JPH08181185A - Continuous vacuum processing device - Google Patents
Continuous vacuum processing deviceInfo
- Publication number
- JPH08181185A JPH08181185A JP32257894A JP32257894A JPH08181185A JP H08181185 A JPH08181185 A JP H08181185A JP 32257894 A JP32257894 A JP 32257894A JP 32257894 A JP32257894 A JP 32257894A JP H08181185 A JPH08181185 A JP H08181185A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum
- substrate
- chamber
- valve
- processing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Physical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
- Drying Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
(57)【要約】
【目的】 真空処理装置に設けた基板出入室の蓋を兼
ね、真空吸着部材を使用して基板を基板出入室に搬送す
る基板交換装置を用いて真空処理を行う連続真空処理装
置の基板交換装置の真空もれの影響が、真空処理装置に
およばないようする。
【構成】 真空処理装置本体10の基板出入室12を交
換アーム51が密封する状態で、吸着部材55a、55
bの近傍にバルブ70、71を介して真空配管57、5
8が接続され、真空ポンプ56側に設けたバルブ59〜
62の開閉と同期してバルブ70、71が開閉するよう
にして、配管57、58の途中で生じる真空もれの影響
が基板出入室12を介して真空処理装置10に及ばない
ようにする。
(57) [Summary] [Purpose] A continuous vacuum that performs vacuum processing using a substrate exchange device that also serves as a lid for the substrate loading / unloading chamber provided in the vacuum processing device and uses the vacuum suction member to transfer the substrate to the substrate loading / unloading chamber. The influence of the vacuum leak of the substrate exchange device of the processing apparatus should not be exerted on the vacuum processing apparatus. With the exchange arm 51 hermetically sealing the substrate loading / unloading chamber 12 of the vacuum processing apparatus body 10, suction members 55a, 55 are provided.
Vacuum pipes 57, 5 near valves b via valves 70, 71
8 connected to the valve 59 to the vacuum pump 56 side
The valves 70 and 71 are opened and closed in synchronization with the opening and closing of 62 so that the influence of vacuum leakage generated in the middle of the pipes 57 and 58 does not affect the vacuum processing apparatus 10 via the substrate loading / unloading chamber 12.
Description
【0001】[0001]
【産業上の利用分野】本発明は外部から被処理基板を真
空室内に順次導入し、蒸着、スパッタリング、CVD、
エッチングなどの基板処理を連続して行う連続真空処理
装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention sequentially introduces a substrate to be processed into a vacuum chamber from outside, and performs vapor deposition, sputtering, CVD,
The present invention relates to a continuous vacuum processing apparatus that continuously performs substrate processing such as etching.
【0002】[0002]
【従来の技術】従来、ウエハ、コンパクトディスク等の
基板に薄膜を形成したり、エッチング処理を行ったりす
るのに真空装置を用いてドライプロセスにより行うこと
がなされている。このような処理を行う真空装置の中に
は、1枚あるいは比較的小数の基板ごとに順次小さな基
板処理室に搬送して処理を行い、処理済み基板を取り出
すとともに次の被処理基板を導入して連続的に処理を行
う方式のものがある。2. Description of the Related Art Conventionally, a thin film is formed on a substrate such as a wafer or a compact disk, or an etching process is performed by a dry process using a vacuum apparatus. In a vacuum device that performs such processing, one or a relatively small number of substrates are sequentially transferred to a small substrate processing chamber for processing, the processed substrate is taken out, and the next substrate to be processed is introduced. There is a system that performs continuous processing.
【0003】図2は、従来からある連続真空処理装置の
断面図を示すものである。この装置は、主に、真空処理
装置本体10と、基板交換装置50とから構成される。FIG. 2 shows a sectional view of a conventional continuous vacuum processing apparatus. This apparatus mainly includes a vacuum processing apparatus main body 10 and a substrate exchanging apparatus 50.
【0004】真空処理装置本体10は、大きな円筒型の
真空チャンバ11と、この真空チャンバ11に接続して
設けられる真空チャンバよりも小型の基板出入室12、
同じく真空チャンバに接続して設けられる真空処理室1
3(真空処理室は複数あってもよい)が真空チャンバ1
1の上壁に設けられ、図示しない高真空排気系により真
空排気されるようになっている。なお、基板処理がスパ
ッタリングなど高真空が必要とされる処理のときには真
空処理室13ごとに別に図示しない高真空排気系を設け
ている場合もある。The vacuum processing apparatus main body 10 has a large cylindrical vacuum chamber 11 and a substrate loading / unloading chamber 12, which is smaller than the vacuum chamber connected to the vacuum chamber 11.
A vacuum processing chamber 1 which is also connected to the vacuum chamber
3 (there may be a plurality of vacuum processing chambers) is the vacuum chamber 1
1 is provided on the upper wall of the first wall, and is evacuated by a high vacuum exhaust system (not shown). When the substrate processing is processing such as sputtering that requires high vacuum, a high vacuum exhaust system (not shown) may be separately provided for each vacuum processing chamber 13.
【0005】真空チャンバ11の内部には回転軸により
軸支されるターンテーブル14が設けられ、回転モータ
15により回転駆動される。ターンテーブル14のテー
ブル部分には少なくとも2つのテーブル凹部16が設け
られている。A turntable 14 supported by a rotary shaft is provided inside the vacuum chamber 11 and is rotationally driven by a rotary motor 15. At least two table recesses 16 are provided in the table portion of the turntable 14.
