JPH0772122A - Leak flux flaw detection method and apparatus for internal defect of magnetic material - Google Patents
Leak flux flaw detection method and apparatus for internal defect of magnetic materialInfo
- Publication number
- JPH0772122A JPH0772122A JP22122493A JP22122493A JPH0772122A JP H0772122 A JPH0772122 A JP H0772122A JP 22122493 A JP22122493 A JP 22122493A JP 22122493 A JP22122493 A JP 22122493A JP H0772122 A JPH0772122 A JP H0772122A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- magnetic
- magnetic field
- magnetic flux
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 title claims abstract description 81
- 230000004907 flux Effects 0.000 title claims abstract description 59
- 239000000696 magnetic material Substances 0.000 title claims abstract description 49
- 238000001514 detection method Methods 0.000 title claims abstract description 42
- 238000012545 processing Methods 0.000 claims abstract description 28
- 230000002194 synthesizing effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 9
- 230000004069 differentiation Effects 0.000 abstract description 3
- 230000010354 integration Effects 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract 4
- 238000010586 diagram Methods 0.000 description 15
- 238000011156 evaluation Methods 0.000 description 5
- 230000003321 amplification Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000007920 subcutaneous administration Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、磁性材料内部欠陥の漏
洩磁束探傷方法及びその装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a leakage magnetic flux flaw detection method for an internal defect of a magnetic material and an apparatus therefor.
【0002】[0002]
【従来の技術】従来から、磁性材料内部欠陥の探傷方法
として種々の非破壊検査法が実用化されており、存在が
予想される欠陥の種類に応じて適切な探傷方法が採用さ
れている。例えば割れなどの面状欠陥の検出には超音波
探傷法を適用すると欠陥位置を容易に察知でき、被検体
面に奥行きをもつ欠陥の検出には放射線透過法を適用す
ると、欠陥形状が容易に察知できる。しかし、前者の超
音波探傷法では欠陥形状の定量評価は困難であり、後者
の放射線透過法では欠陥位置の把握は困難という短所も
併せもっている。また、漏洩磁束探傷法は磁性材料の表
面あるいは皮下欠陥については検出性が優れているが、
内部欠陥に対しては検出性が劣るという欠点をもってい
る。ところでこの磁性材料内部欠陥の漏洩磁束接傷方法
及びその装置についてとりあげ、その従来技術を述べる
と以下に示す通りである。2. Description of the Related Art Conventionally, various nondestructive inspection methods have been put into practical use as flaw detection methods for defects in magnetic materials, and appropriate flaw detection methods are adopted according to the types of defects expected to exist. For example, if ultrasonic flaw detection is used to detect planar defects such as cracks, the defect position can be easily detected, and if a radiation transmission method is applied to detect defects with a depth on the subject surface, the defect shape can be easily detected. I can detect. However, the former ultrasonic flaw detection method is difficult to quantitatively evaluate the defect shape, and the latter radiation transmission method is also difficult to grasp the defect position. Also, although the magnetic flux leakage flaw detection method has excellent detectability for surface or subcutaneous defects of magnetic materials,
It has the drawback of being inferior in detectability to internal defects. By the way, the leakage magnetic flux damage method of the internal defect of the magnetic material and the apparatus therefor will be taken up, and the prior art thereof will be described as follows.
【0003】従来技術は、図8に示されるように磁路を
形成する磁化器1のコイル2に定電圧及び定電流を印加
して一定磁場を発生させ、磁化器1の磁路の両端に当接
する磁性材料3を磁化している。そして磁性材料1の内
部欠陥によって表面に現われる内部欠陥漏洩磁束4と磁
化器1から漏洩する磁化器漏洩磁束5とを、磁性材料3
の表面に配置する磁場検出器6で検出し、出力する電気
信号を増幅装置11で増幅処理し、更にフィルタ12に
よってノイズ成分を除去した後、この電気信号を表示装
置13及び記録装置14に出力し、これによって内部欠
陥7の評価を行っている。In the prior art, as shown in FIG. 8, a constant voltage and a constant current are applied to a coil 2 of a magnetizer 1 forming a magnetic path to generate a constant magnetic field, and both ends of the magnetic path of the magnetizer 1 are generated. The abutting magnetic material 3 is magnetized. The internal defect leakage magnetic flux 4 appearing on the surface due to the internal defect of the magnetic material 1 and the magnetizer leakage magnetic flux 5 leaking from the magnetizer 1 are transferred to the magnetic material 3
The electric signal detected and output by the magnetic field detector 6 arranged on the surface of is amplified by the amplifying device 11, and the noise component is removed by the filter 12, and then the electric signal is output to the display device 13 and the recording device 14. Then, the internal defect 7 is evaluated by this.
