JPH085553Y2 - Wafer delivery device - Google Patents

Wafer delivery device

Info

Publication number
JPH085553Y2
JPH085553Y2 JP1988136475U JP13647588U JPH085553Y2 JP H085553 Y2 JPH085553 Y2 JP H085553Y2 JP 1988136475 U JP1988136475 U JP 1988136475U JP 13647588 U JP13647588 U JP 13647588U JP H085553 Y2 JPH085553 Y2 JP H085553Y2
Authority
JP
Japan
Prior art keywords
wafer
pins
ring
delivery device
movable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988136475U
Other languages
Japanese (ja)
Other versions
JPH0258336U (en
Inventor
勉 水村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP1988136475U priority Critical patent/JPH085553Y2/en
Publication of JPH0258336U publication Critical patent/JPH0258336U/ja
Application granted granted Critical
Publication of JPH085553Y2 publication Critical patent/JPH085553Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Intermediate Stations On Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【考案の詳細な説明】 〈産業上の利用分野〉 この考案は半導体製造の工程において、ウエハ上に電
子回路が形成された状態で、各回路素子を検査するプロ
ービング機におけるウエハの受渡装置に係るものであ
る。
DETAILED DESCRIPTION OF THE INVENTION <Industrial field of application> The present invention relates to a wafer delivery device in a probing machine for inspecting each circuit element in a state where electronic circuits are formed on a wafer in a semiconductor manufacturing process. It is a thing.

〈従来技術〉 プロービング機に供給されるウエハは上面に極めて微
細な回路が多数個構成され、かつ配置位置方向が規制さ
れている。そこでこれを載物用テーブル上にセットする
には方向を狂わすことなく、静かにテーブル上に移す必
要があり、その上面に触れることはできない。なおプロ
ービング機においては、載物用テーブルはその作業の必
要上移動するもので、ウエハ受取り、送り出し位置も特
定されている。ここでウエハは下面もしくは、外周によ
って保持されて、ウエハ受取り、位置に送られてくる。
ここでウエハを一度中間保持機構に渡して、静かにテー
ブル上に置く方式が一般に使われる。これは載物用テー
ブルから3本のピンを上昇させ、これにウエハを受け、
次にピン下降させてテーブル上に置く順序をとる。そし
て送り出すときには逆の操作が行なわれる。
<Prior Art> A wafer supplied to a probing machine has a large number of extremely fine circuits on its upper surface, and the arrangement position direction is regulated. Therefore, in order to set this on the table for loading, it is necessary to gently move it on the table without changing the direction, and the upper surface cannot be touched. In the probing machine, the loading table is moved for the purpose of its work, and the wafer receiving and sending positions are specified. Here, the wafer is held by the lower surface or the outer circumference, receives the wafer, and is sent to a position.
Here, a method is generally used in which the wafer is once passed to the intermediate holding mechanism and gently placed on the table. This raises three pins from the loading table, receives a wafer on it,
Next, the pins are lowered and placed on the table. And when sending out, the reverse operation is performed.

ここでウエハ取扱いの中間保持機構は載物用テーブル
内に設けられるため、載物用テーブルの重量が増加し、
テーブルの精密な移動に対して、慣性が増加することは
望ましいことではない。
Since the intermediate holding mechanism for wafer handling is provided in the loading table, the weight of the loading table increases,
For precise table movement, increased inertia is undesirable.

〈本考案の問題解決手段〉 本考案においては上記中間受渡機構の主要部をなす駆
動源を受取り位置、搬出位置に固定して設けることによ
り、載物用テーブルの構造の簡易軽量化を可能とする。
<Problem solving means of the present invention> In the present invention, the drive source, which is a main part of the intermediate delivery mechanism, is fixedly provided at the receiving position and the unloading position, thereby making it possible to simplify and reduce the structure of the stage table. To do.

〈実施例〉 第1図において載物用テーブルが取付けられている基
部の垂直円筒体2の外側にリング3を上下動可能に嵌め
る。なおリング3は円筒2の中間の棚4にスプリング5
により押し付けられている。
<Embodiment> In FIG. 1, a ring 3 is vertically movably fitted to the outside of a vertical cylindrical body 2 at the base portion on which the loading table is attached. The ring 3 has a spring 5 on a shelf 4 in the middle of the cylinder 2.
It is pressed by.

そしてテーブル1の上面を貫通して自由に上下動でき
るピン6を3本立てて、その下端をリング3に接触し、
支持させる。
Then, three pins 6 which can freely move up and down through the upper surface of the table 1 are erected, and the lower ends thereof are brought into contact with the ring 3,
Support.

このような構造をもつ載物用テーブルはウエハを受け
取る位置に移動すると、ウエハ10を下面において支える
支持体11がテーブル1の直上に移動してくる。なおこの
受取位置の固定部には、支点12を有するレバー13が設け
られ、エアシリンダ14が作動することにより、レバー13
は時計方向に旋回する。
When the loading table having such a structure moves to a position for receiving the wafer, the support 11 that supports the wafer 10 on the lower surface moves to just above the table 1. A lever 13 having a fulcrum 12 is provided on the fixed portion at the receiving position, and the lever 13 is activated by the operation of the air cylinder 14.
Turns clockwise.

なお載物用テーブルが受取り位置に移動してくると、
レバー13の図の左端はリング3の下に差し込まれる。そ
してエアシリンダ14の作動によってレバー13はリング3
を押し上げピン6を一斉に上昇させて、ウエハ10を下か
ら支えて、ウエハと支持体11とを離し、支持体11が経過
した所で、エアシリンダを戻し、ピン6を下降させてウ
エハ10をテーブル1の上に静かに移す。
When the loading table moves to the receiving position,
The left end of the lever 13 in the figure is inserted under the ring 3. Then, the lever 13 is moved to the ring 3 by the operation of the air cylinder 14.
To lift the pins 6 all at once to support the wafer 10 from below and separate the wafer from the support 11. When the support 11 has passed, the air cylinder is returned and the pins 6 are lowered to lower the wafer 10. Gently transfer to table 1.

第2図に他の実施例を示す。ここではウエハ受取り位
置に上向きのエアシリンダ15を固定して設け、その垂直
ロッド16の先端が移動してくるウエハテーブルに内蔵さ
れるリング3の下面に位置をとる。そしてエアシリンダ
15を作動させることにより、ピンを上昇させることは前
述同様である。なお第1図、第2図のものも、いずれも
ウエハの搬出の場合は上記と逆の操作が行なわれる。
FIG. 2 shows another embodiment. Here, an upward air cylinder 15 is fixedly provided at the wafer receiving position, and the tip end of the vertical rod 16 thereof is positioned on the lower surface of the ring 3 built in the wafer table to which it moves. And air cylinder
The actuation of 15 raises the pin as before. In the case of unloading the wafer, the operations shown in FIGS. 1 and 2 are reversed.

〈効果〉 本考案において、移動する必要のある載物用テーブル
駆動源を設ける方式に比較して構成が簡単で、移動体の
軽量化を計ることができる。
<Effect> In the present invention, the structure is simple and the weight of the moving body can be reduced as compared with the method of providing the table driving source for the table that needs to be moved.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案の構成説明図、第2図は他の実施例を示
す説明図。 1……テーブル、2……円筒部、3……リング 4……棚、6……ピン、10……ウエハ 11……支持体、12……支点、13……レバー 14,15……エアピストン、16……垂直ロッド
FIG. 1 is an explanatory view of the configuration of the present invention, and FIG. 2 is an explanatory view showing another embodiment. 1 ... table, 2 ... cylindrical part, 3 ... ring 4 ... shelf, 6 ... pin, 10 ... wafer 11 ... support, 12 ... fulcrum, 13 ... lever 14,15 ... air Piston, 16 …… vertical rod

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】ウエハを移動可能な載物用テーブルに受け
渡す装置において、前記載物用テーブルに内蔵された上
下動可能なリングと、前記載物用テーブルに垂直に、か
つ前記リングの動きに伴って上下動可能に支持され、そ
の一端が前記載物用テーブル上に突出しているときにウ
エハに接触しこれを保持する複数本のピンと、ウエハの
受け渡し位置に固定配置され、前記載物用テーブルが前
記ウエハの受け渡し位置に位置決めされたとき、前記リ
ングを介して前記ピンを上下動させる駆動機構とからな
るウエハの受渡装置
1. A device for transferring a wafer to a movable mount table, wherein a vertically movable ring built in the mount table and movement of the ring perpendicular to the mount table. A plurality of pins that are supported so as to be movable up and down in accordance with the above, and that are fixedly arranged at the wafer transfer position, with a plurality of pins that contact and hold the wafer when one end of the product is protruding onto the table for the aforementioned object. Delivery device comprising a drive mechanism for moving the pins up and down via the ring when the work table is positioned at the delivery position of the wafer.
JP1988136475U 1988-10-19 1988-10-19 Wafer delivery device Expired - Lifetime JPH085553Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988136475U JPH085553Y2 (en) 1988-10-19 1988-10-19 Wafer delivery device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988136475U JPH085553Y2 (en) 1988-10-19 1988-10-19 Wafer delivery device

Publications (2)

Publication Number Publication Date
JPH0258336U JPH0258336U (en) 1990-04-26
JPH085553Y2 true JPH085553Y2 (en) 1996-02-14

Family

ID=31397022

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988136475U Expired - Lifetime JPH085553Y2 (en) 1988-10-19 1988-10-19 Wafer delivery device

Country Status (1)

Country Link
JP (1) JPH085553Y2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6153930U (en) * 1984-09-14 1986-04-11
JPS6214434A (en) * 1985-07-12 1987-01-23 Canon Inc Wafer chuck

Also Published As

Publication number Publication date
JPH0258336U (en) 1990-04-26

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