JPH0856901A - Binocular opening type ophthalmoscopic system - Google Patents

Abstract

PURPOSE: To align the position of a target observed through the fluoroscopic window of a measuring part by an examinee with the optical axis of a measuring optical system with high accuracy. CONSTITUTION: This binocular opening type opthalmoscopic system is equipped with a laser marker device 6 which emits a laser beam 6x in parallel with the optical axis 3x of the measuring optical system and adjacently on the upper part of the measuring part 3. A luminescent spot 6s is formed by hitting the laser beam 6x on the vertical face 7a of a wall or screen, etc., arranged in front of the device 6, and the examinee can observe the luminescent spot 6s located near the optical axis 3x through the fluoroscopic window 3a as the target.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optometry apparatus such as an eye refraction measuring apparatus, and more particularly, a window of a measuring section seen by an examinee is a see-through window and is located at an appropriate distance in front of the apparatus. The state in which the subject sees through the placed visual target, that is, the natural visual state,
The present invention relates to a so-called binocular open-type optometry device for examination.

[0002]

2. Description of the Related Art As an optometry apparatus, there are a type in which an optotype optically imaged in the apparatus is viewed by a subject and a type in which both eyes are open. Although both methods have merits and demerits, the latter method has an advantage that accuracy is good in the sense that an eye to be examined in a natural visual state is inspected.

By the way, in the case of an open-eye type optometry apparatus, the line of sight of the subject is fixed in a fixed direction during measurement,
It is necessary to match the optical axis of the measurement optical system. for that reason,
The subject looks through a see-through window of the measuring device through a transparent window of the measuring device, which is a figurine or the like that is a target placed at a fixed distance from the measuring device, for example, 4 to 5 meters.

However, it is not easy to dispose such a visual target object so as to exactly match the optical axis of the measurement optical system, and it is easy to cause a deviation between the line of sight of the subject and the optical axis of the measurement optical system. . Such a deviation can be adjusted to some extent by an examiner's alignment operation, but if the deviation is too large, measurement cannot be performed or accurate measurement cannot be performed. Further, the optotype used in the conventional binocular open-type optometry apparatus needs to have a size that makes it easy for the examinee to see which part of the optotype is to be seen. It was necessary to consider colors and shapes depending on the conditions.

[0005]

SUMMARY OF THE INVENTION Therefore, a technical problem to be solved by the present invention is to provide a binocular open type optometry apparatus for measuring the position of an optotype which a subject looks through a see-through window of a measuring section. It is to match the optical axis of the system with high accuracy.

[0006]

In order to solve the above problems, according to the present invention, a binocular open type optometry apparatus having the following configuration is provided.

That is, in this binocular open-type eye refraction measuring device, an optometric device main body is horizontally movably mounted on a base, and the optometric device main body is provided with at least a measuring section having a see-through window through which a subject looks. Is included.

The measuring section is provided with a light emitting device which emits a parallel luminous flux as a target which is substantially parallel to and approaches the optical axis of the measuring optical system.

According to the above arrangement, this device uses a bright spot (spot) formed by a parallel light flux that is substantially parallel to and close to the optical axis of the measuring optical system as a visual target. That is,
Place a wall, screen, etc. in front of the device at a position that is more than a predetermined distance away from the subject to prevent myopia, and apply a parallel light beam to the vertical surface to form a bright spot that shines brightly due to the reflected light. To do. The parallel light flux has an appropriate cross-sectional size that forms an appropriate size and shape as a target. This deviation between the bright spot and the optical axis is sufficiently small compared to the distance between the device and the bright spot, so that the parallel light flux substantially coincides with the optical axis of the measurement optical system, and Can be equated. Therefore, this bright spot is, of course, always located on or near the optical axis of the measuring optics, regardless of the distance of the elevation from the device.

Further, even if the main body of the optometry apparatus is moved horizontally with respect to the base, the light emitting device provided in the measuring section also moves integrally with the main body of the optometry apparatus, and the relative position of the parallel light flux with respect to the optical axis of the measuring optical system. Remains fixed. That is, by the movement of the optometry apparatus main body, although the bright spot formed on the vertical surface moves, the measurement optical system of the optometry apparatus main body also moves at the same time, so that the bright spot is always on or near the optical axis of the measurement optical system. To position.

Therefore, the line of sight of the subject can be accurately matched with the optical axis of the measuring optical system by the subject looking into the bright spot through the transparent window.

In the above arrangement, when the parallel light flux approaches the optical axis of the measuring optical system and is strictly parallel, the bright spot due to the parallel light flux is always constant from the optical axis, regardless of the position where the vertical surface is arranged. Located a distance away. Even if this deviation of a certain distance occurs, it is possible to measure with sufficient accuracy in practical use. However, when more accurate measurement is desired, it is more preferable that the bright spot due to the parallel light flux is located on the optical axis of the measurement optical system in a strict sense.

For that purpose, it is preferable that the measuring section is provided with a light emitting device that emits a parallel light beam as a visual target that intersects the optical axis of the measuring optical system at a predetermined position, instead of the light emitting device having the above configuration.

In the above structure, when a vertical plane is arranged at a predetermined position where the parallel light flux and the optical axis of the measuring optical system intersect to form a bright spot, the bright spot is located on the optical axis of the measuring optical system.
Further, even if a bright spot is formed by arranging an elevation in a certain range before and after a predetermined position where the parallel light flux and the optical axis of the measurement optical system intersect, the bright spot is very close to the optical axis, Highly accurate measurements can be expected.

In the above arrangement, the further the distance from the intersection of the parallel light flux and the optical axis of the measuring optical system, the greater the deviation between the optical axis and the bright spot, and hence the measurement accuracy tends to decrease. The position where the plane can be arranged is limited to a certain range before and after the intersection, but the elevation can be arranged at an arbitrary position by the following configuration.

That is, at least two light emitting devices are provided, the parallel light beams from the light emitting devices intersect each other on the optical axis of the measuring optical system, and the intersections are movable on the optical axis. The radiation angle adjusting means for adjusting the radiation angle of the parallel light flux is further provided.

In the above-mentioned structure, if the radiating angle adjusting means adjusts the luminescent spots of the parallel light flux formed on the elevation surface at an arbitrary position so as to overlap each other, the overlapping luminescent spots, that is, the intersections, are on the optical axis of the measuring optical system. Located in.

Therefore, it is possible to position the bright spot on the optical axis of the measuring optical system even if the elevation surface is arranged at an arbitrary position.

In the above construction, the radiation angle adjusting means is required, but if the following construction is adopted, the radiation angle adjusting means becomes unnecessary.

That is, the measuring section is provided with at least two light emitting devices that emit plane light as a target that intersects the optical axis of the measuring optical system.

In the above structure, when at least two plane lights intersecting the optical axis of the measuring optical system hit the elevation surface, at least two intersecting bright lines are formed. Since the plane light intersects with the optical axis of the measuring optical system, the intersection of the bright lines is on the optical axis of the measuring optical system. The examiner instructs the subject to look at the intersection of the bright lines, and the intersecting bright lines are used as the visual target.

Therefore, in the above construction, the radiation angle adjusting means is unnecessary.

In each of the above structures, the light emitting device is
Laser emitting devices are preferred.

That is, the beam light for forming the optotype may be produced by using another light source, but if the laser light emitting device is used, it is possible to form the optotype which is easy to narrow down the light source with a simple structure. In that respect, it is preferable to other light sources.

[0025]

Embodiments of the present invention will be described in detail below with reference to FIGS.

First, the first embodiment will be described.

FIG. 1 is a side view showing a state in which the binocular open eye optometry apparatus according to this embodiment, specifically, the eye refraction measuring apparatus, is used to measure the eye refraction of a subject. is there. The general structure of the entire device is the same as the conventional one. That is, the optometry apparatus main body 2 is mounted on the base 1 so as to be horizontally movable. The main body 2 includes a monitor 4, specifically, a CRT, a measuring unit 3 mounted on the monitor 4,
It has a joystick 5.