【0006】テーブル凹部16は、各テーブル凹部16
の中心がターンテーブル14の回転中心に対して同心円
上にくるようにしてあり、各凹部には、凹部内に納まる
大きさの基板ホルダ17が載置されている。また、テー
ブル凹部16の凹部中心部分にはターンテーブル14の
テーブル部分を貫通するテーブル孔部18が設けられて
いる。The table recesses 16 are each table recess 16
Is centered on the center of rotation of the turntable 14, and a substrate holder 17 having a size that can be accommodated in the recess is placed in each recess. Further, a table hole portion 18 penetrating the table portion of the turntable 14 is provided in the center portion of the table concave portion 16.
【0007】基板ホルダ17は、その外寸、厚さともに
凹部の内寸、深さよりやや小さめの寸法にしてあり、通
常はターンテーブル14の凹部にはまり込んだ状態にな
っている。基板ホルダ17の上面は滑らかに仕上げられ
ており、後述する昇降ロッドの上昇により基板ホルダ1
7が上昇して真空チャンバ11の上壁に当接した際にガ
スケットにより基板ホルダ17が基板出入室12の下面
側を密封するようにしてある。基板ホルダ17の上面中
央部分には基板が載置されるための凹部が設けられてお
り、この凹部に被処理基板が載置できるようになってい
る。すなわち、基板ホルダ17が上昇して真空チャンバ
11上壁に当接した状態で、基板ホルダ17が基板出入
室12の底部を形成することとなり、後述する基板交換
装置50によって搬送され、基板出入室12内に搬入さ
れた被処理基板が基板ホルダ17上に載置できるように
なっている。The substrate holder 17 has an outer dimension and a thickness that are slightly smaller than the inner dimension and the depth of the recess, and is normally fitted in the recess of the turntable 14. The upper surface of the substrate holder 17 is finished to be smooth, and the substrate holder 1
When the substrate 7 rises and comes into contact with the upper wall of the vacuum chamber 11, the substrate holder 17 seals the lower surface side of the substrate loading / unloading chamber 12 with a gasket. A recess is provided in the center of the upper surface of the substrate holder 17 for mounting a substrate, and the substrate to be processed can be mounted in this recess. That is, the substrate holder 17 forms the bottom portion of the substrate loading / unloading chamber 12 in a state where the substrate holder 17 is raised and abuts on the upper wall of the vacuum chamber 11, and the substrate holder 17 is transported by the substrate exchanging device 50, which will be described later, and is transferred to the substrate loading / unloading chamber. The substrate to be processed that has been loaded into the substrate 12 can be placed on the substrate holder 17.
【0008】真空チャンバ11の底部の壁面にはターン
テーブル14に設けたターンテーブル孔部18と対向す
る位置、すなわち、ターンテーブル14の回転中心に対
してターンテーブル孔部18が設けられたのと同じ同心
円上に貫通孔19aが設けられ、昇降ロッド20aがガ
スケット等により真空を保持した状態で嵌挿されてい
る。この昇降ロッド20aは外部のシリンダ21aによ
り昇降され、ターンテーブル14のテーブル孔部18の
ひとつが図示しないターンテーブル回転制御機構(ター
ンテーブル回転位置検出機構も含む)により対向位置に
停止すると、昇降ロッドがテーブル孔部18を通過する
ように上昇するようになっている。そして、テーブル凹
部16に載置されている基板ホルダ17が昇降ロッド2
0により上昇され、基板ホルダ17が真空チャンバ11
の上壁の内壁面に当接される。A turntable hole 18 is provided on the bottom wall of the vacuum chamber 11 at a position facing the turntable hole 18 provided in the turntable 14, that is, with respect to the center of rotation of the turntable 14. A through hole 19a is provided on the same concentric circle, and an elevating rod 20a is fitted and inserted by a gasket or the like while maintaining a vacuum. The lifting rod 20a is lifted and lowered by an external cylinder 21a, and when one of the table hole portions 18 of the turntable 14 is stopped at a facing position by a turntable rotation control mechanism (including a turntable rotation position detection mechanism) (not shown), the lifting rod 20a is lifted. Is designed to rise so as to pass through the table hole portion 18. Then, the substrate holder 17 placed in the table recess 16 is moved up and down by the lifting rod 2
0, the substrate holder 17 is moved to the vacuum chamber 11
Is abutted on the inner wall surface of the upper wall.
【0009】同様に、真空チャンバ11の他の部分にあ
る真空処理室13に対向する位置において、貫通孔19
b、昇降ロッド20b、シリンダ21bが設けられてお
り、ターンテーブル14が回転制御されて被処理基板S
を載置した基板ホルダ17が真空処理室13に対向する
位置に停止したときに、シリンダ21bの駆動により昇
降ロッド20bが上昇し、基板ホルダ17を真空チャン
バ上壁に当接することにより、基板を真空処理室13に
含んだ状態で真空処理室が密閉されるようにしてある。Similarly, at the position facing the vacuum processing chamber 13 in the other part of the vacuum chamber 11, the through hole 19 is formed.
b, an elevating rod 20b, and a cylinder 21b are provided, and the turntable 14 is rotationally controlled to control the substrate S to be processed.
When the substrate holder 17 on which is mounted is stopped at a position facing the vacuum processing chamber 13, the lifting rod 20b is lifted by the driving of the cylinder 21b, and the substrate holder 17 is brought into contact with the upper wall of the vacuum chamber to move the substrate. The vacuum processing chamber is hermetically sealed while being included in the vacuum processing chamber 13.