【0004】[0004]
【発明が解決しようとする課題】上記した従来技術によ
る磁性材料3の内部欠陥7の評価は、内部欠陥漏洩磁束
4と磁化器漏洩磁束5の密度に比例して出力される磁場
検出器6からの電気信号レベルを基に行っている。とこ
ろが、この内部欠陥漏洩磁束4の密度は、表面欠陥また
は皮下欠陥から漏洩する磁束密度と比較すると非常に小
さいため、増幅処理しても磁性材料3の磁化力の変化の
影響を大きく受ける。そしてこの磁性材料3が受ける磁
化力は、たとえ一定磁場を発生させた磁化器1により磁
化させても、磁化器1と磁性材料3の接触状態によって
変化する。このようなことから磁場検出器6から出力さ
れる電気信号レベルは、磁化器1と磁性材料3の接触状
態の影響を大きく受け精度の高い内部欠陥の評価ができ
ない。The evaluation of the internal defect 7 of the magnetic material 3 according to the above-mentioned conventional technique is performed by the magnetic field detector 6 which is output in proportion to the density of the internal defect leakage magnetic flux 4 and the magnetizer leakage magnetic flux 5. It is based on the electric signal level of. However, since the density of the internal defect leakage magnetic flux 4 is very small compared to the magnetic flux density leaked from the surface defect or the subcutaneous defect, even if the amplification process is performed, it is greatly affected by the change in the magnetizing force of the magnetic material 3. The magnetizing force received by the magnetic material 3 changes depending on the contact state between the magnetizer 1 and the magnetic material 3, even if the magnetizer 1 that has generated a constant magnetic field magnetizes the magnetizing force. For this reason, the electric signal level output from the magnetic field detector 6 is greatly affected by the contact state between the magnetizer 1 and the magnetic material 3, and the internal defect with high accuracy cannot be evaluated.
【0005】更に、磁場検出器6は磁化器漏洩磁束5も
検出し、この成分は内部欠陥漏洩磁束4の成分とほぼ同
等であることからフィルタで除去され難く、ノイズ信号
として表示装置13及び記録装置14に出力されるので
内部欠陥評価を行う上で障害となっていた。Further, the magnetic field detector 6 also detects the magnetizer leakage magnetic flux 5, and since this component is almost the same as the component of the internal defect leakage magnetic flux 4, it is difficult to remove it by the filter, and as a noise signal, the display device 13 and recording are performed. Since it is output to the device 14, it has been an obstacle to the evaluation of internal defects.
【0006】次に、前記の漏洩磁束探傷方法により、近
接した複数の内部欠陥が有する磁性材料を検査する場合
を図9〜図12を用いて説明する。内部欠陥7から磁性
材料3の表面に漏洩する磁束4は、図9に示す如く単独
欠陥の場合でも欠陥巾よりかなり巾広く分布するため、
表示装置及び記録装置に出力される信号は図10に示す
ようにゆっくり出力変化している状況を示す巾広い波形
になる。そして図11に示す如く近接した複数の内部欠
陥では、夫々の欠陥から漏洩する磁束は干渉し合い、更
に巾広く分布するため、表示装置及び記録装置に出力さ
れる信号は、図12に示すように各々の内部欠陥に対応
した分離波形が得られず、夫々欠陥についての評価を精
度良く行うことは困難であった。Next, a case of inspecting a magnetic material having a plurality of adjacent internal defects by the above-mentioned leakage magnetic flux flaw detection method will be described with reference to FIGS. The magnetic flux 4 leaking from the internal defect 7 to the surface of the magnetic material 3 is distributed considerably wider than the defect width even in the case of a single defect as shown in FIG.
The signal output to the display device and the recording device has a wide waveform indicating a situation where the output is slowly changing as shown in FIG. Then, as shown in FIG. 11, in a plurality of adjacent internal defects, the magnetic fluxes leaking from the respective defects interfere with each other and are distributed over a wider range. Therefore, the signals output to the display device and the recording device are as shown in FIG. In addition, a separated waveform corresponding to each internal defect was not obtained, and it was difficult to accurately evaluate each defect.
