JPH09232402A - Sample transport device - Google Patents

Sample transport device

Info

Publication number
JPH09232402A
JPH09232402A JP8033466A JP3346696A JPH09232402A JP H09232402 A JPH09232402 A JP H09232402A JP 8033466 A JP8033466 A JP 8033466A JP 3346696 A JP3346696 A JP 3346696A JP H09232402 A JPH09232402 A JP H09232402A
Authority
JP
Japan
Prior art keywords
sample
arm
concave groove
holding
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8033466A
Other languages
Japanese (ja)
Inventor
Takashi Endo
隆 遠藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP8033466A priority Critical patent/JPH09232402A/en
Publication of JPH09232402A publication Critical patent/JPH09232402A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70733Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • G03F7/70741Handling masks outside exposure position, e.g. reticle libraries

Landscapes

  • Engineering & Computer Science (AREA)
  • Library & Information Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Manipulator (AREA)

Abstract

(57)【要約】 【課題】 フォトマスクやレチクル等の試料に傷やゴミ
を付けることなく搬送することのできる搬送装置を得
る。 【解決手段】 搬送しようとする試料Fの両側辺部分に
磁性材料Maを配置すると共に、搬送装置50の試料保
持腕70、70の対向する側面に凹溝71、71を形成
し、そこに、磁性材料Mbを配置する。磁性材料Maと
Mbの対向する面の極性を同じとし、試料Fの磁性材料
Maの部分を試料保持腕70、70の凹部71、71内
で磁力の反発力により非接触で保持し、その状態で目的
の場所に搬送する。
(57) [PROBLEMS] To obtain a transporting device capable of transporting a sample such as a photomask or a reticle without scratches or dust. SOLUTION: A magnetic material Ma is arranged on both side portions of a sample F to be transported, and concave grooves 71, 71 are formed on opposite side surfaces of a sample holding arm 70, 70 of a transport device 50, and there, The magnetic material Mb is arranged. The polarities of the facing surfaces of the magnetic materials Ma and Mb are the same, and the portion of the magnetic material Ma of the sample F is held in the recesses 71, 71 of the sample holding arms 70, 70 in a non-contact manner due to the repulsive force of the magnetic force. And transport it to the desired place.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は平板状の試料、特
に、半導体素子製造用のフォトマスクやレチクル等の試
料の搬送に有効に用いることのできる試料搬送装置に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample transporting apparatus which can be effectively used for transporting a flat plate-shaped sample, particularly a sample such as a photomask or a reticle for manufacturing a semiconductor element.

【0002】[0002]

【従来の技術】半導体製造装置において、フォトマスク
やレチクル(以下、試料という)は試料カセットに段積
み状態に収容されており、そこから、試料搬送装置の搬
送アームにより一枚づつ取り出されて露光装置等に搬送
され、そこで必要な処理を受けた後、再度試料搬送アー
ムによりアンロード側の試料カセットまで搬送され、そ
こに収納保管される。
2. Description of the Related Art In a semiconductor manufacturing apparatus, photomasks and reticles (hereinafter referred to as "samples") are stored in a stack in a sample cassette, from which they are taken out one by one by a transfer arm of a sample transfer device and exposed. After being transported to an apparatus or the like and subjected to necessary processing there, it is transported again to the sample cassette on the unload side by the sample transport arm, and stored and stored therein.

【0003】図13は、従来の試料搬送装置における試
料搬送アーム50の一例を示しており、図示しない制御
機構により上下動する支柱51の先端に図示しない回動
機構を持つ回動盤52が備えられ、該回動盤52に立設
する2本の回転軸53a、53bに一端を固定したリン
ク54a、54bの他端側は共通の支軸55に枢着さ
れ、該支軸55には平板状の試料搬送台56が取り付け
られている。
FIG. 13 shows an example of a sample transfer arm 50 in a conventional sample transfer device, which is provided with a turntable 52 having a turning mechanism (not shown) at the tip of a column 51 that moves up and down by a control mechanism (not shown). The other ends of the links 54a, 54b having one ends fixed to the two rotating shafts 53a, 53b provided upright on the turntable 52 are pivotally attached to a common support shaft 55, and the support shaft 55 has a flat plate. A sample transport table 56 having a shape of a circle is attached.

