JPH0899014A - Exhaust gas treatment device - Google Patents

Exhaust gas treatment device

Info

Publication number
JPH0899014A
JPH0899014A JP6236566A JP23656694A JPH0899014A JP H0899014 A JPH0899014 A JP H0899014A JP 6236566 A JP6236566 A JP 6236566A JP 23656694 A JP23656694 A JP 23656694A JP H0899014 A JPH0899014 A JP H0899014A
Authority
JP
Japan
Prior art keywords
gas
tower
exhaust gas
hole
effective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6236566A
Other languages
Japanese (ja)
Other versions
JP2636751B2 (en
Inventor
Yoshiaki Hagiwara
義昭 萩原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6236566A priority Critical patent/JP2636751B2/en
Publication of JPH0899014A publication Critical patent/JPH0899014A/en
Application granted granted Critical
Publication of JP2636751B2 publication Critical patent/JP2636751B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Treating Waste Gases (AREA)
  • Gas Separation By Absorption (AREA)

Abstract

(57)【要約】 【目的】排ガス処理装置において、多孔板2の清掃を行
なうことなく長時間排気能力を維持し運転できるように
する。 【構成】貫通穴14,15が略同一位置に開けられた2
枚の板部材である摺動板2aと固定板2bを重ね合わせ
て配設し多孔板2としそれぞれの貫通穴14,15が重
ねて形成される実効貫通穴10の有効面積を可変できる
手段をこの多孔板2に設け、導入されるガスの洗浄液3
の気液接触で生成される反応生成物が実効貫通穴10周
囲に付着しコンダクタンスを低下させても摺動板2aの
位置を動かすことにより実効貫通穴の面積を広げてコン
ダグタンスを上げ、塔内の圧力を背圧より高く維持し安
定して運転する。
(57) [Abstract] [Purpose] In an exhaust gas treatment device, it is possible to maintain the exhaust capacity for a long time and operate it without cleaning the perforated plate 2. [Structure] Two through holes 14 and 15 are formed at substantially the same position.
A means for changing the effective area of the effective through hole 10 in which the sliding plate 2a and the fixed plate 2b, which are a single plate member, are arranged so as to overlap each other to form the perforated plate 2 and the through holes 14 and 15 are overlapped, respectively. A cleaning liquid 3 for the gas provided on the perforated plate 2 and introduced.
Even if the reaction product produced by the gas-liquid contact adheres to the periphery of the effective through-hole 10 and lowers the conductance, the position of the sliding plate 2a is moved to increase the area of the effective through-hole and raise the conductance, thereby increasing the inside of the tower. Maintain a higher pressure than the back pressure and operate stably.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体製造装置から発
生するガスの有害物質を除去処理して無害なガスとして
排出する排ガス処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an exhaust gas treating apparatus for removing harmful substances from a gas produced from a semiconductor manufacturing apparatus and discharging the harmless gas.

【0002】[0002]

【従来の技術】従来、この種の排ガス処理装置の代表的
なものとして漏れ棚型の排ガス処理装置がある。この漏
れ棚型の排ガス処理装置は比較的に建設費が安く済むこ
とで半導体製造装置の排ガス処理装置として広く用いら
れていた。
2. Description of the Related Art Conventionally, there is a leak shelf type exhaust gas treatment apparatus as a typical one of this type of exhaust gas treatment apparatus. This leaking shelf type exhaust gas treatment device has been widely used as an exhaust gas treatment device for semiconductor manufacturing equipment because the construction cost is relatively low.