【0007】このため新たな磁性材料内部欠陥の漏洩磁
束探傷方法及びその装置の開発が要望されている。Therefore, there is a demand for the development of a new magnetic flux flaw detection method for magnetic defects inside the magnetic material and a device therefor.
【0008】本発明は、かかる事情に鑑みなされたもの
であり、磁化器と被検体の接触状態及び磁化器から漏洩
する磁束の影響を受けることなく、しかも近接する複数
の内部欠陥の評価まで精度良く行うことができる磁性材
料の漏洩磁束探傷方法及びその装置を提供することにあ
る。The present invention has been made in view of the above circumstances, and is capable of accurately evaluating a plurality of adjacent internal defects without being affected by the contact state between the magnetizer and the subject and the magnetic flux leaking from the magnetizer. (EN) It is an object to provide a magnetic flux leakage flaw detection method for a magnetic material and an apparatus therefor that can be well performed.
【0009】[0009]
【課題を解決するための手段】上記した目的を達成する
ために、本発明の磁性材料内部欠陥の漏洩磁束探傷方法
は、磁性材料からなる被検体を磁化し、被検体の内部欠
陥部から表面に漏洩する磁束を磁場検出器により検出
し、その出力信号を、被検体が受ける磁化力で補償した
後、この補償された信号を分岐して、一方を微分処理
し、他方を積分処理して、その微分処理された信号と積
分処理された信号を合成し、その合成出力の波形から欠
陥探傷の評価を行うようにしたものである。In order to achieve the above-mentioned object, the magnetic flux internal flaw leakage magnetic flux flaw detection method of the present invention magnetizes an object made of a magnetic material, and the surface of the object is removed from the internal defect. The magnetic flux that leaks into the magnetic field is detected by a magnetic field detector, and its output signal is compensated by the magnetizing force received by the subject, then the compensated signal is branched, one of them is differentiated, and the other is integrated. The differential processed signal and the integrated processed signal are combined, and the flaw detection is evaluated from the waveform of the combined output.
【0010】また、本発明の磁性材料内部欠陥の漏洩磁
束探傷装置は、被検体を磁化させる磁化器を内蔵し、そ
の磁化器から漏洩する磁束を遮蔽する手段を有する磁化
装置と、被検体の内部欠陥部から表面に漏洩する磁束を
検出する磁場検出器と、被検体が受ける磁化力を検出す
る磁化力検出器と、磁場検出器の信号を磁化力検出器の
信号で補償する信号補償装置と、この信号補償装置から
の信号を増幅処理し、その増幅された信号を分岐して、
一方を微分処理し、他方を積分処理し、それから微分処
理された信号と積分処理された信号を合成して出力する
信号処理装置と、信号処理装置からの出力を探傷結果と
して表示する表示手段と、を具備したことを特徴とする
ものである。Further, the magnetic flux internal flaw detection apparatus for magnetic defects according to the present invention includes a magnetizing device which has a magnetizer for magnetizing the subject and has means for shielding the magnetic flux leaking from the magnetizer, and the magnetizing device. A magnetic field detector that detects the magnetic flux leaking from the internal defect to the surface, a magnetizing force detector that detects the magnetizing force received by the subject, and a signal compensator that compensates the signal of the magnetic field detector with the signal of the magnetizing force detector. And the signal from this signal compensator is amplified, and the amplified signal is branched,
A signal processing device that performs differential processing on one side and integrates the other side, and then combines and outputs the differentiated signal and the integrated signal, and a display unit that displays the output from the signal processing device as a flaw detection result. , Are provided.