【0004】試料の搬送に際しては、回転盤52を回動
して試料搬送台56を例えば図示しない試料カセット
(第1の場所)方向に位置決めをし、次に、回転軸53
a、53bを回転させてリンク54a、54bを伸長し
て試料搬送台56を押出し、その先端を試料カセット内
に挿入する。次に、支柱51を制御して試料搬送台56
を上昇させ、カセットに段積みされた試料の1枚を下方
から担持する。図13はその状態を示しており、試料F
はその中央部分が試料搬送腕56に支持された姿勢とな
り、そこに真空吸着等で保持されるその状態で回転軸5
3a、53bを逆方向に回転制御し、試料搬送腕56を
後退させて試料カセットから脱出させ、再び回転盤52
を回動して試料搬送腕56を例えばXYステージ上に設
置される試料ホルダ位置(第2の場所)まで回動する。
その位置で、試料搬送腕56の押出し及び下降制御が行
われ、また、真空吸着が開放され、試料搬送腕56に担
持された試料Fは試料ホルダ側に引き継がれる。
In transporting the sample, the rotary disk 52 is rotated to position the sample transport base 56, for example, in the direction of a sample cassette (first location) not shown, and then the rotary shaft 53.
The a and 53b are rotated to extend the links 54a and 54b, push out the sample carrier 56, and insert its tip into the sample cassette. Next, the column 51 is controlled to control the sample carrier 56.
And one of the samples stacked in the cassette is carried from below. FIG. 13 shows the state, and sample F
Has its central portion supported by the sample transfer arm 56 and is held there by vacuum suction or the like.
3a and 53b are controlled to rotate in the opposite directions, the sample transfer arm 56 is retracted to escape from the sample cassette, and the turntable 52 is again rotated.
Is rotated to rotate the sample transport arm 56 to, for example, a sample holder position (second position) set on the XY stage.
At that position, the pushing and lowering control of the sample transport arm 56 is performed, the vacuum suction is released, and the sample F carried on the sample transport arm 56 is taken over to the sample holder side.

【0005】[0005]

【発明が解決しようとする課題】上記のように、従来の
試料搬送装置では、試料は試料搬送腕に搭載された姿勢
で搬送されることから、試料表面と搬送腕面との接触は
不可避であり、接触面で傷が生じる場合があった。ま
た、真空吸着により搬送の安定を図っているために、吸
着面に異物が付着し易いという問題があった。このよう
な傷の発生やゴミの付着は、試料に不良部分を生じさ
せ、生産性の低下を引き起こす。
As described above, in the conventional sample transfer device, the sample is transferred in the posture mounted on the sample transfer arm, so that the contact between the sample surface and the transfer arm surface is unavoidable. There were cases where scratches occurred on the contact surface. Further, since the conveyance is stabilized by vacuum suction, there is a problem that foreign matter is easily attached to the suction surface. The generation of such scratches and the attachment of dust cause defective portions in the sample, resulting in a decrease in productivity.

【0006】そこで本発明の目的は、フォトマスクやレ
チクル等の試料を試料搬送装置により第1の場所から第
2の場所へ搬送する際に、搬送装置に起因して、試料に
傷が付いたりゴミが付着することがないようにした試料
搬送装置を提供することにある。
Therefore, an object of the present invention is, when a sample such as a photomask or a reticle is transported from a first location to a second location by a sample transport device, the sample is scratched due to the transport device. It is an object of the present invention to provide a sample transfer device that prevents dust from adhering to it.

【0007】[0007]

【課題を解決するための手段】上記課題を解決するため
に、本発明による試料搬送装置は、基本的に、搬送しよ
うとする試料の両側辺部分を保持するための凹溝を対向
する側面部分にそれぞれ形成している一対の試料保持腕
と、該一対の試料保持腕を該試料の幅よりも広い間隔で
ある第1の位置と該凹溝内に試料を保持した第2の位置
とに変位させるための移動手段と、該凹溝に磁力を発生
させる磁力発生手段とを少なくとも有する構成とした。
In order to solve the above-mentioned problems, the sample transporting apparatus according to the present invention is basically a side surface part facing a concave groove for holding both side parts of the sample to be transferred. A pair of sample holding arms respectively formed at the first position and a second position where the pair of sample holding arms are wider than the width of the sample and at a first position where the sample is held in the groove. At least a moving means for displacing and a magnetic force generating means for generating a magnetic force in the groove are provided.