【0010】ターンテーブル14上の基板ホルダの数は
2つ以上であればよいが、各基板ホルダ17間は等角ご
とに配置して、ひとつの基板ホルダ17が基板出入室1
2に対向しているときは他の基板ホルダ17のひとつが
基板処理室13に対向するようにしてある。The number of substrate holders on the turntable 14 may be two or more, but the substrate holders 17 are arranged equiangularly, and one substrate holder 17 is provided in the substrate loading / unloading chamber 1.
One of the other substrate holders 17 faces the substrate processing chamber 13 when facing the substrate processing chamber 13.
【0011】次に、基板交換装置50について説明す
る。基板交換装置50は主に、上部の交換アーム51、
交換アーム51を軸支する交換アーム軸52、交換アー
ム軸を回転する回転機構を駆動するモータ53、交換ア
ーム軸を昇降するシリンダ54、交換アーム51に設け
られた真空吸着部材55a、55b、真空吸着部材55
a、55bの真空排気を行う真空ポンプ56とから構成
される。Next, the substrate exchanging device 50 will be described. The substrate exchanging device 50 mainly includes an exchanging arm 51 on the upper side,
An exchange arm shaft 52 that supports the exchange arm 51, a motor 53 that drives a rotation mechanism that rotates the exchange arm shaft, a cylinder 54 that raises and lowers the exchange arm shaft, vacuum suction members 55a and 55b provided on the exchange arm 51, and a vacuum. Adsorption member 55
It is composed of a vacuum pump 56 for evacuating a and 55b.
【0012】交換アーム51は昇降と回転とが可能な交
換アーム軸52により支持され、この交換アーム軸52
に対して対称な位置に前述した2つの吸着部材55a、
55bが取り付けられている。そして、一方の吸着部材
が図中の位置Aにきたときに他方の吸着部材が位置Bに
くるようにしてある。吸着部材55a、55bは交換ア
ーム51の滑らかに仕上げられた下面51a、51bか
ら突出するように取り付けてある。位置Bはちょうど吸
着部材55a、55bが基板出入室13に出し入れされ
る位置であり、また、位置Aは図示しない外部のロボッ
ト機構により基板が供給される位置である。つまり、交
換アーム51は、一方の吸着部材55aが基板出入室1
3に挿入されたときに、同時に、他方の吸着部材55b
が外部のロボット機構と基板の受け渡しができるように
(55aと55bとが逆の場合も同様)設置されてい
る。交換アーム下面51a、51bは吸着部材55a、
55bを基板出入室12に入れた状態で基板出入室13
の上側を密封する蓋として兼用される。すなわち、位置
Bにおいて交換アーム51が降下すると交換アーム下面
51aまたは51bが真空チャンバ11の上壁の外壁面
に当接し、上壁に設けられたガスケットによって交換ア
ーム下面51aあるいは51bが基板出入室12の上部
側を密閉する。これと同時に、位置Aにきた他方の吸着
部材55bあるいは55aが、外部ロボット機構により
送られてきた基板との交換を行うようになる。The exchange arm 51 is supported by an exchange arm shaft 52 which can be raised and lowered and rotated.
The two adsorbing members 55a described above at positions symmetrical with respect to
55b is attached. Then, when one of the suction members comes to the position A in the figure, the other suction member comes to the position B. The suction members 55a and 55b are attached so as to project from the smoothly finished lower surfaces 51a and 51b of the exchange arm 51. The position B is a position where the suction members 55a and 55b are just put into and taken out of the substrate loading / unloading chamber 13, and the position A is a position where the substrate is supplied by an external robot mechanism (not shown). In other words, in the exchange arm 51, one suction member 55a is attached to the substrate loading / unloading chamber 1
3, when the other suction member 55b
Is installed so that the substrate can be transferred to and from an external robot mechanism (the same applies when 55a and 55b are reversed). The exchange arm lower surfaces 51a and 51b are attached to the suction member 55a,
55b in the substrate loading / unloading chamber 12 and the substrate loading / unloading chamber 13
It is also used as a lid to seal the upper side of. That is, when the exchange arm 51 descends at the position B, the exchange arm lower surface 51a or 51b comes into contact with the outer wall surface of the upper wall of the vacuum chamber 11, and the exchange arm lower surface 51a or 51b is caused by the gasket provided on the upper wall. Seal the upper side of the. At the same time, the other suction member 55b or 55a that has come to the position A is to be replaced with the substrate sent by the external robot mechanism.
【0013】吸着部材55a、55bは、交換アーム5
1および交換アーム軸52に設けられた配管57、5
8、バルブ59、60を介して真空ポンプ56に接続さ
れる。なお、交換アーム軸52内では配管57、58は
二重配管としてある。また、配管57、58にはベント
用のバルブ61、62が設けられている。The suction members 55a and 55b are the exchange arms 5.
1 and pipes 57 and 5 provided on the exchange arm shaft 52
8, connected to a vacuum pump 56 via valves 59 and 60. In the exchange arm shaft 52, the pipes 57 and 58 are double pipes. Further, valves 61 and 62 for venting are provided in the pipes 57 and 58.
