JPH0894494A - Optical isolator Wavelength dependence measuring device - Google Patents

Optical isolator Wavelength dependence measuring device

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Publication number
JPH0894494A
JPH0894494A JP25478494A JP25478494A JPH0894494A JP H0894494 A JPH0894494 A JP H0894494A JP 25478494 A JP25478494 A JP 25478494A JP 25478494 A JP25478494 A JP 25478494A JP H0894494 A JPH0894494 A JP H0894494A
Authority
JP
Japan
Prior art keywords
optical
optical isolator
wavelength
light
wavelength dependence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25478494A
Other languages
Japanese (ja)
Inventor
Masayuki Kimura
昌行 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokin Corp
Original Assignee
Tokin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokin Corp filed Critical Tokin Corp
Priority to JP25478494A priority Critical patent/JPH0894494A/en
Publication of JPH0894494A publication Critical patent/JPH0894494A/en
Pending legal-status Critical Current

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  • Testing Of Optical Devices Or Fibers (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE: To obtain an apparatus for measuring the wavelength dependency of an optical isolator accurately in a short time. CONSTITUTION: Light emitted from a white color light source 1 passes through an optical 2 and enters into a Glan-Thompson prism 3 to produce a single polarized light which is then collimated through a lens 4 and enters into an optical isolator 5a. The light leaving the optical isolator 5a is condensed through a lens 6 and enters into an optical fiber 7. Finally, it is analyzed by means of an optical spectrum analyzer 8.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、光アイソレータの波長
依存性測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wavelength dependence measuring device for an optical isolator.

【0002】[0002]

【従来の技術】可視光半導体レーザを光計測等の光信号
伝送系の光源として用いる場合、半導体レーザからの出
射光の一部が、伝送路、あるいは伝送用光学部品の各接
続部で反射して、半導体レーザへ帰還した場合、半導体
レーザの発振特性の不安定化や雑音増加を引き起こす原
因となる。この戻り光が帰還するのを防止するため、一
般的に、光アイソレータが使用される。
2. Description of the Related Art When a visible light semiconductor laser is used as a light source for an optical signal transmission system for optical measurement or the like, a part of light emitted from the semiconductor laser is reflected by a transmission line or each connection portion of transmission optical parts. If the semiconductor laser is returned to the semiconductor laser, it may cause instability of oscillation characteristics of the semiconductor laser and increase noise. An optical isolator is generally used to prevent the returning light from returning.

【0003】光アイソレータは、基本的に、図4に示す
ように、ファラデー効果を有する磁気光学素子13と、
偏光子11、検光子12と、磁気光学素子13に磁界を
印加するための磁石14とから構成され、磁気光学素子
13、偏光子11、検光子12が、それぞれ光軸調整さ
れている。そして、矢印aの方向に伝搬する入射光は、
偏光子11を通過後、直線偏光となって、磁気光学素子
13に入射し、この磁気光学素子13を伝搬中、光は、
その偏波面が磁石14の磁界強度により、通常、45゜
回転した状態で検光子に入射し、この偏光子11の傾き
が、予め入射光の偏波面の傾き(45゜)と等しく設定
されているので、この入射光を通過させる。一方、矢印
bのように、逆方向に伝搬する入射光は、検光子12と
磁気光学素子13を通過することにより、偏光子11の
偏波面に対して、90゜傾いた偏波面を持った直線偏光
になって偏光子11に入射されるために、この逆方向の
入射光は、偏光子11を通過しない。
The optical isolator basically has a magneto-optical element 13 having a Faraday effect, as shown in FIG.
It is composed of a polarizer 11, an analyzer 12, and a magnet 14 for applying a magnetic field to the magneto-optical element 13, and the magneto-optical element 13, the polarizer 11, and the analyzer 12 have their optical axes adjusted. Then, the incident light propagating in the direction of the arrow a is
After passing through the polarizer 11, it becomes linearly polarized light, enters the magneto-optical element 13, and while propagating through the magneto-optical element 13, the light is
Due to the magnetic field strength of the magnet 14, the plane of polarization normally enters the analyzer in a state of being rotated by 45 °, and the inclination of the polarizer 11 is set in advance to be equal to the inclination (45 °) of the plane of polarization of the incident light. Therefore, this incident light is transmitted. On the other hand, as indicated by an arrow b, the incident light propagating in the opposite direction has a polarization plane inclined by 90 ° with respect to the polarization plane of the polarizer 11 by passing through the analyzer 12 and the magneto-optical element 13. The incident light in the opposite direction does not pass through the polarizer 11 because it becomes linearly polarized light and enters the polarizer 11.

