JPH0834014B2 - Magneto-optical storage element - Google Patents
Magneto-optical storage elementInfo
- Publication number
- JPH0834014B2 JPH0834014B2 JP13644191A JP13644191A JPH0834014B2 JP H0834014 B2 JPH0834014 B2 JP H0834014B2 JP 13644191 A JP13644191 A JP 13644191A JP 13644191 A JP13644191 A JP 13644191A JP H0834014 B2 JPH0834014 B2 JP H0834014B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- magneto
- amorphous magnetic
- storage element
- optical storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Description
【0001】[0001]
【産業上の利用分野】本発明はレーザ光を用いて情報の
記録、再生、消去を行うことのできる磁気光学記憶素子
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magneto-optical storage element capable of recording, reproducing and erasing information by using laser light.
【0002】[0002]
【従来の技術】近年、情報の記録、再生、消去が可能な
光記憶素子の開発が磁気光学記憶素子を中心に活発に推
進されている。また、この磁気光学記憶素子の構造で高
い評価を受けているものとして反射膜構造の素子があ
る。2. Description of the Related Art In recent years, development of an optical storage element capable of recording, reproducing and erasing information has been actively promoted centering on a magneto-optical storage element. An element having a reflective film structure has been highly evaluated in the structure of this magneto-optical storage element.
【0003】図2に反射膜構造の素子の一例の側面図を
示す。同図で符号1はガラス、アクリル樹脂等よりなる
透明基板、2はSiO、SiO2、Si3N4等の透明薄
膜、3はGdTbFe、TbDyFe、GdCo、Tb
Fe、GdTbDyFe等の希土類・遷移金属合金から
なる非晶質磁性体薄膜、4はSiO、SiO2、Si3N
4等の透明薄膜、5はCu、Al、Au、Ag等の反射
膜である。FIG. 2 shows a side view of an example of an element having a reflective film structure. In the figure, reference numeral 1 is a transparent substrate made of glass or acrylic resin, 2 is a transparent thin film of SiO, SiO 2 , Si 3 N 4 or the like, 3 is GdTbFe, TbDyFe, GdCo, Tb.
Amorphous magnetic thin film made of rare earth / transition metal alloy such as Fe or GdTbDyFe 4 is SiO, SiO 2 , Si 3 N
Transparent thin films such as 4 and 5 are reflective films of Cu, Al, Au, Ag and the like.
【0004】以上の反射膜構造の素子は非晶質磁性体薄
膜3の厚みを100Å程度と非常に薄くしているため透
明基板1側から入射した入射レーザ光が非晶質磁性体薄
膜3を透過し、この透過した光が反射膜5にて反射され
る。したがって、非晶質磁性体薄膜3表面にて入射レー
ザ光が反射された光のカー効果と上記した非晶質磁性体
薄膜3を透過し反射膜5にて反射され再び非晶質磁性体
薄膜3を透過する光のファラデー効果とが相乗作用を起
こしカー回転角の増大を得るものである。また、透明薄
膜2の内部で光が干渉しそれによってもカー回転角の増
大の作用を得るものである。Since the thickness of the amorphous magnetic thin film 3 of the above-mentioned reflective film structure is very thin, about 100 Å, the incident laser light incident from the transparent substrate 1 side causes the amorphous magnetic thin film 3 to pass through the amorphous magnetic thin film 3. The light that has passed through is reflected by the reflective film 5. Therefore, the Kerr effect of the incident laser light reflected on the surface of the amorphous magnetic thin film 3 is transmitted, and the Kerr effect transmitted through the amorphous magnetic thin film 3 is reflected by the reflective film 5 and again the amorphous magnetic thin film. The Faraday effect of the light passing through No. 3 causes a synergistic effect to increase the Kerr rotation angle. In addition, the light interferes inside the transparent thin film 2, which also has the effect of increasing the Kerr rotation angle.