【0008】本発明による試料搬送装置の他の態様で
は、少なくとも両側辺に磁性を有する平板状の試料を試
料搬送腕で保持して第1の場所から第2の場所へ搬送す
る試料搬送装置であって、該試料搬送腕は、該試料の両
側辺部分を保持するための凹溝を対向する側面部分にそ
れぞれ形成している一対の試料保持腕と、該一対の試料
保持腕を該試料の幅よりも広い間隔である第1の位置と
該凹溝内に試料を保持する第2の位置とに変位させるた
めの移動手段とを有し、該凹溝面には、搬送する試料の
側辺部分の磁極と同極の磁極が生じるようにされ、さら
に、該試料保持腕の前記第2の位置において、試料を磁
力の反発により非接触の状態で保持されるように制御す
る制御手段とを有する構成とされる。
In another aspect of the sample transporting apparatus according to the present invention, the sample transporting apparatus holds a flat sample having magnetism at least on both sides by a sample transporting arm and transports it from the first location to the second location. Then, the sample transport arm includes a pair of sample holding arms each having a concave groove for holding both side portions of the sample on opposite side surface portions, and the pair of sample holding arms of the sample holding arm. A moving means for displacing the sample into a first position that is wider than the width and a second position that holds the sample in the concave groove, and the concave groove surface has a side of the sample to be conveyed. A magnetic pole having the same polarity as the magnetic poles of the side portions, and a control means for controlling the sample to be held in a non-contact state by the repulsion of the magnetic force at the second position of the sample holding arm. It is configured to have.

【0009】本発明による試料搬送装置に使用に際し
て、試料は少なくとも試料搬送腕に保持される側辺部分
が磁性を持つようにされる。その手段は任意であるが、
試料の4周あるいは対向する2辺に沿って希土類系プラ
スチック磁石、フェライト磁石、アルコニ磁石等の磁性
材料を配置又は一体に成形する方法、あるいは、試料に
メッキ加工を施す等の方法等であつてよい。
When the sample transport apparatus according to the present invention is used, at least the side portion of the sample held by the sample transport arm has magnetism. The means is arbitrary,
A method of arranging or integrally forming magnetic materials such as rare earth plastic magnets, ferrite magnets, and arconi magnets along the four circumferences of the sample or two opposite sides, or a method of plating the sample, etc. Good.

【0010】本発明による試料搬送装置は、その試料搬
送腕の先端に設ける一対の試料保持腕及びその位置制御
手段に係る構成を除き、従来の試料搬送装置の構成と同
じであってよい。該一対の試料保持腕を搬送しようとす
る試料の幅よりも広い間隔である第1の位置と該凹溝内
に試料を保持した第2の位置とに変位させるための移動
手段も任意であり、一方向に付勢されたバネとバネの付
勢方向に抗して試料保持腕の位置決めを行う液圧あるい
は空圧アクチュエータ機構によるもの、あるいは、モー
タを駆動源とし、ボールネジあるいはラックとピニオン
によるもの等であってよい。
The sample transporting device according to the present invention may have the same configuration as that of the conventional sample transporting device, except for the configuration relating to the pair of sample holding arms provided at the tip of the sample transporting arm and its position control means. The moving means for displacing the pair of sample holding arms between the first position which is wider than the width of the sample to be transported and the second position which holds the sample in the groove is also optional. , By a spring biased in one direction and a hydraulic or pneumatic actuator mechanism that positions the sample holding arm against the biasing direction of the spring, or by using a motor as a drive source and a ball screw or rack and pinion It may be one or the like.

【0011】一対の試料保持腕に形成する凹溝面に磁力
を発生させる磁力発生手段は、試料の側辺に配置したと
同様の磁性材料を凹溝面に配置した形態であってもよ
く、電磁石であってもよい。電磁石の場合には、該試料
保持腕の前記第2の位置において、試料を磁力の反発に
より非接触の状態で保持されるように磁極及び磁力を制
御、調整するための制御手段が設けられる。
The magnetic force generating means for generating a magnetic force on the concave groove surfaces formed on the pair of sample holding arms may have a form in which the same magnetic material as that arranged on the side of the sample is arranged on the concave groove surfaces, It may be an electromagnet. In the case of an electromagnet, at the second position of the sample holding arm, a control means for controlling and adjusting the magnetic pole and the magnetic force is provided so that the sample is held in a non-contact state by the repulsion of the magnetic force.