【0014】真空ポンプ56はバルブ59、60を介し
て吸着部材55の真空排気を行うとともに、バルブ6
3、配管64を介して基板出入室12に接続されてお
り、基板出入室12の排気をも行えるようにされてい
る。配管64には、ベント用のバルブ65も接続されて
いる。The vacuum pump 56 evacuates the suction member 55 through the valves 59 and 60, and the valve 6
3. It is connected to the substrate loading / unloading chamber 12 via a pipe 64, and the substrate loading / unloading chamber 12 can be exhausted. A valve 65 for venting is also connected to the pipe 64.
【0015】次に以上のような構成を有する連続真空処
理装置における連続処理の動作を説明する。外部のロボ
ット機構などにより位置Aの受け渡し位置に用意された
被処理基板Sはバルブ60を開けることにより、吸着部
材55aに真空吸着され、シリンダ54により上昇さ
れ、さらにモータ53により位置Bの上方にくるまで回
転される。位置Bの上方にて回転を停止し、シリンダ5
4を下降すると、吸着部材55aは被処理基板Sととも
に基板出入室12に入れられ、交換アーム下面51aが
真空チャンバ11の上壁の外壁面に当接することによ
り、交換アーム51が蓋となって基板出入室12を密封
する。Next, the operation of continuous processing in the continuous vacuum processing apparatus having the above structure will be described. The substrate S to be processed prepared at the transfer position of the position A by an external robot mechanism or the like is vacuum-sucked by the suction member 55a by opening the valve 60, lifted by the cylinder 54, and further moved above the position B by the motor 53. It is rotated until it comes. The rotation is stopped above the position B, and the cylinder 5
4, the suction member 55a is put into the substrate loading / unloading chamber 12 together with the substrate S to be processed, and the exchange arm lower surface 51a comes into contact with the outer wall surface of the upper wall of the vacuum chamber 11, so that the exchange arm 51 serves as a lid. The substrate loading / unloading chamber 12 is sealed.
【0016】真空処理装置本体10側では、予めシリン
ダ21を上昇させて基板ホルダ17が真空チャンバ11
の上壁の内壁面に当接してある。それゆえ、続いてバル
ブ60を閉、バルブ63を開にすることにより基板出入
室12が真空排気され、よって基板Sは重力により吸着
部材51aから離れて基板ホルダ17に載せられる。そ
の後、バルブ63を閉、シリンダ21aが下降すること
により被処理基板Sは基板ホルダ17ごと真空チャンバ
11内のターンテーブル14のテーブル凹部16に納ま
り、モータ15の回転により真空処理室13に対向する
位置まで回転される。そして、シリンダ21bの上昇に
より真空処理室13に被処理基板Sが対向した状態で基
板ホルダ17が真空チャンバ上壁と当接し、この状態で
真空処理がなされる。処理後の基板はシリンダ21bの
下降、ターンテーブル14の回転、シリンダ21aの上
昇により再び基板出入室12に送られる。そして、バル
ブ65を開くことによって基板出入室12は大気圧に戻
され、基板Sはバルブ59を開くことによって吸着部材
55bに真空吸着され、交換アーム51がシリンダ54
により上昇、モータ53により回転、シリンダ54によ
り下降し、位置Aに運ばれ、バルブ59を閉、バルブ6
1を開とすることにより吸着部材55bが大気圧に戻さ
れ、処理を終えた被処理基板Sを外部ロボットに受け渡
す。On the side of the vacuum processing apparatus body 10, the cylinder 21 is raised in advance so that the substrate holder 17 is moved to the vacuum chamber 11
Is in contact with the inner wall surface of the upper wall. Therefore, by subsequently closing the valve 60 and opening the valve 63, the substrate loading / unloading chamber 12 is evacuated, so that the substrate S is placed on the substrate holder 17 away from the suction member 51a by gravity. After that, the valve 63 is closed and the cylinder 21a is lowered, so that the substrate S to be processed is housed together with the substrate holder 17 in the table recess 16 of the turntable 14 in the vacuum chamber 11, and is opposed to the vacuum processing chamber 13 by the rotation of the motor 15. It is rotated to the position. Then, the substrate holder 17 contacts the upper wall of the vacuum chamber in a state where the substrate S to be processed faces the vacuum processing chamber 13 due to the rise of the cylinder 21b, and the vacuum processing is performed in this state. The processed substrate is sent to the substrate loading / unloading chamber 12 again by lowering the cylinder 21b, rotating the turntable 14, and raising the cylinder 21a. Then, by opening the valve 65, the substrate loading / unloading chamber 12 is returned to the atmospheric pressure, and by opening the valve 59, the substrate S is vacuum-sucked by the suction member 55b, and the exchange arm 51 is moved by the cylinder 54.
Is raised by the motor 53, rotated by the motor 53, lowered by the cylinder 54, conveyed to the position A, the valve 59 is closed, and the valve 6 is closed.
When 1 is opened, the suction member 55b is returned to atmospheric pressure, and the processed substrate S is transferred to the external robot.
【0017】[0017]
【発明が解決しようとする課題】このような連続真空処
理装置においては、基板交換装置が基板出入室の蓋とし
ての機能を兼ねている。そのため、基板出入室の真空引
きが行われる際に、基板交換装置のうちの基板出入室に
入れられる部分については真空漏れがないことが必要で
ある。In such a continuous vacuum processing apparatus, the substrate exchanging device also functions as a lid for the substrate loading / unloading chamber. Therefore, when vacuuming the substrate loading / unloading chamber, it is necessary that there is no vacuum leakage in the portion of the substrate exchanging device that is placed in the substrate loading / unloading chamber.