【0004】光アイソレータの特性を示す値の一つとし
て、波長依存性がある。これは、入射LD光がアイソレ
ータの作製中心波長から、ずれた場合、ファラデー回転
角が変わるため、最適なアイソレーションを示さなくな
る。よって、図5に示すようなアイソレータは、中心波
長に対して、アイソレーションの波長依存性を示すこと
になる。
Wavelength dependence is one of the values indicating the characteristics of the optical isolator. This is because when the incident LD light deviates from the manufacturing center wavelength of the isolator, the Faraday rotation angle changes, and optimal isolation cannot be obtained. Therefore, the isolator as shown in FIG. 5 exhibits wavelength dependency of isolation with respect to the center wavelength.

【0005】[0005]

【発明が解決しようとする課題】光アイソレータの波長
依存性を評価するためには、図6に示すような工学系を
用いる。LDから出た入射光は、グラントムソンプリズ
ム3を通過して、コリメートレンズ4で平行光となり、
集光レンズ6により、パワーメータ10に集光する。
In order to evaluate the wavelength dependence of the optical isolator, an engineering system as shown in FIG. 6 is used. The incident light emitted from the LD passes through the Glan-Thompson prism 3 and is collimated by the collimator lens 4,
The light is condensed on the power meter 10 by the condenser lens 6.

【0006】この時、LDの波長を少しずつ変化させて
いき、逆方向挿入損失を測定していく。しかしながら、
LDの波長可変光源9は、中心波長±20nm程度しか
変化させられず、広範囲な波長依存性はとれない。又、
種々の中心波長に対応する光アイソレータの波長依存性
を測定するには、中心波長の数だけ波長可変光源が必要
となり、特性測定時間は長く、設備費も高価なものとな
っていた。
At this time, the wavelength of the LD is gradually changed and the reverse insertion loss is measured. However,
The wavelength tunable light source 9 of the LD can change only the central wavelength of about ± 20 nm and cannot take a wide wavelength dependency. or,
In order to measure the wavelength dependence of the optical isolators corresponding to various center wavelengths, as many wavelength tunable light sources as the number of center wavelengths are required, the characteristic measuring time is long, and the equipment cost is expensive.

【0007】本発明の目的は、上記した欠点を除去し、
短時間で正確な波長依存性を測定する光アイソレータ波
長依存性測定装置を提供することである。
The object of the present invention is to eliminate the above-mentioned drawbacks,
An object of the present invention is to provide an optical isolator wavelength dependency measuring device that accurately measures wavelength dependency in a short time.

【0008】[0008]

【課題を解決するための手段】本発明によれば、光アイ
ソレータのアイソレーションの波長依存性を測定する光
アイソレータ波長依存性測定装置において、光源に白色
光を用い、光スペクトラムアナライザでアイソレーショ
ンを測定することを特徴とする光アイソレータ波長依存
性測定装置が得られる。
According to the present invention, in an optical isolator wavelength dependency measuring device for measuring the wavelength dependency of isolation of an optical isolator, white light is used as a light source and isolation is performed by an optical spectrum analyzer. An optical isolator wavelength dependence measuring device characterized by being measured is obtained.

【0009】[0009]

【作用】白色光源は、可視光域から赤外域まで広範囲に
わたり発光する。この光の進行方向に対して、アイソレ
ータを順方向に置き、光スペクトラムアナライザで波長
依存性を測定する。次に、光アイソレータを光の進行方
向に対して、逆方向に置くと、アイソレータの中心波長
を谷とする波長依存性が測定される。光アイソレータを
順方向に置いた場合と、逆方向に置いた場合の差が、光
アイソレーションの波長依存性となる。白色光源は、4
00nm〜1600nmの波長帯域まで発光するため、
この範囲に中心波長を持つ光アイソレータは、全て、本
発明による装置で、簡単に波長依存性を測定できる。
The white light source emits light over a wide range from visible light to infrared. An isolator is placed in the forward direction with respect to the traveling direction of this light, and the wavelength dependence is measured by an optical spectrum analyzer. Next, when the optical isolator is placed in the direction opposite to the traveling direction of light, the wavelength dependence with the center wavelength of the isolator as the valley is measured. The difference between when the optical isolator is placed in the forward direction and when it is placed in the reverse direction is the wavelength dependence of the optical isolation. 4 white light sources
Since it emits light in the wavelength band of 00 nm to 1600 nm,
All optical isolators having a center wavelength in this range can be easily measured for wavelength dependence by the device according to the present invention.