【0012】搬送開始に当たり、従来の試料搬送装置と
同様にして試料搬送腕を回転させ、試料ホルダ等に試料
トレイを介して段積みされた1枚の試料の両側辺位置
に、当該試料の幅よりも広い間隔である第1の位置とさ
れた一対の試料保持腕を接近させ、かつ、凹溝の位置と
試料の高さとの位置合わせを行う。位置合わせ後、一対
の試料保持腕を前記第2の位置に向けて移動させる。凹
溝内面での磁極面の極性と凹溝内に入り込む試料の側辺
部分の磁極面の極性は同極とされており、磁力の反発力
により、試料はその両側辺部分を一対の試料保持腕の凹
溝内に浮揚させた姿勢、すなわち、非接触状態で保持さ
れる。その状態で制御機構により試料搬送腕をわずかに
揚上させと、試料は非接触状態を維持しながら、試料保
持腕と共に上昇し、試料トレイから離脱する。以下、従
来の試料搬送装置と同様な操作を行い、試料を第2の場
所に搬送し、引き渡す。
At the start of transporting, the sample transport arm is rotated in the same manner as in the conventional sample transport device, and the width of the sample is placed at both side positions of one sample stacked on the sample holder or the like via the sample tray. The pair of sample holding arms, which are located at the first position with a wider interval, are brought closer to each other, and the position of the groove is aligned with the height of the sample. After the alignment, the pair of sample holding arms is moved toward the second position. The polarity of the magnetic pole surface on the inner surface of the groove is the same as the polarity of the magnetic pole surface on the side of the sample that enters the groove, and the sample is held by the repulsive force of the magnetic force on both sides of the sample. It is held in a levitated position in the groove of the arm, that is, in a non-contact state. In that state, when the sample transport arm is slightly lifted by the control mechanism, the sample ascends together with the sample holding arm and is separated from the sample tray while maintaining the non-contact state. Thereafter, the same operation as in the conventional sample transfer device is performed to transfer the sample to the second location and deliver it.

【0013】[0013]

【発明の実施の形態】以下、本発明による試料搬送装置
を好ましい実施の形態に基づき詳細に説明する。図1
は、本発明による試料搬送装置50の一使用態様とし
て、フォトマスクあるいはレチクル等の試料Fを試料カ
セット10から露光装置等のXYステージ上に設置され
る試料ホルダ30に搬送する場合の例を示している。
BEST MODE FOR CARRYING OUT THE INVENTION The sample carrying device according to the present invention will be described in detail below based on preferred embodiments. FIG.
Shows an example of a case where a sample F such as a photomask or a reticle is conveyed from a sample cassette 10 to a sample holder 30 installed on an XY stage such as an exposure device as one usage mode of the sample conveying device 50 according to the present invention. ing.

【0014】先ず、試料カセット10について説明す
る。試料カセット10は、試料トレイ11が複数段重ね
合わされてあり、各試料トレイ11は一方端側を支点1
2としてほぼ90°回転するように機枠に取り付けてあ
り、図示最下段の試料トレイ11のように開放された状
態で、図示しない搬送装置により1枚の試料Fが載置さ
れ、閉じることにより、載置された試料Fは試料カセッ
ト10内に収容される。図3に示すように、各試料トレ
イ11には複数本(図では3本)の試料支持体13が立
設されている。
First, the sample cassette 10 will be described. The sample cassette 10 has a plurality of stacked sample trays 11, and each sample tray 11 has a fulcrum 1 on one end side.
2 is attached to the machine frame so as to rotate about 90 °, and one sample F is placed by a transport device (not shown) on the open state like the sample tray 11 at the bottom of the figure, and closed. The mounted sample F is stored in the sample cassette 10. As shown in FIG. 3, a plurality of (three in the figure) sample supports 13 are erected on each sample tray 11.

【0015】図2aは、本発明による試料搬送装置50
によって搬送される試料Fの一例を示す斜視図であり、
図2bは図2aのII-II 線による断面図である。図示さ
れるように、この例において、試料Fは全体が方形をな
す平板板であり、その4周には希土類系プラスチック磁
石シートのような磁性材料Maが張り付けられている。
図3に示すように、試料Fは前記した試料トレイ11に
立設した試料支持体13の先端に支承された姿勢で各試
料トレイ11のほぼ中央位置に載置される。
FIG. 2a shows a sample transport device 50 according to the present invention.
It is a perspective view showing an example of a sample F conveyed by
2b is a sectional view taken along line II-II of FIG. 2a. As shown in the figure, in this example, the sample F is a flat plate having a rectangular shape as a whole, and a magnetic material Ma such as a rare earth plastic magnet sheet is attached to the four circumferences thereof.
As shown in FIG. 3, the sample F is placed at a substantially central position of each sample tray 11 in a posture in which the sample F is supported by the tip of the sample support 13 standing on the sample tray 11.

【0016】この実施例において、試料搬送装置50
は、試料搬送腕60の構成を除いて他の構成は先に図1
3に基づき説明した試料搬送装置の基本的に同じであ
り、図1において、同じ機能を奏する部材には同じ符号
を付すことにより、詳細な説明は省略する。図4にその
平面図を示すように、試料搬送腕60は、前記したリン
ク54a、54bの先端に取り付けられる基部61と、
その先端側の両側に配置した一対の試料保持腕70、7
0とを有する。基部61の先端には2本の平行するガイ
ド杆62a、62bが設けられ、その中間位置には、ピ
ストン棒63が、基部61内に設けられた図示されない
液圧アクチュエータにより進退自在となるように配置さ
れている。
In this embodiment, the sample transport device 50
Other than the configuration of the sample transport arm 60, the other configurations are as shown in FIG.
3 is basically the same as that of the sample transporting apparatus described based on FIG. 3, and in FIG. 1, members having the same functions are denoted by the same reference numerals, and detailed description thereof will be omitted. As shown in the plan view of FIG. 4, the sample transport arm 60 includes a base portion 61 attached to the distal ends of the links 54a and 54b.
A pair of sample holding arms 70, 7 arranged on both sides of the tip side.
0. Two parallel guide rods 62a and 62b are provided at the tip of the base 61, and a piston rod 63 is provided at an intermediate position between the guide rods 62a and 62b so that the piston rod 63 can be moved back and forth by a hydraulic actuator (not shown) provided in the base 61. It is arranged.

【0017】試料保持腕70、70の基部には図示しな
い貫通孔が設けてあり、一対の試料保持腕70、70
は、該貫通孔にガイド杆62a、62bを挿通させるこ
とにより、基部61の先端の左右位置に互いにな平行状
態で、かつ、左右方向に移動自在に取り付けられてい
る。ガイド杆62a、62bの先端には止め板64、6
4が取り付けられ、該止め板た64、64と保持腕7
0、70との間にはコイルバネ65a、65bが介装さ
れている。上記の構成であり、図示しない制御機構によ
り液圧アクチュエータを操作してピストン棒63を進退
させると、一対の試料保持腕70、70はコイルバネ6
5a、65bにより互に接近する方向に常時付勢された
状態で、ビストン棒63の先端位置によって位置決めさ
れる。
Through holes (not shown) are provided at the bases of the sample holding arms 70, 70, and a pair of sample holding arms 70, 70 are provided.
The guide rods 62a and 62b are inserted into the through holes, so that the guide rods 62a and 62b are attached to the left and right positions of the tip of the base portion 61 in parallel with each other and movably in the left and right directions. Stop plates 64, 6 are provided at the tips of the guide rods 62a, 62b.
4 is attached to the stopper plate 64, 64 and the holding arm 7.
Coil springs 65a and 65b are interposed between 0 and 70. With the above-mentioned configuration, when the hydraulic actuator is operated by the control mechanism (not shown) to move the piston rod 63 forward and backward, the pair of sample holding arms 70, 70 will move to the coil spring 6.
It is positioned by the tip position of the Biston rod 63 while being constantly urged by the 5a and 65b in the directions approaching each other.

【0018】試料保持腕70、70の対向する側面部分
には凹溝71、71が形成される。凹溝71、71の長
さは、搬送しようとする試料Fの長辺の長さよりも幾分
長い長さとされ、また、上下方向の幅は、搬送しようと
する試料Fの厚みよりも幾分広い幅とされる。そして、
図4のV-V 線による断面図を図5によく示すように、該
凹溝71の壁面には、フェライト磁石のような磁性材料
Mbが、試料Fの磁性材料Maと該磁性材料Mbとの対
向する面が同極となるようにして配置されている。
Grooves 71, 71 are formed in the side surfaces of the sample holding arms 70, 70 facing each other. The length of the concave grooves 71, 71 is set to be slightly longer than the length of the long side of the sample F to be transported, and the vertical width thereof is somewhat larger than the thickness of the sample F to be transported. Wide width. And
As well shown in FIG. 5 which is a sectional view taken along line VV in FIG. 4, a magnetic material Mb such as a ferrite magnet is provided on the wall surface of the groove 71 so that the magnetic material Ma of the sample F and the magnetic material Mb face each other. They are arranged so that the surfaces to be treated have the same polarity.

【0019】この試料搬送装置50での試料の搬送は次
のようにして行われる。先ず、回転盤52を回動して試
料搬送腕60を試料カセット10方向に位置決めし、さ
らに、試料搬送腕60内の液圧アクチュエータを操作し
てピストン棒63を押し出して、図6に示すように、一
対の試料保持腕70、70の対向する側面間の間隔が試
料Fの幅よりも広い間隔である状態(第1の位置)に調
整すると共に、搬送腕60の高さを、試料トレイ11の
試料支持体13上に載置された搬出しようとする試料F
の厚み方向の中心が、試料保持腕70に形成した凹溝7
1の中心線Lとほぼ一致する位置となるように調整す
る。
The sample is carried by the sample carrying device 50 as follows. First, the turntable 52 is rotated to position the sample transport arm 60 in the direction of the sample cassette 10, and the hydraulic rod actuator in the sample transport arm 60 is operated to push out the piston rod 63, as shown in FIG. First, the distance between the opposed side surfaces of the pair of sample holding arms 70, 70 is adjusted to be wider than the width of the sample F (first position), and the height of the transport arm 60 is adjusted to the sample tray. No. 11 sample F placed on the sample support 13 to be carried out
The center in the thickness direction of the concave groove 7 formed in the sample holding arm 70
The center line L of 1 is adjusted so that the position is almost the same.

