JPH0738294B2 - Electron beam adjusting device for cathode ray tube - Google Patents
Electron beam adjusting device for cathode ray tubeInfo
- Publication number
- JPH0738294B2 JPH0738294B2 JP63273317A JP27331788A JPH0738294B2 JP H0738294 B2 JPH0738294 B2 JP H0738294B2 JP 63273317 A JP63273317 A JP 63273317A JP 27331788 A JP27331788 A JP 27331788A JP H0738294 B2 JPH0738294 B2 JP H0738294B2
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- cathode ray
- ray tube
- brightness
- phosphor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、陰極線管の管面に塗布された蛍光体に対す
る電子ビームの位置を調整する陰極線管の電子ビーム調
整装置に関するものである。Description: TECHNICAL FIELD The present invention relates to an electron beam adjusting device for a cathode ray tube, which adjusts the position of an electron beam with respect to the phosphor coated on the tube surface of the cathode ray tube.
従来より、陰極線の電子ビームを、管面に塗布されたR
(赤),G(緑),B(青)の各ドット状の蛍光体に正しく
照射させるためにITC調整が行われている。ITC調整にお
いては、蛍光体に対する電子ビームの位置調整を行う調
整手段として、陰極線管のネック部に設けられた色純度
調整用マグネットから成るCPリングや偏向ヨーク、ある
いは別に設けた調整コイル等が用いられている。このよ
うな調整手段により位置調整された電子ビームが、蛍光
体に正しく当っているか否かを判定する基準として、現
在では、蛍光体の発光輝度が用いられている。即ち、一
般に蛍光体の発光面積とその輝度とは比例関係にあるの
で、輝度が最大となったときを以って、電子ビームが蛍
光体に正しく当たった状態、即ち電子ビームの中心と蛍
光体の中心とが一致していると判定するようにしてい
る。Conventionally, a cathode ray electron beam has been applied to the surface of the R
ITC adjustment is performed in order to properly irradiate each dot-shaped phosphor of (red), G (green), and B (blue). In ITC adjustment, a CP ring or deflection yoke composed of a magnet for color purity adjustment provided at the neck of the cathode ray tube, or a separately provided adjustment coil is used as the adjustment means for adjusting the position of the electron beam with respect to the phosphor. Has been. At present, the emission brightness of the phosphor is used as a criterion for determining whether or not the electron beam position-adjusted by such adjusting means strikes the phosphor correctly. That is, since the light emitting area of the phosphor and the brightness thereof are generally in a proportional relationship, the state where the electron beam hits the phosphor correctly when the brightness becomes maximum, that is, the center of the electron beam and the phosphor It is determined that the centers of the two match.
第4図において、偏向ヨーク,CPリングを動かしたり、
あるいは電流を流した調整コイルを近づけたりして、電
子ビーム21を蛍光体1に対して電子ビーム22,23の位置
に移動させるとき、電子ビーム22の位置で蛍光体1の輝
度が最大となれば、その位置を最適位置とする。In Fig. 4, moving the deflection yoke and CP ring,
Alternatively, when the electron beam 2 1 is moved to the positions of the electron beams 2 2 and 2 3 with respect to the phosphor 1 by moving an adjustment coil to which a current is passed, the brightness of the phosphor 1 at the position of the electron beam 2 2. If is the maximum, the position is set as the optimum position.
第5図において、電子ビームを基準点0から+,−方向
へ移動させ、各点に対する輝度を求めてカーブを描くと
き、最大輝度と基準点0との距離(移動量)が、電子ビ
ームと蛍光体とのずれ量aである。In FIG. 5, when the electron beam is moved in the + and-directions from the reference point 0 and the brightness for each point is obtained and a curve is drawn, the distance (movement amount) between the maximum brightness and the reference point 0 corresponds to the electron beam. The amount of deviation a from the phosphor.
従来の陰極線管の電子ビーム調整は以上のように行われ
ているので、現状の量産品としての陰極線管の製造技術
では、全ての製品又は個々の製品について、全ての蛍光
体を均一な厚さで塗布することは困難であり、これにそ
の他の外的要因等が加わると、蛍光体の発光面積と輝度
との比例関係が崩れて来る。このため第6図に示すよう
に電子ビームの位置(発光面積)と輝度とが比例しなく
なり、従って、単に最大輝度が得られる位置と基準点0
との距離をずれ量aとすると、真の最適位置より誤差が
生じることになる等の問題点があった。Since the electron beam adjustment of the conventional cathode ray tube is performed as described above, in the current manufacturing technology of the cathode ray tube as a mass-produced product, all the phosphors of all the products or individual products have a uniform thickness. Is difficult to apply, and if other external factors or the like are added to this, the proportional relationship between the light emitting area of the phosphor and the brightness is broken. Therefore, as shown in FIG. 6, the position of the electron beam (light emitting area) is not proportional to the brightness, and therefore the position where the maximum brightness is simply obtained and the reference point 0
There is a problem that an error occurs from the true optimum position when the distance between and is the shift amount a.