【0010】[0010]

【実施例】本発明の実施例を図面を用いて詳細に説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described in detail with reference to the drawings.

【0011】本発明の構造を図1及び図2に示す。図1
(a)に示すように、白色光源1につながれた光ファイ
バ2の端から出た光は、グラントムソンプリズム3を通
過し、単一偏光の光となり、レンズ4でコリメートさ
れ、光アイソレータ5aに入射する。光アイソレータ5
aを出た光は、レンズ6で光ファイバ7に集光される。
The structure of the present invention is shown in FIGS. Figure 1
As shown in (a), the light emitted from the end of the optical fiber 2 connected to the white light source 1 passes through the Glan-Thompson prism 3, becomes a single-polarized light, is collimated by the lens 4, and is transmitted to the optical isolator 5a. Incident. Optical isolator 5
The light emitted from a is focused on the optical fiber 7 by the lens 6.

【0012】この光を光スペクトラムアナライザ8で解
析すると、図1(b)のようなグラフが得られる。
When this light is analyzed by the optical spectrum analyzer 8, a graph as shown in FIG. 1 (b) is obtained.

【0013】又、同じ装置でアイソレータを逆方向に置
くと、図2(a)に示すように、白色光源1につながれ
た光ファイバ2の端から出た光は、グラントムソンプリ
ズム3を通過し、単一偏光となり、レンズ4でコリメー
トされ、逆向きに置かれた光アイソレータ5bに入射す
る。光アイソレータ5bを出た光は、レンズ6で光ファ
イバ7に集光される。
When the isolator is placed in the opposite direction in the same device, the light emitted from the end of the optical fiber 2 connected to the white light source 1 passes through the Glan-Thompson prism 3 as shown in FIG. 2 (a). , Becomes a single polarized light, is collimated by the lens 4, and enters the optical isolator 5b placed in the opposite direction. The light emitted from the optical isolator 5b is condensed on the optical fiber 7 by the lens 6.

【0014】この光を光スペクトラムアナライザ8で解
析すると、図2(b)のようなグラフが得られる。
When this light is analyzed by the optical spectrum analyzer 8, a graph as shown in FIG. 2B is obtained.

【0015】光スペクトラムアナライザ8で図1(b)
−図2(b)のグラフを出させると、図3のようなアイ
ソレーションの波長依存性になる。
The optical spectrum analyzer 8 shown in FIG.
-When the graph of FIG. 2B is displayed, the wavelength dependence of isolation is as shown in FIG.

【0016】[0016]

【比較例】比較例を図5に示す。基本的な構造は実施例
と同じであるが、光源は波長可変光源であり、アイソレ
ータから出た光は、パワーメータに集光される。よっ
て、波長依存性を測定する範囲内で、断続的に変化させ
ている。波長可変光源は、1550nm,1310nm
等、種類が少ないので、ある特定波長でしか波長依存性
を測定できない。
Comparative Example A comparative example is shown in FIG. Although the basic structure is the same as that of the embodiment, the light source is a variable wavelength light source, and the light emitted from the isolator is focused on the power meter. Therefore, the wavelength dependence is intermittently changed within the range of measurement. Variable wavelength light source is 1550nm, 1310nm
Since there are few types, the wavelength dependence can be measured only at a certain specific wavelength.

【0017】表1に、本実施例と比較例の測定可能波長
範囲と測定時間を示す。
Table 1 shows the measurable wavelength range and measurement time of this example and the comparative example.

【0018】[0018]

【表1】 [Table 1]

【0019】表1から明かなように、本実施例は測定範
囲が広く、測定時間も1/30に短縮される。
As is clear from Table 1, this embodiment has a wide measuring range and the measuring time is shortened to 1/30.

【0020】[0020]

【発明の効果】本発明による装置により、400〜16
00nmまでの、どの波長帯のアイソレータでも、波長
依存性が簡単に正確に測定可能となる。
With the device according to the invention, 400 to 16
The wavelength dependence can be easily and accurately measured in any isolator having any wavelength band up to 00 nm.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の光アイソレータ波長依存性測定装置の
構成を示す説明図。図1(a)は、光アイソレータを矢
印方向に置いた場合の光アイソレータ波長依存性測定装
置の構成を示す説明図。図1(b)は、図1(a)の光
スペクトラムアナライザで解析されたグラフ。
FIG. 1 is an explanatory diagram showing a configuration of an optical isolator wavelength dependence measuring device of the present invention. FIG. 1A is an explanatory diagram showing a configuration of an optical isolator wavelength dependence measuring device when the optical isolator is placed in the arrow direction. FIG. 1B is a graph analyzed by the optical spectrum analyzer of FIG.