【0003】図4(a)および(b)は従来の一例を示
す排ガス処理装置の模式断面図およびB部を拡大して示
す図である。この漏れ棚型の排ガス処理装置は、例え
ば、図4(a)に示すように、下方に洗浄液3を蓄える
とともに上方より洗浄液3を散布するスプレーノズル1
を配置しガス吸入口5とガス排気口6をもつ塔8と、こ
の塔8内にあって散布される洗浄液3が通過する複数の
貫通穴を有し複数段に配設される多孔板12と、塔8内
の導入されるガスを排気する排気ファン4とを備えてい
る。また、多孔板12は、図4(b)に示すように、円
状の板に約φ8mmの貫通穴が多数あけられている。
FIGS. 4 (a) and 4 (b) are a schematic cross-sectional view of an exhaust gas treatment apparatus showing an example of the prior art and an enlarged view of a portion B. As shown in FIG. For example, as shown in FIG. 4 (a), the leak shelf type exhaust gas treatment apparatus stores a cleaning liquid 3 below and sprays the cleaning liquid 3 from above.
And a tower 8 having a gas inlet 5 and a gas outlet 6, and a perforated plate 12 having a plurality of through holes in the tower 8 and having a plurality of through holes through which the sprayed cleaning liquid 3 passes. And an exhaust fan 4 for exhausting gas introduced into the tower 8. Further, as shown in FIG. 4B, the perforated plate 12 has a large number of through holes of about 8 mm in a circular plate.

【0004】この排ガス処理装置の動作は、まず、半導
体製造装置から発生するガスがガス吸入口5より導入さ
れると、ガスは排気ファン4により塔8内に導びかれ多
孔板12の貫通穴を通り抜ける際にスプレーノズル1よ
り放出される洗浄液3と貫通穴部で向流接触する。この
ガスと洗浄液3が接触することによりガスに含まれた有
害物質が吸収され無害化されたガスはガス排出口6から
大気に放出される。
The operation of this exhaust gas treatment apparatus is as follows. First, when the gas generated from the semiconductor manufacturing apparatus is introduced from the gas inlet 5, the gas is guided into the tower 8 by the exhaust fan 4 and the through hole of the perforated plate 12 is introduced. When it passes through, it comes into countercurrent contact with the cleaning liquid 3 discharged from the spray nozzle 1 at the through hole. When the gas comes into contact with the cleaning liquid 3, the harmful substances contained in the gas are absorbed and the detoxified gas is released from the gas outlet 6 to the atmosphere.

【0005】[0005]

【発明が解決しようとする課題】上述した従来の漏れ棚
型の排ガス処理装置では、運転を重ねるにつれて、洗浄
液と導入されるガスとの化学反応により生成分質が成長
し、図4(b)に示すように、貫通穴の周囲に蓄積しス
ケール7となる。その結果、貫通穴の開口面積が小さく
なり背圧が上昇し処理できる排ガスの流量が低下し処理
能力が落ちてくる。さらに、このスケール7の成長が進
むにつれて、ガス導入口側の塔内圧力が背圧に対し負圧
となり半導体製造装置のガス排気フードの排気風速が得
られなくなり、ついには有害分質が逆流しフードから漏
れたり危険な事態を引起す問題がある。
In the above-mentioned conventional leak-shelf type exhaust gas treatment apparatus, as the operation is repeated, the produced quality grows due to the chemical reaction between the cleaning liquid and the introduced gas, and FIG. As shown in, the scale 7 is accumulated around the through hole. As a result, the opening area of the through hole becomes smaller, the back pressure rises, the flow rate of the exhaust gas that can be treated decreases, and the treatment capacity decreases. Further, as the growth of the scale 7 progresses, the pressure in the tower on the gas inlet side becomes a negative pressure with respect to the back pressure, so that the exhaust wind speed of the gas exhaust hood of the semiconductor manufacturing equipment cannot be obtained. There is a problem of leaking from the hood or causing a dangerous situation.

【0006】この防止策として現状では、装置を停止し
手作業により成長したスケール7を1つ1つ落としてい
る。しかしながら、この作業は多大な時間を浪費するば
がりか危険な作業であり、しかも半導体製造装置の稼働
率をも低下させるという問題がある。
In order to prevent this, at present, the scale is grown one by one by stopping the apparatus and dropping the scales 7 grown by hand. However, this operation is a dangerous operation that wastes a lot of time, and has a problem that the operation rate of the semiconductor manufacturing apparatus is also reduced.

【0007】従って、本発明の目的は、多孔板の清掃を
行なうことなく長時間排気能力を維持し運転できる排ガ
ス処理装置を提供することである。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide an exhaust gas treating apparatus capable of maintaining and operating the exhaust capacity for a long time without cleaning the perforated plate.