As shown in the figure, a head fixing frame 1a is provided on the subject side of the base 1. The measurement unit 3 has a see-through window 3a that the examinee looks through. The measuring unit 3 is located near the subject or the frame 1a.

A laser marker device 6, which is a light emitting device, is provided above the measuring section 3. The laser marker device 6 uses a commercially available red laser, and a laser diode is most suitable. The laser beam 6x, which is a parallel light beam, is radiated parallel to the optical axis 3x of the measuring optical system, being separated from the optical axis 3x of the measuring optical system by about 10 cm.

In order to carry out an inspection using this apparatus,
In order to prevent the subject from getting into myopia, generally, an appropriate wall, screen, or the like is arranged at a position 7 that is 3 meters or more in front of the device, and a laser beam 6x is applied to its upright surface 7a. Then, the examinee looks through the transparent window 3a with the bright spot 6s of the laser beam 6x formed on the upright surface 7a, that is, the bright spot due to the reflected light of the laser beam 6x as a target. It should be noted that, at the time of measurement, it is effective to draw the subject's attention by flashing the bright spot 6s.

In the above structure, the deviation (about 10 cm) between the point 3s on the optical axis 3x of the measuring optical system on the elevation surface 7a and the bright spot 6s by the laser beam 6x is a distance (3 meters or more) from the apparatus. Since it is sufficiently smaller than that of), the bright spot 6s can be regarded as being substantially located on the optical axis 3x. Further, the laser beam 6x is the optical axis 3 of the measurement optical system.
Since it is parallel to x, the deviation of the bright spot 7s from the optical axis 3x is constant regardless of the position of the upright surface 7a. Further, even if the eye examination apparatus main body 2 is moved horizontally with respect to the base 1 by the alignment operation of the examiner, the laser marker device 6 provided in the measurement unit 3 also moves integrally with the eye examination apparatus main body 2, so that measurement optical The relative position of the laser beam 6x with respect to the optical axis 3x of the system remains fixed. That is, although the bright spot 6s moves on the upright surface 7a due to the movement of the optometry apparatus body 2, the bright spot 6s is always located at a certain distance from the optical axis 3x of the measurement optical system.

Therefore, the examinee sees through the transparent window 3 of the measuring section 3.
The position of the bright spot 6s, which is a target to be seen through a, can be accurately matched with the optical axis 3x of the measurement optical system.

In the first embodiment, the optical axis 3x of the bright spot 6s is
Is constant regardless of the distance of the bright spot 6s from the device. This device therefore has the advantage that the elevation 7 can be arranged independently of the distance from the device. On the other hand, the measurement of this device always includes a measurement error due to a constant deviation of the bright spot 6s from the optical axis 3x.

Next, a second embodiment capable of eliminating the deviation of the bright spot from the optical axis will be described.

In the second embodiment, as shown in FIG. 2, the construction is almost the same as that of the first embodiment. The configuration different from that of the first embodiment is only the emission direction of the laser beam 6x.

That is, the laser beam 6x is located at a position 7 in front of the device at a predetermined distance, generally at a position 3 m or more in front of the device so that the subject is not in myopia.
Here, it intersects the optical axis 3x of the measurement optical system at a position 7 5 meters in front of the device. In FIG. 2, since it is not shown according to the actual size, it is hard to see that the laser beam 6x emitted from the laser marker device 6 is substantially parallel and close to the optical axis 3x of the measurement optical system, but In the vicinity of the intersection, the laser beam 6x is very close to the optical axis 3x, and the laser beam 6x is substantially the optical axis 3 of the measurement optical system.
It can be equated with x.

In order to carry out an inspection using this apparatus,
At a predetermined position 7 where the laser beam 6x and the optical axis 3x intersect, or at positions 7 ′ and 7 ″ within a predetermined range before and after the predetermined position, an appropriate wall or screen is arranged, and their elevations 7a, 7a ′ and 7a. '' Is irradiated with a laser beam 6x. And the elevations 7a, 7a ', 7
bright spots 6s, 6s', 6 of the laser beam 6x formed on a "
a ″ is used as a visual target as in the first embodiment.