この発明は上記のような問題点を解消するために成され
たもので、蛍光体の発光面積と輝度との比例関係の崩れ
を補正して、正しい最適位置及びずれ量aを求めること
のできる陰極線管の電子ビーム調整装置を得ることを目
的とする。The present invention has been made to solve the above problems, and corrects the collapse of the proportional relationship between the light emitting area of the phosphor and the luminance, and can obtain the correct optimum position and shift amount a. An object is to obtain an electron beam adjusting device for a cathode ray tube.
この発明に係る陰極線管の電子ビーム調整装置は、R,G,
Bのドット状の蛍光体のいずれか一つの上での電子ビー
ムの照射位置を移動させる調整手段と、上記電子ビーム
の複数の照射位置における上記蛍光体の複数の輝度値を
検出する検出手段と、この検出手段から得られる複数の
輝度値と上記電子ビームの複数の照射位置との関係に基
づいて、その関係に近似する、輝度値と上記電子ビーム
の位置との関係を示す連続する近似曲線を求め、この近
似曲線の輝度値のピーク値を求める演算手段とを備え、
前記調整手段により前記電子ビームの位置を該ピーク値
に対応する電子ビームの位置に一致させるようにしたも
のである。The electron beam adjusting device for a cathode ray tube according to the present invention is R, G,
Adjusting means for moving the irradiation position of the electron beam on any one of the dot-shaped phosphor of B, and detection means for detecting a plurality of brightness values of the phosphor at a plurality of irradiation positions of the electron beam , A continuous approximation curve indicating the relationship between the brightness value and the position of the electron beam, which is approximate to the relationship between the plurality of brightness values obtained from the detecting means and the plurality of irradiation positions of the electron beam And calculating means for calculating the peak value of the brightness value of this approximate curve,
The position of the electron beam is made to coincide with the position of the electron beam corresponding to the peak value by the adjusting means.
この発明における陰極線管の電子ビーム調整装置は近似
曲線のピーク値を求めた後、調整手段を調整して、輝度
がピーク値となるようにすれば電子ビームを最適位置に
することができる。The electron beam adjusting apparatus for a cathode ray tube according to the present invention can obtain the electron beam at the optimum position by obtaining the peak value of the approximate curve and then adjusting the adjusting means so that the brightness reaches the peak value.
以下、この発明の一実施例を図について説明する。第1
図において、3は陰極線管、4は陰極線管3のネック部
に設けられた偏向ヨーク、5は陰極線管3のネック部に
設けられたCPリング、6は陰極線管3の管面にR,G,Bの
ラスタを出すための偏向回路等を含む駆動回路、7は陰
極線管3の管面を撮影して輝度を測定するカメラ、8は
カメラ7から得られる輝度信号を増幅するアンプ、9は
アンプ8の出力信号をディジタル信号に変換するA/D変
換器、10はA/D変換器9から得られるディジタル信号を
処理して、後述する近似曲線を求めると共に、この近似
曲線のピーク値を求める演算手段で、この実施例ではマ
イクロコンピュータを含む演算回路が用いられている。
カメラ7,アンプ8及びA/D変換器9により、輝度は検出
する検出手段が構成されている。An embodiment of the present invention will be described below with reference to the drawings. First
In the figure, 3 is a cathode ray tube, 4 is a deflection yoke provided at the neck portion of the cathode ray tube 3, 5 is a CP ring provided at the neck portion of the cathode ray tube 3, and 6 is R, G on the tube surface of the cathode ray tube 3. , A drive circuit including a deflection circuit for outputting the raster of B, 7 is a camera for photographing the tube surface of the cathode ray tube 3 and measuring the brightness, 8 is an amplifier for amplifying the brightness signal obtained from the camera 7, and 9 is An A / D converter for converting the output signal of the amplifier 8 into a digital signal, 10 processes the digital signal obtained from the A / D converter 9 to obtain an approximate curve to be described later, and to calculate the peak value of the approximate curve. In this embodiment, an arithmetic circuit including a microcomputer is used as the arithmetic means to be obtained.
