JPH08288596A - Wiring board and manufacturing method thereof - Google Patents
Wiring board and manufacturing method thereofInfo
- Publication number
- JPH08288596A JPH08288596A JP7094981A JP9498195A JPH08288596A JP H08288596 A JPH08288596 A JP H08288596A JP 7094981 A JP7094981 A JP 7094981A JP 9498195 A JP9498195 A JP 9498195A JP H08288596 A JPH08288596 A JP H08288596A
- Authority
- JP
- Japan
- Prior art keywords
- wiring board
- powder
- precursor
- semiconductor element
- wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0313—Organic insulating material
- H05K1/0353—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
- H05K1/0373—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/095—Dispersed materials, e.g. conductive pastes or inks for polymer thick films, i.e. having a permanent organic polymeric binder
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
- H05K3/4673—Application methods or materials of intermediate insulating layers not specially adapted to any one of the previous methods of adding a circuit layer
- H05K3/4676—Single layer compositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/682—Shapes or dispositions thereof comprising holes having chips therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
(57)【要約】
【目的】欠けや割れ等の発生を有効に防止するとともに
半導体素子等を外部電気回路に確実に電気的接続するこ
とができる配線基板を提供することにある。
【構成】60乃至95重量%の無機絶縁物粉末と5乃至
40重量%の熱硬化性樹脂とから成り、前記無機絶縁物
粉末を前記熱硬化性樹脂により結合した絶縁基体1に、
金属粉末をエポキシ変性アクリレート系樹脂により結合
した配線導体2を被着させた。
(57) [Abstract] [Purpose] To provide a wiring board capable of effectively preventing the occurrence of chips, cracks, and the like and reliably electrically connecting a semiconductor element or the like to an external electric circuit. [Structure] An insulating substrate 1 comprising 60 to 95% by weight of an inorganic insulating powder and 5 to 40% by weight of a thermosetting resin, wherein the inorganic insulating powder is bonded by the thermosetting resin.
The wiring conductor 2 in which metal powder was bonded with an epoxy-modified acrylate resin was applied.
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体素子を収容する
ための半導体素子収納用パッケージや混成集積回路基板
等に用いられる配線基板に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a semiconductor element housing package for housing semiconductor elements, a hybrid integrated circuit board and the like.
【0002】[0002]
【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板として比較的高密度の配線が可能な積層セラミックス
配線基板が多用されている。この配線基板は、酸化アル
ミニウム質焼結体等のセラミックスより成り、その上面
中央部に半導体素子を収容する凹部を有する絶縁基体
と、前記絶縁基体の凹部周辺から下面にかけて導出され
たタングステン、モリブデン等の高融点金属粉末から成
る配線導体とから構成されており、前記絶縁基体の凹部
底面に半導体素子をガラス、樹脂、ロウ材等の接着剤を
介して接着固定するとともに該半導体素子の各電極を例
えばボンディングワイヤ等の電気的接続手段を介して配
線導体に電気的に接続し、しかる後、前記絶縁基体の上
面に、金属やセラミックス等から成る蓋体を絶縁基体の
凹部を塞ぐようにしてガラス、樹脂、ロウ材等の封止材
を介して接合させ、絶得基体の凹部内に半導体素子を気
密に収容することによって製品としての半導体装置とな
る。2. Description of the Related Art Hitherto, as a wiring board, for example, a wiring board used in a semiconductor element housing package for housing a semiconductor element, a laminated ceramic wiring board capable of relatively high-density wiring has been widely used. This wiring board is made of ceramics such as aluminum oxide sintered body and has an insulating base having a recess for accommodating a semiconductor element in the center of the upper surface thereof, and tungsten, molybdenum, etc. led out from the periphery of the recess of the insulating base to the lower surface. And a wiring conductor made of a refractory metal powder, the semiconductor element is adhered and fixed to the bottom surface of the recess of the insulating substrate via an adhesive such as glass, resin, or brazing material, and each electrode of the semiconductor element is fixed. For example, it is electrically connected to a wiring conductor through an electrical connection means such as a bonding wire, and then a glass cover is formed on the upper surface of the insulating base so as to cover the recess of the insulating base. , A resin, a brazing material, etc., are bonded together, and the semiconductor element is hermetically housed in the recess of the base body. To become.