【0011】[0011]
【作用】本発明の漏洩磁束探傷方法においては、磁場検
出器の信号を磁化力検出器の信号で補償しているので、
欠陥評価の基になる磁場検出器の信号は、磁性材料と磁
化器の接触状態により変化する磁性材料が受けている磁
化力の影響を受けることがなく、また、信号補償装置に
より処理された信号は、微分処理されて急峻な出力波形
となり、また積分処理されて低い周波数(ドリフト)成
分を除去するで、近接した複数の内部欠陥から漏洩する
巾広く分布した磁束を検出した場合でも夫々欠陥に対応
して信号を分離できるので、表示手段に表示される波形
から夫々欠陥の評価を容易に行うことができる。In the leakage magnetic flux flaw detection method of the present invention, since the signal of the magnetic field detector is compensated by the signal of the magnetizing force detector,
The signal of the magnetic field detector, which is the basis of the defect evaluation, is not affected by the magnetizing force applied to the magnetic material, which changes depending on the contact state between the magnetic material and the magnetizer, and the signal processed by the signal compensator. Is differentiated to form a steep output waveform, and integrated to remove low-frequency (drift) components, so that even if a widely distributed magnetic flux leaking from a plurality of adjacent internal defects is detected, each defect is detected. Since the signals can be separated correspondingly, the defects can be easily evaluated from the waveforms displayed on the display means.
【0012】本発明の漏洩磁束探傷装置においては、磁
化装置に具備した磁界遮蔽器により磁化器から漏洩する
磁束を遮蔽しているので、磁場検出器は内部欠陥漏洩磁
束のみを検出し、またこの信号を磁化力検出器の信号で
補償する信号補償装置で処理し、更には信号処理装置は
信号補償装置の出力信号を増幅処理し、その後分岐し
て、一方の分岐信号を微分処理して急峻な出力波形を成
形し、他方の分岐信号が積分処理して低周波数成分を取
り除き、微分処理し波形と積分しと波形とを合成し出力
するので、表示手段に出力される信号にノイズがでるこ
とがなく、表示手段に表示される波形は、近接した内部
欠陥が近接していてもそれらに対応して分離されたもの
となり、内部欠陥を容易に評価できる。In the leakage magnetic flux flaw detector of the present invention, since the magnetic flux leaking from the magnetizer is shielded by the magnetic field shield included in the magnetizing device, the magnetic field detector detects only the internal defect leakage magnetic flux. The signal is processed by the signal compensator that compensates with the signal of the magnetizing force detector, and the signal processor further amplifies the output signal of the signal compensator, and then branches and one branch signal is differentiated and steepened. Since the output signal of the other branch is shaped, the other branch signal is integrated to remove low-frequency components, the differential processing is performed, the waveform is integrated and the waveform is synthesized and output, so that noise is generated in the signal output to the display means. Therefore, even if adjacent internal defects are close to each other, the waveform displayed on the display unit is separated correspondingly, and the internal defects can be easily evaluated.
【0013】[0013]
【実施例】以下、本発明の一実施例を図面に基づいて説
明する。図1は本発明の磁性材料内部欠陥の漏洩磁束探
傷方法を具現化する制御回路のブロック図である。この
制御回路は、磁性材料からなる被検体を磁化することに
よって被検体内部欠陥部から表面に漏洩する磁束を検出
する磁場検出器6と、被検体が受けている磁化力を検出
する磁化力検出器8と、磁場検出器6の信号を磁化力検
出器8の信号で補償する信号補償装置15と、この信号
補償装置15からの出力信号を増幅処理する増幅器1
7、微分処理する微分器18及び積分処理する積分器1
9から成る信号処理装置16と、この信号処理装置16
の出力を探傷結果として表示する表示手段としての表示
装置13、記録装置14によって構成されている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram of a control circuit that embodies the magnetic flux leakage flaw detection method for defects inside a magnetic material according to the present invention. This control circuit includes a magnetic field detector 6 for detecting a magnetic flux leaking from the internal defect portion of the subject to the surface by magnetizing the subject made of a magnetic material, and a magnetizing force detection for detecting a magnetizing force received by the subject. Device 8, a signal compensator 15 for compensating the signal of the magnetic field detector 6 with the signal of the magnetizing force detector 8, and an amplifier 1 for amplifying an output signal from the signal compensator 15.
7. Differentiator 18 for differential processing and integrator 1 for integral processing
And a signal processing device 16 including the signal processing device 16.
The display device 13 and the recording device 14 function as a display unit for displaying the output of (1) as the flaw detection result.
