JPH088015A - Ic socket - Google Patents

Abstract

PURPOSE:To prevent damage of an IC socket produced by the contact of a contact with an IC lead and reduce inspection cost when the IC socket is used in an electrical characteristic test. CONSTITUTION:A contact pin 1 capable of moving vertically to the surface of a lead 7 of an IC, and a conductive rubber 3 which is an elastic member in contact with the rear edge of the contact pin 1 and has high conductivity are arranged. The contact pin 1 is vertically brought into contact with the surface of the lead 7 pressed with a cover 10 without causing sliding between the lead 7 surface and the contact pin 1. The contact pin 1 is only inserted into a hole 2a of a socket base 5.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring device for conducting an electrical characteristic test of an IC by loading the IC.
The present invention relates to an IC socket that electrically connects a lead of C and a measuring circuit of a measuring device.

[0002]

2. Description of the Related Art FIG. 2 is a partial sectional view of an IC socket showing a conventional example. 2. Description of the Related Art Conventionally, as shown in FIG. 2, for example, an IC socket of this type includes a socket base 5a on which an outer shell of the IC is mounted, a lid 10 for covering the IC mounted on the socket base 5a, and the socket base. 5a has a tip 6a protruding from the front surface, bent and horizontally extended, and has the other end protruding from the back surface of the socket base and a foot lead portion 6b.
And a contactor 6 that forms

To electrically connect to the lead 7 of the IC,
This is done by bringing the tip 6a rising from the portion embedded in the socket base 5a and extending horizontally to contact the lead 7 pushed downward by the lid 10. Then, by this contact, a signal was sent to the measurement circuit connected to the foot lead portion 6b of the contactor 6 to perform the test.

The contactor 6 has a cantilever shape having a spring property so that the tip portion 6a is extended so that the lead 7 and the tip portion contact each other regardless of the amount of protrusion of the lead 7. It is characterized by being able to.

[0005]

In the above-mentioned conventional IC socket, although the lead and the tip portion can be surely brought into contact with each other regardless of the protruding amount of the lead, the contact pressure of the tip portion at the time of contact makes the beam of the contactor. The bending of the part may cause a slip between the contact part of the contactor and the lead to damage the plated surface of the lead.
There is a problem that rust is eventually generated from this scratch, which causes a serious defect in quality.

Further, the tip portion, which is the contact portion on the contactor side, is worn during repeated inspections and normal contact cannot be obtained. Particularly, in recent years, the voltage drop due to this contact failure accompanying the decrease in operating voltage makes the inspection data inaccurate, and normal inspection cannot be performed. Further, conventionally, since the contactor is embedded in the socket base and fixed firmly, only the contactor cannot be replaced. In other words, if even one contactor deteriorates, the socket base itself must be replaced, which increases the inspection cost.

Therefore, an object of the present invention is to provide an IC socket which can inspect an IC at low cost without causing damage to the leads of the IC.

[0008]

The features of the present invention correspond to a socket base on which an IC is mounted, a lid for covering the mounted IC, and a plurality of leads protruding from the outer shell of the IC. A plurality of contact pins that are arranged side by side with one end exposed on one main surface of the socket base, and the ends are projected from the socket base corresponding to each of the contact pins and are embedded in the socket base and connected to the measurement circuit. And an electrically conductive rubber inserted between the rear end of the foot lead and the rear end of the contact pin.

Further, the shape of both end surfaces of the conductive rubber is similar to the shape of the rear end surface of the contact pin and the shape of the rear end surface of the foot lead, and the area of both end surfaces of the conductive rubber is the same. It is desirable that the area is the same as the area of the rear end surface of each of the contact and the foot lead, even if it is small.

[0010]

The present invention will be described below with reference to the drawings. 1A and 1B show an IC of an embodiment of the present invention.
It is a perspective view and a sectional partial view showing a socket. This I
As shown in FIG. 1, the C socket includes a socket base 5 on which an IC is mounted, a lid 10 for covering the IC mounted on the socket base 5, and a plurality of leads 7 protruding from an outer shell 8 of the IC. Corresponding to the above, a plurality of contact pins 1 exposed at the socket base 5 and arranged side by side along the periphery of the hole 9,
Corresponding to each of the contact pins 1, a plurality of foot leads 4 having their tips projecting from the back surface of the socket base 5 and embedded in the socket base 5, the rear ends of the foot leads 4 and the rear ends of the contact pins 1. A conductive rubber 3 which is inserted between the contact pins 1 and applies a repulsive force to the contact pins 1.