In the above structure, since the laser beam 6x can be regarded as substantially the same as the optical axis 3x of the measuring optical system, the elevation surface 7
bright spot 6 of laser beam 6x formed on a, 7a ', 7a''
s, 6s', 6a '' are located on or near the optical axis 3x of the measurement optical system. That is, the standing surface 7a is located at the predetermined position 7
In the case of, the bright spot 6s is located on the optical axis 3x of the measurement optical system. Further, even if the elevations 7a ′, 7a ″ deviate from the above-mentioned predetermined position 7 within a predetermined range, the deviation of the bright spots 7s ′, 7s ″ from the optical axis 3x is very small, which is substantially Is the same as being located on the optical axis 3x.

Therefore, the examinee sees through the transparent window 3 of the measuring section 3.
The positions of the bright spots 6s, 6s', 6s'', which are the visual targets looking through a, can be matched with the optical axis 3x of the measurement optical system with extremely high accuracy.

In each of the above embodiments, the laser marker device 6 may be arranged at another position of the measuring unit 3, for example, the left and right position, instead of being arranged at the upper portion of the measuring unit 3.
Further, the laser beam 6x does not intersect the optical axis 3x, and
Even if it is not strictly parallel to the optical axis 3x, if it is close to the optical axis 3x and is substantially parallel, it can be regarded as substantially the same as the optical axis 3x. To be
Further, as the light emitting device, another light source that emits a light beam may be used instead of the laser marker device.

By the way, as described above, when more accurate measurement is desired, it is ideal that the bright spot by the laser beam is located exactly on the optical axis of the measuring optical system. Is. In the second embodiment above, such a position is
Although there is only one location 7 shown in FIG. 2, it is possible to form a bright spot that coincides with the optical axis of the measurement optical system on the elevation surface at an arbitrary position in front of the apparatus by configuring as follows. is there.

For example, a radiation angle adjusting means for adjusting the radiation angle of the laser beam from the laser marker device is further provided, and the elevation surface and the device are arranged so that the bright point is located on the optical axis of the measurement optical system by this radiation angle adjusting means. The emission angle of the laser beam is adjusted according to the distance between and.

Alternatively, two laser marker devices are provided, and the radiation angle of each laser marker device is synchronously adjusted by the radiation angle adjusting means including the known synchronization adjusting means, and the intersection of the laser beams is always on the optical axis of the measuring optical system. It is configured so that it can be moved along the optical axis while being positioned at.
Then, the synchronization adjusting means is adjusted so that the bright spots of the laser beams formed on the elevation surface at an arbitrary position in front of the device overlap with each other,
The overlapping bright points are used as targets.

According to each of the above configurations, even if the elevation surface is arranged at an arbitrary position in front of the apparatus, the bright spot of the laser beam can always be positioned on the optical axis of the measuring optical system, so that It is possible to completely match the line of sight with the optical axis of the measurement optical system.

In each of the above-mentioned constitutions, the radiation angle adjusting means for adjusting the radiation angle of the laser beam is required, but the third embodiment in which the radiation angle adjusting means is unnecessary will be described below.

That is, as shown in the perspective view of the main part of FIG. 3, this device is provided with line laser devices 16a and 16b, which are planar light emitting devices, on the upper part and the right part of the measuring part 3.

The vertical line laser device 16a located above the measuring section 3 vertically vibrates the laser beam vertically at high speed to form a fan-shaped plane light 18a. This plane light 18
The upper side 18u of a is parallel to the optical axis 3x of the measurement optical system. On the other hand, the horizontal line laser device 16b on the right side of the measuring unit 3 vertically vibrates the laser beam in the horizontal direction at high speed to form a fan-shaped plane light 18b. This plane light 18b
The right side 18r of is parallel to the optical axis 3x of the measurement optical system.
Both plane lights 18a and 18b intersect the optical axis 3x of the measurement optical system.

When the elevation surface 7a is arranged in a predetermined range in front of the device, here, in a range farther from the intersection 18s, 18t between the plane lights 18a, 18b and the optical axis, which is farther from the far side 18t from the device, as shown in FIG. As shown in FIG. 4, the orthogonal bright lines 20a, 20
b is formed. As shown schematically in FIG. 4, the lower part of the vertical bright line 20a and the left part of the horizontal bright line 20b are the elevations 7
Although it becomes short when a is brought close to the device and becomes long when the elevation surface 7a is moved away from the device, both emission lines 20a and 20b always intersect each other, and the intersection 20s is on the optical axis 3x of the measurement optical system.

Therefore, the examiner gives the examinee the bright line 20a,
If the intersecting bright lines 20a and 20b are used as targets by instructing to see the intersection 20s of 20b, the radiation angle adjusting means is unnecessary.

As a planar light emitting device. A known slit light emitting device may be used instead of the line laser device. Further, it is sufficient that the plane light intersects the optical axis of the measurement optical system within the range where the elevation is arranged to form the optotype.

[Brief description of drawings]

FIG. 1 is a side view showing a state in which an examination is performed using the binocular open type optometry apparatus according to the first embodiment of the present invention.

FIG. 2 is a side view showing a state in which an examination is performed using the open-eyes optometry apparatus according to the second embodiment of the present invention.

FIG. 3 is a perspective view of a main part of a binocular open type optometry apparatus according to a third embodiment of the present invention.

FIG. 4 is a schematic diagram showing the bright line in FIG. 3 that changes depending on the position of the elevation surface.

[Explanation of symbols]

 1 base 1a head fixed frame 2 optometry device body 3 measuring part 3a transparent window 3x optical axis 4 monitor 4a monitor screen 5 joystick 6 laser marker device (light emitting device) 6s, 6s', 6s' 'bright spot (target) 6x laser Rays (parallel light flux) 7, 7 ', 7' 'Positions 7a, 7a', 7a '' Elevations 16a, 16b Line laser device (light emitting device) 18a, 18b Plane light 18r Right side 18s, 18t Intersection 18u Upper side 20a, 20b Bright line (target) 20s intersection

Claims (5)

[Claims] 1. An optometry apparatus main body (2) is horizontally movably mounted on a base (1), and the optometry apparatus main body (2) is provided with at least a measuring window having a see-through window (3a) seen by a subject. In the binocular open-type optometry apparatus including (3), a light emitting device (6) that emits a parallel luminous flux (6x) as a target that is substantially parallel to and approaches the optical axis (3x) of the measurement optical system is provided in the measuring unit (6). A binocular open type optometry apparatus provided in 3). 2. An optometry apparatus main body (2) is horizontally movably mounted on a base (1), and the optometry apparatus main body (2) is provided with at least a measuring window having a see-through window (3a) seen by a subject. In the binocular open-type optometry apparatus including (3), the light emitting device (6) that emits a parallel light beam (6x) as a target intersecting the optical axis (3x) of the measurement optical system at a predetermined position (7) is used. A binocular open-type optometry apparatus, which is provided in the measurement unit (3). 3. At least two light emitting devices (6) are provided, wherein the parallel light beams (6x) from the light emitting devices (6) intersect each other on the optical axis (3x) of the measuring optical system and Enabling the intersection to move on the optical axis (3x),
The binocular open eye optometry apparatus according to claim 2, further comprising a radiation angle adjusting unit that adjusts a radiation angle of the parallel light flux in synchronization. 4. An optometry apparatus main body (2) is horizontally movably mounted on a base (1), and the optometry apparatus main body (2) has at least a measuring section provided with a see-through window (3a) that a subject can look into. In the binocular open eye optometry device including (3), at least two light emitting devices (16a, 16b) that emit plane light (18a, 18b) as a target crossing the optical axis (3x) of the measurement optical system are provided. A binocular open-type optometry apparatus, which is provided in the measurement unit (3). 5. The light emitting device (6, 16a, 16b) comprises:
The binocular open type optometry apparatus according to any one of claims 1 to 4, which is a laser emitting device (6, 16a, 16b).