【0014】次に上記のように構成される制御回路を、
さらに図2に示す信号処理回路図により詳しく説明す
る。内部欠陥漏洩磁束密度に比例して内部抵抗値R1が
変化する磁場検出器6と被検体が受けている磁化力に比
例して内部抵抗値R2が変化する磁化力検出器8を差動
構成させた信号補償装置15によって、磁場検出信号は
磁化力検出器信号で差動補償され、信号処理装置16に
出力される。信号処理装置16に入力された信号は増幅
器17で可変抵抗R3を変化させることによって任意に
増幅処理され、そして増幅された信号は分岐して一方が
微分器18に、他方が積分器19に出力される。微分器
18では図3に示すようなゆっくりした入力信号波形で
も微分回路の時定数(τ=R4C1の値)を小さくするこ
とによって図4に示すような急峻な出力波形が得られ、
また、図5に示すように近接した複数の内部欠陥の入力
信号でも、出力波形は図6に示すように各欠陥毎に分離
されている。なお、微分器18は、コンデンサC1、抵
抗R4それぞれに並列に抵抗R5、コンデンサーC2を入
れたことにより、欠陥信号より高い周波数成分(ノイ
ズ)が除去できるものである。また、積分器19は微分
器18に対し並列に接続し、高い周波数成分を除去し
て、微分回路と等しいゲインをもたせて、低い周波数
(ドリフト)成分を相殺している。Next, the control circuit configured as described above is
Further, a detailed description will be given with reference to the signal processing circuit diagram shown in FIG. The magnetic field detector 6 whose internal resistance value R 1 changes in proportion to the internal defect leakage magnetic flux density and the magnetic force detector 8 whose internal resistance value R 2 changes in proportion to the magnetizing force received by the subject are differentially detected. The magnetic field detection signal is differentially compensated by the magnetizing force detector signal by the configured signal compensator 15 and output to the signal processor 16. The signal input to the signal processing device 16 is arbitrarily amplified by changing the variable resistor R 3 by the amplifier 17, and the amplified signal is branched and one is fed to the differentiator 18 and the other is fed to the integrator 19. Is output. In the differentiator 18, even with a slow input signal waveform as shown in FIG. 3, a steep output waveform as shown in FIG. 4 can be obtained by reducing the time constant (τ = R 4 C 1 value) of the differentiating circuit.
Further, even with input signals of a plurality of adjacent internal defects as shown in FIG. 5, output waveforms are separated for each defect as shown in FIG. Note that the differentiator 18 can remove a frequency component (noise) higher than the defect signal by inserting the resistor R 5 and the capacitor C 2 in parallel with the capacitor C 1 and the resistor R 4, respectively. Further, the integrator 19 is connected in parallel to the differentiator 18, removes high frequency components, gives a gain equal to that of the differentiating circuit, and cancels low frequency (drift) components.
【0015】このように微分器18及び積分器19で処
理された信号は合成され、その合成された信号は、探傷
結果として表示装置13に出力されるとともに記録装置
14で記録され、この探傷結果により精度の高い欠陥評
価が行われる。The signals thus processed by the differentiator 18 and the integrator 19 are combined, and the combined signal is output to the display unit 13 as a flaw detection result and recorded by the recording unit 14, and the flaw detection result is obtained. Due to this, highly accurate defect evaluation is performed.
【0016】図7は本発明の磁性材料内部欠陥の漏洩磁
束探傷装置の一実施例を示す全体構成図であり、磁性材
料の内部欠陥を検査している状況を示している。図中の
符号9は、磁性材料3を磁化させる磁路を有する磁化器
1と、磁化器1からの漏洩磁束5を遮蔽する磁界遮蔽器
10を備えた磁化装置である。そして、磁場検出器6は
移動手段(図示せず)により磁性材料3の表面を縦方向
及び横方向に走査させるようになっており、磁化力検出
器8は磁性材料3の表面に位置させ表面磁場を検出す
る。また、信号補償装置15は磁場検出信号を磁化力検
出信号で補償するようになっており、補償処理された信
号は、信号処理装置16によって増幅処理され、増幅さ
れた信号は分岐されて一方が微分処理され他方が積分処
理され、その後合成されて、探傷結果を表示する表示装
置13、及び探傷結果を記録する記録装置14に出力さ
れる。FIG. 7 is an overall configuration diagram showing an embodiment of a magnetic flux leakage flaw detection apparatus for defects in magnetic materials according to the present invention, showing a situation in which internal defects in magnetic materials are inspected. Reference numeral 9 in the drawing is a magnetizing device including a magnetizer 1 having a magnetic path for magnetizing the magnetic material 3 and a magnetic field shield 10 for shielding the leakage magnetic flux 5 from the magnetizer 1. The magnetic field detector 6 is adapted to scan the surface of the magnetic material 3 in the vertical and horizontal directions by moving means (not shown). Detect magnetic field. Further, the signal compensator 15 is adapted to compensate the magnetic field detection signal with the magnetizing force detection signal. The signal subjected to the compensation processing is amplified by the signal processing device 16, and the amplified signal is branched so that one of the signals is branched. The differential processing is performed, the other is integrated, and then the two are combined and output to the display device 13 that displays the flaw detection result and the recording device 14 that records the flaw detection result.