【0008】[0008]

【課題を解決するための手段】本発明の特徴は、下方に
洗浄液を蓄えるとともに上方より該洗浄液を散布するス
プレーノズルを配置しガスを導入するガス吸入口をもつ
塔と、この塔内にあって前記ガスが通過する複数の第1
の貫通穴を有し複数段に配設される多孔板と、前記塔内
の導入される前記ガスを前記洗浄液に接触させ前記塔の
ガス排出口より排気させる排気ファンとを備える排ガス
処理装置において、前記ガス吸入口側の前記塔内の圧力
に応じて前記多孔板が該第1の貫通穴のガスが通過し得
る有効面積を変える有効面積可変手段を備える排ガス処
理装置である。
A feature of the present invention is that a tower having a gas inlet for introducing a gas by arranging a spray nozzle for storing a cleaning liquid and spraying the cleaning liquid from above, and an inside of the tower. A plurality of first gas
An exhaust gas treatment apparatus comprising: a perforated plate having a through hole and arranged in a plurality of stages; and an exhaust fan for bringing the gas introduced into the tower into contact with the cleaning liquid and exhausting the gas from a gas outlet of the tower. The exhaust gas treatment apparatus is provided with an effective area varying means for changing the effective area of the perforated plate through which the gas in the first through hole can pass according to the pressure in the tower on the gas inlet side.

【0009】また、前記開口面積可変手段は、複数の第
2の貫通穴を略相対的に同一位置にもつ少くとも2枚の
前記板部材を重ね配設するとともに該板部材を互にずら
すことによりそれぞれの前記第2の貫通穴の重なりでな
る前記第1の貫通穴の有効面積を変える機構であること
が望ましい。
Further, the opening area varying means is arranged such that at least two plate members having a plurality of second through holes at substantially the same position are overlapped and the plate members are displaced from each other. Therefore, it is preferable that the mechanism changes the effective area of the first through hole formed by the overlap of the respective second through holes.

【0010】さらに、上記開口面積可変手段とは別に前
記重なり合った前記板部材を周期的に互いにすり合せ運
動させる駆動機構を備えると良い。
Further, in addition to the opening area varying means, it is preferable that a driving mechanism for periodically rubbing the overlapping plate members with each other is provided.

【0011】[0011]

【実施例】次に、本発明の実施例について図面を参照し
て説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0012】図1(a)および(b)ならびに(c)は
本発明の一実施例における排ガス処理装置を示す模式断
面図および多孔板のA部を拡大して示す上面図(b)な
らびに断面図である。この排ガス処理装置は、図1に示
すように、ガス吸入口側の塔8内の圧力に応じて多孔板
2が実効貫通穴10のガスが通過し得る有効面積を変え
る有効面積可変機構を備えている。
1 (a), 1 (b) and 1 (c) are schematic cross-sectional views showing an exhaust gas treating apparatus in one embodiment of the present invention and a top view (b) and a cross-sectional view showing an enlarged portion A of a perforated plate. It is a figure. As shown in FIG. 1, the exhaust gas treatment apparatus includes an effective area variable mechanism that changes the effective area through which the gas in the effective through hole 10 can pass through the perforated plate 2 according to the pressure in the tower 8 on the gas inlet side. ing.

【0013】この有効面積可変機構は、貫通穴14,1
5を略相対的に同一位置にもつ摺動板2aと固定板2b
とを重ね配設するとともに固定板2bに対し摺動板2a
をずらすことによりそれぞれの貫通穴14と15とが重
なり合って形成される実効貫通穴10の有効面積を変え
る機構である。
This effective area variable mechanism is provided with through holes 14 and 1.
Slide plate 2a and fixed plate 2b having 5 in substantially the same relative position
And the sliding plate 2a with respect to the fixed plate 2b.
Is a mechanism for changing the effective area of the effective through-hole 10 formed by overlapping the respective through-holes 14 and 15 with each other.

【0014】また、この有効面積可変機構は、ガス吸入
口5側の塔8内の圧力を検知する圧力計9と、この圧力
計9の圧力値を入力し背圧と比較し基準値より下ったと
きその減少値に応じてモータ13に出力を与える制御回
路11と、摺動板2aの端部に取付けられるナット(図
示せず)を送るモータ13と連結する送りねじ(図示せ
ず)とから構成される送り機構とを備えている。
This effective area variable mechanism also inputs a pressure gauge 9 for detecting the pressure in the tower 8 on the gas inlet 5 side, and inputs the pressure value of this pressure gauge 9 and compares it with the back pressure to lower the reference value. A control circuit 11 which gives an output to the motor 13 in accordance with the decrease value, and a feed screw (not shown) which is connected to the motor 13 for feeding a nut (not shown) attached to the end of the sliding plate 2a. And a feeding mechanism composed of.