【0003】またこの従来の配線基板は、一般にセラミ
ックグリーンシート積層法によって製作され、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用しシート状
とすることによって複数のセラミックグリーンシートを
得、しかる後、前記セラミックグリーンシートに適当な
打ち抜き加工を施すとともに配線導体となる金属ペース
トを所定パターンに印刷塗布し、最後に前記セラミック
グリーンシートを所定の順に上下に積層してセラミック
生成形体となすとともに該セラミック生成形体を還元雰
囲気中、約1600℃の高温で焼成することによって製
作される。This conventional wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, aluminum oxide, silicon oxide, magnesium oxide,
A plurality of ceramic green sheets are obtained by adding a suitable organic binder to a ceramic raw material powder such as calcium oxide, a solvent and the like to form a slurry and making it into a sheet shape by adopting a conventionally known doctor blade method, Thereafter, the ceramic green sheet is subjected to appropriate punching processing, a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally the ceramic green sheets are laminated vertically in a predetermined order to form a ceramic molded body. It is manufactured by firing the ceramic green body at a high temperature of about 1600 ° C. in a reducing atmosphere.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間にわた
り正常、且つ安定に作動させることができなくなるとい
う欠点を有していた。However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body forming the insulating substrate have the property of being hard and brittle, an automatic line for the carrying process and the semiconductor device manufacturing is provided. Etc., when the wiring boards collide with each other or between the wiring boards and a part of the semiconductor device manufacturing automatic line, a crack, crack, crack or the like occurs in the insulating substrate, and as a result, the semiconductor element can be housed in an airtight manner. Therefore, there is a drawback that the semiconductor element cannot be operated normally and stably for a long period of time.
【0005】また前記配線基板の製造方法によれば、セ
ラミック生成形体を焼成する際、各セラミックグリーン
シートにおけるセラミック原料粉末の密度のバラツキに
起因してセラミック生成形体に不均一な焼成収縮が発生
して得られる配線基板に反り等の変形や寸法のバラツキ
が生じ、変形や寸法のバラツキが大きいと配線導体に断
線を招来するという欠点も有していた。Further, according to the method for manufacturing a wiring board, when firing the ceramic green body, uneven firing shrinkage occurs in the ceramic green body due to the variation in the density of the ceramic raw material powder in each ceramic green sheet. There is also a drawback that the resulting wiring board is deformed due to warpage or the like and the dimensions are varied, and if the deformation or the variations are large, the wiring conductor is broken.
【0006】[0006]
【発明の目的】本発明は、かかる従来の半導体素子収納
用パッケージの欠点に鑑み案出されたものであり、その
目的は、衝撃力の印加による欠けや割れ等の発生を有効
に防止し、内部に収容する半導体素子を長期間にわたり
正常、且つ安定に作動させることができる配線基板を提
供することにある。SUMMARY OF THE INVENTION The present invention has been devised in view of the drawbacks of the conventional semiconductor device housing package, and its purpose is to effectively prevent the occurrence of chipping or cracking due to the application of impact force, It is an object of the present invention to provide a wiring board that can normally and stably operate a semiconductor element housed inside for a long period of time.
【0007】また本発明の他の目的は反り等の変形や寸
法のバラツキが少なく、配線導体の断線を有効に防止し
て半導体素子等の電極を外部電気回路に確実に電気的接
続することができる配線基板の製造方法を提供すること
にある。Another object of the present invention is to reduce deformation such as warpage and variation in dimensions, effectively prevent disconnection of wiring conductors, and reliably electrically connect electrodes such as semiconductor elements to an external electric circuit. An object of the present invention is to provide a method of manufacturing a wiring board that can be manufactured.
