium mixed is printed and baked on the elastic layer 1 to form a connection terminal. 60 (70) is formed.

【0027】このように、配線50(51)を弾性層1
で覆い隠すことにより、配線50(51)と半田とが直
接接触して半田喰われによる断線の発生を緩和できる。
つまり、配線50(51)は、焼成後、純粋な金のみの
膜となり、半田と金とが非常になじみ易いため、図3に
示すように半田Hがボ−ル状になり部分的に金膜Mを喰
ってしまい、基板Kから金膜Mが剥離・溶解消失して半
田での接着不良や断線を発生させる恐れがある。前記弾
性層1内にも半田と馴染み易い銀または金を含有してい
るが、この弾性層1にはガラスフリット等の不純物が混
在しているため、配線50(51)に比べかなり厚い層
となり、前述した半田喰われによる断線等の問題の影響
は純粋な金のみで形成される配線50(51)に比べて
緩和される。しかしながら、前述した半田喰われによる
問題を防止するには、半田用の接続端子60(70)と
して前記銀−パラジウムのペ−ストを採用しているよう
に、前記パラジウム元素等が半田喰われを防止抑制する
不純物を含有させるのが好ましい。
In this way, the wiring 50 (51) is connected to the elastic layer 1
The wiring 50 (51) and the solder come into direct contact with each other, so that the occurrence of wire breakage due to the solder being eaten can be alleviated.
That is, the wiring 50 (51) becomes a film of pure gold only after firing, and the solder and gold are very easily blended together, so that the solder H becomes a ball shape as shown in FIG. The film M may be consumed, and the gold film M may be peeled off from the substrate K and dissolved and disappear, resulting in defective adhesion or disconnection with solder. The elastic layer 1 also contains silver or gold, which is easily compatible with solder. However, since impurities such as glass frit are mixed in the elastic layer 1, the layer is considerably thicker than the wiring 50 (51). The influence of the above-mentioned problem such as disconnection due to solder leaching is alleviated as compared with the wiring 50 (51) formed of pure gold only. However, in order to prevent the above-mentioned problem due to solder leaching, the palladium element or the like may prevent solder leaching as in the case where the silver-palladium paste is used as the solder connecting terminal 60 (70). It is preferable to contain an impurity which suppresses prevention.

【0028】また、前述したように配線50(51)の
表面に弾性層1がちょうど重なるように形成するのでは
なく、配線50(51)を完全に覆うように形成するの
は、その重なり部分で金と銀とが合金を形成した場合に
電気的抵抗が大きくなるためその重なり部分を少なくし
たいためによる。
Further, as described above, the elastic layer 1 is not formed so as to exactly overlap the surface of the wiring 50 (51), but is formed so as to completely cover the wiring 50 (51). When gold and silver form an alloy, the electric resistance increases, and it is because it is desired to reduce the overlapping portion.

【0029】図4に示すのが本発明の変形実施例であ
る。この変形実施例では、前述した実施例の弾性層1の
形成方法と異なる以下のような方法を採用し、その弾性
層1の形成箇所を接続端子60(70)と配線50(5
1)との間から、グレ−ズ層22と配線50(51)と
の間に変更した点で相違し、他の構成は前記実施例と同
様の構成としている。
FIG. 4 shows a modified embodiment of the present invention. In this modified embodiment, the following method, which is different from the method of forming the elastic layer 1 of the above-described embodiment, is adopted, and the formation position of the elastic layer 1 is connected to the connection terminal 60 (70) and the wiring 50 (5).
1) except that the glaze layer 22 and the wiring 50 (51) are different from each other, and the other structure is the same as that of the above-described embodiment.

【0030】本変形実施例での弾性層1は、金等の金属
粒子を高圧ガス中でスパッタリング方法に蒸着して弾力
性を有する膜を形成するようにしたものである。通常、
スパッタリングは、例えばアルゴンガス雰囲気中でガス
圧3×10-3torrで行われるが、このガス圧を3×
10-2に上げて形成する。
The elastic layer 1 in the present modified example is formed by vapor-depositing metal particles such as gold in a high pressure gas by a sputtering method to form a film having elasticity. Normal,
Sputtering is performed, for example, in an argon gas atmosphere at a gas pressure of 3 × 10 −3 torr.
Form by raising to 10 -2 .