【0015】次に、この排ガス処理装置の動作を説明す
る。まず、CVD装置などの半導体製造装置から排気さ
れたガスがガス吸入口5から塔8内に導入される。そし
て、排気ファン4で送風され導入されたガスは複数段の
多孔板2の実効貫通穴10を通過するとともにスプレー
ノズル1から散布される洗浄液3と気液接触しながらガ
ス排出口6より排出される。この気液接触によりガス中
に含まれる有害物資は洗浄液3に吸着し塔8の下方に滴
下される。
Next, the operation of the exhaust gas treatment device will be described. First, gas exhausted from a semiconductor manufacturing apparatus such as a CVD apparatus is introduced into the tower 8 from the gas inlet 5. The gas blown and introduced by the exhaust fan 4 passes through the effective through holes 10 of the multi-stage perforated plate 2 and is discharged from the gas discharge port 6 while being in gas-liquid contact with the cleaning liquid 3 sprayed from the spray nozzle 1. You. By this gas-liquid contact, harmful substances contained in the gas are adsorbed by the cleaning liquid 3 and dropped below the tower 8.

【0016】一方、運転中は圧力計9は導入されるガス
の圧力を常に監視している。ここで、長時間の運転後、
もし、実効貫通穴10にスケールが生成され圧力計9の
圧力値が基準値より下ったとすると、制御回路11は基
準値より下る値のアナログ値を増幅しデジタル信号値に
変換し、変換されたデジタルパルス数をモータ13に送
る。そして、送られたパルス数に応じてモータ13は回
転して送りねじの回転により摺動板2aを固定板2bを
すべり貫通穴14,15の重なり度が変化し実効貫通穴
10の有効面積が増加する。このことにより多孔板2の
実効貫通穴10のコンダクタンスが増加し圧力計9の圧
力値が上る。
On the other hand, during operation, the pressure gauge 9 constantly monitors the pressure of the introduced gas. Here, after driving for a long time,
If a scale is generated in the effective through hole 10 and the pressure value of the pressure gauge 9 falls below the reference value, the control circuit 11 amplifies the analog value of the value below the reference value, converts it into a digital signal value, and converts it. The digital pulse number is sent to the motor 13. Then, the motor 13 rotates according to the number of pulses sent, and the sliding plate 2a slides on the fixed plate 2b by the rotation of the feed screw, the overlapping degree of the through holes 14 and 15 changes, and the effective area of the effective through hole 10 changes. To increase. As a result, the conductance of the effective through hole 10 of the perforated plate 2 increases, and the pressure value of the pressure gauge 9 increases.

【0017】そして、再び圧力計9を監視し、圧力値が
基準値より下る毎に実効貫通穴10の有効面積を広げ
る。そして、機械的に移動限界に達したら従来通り多孔
板2の清掃作業を行なう。この結果、従来、2箇月毎に
清掃点検していたものが年1回で済みその分半導体製造
装置の稼働率を上げることができた。
Then, the pressure gauge 9 is monitored again, and the effective area of the effective through hole 10 is increased each time the pressure value falls below the reference value. When the movement limit is reached mechanically, the perforated plate 2 is cleaned as in the related art. As a result, it is possible to increase the operation rate of the semiconductor manufacturing apparatus by that amount, which was conventionally cleaned and inspected every two months only once a year.