【図2】本発明の光アイソレータ波長依存性測定装置の
構成を示す説明図。図2(a)は、光アイソレータを図
1(a)とは逆方向に置いた場合の光アイソレータ波長
依存性測定装置の構成を示す説明図。図2(b)は、図
2(a)の光スペクトラムアナライザで解析されたグラ
フ。
FIG. 2 is an explanatory diagram showing a configuration of an optical isolator wavelength dependence measuring device of the present invention. FIG. 2A is an explanatory diagram showing the configuration of the optical isolator wavelength dependence measuring device when the optical isolator is placed in the opposite direction to that of FIG. 1A. FIG. 2B is a graph analyzed by the optical spectrum analyzer of FIG.

【図3】光スペクトラムアナライザで図1(b)と図2
(b)とのグラフを解析し得られたアイソレーションの
波長依存性を示す図。
FIG. 3 shows an optical spectrum analyzer in FIG. 1 (b) and FIG.
The figure which shows the wavelength dependence of the isolation obtained by analyzing the graph with (b).

【図4】光アイソレータの基本構成を示す説明図。FIG. 4 is an explanatory diagram showing a basic configuration of an optical isolator.

【図5】従来の光アイソレータのアイソレーションの波
長依存性を示す図。
FIG. 5 is a diagram showing wavelength dependency of isolation of a conventional optical isolator.

【図6】光アイソレータのアイソレーションの波長依存
性を評価する従来の装置の構成を示す説明図。
FIG. 6 is an explanatory diagram showing a configuration of a conventional device for evaluating the wavelength dependence of isolation of an optical isolator.

【符号の説明】[Explanation of symbols]

1 白色光源 2,7 光ファイバ 3 グラントムソンプリズム(GTP) 4 (コリメート)レンズ 5a,5b アイソレータ 6 (集光)レンズ 8 光スペクトラムアナライザ 9 波長可変光源 10 パワーメータ 11 偏光子 12 検光子 13 磁気光学素子 14 磁石 a,b 矢印 1 White Light Source 2, 7 Optical Fiber 3 Glan-Thompson Prism (GTP) 4 (Collimating) Lens 5a, 5b Isolator 6 (Condensing) Lens 8 Optical Spectrum Analyzer 9 Wavelength Variable Light Source 10 Power Meter 11 Polarizer 12 Analyzer 13 Magneto-Optical Element 14 Magnet a, b Arrow

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 光アイソレータのアイソレーションの波
長依存性を測定する光アイソレータ波長依存性測定装置
において、光源に白色光を用い、光スペクトラムアナラ
イザでアイソレーションを測定することを特徴とする光
アイソレータ波長依存性測定装置。
1. An optical isolator wavelength dependence measuring apparatus for measuring wavelength dependence of isolation of an optical isolator, characterized in that white light is used as a light source and the isolation is measured by an optical spectrum analyzer. Dependency measuring device.
JP25478494A 1994-09-22 1994-09-22 Optical isolator Wavelength dependence measuring device Pending JPH0894494A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25478494A JPH0894494A (en) 1994-09-22 1994-09-22 Optical isolator Wavelength dependence measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25478494A JPH0894494A (en) 1994-09-22 1994-09-22 Optical isolator Wavelength dependence measuring device

Publications (1)

Publication Number Publication Date
JPH0894494A true JPH0894494A (en) 1996-04-12

Family

ID=17269839

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25478494A Pending JPH0894494A (en) 1994-09-22 1994-09-22 Optical isolator Wavelength dependence measuring device

Country Status (1)

Country Link
JP (1) JPH0894494A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103852779A (en) * 2014-02-19 2014-06-11 中国科学院等离子体物理研究所 Method for measuring and calculating beam mass spectrum and beam energy spectrum synchronously
CN105371953A (en) * 2015-12-01 2016-03-02 中国科学院上海技术物理研究所 General portable object spectrum imager

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103852779A (en) * 2014-02-19 2014-06-11 中国科学院等离子体物理研究所 Method for measuring and calculating beam mass spectrum and beam energy spectrum synchronously
CN105371953A (en) * 2015-12-01 2016-03-02 中国科学院上海技术物理研究所 General portable object spectrum imager

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