【0017】次に、このように構成された本装置を用い
磁性材料3の内部欠陥7を検査する場合について説明す
る。まず、磁化装置9の磁路の両端を磁性材料3に当
て、コイル2に定電流及び定電圧を印加し、磁化器1に
一定磁場を発生させ、磁性材料3を磁化する。Next, the case of inspecting the internal defects 7 of the magnetic material 3 using the present apparatus having the above-described structure will be described. First, both ends of the magnetic path of the magnetizing device 9 are applied to the magnetic material 3, a constant current and a constant voltage are applied to the coil 2, a constant magnetic field is generated in the magnetizer 1, and the magnetic material 3 is magnetized.
【0018】磁性材料3は磁化されることによって内部
欠陥部からその材料表面に漏洩磁束4が発生し、この磁
束4は、磁性材料3の表面上を縦横に走査する磁場検出
器6によって検出される。ここで、内部欠陥漏洩磁束4
は、欠陥の大きさに比例して分布しているので、磁場検
出器6の出力信号も欠陥の大きさに対応した信号を出力
し、信号補償装置15に送っている。また、磁性材料3
の表面に配置した磁化力検出器8は磁性材料3の表面磁
場を検出し、表面磁場強度に対応した信号を出力し、信
号補償装置15に送っている。ここで、磁化器1から漏
洩する磁化器漏洩磁束5は磁界遮蔽器10によって遮蔽
されているので、磁場検出器6及び磁化力検出器8で検
出されることはない。When the magnetic material 3 is magnetized, a leakage magnetic flux 4 is generated from the internal defect portion on the surface of the magnetic material 3. The magnetic flux 4 is detected by a magnetic field detector 6 which scans the surface of the magnetic material 3 vertically and horizontally. It Here, the internal defect leakage magnetic flux 4
Is distributed in proportion to the size of the defect, the output signal of the magnetic field detector 6 also outputs a signal corresponding to the size of the defect and sends it to the signal compensator 15. In addition, magnetic material 3
The magnetizing force detector 8 arranged on the surface of detects the surface magnetic field of the magnetic material 3, outputs a signal corresponding to the surface magnetic field strength, and sends it to the signal compensator 15. Here, since the magnetizer leakage magnetic flux 5 leaking from the magnetizer 1 is shielded by the magnetic field shield 10, it is not detected by the magnetic field detector 6 and the magnetizing force detector 8.
【0019】信号補償装置15は磁場検出信号を磁化力
検出器信号で補償し、この信号は信号処理装置16に送
り、増幅処理、微分処理、積分処理し、探傷結果は表示
装置13に表示すると共に記録は記録装置14により出
力される。The signal compensator 15 compensates the magnetic field detection signal with the magnetizing force detector signal, sends this signal to the signal processor 16 for amplification processing, differentiation processing and integration processing, and displays the flaw detection result on the display device 13. The record is output together with the recording device 14.
【0020】上記した実施例では、磁化器漏洩磁束5を
遮蔽する磁界遮蔽器10の遮蔽板は一重の場合を説明し
たが、これを二重、三重に施してもよく、また銅と鋼の
二重構造にすることもできる。In the above-mentioned embodiment, the case where the shield plate of the magnetic field shield 10 for shielding the magnetizer leakage magnetic flux 5 is a single shield plate has been described, but this may be doubled or tripled, or made of copper and steel. It can also have a double structure.
【0021】前記した図1〜図7に示す実施例では磁性
材料の内部欠陥を漏洩磁束探傷検査する場合について説
明したが、本発明は磁性材料であれば、この表面及び内
面に発生する欠陥探傷に適用できることは言うまでもな
い。また、本発明の磁場検出器信号の補償手段として、
磁性材料の受ける磁化力を補償値として用いた場合を説
明したが、磁化器と磁性材料の接触状態は磁化器から漏
洩する磁束密度にも関係することから、この磁化器から
の漏洩磁束密度を補償値としても何ら問題はない。In the embodiments shown in FIGS. 1 to 7 described above, the case where the magnetic flux internal flaw detection of the magnetic material is inspected has been described. However, in the present invention, if the magnetic material is a magnetic material, flaw detection generated on the surface and the inner surface of the magnetic material is performed. It goes without saying that it can be applied to. Further, as the magnetic field detector signal compensating means of the present invention,
Although the case where the magnetizing force received by the magnetic material is used as the compensation value has been described, the contact state between the magnetizer and the magnetic material is related to the magnetic flux density leaking from the magnetizer. There is no problem as a compensation value.
【0022】[0022]
【発明の効果】本発明の方法によれば、磁性材料の内部
欠陥による漏洩磁束を検出する磁場検出器の信号を磁性
材料が受けている磁化力によって補償するので、磁化器
と磁性材料の接触状態の影響を受けることがなく、そし
て補償された信号を増幅処理した後分岐して、一方の信
号を微分処理して急峻な波形とし、他方の信号を積分処
理して低周波数成分を除去して、それから両信号を合成
して出力するので、近接した複数の内部欠陥に対して識
別の容易な信号波形が得られ、精度の高い内部欠陥評価
が可能となる。According to the method of the present invention, since the signal of the magnetic field detector for detecting the leakage magnetic flux due to the internal defect of the magnetic material is compensated by the magnetizing force received by the magnetic material, the contact between the magnetizer and the magnetic material. The signal that is not affected by the state and that has been compensated is branched after amplification processing, one signal is differentiated to form a steep waveform, and the other signal is integrated to remove low frequency components. Then, since both signals are combined and output, a signal waveform that allows easy identification of a plurality of adjacent internal defects can be obtained, and highly accurate internal defect evaluation becomes possible.
【0023】本発明の装置によれば、上記方法を実施す
る構成要素を備えているとともに、磁化器からの漏洩磁
束を遮蔽する手段を有するので、磁場検出器で検出され
る磁束を内部欠陥による漏洩磁束のみにすることがで
き、ノイズの発生防止が達成できる。According to the apparatus of the present invention, since the apparatus for carrying out the above method is provided and the means for shielding the leakage magnetic flux from the magnetizer is provided, the magnetic flux detected by the magnetic field detector is caused by internal defects. Only the leakage magnetic flux can be used, and the generation of noise can be prevented.
【図1】本発明の漏洩磁束探傷方法の具現化する制御装
置のブロック図である。FIG. 1 is a block diagram of a control device that embodies a magnetic flux leakage flaw detection method of the present invention.
【図2】漏洩磁束の検出信号を処理する信号処理回路を
示す図である。FIG. 2 is a diagram illustrating a signal processing circuit that processes a detection signal of a leakage magnetic flux.
【図3】単独内部欠陥に対応する信号処理前の信号波形
例を示す図である。FIG. 3 is a diagram showing an example of a signal waveform before signal processing corresponding to a single internal defect.
【図4】近接する複数内部欠陥に対応する信号処理前の
信号波形例を示す図である。FIG. 4 is a diagram showing an example of a signal waveform before signal processing corresponding to a plurality of adjacent internal defects.
【図5】単独の内部欠陥に対応して信号処理した探傷出
力信号波形例を示す図である。FIG. 5 is a diagram showing an example of a flaw detection output signal waveform subjected to signal processing corresponding to a single internal defect.
【図6】近接する複数内部欠陥に対応して信号処理した
探傷出力信号波形例を示す図である。FIG. 6 is a diagram showing an example of a flaw detection output signal waveform obtained by signal processing corresponding to a plurality of adjacent internal defects.
【図7】本発明による実施例の漏洩磁束探傷装置の構成
図である。FIG. 7 is a configuration diagram of a leakage magnetic flux flaw detector according to an embodiment of the present invention.
【図8】従来の探傷方法及び探傷装置を示す説明図であ
る。FIG. 8 is an explanatory diagram showing a conventional flaw detection method and flaw detection apparatus.
【図9】単独の内部欠陥における漏洩磁束の様相をを示
す説明図である。FIG. 9 is an explanatory diagram showing the appearance of leakage magnetic flux in a single internal defect.
【図10】近接する複数内部欠陥における漏洩磁束の様
相をを示す説明図である。FIG. 10 is an explanatory diagram showing the appearance of leakage magnetic flux in a plurality of adjacent internal defects.