【0031】このようにガス圧を上げると、被蒸着箇所
(接続端子60(70)を形成するグレ−ズ層22表
面)に金属粒子がスパッタされる際に前記アルゴンガス
等の粒子が取り込まれ易くなる結果、成膜された弾性層
1はガス粒子を含むポ−ラスな膜とすることができる。
When the gas pressure is increased in this manner, when the metal particles are sputtered on the deposition target portion (the surface of the glaze layer 22 forming the connection terminal 60 (70)), the particles such as the argon gas are taken in. As a result, the formed elastic layer 1 can be a porous film containing gas particles.

【0032】また、弾性層1はこの変形実施例のように
グレ−ズ層22上に直接設ける方が、半田の熱圧着の際
に生じる応力をグレ−ズ層に伝えないように効率的に吸
収できるので好ましいが、半田が直接に接する接続端子
60(70)と、グレ−ズ層22との間であれば、いず
れの層間に形成しても程度の差はあれ、グレ−ズ層22
でのクラックの発生を防止できる。しかしながら、前記
弾性層1を接続端子の下層に部分的に形成する場合い
は、製法上の都合から配線50(51)の上層に弾性層
1を形成する方が容易である。
Further, when the elastic layer 1 is directly provided on the glaze layer 22 as in this modified embodiment, the stress generated during the thermocompression bonding of the solder is efficiently transmitted to the glaze layer. It is preferable because it can be absorbed, but if it is formed between the connection terminal 60 (70) to which the solder is directly in contact and the glaze layer 22, it may be formed between any layers to some extent.
It is possible to prevent the occurrence of cracks. However, when the elastic layer 1 is partially formed in the lower layer of the connection terminal, it is easier to form the elastic layer 1 in the upper layer of the wiring 50 (51) for the convenience of the manufacturing method.

【0033】さらに、本実施例では、グレ−ズ層22で
70μm、接続端子60(70)で6μm、配線50、
51で0.6μmに対して、弾性層1を前記各層に比べ
充分厚い12μmとしてあり、確実に熱膨張差による応
力を緩和できるようにしてある。
Further, in this embodiment, the glaze layer 22 is 70 μm, the connection terminal 60 (70) is 6 μm, the wiring 50,
51 is 0.6 μm, the elastic layer 1 is 12 μm, which is sufficiently thicker than the above layers, so that the stress due to the difference in thermal expansion can be reliably relaxed.

【0034】前述した弾性層1を形成した両実施例のヘ
ッド基板20(以下Aタイプという)と、従来の弾性層
1のないヘッド基板20(以下Bタイプ)とにそれぞれ
フレキシブル基板80を半田で熱圧着し、前記両基板2
0、80を引っ張り試験(引っ張り加重1.5Kg)に
よって接着状態を比較すると次のとうりの結果が得られ
た。前記引っ張り加重は、通常掛けられ得る加重に比べ
大幅に大きいものとしている(通常掛かり得る加重は約
0.3Kg)。また、通常の場合、完成品のには、前記
ヘッド基板20とフレキシブル基板80とが半田接着さ
れた箇所には、接着補強用の樹脂コ−トをするが一般て
きであるが、本引っ張り試験では樹脂コ−トは施してい
ない。
A flexible substrate 80 is soldered to each of the head substrate 20 (hereinafter, referred to as A type) having the elastic layer 1 formed thereon and the conventional head substrate 20 without the elastic layer 1 (hereinafter, B type). Thermo-compression bonded, both substrates 2
When the adhesion states of Nos. 0 and 80 were compared by a tensile test (tensile load of 1.5 kg), the following results were obtained. The tensile load is set to be significantly larger than the load that can be normally applied (the load that can normally be applied is about 0.3 kg). Usually, in the finished product, a resin coat for adhesion reinforcement is generally provided at the position where the head substrate 20 and the flexible substrate 80 are solder-bonded, but the main pulling test However, no resin coat is applied.