【0018】図2(a)および(b)は図1の多孔板の
種々の実効貫通穴の例を示す図である。上述した実施例
では実効貫通穴がコンダクタンス係数の高い楕円形であ
るが、むしろ、ガスの流れに乱流を生じさせ、反応物質
が付着し難くい形状にした方がより効果があるという知
見を得た。この実効貫通穴は、例えば、図2(a)に示
すように、三角形の貫通穴を重ねて形成される菱形の実
効貫通穴10aやあるいは図2(b)の矩形状の貫通穴
を重ねて形成される矩形の実効貫通穴などが考えられ
る。
FIGS. 2A and 2B are diagrams showing examples of various effective through holes of the perforated plate of FIG. In the above-mentioned embodiment, the effective through hole is an elliptical shape having a high conductance coefficient, but rather it is found that it is more effective to form a turbulent flow in the gas flow and make it difficult for the reactant to adhere. Obtained. For example, as shown in FIG. 2A, this effective through hole is formed by overlapping a diamond-shaped effective through hole 10a formed by overlapping triangular through holes or a rectangular through hole shown in FIG. 2B. A rectangular effective through hole to be formed may be considered.

【0019】図3は本発明の排ガス処理装置の他の実施
例における塔部の半分を示す模式断面図である。この排
ガス処理装置は、図3に示すように、重なり合った固定
板2摺動板2aとが周期的に互いにすり合せ運動させる
駆動機構を前述の有効面積可変機構とは別に設けたこと
である。この駆動機構は、固定板2bと連結する連結棒
17と、この連結棒17とピストンロッド16aを介し
て接続されるエアシリンダ16とで構成されている。
FIG. 3 is a schematic sectional view showing a half of a tower portion in another embodiment of the exhaust gas treatment apparatus of the present invention. In this exhaust gas treatment apparatus, as shown in FIG. 3, a drive mechanism for periodically moving the overlapping fixed plate 2 and sliding plate 2a is provided separately from the above-described effective area variable mechanism. The drive mechanism includes a connecting rod 17 connected to the fixed plate 2b, and an air cylinder 16 connected to the connecting rod 17 via a piston rod 16a.

【0020】この駆動機構は、半導体製造装置が一時停
止している僅かな時間だけ動作し前述の有効面積可変機
構が動作している間は停止している。そして、エアシリ
ンダ16の往復運動で固定板2bを停止している摺動板
2aに対しすり合せ動作をさせ、積層しない内に付着し
た反応物質を取除くことである。
This drive mechanism operates only for a short time when the semiconductor manufacturing apparatus is temporarily stopped, and is stopped while the above-mentioned effective area variable mechanism is operating. Then, the reciprocating motion of the air cylinder 16 causes the sliding plate 2a stopping the fixed plate 2b to perform a rubbing operation to remove the reaction substances adhering to the inside without stacking.

【0021】この駆動機構を設けることによって、クリ
ーニングすべき期間が延長され、数年に1回程度でメン
テナンスフリーであった。
By providing this drive mechanism, the period for cleaning is extended, and maintenance is free once every several years.

【0022】[0022]

【発明の効果】以上説明したように本発明は、貫通穴が
略同一位置に開けられた2枚の板部材を重ね合わせて配
設し多孔板としそれぞれの貫通穴が重ねて形成される実
効貫通穴の有効面積を可変できる手段をこの多孔板に設
けることよって、導入されるガスの洗浄液の気液接触で
生成される反応生成物が実効貫通穴周囲に付着しコンダ
クタンスを低下させてもこの板部材の位置を動かすこと
により実効貫通穴の面積を広げることができ、従来行な
っていた多孔板の付着したスケールの除去作業における
メンテナンスの頻度が少くなり長期間連続して運転でき
るとともに前段の半導体製造装置の稼働率を向上するこ
とができるという効果がある。
As described above, according to the present invention, two plate members having through holes formed at substantially the same position are superposed and arranged to form a perforated plate. By providing a means capable of changing the effective area of the through hole in this perforated plate, even if the reaction product generated by the gas-liquid contact of the cleaning gas of the introduced gas adheres around the effective through hole and reduces the conductance, By moving the position of the plate member, the area of the effective through hole can be enlarged, the frequency of maintenance in the conventional work of removing the scale to which the perforated plate adheres is reduced, it can be operated continuously for a long time, and the semiconductor in the previous stage There is an effect that the operation rate of the manufacturing apparatus can be improved.