【図11】従来技術における単独内部欠陥に対応する探
傷信号波形図である。FIG. 11 is a flaw detection signal waveform diagram corresponding to a single internal defect in the related art.
【図12】従来技術における近接する複数内部欠陥に対
応する探傷信号波形図である。FIG. 12 is a flaw detection signal waveform diagram corresponding to a plurality of adjacent internal defects in the related art.
1 磁化器 2 コイル 3 磁性材料 4 内部欠陥漏洩磁束 5 磁化器漏洩洩磁束 6 磁場検出器 7 内部欠陥 8 磁化力検出器 9 磁化装置 10 磁界遮蔽器 11 増幅装置 12 フィルタ 13 表示装置 14 記録装置 15 信号補償装置 16 信号処理装置 17 増幅器 18 微分器 19 積分器 1 Magnetizer 2 Coil 3 Magnetic Material 4 Internal Defect Leakage Flux 5 Magnetizer Leakage Flux 6 Magnetic Field Detector 7 Internal Defect 8 Magnetizing Force Detector 9 Magnetizing Device 10 Magnetic Field Shielder 11 Amplifying Device 12 Filter 13 Display Device 14 Recording Device 15 Signal compensator 16 Signal processor 17 Amplifier 18 Differentiator 19 Integrator
Claims (2)
検体の内部欠陥部から表面に漏洩する磁束を磁場検出器
により検出し、該磁場検出器の出力信号を、前記被検体
が受ける磁化力で補償した後に分岐し、一方を微分処理
し、他方を積分処理し、それから微分処理された信号と
積分された信号を合成し、該合成された信号の波形から
欠陥探傷の評価を行うことを特徴とする磁性材料内部欠
陥の漏洩磁束探傷方法。1. A magnetic field detector magnetizes a subject made of a magnetic material, detects a magnetic flux leaking from an internal defect portion of the subject to the surface, and the subject receives an output signal of the magnetic field detector. After branching after compensating with the magnetizing force, one is differentiated, the other is integrated, and then the differentiated signal and the integrated signal are combined, and the flaw detection is evaluated from the waveform of the combined signal. A leak magnetic flux flaw detection method for defects inside a magnetic material, comprising:
化器を内蔵し、該磁化器から漏洩する磁束を遮蔽する手
段を有する磁化装置と、前記被検体の内部欠陥部から表
面に漏洩する磁束を検出する磁場検出器と、前記被検体
が受ける磁化力を検出する磁化力検出器と、前記磁場検
出器の出力信号を前記磁化力検出器の出力信号で補償す
る信号補償装置と、該信号補償装置からの信号を増幅処
理したのち分岐して、一方を微分処理し、他方を積分処
理し、微分処理された信号と積分された信号を合成して
出力する信号処理装置と、該信号処理装置の出力信号の
波形を探傷結果として表示する表示手段と、を具備して
なることを特徴とした磁性材料内部欠陥の漏洩磁束探傷
装置。2. A magnetizing device having a built-in magnetizer for magnetizing a subject made of a magnetic material and having means for shielding a magnetic flux leaking from the magnetizer, and a magnetic flux leaking from an internal defect portion of the subject to a surface. A magnetic field detector for detecting a magnetic field, a magnetic force detector for detecting a magnetic force received by the subject, a signal compensator for compensating an output signal of the magnetic field detector with an output signal of the magnetic force detector, and the signal. A signal processing device for amplifying a signal from a compensating device, branching the signal, differentiating one of the signals, integrating the other, and synthesizing and outputting the differentiated signal and the integrated signal, and the signal processing A leakage magnetic flux flaw detector for magnetic material internal defects, comprising: a display unit that displays the waveform of the output signal of the apparatus as the flaw detection result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22122493A JPH0772122A (en) | 1993-09-06 | 1993-09-06 | Leak flux flaw detection method and apparatus for internal defect of magnetic material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22122493A JPH0772122A (en) | 1993-09-06 | 1993-09-06 | Leak flux flaw detection method and apparatus for internal defect of magnetic material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0772122A true JPH0772122A (en) | 1995-03-17 |
Family
ID=16763417
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22122493A Pending JPH0772122A (en) | 1993-09-06 | 1993-09-06 | Leak flux flaw detection method and apparatus for internal defect of magnetic material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0772122A (en) |
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