【0035】熱圧着後、前記引っ張り試験によって前記
ヘッド基板20の接続端子60(70)と、フレキシブ
ル基板80の接続端子90との剥がれ率は、Aタイプで
約8.7%、Bタイプで約56%であった。前記剥がれ
率とは、10本のサ−マルヘッドを用い、それぞれのヘ
ッド基板20のグレ−ズ層22と接続端子60(70)
との間で発生した剥がれ数の合計を全サ−マルヘッドの
接続端子60(70)の合計で割って表したものであ
る。
After thermocompression bonding, the peeling rate between the connection terminal 60 (70) of the head substrate 20 and the connection terminal 90 of the flexible substrate 80 by the tensile test is about 8.7% for the A type and about 100% for the B type. It was 56%. The peeling rate means that 10 thermal heads are used, and the glaze layer 22 and the connection terminal 60 (70) of each head substrate 20 are used.
And the total number of peelings generated between and is divided by the total of the connection terminals 60 (70) of all the thermal heads.

【0036】次に、信頼性テスト(125℃→25℃→
マイナス30℃を100サイクル繰り返す)の終了後、
前述したと同様の試験をおこなったところ、Aタイプで
約45%、Bタイプで約100%の剥がれ率となった。
Next, a reliability test (125 ° C. → 25 ° C. →
After the process of repeating minus 30 ° C for 100 cycles),
When the same test as described above was performed, the peeling rate was about 45% for the A type and about 100% for the B type.

【0037】なお、本実施例では、脆性層として、ガラ
スを主成分としたグレ−ズ層に適用した場合について説
明したが、これにかぎらず薄くて脆い層であれば何でも
適用できるのは勿論である。
In the present embodiment, the brittle layer has been described as being applied to the glaze layer containing glass as a main component, but the present invention is not limited to this, and any thin and brittle layer can be applied. Is.

【0038】[0038]

【発明の効果】以上の構成による本発明によれば、セラ
ミック製の第1の回路基板またはヘッド基板に形成され
た被覆層またはグ−レズ層と、第2の回路基板またはフ
レキシブル基板の接続端子との間に弾性層を設けている
から、当該弾性層が、前記両基板の接続端子と、第2の
回路基板またはフレキシブル基板の接続端子とを半田で
熱溶着する際などにおける、前記グレ−ズ層と接続端子
などの他の層との熱膨張係数の違いによる応力をその弾
性により吸収し緩和してクラックが発生することを防止
する。
According to the present invention having the above-described structure, the connection terminals of the coating layer or the glaze layer formed on the first circuit board or head board made of ceramic and the second circuit board or the flexible board are formed. Since an elastic layer is provided between the contact layer and the connection terminal of the both boards and the connection terminal of the second circuit board or the flexible board by soldering, the elastic layer is used for the gray layer. The stress caused by the difference in thermal expansion coefficient between the insulating layer and other layers such as connection terminals is absorbed and relaxed by its elasticity to prevent cracks from occurring.

【0039】このようにクラックの発生を防止しできる
から、例えばサ−マルヘッドのようなヘッド基板とフレ
キシブル基板との接続端子の接続構造に採用した場合に
は、前記サ−マルヘッドが可動方式のものであっても、
ヘッド基板とフレキシブル基板との接続状態を保持し、
クラックによる接続剥がれを解消することができる。
Since the generation of cracks can be prevented in this way, when the thermal head is used in a connecting structure for connecting a connecting terminal between a head substrate and a flexible substrate such as a thermal head, the thermal head is of a movable type. Even
Holds the connection between the head substrate and the flexible substrate,
It is possible to eliminate connection peeling due to cracks.

【図面の簡単な説明】[Brief description of drawings]

【図1】図2のB−B断面図である。FIG. 1 is a sectional view taken along line BB of FIG.

【図2】図6の矢印Aから見た接続端子2の要部拡大断
面図である。
FIG. 2 is an enlarged cross-sectional view of a main part of a connection terminal 2 viewed from an arrow A in FIG.

【図3】本発明の実施例の説明図である。FIG. 3 is an explanatory diagram of an example of the present invention.

【図4】本発明の変形実施例を示す斜視図である。FIG. 4 is a perspective view showing a modified embodiment of the present invention.