【0020】次に、回転軸53a、53bを回転してリ
ンク54a、54bを伸長させ、試料搬送腕60を、試
料Fの側辺部分がすべて試料保持腕70、70に形成し
た凹溝71、71の側方位置となるまで押出す。その状
態が図6に一部断面による正面図として示される。押出
しを停止し、再度液圧アクチュエータを操作して、ビス
トン棒63を後退させ、図7に平面図が、図8に一部断
面による正面図が示されるように、凹溝71、71内に
試料Fの側辺部分(すなわち、磁性材料Ma)が入り込
む位置(第2の位置)とする。その位置では、前記のよ
うに、該凹溝71の壁面の磁性材料Mbと試料の4周面
に沿って配置した磁性材料Maとの対向する面は同極と
されているので、磁力の反発力により両者が接触するこ
とはなく、試料Fはその両側辺部分を一対の試料保持腕
70の凹溝71内に浮揚させた姿勢で保持される。
Next, the rotary shafts 53a and 53b are rotated to extend the links 54a and 54b, so that the sample carrying arm 60 has a concave groove 71 in which the sides of the sample F are all formed on the sample holding arms 70 and 70. Extrude to the side of 71. The state is shown in FIG. 6 as a partial cross-sectional front view. The extrusion is stopped, the hydraulic actuator is operated again, and the Biston rod 63 is retracted. As shown in the plan view of FIG. 7 and the front view of a partial cross section of FIG. It is a position (second position) into which the side portion (that is, the magnetic material Ma) of the sample F enters. At that position, as described above, the opposing surfaces of the magnetic material Mb on the wall surface of the concave groove 71 and the magnetic material Ma arranged along the four circumferential surfaces of the sample have the same polarity, so that the repulsion of the magnetic force occurs. The two do not come into contact with each other due to the force, and the sample F is held in a posture in which both side portions thereof are levitated in the concave grooves 71 of the pair of sample holding arms 70.

【0021】次に、支柱51を制御して搬送腕56をわ
ずかに上昇させると、図9に示すように、試料Fは凹溝
71とは接触することなく試料保持腕70と共に浮揚
し、試料トレイ11から離脱する。その状態で回転軸5
3a、53bを逆方向に回転制御し、試料搬送腕60を
後退させて試料カセット10から脱出させ、再び回転盤
52を回動して試料搬送腕60をXYステージ上に設置
される試料ホルダ30(第2の場所)まで回動する。そ
の位置で、試料搬送腕60の押出し及び下降制御が行わ
れ、試料搬送腕60に担持された試料Fは試料ホルダ3
0側に引き継がれる。それにより1枚の試料の第1の場
所から第2の場所への搬送は終了する。
Next, when the column 51 is controlled to slightly raise the transport arm 56, the sample F floats together with the sample holding arm 70 without contacting the groove 71, as shown in FIG. Remove from the tray 11. In that state, the rotary shaft 5
3a and 53b are controlled to rotate in the opposite directions, the sample transport arm 60 is retracted to escape from the sample cassette 10, and the turntable 52 is rotated again to mount the sample transport arm 60 on the XY stage. Rotate to (2nd place). At that position, the pushing and lowering control of the sample transport arm 60 is performed, and the sample F carried on the sample transport arm 60 is transferred to the sample holder 3
It is taken over by the 0 side. This completes the transportation of one sample from the first location to the second location.

【0022】前記のように、この搬送の過程で、試料F
は無接触状態で試料保持腕に保持されかつ所定の場所ま
で搬送されるので、搬送装置に起因して試料Fに傷が付
いたりゴミが付着するのは回避される。
As described above, in the course of this transportation, the sample F
Is held by the sample holding arm in a non-contact state and is transported to a predetermined place, so that the sample F is prevented from being scratched or dust is attached due to the transport device.

【0023】なお、試料保持腕70の試料Fに対する上
下方向の位置決めをするに際して、図10に示すよう
に、試料Fの厚み方向の中心位置Lfよりも下方に試料
保持腕70に形成した凹溝71の中心線Lが位置するよ
うに調整すると、試料Fを試料支持体13側に押し付け
る力が作用し、試料に傷が付くことが生じうるので、位
置調整に際しては、前記のように、試料Fの厚み方向の
中心位置Lfと凹溝71の中心線Lの位置を一致させる
か、凹溝71の中心線Lの位置が幾分上位位置となるよ
うに調整することが推奨される。
When vertically positioning the sample holding arm 70 with respect to the sample F, as shown in FIG. 10, a concave groove formed in the sample holding arm 70 below the center position Lf of the sample F in the thickness direction. When the center line L of 71 is adjusted so that the sample F may be pressed against the sample support 13 side, the sample may be scratched. It is recommended that the center position Lf of the F in the thickness direction and the position of the center line L of the concave groove 71 be made coincident with each other, or that the position of the center line L of the concave groove 71 be adjusted to a somewhat higher position.

【0024】図11及び図12は本発明による試料搬送
装置の他の実施例を示している。この例においては、試
料保持腕70、70の対向する側面部分に形成された凹
溝71、71には、複数の電磁石Meが、試料Fに対向
する面での磁極がすべて同じとなるようにして配置され
ている。図11は電磁石Meの配置態様を示す平面図で
あり、図12は電磁石の配置態様と共に結線状態を示し
ている。特に図示されないが、この実施例では、電磁石
への電流をON、OFFする開閉器、電磁石の極性を変
える極性変換スイッチ、磁力の強さを変えるための電流
調整器等からなる制御手段が付設される。この例によれ
ば、凹溝面での磁極の極性及び磁力の強さを任意に調整
することが可能となり、試料側の磁性材料の自由度を高
めることができる。
11 and 12 show another embodiment of the sample transfer device according to the present invention. In this example, the plurality of electromagnets Me are arranged in the concave grooves 71, 71 formed in the side surfaces of the sample holding arms 70, 70 facing each other so that all the magnetic poles on the surface facing the sample F are the same. Are arranged. FIG. 11 is a plan view showing an arrangement mode of the electromagnet Me, and FIG. 12 shows a connection state together with the arrangement mode of the electromagnet. Although not particularly shown, in this embodiment, control means including a switch for turning on and off the electric current to the electromagnet, a polarity conversion switch for changing the polarity of the electromagnet, a current regulator for changing the strength of the magnetic force, etc. is attached. It According to this example, it is possible to arbitrarily adjust the polarity of the magnetic pole and the strength of the magnetic force on the concave groove surface, and the degree of freedom of the magnetic material on the sample side can be increased.

【0025】[0025]

【発明の効果】本発明による試料搬送装置によれば、試
料を非接触の状態で第1の場所から第2の場所へ搬送可
能であり、搬送装置に起因して試料に傷が付いたりゴミ
が付着するのを回避できる。それにより、半導体製造に
おけるフォトマスクやレチクルの搬送装置として特に有
効に用いることができる。
According to the sample transport apparatus of the present invention, the sample can be transported from the first location to the second location in a non-contact state, and the sample is scratched or dust is caused by the transport apparatus. Can be avoided. As a result, it can be used particularly effectively as a transfer device for photomasks and reticles in semiconductor manufacturing.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による試料搬送装置の一使用態様を説明
する図。
FIG. 1 is a diagram illustrating one usage mode of a sample transporting device according to the present invention.

【図2】本発明に使用される試料の一例を示す図。FIG. 2 is a diagram showing an example of a sample used in the present invention.

【図3】試料が試料トレイ上に載置された状態を説明す
る図。
FIG. 3 is a diagram illustrating a state in which a sample is placed on a sample tray.

【図4】試料保持腕が第1の位置にある状態を示す平面
図。
FIG. 4 is a plan view showing a state in which the sample holding arm is in the first position.

【図5】試料保持腕の断面を説明する図。FIG. 5 is a diagram illustrating a cross section of a sample holding arm.

【図6】第1の位置における試料保持腕と試料との位置
関係を説明する一部断面による正面図。
FIG. 6 is a partial cross-sectional front view illustrating the positional relationship between the sample holding arm and the sample at the first position.

【図7】試料保持腕が第2の位置にある状態を示す平面
図。
FIG. 7 is a plan view showing a state in which the sample holding arm is in the second position.

【図8】第2の位置における試料保持腕と試料との位置
関係を説明する一部断面による正面図。
FIG. 8 is a partial cross-sectional front view illustrating the positional relationship between the sample holding arm and the sample at the second position.

【図9】試料保持腕に保持されて試料が浮揚し状態を示
す図。
FIG. 9 is a view showing a state in which a sample is levitated while being held by a sample holding arm.

【図10】試料保持腕の凹部の中心と試料の中心との関
係を説明する図。
FIG. 10 is a view for explaining the relationship between the center of the recess of the sample holding arm and the center of the sample.

【図11】本発明による試料搬送装置の他の実施例を示
す平面図。
FIG. 11 is a plan view showing another embodiment of the sample transport device according to the present invention.

【図12】電磁石の配置と結線状態を説明する図。FIG. 12 is a diagram illustrating an arrangement of electromagnets and a connection state.