【0008】[0008]
【課題を解決するための手段】本発明の配線基板は、6
0乃至95重量%の無機絶縁物粉末と5乃至40重量%
の熱硬化性樹脂とから成り、前記無機絶縁物粉末を前記
熱硬化性樹脂により結合した絶縁基体に、金属粉末をエ
ポキシ変性アクリレート系樹脂により結合した配線導体
を被着させて成ることを特徴とするものである。A wiring board according to the present invention comprises 6
0 to 95% by weight of inorganic insulating powder and 5 to 40% by weight
A thermosetting resin, and a wiring conductor formed by bonding a metal powder with an epoxy-modified acrylate resin is adhered to an insulating substrate having the inorganic insulating powder bonded with the thermosetting resin. To do.
【0009】また本発明の配線基板の製造方法は、硬化
性樹脂前駆体と無機絶縁物粉末とを混合して成る前駆体
シートを準備する工程と、前記前駆体シートに、エポキ
シ変性アクリレート系樹脂と金属粉末とを混合して成る
金属ペーストを所定パターンに印刷する工程と、前記所
定パターンに印刷された金属ペーストを紫外線にて半硬
化させる工程と、前記前駆体シート及び所定パターンに
印刷された金属ペーストを熱硬化させる工程とから成る
ことを特徴とするものである。Further, the method for manufacturing a wiring board of the present invention comprises the steps of preparing a precursor sheet formed by mixing a curable resin precursor and an inorganic insulating powder, and adding an epoxy-modified acrylate resin to the precursor sheet. A step of printing a metal paste formed by mixing a metal powder with a metal powder in a predetermined pattern, a step of semi-curing the metal paste printed in the predetermined pattern with ultraviolet light, the precursor sheet and a predetermined pattern And a step of thermally curing the metal paste.
【0010】[0010]
【作用】本発明の配線基板によれば、絶縁基体が無機絶
縁物粉末を靱性に優れる熱硬化性樹脂で結合することに
よって形成されていることから配線基板同士あるいは配
線基板と半導体装置製作自動ラインの一部とが激しく衝
突しても絶縁基体に欠けや割れ、クラック等が発生する
ことはない。According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are connected to each other or the wiring boards and the semiconductor device manufacturing automatic line. Even if it collides violently with a part of the above, the insulating substrate will not be chipped, cracked, or cracked.
【0011】また本発明の配線基板は硬化性樹脂前駆体
と無機絶縁物粉末とを混合して成る前駆体シート、及び
エポキシ変性アクリレート系樹脂と金属粉末とを混合し
て成る金属ペーストを熱硬化させることによって製作さ
れ、焼成工程がないことから不均一な焼成収縮に起因す
る変形や寸法のバラツキは発生せず、その結果、配線導
体に断線が招来することもなく、配線導体を介して半導
体素子等の電極を外部電気回路に確実に電気的接続する
ことが可能となる。The wiring board of the present invention is obtained by thermosetting a precursor sheet formed by mixing a curable resin precursor and an inorganic insulating powder, and a metal paste formed by mixing an epoxy-modified acrylate resin and a metal powder. Since there is no firing process, deformation and dimensional variation due to uneven firing shrinkage do not occur, and as a result, there is no disconnection in the wiring conductor, and there is no semiconductor through the wiring conductor. It is possible to reliably electrically connect the electrodes of the element or the like to the external electric circuit.
【0012】更に本発明の配線基板は硬化性樹脂前駆体
と無機絶縁物粉末とを混合して成る前駆体シートに印刷
された金属ペーストを一旦、紫外線によって半硬化させ
ることから前駆体シート等を熱硬化させる際に配線導体
に変形等が発生することはなく、印刷時の形状を維持す
ることができ、配線導体の高密度化が容易となる。Further, in the wiring board of the present invention, the metal paste printed on the precursor sheet made by mixing the curable resin precursor and the inorganic insulating powder is once semi-cured by ultraviolet rays, so that the precursor sheet or the like is obtained. No deformation or the like occurs in the wiring conductor during thermosetting, the shape at the time of printing can be maintained, and the wiring conductor can be easily densified.
【0013】[0013]
【実施例】次に本発明を添付図面に基づき詳細に説明す
る。図1は本発明の配線基板を半導体素子を収容する半
導体素子収納用パッケージに適用した場合の一実施例を
示し、1は絶縁基体、2は配線導体である。この配線導
体2を絶縁基体1に被着させたものが配線基板となる。The present invention will now be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating substrate and 2 is a wiring conductor. The wiring substrate is formed by attaching the wiring conductor 2 to the insulating substrate 1.
【0014】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
材を介して接着固定される。The insulating substrate 1 comprises three insulating substrates 1a and 1a.
It is formed by stacking b and 1c, and has a recess 1d for accommodating a semiconductor element in the center of the upper surface thereof, and the semiconductor element 3 is provided on the bottom surface of the recess 1d via an adhesive such as resin. Adhesively fixed.
【0015】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは例えば酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム等
の無機絶縁物粉末をエポキシ樹脂、ポリイミド樹脂等の
熱硬化性樹脂で結合することによって形成されており、
絶縁基体1を構成する3枚の絶縁基板1a、1b、1c
はその各々が無機絶縁物粉末を靱性に優れる熱硬化性樹
脂で結合することによって形成されていることから絶縁
基体1に外力が印加されても該外力によって絶縁基体1
に欠けや割れ、クラック等が発生することはない。The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are made of an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, epoxy resin or polyimide resin. It is formed by bonding with thermosetting resin of
Three insulating substrates 1a, 1b, 1c constituting the insulating base 1
Since each of them is formed by binding the inorganic insulating powder with a thermosetting resin having excellent toughness, even if an external force is applied to the insulating base 1, the insulating base 1 is applied by the external force.
There is no chipping, cracking, or cracking.
【0016】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に両者の熱膨張係数の相違に起因
する大きな熱応力が発生し、この大きな熱応力によって
半導体素子3が絶縁基体1より剥離したり、半導体素子
3に割れや欠け等が発生しまう。また95重量%を越え
ると無機絶縁物粉末を熱硬化性樹脂で完全に結合させる
ことができず、所定の絶縁基板1a、1b、1cを得る
ことができなくなる。従って、前記絶縁基体1を構成す
る絶縁基板1a、1b、1cはその各々の内部に含有さ
れる無機絶縁物粉末の量が60乃至95重量%の範囲に
特定される。In addition, three insulating substrates 1 constituting an insulating substrate 1 formed by bonding the inorganic insulating powders with a thermosetting resin.
a, 1b, and 1c have an inorganic insulating powder content of 60% by weight.
When it is less than the above, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, the semiconductor element 3 emits heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. Then, a large thermal stress is generated between them due to the difference in thermal expansion coefficient between the two, and the semiconductor element 3 is separated from the insulating substrate 1 due to the large thermal stress, or the semiconductor element 3 is cracked or chipped. I will end up. On the other hand, if it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, 1c cannot be obtained. Therefore, the insulating substrates 1a, 1b, 1c constituting the insulating base 1 are specified such that the amount of the inorganic insulating powder contained therein is in the range of 60 to 95% by weight.
【0017】また前記絶縁基体1はその凹部1d周辺か
ら下面にかけて配線導体2が被着形成されており、該配
線導体2は銅、銀、金等の金属粉末をエポキシ変性アク
リレート系樹脂により結合したもので形成されている。A wiring conductor 2 is adhered and formed from the periphery of the recess 1d to the lower surface of the insulating substrate 1. The wiring conductor 2 is formed by bonding a metal powder of copper, silver, gold or the like with an epoxy-modified acrylate resin. It is made of things.
【0018】前記配線導体2は半導体素子3の電極を外
部電気回路に接続する作用を為し、絶縁基体1の凹部1
d周辺部位に位置する配線導体2には半導体素子3の各
電極がボンディングワイヤ4を介して電気的に接続さ
れ、また絶縁基体1の下面に導出される部位は外部電気
回路に電気的に接続される。The wiring conductor 2 functions to connect the electrode of the semiconductor element 3 to an external electric circuit, and the recess 1 of the insulating base 1 is formed.
d Each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 located in the peripheral portion via the bonding wire 4, and the portion led out to the lower surface of the insulating substrate 1 is electrically connected to the external electric circuit. To be done.