The camera 7, the amplifier 8 and the A / D converter 9 constitute a detecting means for detecting the brightness.
次に動作について説明する。全ての蛍光体が管面に均一
な厚さで塗布されている理想的な陰極線管の場合は、電
子ビームの中心と蛍光体の中心とが一致し最大輝度が得
られている状態から、電子ビームを左右(+,−方向)
に振ると、電子ビームの移動量に対する輝度は左右対称
に変化するはずである。この発明は上記の考え方に基く
もので、電子ビームの移動量に対する輝度の変化を検出
して、その近似曲線を求め、この近似曲線のピーク値を
補正値として用いるようにしたものである。即ち、先ず
第2図において、電子ビームの各位置に対する輝度を測
定し、これをプロットして得られる特性Aに基いて、こ
の特性Aに近似する2次元的な近似曲線Bを求める。次
にこの近似曲線Bのピーク点pのピーク値を求めてこれ
を電子ビームの最適位置とする。Next, the operation will be described. In the case of an ideal cathode ray tube in which all the phosphors are coated on the tube surface with a uniform thickness, the electron beam center and the phosphor center coincide with each other and the maximum brightness is obtained. Left and right beam (+,-direction)
When shaken, the luminance with respect to the amount of movement of the electron beam should change symmetrically. The present invention is based on the above concept, and detects a change in luminance with respect to the amount of movement of an electron beam, obtains an approximate curve thereof, and uses a peak value of the approximate curve as a correction value. That is, first, in FIG. 2, the brightness at each position of the electron beam is measured, and based on the characteristic A obtained by plotting this, a two-dimensional approximation curve B approximating the characteristic A is obtained. Next, the peak value of the peak point p of the approximate curve B is obtained and this is set as the optimum position of the electron beam.
上述した原理に基づく第1図の動作について第3図のフ
ローチャートと共に説明する。先ずステップST(1)に
おいて、駆動回路6を動作させて、陰極線管3の電子ビ
ームを管面上で走査させ、これにより変化する輝度をカ
メラ7で測定する。この測定された輝度信号は、ステッ
プST(2)において、アンプ8を通じてA/D変換器9に
より輝度値を示すデータとしてのディジタル信号に変換
される。このステップST(1),ST(2)による処理は
ステップST(3)で測定の終了が判断されるまで行われ
る。この間、測定されたデータは演算回路10に送られ
て、電子ビームの位置と共に保持される。測定が終了す
るとステップST(4)に進み、演算回路10に近似範囲や
近似に必要なデータ間隔等をインプットし、これらに応
じて測定データをプロットして特性Aを求める。次にこ
の特性Aに近似する2次元の近似曲線Bを算出し、さら
にこの近似曲線Bのピーク点pのピーク値及びずれ量a
等を求めてこれを保持する。次にステップST(5)にお
いて、調整手段を用いて、電子ビームを移動させ、この
とき測定された輝度が上記ピーク値と一致するように調
整する。そしてステップST(6)で輝度がピーク値と一
致したことが検出されたら終了とする。The operation of FIG. 1 based on the above principle will be described with the flowchart of FIG. First, in step ST (1), the drive circuit 6 is operated to scan the electron beam of the cathode ray tube 3 on the tube surface, and the camera 7 measures the brightness which changes accordingly. The measured luminance signal is converted into a digital signal as data indicating a luminance value by the A / D converter 9 through the amplifier 8 in step ST (2). The processing in steps ST (1) and ST (2) is performed until the end of measurement is determined in step ST (3). During this time, the measured data is sent to the arithmetic circuit 10 and held together with the position of the electron beam. When the measurement is completed, the process proceeds to step ST (4), the approximation range and the data interval required for the approximation are input to the arithmetic circuit 10, and the measured data is plotted according to these to obtain the characteristic A. Next, a two-dimensional approximation curve B that approximates the characteristic A is calculated, and the peak value of the peak point p of this approximation curve B and the shift amount a are calculated.
And so on, and so on. Next, in step ST (5), the adjusting means is used to move the electron beam and adjust so that the brightness measured at this time matches the peak value. When it is detected in step ST (6) that the brightness matches the peak value, the process ends.
なお、上記実施例では、陰極線管3のITC調整を行う場
合について説明したが、一定輝度の発光体を焦点を種々
変更して輝度の測定を行うことにより、カメラのフォー
カス調整を行うこともできる。In the above embodiment, the case where the ITC adjustment of the cathode ray tube 3 is performed has been described, but the focus adjustment of the camera can be performed by changing the focal point of the light emitting body having a constant luminance and measuring the luminance. .