【図13】従来の試料搬送腕を説明する斜視図。FIG. 13 is a perspective view illustrating a conventional sample transport arm.

【符号の説明】[Explanation of symbols]

10…試料カセット、11…試料トレイ、13…試料支
持体、30…試料ホルダ、50…試料搬送装置、60…
試料搬送腕、61…基台、63…ピストン棒、65a、
65b…コイルバネ、70…試料保持腕、71…凹溝、
F…試料、Ma、Mb…磁性材料、Me…電磁石
10 ... Sample cassette, 11 ... Sample tray, 13 ... Sample support, 30 ... Sample holder, 50 ... Sample transport device, 60 ...
Sample transfer arm, 61 ... Base, 63 ... Piston rod, 65a,
65b ... Coil spring, 70 ... Sample holding arm, 71 ... Recessed groove,
F ... sample, Ma, Mb ... magnetic material, Me ... electromagnet

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 搬送しようとする試料の両側辺部分を保
持するための凹溝を対向する側面部分にそれぞれ形成し
ている一対の試料保持腕と、該一対の試料保持腕を該試
料の幅よりも広い間隔である第1の位置と該凹溝内に試
料を保持する第2の位置とに変位させるための移動手段
と、該凹溝に磁力を発生させる磁力発生手段とを少なく
とも有することを特徴とする試料搬送装置。
1. A pair of sample holding arms each having a concave groove for holding both side portions of a sample to be conveyed formed on opposing side surface portions, and the pair of sample holding arms having a width of the sample. At least a moving means for displacing the first position, which is wider than the first position, and a second position for holding the sample in the concave groove, and a magnetic force generating means for generating a magnetic force in the concave groove. A sample transport device characterized by:
【請求項2】 少なくとも両側辺に磁性を有する平板状
の試料を試料搬送アームで保持して第1の場所から第2
の場所へ搬送する試料搬送装置であって、該試料搬送ア
ームは、該試料の両側辺部分を保持するための凹溝を対
向する側面部分にそれぞれ形成している一対の試料保持
腕と、該一対の試料保持腕を該試料の幅よりも広い間隔
である第1の位置と該凹溝内に試料を保持する第2の位
置とに変位させるための移動手段を有し、該凹溝面に
は、搬送する試料の側辺部分の磁極と同極の磁極が生じ
るようにされており、さらに、該試料保持腕の前記第2
の位置において、試料を磁力の反発により非接触の状態
で保持されるように制御する制御手段を有することを特
徴とする試料搬送装置。
2. A flat plate-shaped sample having magnetism on at least both sides is held by a sample transfer arm, and the sample is moved from the first position to the second position.
And a pair of sample holding arms each having concave grooves for holding both side portions of the sample formed on opposite side surface portions, The concave groove surface has a moving means for displacing the pair of sample holding arms between a first position which is wider than the width of the sample and a second position which holds the sample in the concave groove. Is designed to generate a magnetic pole having the same pole as that of the side portion of the sample to be conveyed, and further, the second magnetic pole of the sample holding arm.
At the position of (1), the sample transporting device is provided with control means for controlling the sample to be held in a non-contact state by repulsion of magnetic force.
JP8033466A 1996-02-21 1996-02-21 Sample transport device Pending JPH09232402A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8033466A JPH09232402A (en) 1996-02-21 1996-02-21 Sample transport device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8033466A JPH09232402A (en) 1996-02-21 1996-02-21 Sample transport device

Publications (1)

Publication Number Publication Date
JPH09232402A true JPH09232402A (en) 1997-09-05

Family

ID=12387334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8033466A Pending JPH09232402A (en) 1996-02-21 1996-02-21 Sample transport device

Country Status (1)

Country Link
JP (1) JPH09232402A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000031019A (en) * 1998-07-13 2000-01-28 Nikon Corp Mask and exposure equipment
US6515736B1 (en) 2000-05-04 2003-02-04 International Business Machines Corporation Reticle capturing and handling system
JP2012099859A (en) * 2003-10-29 2012-05-24 Carl Zeiss Smt Gmbh Optical assembly
CN102582670A (en) * 2011-10-17 2012-07-18 上海华力微电子有限公司 Safety masking plate carrying cart

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000031019A (en) * 1998-07-13 2000-01-28 Nikon Corp Mask and exposure equipment
US6515736B1 (en) 2000-05-04 2003-02-04 International Business Machines Corporation Reticle capturing and handling system
JP2012099859A (en) * 2003-10-29 2012-05-24 Carl Zeiss Smt Gmbh Optical assembly
CN102582670A (en) * 2011-10-17 2012-07-18 上海华力微电子有限公司 Safety masking plate carrying cart

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