【0019】尚、前記金属粉末をエポキシ変性アクリレ
ート系樹脂で結合することによって形成される配線導体
2は金属粉末の含有量が70重量%未満では配線導体2
の電気抵抗値が高くなり、また95重量%を越えると金
属粉末をエポキシ変性アクリレート系樹脂で結合して所
定の配線導体2を形成するのが困難となる。従って、前
記配線層2はその金属粉末の含有量を70乃至95重量
%の範囲としておくことが好ましい。The wiring conductor 2 formed by binding the metal powder with an epoxy-modified acrylate resin is used if the content of the metal powder is less than 70% by weight.
When the electric resistance value is higher than 95% by weight, it becomes difficult to bond the metal powder with the epoxy modified acrylate resin to form the predetermined wiring conductor 2. Therefore, it is preferable that the content of the metal powder in the wiring layer 2 is in the range of 70 to 95% by weight.
【0020】また前記配線導体2はその露出する表面に
ニッケル、金等の耐蝕性に優れ、且つ良導電性の金属を
メッキ法により1乃至20μmの厚みに層着させておく
と配線導体2の酸化腐食を有効に防止することができる
とともに配線導体2にボンディングワイヤ4を強固に電
気的接続させることができる。従って、前記配線導体2
の露出する表面にはニッケルや金等の耐蝕性に優れ、且
つ良導電性の金属をメッキ法により1乃至20μmの厚
みに層着させておくことが好ましい。The wiring conductor 2 is formed by depositing a metal having excellent corrosion resistance such as nickel or gold on the exposed surface by a plating method to a thickness of 1 to 20 μm. Oxidation and corrosion can be effectively prevented, and the bonding wire 4 can be firmly electrically connected to the wiring conductor 2. Therefore, the wiring conductor 2
It is preferable that a metal having excellent corrosion resistance, such as nickel or gold, and having good conductivity is deposited on the exposed surface by a plating method to a thickness of 1 to 20 μm.
【0021】かくして上述の配線基板によれば、絶縁基
体1の凹部1a底面に半導体素子3を樹脂等の接着剤を
介して接着固定するとともに半導体素子3の各電極をボ
ンディングワイヤ4を介して配線導体2に電気的に接続
し、しかる後、絶縁基体1の上面に蓋体5を樹脂等から
成る封止材を介して接合させ、絶縁基体1と蓋体5とか
ら成る容器内部に半導体素子3を気密に収容することに
よって製品としての半導体装置が完成する。Thus, according to the above wiring board, the semiconductor element 3 is adhered and fixed to the bottom surface of the concave portion 1a of the insulating substrate 1 with an adhesive such as resin, and each electrode of the semiconductor element 3 is wired with the bonding wire 4. After electrically connecting to the conductor 2, the lid 5 is joined to the upper surface of the insulating base 1 via a sealing material made of resin or the like, and the semiconductor element is placed inside the container made up of the insulating base 1 and the lid 5. A semiconductor device as a product is completed by hermetically containing 3 therein.
【0022】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について説明する。Next, a method of manufacturing the wiring board used for the semiconductor element housing package will be described.
【0023】まず図2(a)に示すように3枚の前駆体
シート11a、11b、11cを準備する。前記3枚の
前駆体シート11a、11b、11cは無機絶縁物粉末
を熱硬化性樹脂前駆体で結合することによって形成され
ており、例えば粒径が0.1〜100μmの酸化珪素粉
末に、ビスフェノールA型エポキシ樹脂、ノボラック型
エポキシ樹脂、グリシジルエステル型エポキシ樹脂等の
エポキシ樹脂及びアミン系硬化剤、イミダゾール系硬化
剤、酸無水物系硬化剤等の硬化剤を添加混合してペース
ト状となし、しかる後、このペーストをシート状になす
とともに約25〜100℃の温度で1〜60分間加熱し
半硬化させることによって製作される。First, as shown in FIG. 2 (a), three precursor sheets 11a, 11b and 11c are prepared. The three precursor sheets 11a, 11b, and 11c are formed by bonding inorganic insulating powders with a thermosetting resin precursor. For example, silicon oxide powders having a particle size of 0.1 to 100 μm are mixed with bisphenol. A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin and other epoxy resins and amine type curing agents, imidazole type curing agents, acid anhydride type curing agents and other curing agents are added and mixed to form a paste, Then, the paste is formed into a sheet and is heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to be semi-cured.
【0024】次に図2(b)に示すように前記3枚の前
駆体シート11a、11b、11cのうち2枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
aとなる開口A、A’を、2枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B、B’を
各々形成する。Next, as shown in FIG. 2B, the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b among the three precursor sheets 11a, 11b, 11c.
The openings A and A ′ that become a are two precursor sheets 11b,
Through holes B and B'for routing the wiring conductor 2 are formed in 11c.
【0025】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。The openings A, A'and the through holes B, B'are formed by subjecting the precursor sheets 11a, 11b, 11c to a well-known punching process to obtain the precursor sheets 11a, 11b, 11c.
It is formed by drilling a hole of a predetermined shape in each of c.
【0026】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2と成る金属ペースト12を従来周知のスリー
ン印刷法により所定パターンに印刷塗布するとともにこ
れに紫外線を照射して半硬化させる。Next, as shown in FIG. 2 (c), a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B'by a conventionally known screen printing method. A predetermined pattern is printed and applied, and at the same time, it is irradiated with ultraviolet rays to be semi-cured.
【0027】前記金属ペースト12としては例えば、金
属粉末として粒径0.1〜20μmの銅粉末に、エポキ
シ変性アクリレート系樹脂を添加混合しペースト状とし
たものが使用される。As the metal paste 12, for example, a copper powder having a particle diameter of 0.1 to 20 μm as a metal powder to which an epoxy-modified acrylate resin is added and mixed to form a paste is used.
【0028】また前記前駆体シート11b、11cに印
刷塗布された金属ペースト12は紫外線の照射により半
硬化されているため後述する3枚の前駆体シート11
a、11b、11cと該各前駆体シートに所定パターン
に印刷塗布させた金属ペースト12とを熱硬化させて配
線導体2を絶縁基体1に被着させた配線基板を得る際、
金属ペースト12のパターンに変形等が発生することは
なく、その結果、前駆体シート11b、11cに金属ベ
ースト12によるパターンを多数近接させて印刷塗布し
ても隣接するパターン同士が接触して電気的短絡を生じ
ることはなく、前駆体シート11b、11cに金属ペー
スト12によるパターンを高密度に形成することが可能
となる。The metal paste 12 printed and applied on the precursor sheets 11b and 11c is semi-cured by irradiation of ultraviolet rays, and therefore, the three precursor sheets 11 to be described later.
When a, 11b, 11c and the metal paste 12 printed and applied in a predetermined pattern on each of the precursor sheets are thermoset to obtain a wiring board in which the wiring conductor 2 is adhered to the insulating substrate 1,
No deformation or the like occurs in the pattern of the metal paste 12, and as a result, even if a large number of patterns based on the metal base 12 are brought close to and printed on the precursor sheets 11b and 11c, the adjacent patterns come into contact with each other and electrically. It is possible to form a pattern of the metal paste 12 on the precursor sheets 11b and 11c with high density without causing a short circuit.
【0029】尚、前記前駆体シート11b、11cに印
刷塗布された金属ペースト12は紫外線積算量が200
〜1600mJ/cm2 の紫外線を照射することによっ
て半硬化状態となる。The metal paste 12 printed and applied on the precursor sheets 11b and 11c has an integrated amount of ultraviolet rays of 200.
A semi-cured state is obtained by irradiating with ultraviolet rays of ˜1600 mJ / cm 2 .
【0030】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを約
80〜300℃の温度で約10秒〜24時間加熱し、前
記前駆体シート11a、11b、11cと、前駆体シー
ト11b、11cに所定パターンに印刷塗布された金属
ペースト12とを完全に熱硬化させることによって図1
に示すような絶縁基体1に配線導体2を被着させた半導
体素子収納用パッケージに使用される配線基板が完成す
る。この場合、前記前駆体シート11a、11b、11
c及び金属ペースト12は熱硬化時に収縮することは殆
どなく、従って、得られる配線基板に変形や寸法にバラ
ツキが発生することは皆無で、配線導体に断線が招来す
ることはなく、配線導体を介して半導体素子等の電極を
外部電気回路に確実に電気的接続することが可能とな
る。Finally, the three precursor sheets 11
a, 11b, 11c are stacked on top of each other and heated at a temperature of about 80 to 300 ° C. for about 10 seconds to 24 hours to form a predetermined pattern on the precursor sheets 11a, 11b, 11c and the precursor sheets 11b, 11c. By completely thermosetting the metal paste 12 printed and applied to
A wiring board used in a package for housing a semiconductor device, in which the wiring conductor 2 is adhered to the insulating substrate 1 as shown in (3), is completed. In this case, the precursor sheets 11a, 11b, 11
c and the metal paste 12 hardly shrink during thermosetting, so that the obtained wiring board is never deformed or the dimensions are not varied, and the wiring conductor is not broken. Through this, the electrodes of the semiconductor element or the like can be reliably electrically connected to the external electric circuit.
【0031】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば種
々の変更は可能であり、例えば上述の実施例では本願発
明の配線基板を半導体素子を収容する半導体素子収納用
パッケージに適用した場合を例に採って説明したがこれ
を混成集積回路基板等に適用してもよい。The present invention is not limited to the above-mentioned embodiments, and various modifications can be made without departing from the scope of the present invention. For example, in the above-mentioned embodiments, the wiring board of the present invention can be applied. Although the description has been given by taking as an example the case where the above is applied to a semiconductor element housing package for housing a semiconductor element, this may be applied to a hybrid integrated circuit board or the like.
【0032】また上述の実施例では3枚の前駆体シート
を積層することによって配線基板を製作したが、1枚や
2枚、あるいは4枚以上の前駆体シートを使用して配線
基板を製作してもよい。In the above-mentioned embodiment, the wiring board is manufactured by laminating the three precursor sheets. However, the wiring board is manufactured by using one, two, or four or more precursor sheets. May be.
【0033】[0033]
【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作自動ラインの一部とが激
しく衝突しても絶縁基体に欠けや割れ、クラック等が発
生することはない。According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are manufactured together or the wiring board and the semiconductor device are manufactured. Even if a part of the automatic line collides violently, the insulating substrate will not be chipped, cracked, or cracked.
【0034】また本発明の配線基板は硬化性樹脂前駆体
と無機絶縁物粉末とを混合して成る前駆体シート、及び
エポキシ変性アクリレート系樹脂と金属粉末とを混合し
て成る金属ペーストを熱硬化させることによって製作さ
れ、焼成工程がないことから不均一な焼成収縮に起因す
る変形や寸法のバラツキは発生せず、その結果、配線導
体に断線が招来することもなく、配線導体を介して半導
体素子等の電極を外部電気回路に確実に電気的接続する
ことが可能となる。The wiring board of the present invention is obtained by thermosetting a precursor sheet made by mixing a curable resin precursor and an inorganic insulating powder, and a metal paste made by mixing an epoxy-modified acrylate resin and a metal powder. Since there is no firing process, deformation and dimensional variation due to uneven firing shrinkage do not occur, and as a result, there is no disconnection in the wiring conductor, and there is no semiconductor through the wiring conductor. It is possible to reliably electrically connect the electrodes of the element or the like to the external electric circuit.
【0035】更に本発明の配線基板は硬化性樹脂前駆体
と無機絶縁物粉末とを混合して成る前駆体シートに印刷
された金属ペーストを一旦、紫外線によって半硬化させ
ることから前駆体シート等を熱硬化させる際に配線導体
に変形等が発生することはなく、印刷時の形状を維持す
ることができ、配線導体の高密度化が容易となる。Further, in the wiring board of the present invention, the metal paste printed on the precursor sheet formed by mixing the curable resin precursor and the inorganic insulating powder is once semi-cured by ultraviolet rays, so that the precursor sheet or the like is obtained. No deformation or the like occurs in the wiring conductor during thermosetting, the shape at the time of printing can be maintained, and the wiring conductor can be easily densified.
【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。FIG. 1 is a cross-sectional view showing an embodiment in which a wiring board of the present invention is applied to a semiconductor element housing package.
【図2】(a)乃至(c)は本発明の配線基板の製造方
法を説明するための各工程毎の断面図である。2A to 2C are cross-sectional views for each step for explaining the method for manufacturing a wiring board according to the present invention.
1・・・・・・・・・・・・・絶縁基体 1a、1b、1c・・・・・・絶縁基板 2・・・・・・・・・・・・・配線導体 11a、11b、11c・・・前駆体シート 12・・・・・・・・・・・・金属ペースト Insulation bases 1a, 1b, 1c ... Insulation substrate 2 ... Wiring conductors 11a, 11b, 11c・ ・ ・ Precursor sheet 12 ・ ・ ・ ・ ・ ・ ・ ・ ・ Metal paste
Claims (2)
乃至40重量%の熱硬化性樹脂とから成り、前記無機絶
縁物粉末を前記熱硬化性樹脂により結合した絶縁基体
に、金属粉末をエポキシ変性アクリレート系樹脂により
結合した配線導体を被着させて成る配線基板。1. An inorganic insulating powder of 60 to 95% by weight and 5
To 40% by weight of a thermosetting resin, and a wiring conductor formed by bonding a metal powder with an epoxy-modified acrylate resin is adhered to an insulating substrate having the inorganic insulating powder bonded with the thermosetting resin. Wiring board.
混合して成る前駆体シートを準備する工程と、前記前駆
体シートに、エポキシ変性アクリレート系樹脂と金属粉
末とを混合して成る金属ペーストを所定パターンに印刷
する工程と、前記所定パターンに印刷された金属ペース
トを紫外線にて半硬化させる工程と、前記前駆体シート
及び所定パターンに印刷された金属ペーストを熱硬化さ
せる工程とから成る配線基板の製造方法。2. A step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and mixing the epoxy sheet with an epoxy-modified acrylate resin and a metal powder. A step of printing the formed metal paste in a predetermined pattern, a step of semi-curing the metal paste printed in the predetermined pattern with ultraviolet rays, and a step of thermally curing the precursor sheet and the metal paste printed in the predetermined pattern A method of manufacturing a wiring board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09498195A JP3292620B2 (en) | 1995-04-20 | 1995-04-20 | Wiring board and method of manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09498195A JP3292620B2 (en) | 1995-04-20 | 1995-04-20 | Wiring board and method of manufacturing the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08288596A true JPH08288596A (en) | 1996-11-01 |
| JP3292620B2 JP3292620B2 (en) | 2002-06-17 |
Family
ID=14125085
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP09498195A Expired - Fee Related JP3292620B2 (en) | 1995-04-20 | 1995-04-20 | Wiring board and method of manufacturing the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3292620B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10163364A (en) * | 1996-11-28 | 1998-06-19 | Kyocera Corp | Wiring board |
| US6871396B2 (en) | 2000-02-09 | 2005-03-29 | Matsushita Electric Industrial Co., Ltd. | Transfer material for wiring substrate |
-
1995
- 1995-04-20 JP JP09498195A patent/JP3292620B2/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10163364A (en) * | 1996-11-28 | 1998-06-19 | Kyocera Corp | Wiring board |
| US6871396B2 (en) | 2000-02-09 | 2005-03-29 | Matsushita Electric Industrial Co., Ltd. | Transfer material for wiring substrate |
| US6936774B2 (en) | 2000-02-09 | 2005-08-30 | Matsushita Electric Industrial Co., Ltd. | Wiring substrate produced by transfer material method |
| EP1933376A2 (en) | 2000-02-09 | 2008-06-18 | Matsushita Electric Industrial Co., Ltd. | Transfer material, method for producing the same and wiring substrate produced by using the same |
| US7888789B2 (en) | 2000-02-09 | 2011-02-15 | Panasonic Corporation | Transfer material used for producing a wiring substrate |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3292620B2 (en) | 2002-06-17 |
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