【0023】さらに、2枚の板部材を互いに周期的にす
り合せる機構を設けることによって付着する反応生成物
を必要に応じて取去ることができるので、メンテナンス
フリーとなる効果が得られた。
Further, by providing a mechanism for periodically rubbing the two plate members together, the adhered reaction product can be removed as required, so that the maintenance free effect is obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例における排ガス処理装置を示
す模式断面図(a)および多孔板のA部を拡大して示す
上面図(b)ならびに断面図(c)である。
FIG. 1 is a schematic cross-sectional view (a) showing an exhaust gas treatment device in one embodiment of the present invention, a top view (b) and a cross-sectional view (c) showing an enlarged portion A of a porous plate.

【図2】図1の多孔板の種々の実効貫通穴の例を示す図
である。
FIG. 2 is a view showing examples of various effective through holes of the perforated plate of FIG.

【図3】本発明の排ガス処理装置の他の実施例における
塔部の半分を示す模式断面図である。
FIG. 3 is a schematic sectional view showing a half of a tower section in another embodiment of the exhaust gas treatment apparatus of the present invention.

【図4】従来の一例を示す排ガス処理装置の模式断面図
およびB部を拡大して示す図である。
FIG. 4 is a schematic cross-sectional view of an example of a conventional exhaust gas treatment apparatus and an enlarged view of a portion B.

【符号の説明】[Explanation of symbols]

1 スプレーノズル 2,12 多孔板 2a 摺動板 2b 固定板 3 洗浄液 4 排気ファン 5 ガス吸入口 6 ガス排出口 7 スケール 8 塔 9 圧力計 10,10a,10b 実効貫通穴 11 制御回路 13 モータ 14,15 貫通穴 16 エアシリンダ 16a ピストンロッド 17 連結棒 1 Spray Nozzle 2, 12 Perforated Plate 2a Sliding Plate 2b Fixed Plate 3 Cleaning Liquid 4 Exhaust Fan 5 Gas Inlet 6 Gas Outlet 7 Scale 8 Tower 9 Pressure Gauge 10, 10a, 10b Effective Through Hole 11 Control Circuit 13 Motor 14, 15 Through Hole 16 Air Cylinder 16a Piston Rod 17 Connecting Rod

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 下方に洗浄液を蓄えるとともに上方より
該洗浄液を散布するスプレーノズルを配置しガスを導入
するガス吸入口をもつ塔と、この塔内にあって前記ガス
が通過する複数の第1の貫通穴を有し複数段に配設され
る多孔板と、前記塔内の導入される前記ガスを前記洗浄
液に接触させ前記塔のガス排出口より排気させる排気フ
ァンとを備える排ガス処理装置において、前記ガス吸入
口側の前記塔内の圧力に応じて前記多孔板が該第1の貫
通穴のガスが通過し得る有効面積を変える有効面積可変
手段を備えることを特徴とする排ガス処理装置。
1. A tower having a spray nozzle for storing a cleaning solution below and spraying the cleaning solution from above and having a gas suction port for introducing a gas, and a plurality of first towers in the tower through which the gas passes. An exhaust gas treatment apparatus comprising: a perforated plate having a through hole and arranged in a plurality of stages; and an exhaust fan for bringing the gas introduced into the tower into contact with the cleaning liquid and exhausting the gas from a gas outlet of the tower. The exhaust gas treatment apparatus is provided with an effective area varying means for changing an effective area through which the gas in the first through hole can pass, in accordance with the pressure in the tower on the gas inlet side.
【請求項2】 前記開口面積可変手段は、複数の第2の
貫通穴を略相対的に同一位置にもつ少くとも2枚の前記
板部材を重ね配設するとともに該板部材を互にずらすこ
とによりそれぞれの前記第2の貫通穴の重なりでなる前
記第1の貫通穴の有効面積を変える機構であることを特
徴とする請求項1記載の排ガス処理装置。
2. The opening area varying means includes at least two plate members having a plurality of second through holes at substantially the same position in a stack, and the plate members are displaced from each other. 2. The exhaust gas treating apparatus according to claim 1, wherein the exhaust gas treating apparatus is a mechanism for changing the effective area of the first through hole formed by overlapping the respective second through holes.
【請求項3】 前記重なり合った前記板部材を周期的に
互いにすり合せ運動させる駆動機構を備えることを特徴
とする請求項2記載の排ガス処理装置。
3. The exhaust gas treating apparatus according to claim 2, further comprising a drive mechanism for periodically rubbing the overlapping plate members with each other.
JP6236566A 1994-09-30 1994-09-30 Exhaust gas treatment equipment Expired - Fee Related JP2636751B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6236566A JP2636751B2 (en) 1994-09-30 1994-09-30 Exhaust gas treatment equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6236566A JP2636751B2 (en) 1994-09-30 1994-09-30 Exhaust gas treatment equipment