That is, this IC socket has leads 7
The movement of the contact pin 1 can be linearly moved perpendicularly to the surface of the lead 7 so as not to cause a slip at the contact portion with. For this purpose, a vertical hole 2a is formed in the socket base 5 through which the contact pin 1 can slide and slide,
A conductive rubber 3 having a high electric conductivity, which is an elastic member that gives a contact pressure by elastic repulsive force, is provided so that one end thereof abuts on the rear end of the contact pin 1. The rear end of the foot lead 4 embedded in the socket base 5 and the conductive rubber 3 are
Is in contact with the other end.

The socket base 5 is formed of an insulating material as in the prior art, and a wear-resistant metal sleeve 2 is provided on the side wall of the hole in which the gold-plated copper contact pin 1 slides. Has been. Furthermore, this sleeve 2
The inner diameter of the contact pin and the outer diameter of the contact pin 1 are precisely finished so that they can slide smoothly without rattling. In addition, the hole into which the conductive rubber 3 is inserted is provided with the hole 2 in order to provide the space 2b so as to escape the bulge of the conductive rubber 3 when compressed.
There is a hole larger than a.

The conductive rubber 3 is formed by dispersing and mixing a large amount of fine metal particles such as gold in a polymer medium such as butadiene. Further, it is desirable that its hardness is also compressed by about 1 millimeter under a compression load of 20 grams. Furthermore, it is desirable that the cross-sectional shape of the conductive rubber 3 be similar to the cross-sectional shape of the contact pin 1 and the foot lead 4. For example, if the contact pins 1 and the foot leads have a circular cross-sectional shape, it is circular. The area of both end surfaces of the conductive rubber 3 is the same as or rather larger than the area of the end surface of the contact pin 1 and the foot lead in order to further reduce the contact resistance.

On the other hand, the foot leads 4 connected to the measuring circuit of the measuring apparatus are embedded in the socket base 5 when the socket base 5 is molded in order to firmly fix the position to the socket base 5 so as not to change its position. In addition, the rear end surface of the contact pin 1 and the end surface of the conductive rubber 3 can be easily separated without adhering so that the contact pin 1 can be easily replaced when the tip end portion is worn.

Next, an IC loading procedure using this IC socket will be described. First, the IC is placed on the socket base 5. Next, by covering the lid 10, the weight of the lid 10 causes the lead 7 to move downward and come into contact with the contact pin 1 to be pressed, so that the contact pin 1 moves in the sleeve 2 and the contact pin 1 contacts the conductive rubber 3. Abut. As a result, the conductive rubber 3 is sandwiched between the contact pins 1 and compressed. The repulsive force of the conductive rubber 3 generated by this compression is given to the contactor 1, and this repulsive force is applied to the lead 7
The vertical contact pressure does not cause a slip between the contact pin 1 and the contact pin 1.

[0016]

As described above, according to the present invention, the contact pin that can move in the direction perpendicular to the lead surface of the IC and the conductive rubber that is an elastic member that abuts the rear end of the contact pin and has a high conductivity. By providing the contact pin, the contact pin vertically contacts the lead surface pushed by the lid member, so that the lead surface and the contact pin can be brought into contact with each other without causing slippage. As a result, the lead surface is not damaged.

Further, since the contact pin is not embedded in the socket base but simply inserted into the hole of the socket base, it is not necessary to replace the IC socket itself even if one contact pin is deteriorated. , Replacing only the contact pin has the effect of significantly reducing the expense.

[Brief description of drawings]

FIG. 1 is a perspective view and a partial sectional view showing an IC socket according to an embodiment of the present invention.

FIG. 2 is a partial sectional view of an IC socket showing a conventional example.

[Explanation of symbols]

 1 Contact Pin 2 Sleeve 2a, 9 Hole 2b Space 3 Conductive Rubber 4 Foot Lead 5, 5a Socket Stand 6 Contactor 6a Tip 6b Foot Lead 7 Lead 8 Outer Shell 10 Lid

Claims (3)

[Claims] 1. A socket base on which an IC is mounted, a lid for covering the mounted IC, and a plurality of leads protruding from an outer shell of the IC, each of which has a tip on one main surface of the socket base. A plurality of contact pins that are arranged side by side to expose, and a plurality of foot leads that correspond to each of the contact pins and that are protruded from the back surface of the socket base and that are embedded in the socket base and that are connected to the measurement circuit. An IC comprising a conductive rubber inserted between the rear end of the foot lead and the rear end of the contact pin.
socket. 2. The shape of both end surfaces of the conductive rubber is similar to the shape of the rear end surface of the contact pin and the shape of the rear end surface of the foot lead, and the area of both end surfaces of the conductive rubber is the same. 2. The IC socket according to claim 1, wherein the contact and the foot lead have the same area at least as compared with the area of the rear end surface of the contact. 3. The IC socket according to claim 1, wherein the contact pin can be replaced by inserting and removing it from the socket base.