【0018】ところで、連続真空処理装置では基板交換
装置は回転、昇降運動を頻繁に繰り返すため、微小なも
れが生じやすい。特に、交換アーム軸には吸着部材に接
続される真空配管の真空度を保つためにいくつかのガス
ケット、Oリングが使用されているがこれらの部分での
真空もれが生じやすい。もしもこれらの部分に真空漏れ
が生じると基板出入室や真空チャンバの圧力が上昇し、
基板連続処理ができなかったり、大気を含んだ状態での
真空処理となって悪影響をおよぼすという問題が生じ
る。By the way, in the continuous vacuum processing apparatus, since the substrate exchanging apparatus frequently repeats the rotation and the vertical movement, a minute leak is likely to occur. In particular, some gaskets and O-rings are used for the exchange arm shaft in order to maintain the degree of vacuum of the vacuum piping connected to the suction member, but vacuum leakage is likely to occur at these parts. If a vacuum leak occurs in these parts, the pressure in the substrate loading / unloading chamber or the vacuum chamber will rise,
There arises a problem that the continuous substrate processing cannot be performed, or the vacuum processing is performed in a state including the atmosphere, which has an adverse effect.
【0019】本発明は以上のような問題を解決するもの
であり、基板交換装置を有する連続基板処理装置におい
て、真空もれが生じにくく、また微小な漏れが生じても
真空処理に影響がないようにすることを目的とする。The present invention solves the problems as described above, and in a continuous substrate processing apparatus having a substrate exchanging device, vacuum leakage hardly occurs, and even if a minute leak occurs, the vacuum processing is not affected. The purpose is to do so.
【0020】[0020]
【課題を解決するための手段】上記問題を解決するため
になされた本発明にかかる連続真空処理装置は、真空吸
着手段により被処理基板を保持し、真空チャンバに接続
される基板出入室内に被処理基板を搬送する基板交換装
置と、基板出入室に搬送された被処理基板を真空チャン
バ内に設けられた搬送手段により真空チャンバを介して
基板処理室に送り込んで真空処理を行う真空処理装置本
体とを有する連続真空処理装置であって、前記基板交換
装置は、真空吸着手段を基板出入室に入れた状態で基板
出入室の蓋を形成する交換アームと、交換アームを支持
する交換アーム軸と、交換アーム軸を回転昇降駆動する
回転昇降駆動手段と、交換アームおよび交換アーム軸に
設けられ、前記真空吸着手段を真空排気するための真空
配管と、真空配管に接続される真空ポンプと、前記真空
配管の真空吸着手段近傍と真空ポンプ近傍との双方に設
けたバルブとを備え、真空配管の真空ポンプ近傍のバル
ブを開閉する際に真空吸着手段側のバルブを同期して動
作させるようにしたことを特徴とする。以下、この連続
真空処理装置がどのように作用するかを説明する。A continuous vacuum processing apparatus according to the present invention, which has been made to solve the above problems, holds a substrate to be processed by a vacuum suction means and stores it in a substrate loading / unloading chamber connected to a vacuum chamber. A substrate exchanging device that conveys a processed substrate, and a main body of a vacuum processing device that performs vacuum processing by feeding a substrate to be processed that has been transferred into a substrate loading / unloading chamber into a substrate processing chamber through a vacuum chamber by a transfer means provided in the vacuum chamber. A continuous vacuum processing apparatus comprising: a substrate exchanging device, wherein the substrate exchanging device forms a lid of the substrate loading / unloading chamber with the vacuum suction means in the substrate loading / unloading chamber, and an exchange arm shaft supporting the exchange arm. A rotary elevating and lowering drive means for rotating and elevating the exchange arm shaft; a vacuum pipe provided to the exchange arm and the exchange arm shaft for evacuating the vacuum suction means; and a vacuum pipe. A vacuum pump to be connected and a valve provided both in the vicinity of the vacuum suction means of the vacuum pipe and in the vicinity of the vacuum pump are provided, and the valve on the vacuum suction means side is opened and closed when opening and closing the valve near the vacuum pump of the vacuum pipe. The feature is that they are operated in synchronization. The operation of this continuous vacuum processing apparatus will be described below.
【0021】[0021]
【作用】本発明の連続真空処理装置では、基板交換装置
に設けられた真空配管については真空吸着手段近傍にバ
ルブが設けてあるので、基板交換装置が回転、昇降する
際の真空シールのために使用するガスケット、Oリング
はこのバルブより真空ポンプ側にくることになる。した
がって、真空吸着手段の真空排気を停止するときに真空
ポンプ近傍のバルブとともに真空吸着手段近傍に設けた
バルブも閉じることにより、たとえ真空シール部分に漏
れが生じてもその影響は真空吸着手段を介して真空チャ
ンバ側に及ぶことはない。In the continuous vacuum processing apparatus of the present invention, the vacuum pipe provided in the substrate exchanging device is provided with a valve in the vicinity of the vacuum suction means, so that a vacuum seal is provided when the substrate exchanging device rotates and moves up and down. The gasket and O-ring used will be closer to the vacuum pump than this valve. Therefore, by closing the valve near the vacuum pump as well as the valve near the vacuum suction means when the vacuum suction of the vacuum suction means is stopped, even if a leak occurs in the vacuum seal part, the effect is not affected by the vacuum suction means. Does not reach the vacuum chamber side.
【0022】[0022]
【実施例】以下、本発明の実施例を図を用いて説明す
る。図1は本発明による一実施例を示した連続真空処理
装置の断面図である。特に示さないものは従来例である
図2と同じ符号を付けることによりその説明を省略す
る。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view of a continuous vacuum processing apparatus showing an embodiment according to the present invention. Those not specifically shown are denoted by the same reference numerals as those of the conventional example shown in FIG.
【0023】図において、交換アーム51における配管
57、配管58の途中にバルブ70、71が設けられて
いる。そして、バルブ70はバルブ60、バルブ62と
同期して開閉するようにしてあり、バルブ71はバルブ
59、バルブ61と同期して開閉するようにしてある。In the figure, valves 70 and 71 are provided in the middle of the pipe 57 and the pipe 58 of the exchange arm 51. The valve 70 is opened and closed in synchronization with the valves 60 and 62, and the valve 71 is opened and closed in synchronization with the valves 59 and 61.
【0024】次に本構成の連続真空処理装置の動作につ
いて説明する。外部のロボット機構などにより位置Aに
用意された被処理基板Sは、バルブ60およびこれに連
動するバルブ70を開けることにより吸着部材55aに
真空吸着され、交換アーム51がシリンダ54により上
昇され、さらにモータ53により吸着部材55aが位置
Bの上方にくるまで回転される。位置Bの上方にて回転
を停止し、シリンダ54を下降すると、吸着部材55a
は被処理基板Sとともに基板出入室12に入れられ、交
換アーム下面51aが真空チャンバ11の上壁の外壁面
に当接することにより、交換アーム51が蓋となって基
板出入室12を密封する。Next, the operation of the continuous vacuum processing apparatus of this structure will be described. The substrate S to be processed prepared at the position A by an external robot mechanism or the like is vacuum-sucked by the suction member 55a by opening the valve 60 and the valve 70 interlocked therewith, and the exchange arm 51 is lifted by the cylinder 54. The motor 53 rotates the suction member 55a until it is located above the position B. When the rotation is stopped above the position B and the cylinder 54 is lowered, the suction member 55a
Is placed in the substrate loading / unloading chamber 12 together with the substrate S to be processed, and the exchange arm lower surface 51a comes into contact with the outer wall surface of the upper wall of the vacuum chamber 11, whereby the exchange arm 51 serves as a lid to seal the substrate loading / unloading chamber 12.
【0025】真空処理装置本体10側では、予めシリン
ダ21を上昇させて基板ホルダ17が真空チャンバ11
の上壁の内壁面に当接してある。それゆえ、続いてバル
ブ60とこれに連動するバルブ70を閉、バルブ63を
開にすることにより基板出入室12が真空排気され、よ
って基板Sは重力により吸着部材51aから離れて基板
ホルダ17に載せられる。On the side of the vacuum processing apparatus body 10, the cylinder 21 is raised in advance so that the substrate holder 17 is moved to the vacuum chamber 11
Is in contact with the inner wall surface of the upper wall. Therefore, subsequently, the valve 60 and the valve 70 associated therewith are closed and the valve 63 is opened, so that the substrate loading / unloading chamber 12 is evacuated, and thus the substrate S is separated from the suction member 51a by the gravity to the substrate holder 17. Can be posted.
【0026】その後、バルブ63を閉、シリンダ21a
が下降することにより被処理基板Sは基板ホルダ17ご
と真空チャンバ11内のターンテーブル14のテーブル
凹部16に納まり、モータ15の回転により真空処理室
13に対向する位置まで回転される。そして、シリンダ
21bの上昇により真空処理室13に被処理基板Sが対
向した状態で基板ホルダ17が真空チャンバ上壁と当接
し、この状態で真空処理がなされる。処理後の基板はシ
リンダ21bの下降、ターンテーブル14の回転、シリ
ンダ21aの上昇により再び基板出入室12に送られ
る。そして、バルブ65を開くことによって基板出入室
12は大気圧に戻され、基板Sはバルブ59、バルブ7
1を開くことによって吸着部材55bに真空吸着され、
交換アーム51がシリンダ54により上昇、モータ53
により回転、シリンダ54により下降し、吸着部材55
bは位置Aに運ばれ、バルブ59を閉にし、バルブ61
を開にすることにより吸着部材55bが大気圧に戻さ
れ、処理を終えた被処理基板Sは外部ロボットに受け渡
される。同様の動作は被処理基板が吸着部材55bによ
って搬送される場合に、バルブ71とバルブ59、61
とを連動することにより行われる。Then, the valve 63 is closed and the cylinder 21a is closed.
As the substrate S is lowered, the substrate S to be processed is housed together with the substrate holder 17 in the table recess 16 of the turntable 14 in the vacuum chamber 11, and is rotated by the rotation of the motor 15 to a position facing the vacuum processing chamber 13. Then, the substrate holder 17 contacts the upper wall of the vacuum chamber in a state where the substrate S to be processed faces the vacuum processing chamber 13 due to the rise of the cylinder 21b, and the vacuum processing is performed in this state. The processed substrate is sent to the substrate loading / unloading chamber 12 again by lowering the cylinder 21b, rotating the turntable 14, and raising the cylinder 21a. Then, by opening the valve 65, the substrate loading / unloading chamber 12 is returned to the atmospheric pressure, and the substrate S is loaded with the valve 59 and the valve 7.
By opening 1, vacuum suction is performed on the suction member 55b,
The exchange arm 51 is lifted by the cylinder 54, and the motor 53
Is rotated by the cylinder 54 and lowered by the cylinder 54.
b is brought to position A, valve 59 is closed and valve 61
Is opened, the suction member 55b is returned to atmospheric pressure, and the processed substrate S is transferred to the external robot. The same operation is performed when the substrate to be processed is transported by the suction member 55b and the valve 71 and the valves 59 and 61.
This is done by linking and.
【0027】このように、バルブ70はバルブ60また
はバルブ62が開くときに連動して開き、バルブ60、
バルブ62が共に閉じているときに連動して閉じるよう
に制御させる。またバルブ71はバルブ59またはバル
ブ61が開くときに連動して開き、バルブ59とバルブ
61が共に閉じるときに連動して閉じるように制御させ
る。このようにすることにより、シリンダが21aが下
降しているとき、すなわち、真空チャンバ11と基板出
入室12とが連通しているときに、たとえ、配管57、
配管58に真空もれが生じても基板出入室12、真空チ
ャンバ11はその影響を受けることがなくなる。In this way, the valve 70 is interlocked when the valve 60 or the valve 62 is opened, and the valve 60,
When the valves 62 are both closed, they are controlled so as to be interlocked. Further, the valve 71 is controlled to open in conjunction with the opening of the valve 59 or 61, and to close in conjunction with the closing of both the valve 59 and the valve 61. By doing so, when the cylinder 21a is descending, that is, when the vacuum chamber 11 and the substrate loading / unloading chamber 12 communicate with each other, even if the pipe 57,
Even if a vacuum leak occurs in the pipe 58, the substrate loading / unloading chamber 12 and the vacuum chamber 11 are not affected.
【0028】本実施例では、真空チャンバに基板出入室
を接続させて基板出入室により基板を出し入れしてい
る。これは、基板出入室をできるだけ小さくして基板の
出し入れ時に排気すべき真空領域を小さくし、真空排気
時間を短縮化することや、真空処理室が高真空に維持さ
れることが要求される場合に、大気にさらされる基板出
入室真空処理室との間に中間室としての真空チャンバ設
けることが真空処理室の高真空維持に有利であるからで
ある。In this embodiment, the substrate loading / unloading chamber is connected to the vacuum chamber and the substrate is loaded / unloaded in / from the substrate loading / unloading chamber. This is the case when it is required to make the substrate loading / unloading chamber as small as possible to reduce the vacuum area to be evacuated when loading / unloading the substrate to shorten the vacuum exhaust time and to maintain the vacuum processing chamber at a high vacuum. In addition, it is advantageous to maintain a high vacuum in the vacuum processing chamber by providing a vacuum chamber as an intermediate chamber between the vacuum processing chamber and the substrate loading / unloading chamber that is exposed to the atmosphere.
【0029】しかしながら、そのような必要がなく、そ
のかわりに装置をできるだけ簡単にしたい場合には、基
板出入室を設けず、交換アームが直接真空チャンバの搬
送手段と受け渡すようにしてもよい。その場合の装置の
構成は以下のようになる。真空吸着手段により被処理基
板を保持し、真空チャンバ内に被処理基板を搬送する基
板交換装置と、真空チャンバ内に搬送された被処理基板
を真空チャンバ内に設けられた搬送手段により基板処理
室に送り込んで真空処理を行う真空処理装置本体とを有
する連続真空処理装置であって、前記基板交換装置は、
真空吸着手段を真空チャンバに入れた状態で真空チャン
バの蓋を形成する交換アームと、交換アームを支持する
交換アーム軸と、交換アーム軸を回転昇降駆動する回転
昇降駆動手段と、交換アームおよび交換アーム軸に設け
られ、前記真空吸着手段を真空排気するための真空配管
と、真空配管に接続される真空ポンプと、前記真空配管
の真空吸着手段近傍と真空ポンプ近傍との双方に設けた
バルブとを備え、真空配管の真空ポンプ近傍のバルブを
開閉する際に真空吸着手段側のバルブを同期して動作さ
せるようにしたことを特徴とする連続真空処理装置。However, if there is no such need, and instead the apparatus is desired to be as simple as possible, the substrate loading / unloading chamber may not be provided and the exchanging arm may be directly transferred to the transfer means of the vacuum chamber. The configuration of the device in that case is as follows. A substrate exchanging device that holds the substrate to be processed by the vacuum suction means and conveys the substrate to be processed into the vacuum chamber, and a substrate processing chamber by the conveying means that is provided to the substrate to be processed conveyed into the vacuum chamber. A continuous vacuum processing apparatus having a vacuum processing apparatus main body for performing vacuum processing by sending the substrate to the substrate exchange apparatus,
An exchange arm that forms a lid of the vacuum chamber in a state where the vacuum suction means is placed in the vacuum chamber, an exchange arm shaft that supports the exchange arm, a rotary lift drive means that rotates and drives the exchange arm shaft, an exchange arm and an exchange. A vacuum pipe provided on the arm shaft for evacuating the vacuum suction means, a vacuum pump connected to the vacuum pipe, and a valve provided both near the vacuum suction means of the vacuum pipe and near the vacuum pump. A continuous vacuum processing apparatus comprising: a valve for vacuum suction means, which is operated synchronously when a valve near the vacuum pump of the vacuum pipe is opened and closed.
【0030】[0030]
【発明の効果】以上、説明したように本発明にかかる連
続真空処理装置では、真空吸着手段近傍にバルブを設け
たので、たとえ基板交換装置における真空配管のガスケ
ット、Oリング部分に真空もれがあっても真空処理装置
への影響はない。またOリングなどの交換は基板が充分
に真空吸着できなくなった時に行うだけでよくOリング
などの交換頻度が大幅に少なくなる。As described above, in the continuous vacuum processing apparatus according to the present invention, since the valve is provided in the vicinity of the vacuum suction means, even if the gasket of the vacuum pipe and the O-ring portion of the substrate exchanging apparatus are not leaked. Even if there is, it does not affect the vacuum processing device. Further, the O-ring and the like need only be exchanged when the substrate cannot be sufficiently vacuum-sucked, and the O-ring and the like are exchanged significantly less frequently.
【図1】本発明の一実施例である連続真空処理装置の断
面図。FIG. 1 is a sectional view of a continuous vacuum processing apparatus that is an embodiment of the present invention.
【図2】従来からの連続真空処理装置の断面図。FIG. 2 is a sectional view of a conventional continuous vacuum processing apparatus.
10:真空処理装置本体 11:真空チャンバ 12:基板出入室 13:真空処理室 14:ターンテーブル 15:モータ 17:基板ホルダ 20a、20b:昇降ロッド 21a、21b:シリンダ 50:基板交換装置 51:交換アーム 52:交換アーム軸 53:モータ 54:シリンダ 55a、55b:吸着部材 56:真空ポンプ 57、58:配管 59〜63、65、70、71:バルブ 10: Vacuum processing apparatus main body 11: Vacuum chamber 12: Substrate loading / unloading chamber 13: Vacuum processing chamber 14: Turntable 15: Motor 17: Substrate holder 20a, 20b: Lifting rods 21a, 21b: Cylinder 50: Substrate exchanging device 51: Exchange Arm 52: Replacement arm shaft 53: Motor 54: Cylinder 55a, 55b: Adsorption member 56: Vacuum pump 57, 58: Piping 59-63, 65, 70, 71: Valve
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/203 21/205 21/3065 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical indication H01L 21/203 21/205 21/3065
Claims (1)
真空チャンバに接続される基板出入室内に被処理基板を
搬送する基板交換装置と、基板出入室に搬送された被処
理基板を真空チャンバ内に設けられた搬送手段により真
空チャンバを介して基板処理室に送り込んで真空処理を
行う真空処理装置本体とを有する連続真空処理装置であ
って、前記基板交換装置は、真空吸着手段を基板出入室
に入れた状態で基板出入室の蓋を形成する交換アーム
と、交換アームを支持する交換アーム軸と、交換アーム
軸を回転昇降駆動する回転昇降駆動手段と、交換アーム
および交換アーム軸に設けられ、前記真空吸着手段を真
空排気するための真空配管と、真空配管に接続される真
空ポンプと、前記真空配管の真空吸着手段近傍と真空ポ
ンプ近傍との双方に設けたバルブとを備え、真空配管の
真空ポンプ近傍のバルブを開閉する際に真空吸着手段側
のバルブを同期して動作させるようにしたことを特徴と
する連続真空処理装置。1. A substrate to be processed is held by a vacuum suction means,
A substrate exchanging device for transferring a substrate to be processed into a substrate loading / unloading chamber connected to the vacuum chamber, and a substrate processing chamber for transferring the substrate to be processed transferred to the substrate loading / unloading chamber through the vacuum chamber by a transport means provided in the vacuum chamber. Is a continuous vacuum processing apparatus having a vacuum processing apparatus main body for performing vacuum processing by feeding the substrate to the substrate, wherein the substrate exchanging apparatus forms a lid of the substrate loading / unloading chamber with the vacuum suction means placed in the substrate loading / unloading chamber. An exchange arm shaft that supports the exchange arm, a rotation elevating and lowering drive unit that rotationally elevates and lowers the exchange arm shaft, a vacuum pipe that is provided on the exchange arm and the exchange arm shaft, and that evacuates the vacuum suction unit. A vacuum pump connected to the vacuum pipe, and a valve provided both near the vacuum suction means of the vacuum pipe and near the vacuum pump are provided. Continuous vacuum processing apparatus is characterized in that so as to operate in synchronization with the vacuum suction means side valve when to open and close the drive.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32257894A JPH08181185A (en) | 1994-12-26 | 1994-12-26 | Continuous vacuum processing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32257894A JPH08181185A (en) | 1994-12-26 | 1994-12-26 | Continuous vacuum processing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH08181185A true JPH08181185A (en) | 1996-07-12 |
Family
ID=18145259
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP32257894A Pending JPH08181185A (en) | 1994-12-26 | 1994-12-26 | Continuous vacuum processing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH08181185A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100775870B1 (en) * | 2006-11-02 | 2007-11-13 | 양용찬 | Vacuum adsorption system |
| JP2009246273A (en) * | 2008-03-31 | 2009-10-22 | Tdk Corp | Green sheet laminating apparatus and apparatus for manufacturing laminate type electronic component |
-
1994
- 1994-12-26 JP JP32257894A patent/JPH08181185A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100775870B1 (en) * | 2006-11-02 | 2007-11-13 | 양용찬 | Vacuum adsorption system |
| JP2009246273A (en) * | 2008-03-31 | 2009-10-22 | Tdk Corp | Green sheet laminating apparatus and apparatus for manufacturing laminate type electronic component |
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