【図5】図6の矢印Aから見た従来の回路基板の接続端
子積層構造を示す断面図である。
5 is a cross-sectional view showing a connection terminal laminated structure of a conventional circuit board as seen from an arrow A in FIG.

【図6】一般的なサ−マルヘッドの熱圧着状態を示す側
面図である。
FIG. 6 is a side view showing a thermo-compression state of a general thermal head.

【図7】図6の斜視図である。FIG. 7 is a perspective view of FIG.

【符号の説明】[Explanation of symbols]

1 弾性層 22 グレ−ズ層 20 ヘッド基板 60、70、90 接続端子 80 フレキシブル基板 1 Elastic Layer 22 Glaze Layer 20 Head Substrate 60, 70, 90 Connection Terminal 80 Flexible Substrate

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 9168−4M H01L 21/92 U ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI technical display location 9168-4M H01L 21/92 U

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 第1の回路基板と、該第1の回路基板の
上面に脆性である被覆層を形成するとともに、この被覆
層の上面側に金属からなる接続端子を積層して形成し、
該接続端子と第2の回路基板の接続端子とを半田を介し
て熱溶着する回路基板の接続端子積層構造において、 前記被覆層と前記第1の回路基板の接続端子との間に弾
性層を設けてなることを特徴とする回路基板の接続端子
積層構造。
1. A first circuit board, a brittle coating layer is formed on an upper surface of the first circuit board, and a connection terminal made of metal is laminated on the upper surface side of the coating layer.
In a connection terminal laminated structure of a circuit board in which the connection terminal and the connection terminal of the second circuit board are heat-welded via solder, an elastic layer is provided between the cover layer and the connection terminal of the first circuit board. A connection terminal laminated structure for a circuit board, which is provided.
【請求項2】 セラミック製のヘッド基板の上面全面に
グレ−ズ層を形成し、このグレ−ズ層上面に帯状の発熱
抵抗体と、この発熱抵抗体を選択発熱駆動するための駆
動ICと、前記発熱抵抗体と駆動ICおよび前記グレ−
ズ上面側に外部信号等導出用の接続端子とをそれぞれ設
け、前記発熱抵抗体と駆動ICと接続端子とを配線にて
電気的に接続する一方、前記ヘッド基板の接続端子とフ
レキシブル基板の接続端子とを半田で熱溶着してなるサ
−マルヘッドにおいて、 前記グレ−ズ層とヘッド基板の接続端子との間には、弾
性層を設けてなることを特徴とするサ−マルヘッド。
2. A glaze layer is formed on the entire upper surface of a ceramic head substrate, a strip-shaped heating resistor is provided on the upper surface of the glaze layer, and a drive IC for selectively heating the heating resistor. , The heating resistor, the drive IC, and the gray
A connection terminal for deriving an external signal or the like is provided on the upper surface side to electrically connect the heating resistor, the drive IC and the connection terminal by wiring, and connect the connection terminal of the head substrate and the flexible substrate. A thermal head comprising a terminal and a terminal that are heat-welded with solder, wherein an elastic layer is provided between the glaze layer and the connection terminal of the head substrate.
JP5181060A 1993-07-22 1993-07-22 Circuit board connection terminal laminated structure and thermal head using the structure Pending JPH0732632A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5181060A JPH0732632A (en) 1993-07-22 1993-07-22 Circuit board connection terminal laminated structure and thermal head using the structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5181060A JPH0732632A (en) 1993-07-22 1993-07-22 Circuit board connection terminal laminated structure and thermal head using the structure

Publications (1)

Publication Number Publication Date
JPH0732632A true JPH0732632A (en) 1995-02-03

Family

ID=16094087

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5181060A Pending JPH0732632A (en) 1993-07-22 1993-07-22 Circuit board connection terminal laminated structure and thermal head using the structure

Country Status (1)

Country Link
JP (1) JPH0732632A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021079600A (en) * 2019-11-18 2021-05-27 ローム株式会社 Thermal print head and thermal printer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021079600A (en) * 2019-11-18 2021-05-27 ローム株式会社 Thermal print head and thermal printer

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