JPH0874088A - Cup type plating machine - Google Patents

Cup type plating machine

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Publication number
JPH0874088A
JPH0874088A JP6215027A JP21502794A JPH0874088A JP H0874088 A JPH0874088 A JP H0874088A JP 6215027 A JP6215027 A JP 6215027A JP 21502794 A JP21502794 A JP 21502794A JP H0874088 A JPH0874088 A JP H0874088A
Authority
JP
Japan
Prior art keywords
plating
cup
supply port
upper opening
plated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6215027A
Other languages
Japanese (ja)
Other versions
JP2828912B2 (en
Inventor
Kenji Takahashi
健二 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EEJA Ltd
Original Assignee
Electroplating Engineers of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electroplating Engineers of Japan Ltd filed Critical Electroplating Engineers of Japan Ltd
Priority to JP6215027A priority Critical patent/JP2828912B2/en
Publication of JPH0874088A publication Critical patent/JPH0874088A/en
Application granted granted Critical
Publication of JP2828912B2 publication Critical patent/JP2828912B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

(57)【要約】 【目的】バンプメッキなどに用いられるカップ式めっき
装置について、めっきの不均一性の原因となるめっき液
の流速ムラや電流密度のムラを解消させる。 【構成】供給口3からのめっき液Lの噴出流をめっき槽
2内に拡散させるためのダンパー体4を供給口の上部に
設け、また上部開口1におけるめっき液の流出口7に沿
って電流遮蔽体8をめっき槽の内方に突出させて設けて
いる。その電流遮蔽体は、流出口側の端部から突出先端
に向けてめっき対象物Uのめっき対象面との間隔が徐々
に広がるようになる形状の電流密度ガイド面8fを有す
ることで特徴付けられる。
(57) [Abstract] [Purpose] For a cup-type plating apparatus used for bump plating, etc., eliminates unevenness in the flow rate and current density of the plating solution that causes uneven plating. [Composition] A damper body 4 for diffusing a jet flow of a plating solution L from a supply port 3 into a plating tank 2 is provided above the supply port, and a current flows along an outlet 7 of the plating solution in an upper opening 1. The shield 8 is provided so as to project inward of the plating tank. The current shield is characterized by having a current density guide surface 8f having a shape in which the distance between the plating target U and the plating target surface gradually increases from the end on the outlet side toward the protruding tip. .

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えばウエーハのバン
プメッキなどに用いられるカップ式めっき装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cup type plating apparatus used for bump plating of wafers, for example.

【0002】[0002]

【従来の技術】カップ式めっき装置の典型的な基本構造
は図3に示すようになっている。即ちカップ状のめっき
槽20を備えており、このめっき槽20の上部開口21
にめっき対象物、例えばウエーハUを載置し、このウエ
ーハUのめっき対象面に、めっき槽20の底部の供給口
22から噴出的に供給するめっき液Lを上部開口から周
囲に流出させつつ接触させてめっきを施すようになって
いる。なお図中の23は、アノード電極であり、一方ウ
エーハUには、図示せぬカソード電極が接続されてい
る。
2. Description of the Related Art A typical basic structure of a cup type plating apparatus is shown in FIG. That is, the cup-shaped plating tank 20 is provided, and the upper opening 21 of the plating tank 20 is provided.
An object to be plated, for example, a wafer U is placed on the surface of the wafer U to be plated, and the plating solution L jetted from the supply port 22 at the bottom of the plating tank 20 is contacted while flowing out from the upper opening to the surroundings. It is designed to be plated. Reference numeral 23 in the figure is an anode electrode, while the wafer U is connected to a cathode electrode (not shown).

【0003】このようなカップ式めっき装置において問
題になることの一つは、めっき対象面に接触する部分に
おけるめっき液の流速にムラがあることやめっき対象面
において電流密度にムラがあることなど起因してめっき
に不均一性を生じることである。
One of the problems in such a cup type plating apparatus is that the flow velocity of the plating solution at the portion in contact with the surface to be plated is uneven and the current density is uneven on the surface to be plated. This is due to non-uniformity in plating.

【0004】このようなめっきの不均一性を解消するに
ついては既に多くの工夫がなされている。例えば実公昭
58−8774号公報に開示の技術もその一つである。
この技術では、めっき対象面における外周部分が他の部
分より多くめっき液に接触し、また電流密度が外周部分
で大きくなり易いことが不均一性の原因であることを前
提として、めっき槽の内周面に突条を設け、この突条に
よりめっき液の流れを内方に偏向させると共に、めっき
対象面における電流密度の均一化を図ることで、めっき
の均一性を高めるようにしている。この技術によるとそ
れなりに均一性を高めることができるものの、その程度
は必ずしも十分なものとは言えない。
Many measures have already been taken to eliminate such non-uniformity of plating. For example, the technique disclosed in Japanese Utility Model Publication No. 58-8774 is one of them.
In this technique, it is assumed that the non-uniformity is caused by the fact that the outer peripheral part of the surface to be plated is in contact with the plating solution more than other parts and the current density is likely to increase in the outer peripheral part. The ridges are provided on the peripheral surface, the flow of the plating solution is deflected inward by the ridges, and the current density on the surface to be plated is made uniform, thereby improving the uniformity of plating. According to this technique, the uniformity can be improved to some extent, but the degree is not always sufficient.

【0005】そこでその原因をさらに追求してみると、
第1に、供給口からの噴出流が直接影響する中央部分の
流速が他の部分より速くなるためにその周囲にドーナツ
状に淀み部分S(図3)が生じ、この淀み部分でめっき
厚が薄くなり易いこと、第2に上記実公昭58−877
4号で採用するような突条の構造では外周部分の電流密
度の均一化を十分に図れないということが分かった。
Then, when further pursuing the cause,
First, since the flow velocity in the central portion, which is directly affected by the jet flow from the supply port, is faster than other portions, a donut-shaped stagnation portion S (FIG. 3) is formed around the central portion, and the plating thickness at this stagnation portion. Second, it is easy to become thin.
It was found that the ridge structure used in No. 4 cannot sufficiently make the current density in the outer peripheral portion uniform.

【0006】[0006]

【発明が解決しようとする課題】従って本発明の目的
は、上記のような不均一性の原因を解消できるようなカ
ップ式めっき装置の提供にある。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a cup type plating apparatus capable of eliminating the above-mentioned causes of non-uniformity.

【0007】[0007]

【課題を解決するための手段】本発明によるカップ式め
っき装置は、カップ状のめっき槽の上部開口に載置した
めっき対象物のめっき対象面に、めっき槽底部の供給口
から噴出的に供給されるめっき液を上部開口から周囲に
流出させつつ接触させてめっきする構造を基本とし、供
給口の上部にダンパー体を設け、このダンパー体により
供給口からのめっき液の噴出流をめっき槽内に拡散させ
る構造となっている。
According to the cup type plating apparatus of the present invention, the object to be plated placed on the upper opening of the cup-shaped plating tank is jetted from the supply port at the bottom of the plating tank. Based on the structure in which the plating solution to be flowed from the upper opening to the surroundings is contacted and plated, a damper body is provided above the supply port, and this damper body allows the jet flow of the plating solution from the supply port to be stored in the plating tank. It has a structure to diffuse into.

【0008】この構造によると、供給口からの噴出流が
ダンパー体によりめっき槽内全体に均一的に拡散される
ので、中央部分だけ流速が速くなってその周囲に淀み部
分を生じさせるという現象を有効に防止できる。
According to this structure, the jet flow from the supply port is uniformly diffused by the damper body throughout the plating tank, so that the flow velocity is increased only in the central portion to cause a stagnation portion around it. It can be effectively prevented.

【0009】また本発明によるカップ式めっき装置は、
カップ状のめっき槽の上部開口に載置しためっき対象物
のめっき対象面に、めっき槽底部の供給口から噴出的に
供給されるめっき液を上部開口から周囲に流出させつつ
接触させてめっきする構造を基本とし、上部開口におけ
るめっき液の流出口に沿って電流遮蔽体をめっき槽の内
方に突出させて設け、且つこの電流遮蔽体に、流出口側
の端部から突出先端に向けてめっき対象物のめっき対象
面との間隔が徐々に広がるようになる形状の電流密度ガ
イド面を与えた構造となっている。
The cup type plating apparatus according to the present invention is
Plating is performed by bringing the plating solution jetted from the supply port at the bottom of the plating tank into contact with the surface to be plated of the plating object placed in the upper opening of the cup-shaped plating tank while allowing it to flow from the upper opening to the surroundings. Based on the structure, the current shield is provided so as to protrude inward of the plating tank along the outlet of the plating solution at the upper opening, and the current shield is provided from the end on the outlet side toward the protruding tip. It has a structure in which a current density guide surface having a shape in which the distance between the object to be plated and the surface to be plated gradually widens is provided.

【0010】この構造によると、電流遮蔽体がめっき対
象面の外周部分とアノード電極との間に介在すること
で、外周部分へ電流が集中することを先ず大まかに防止
でき、さらに電流遮蔽体の電流密度ガイド面における形
状により、外周部分に対応するめっき液の層厚を調整す
ることでさらに緻密に電流密度の均一化を図ることがで
き、外周部分における電流密度の均一性を大幅に高める
ことができる。
According to this structure, since the current shield is interposed between the outer peripheral portion of the surface to be plated and the anode electrode, it is possible to roughly prevent the current from concentrating on the outer peripheral portion. By adjusting the layer thickness of the plating solution corresponding to the outer peripheral portion by the shape of the current density guide surface, the current density can be made more uniform and the uniformity of the current density in the outer peripheral portion can be greatly increased. You can

【0011】さらに本発明によるカップ式めっき装置
は、カップ状のめっき槽の上部開口に載置しためっき対
象物のめっき対象面に、めっき槽底部の供給口から噴出
的に供給されるめっき液を上部開口から周囲に流出させ
つつ接触させてめっきする構造を基本とし、供給口から
のめっき液の噴出流をめっき槽内に拡散させるためのダ
ンパー体を供給口の上部に設けると共に、上部開口にお
けるめっき液の流出口に沿って電流遮蔽体をめっき槽の
内方に突出させて設け、且つこの電流遮蔽体に、流出口
側の端部から突出先端に向けてめっき対象物のめっき対
象面との間隔が徐々に広がるようになる形状の電流密度
ガイド面を与えた構造となっている。
Further, in the cup type plating apparatus according to the present invention, the plating solution jetted from the supply port at the bottom of the plating tank is applied to the surface to be plated of the object to be plated placed in the upper opening of the cup-shaped plating tank. Basically, the structure is such that plating is performed while allowing it to flow out from the upper opening to the surroundings, and a damper body for diffusing the jet flow of the plating solution from the supply port into the plating tank is provided on the upper side of the supply port and A current shield is provided so as to project inward of the plating tank along the outlet of the plating solution, and the current shield is provided with a surface to be plated of the object to be plated from the end on the outlet side toward the protruding tip. Has a structure in which a current density guide surface having a shape in which the interval of gradually increases is provided.

【0012】この構造は上記各構造を併用したもので、
流速の均一化と電流密度の均一化をともに図れ、より均
一なめっきを可能とする。
This structure is a combination of the above structures,
Both flow velocity and current density can be made uniform, and more uniform plating can be achieved.

【0013】[0013]

【実施例】以下、本発明の一実施例について説明する。
本実施例のカップ式めっき装置は、ウエーハのバンプめ
っき用の例で、図1及び図2に示すように、ウエーハU
の形状に対応した円形の上部開口1を有するカップ状の
メッキ槽2を備えている。メッキ槽2の底部には図外の
循環機構を介して供給されるめっき液を槽内に噴射的に
供給する供給口3が設けられている。この供給口3の上
側には供給口3の上端から若干離してダンパー体4が設
けられると共に、これに重ねた状態でアノード電極5が
設けられている。なお図中の6はカソード電極でその先
端がウエーハUに接触させらている。
EXAMPLES An example of the present invention will be described below.
The cup type plating apparatus of the present embodiment is an example for bump plating of a wafer, and as shown in FIG. 1 and FIG.
It has a cup-shaped plating tank 2 having a circular upper opening 1 corresponding to the above shape. The bottom of the plating tank 2 is provided with a supply port 3 for supplying the plating solution, which is supplied via a circulation mechanism (not shown), into the tank by jetting. A damper body 4 is provided on the upper side of the supply port 3 slightly apart from the upper end of the supply port 3, and an anode electrode 5 is provided in a state of being superposed on the damper body 4. Reference numeral 6 in the drawing denotes a cathode electrode whose tip is in contact with the wafer U.

【0014】ダンパー体4は、円板状に形成され、供給
口3から噴出するめっき液を周囲に拡散させるようにな
っている。つまりダンパー体4は、供給口3から噴出す
るめっき液Lの流れを緩和しつつこれに矢印で示す如き
流れを与えてめっき液Lがメッキ槽2の全体に緩やかに
広がって上昇するように機能する。
The damper body 4 is formed in a disk shape, and diffuses the plating solution ejected from the supply port 3 to the surroundings. That is, the damper body 4 functions so as to moderate the flow of the plating solution L ejected from the supply port 3 and to give a flow as shown by the arrow to this so that the plating solution L gradually spreads and rises over the entire plating tank 2. To do.

【0015】またメッキ槽2の上部開口1におけるめっ
き液の流出口7に沿っては電流遮蔽体8が内方に向けて
突出する状態で設けられている。電流遮蔽体8は、扇状
の断面形状を持つリング状に形成されており、上部開口
1に載置のウエーハUに対し斜めに対面する状態の電流
密度ガイド面8fを有している。この電流密度ガイド面
8fは、円弧曲面に形成されており、流出口7に接する
端部側から突出先端に向けてウエーハUのめっき対象面
との間隔が徐々に広がるようにされている。
A current shield 8 is provided along the outlet 7 of the plating solution in the upper opening 1 of the plating tank 2 so as to project inward. The current shield 8 is formed in a ring shape having a fan-shaped cross section, and has a current density guide surface 8f in a state of diagonally facing the wafer U placed in the upper opening 1. The current density guide surface 8f is formed into an arcuate curved surface, and the distance between the current U and the surface to be plated of the wafer U gradually increases from the end portion side in contact with the outlet 7 toward the protruding tip.

【0016】この電流遮蔽体8は、ウエーハUの外周部
分とアノード電極5との間に介在することで外周部分へ
の電流の集中を大まかに防止するのに機能する。また電
流遮蔽体8は、その電流密度ガイド面8fの形状によ
り、ウエーハUの外周部分に対応するめっき液の層厚を
外周端に向けて徐々に薄くし、これに応じて電流密度を
小さくさせるようにも機能する。この結果、この電流密
度が小さくなることと外周端に行くにしたがって電流密
度が増大しようとする傾向とが相殺されて外周部分にお
ける電流密度の高い均一化が図られる。
The current shield 8 is provided between the outer peripheral portion of the wafer U and the anode electrode 5 to function to roughly prevent the concentration of the electric current on the outer peripheral portion. Further, in the current shield 8, the layer thickness of the plating solution corresponding to the outer peripheral portion of the wafer U is gradually reduced toward the outer peripheral edge due to the shape of the current density guide surface 8f, and the current density is accordingly reduced. Works as well. As a result, the decrease in the current density and the tendency for the current density to increase toward the outer peripheral edge are offset, and the current density in the outer peripheral portion can be made high and uniform.

【0017】このような電流遮蔽体の機能から分かるよ
うに、その電流密度ガイド面の形状は、めっき液の種類
やめっきの流れ状態などに応じて異なる外周端への電流
集中の度合いに応じて選択されることになる。従って上
記の円弧曲面形状はその一例であり、めっき液の種類な
どが異なればこれに応じて上記の相殺機能を満たす形状
範囲で他の形状を与えることになる。
As can be seen from the function of such a current shield, the shape of the current density guide surface varies depending on the type of plating solution, the flow state of plating, etc., depending on the degree of current concentration at the outer peripheral edge. Will be selected. Therefore, the above-mentioned arc curved surface shape is an example, and if the type of plating solution is different, other shapes will be given in a shape range satisfying the above-mentioned offsetting function.

【0018】[0018]

【発明の効果】以上説明したごとく本発明のカップ式め
っき装置によると、めっきの不均一性を招く要因を有効
に解消でき、均一性の高いめっきを行なうことができ
る。
As described above, according to the cup type plating apparatus of the present invention, the factors that cause non-uniformity of plating can be effectively eliminated, and plating with high uniformity can be performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明によるカップ式めっき装置の内部構造を
示す断面図。
FIG. 1 is a sectional view showing the internal structure of a cup-type plating apparatus according to the present invention.

【図2】図1中の矢示DA方向から見た平面図。FIG. 2 is a plan view seen from the direction of the arrow DA in FIG.

【図3】従来のカップ式めっき装置の内部構造を示す断
面図。
FIG. 3 is a sectional view showing an internal structure of a conventional cup-type plating apparatus.

【符号の説明】[Explanation of symbols]

1 上部開口 2 めっき槽 3 供給口 4 ダンパー体 7 流出口 8 電流遮蔽体 8f 電流密度ガイド面 L めっき液 U ウエーハ(めっき対象物) 1 Upper opening 2 Plating tank 3 Supply port 4 Damper body 7 Outlet 8 Current shield 8f Current density guide surface L Plating liquid U Wafer (plating target)

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 カップ状のめっき槽の上部開口に載置し
ためっき対象物のめっき対象面に、めっき槽底部の供給
口から噴出的に供給されるめっき液を上部開口から周囲
に流出させつつ接触させてめっきするようになっている
カップ式めっき装置において、供給口の上部にダンパー
体を設け、このダンパー体により供給口からのめっき液
の噴出流をめっき槽内に拡散させるようにしたことを特
徴とするカップ式めっき装置。
1. A plating solution jetted from a supply port at the bottom of a plating tank to the surface to be plated of an object to be plated placed in the upper opening of a cup-shaped plating tank while flowing out to the surroundings from the upper opening. In a cup-type plating device that is configured to contact and plate, a damper body is provided above the supply port, and this damper body is used to diffuse the jet flow of the plating solution from the supply port into the plating tank. A cup-type plating device.
【請求項2】 カップ状のめっき槽の上部開口に載置し
ためっき対象物のめっき対象面に、めっき槽底部の供給
口から噴出的に供給されるめっき液を上部開口から周囲
に流出させつつ接触させてめっきするようになっている
カップ式めっき装置において、上部開口におけるめっき
液の流出口に沿って電流遮蔽体をめっき槽の内方に突出
させて設け、且つこの電流遮蔽体に、流出口側の端部か
ら突出先端に向けてめっき対象物のめっき対象面との間
隔が徐々に広がるようになる形状の電流密度ガイド面を
与えたことを特徴とするカップ式めっき装置。
2. The plating solution jetted from the supply port at the bottom of the plating tank onto the surface of the object to be plated placed in the upper opening of the cup-shaped plating tank while flowing out from the upper opening to the surroundings. In a cup-type plating apparatus that is configured to contact and plate, a current shield is provided so as to protrude inward of the plating tank along the outlet of the plating solution at the upper opening, and A cup-type plating apparatus characterized in that a current density guide surface having a shape in which a space between a plating target object and a plating target surface gradually widens from an end on the outlet side toward a protruding tip is provided.
【請求項3】 カップ状のめっき槽の上部開口に載置し
ためっき対象物のめっき対象面に、めっき槽底部の供給
口から噴出的に供給されるめっき液を上部開口から周囲
に流出させつつ接触させてめっきするようになっている
カップ式めっき装置において、供給口からのめっき液の
噴出流をめっき槽内に拡散させるためのダンパー体を供
給口の上部に設けると共に、上部開口におけるめっき液
の流出口に沿って電流遮蔽体をめっき槽の内方に突出さ
せて設け、且つこの電流遮蔽体に、流出口側の端部から
突出先端に向けてめっき対象物のめっき対象面との間隔
が徐々に広がるようになる形状の電流密度ガイド面を与
えたことを特徴とするカップ式めっき装置。
3. The plating solution jetted from the supply port at the bottom of the plating tank to the surface of the object to be plated placed in the upper opening of the cup-shaped plating tank while flowing out to the surroundings from the upper opening. In a cup-type plating apparatus that is adapted to contact and plate, a damper body for diffusing the jet flow of the plating solution from the supply port into the plating tank is provided above the supply port, and the plating solution at the upper opening is provided. The current shield is provided so as to project inward of the plating tank along the outlet of the plate, and the gap between the current shield and the surface to be plated of the object to be plated from the end on the outlet side toward the protruding tip. The cup-type plating device is characterized in that a current density guide surface having a shape that gradually expands is provided.
JP6215027A 1994-09-08 1994-09-08 Cup type plating equipment Expired - Lifetime JP2828912B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6215027A JP2828912B2 (en) 1994-09-08 1994-09-08 Cup type plating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6215027A JP2828912B2 (en) 1994-09-08 1994-09-08 Cup type plating equipment

Publications (2)

Publication Number Publication Date
JPH0874088A true JPH0874088A (en) 1996-03-19
JP2828912B2 JP2828912B2 (en) 1998-11-25

Family

ID=16665535

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6215027A Expired - Lifetime JP2828912B2 (en) 1994-09-08 1994-09-08 Cup type plating equipment

Country Status (1)

Country Link
JP (1) JP2828912B2 (en)

Also Published As

Publication number Publication date
JP2828912B2 (en) 1998-11-25

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