JPH1074858A - Wiring board and manufacturing method thereof - Google Patents
Wiring board and manufacturing method thereofInfo
- Publication number
- JPH1074858A JPH1074858A JP8229505A JP22950596A JPH1074858A JP H1074858 A JPH1074858 A JP H1074858A JP 8229505 A JP8229505 A JP 8229505A JP 22950596 A JP22950596 A JP 22950596A JP H1074858 A JPH1074858 A JP H1074858A
- Authority
- JP
- Japan
- Prior art keywords
- thermosetting resin
- powder
- insulating
- conductive material
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Manufacturing Of Printed Wiring (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structure Of Printed Boards (AREA)
Abstract
(57)【要約】
【課題】絶縁基体に搭載される半導体素子が作動時に発
生する熱を外部に良好に放散することができずに半導体
素子に熱破壊や誤動作を発生させてしまう。
【解決手段】60乃至95重量%の無機絶縁物粉末と5
乃至40重量%の熱硬化性樹脂とから成り、前記無機絶
縁物粉末を前記熱硬化性樹脂により結合して成る絶縁基
体1に、金属粉末を熱硬化樹脂により結合した配線導体
2を被着させて成る配線基板であって、前記絶縁基体1
はその表面に熱伝導率が100W/m・K以上の高熱伝
導材料粉末60乃至95重量%と熱硬化性樹脂5乃至4
0重量%とから成り、前記高熱伝導材料粉末を前記熱硬
化性樹脂で結合して成る放熱部材5が被着されている。
(57) Abstract: A semiconductor element mounted on an insulating base cannot satisfactorily dissipate heat generated during operation to the outside, causing thermal destruction or malfunction of the semiconductor element. SOLUTION: The inorganic insulating powder of 60 to 95% by weight and 5
A wiring conductor 2 in which metal powder is bonded by a thermosetting resin is applied to an insulating substrate 1 made of a thermosetting resin of about 40% by weight and comprising the inorganic insulating powder bonded by the thermosetting resin. A wiring board comprising:
Has a surface having a thermal conductivity of at least 100 W / m · K and a high thermal conductive material powder of 60 to 95% by weight and a thermosetting resin 5 to 4
0% by weight, and a heat radiating member 5 formed by bonding the high thermal conductive material powder with the thermosetting resin is attached.
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体素子を収容
するための半導体素子収納用パッケージや混成集積回路
基板等に用いられる配線基板に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a package for housing a semiconductor element for housing a semiconductor element or a hybrid integrated circuit board.
【0002】[0002]
【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を搭載する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とより構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して搭載固定するとともに該半導体素子
の各電極を例えばボンディングワイヤ等の電気的接続手
段を介して配線導体に電気的に接続し、しかる後、前記
絶縁基体の上面に、金属やセラミックス等から成る蓋体
を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロウ
材等の封止材を介して接合させ、絶縁基体の凹部内に半
導体素子を気密に収容することによって製品としての半
導体装置となり、絶縁基体の下面に導出した配線導体の
一部を外部電気回路基板の配線導体に接続することによ
って半導体素子の各電極が外部電気回路基板に電気的に
接続されることとなる。2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element is made of ceramics such as an aluminum oxide sintered body, and a semiconductor element is mounted on a central portion of an upper surface thereof. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum led out from the periphery of the recess to the lower surface of the insulating base, and a semiconductor element is formed on the bottom of the recess of the insulating base. The electrodes of the semiconductor element are mounted and fixed via an adhesive such as glass, resin, brazing material or the like, and each electrode of the semiconductor element is electrically connected to a wiring conductor via an electrical connection means such as a bonding wire. A cover made of metal, ceramics, or the like is placed on the upper surface of the base with a sealing material such as glass, resin, brazing material, etc. A semiconductor device as a product by hermetically housing the semiconductor element in the recess of the insulating base, and connecting a part of the wiring conductor led out to the lower surface of the insulating base to the wiring conductor of the external electric circuit board. Thus, each electrode of the semiconductor element is electrically connected to the external electric circuit board.
【0003】この従来の配線基板は、一般にセラミック
グリーンシート積層法によって製作されており、具体的
には、酸化アルミニウム、酸化珪素、酸化マグネシウ
ム、酸化カルシウム等のセラミック原料粉末に適当な有
機バインダー、溶剤等を添加混合して泥漿状となすとと
もにこれを従来周知のドクターブレード法等によりシー
ト状とすることによって複数のセラミックグリーンシー
ト(セラミック生シート)を得、しかる後、前記セラミ
ックグリーンシートに適当な打ち抜き加工を施すととも
に配線導体となる金属ペーストを所定パターンに印刷塗
布し、最後に前記セラミックグリーンシートを所定の順
に上下に積層して生セラミック成形体となすとともに該
生セラミック成形体を還元雰囲気中、約1600℃の高
温で焼成することによって製作される。[0003] This conventional wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, an organic binder and a solvent suitable for ceramic raw material powder such as aluminum oxide, silicon oxide, magnesium oxide and calcium oxide are used. The mixture is added and mixed to form a slurry, and the mixture is formed into a sheet by a well-known doctor blade method or the like to obtain a plurality of ceramic green sheets (ceramic green sheets). A punching process is performed and a metal paste to be a wiring conductor is printed and applied in a predetermined pattern. Finally, the ceramic green sheets are stacked up and down in a predetermined order to form a green ceramic molded body, and the green ceramic molded body is placed in a reducing atmosphere. Firing at a high temperature of about 1600 ° C It is fabricated me.
【0004】しかしながら、この従来の配線基板は、絶
縁基体を構成する酸化アルミニウム質焼結体等のセラミ
ックスが硬くて脆い性質を有するため、搬送工程や半導
体装置製作の自動ライン等において配線基板同士が、あ
るいは配線基板と半導体装置製作自動ラインの一部とが
激しく衝突すると絶縁基体に欠けや割れ、クラック等が
発生し、その結果、半導体素子を内部に気密に収容する
ことができず、半導体素子を長期間にわたり正常、且つ
安定に作動させることができなくなるという欠点を有し
ていた。However, in the conventional wiring board, since ceramics such as an aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the wiring boards are not connected to each other in a transfer process or an automatic line for manufacturing semiconductor devices. When the wiring board and a part of the automatic semiconductor device manufacturing line collide violently, the insulating substrate is chipped, broken, cracked, etc., and as a result, the semiconductor element cannot be housed in an airtight manner. Has a disadvantage that it cannot be operated normally and stably for a long period of time.
【0005】また、前記配線基板の製造方法によれば、
生セラミック成形体を焼成する際、生セラミック成形体
に不均一な焼成収縮が生じ、得られる配線基板に反り等
の変形や寸法のばらつきが発生して半導体素子の各電極
と配線導体とを、あるいは配線導体と外部電気回路基板
の配線導体とを正確、且つ確実に電気的接続することが
できないという欠点を有していた。According to the method of manufacturing a wiring board,
When firing the green ceramic molded body, non-uniform firing shrinkage occurs in the green ceramic molded body, and deformation and dimensional variation such as warpage occur in the obtained wiring board, and each electrode of the semiconductor element and the wiring conductor are formed. Another problem is that the wiring conductor cannot be accurately and reliably electrically connected to the wiring conductor of the external electric circuit board.
【0006】そこで、配線基板の絶縁基体を従来のセラ
ミックスに代えて無機絶縁物粉末を熱硬化性樹脂で結合
したものにすることが提案されている。Therefore, it has been proposed to replace the insulating substrate of the wiring substrate with a conventional ceramic and bond the inorganic insulating powder with a thermosetting resin.
【0007】この無機絶縁物粉末を熱硬化性樹脂で結合
して成る絶縁基体を使用した配線基板は、熱硬化性樹脂
と無機絶縁物粉末とを混合して成る半硬化状態の絶縁シ
ートを準備するとともに該半硬化絶縁シートに適当な打
ち抜き加工を施し、次にこれに熱硬化性樹脂と金属粉末
とを混合した配線導体と成る金属ペーストを所定パター
ンに印刷塗布し、最後に前記金属ペーストが印刷塗布さ
れた半硬化絶縁シートを必要に応じて積層するとともに
これを約100〜300℃の温度で熱硬化させることに
よって製作される。For a wiring board using an insulating substrate formed by bonding the inorganic insulating powder with a thermosetting resin, a semi-cured insulating sheet prepared by mixing the thermosetting resin and the inorganic insulating powder is prepared. Then, the semi-cured insulating sheet is subjected to an appropriate punching process, and then a metal paste serving as a wiring conductor in which a thermosetting resin and a metal powder are mixed is printed and applied in a predetermined pattern. It is manufactured by laminating a print-coated semi-cured insulating sheet as necessary and thermally curing it at a temperature of about 100 to 300 ° C.
【0008】[0008]
【発明が解決しようとする課題】しかしながら、この無
機絶縁物粉末を熱硬化性樹脂で結合して成る絶縁基体と
金属粉末を熱硬化性樹脂で結合して成る配線導体とから
成る配線基板は、絶縁基体を構成する無機絶縁物粉末が
例えば酸化珪素から成る場合、酸化珪素の熱伝導率が約
2W/m・K程度であり、また熱硬化性樹脂の熱伝導率
が約0.1W/m・K程度であることから、その熱伝導
率が約0.5W/m・K程度と低く、そのためこれに作
動時の発熱量が大きな半導体素子を搭載すると該半導体
素子の作動時に発生する熱が絶縁基体を介して外部に良
好に放散除去されずに、半導体素子が半導体素子自身の
発する熱で高温となり、その結果、半導体素子に熱破壊
や誤動作を発生させてしまうという欠点が誘発される。However, a wiring board comprising an insulating base formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with a thermosetting resin, When the inorganic insulating powder constituting the insulating base is made of, for example, silicon oxide, the thermal conductivity of the silicon oxide is about 2 W / m · K, and the thermal conductivity of the thermosetting resin is about 0.1 W / m.・ Since it is about K, its thermal conductivity is as low as about 0.5 W / m · K. Therefore, when a semiconductor element which generates a large amount of heat during operation is mounted, heat generated during operation of the semiconductor element is reduced. Without being satisfactorily dissipated and removed to the outside via the insulating base, the semiconductor element becomes high in temperature due to the heat generated by the semiconductor element itself, and as a result, a disadvantage is caused in that the semiconductor element causes thermal destruction or malfunction.
【0009】また上記欠点を解消するために、絶縁基体
の表面に銅やアルミニウム、あるいは窒化アルミニウム
質焼結体等の熱伝導率に優れる放熱部材を樹脂等の接着
剤を介して取着し、該放熱部材を介して半導体素子が作
動時に発生する熱を外部に良好に放散除去することが考
えられる。In order to solve the above-mentioned disadvantage, a heat radiating member having excellent thermal conductivity such as copper, aluminum, or aluminum nitride sintered body is attached to the surface of the insulating base via an adhesive such as resin. It is conceivable to satisfactorily dissipate and remove the heat generated during operation of the semiconductor element to the outside via the heat radiating member.
【0010】しかしながら、絶縁基体の表面に銅やアル
ミニウム、あるいは窒化アルミニウム質焼結体等の熱伝
導率に優れる放熱部材を樹脂等の接着剤を介して取着し
た場合、銅やアルミニウム、あるいは窒化アルミニウム
質焼結体等から成る放熱部材は、樹脂等の接着剤との化
学的な結合力が弱く絶縁基体に強固に接合されにくく、
また絶縁基体の熱膨張係数が約30×10-6/℃〜40
×10-6/℃であるのに対して銅の熱膨張係数が約14
×10-6/℃、アルミニウムの熱膨張係数が約23×1
0-6/℃、窒化アルミニウム質焼結体の熱膨張係数が約
5×10-6/℃といずれも大きく異なることから、半導
体素子の作動時に発生する熱が絶縁基体及び放熱部材に
繰り返し印可されると、絶縁基体と放熱部材との熱膨張
係数の差に起因して発生する熱応力により放熱部材が絶
縁基体から剥離してしまい、その結果、絶縁基体に搭載
される半導体素子が作動時に発生する熱を外部に良好に
放散することが不可となって、やはり半導体素子に熱破
壊や誤動作を発生させてしまう。However, when a heat radiating member having excellent thermal conductivity, such as copper, aluminum, or aluminum nitride sintered body, is attached to the surface of the insulating base via an adhesive such as resin, copper, aluminum, or nitrided The heat dissipating member made of an aluminum sintered body or the like has a weak chemical bonding force with an adhesive such as a resin and is hardly firmly joined to the insulating base,
Further, the coefficient of thermal expansion of the insulating substrate is about 30 × 10 −6 / ° C. to 40.
× 10 -6 / ° C, whereas the coefficient of thermal expansion of copper is about 14
× 10 -6 / ° C, coefficient of thermal expansion of aluminum is about 23 × 1
0 −6 / ° C., the coefficient of thermal expansion of the aluminum nitride sintered body is about 5 × 10 −6 / ° C., which is significantly different from each other, so that the heat generated during the operation of the semiconductor element can be repeatedly applied to the insulating base and the heat radiating member. Then, the heat radiating member is separated from the insulating base due to thermal stress generated due to a difference in thermal expansion coefficient between the insulating base and the heat radiating member, and as a result, the semiconductor element mounted on the insulating base is in operation. It becomes impossible to satisfactorily dissipate the generated heat to the outside, which also causes thermal destruction and malfunction of the semiconductor element.
【0011】[0011]
【課題を解決するための手段】本発明の配線基板は、6
0乃至95重量%の無機絶縁物粉末と5乃至40重量%
の熱硬化性樹脂とから成り、前記無機絶縁物粉末を前記
熱硬化性樹脂により結合して成る絶縁基体に、金属粉末
を熱硬化樹脂により結合した配線導体を被着させて成る
配線基板であって、前記絶縁基体はその表面に熱伝導率
が100W/m・K以上の高熱伝導材料粉末60乃至9
5重量%と熱硬化性樹脂5乃至40重量%とから成り、
前記高熱伝導材料粉末を前記熱硬化性樹脂で結合して成
る放熱部材が被着されていることを特徴とするものであ
り、放熱部材を熱伝導率が100W/m・K以上の高熱
伝導材料粉末を熱硬化性樹脂で結合して成る材料で形成
したことから該放熱部材の熱伝導率が約25W/m・K
以上の大きなものとなり、半導体素子の作動時に発生す
る熱を外部に良好に放散することができるとともに該放
熱部材の熱膨張係数が30×10-6/℃〜40×10-6
/℃と絶縁基体の熱膨張係数と略同じとなり、絶縁基体
と放熱部材とに半導体素子が作動時に発生する熱が繰り
返し印加されても両者間に大きな熱応力が発生すること
はなく、従って、放熱部材が絶縁基体より剥離すること
はない。According to the present invention, there is provided a wiring board comprising:
0 to 95% by weight of inorganic insulating powder and 5 to 40% by weight
And a wiring conductor formed by bonding the inorganic insulating powder with the thermosetting resin to a wiring conductor formed by bonding the metal powder with the thermosetting resin. The insulating substrate has a high thermal conductive material powder having a thermal conductivity of 100 W / m · K or more on its surface.
5% by weight and 5 to 40% by weight of a thermosetting resin,
A heat dissipating member formed by bonding the high heat conductive material powder with the thermosetting resin is attached, and the heat dissipating member is formed of a high heat conductive material having a heat conductivity of 100 W / m · K or more. The thermal conductivity of the heat dissipating member is about 25 W / m · K since the powder is made of a material obtained by bonding the powder with a thermosetting resin.
As described above, the heat generated during the operation of the semiconductor element can be satisfactorily radiated to the outside, and the heat radiation member has a coefficient of thermal expansion of 30 × 10 −6 / ° C. to 40 × 10 −6.
/ ° C is substantially the same as the thermal expansion coefficient of the insulating base, and even if heat generated during operation of the semiconductor element is repeatedly applied to the insulating base and the heat radiating member, no large thermal stress is generated therebetween. The heat radiation member does not peel off from the insulating base.
【0012】また本発明の配線基板の製造方法は、熱硬
化性樹脂と無機絶縁物粉末とを混合して成る半硬化絶縁
シートを準備する工程と、前記半硬化絶縁シートに熱硬
性樹脂と金属粉末とを混合して成る金属ペーストを所定
の配線パターンに印刷する工程と、前記半硬化絶縁シー
トに熱硬化性樹脂と熱伝導率が100W/m・K以上の
高熱伝導材料粉末とを混合して成る高熱伝導材料ペース
トを所定の放熱パターンに印刷塗布する工程と、前記半
硬化絶縁シートと金属ペースト及び高熱伝導材料ペース
トとを完全に熱硬化させ一体化する工程と、から成るこ
とを特徴とするものであり、前記半硬化絶縁シートと高
熱伝導材料ペーストとがいずれも熱硬化性樹脂を含み、
該半硬化絶縁シートと高熱伝導材料ペーストとを熱硬化
させることにより結合一体化することから、半硬化絶縁
シートに含有される熱硬化性樹脂と高熱伝導材料ペース
トに含有される熱硬化性樹脂とが化学的に強固に結合
し、その結果、絶縁基体と放熱部材とが強固に接合され
る。Further, in the method of manufacturing a wiring board according to the present invention, there is provided a step of preparing a semi-cured insulating sheet formed by mixing a thermosetting resin and an inorganic insulating powder; A step of printing a metal paste obtained by mixing the powder with a powder on a predetermined wiring pattern; and mixing a thermosetting resin and a high thermal conductive material powder having a thermal conductivity of 100 W / m · K or more in the semi-cured insulating sheet. A step of printing and applying a high heat conductive material paste formed on a predetermined heat radiation pattern, and a step of completely thermosetting and integrating the semi-cured insulating sheet, the metal paste and the high heat conductive material paste. The semi-cured insulating sheet and the high thermal conductive material paste both contain a thermosetting resin,
Since the semi-cured insulating sheet and the high thermal conductive material paste are bonded and integrated by heat curing, the thermosetting resin contained in the semi-cured insulating sheet and the thermosetting resin contained in the high thermal conductive material paste Are chemically strongly bonded, and as a result, the insulating base and the heat radiating member are firmly joined.
【0013】[0013]
【発明の実施の形態】次に、本発明を添付の図面に基づ
き、詳細に説明する。図1は、本発明の配線基板を半導
体素子を収容する半導体素子収納用パッケージに適用し
た場合の一実施例を示し、1は絶縁基体、2は配線導体
である。Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating base, and 2 is a wiring conductor.
【0014】前記絶縁基体1は、三層の絶縁層1a、1
b、1cを積層することによって形成されており、その
上面中央部に半導体素子を収容するための凹部Aを有
し、該凹部A底面には半導体素子3が樹脂等の接着剤を
介して接着固定される。The insulating substrate 1 has three insulating layers 1a, 1
The semiconductor element 3 is formed by laminating b and 1c, and has a concave portion A for accommodating the semiconductor element at the center of the upper surface thereof, and the semiconductor element 3 is bonded to the bottom surface of the concave portion A with an adhesive such as resin. Fixed.
【0015】前記絶縁基体1を構成する絶縁層1a、1
b、1cは、例えば酸化珪素、酸化アルミニウム、窒化
アルミニウム、炭化珪素、チタン酸バリウム、チタン酸
ストロンチウム、チタン酸カルシウム、酸化チタン、ゼ
オライト等の無機絶縁物粉末をエポキシ樹脂、ポリイミ
ド樹脂、フェノール樹脂、熱硬化性ポリフニレンエーテ
ル樹脂、ポリイミドアミド樹脂、ビスマレイミドトリア
ジン樹脂等の熱硬化性樹脂により結合することによって
形成されており、絶縁基体1を構成する三層の絶縁層1
a、1b、1cはその各々が無機絶縁物粉末を靭性に優
れるエポキシ樹脂等の熱硬化性樹脂で結合することによ
って形成されていることから絶縁基体1に外力が印加さ
れても該外力によって絶縁基体1に欠けや割れ、クラッ
ク等が発生することはない。The insulating layers 1a, 1 constituting the insulating substrate 1
b, 1c, for example, an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, calcium titanate, titanium oxide, zeolite, epoxy resin, polyimide resin, phenol resin, The three insulating layers 1 which are formed by bonding with a thermosetting resin such as a thermosetting polyphenylene ether resin, a polyimide amide resin, a bismaleimide triazine resin, etc.
a, 1b, and 1c are formed by bonding inorganic insulating powder with a thermosetting resin such as an epoxy resin having excellent toughness, so that even if an external force is applied to the insulating base 1, the insulating substrate 1 is insulated by the external force. Chipping, cracking, cracking and the like do not occur in the base 1.
【0016】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する三層の絶縁層1a、
1b、1cは、これに含有される無機絶縁物粉末の含有
量が60重量%未満であると絶縁基体1の熱膨張係数が
半導体素子3の熱膨張係数に対して大きく相違し、半導
体素子3が作動時に熱を発し、該熱が半導体素子3と絶
縁基体1の両者に印可されると、両者間に両者の熱膨張
係数の相違に起因する大きな熱応力が発生し、この大き
な熱応力によって半導体素子3が絶縁基体1から剥離し
たり、半導体素子3に割れや欠けが発生してしまう。従
って、前記絶縁基体1を構成する絶縁層1a、1b、1
cは、その各々の内部に含有される無機絶縁物粉末の量
が60乃至95重量%の範囲に特定される。Incidentally, three insulating layers 1a, 3a constituting an insulating base 1 formed by bonding the inorganic insulating powder with a thermosetting resin.
1b and 1c, when the content of the inorganic insulating powder contained therein is less than 60% by weight, the thermal expansion coefficient of the insulating base 1 is significantly different from the thermal expansion coefficient of the semiconductor element 3; Generates heat during operation, and when the heat is applied to both the semiconductor element 3 and the insulating base 1, a large thermal stress is generated between the two due to a difference in the coefficient of thermal expansion between the two. The semiconductor element 3 peels off from the insulating base 1 or the semiconductor element 3 is cracked or chipped. Therefore, the insulating layers 1a, 1b, 1
As for c, the amount of the inorganic insulating powder contained therein is specified in the range of 60 to 95% by weight.
【0017】また前記絶縁基体1は、その凹部A周辺か
ら下面外周部にかけて例えば銅、銀、金等の金属粉末を
エポキシ樹脂、ポリイミド樹脂、フェノール樹脂、熱硬
化性ポリフニレンエーテル樹脂、ポリイミドアミド樹
脂、ビスマレイミドトリアジン樹脂等の熱硬化樹脂によ
り結合した配線導体2が被着形成されている。The insulating substrate 1 is made of a metal powder such as copper, silver, gold, etc., from the periphery of the concave portion A to the outer peripheral portion of the lower surface thereof by epoxy resin, polyimide resin, phenol resin, thermosetting polyphenylene ether resin, polyimide amide resin. And a wiring conductor 2 bonded by a thermosetting resin such as a bismaleimide triazine resin.
【0018】前記配線導体2は、半導体素子3の各電極
を外部電気回路に電気的に接続する作用を為し、絶縁基
体1の凹部A周辺に位置する部位には半導体素子3の各
電極がボンディングワイヤ4を介して電気的に接続さ
れ、また絶縁基体1の下面外周部に導出された部位は外
部電気回路に電気的に接続される。The wiring conductor 2 serves to electrically connect each electrode of the semiconductor element 3 to an external electric circuit. Each electrode of the semiconductor element 3 is located at a position around the concave portion A of the insulating base 1. A portion electrically connected via the bonding wire 4 and a portion led out to the outer peripheral portion of the lower surface of the insulating base 1 is electrically connected to an external electric circuit.
【0019】前記配線導体2に含有される金属粉末は、
配線導体2に導電性を付与する作用を為し、配線導体2
における含有量が70重量%未満では配線導体2の電気
抵抗が高いものとなり、また95重量%を越えると金属
粉末を熱硬化性樹脂で強固に結合して所定の配線導体2
を形成することが困難となる傾向にある。従って、前記
配線導体2は、その内部に含有される金属粉末の量を7
0乃至95重量%の範囲としておくことが好ましい。The metal powder contained in the wiring conductor 2 is as follows:
The wiring conductor 2 acts to impart conductivity to the wiring conductor 2.
If the content is less than 70% by weight, the electrical resistance of the wiring conductor 2 is high, and if it exceeds 95% by weight, the metal powder is firmly bound with a thermosetting resin and a predetermined wiring conductor 2 is formed.
Tends to be difficult to form. Therefore, the amount of the metal powder contained in the wiring conductor 2 is reduced by 7%.
It is preferable to set the range of 0 to 95% by weight.
【0020】また、前記配線導体2に含有される熱硬化
性樹脂は、配線導体2に含有される金属粉末を結合する
とともに配線導体2を絶縁基体1に被着させる作用を為
し、配線導体2における含有量が5重量%未満では、金
属粉末同士を強固に結合して配線導体2を形成すること
が困難となる傾向にあり、また30重量%を越えると配
線導体2の電気抵抗が大きなものとなる傾向にある。従
って、前記配線導体2に含有される熱硬化性樹脂の含有
量は5乃至30重量%の範囲が好ましい。The thermosetting resin contained in the wiring conductor 2 serves to bind the metal powder contained in the wiring conductor 2 and to adhere the wiring conductor 2 to the insulating base 1. If the content of the metal powder 2 is less than 5% by weight, it tends to be difficult to form the wiring conductor 2 by firmly bonding the metal powders to each other, and if it exceeds 30% by weight, the electrical resistance of the wiring conductor 2 is large. It tends to be something. Therefore, the content of the thermosetting resin contained in the wiring conductor 2 is preferably in the range of 5 to 30% by weight.
【0021】前記配線導体2は、またその露出する表面
にニッケル、金等の耐食性に優れ、且つ良導電性の金属
をメッキ法により1.0乃至20.0μmの厚みに層着
させておくと配線導体2の酸化腐食を有効に防止するこ
とができるとともに配線導体2とボンディングワイヤ4
とを強固に電気的に接続させることができる。従って前
記配線導体2は、その露出する表面にニッケルや金等の
耐食性に優れ、且つ良導電性の金属をメッキ法により
1.0乃至20.0μmの厚みに層着させておくことが
好ましい。The wiring conductor 2 is preferably provided with a metal having excellent corrosion resistance, such as nickel or gold, and a good conductivity, having a thickness of 1.0 to 20.0 μm by a plating method. Oxidation and corrosion of the wiring conductor 2 can be effectively prevented, and the wiring conductor 2 and the bonding wire 4
Can be firmly and electrically connected. Therefore, it is preferable that the wiring conductor 2 is coated with a metal having excellent corrosion resistance, such as nickel or gold, and a good conductivity by a plating method to a thickness of 1.0 to 20.0 μm on the exposed surface.
【0022】更に、前記絶縁基体1は、その下面に銅、
銀、アルミニウム、窒化アルミニウム焼結体等の熱伝導
率が100W/m・K以上の高熱伝導材料粉末60乃至
95重量%とエポキシ樹脂、ポリイミド樹脂、ビスマレ
イミドトリアジン樹脂、フェノール樹脂、熱硬化性ポリ
フェニレンエーテル樹脂等の熱硬化性樹脂5乃至40重
量%から成り、前記高熱伝導材料粉末を前記熱硬化性樹
脂で結合して成る放熱部材5が被着されている。Further, the insulating base 1 has copper on its lower surface,
60 to 95% by weight of high thermal conductive material powder having a thermal conductivity of 100 W / m · K or more such as silver, aluminum, aluminum nitride sintered body, epoxy resin, polyimide resin, bismaleimide triazine resin, phenol resin, thermosetting polyphenylene A heat dissipating member 5 made of a thermosetting resin such as an ether resin or the like in an amount of 5 to 40% by weight and formed by bonding the high heat conductive material powder with the thermosetting resin is attached.
【0023】前記放熱部材5は、半導体素子3が作動時
に発生する熱を外部に良好に放散する作用を為し、熱伝
導率が100W/m・K以上の高熱伝導材料粉末60乃
至95重量%と熱硬化性樹脂5乃至40重量%から成
り、前記高熱伝導材料粉末を前記熱硬化性樹脂で結合し
て成ることから、その熱伝導率が約25W/m・K以上
の大きなものとなるとともにその熱膨張係数が約30×
10-6/℃〜40×10-6/℃と絶縁基体1の熱膨張係
数に近似したものとなり、その結果、半導体素子3が作
動時に発生する熱を外部に極めて良好に放散除去するこ
とができるとともに半導体素子3が作動時に発生する熱
が絶縁基体1と放熱部材5との両方に印加されても両者
の熱膨張係数の相違に起因して大きな熱応力が発生する
ことはなく、従って該応力により放熱部材が絶縁基体1
から剥離することはなく、半導体素子3を常に正常、且
つ安定に作動させることができる。The heat dissipating member 5 functions to satisfactorily dissipate the heat generated during operation of the semiconductor element 3 to the outside, and has a heat conductivity of 60 to 95% by weight of a high heat conductive material powder having a heat conductivity of 100 W / m · K or more. And 5 to 40% by weight of a thermosetting resin, and the high thermal conductive material powder is bonded with the thermosetting resin, so that the thermal conductivity becomes as large as about 25 W / m · K or more. Its thermal expansion coefficient is about 30 ×
10 −6 / ° C. to 40 × 10 −6 / ° C., which is close to the coefficient of thermal expansion of the insulating substrate 1. As a result, heat generated when the semiconductor element 3 is operated can be radiated to the outside very well. Even if the heat generated during operation of the semiconductor element 3 is applied to both the insulating base 1 and the heat radiating member 5, no large thermal stress is generated due to the difference in the thermal expansion coefficient between the two. The heat radiating member is insulated by the stress in the insulating base 1
The semiconductor element 3 can always be operated normally and stably without being separated from the semiconductor element 3.
【0024】尚、前記放熱部材5に含有される高熱伝導
材料粉末は、放熱部材5に大きな熱伝導性を付与する作
用を為し、その熱伝導率が100W/m・K未満では放
熱部材5の熱伝導率を約25W/m・K以上の大きなも
のとして半導体素子3の作動時に発生する熱を外部に良
好に放散することが困難となり、半導体素子3に熱破壊
や誤動作を発生させてしまう危険性が大きなものとな
る。従って前記放熱部材5に含有される高熱伝導材料粉
末はその熱伝導率が100W/m・K以上のものに限定
される。The high heat conductive material powder contained in the heat radiating member 5 has a function of imparting a large thermal conductivity to the heat radiating member 5, and when the heat conductivity is less than 100 W / m · K, the heat radiating member 5 has a high thermal conductivity. , The heat generated during the operation of the semiconductor element 3 is difficult to satisfactorily dissipate to the outside, resulting in thermal destruction and malfunction of the semiconductor element 3. The danger becomes great. Therefore, the high thermal conductive material powder contained in the heat radiating member 5 is limited to those having a thermal conductivity of 100 W / m · K or more.
【0025】また前記放熱部材5に含有される高熱伝導
材料粉末は、放熱部材5における含有量が65重量%未
満では、放熱部材5の熱伝導率を約25W/m・K以上
の大きなものとして半導体素子3の作動時に発生する熱
を外部に良好に放散することが困難となり、半導体素子
3に熱破壊や誤動作を発生させてしまう危険性が大きな
ものとなり、放熱部材5における含有量が95重量%を
越えると高熱伝導材料粉末を熱硬化性樹脂で強固に結合
して所定の放熱部材5を形成することが困難となる。従
って、前記放熱部材5に含有される高熱伝導材料粉末
は、放熱部材5における含有量が、65乃至95重量%
の範囲に限定される。When the content of the high thermal conductive material powder in the heat radiating member 5 is less than 65% by weight, the heat conductivity of the heat radiating member 5 may be as large as about 25 W / m · K or more. It becomes difficult to satisfactorily dissipate the heat generated during the operation of the semiconductor element 3 to the outside, and there is a great risk that the semiconductor element 3 will be damaged by heat or malfunction. %, It becomes difficult to form the predetermined heat radiating member 5 by firmly bonding the high thermal conductive material powder with the thermosetting resin. Therefore, the content of the high thermal conductive material powder contained in the heat radiating member 5 is 65 to 95% by weight in the heat radiating member 5.
Is limited to the range.
【0026】更に、前記放熱部材5に含有される熱硬化
性樹脂は、前記絶縁基体1に含有される熱硬化性樹脂と
実質的に同じ樹脂であると、放熱部材5の熱膨張係数を
絶縁基体1の熱膨張係数に極めて近いものとなすことが
できるとともに放熱部材5を絶縁基体1に極めて強固に
被着させることができる。従って、前記放熱部材5に含
有される熱硬化性樹脂は前記絶縁基体1に含有される熱
硬化性樹脂と実質的に同じ樹脂であることが好ましい。Further, if the thermosetting resin contained in the heat radiating member 5 is substantially the same as the thermosetting resin contained in the insulating base 1, the thermal expansion coefficient of the heat radiating member 5 is reduced. The thermal expansion coefficient can be made very close to the coefficient of thermal expansion of the base 1, and the heat radiation member 5 can be very firmly adhered to the insulating base 1. Therefore, the thermosetting resin contained in the heat radiating member 5 is preferably substantially the same as the thermosetting resin contained in the insulating base 1.
【0027】かくして本発明の配線基板によれば、絶縁
基体1の凹部A底面に半導体素子3を樹脂等の接着剤を
介して接着固定するとともに半導体素子3の各電極をボ
ンディングワイヤ4を介して配線導体2に電気的に接続
し、最後に前記絶縁基体1の上面に蓋体6を樹脂等から
成る封止材を介して接合させ、絶縁基体1と蓋体5とか
ら成る容器内部に半導体素子3を気密に収容することに
より製品としての半導体装置が完成する。Thus, according to the wiring board of the present invention, the semiconductor element 3 is bonded and fixed to the bottom surface of the recess A of the insulating base 1 with an adhesive such as a resin, and each electrode of the semiconductor element 3 is bonded with the bonding wire 4. It is electrically connected to the wiring conductor 2, and finally, the lid 6 is joined to the upper surface of the insulating base 1 via a sealing material made of resin or the like, and the semiconductor is placed inside the container including the insulating base 1 and the lid 5. The semiconductor device as a product is completed by housing the element 3 in an airtight manner.
【0028】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について説明する。Next, a method of manufacturing a wiring board used in the package for housing a semiconductor element will be described.
【0029】先ず、図2(a)に示すように無機絶縁物
粉末を熱硬化樹脂で結合して成る三枚の半硬化絶縁シー
ト11a、11b、11cを準備する。First, as shown in FIG. 2A, three semi-cured insulating sheets 11a, 11b and 11c are prepared by bonding inorganic insulating powder with a thermosetting resin.
【0030】前記三枚の半硬化絶縁シート11a、11
b、11cは、無機絶縁物粉末を熱硬化性樹脂で結合す
ることによって形成されており、例えば粒径が0.1〜
100μm程度の酸化珪素粉末にエポキシ樹脂及びイミ
ダゾール系硬化剤を添加混合して得たペーストをドクタ
ーブレード法等のシート成形法を採用してシート状とな
すとともに該シートを25〜150℃の温度で1〜60
分間加熱し半硬化させることによって製作される。The three semi-cured insulating sheets 11a, 11
b and 11c are formed by bonding an inorganic insulating powder with a thermosetting resin, and have a particle size of, for example, 0.1 to
A paste obtained by adding and mixing an epoxy resin and an imidazole-based curing agent to silicon oxide powder of about 100 μm is formed into a sheet by using a sheet forming method such as a doctor blade method, and the sheet is formed at a temperature of 25 to 150 ° C. 1-60
Produced by heating and semi-curing for a minute.
【0031】尚、前記半硬化絶縁シート11a、11
b、11cは、その硬度がJIS7215,6301の
タイプA測定に規定の硬度で40乃至90となるように
半硬化させておくと、後述するように三枚の半硬化絶縁
シート11a、11b、11cに、打ち抜き加工を施し
たり配線導体2となる金属ペーストや放熱部材5となる
高熱伝導材料ペーストを印刷塗布する際等に半硬化絶縁
シート11a、11b、11cに変形やクラックをさせ
ることなく正確、且つ確実に打ち抜き加工や金属ペース
ト、高熱伝導材料ペーストの印刷を行うことができ、そ
の結果、所望の配線基板を正確、且つ確実に製作するこ
とができる。従って、前記半硬化絶縁シート11a、1
1b、11cはその硬度をJIS7215,6301の
タイプA測定に規定の硬度で40乃至90の範囲として
おくことが好ましい。The semi-cured insulating sheets 11a, 11a
b and 11c are semi-cured so that their hardness is 40 to 90 as specified in Type A measurement according to JIS 7215 and 6301, and as described later, three semi-cured insulating sheets 11a, 11b and 11c When semi-cured insulating sheets 11a, 11b, 11c are not deformed or cracked when punching or printing and applying a metal paste to be wiring conductor 2 or a high heat conductive material paste to be heat radiating member 5, In addition, punching and printing of a metal paste and a high thermal conductive material paste can be performed reliably, and as a result, a desired wiring board can be accurately and reliably manufactured. Therefore, the semi-cured insulating sheets 11a, 1
It is preferable that the hardness of 1b and 11c is set in the range of 40 to 90 as the hardness specified in the type A measurement of JIS7215,6301.
【0032】次に図2(b)に示すように前記半硬化さ
れた三枚の半硬化絶縁シート11a、11b、11cの
うち二枚の半硬化絶縁シート11a、11bに凹部Aと
なる開口12a、12bを二枚の半硬化絶縁シート11
b、11cに配線導体2を引き回すための貫通孔13
b、13cを各々形成する。Next, as shown in FIG. 2B, two semi-cured insulating sheets 11a, 11b among the three semi-cured semi-cured insulating sheets 11a, 11b are provided with openings 12a that form recesses A. , 12b to two semi-cured insulating sheets 11
b, 11c through-hole 13 for routing wiring conductor 2
b and 13c are formed respectively.
【0033】前記開口12a、12b及び貫通孔13
b、13cは、半硬化絶縁シート11a、11b、11
cに従来周知のパンチング加工法を施し、半硬化絶縁シ
ート11a、11b、11cの各々に所定形状の孔を穿
孔することによって形成される。The openings 12a and 12b and the through holes 13
b, 13c are semi-cured insulating sheets 11a, 11b, 11
The semi-cured insulating sheets 11a, 11b, and 11c are formed by subjecting each of the semi-cured insulating sheets 11a, 11b, and 11c to a hole having a predetermined shape.
【0034】次に図2(c)に示すように、前記半硬化
絶縁シート11b、11cの上下面及び貫通孔13b、
13c内に配線導体2となる金属ペースト21を従来周
知のスクリーン印刷法及び充填法を採用して所定の配線
パターンに印刷塗布及び充填するとともに前記半硬化絶
縁シート11cの下面に放熱部材5となる高熱伝導材料
ペースト22をスクリーン印刷法を採用して印刷塗布
し、しかる後これらを約25〜150℃の温度で1〜6
0分間加熱し金属ペースト21及び高熱伝導材料ペース
ト22を半硬化させる。Next, as shown in FIG. 2C, the upper and lower surfaces of the semi-cured insulating sheets 11b and 11c and the through holes 13b,
13c, a metal paste 21 to be the wiring conductor 2 is printed and applied to a predetermined wiring pattern by using a conventionally known screen printing method and filling method, and the heat radiation member 5 is formed on the lower surface of the semi-cured insulating sheet 11c. The high thermal conductive material paste 22 is applied by printing using a screen printing method, and thereafter, these are applied at a temperature of about 25 to 150 ° C. for 1 to 6 hours.
The metal paste 21 and the high heat conductive material paste 22 are semi-cured by heating for 0 minutes.
【0035】前記配線導体2となる金属ペースト21と
しては、例えば粒径が0.1〜20μm程度の銅等粉末
にビスフェノールA型エポキシ樹脂、ノボラック型エポ
キシ樹脂、グリシジルエステル型エポキシ樹脂等のエポ
キシ樹脂にアミン系硬化剤、イミダゾール系硬化剤、酸
無水物系硬化剤等の硬化剤等を添加混合しペースト状と
なしたものが使用される。The metal paste 21 serving as the wiring conductor 2 is, for example, a powder of copper having a particle size of about 0.1 to 20 μm or an epoxy resin such as a bisphenol A type epoxy resin, a novolak type epoxy resin, and a glycidyl ester type epoxy resin. A curing agent such as an amine-based curing agent, an imidazole-based curing agent, and an acid anhydride-based curing agent is added and mixed to form a paste.
【0036】また前記放熱部材5となる高熱伝導材料ペ
ースト22としては、例えば熱伝導率が100W/m・
K以上の窒化アルミニウム質焼結体を粉砕して粒径0.
1乃至20μm程度の粉末とした窒化アルミニウム質焼
結体粉末にビスフェノールA型エポキシ樹脂、ノボラッ
ク型エポキシ樹脂、グリシジルエステル型エポキシ樹脂
等のエポキシ樹脂にアミン系硬化剤、イミダゾール系硬
化剤、酸無水物系硬化剤等の硬化剤等を添加混合しペー
スト状となしたものが使用される。The high thermal conductive material paste 22 serving as the heat radiating member 5 has, for example, a thermal conductivity of 100 W / m ·
K or more of the aluminum nitride sintered body is pulverized to a particle size of 0.
Aluminum nitride sintered powder in the form of powder having a particle size of about 1 to 20 μm is added to an epoxy resin such as bisphenol A type epoxy resin, novolak type epoxy resin, glycidyl ester type epoxy resin, and the like, an amine curing agent, an imidazole curing agent, an acid anhydride. A paste obtained by adding and mixing a curing agent such as a system curing agent is used.
【0037】そして最後に前記三枚の半硬化絶縁シート
11a、11b、11cを上下に加圧積層するとともに
これを約80〜300℃の温度で約10秒〜24時間加
熱し前記半硬化絶縁シート11a、11b、11c及び
金属ペースト21、高熱伝導材料ペースト22を完全に
熱硬化させることによって図1に示すような絶縁基体1
に配線導体2及び放熱部材5を被着一体化させた配線基
板が完成する。Finally, the three semi-cured insulating sheets 11a, 11b, and 11c are vertically laminated under pressure and heated at a temperature of about 80 to 300 ° C. for about 10 seconds to 24 hours. The insulating base 1 as shown in FIG. 1 is obtained by completely thermosetting the metal pastes 11a, 11b, 11c, the metal paste 21, and the high thermal conductive material paste 22.
A wiring board in which the wiring conductor 2 and the heat radiating member 5 are integrally attached is completed.
【0038】この場合、本発明の配線基板の製造方法に
よれば、前記半硬化絶縁シート11a、11b、11c
及び金属ペースト21、高熱伝導材料ペースト22は、
熱硬化時に収縮することは殆どなく、従って、得られる
配線基板に変形や寸法のばらつきが発生することは皆無
であり、半導体素子3と配線導体2とを正確に接続する
ことが可能な配線基板を提供することができ、更に半硬
化絶縁シート11a、11b、11c及び金属ペースト
21、高熱伝導材料ペースト22に含有される熱硬化性
樹脂同士が硬化反応によって化学的に強固に結合される
ため絶縁基体1に配線導体2及び放熱部材5が強固に被
着され、得られる配線基板において配線導体2や放熱部
材5が絶縁基体1から剥離することはなく、従って半導
体素子3が作動時に発生する熱を放熱部材5を介して外
部に常に良好に放散し半導体素子3を正常、且つ安定に
作動させることが可能な配線基板を提供することができ
る。In this case, according to the method of manufacturing a wiring board of the present invention, the semi-cured insulating sheets 11a, 11b, 11c
And the metal paste 21 and the high thermal conductive material paste 22
There is almost no shrinkage at the time of thermosetting, and therefore, there is no deformation or dimensional variation in the obtained wiring board, and a wiring board capable of accurately connecting the semiconductor element 3 and the wiring conductor 2 Further, the thermosetting resins contained in the semi-cured insulating sheets 11a, 11b, 11c, the metal paste 21, and the high heat conductive material paste 22 are chemically strongly bonded to each other by a curing reaction. The wiring conductor 2 and the heat radiating member 5 are firmly adhered to the base 1, and the wiring conductor 2 and the heat radiating member 5 do not peel off from the insulating base 1 in the obtained wiring board, and therefore, the heat generated when the semiconductor element 3 is operated. Can be always satisfactorily radiated to the outside via the heat radiating member 5 to enable the semiconductor element 3 to operate normally and stably.
【0039】また、前記硬化絶縁シート11a、11
b、11cに含有される熱硬化性樹脂と前記高熱伝導材
料ペースト22に含有される熱硬化性樹脂とを実質的に
同じ樹脂としておくと、前記硬化絶縁シート11a、1
1b、11c及び金属ペースト21、高熱伝導材料ペー
スト22を完全に熱硬化させて絶縁基体1に配線導体2
及び放熱部材5を被着一体化させる際に絶縁基体1に放
熱部材5を極めて強固、且つ容易に被着一体化させるこ
とができる。従って、前記硬化絶縁シート11a、11
b、11cに含有される熱硬化性樹脂と前記高熱伝導材
料ペースト22に含有される熱硬化性樹脂とは実質的に
同じ樹脂であることが好ましい。Further, the cured insulating sheets 11a, 11
When the thermosetting resin contained in the b and 11c and the thermosetting resin contained in the high thermal conductive material paste 22 are substantially the same resin, the cured insulating sheets 11a and
1b, 11c, the metal paste 21, and the high thermal conductive material paste 22 are completely thermally cured to form the wiring conductor 2 on the insulating base 1.
In addition, when the heat radiating member 5 is attached and integrated, the heat radiating member 5 can be extremely firmly and easily attached and integrated to the insulating base 1. Therefore, the cured insulating sheets 11a, 11
It is preferable that the thermosetting resin contained in b and 11c and the thermosetting resin contained in the high thermal conductive material paste 22 are substantially the same resin.
【0040】尚、本発明は、上述の実施の形態に限定さ
れるものではなく、本発明の要旨を逸脱しない範囲であ
れば種々の変更は可能であり、例えば上述の実施形態に
おける配線基板では、絶縁基体1の凹部A底面と放熱部
材5との間に該凹部A底面と放熱部材5との間の熱伝導
率を向上させるための熱伝達手段をを有していなかった
が、本発明の配線基板は、図3に示すように絶縁基体1
の凹部A底面から絶縁基体1下面に貫通し放熱部材5に
達し、内部に高熱伝導材料が充填されたサーマルビア7
を有していても良く、この場合、半導体素子3の作動時
に発生する熱が該サーマルビア7内の高熱伝導材料を介
して放熱部材5に極めて良好に伝達され、該伝達された
熱が放熱部材5を介して外部に効率よく放散されること
から、更に好ましい。前記サーマルビア7内部に充填さ
れる高熱伝導材料は、放熱部材5と同様の材料、具体的
には銅、アルミニウム、銀、窒化アルミニウム質焼結体
等の熱伝導率が100W/m・K以上の高熱伝導材料粉
末60乃至95重量%とエポキシ樹脂、ポリイミド樹
脂、ビスマレイミドトリアジン樹脂、フェノール樹脂、
熱硬化性ポリフェニレンエーテル樹脂等の熱硬化性樹脂
5乃至40重量%から成り、前記高熱伝導材料粉末を前
記熱硬化性樹脂で結合して成る高熱伝導材料が好適に使
用され、この場合、絶縁基体1の絶縁層1cとなる半硬
化絶縁シート11cにサーマルビア7と成る貫通孔を穿
孔するとともに該サーマルビア7となる貫通孔内に高熱
伝導材料粉末と熱硬化性樹脂とを混合して得た高熱伝導
材料ペーストを充填し、これを絶縁基体1となる半硬化
絶縁シート11a、11b、11c及び配線導体2と成
る金属ペースト21、放熱部材5と成る高熱伝導材料ペ
ースト22とともに熱硬化させることにより絶縁基体1
の凹部A底面から絶縁基体1下面に貫通し放熱部材5に
達するサーマルビア7を有する配線基板が製作される。It should be noted that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the scope of the present invention. The present invention does not have a heat transfer means between the bottom surface of the concave portion A of the insulating base 1 and the heat radiating member 5 for improving the thermal conductivity between the bottom surface of the concave portion A and the heat radiating member 5. The wiring board of FIG.
The thermal via 7 penetrates from the bottom surface of the concave portion A to the lower surface of the insulating base 1 and reaches the heat radiation member 5 and is filled with a high heat conductive material.
In this case, the heat generated during the operation of the semiconductor element 3 is very well transmitted to the heat radiating member 5 via the high thermal conductive material in the thermal via 7, and the transmitted heat is radiated. It is more preferable because it is efficiently radiated to the outside via the member 5. The high thermal conductive material filled in the thermal via 7 is the same material as the heat radiating member 5, specifically, the thermal conductivity of copper, aluminum, silver, aluminum nitride sintered body or the like is 100 W / m · K or more. 60 to 95% by weight of high thermal conductive material powder and epoxy resin, polyimide resin, bismaleimide triazine resin, phenol resin,
A high heat conductive material composed of 5 to 40% by weight of a thermosetting resin such as a thermosetting polyphenylene ether resin, wherein the high heat conductive material powder is bonded with the thermosetting resin is preferably used. The semi-cured insulating sheet 11c serving as the first insulating layer 1c was provided with a through hole serving as the thermal via 7, and a high heat conductive material powder and a thermosetting resin were mixed in the through hole serving as the thermal via 7. By filling a high thermal conductive material paste and thermally curing it together with the semi-cured insulating sheets 11a, 11b, 11c serving as the insulating base 1, the metal paste 21 serving as the wiring conductor 2, and the high thermal conductive material paste 22 serving as the heat radiating member 5. Insulating substrate 1
A wiring board having a thermal via 7 penetrating from the bottom surface of the concave portion A to the lower surface of the insulating base 1 and reaching the heat dissipation member 5 is manufactured.
【0041】また、上述の実施形態では、本発明の配線
基板を半導体素子を収容する半導体素子収納用パッケー
ジに適用した場合を例に採って説明したが、例えば混成
集積回路等他の用途に使用される配線基板に適用しても
よい。In the above embodiment, the case where the wiring board of the present invention is applied to a package for housing a semiconductor element for housing a semiconductor element has been described as an example. However, the wiring board may be used for other purposes such as a hybrid integrated circuit. It may be applied to a wiring board to be used.
【0042】更に、上述の実施の形態では、三枚の半硬
化絶縁シートを積層することによって配線基板を製作し
たが、一枚や二枚、あるいは四枚以上の半硬化絶縁シー
トを使用して配線基板を製作してもよい。Further, in the above-described embodiment, a wiring board is manufactured by laminating three semi-cured insulating sheets. However, one, two, or four or more semi-cured insulating sheets are used. A wiring board may be manufactured.
【0043】また更に、上述の実施の形態では、絶縁基
体は、無機絶縁物粉末と熱硬化性樹脂とから成っていた
が、これらに更にガラス繊維やカーボン繊維、アラミド
繊維、アルミナ繊維、チタン酸カリウムウィスカー、ホ
ウ酸アルミニウムウィスカー等の短繊維を配合させても
よい。Further, in the above-described embodiment, the insulating base is composed of the inorganic insulating powder and the thermosetting resin. However, the insulating base may further include glass fiber, carbon fiber, aramid fiber, alumina fiber, titanic acid, and the like. Short fibers such as potassium whiskers and aluminum borate whiskers may be blended.
【0044】更にまた上述の実施の形態では、配線導体
は、金属粉末を熱硬化性樹脂により結合することにより
形成されていたが、配線導体に更に低融点金属を配合さ
せるとともに該低融点金属により金属粉末同士を結合す
ることにより形成されてもよく、この場合、配線導体と
なる金属ペースト中に低融点金属として例えば錫−鉛半
田等から成る低融点金属粉末を配合させるとともにれを
絶縁基体となる半硬化絶縁シートに印刷塗布した後、こ
れに熱を印加し低融点金属粉末を溶融させ該溶融した低
融点金属により金属粉末を結合する方法が採用される。Furthermore, in the above-described embodiment, the wiring conductor is formed by bonding metal powder with a thermosetting resin. It may be formed by bonding metal powders together.In this case, a low-melting-point metal powder made of, for example, tin-lead solder or the like is mixed as a low-melting-point metal in a metal paste to be a wiring conductor. After printing and applying to the semi-cured insulating sheet, a method is adopted in which heat is applied thereto to melt the low melting point metal powder, and the metal powder is bonded by the melted low melting point metal.
【0045】[0045]
【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことにより形成されていることから、配線基板同士ある
いは配線基板と半導体装置の一部とが激しく衝突しても
絶縁基体に欠けや割れ、クラック等が発生することはな
く、半導体素子を気密に収容して長期間にわたり正常、
且つ安定に作動させることができる。According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards or the wiring board and the semiconductor device are formed. No chipping, cracking, cracking, etc. will occur in the insulating base even if a part of the semiconductor device collides violently.
And it can be operated stably.
【0046】また本発明の配線基板によれば、放熱部材
は熱伝導率が100W/m・K以上の高熱伝導材料粉末
60乃至95重量%と熱硬化性樹脂5乃至40重量%か
ら成り、前記高熱伝導材料粉末を前記熱硬化性樹脂で結
合して成ることから、その熱伝導率が約25W/m・K
以上の大きなものとなるとともにその熱膨張係数が約3
0〜40×10−6/℃と絶縁基体の熱膨張係数に近似
したものとなり、その結果、半導体素子が作動時に発生
する熱を外部に極めて良好に放散除去することができる
とともに半導体素子が作動時に発生する熱が絶縁基体と
放熱部材との両方に印加されても両者の熱膨張係数の相
違に起因して大きな熱応力が発生することはなく、従っ
て該応力により放熱部材が絶縁基体から剥離することは
なく、半導体素子を常に正常、且つ安定に作動させるこ
とができる。According to the wiring board of the present invention, the heat radiating member is composed of 60 to 95% by weight of a high heat conductive material powder having a thermal conductivity of 100 W / m · K or more and 5 to 40% by weight of a thermosetting resin. Since the high thermal conductive material powder is bonded by the thermosetting resin, its thermal conductivity is about 25 W / m · K.
The thermal expansion coefficient is about 3
0 to 40 × 10 −6 / ° C., which is close to the coefficient of thermal expansion of the insulating substrate. As a result, the heat generated during operation of the semiconductor element can be very effectively radiated to the outside and removed, and the semiconductor element operates. Even if the heat generated at the time is applied to both the insulating base and the heat radiating member, no large thermal stress is generated due to the difference in the thermal expansion coefficient between the two, and therefore the heat radiating member is separated from the insulating base by the stress. Therefore, the semiconductor element can always be operated normally and stably.
【0047】更に本発明の配線基板の製造方法によれ
ば、熱硬化性樹脂と無機絶縁物粉末とを混合して成る半
硬化絶縁シート及び熱硬化性樹脂と金属粉末とを混合し
て成る金属ペースト、熱硬化性樹脂と高熱伝導材料ペー
ストを熱硬化させることによって配線基板が製作され、
前記半硬化絶縁シート及び金属ペースト、高熱伝導材料
ペーストは、熱硬化時に収縮することは殆どなく、従っ
て、得られる配線基板に変形や寸法のばらつきが発生す
ることは皆無であり、半導体素子と配線導体とを正確に
接続することが可能な配線基板を提供することができ、
更に半硬化絶縁シート及び金属ペースト、高熱伝導材料
ペーストに含有される熱硬化性樹脂同士が硬化反応によ
って化学的に強固に結合されるため絶縁基体に配線導体
及び放熱部材が極めて強固に被着され、得られる配線基
板において配線導体や放熱部材が絶縁基体から剥離する
ことはなく、従って半導体素子が作動時に発生する熱を
放熱部材を介して外部に常に良好に放散し半導体素子を
正常、且つ安定に作動させることが可能な配線基板を提
供することができる。Further, according to the method for manufacturing a wiring board of the present invention, a semi-cured insulating sheet formed by mixing a thermosetting resin and an inorganic insulating powder, and a metal formed by mixing a thermosetting resin and a metal powder. The wiring board is manufactured by thermosetting the paste, thermosetting resin and high heat conductive material paste,
The semi-cured insulating sheet, the metal paste, and the high thermal conductive material paste hardly shrink during thermal curing, and therefore, the resulting wiring board is free from deformation and dimensional variation. It is possible to provide a wiring board that can accurately connect with a conductor,
Furthermore, since the thermosetting resins contained in the semi-cured insulating sheet, the metal paste, and the high heat conductive material paste are chemically bonded to each other by a curing reaction, the wiring conductor and the heat radiating member are extremely firmly adhered to the insulating base. In the obtained wiring board, the wiring conductor and the heat radiating member do not peel off from the insulating base, so that the heat generated during the operation of the semiconductor element is always satisfactorily radiated to the outside through the heat radiating member so that the semiconductor element is normal and stable And a wiring board that can be operated at a time.
【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.
【図2】本発明の配線基板の製造方法を説明するための
工程毎の断面図である。FIG. 2 is a cross-sectional view of each process for explaining the method for manufacturing a wiring board of the present invention.
【図3】本発明の他の実施例を示す断面図である。FIG. 3 is a sectional view showing another embodiment of the present invention.
1・・・絶縁基体 2・・・配線導体 5・・・放熱部材 11・・・半硬化絶縁シート 21・・・金属ペースト 22・・・高熱伝導材料ペースト DESCRIPTION OF SYMBOLS 1 ... Insulating base 2 ... Wiring conductor 5 ... Heat radiating member 11 ... Semi-hardened insulating sheet 21 ... Metal paste 22 ... High heat conductive material paste
Claims (4)
乃至40重量%の熱硬化性樹脂とから成り、前記無機絶
縁物粉末を前記熱硬化性樹脂により結合して成る絶縁基
体に、金属粉末を熱硬化樹脂により結合した配線導体を
被着させて成る配線基板であって、前記絶縁基体はその
表面に熱伝導率が100W/m・K以上の高熱伝導材料
粉末60乃至95重量%と熱硬化性樹脂5乃至40重量
%とから成り、前記高熱伝導材料粉末を前記熱硬化性樹
脂で結合して成る放熱部材が被着されていることを特徴
とする配線基板。An inorganic insulating powder of 60 to 95% by weight and 5
To 40% by weight of a thermosetting resin, and a wiring conductor formed by bonding the metal powder with the thermosetting resin to an insulating base formed by bonding the inorganic insulating powder with the thermosetting resin. A wiring board, wherein the insulating base comprises, on the surface thereof, 60 to 95% by weight of a high thermal conductive material powder having a thermal conductivity of 100 W / m · K or more and 5 to 40% by weight of a thermosetting resin. A wiring board, on which a heat radiating member formed by bonding a material powder with the thermosetting resin is attached.
材の熱硬化性樹脂とが実質的に同じ樹脂であることを特
徴とする請求項1に記載の配線基板。2. The wiring board according to claim 1, wherein the thermosetting resin of the insulating base and the thermosetting resin of the heat radiation member are substantially the same resin.
て成る半硬化絶縁シートを準備する工程と、前記半硬化
絶縁シートに熱硬性樹脂と金属粉末とを混合して成る金
属ペーストを所定の配線パターンに印刷する工程と、前
記半硬化絶縁シートに熱硬化性樹脂と熱伝導率が100
W/m・K以上の高熱伝導材料粉末とを混合して成る高
熱伝導材料ペーストを所定の放熱パターンに印刷塗布す
る工程と、前記半硬化絶縁シートと金属ペースト及び高
熱伝導材料ペーストとを完全に熱硬化させ一体化させる
工程と、から成ることを特徴とする配線基板の製造方
法。3. A step of preparing a semi-cured insulating sheet comprising a mixture of a thermosetting resin and an inorganic insulating powder; and a metal paste comprising mixing the thermosetting resin and a metal powder with the semi-cured insulating sheet. Printing on a predetermined wiring pattern, and applying a thermosetting resin and a thermal conductivity of 100 to the semi-cured insulating sheet.
A step of printing and applying a high heat conductive material paste formed by mixing a high heat conductive material powder of W / m · K or more in a predetermined heat radiation pattern, and completely connecting the semi-cured insulating sheet, the metal paste and the high heat conductive material paste. And b. A step of thermosetting and integrating the wiring board.
脂と前記高熱伝導材料ペーストに含有される熱硬化性樹
脂とが実質的に同じ樹脂であることを特徴とする請求項
3に記載の配線基板の製造方法。4. The thermosetting resin contained in the semi-cured sheet and the thermosetting resin contained in the high heat conductive material paste are substantially the same resin. Method of manufacturing a wiring board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8229505A JPH1074858A (en) | 1996-08-30 | 1996-08-30 | Wiring board and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8229505A JPH1074858A (en) | 1996-08-30 | 1996-08-30 | Wiring board and manufacturing method thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH1074858A true JPH1074858A (en) | 1998-03-17 |
Family
ID=16893231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8229505A Pending JPH1074858A (en) | 1996-08-30 | 1996-08-30 | Wiring board and manufacturing method thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1074858A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001015869A (en) * | 1999-06-30 | 2001-01-19 | Kyocera Corp | Wiring board |
| JP2001244638A (en) * | 1999-12-20 | 2001-09-07 | Matsushita Electric Ind Co Ltd | Circuit component built-in module and method of manufacturing the same |
| JP2002111226A (en) * | 2000-09-26 | 2002-04-12 | Tdk Corp | Composite multilayer substrate and module using the same |
| US6931725B2 (en) | 1999-12-20 | 2005-08-23 | Matsushita Electric Industrial Co., Ltd. | Circuit component built-in module, radio device having the same, and method for producing the same |
| JP2007511899A (en) * | 2003-10-07 | 2007-05-10 | アイビス・テクノロジー・コーポレイション | Thermosetting resin wafer holding pin |
| WO2010067508A1 (en) * | 2008-12-12 | 2010-06-17 | 株式会社村田製作所 | Multilayer substrate and method for manufacturing same |
| CN105280601A (en) * | 2014-06-24 | 2016-01-27 | 思鹭科技股份有限公司 | Package structure and package substrate structure |
-
1996
- 1996-08-30 JP JP8229505A patent/JPH1074858A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001015869A (en) * | 1999-06-30 | 2001-01-19 | Kyocera Corp | Wiring board |
| JP2001244638A (en) * | 1999-12-20 | 2001-09-07 | Matsushita Electric Ind Co Ltd | Circuit component built-in module and method of manufacturing the same |
| US6931725B2 (en) | 1999-12-20 | 2005-08-23 | Matsushita Electric Industrial Co., Ltd. | Circuit component built-in module, radio device having the same, and method for producing the same |
| JP2002111226A (en) * | 2000-09-26 | 2002-04-12 | Tdk Corp | Composite multilayer substrate and module using the same |
| JP2007511899A (en) * | 2003-10-07 | 2007-05-10 | アイビス・テクノロジー・コーポレイション | Thermosetting resin wafer holding pin |
| WO2010067508A1 (en) * | 2008-12-12 | 2010-06-17 | 株式会社村田製作所 | Multilayer substrate and method for manufacturing same |
| CN105280601A (en) * | 2014-06-24 | 2016-01-27 | 思鹭科技股份有限公司 | Package structure and package substrate structure |
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