以上のように、この発明によれば、電子ビームの位置と
輝度との関係を、実際の測定データに基いて近似化した
曲線と成し、この近似曲線のピーク値が得られる点を電
子ビームの最適位置と成すように構成したので、蛍光体
のばらつきや外的要因等を補正することができ、また少
ない数の測定データで精度の高い且つ測定速度の速い調
整を行うことができる効果がある。As described above, according to the present invention, the relationship between the position of the electron beam and the brightness is formed as a curve approximated based on the actual measurement data, and the point at which the peak value of the approximated curve is obtained is the electron beam. Since it is configured to be the optimum position of, it is possible to correct the variation of the phosphor, external factors, etc., and also it is possible to perform adjustment with high accuracy and fast measurement speed with a small number of measurement data. is there.
第1図はこの発明の一実施例による陰極線管の電子ビー
ム調整装置を示すブロック図、第2図は同装置の原理を
説明するためのグラフ図、第3図は同装置の動作を説明
するためのフローチャート、第4図は従来の陰極線管の
電子ビーム調整方法を説明する電子ビームと蛍光体を示
す図、第5図は従来の調整方法の原理を説明するための
グラフ図、第6図は従来の調整方法の問題点を説明する
ためのグラフ図である。 3は陰極線管、4は偏向ヨーク、5はCPリング、7はカ
メラ、8はアンプ、9はA/D変換器、10は演算回路。 なお、図中、同一符号は同一、又は相当部分を示す。FIG. 1 is a block diagram showing an electron beam adjusting device for a cathode ray tube according to an embodiment of the present invention, FIG. 2 is a graph diagram for explaining the principle of the device, and FIG. 3 is a diagram for explaining the operation of the device. FIG. 4 is a flowchart showing an electron beam and a phosphor for explaining an electron beam adjusting method for a conventional cathode ray tube, FIG. 5 is a graph for explaining the principle of the conventional adjusting method, and FIG. [Fig. 6] is a graph for explaining problems of the conventional adjustment method. 3 is a cathode ray tube, 4 is a deflection yoke, 5 is a CP ring, 7 is a camera, 8 is an amplifier, 9 is an A / D converter, and 10 is an arithmetic circuit. In the drawings, the same reference numerals indicate the same or corresponding parts.
Claims (1)
の上での電子ビームの照射位置を移動させる調整手段
と、上記電子ビームの複数の照射位置における上記蛍光
体の複数の輝度値を検出する検出手段と、この検出手段
から得られる複数の輝度値と上記電子ビームの複数の照
射位置との関係に基いて、該関係に近似する、輝度値と
上記電子ビームの位置との関係を示す連続する近似曲線
を求め、この近似曲線の輝度値のピーク値を求める演算
手段とを備え、前記調整手段により前記電子ビームの位
置を該ピーク値に対応する電子ビームの位置に一致させ
るようにしたことを特徴とする陰極線管の電子ビーム調
整装置。1. Adjustment means for moving an irradiation position of an electron beam on one of R, G, B dot-shaped phosphors, and a plurality of the phosphors at a plurality of irradiation positions of the electron beam. Of the brightness value and the position of the electron beam approximated to the relationship based on the relationship between the plurality of brightness values obtained from the detection means and the plurality of irradiation positions of the electron beam. And a calculating means for obtaining a peak value of the brightness value of the approximate curve, and the adjusting means adjusts the position of the electron beam to the position of the electron beam corresponding to the peak value. An electron beam adjusting device for a cathode ray tube, characterized in that they are matched.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63273317A JPH0738294B2 (en) | 1988-10-31 | 1988-10-31 | Electron beam adjusting device for cathode ray tube |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63273317A JPH0738294B2 (en) | 1988-10-31 | 1988-10-31 | Electron beam adjusting device for cathode ray tube |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02121231A JPH02121231A (en) | 1990-05-09 |
| JPH0738294B2 true JPH0738294B2 (en) | 1995-04-26 |
Family
ID=17526197
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63273317A Expired - Fee Related JPH0738294B2 (en) | 1988-10-31 | 1988-10-31 | Electron beam adjusting device for cathode ray tube |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0738294B2 (en) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61211935A (en) * | 1985-03-15 | 1986-09-20 | Toshiba Corp | Convergence amount detective method of color cathode-ray tube |
| JPH0646543B2 (en) * | 1985-05-31 | 1994-06-15 | ソニー株式会社 | How to measure the convergence of a picture tube |
-
1988
- 1988-10-31 JP JP63273317A patent/JPH0738294B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02121231A (en) | 1990-05-09 |
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