【0005】[0005]
【発明が解決しようとする課題】上述の反射膜構造の素
子は磁気光学効果の点から見れば極めて優れた構造であ
るが、その一方で非晶質磁性体薄膜3の酸化による特整
劣化が大きいことが難点であることが判明している。つ
まり、反射膜5及び透明薄膜4を通過して外気が侵入し
非晶質磁性体薄膜3を酸化せしめる、あるいは反射膜
5、透明薄膜4内部に含まれていた酸素が非晶質磁性体
薄膜3を酸化せしめる現象が発生するのである。非晶質
磁性体薄膜3が酸化すれば保磁力が低下し磁気光学効果
による再生が困難となり、極端な場合は非晶質磁性体薄
膜3の垂直磁気異方性が全くなくなり記録、再生共に不
可能となるという著しく不都合な問題が発生する。The element having the above-mentioned reflective film structure has an extremely excellent structure from the viewpoint of the magneto-optical effect. On the other hand, however, the characteristic deterioration due to the oxidation of the amorphous magnetic thin film 3 occurs. The big one has proven to be a drawback. That is, outside air penetrates through the reflective film 5 and the transparent thin film 4 to oxidize the amorphous magnetic thin film 3, or the oxygen contained in the reflective film 5 and the transparent thin film 4 is converted into the amorphous magnetic thin film. The phenomenon of oxidizing 3 occurs. If the amorphous magnetic thin film 3 is oxidized, the coercive force is lowered, making it difficult to reproduce due to the magneto-optical effect. In an extreme case, the perpendicular magnetic anisotropy of the amorphous magnetic thin film 3 is completely lost and both recording and reproducing are unsuccessful. There is a remarkably inconvenient problem that it becomes possible.
【0006】そこで本発明は上述の問題点に鑑みてなさ
れたものであり、非晶質磁性体薄膜の酸化を防止するこ
とのできる構造を有する磁気光学記憶素子を提供するこ
とを目的とする。Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide a magneto-optical storage element having a structure capable of preventing the oxidation of an amorphous magnetic thin film.
【0007】[0007]
【課題を解決するための手段】上述の目的を達成するた
め、本発明は透明基板上に膜面に垂直な方向に磁化容易
軸を有する希土類・遷移金属合金からなる非晶質磁性体
薄膜を形成してなる磁気光学記憶素子において、前記非
晶質磁性体薄膜に近接する透明薄膜を備え、該透明薄膜
中にTiあるいは希土類金属の少なくとも一つを含有し
たことを特徴とする磁気光学記憶素子である。In order to achieve the above-mentioned object, the present invention provides an amorphous magnetic thin film made of a rare earth / transition metal alloy having an easy axis of magnetization in a direction perpendicular to the film surface on a transparent substrate. A formed magneto-optical storage element, comprising a transparent thin film adjacent to the amorphous magnetic thin film, wherein the transparent thin film contains at least one of Ti and a rare earth metal. Is.
【0008】[0008]
【作用】透明基板上に膜面に垂直な方向に磁化容易軸を
有する希土類・遷移金属合金からなる非晶質磁性体薄膜
に近接して設けられる透明薄膜中にTiあるいは希土類
金属の少なくとも一つを含有することによって、侵入す
る酸素を透明薄膜中のTiあるいは希土類金属によって
消費せしめる。[Function] At least one of Ti and a rare earth metal is provided in the transparent thin film provided on the transparent substrate in proximity to the amorphous magnetic thin film made of a rare earth / transition metal alloy having an easy axis of magnetization in the direction perpendicular to the film surface. By containing, the invading oxygen can be consumed by Ti or the rare earth metal in the transparent thin film.
【0009】[0009]
【実施例】図1に示すものは本発明に係る磁気光学記憶
素子の一実施例の側面図である。同図で符号1はガラ
ス、アクリル樹脂等よりなる透明基板、2はSiO、S
iO2、Si3N4等の透明薄膜、3はGdTbFe、T
bDyFe、GdCo、TbFe、GdTbDyFe等
の希土類・遷移金属合金からなる非晶質磁性体薄膜、4
はSiO、SiO2、Si3N4等の透明薄膜、6はC
u、Al、Au、Ag、SUS等の金属膜中にTi、M
g、希土類金属(Gd、Tb、Dy、Ho、Y)等の酸
化容易性金属物質を含有した反射膜である。1 is a side view of an embodiment of a magneto-optical memory device according to the present invention. In the figure, reference numeral 1 is a transparent substrate made of glass, acrylic resin or the like, and 2 is SiO or S.
Transparent thin films such as iO 2 , Si 3 N 4 , 3 are GdTbFe, T
Amorphous magnetic thin film made of rare earth / transition metal alloy such as bDyFe, GdCo, TbFe, GdTbDyFe, 4
Is a transparent thin film of SiO, SiO 2 , Si 3 N 4, etc., 6 is C
Ti, M in a metal film of u, Al, Au, Ag, SUS, etc.
g, a rare earth metal (Gd, Tb, Dy, Ho, Y) and other oxidizable metal substances.
【0010】ここで、上記酸化容易性金属物質の含有は
透明薄膜2に対して行ってもよく、あるいは透明薄膜4
に対して行ってもよく、あるいは透明薄膜2、透明薄膜
4、反射膜6の任意の2以上の膜に対して行ってもよ
い。また、同図の構成において透明薄膜2はなくても構
わない。以上の発明の効果を確認するために、高温状態
に保存した場合の非晶質磁性体薄膜の保磁力の変化具合
を測定した結果を図3及び図4に示す。同図において横
軸が保存時間(h)、縦軸が保磁力の変化量(KOe)
を示している。また、図中の記号Gはガラス基板を意味
している。なお、保磁力の初期値は10KOeであっ
た。図3はAl反射膜中にTiを5%含有したもの(曲
線b)及び50%含有したもの(曲線c)を280℃に
保存した場合の結果を示している。Tiを含有しない反
射膜(曲線a)に比べて保磁力の変化具合が小さいこと
が理解される。また、図4はSiO 2 透明薄膜中にTi
を5%含有したもの及び50%含有したもの(ほぼ、同
一の結果が得られたので曲線eとしてまとめて示す)、
並びに、同じくSiO 2 透明薄膜中にDyを5%含有し
たもの及び50%含有したもの(この場合もほぼ、同一
の結果が得られたので曲線fとしてまとめて示す)を2
00℃に保存した場合の保磁力の変化具合を示してい
る。Tiを含有した場合もDyを含有した場合もSiO
2 のみの透明薄膜(曲線d)に比べて保磁力の変化具合
は小さいことが解る。 Here, the inclusion of the easily oxidizable metal substance may be carried out in the transparent thin film 2, or in the transparent thin film 4.
The transparent thin film 2, the transparent thin film 4, and the reflective film 6 may be used for any two or more films. In addition, the transparent thin film 2 may be omitted in the configuration shown in FIG. In order to confirm the effects of the invention described above, the results of measuring the degree of change in the coercive force of the amorphous magnetic thin film when stored in a high temperature state are shown in FIGS. 3 and 4. In the figure, the horizontal axis is the storage time (h), and the vertical axis is the amount of change in coercive force (KOe).
Is shown. The symbol G in the figure means a glass substrate. The initial value of the coercive force was 10 KOe. Fig. 3 shows an Al reflective film containing 5% Ti (curved
Line b) and the one containing 50% (curve c) at 280 ° C
The result when saved is shown. Anti-Ti-free
The change in coercive force is smaller than that of the coating (curve a)
Is understood. In addition, FIG. 4 shows that Ti is contained in the SiO 2 transparent thin film .
Containing 5% and 50% (almost the same
Since one result was obtained, it is shown collectively as a curve e),
Also , 5% of Dy is also contained in the SiO 2 transparent thin film.
And those containing 50% (Also in this case, almost the same
Since the result of is obtained, it is shown collectively as a curve f)
Shows how the coercive force changes when stored at 00 ° C
It SiO containing both Ti and Dy
Change in coercive force compared to transparent thin film (curve d) with only 2
It turns out that is small.
【0011】以上の実施例の説明においては反射膜構造
の素子において本発明を適用したものを示したが、本発
明は非晶質磁性体薄膜の膜厚が十分厚い(1000Å程
度)厚膜形の構造の素子、つまり、カー効果のみを利用
する素子においても適用が可能なものである。In the above description of the embodiments, the present invention is applied to an element having a reflective film structure, but the present invention shows that the amorphous magnetic thin film is thick enough (about 1000Å) to form a thick film. The present invention can be applied to an element having the above structure, that is, an element utilizing only the Kerr effect.
【0012】[0012]
【発明の効果】本発明によれば非晶質磁性体薄膜に近接
する透明薄膜の膜中に含有したTiあるいは希土類金属
(Gd、Tb、Dy、Ho、Y)の存在により非晶質磁
性体薄膜の酸素を大幅に抑制することができるので、こ
の非晶質磁性体薄膜の磁気的特性を安定化することがで
き、素子の信頼性を著しく向上することができる。According to the present invention, due to the presence of Ti or rare earth metal (Gd, Tb, Dy, Ho, Y) contained in the transparent thin film adjacent to the amorphous magnetic thin film, the amorphous magnetic thin film is present. Since oxygen in the thin film can be greatly suppressed, the magnetic characteristics of this amorphous magnetic thin film can be stabilized, and the reliability of the device can be significantly improved.
【図1】本発明に係る磁気光学記憶素子の側面図であ
る。FIG. 1 is a side view of a magneto-optical storage element according to the present invention.
【図2】従来の磁気光学記憶素子の側面図である。FIG. 2 is a side view of a conventional magneto-optical storage element.
【図3】Al反射膜にTiを含有した場合の保磁力の変
化特性を示す図である。 FIG. 3 shows the change in coercive force when the Al reflection film contains Ti.
It is a figure which shows the conversion characteristic.
【図4】本発明の磁気光学記憶素子の特性を示す図であ
る。 FIG. 4 is a diagram showing characteristics of the magneto-optical storage element of the present invention.
It
1 透明基板 2 透明薄膜 3 非晶質磁性体薄膜 4 透明薄膜 5 反射膜 6 酸化容易性物質を含有した反射膜 1 Transparent Substrate 2 Transparent Thin Film 3 Amorphous Magnetic Thin Film 4 Transparent Thin Film 5 Reflective Film 6 Reflective Film Containing Oxidizing Substance
───────────────────────────────────────────────────── フロントページの続き (72)発明者 太田 賢司 大阪府大阪市阿倍野区長池町22番22号 シ ャープ株式会社内 (72)発明者 山岡 秀嘉 大阪府大阪市阿倍野区長池町22番22号 シ ャープ株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Kenji Ota, 22-22 Nagaike-cho, Abeno-ku, Osaka City, Osaka Prefecture Sharp Corporation (72) Hideka Yamaoka, 22-22 Nagaike-cho, Abeno-ku, Osaka City, Osaka Prefecture Inside the company
Claims (1)
軸を有する希土類・遷移金属合金からなる非晶質磁性体
薄膜を形成してなる磁気光学記憶素子において、 前記非晶質磁性体薄膜に近接する透明薄膜を備え、 該透明薄膜中にTiあるいは希土類金属の少なくとも一
つを含有したことを特徴とする磁気光学記憶素子。1. A magneto-optical storage element comprising a transparent substrate on which an amorphous magnetic thin film made of a rare earth / transition metal alloy having an easy axis of magnetization in a direction perpendicular to the film surface is formed. A magneto-optical storage element comprising a transparent thin film adjacent to a body thin film, wherein the transparent thin film contains at least one of Ti and a rare earth metal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13644191A JPH0834014B2 (en) | 1991-06-07 | 1991-06-07 | Magneto-optical storage element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13644191A JPH0834014B2 (en) | 1991-06-07 | 1991-06-07 | Magneto-optical storage element |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14980882A Division JPS5938781A (en) | 1982-08-27 | 1982-08-27 | Magnetooptic storage element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04330654A JPH04330654A (en) | 1992-11-18 |
| JPH0834014B2 true JPH0834014B2 (en) | 1996-03-29 |
Family
ID=15175195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13644191A Expired - Lifetime JPH0834014B2 (en) | 1991-06-07 | 1991-06-07 | Magneto-optical storage element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0834014B2 (en) |
-
1991
- 1991-06-07 JP JP13644191A patent/JPH0834014B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04330654A (en) | 1992-11-18 |
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