Publications (2)

Publication Number Publication Date
JPH0899014A true JPH0899014A (en) 1996-04-16
JP2636751B2 JP2636751B2 (en) 1997-07-30

Family

ID=17002539

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6236566A Expired - Fee Related JP2636751B2 (en) 1994-09-30 1994-09-30 Exhaust gas treatment equipment

Country Status (1)

Country Link
JP (1) JP2636751B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011258795A (en) * 2010-06-10 2011-12-22 Mitsubishi Electric Corp Transformer
JP2013215691A (en) * 2012-04-11 2013-10-24 Ihi Corp Flue gas desulfurization apparatus and flue gas desulfurization method
KR101341479B1 (en) * 2013-05-03 2013-12-13 한국기계연구원 Apparatus for treating harmful gas using metal mesh plate
CN112044190A (en) * 2020-08-27 2020-12-08 王凯 Intelligent steam recovery processing equipment for textile materials
JP2023518338A (en) * 2020-02-12 2023-05-01 ムンタース ユーロフォルム ゲーエムベーハー Variable installation in gas flow channel

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4856569A (en) * 1971-11-22 1973-08-08
JPS5429148U (en) * 1977-07-30 1979-02-26
JPS5595822U (en) * 1978-12-26 1980-07-03

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4856569A (en) * 1971-11-22 1973-08-08
JPS5429148U (en) * 1977-07-30 1979-02-26
JPS5595822U (en) * 1978-12-26 1980-07-03

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011258795A (en) * 2010-06-10 2011-12-22 Mitsubishi Electric Corp Transformer
JP2013215691A (en) * 2012-04-11 2013-10-24 Ihi Corp Flue gas desulfurization apparatus and flue gas desulfurization method
KR101341479B1 (en) * 2013-05-03 2013-12-13 한국기계연구원 Apparatus for treating harmful gas using metal mesh plate
JP2023518338A (en) * 2020-02-12 2023-05-01 ムンタース ユーロフォルム ゲーエムベーハー Variable installation in gas flow channel
CN112044190A (en) * 2020-08-27 2020-12-08 王凯 Intelligent steam recovery processing equipment for textile materials

Also Published As

Publication number Publication date
JP2636751B2 (en) 1997-07-30

Similar Documents

Publication Publication Date Title
US8349057B2 (en) Method for the backflushing of filters
JP4095737B2 (en) Cleaning dust collector and exhaust gas treatment facility
US5127960A (en) Method for removing washcoat remaining in the channels of freshly coated monolithic or honeycombed catalyst carriers
JP2636751B2 (en) Exhaust gas treatment equipment
KR20220058036A (en) Combined deodorization system with backwash structure and ozone facility
US6521027B1 (en) Air cleaner
KR970067670A (en) A Dry Cleaner for Wafer Carriers and Carrier Boxes
CN115970427B (en) A spherical graphite dust collection system
US3798880A (en) Air cleaning apparatus
US5902383A (en) Dust collection apparatus having packed tower
JPH07114908B2 (en) Air cleaner cleaning equipment
CN120393686A (en) Multi-stage spray flue gas desulfurization device
CN215390622U (en) A grit multi-stage separation device for construction
JPH11309322A (en) Bag filter dust removal mechanism
US5707410A (en) Exhaust stack scrubber
KR20220058070A (en) Deodorization system with automatic water control system
JPH1147533A (en) Gas treatment equipment
US7101425B2 (en) Washer and method for purifying gases
CN115633714B (en) An ethylene removal device
CN211462453U (en) Bag type dust collector capable of simultaneously removing dust and ash
JPH0299117A (en) Gas deodorizing apparatus
KR200266343Y1 (en) A Device for Purification The Smoke
CN215782416U (en) Furniture processing lacquer house exhaust treatment device
KR200359606Y1 (en) Biotrickling apparatus of sludge spray type
WO1995003875A1 (en) Dynamic packed chamber scrubber

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19970311

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees