JPH078785U - IC handler using IC device transport tray - Google Patents

Abstract

(57) [Summary] [Purpose] In an IC handler using an IC device transport tray, an IC handler that improves the test efficiency by shortening the time to transfer the IC from the customer tray for transporting the IC device to the test tray for testing. Is intended to provide. In order to achieve the above object, the present invention replaces the conventional test tray with a transport frame which is a frame for accommodating a new type of customer tray, and the customer tray is under the input / output pins of the stored IC device. The customer tray itself is inserted into the transport frame as a structure with a hole in it, and when the transport frame reaches the measuring section, it contacts the measuring socket, and I
The configuration is such that the IC device under test can be tested with the C tester.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to an IC handler using an IC device transport tray in which an IC device under test is stored in a test tray, transported horizontally, and tested in a measuring section.

[0002]

[Prior art]

 In the IC handler, the IC device under test is stored in the test tray, transported horizontally in the IC handler, electrically connected to the measurement socket at the position of the measurement section, and the test is performed using the IC tester. There are two types, one is that the IC device is slid under its own weight and the other is that it is inserted into the socket and tested. The present invention is a method for testing the former IC device to be measured by storing it in a test tray and horizontally transporting it, and particularly to the test tray and the customer tray.

FIG. 3 shows an example of the conventional test tray 10 and customer tray 20. The IC device 30 to be measured is externally stored in the customer tray 20 for transportation and carried to the test room. This IC device 30 to be measured is transferred to the test tray 10, and the test tray 10 is moved in the IC handler by a belt or horizontally on a rail to reach the position of the measuring socket 30 of the measuring section and the IC device to be measured is reached. 30 is tested with an IC tester to determine pass / fail. The IC devices 30 that have been judged as good or bad are sorted into categories of test results and stored in the customer tray 20, and the test tray 10 returns to the initial position.

The problem here is that the IC devices 30 to be measured are transferred from the customer tray 20 to the test tray 10 one by one. Although it may be transferred one by one with a gloved hand, or not shown, the suction manipulator may suck up the IC devices 30 to be measured one by one from the customer tray 20 and automatically transfer them to the test tray 10. In any case, it takes too long. In addition, there is a possibility that the IC device under test 30 will be damaged during the transfer.

[0005]

[Problems to be solved by the device]

 The present invention focuses on both of the trays described above, moves them quickly and safely, increases the test operation time, and reduces the test cost.

[0006]

[Means for Solving the Problems]

 In order to achieve the above object, the present invention uses the conventional test tray 10 only as the frame for accommodating the carrier frame 11 and the customer tray 21 of the present invention, and the IC device 30 to be measured is stored in the frame. The customer tray 21 of the present invention which has been used is fitted, and the customer tray 21 and the transport frame 11 which replaces the conventional test tray 10 are integrated so as to circulate in the IC handler for testing.

[0007]

【Example】

 An embodiment of the present invention will be described with reference to FIGS.

FIG. 1 shows an embodiment of a customer tray 21 of the present invention, which is fitted inside a carrying frame 11 and a carrying frame 11 which are composed only of a frame which replaces the conventional test tray 10.

The transport frame 11 has a size capable of accommodating a plurality of test trays 21 and is configured to be continuously connected to a transport mechanism of an IC handler. The width X, length Y 2, and height Z of the transport frame 11 are fixed, and the storage hole into which the dust tray 21 is inserted has a protrusion on the bottom to support the customer tray 21 and an upper side. Attaches a hook or the like for suppressing and stabilizing the customer tray 21. The positioning of the customer tray 21 may be determined by the outer shape of the bottom side or the side surface of the carrier frame 11, but a pin to the carrier frame 11 and a pin receiver provided on the customer tray 21 are fitted to determine the position. I have eyes.

The outer shape of the customer tray 21 for transportation has such a size and shape that it can fit in the transport frame 11. In the customer tray 21, IC device storage rooms 22 are arranged in a plurality of rows and a plurality of columns, and the IC devices 30 are stored therein. The bottom of the IC device storage chamber 22 of the customer tray 21 has a structure in which a hole is formed right below the input / output pin 31 of the IC device 30, and the contactor 36 of the measuring socket 35 is connected to the input / output pin 31 during the test. Allows for electrical connection. When the customer tray 21 is transported from the outside and the IC devices 30 to be measured are tested in the test room, the IC devices 30 have conventionally been transferred to the test tray one by one. It may be positioned and stored in the transport frame 11.

When the transport frame 11 is horizontally transported in the IC handler by the transport mechanism and reaches the test position of the measuring unit, the measurement socket 35 having the contactor 36 is moved upward from below as shown in FIG. The contactor 36 is pushed up and the input / output pin 31 of the IC device 30 to be measured is electrically connected. Although not shown, the measurement socket 35 is connected to an IC tester, where the test of the IC device under test starts. When the test is completed, the measuring socket 35 descends again and returns to the original position. When the measurement socket 35 returns to the original position, the transport frame 11 moves, and the next measurement IC device 30 is ready for measurement. In this way, the transport frame 11 circulates in the IC handler by the transport mechanism while sequentially measuring the IC devices to be measured. During this circulation process, the measured IC devices 30 are classified into categories based on the measurement data.

[0012]

[Effect of device]

 As described above, in the present invention, the customer tray 21 for transportation is used as it is as a part of the test tray 10. Therefore, it is not necessary to transfer the IC devices to be measured one by one, and the customer tray 21 remains as it is. It suffices to fit it into the transport frame 11. Therefore, it is easy to move and can move safely in a short time. Therefore, the test preparation time can be shortened, the test operation time can be increased, and the test cost can be reduced.

[Brief description of drawings]

FIG. 1 is a diagram of an embodiment of the present invention.

FIG. 2 is a diagram of an embodiment of the measuring unit of the present invention.

FIG. 3 is a schematic view of a conventional test tray and customer tray.

[Explanation of symbols]

 10 Conventional Test Tray 11 Transport Frame 20 Conventional Customer Tray 21 Customer Tray of the Present Invention 22 IC Device Storage Room 30 IC Device 31 Input / Output Pin 35 Measurement Socket 36 Contactor

Claims (1)

[Scope of utility model registration request] An IC device transfer mechanism for connecting a transfer frame (11) for accommodating a customer tray (21) to circulate in an IC handler, and an IC device storage chamber (22) having a plurality of rows and a plurality of columns. A tomato ray (21) having a structure in which a hole is formed below an input / output pin (31) of an IC device (30) stored in an IC device storage chamber (22), and the tomato ray (21) is housed. The transport frame (11)
When the measuring object reaches the measuring section, the IC is
A mechanism for testing a device (30), and an IC handler using an IC device carrying tray, characterized in that: