JPH09292371A - Image processing method and apparatus for ultrasonic reflection source - Google Patents

Abstract

(57) Abstract: In a technique for visualizing flaw detection data measured using a longitudinal wave bevel probe, an ultrasonic image processing method for eliminating a ghost image and displaying only a true defect image, and It is to provide a device. An inspection apparatus includes a longitudinal wave bevel probe for transmitting a longitudinal ultrasonic wave 10 and a transverse ultrasonic wave to a steel plate, a motor for scanning the longitudinal wave bevel probe in the x direction, and a motor for the y direction. A scanning mechanism including a motor for scanning the wave bevel probe 1 and an encoder, a counter for counting the pulses transmitted from the encoder, a controller, a trigger generator, an oscillator, a receiver, and a gate circuit. , An A / D converter, a memory, a storage medium, a data storage unit 46, an image data calculation device 44, and an image display device 36, and measurement was performed using a longitudinal wave bevel probe. In the technique of visualizing flaw detection data, it is possible to erase the ghost image and display only the true defect image.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ultrasonic wave incident on an object to be inspected, an ultrasonic wave transmitting position, and an elapsed time from the incidence of an ultrasonic echo returning from the object to be inspected to the ultrasonic probe. The position of the reflection source is calculated from, and relates to an ultrasonic image processing method and device for visualizing the reflection source, a material through which transverse waves do not pass,
For example, in a technique of visualizing flaw detection data using longitudinal ultrasonic waves of an inspection target including a welded portion, an ultrasonic image processing method and apparatus suitable for erasing a ghost image of a reflection source existing other than the welded portion. Regarding

[0002]

2. Description of the Related Art In a welded portion of a steel material, transverse ultrasonic waves are strongly attenuated and only longitudinal ultrasonic waves propagate. Therefore, the longitudinal wave bevel flaw detection method has been conventionally used to detect defects existing near and inside the weld.

An image processing method of flaw detection data measured by the longitudinal wave oblique flaw detection method will be described with reference to FIGS. 2, 3 and 4.

The computer 100 controls the scanning device 60 and the ultrasonic flaw detector 106 to scan the steel plate 3 with the longitudinal wave bevel probe 1 while the scanning device 60 scans the longitudinal wave bevel probe. The pulse wave 50 is transmitted to the tentacle 1.

When a pulse wave 50 is transmitted to the longitudinal wave bevel probe 1, transverse ultrasonic waves 9 and longitudinal ultrasonic waves 10 are incident on the steel plate 3 at incident angles θ _S and θ _L. When the defect 6 exists in the path of the transverse ultrasonic wave 9 or the longitudinal ultrasonic wave 10, the transverse ultrasonic wave 9 or the longitudinal ultrasonic wave 10 is reflected by the defect 6, and a part of the reflected wave is transmitted to the longitudinal wave bevel probe 1. And is received as a reflected echo 52.

The position (x, y) of the longitudinal wave bevel probe when the reflected echo 52 is received and the propagation time T from the transmission of the pulse wave 50 to the reception of the reflected echo 52 are stored in a storage device. It stores in 104 like FIG.

When the defect 6 exists in the base material, first, when the position of the longitudinal wave bevel probe 1 is (x ₀ , y ₀ ), the reflection echo of the longitudinal ultrasonic wave 10 is received at the propagation time T _L. Then, when the position of the longitudinal wave bevel probe 1 is (x ₁ , y ₀ ), the reflection echo of the transverse ultrasonic wave 9 is received at T _S.

That is, when the longitudinal wave bevel probe is used, two reflection echoes can be obtained for one defect. When both reflected echoes are visualized as reflected echoes of longitudinal ultrasonic waves,
A true defect image 14 is displayed on the display 102 at the position represented by (Equation 1),

[0009]

[Equation 1]

The ghost image 14 is formed at the position represented by (Equation 2).
g is displayed on the display 102.

[0011]

[Equation 2]

[0012]

From the position of the measured probe with longitudinal wave angle probe 1 as [0007] FIG. 2 (x, y) and the propagation time T, longitudinal wave acoustic velocity V _L and the longitudinal When the reflected echo is imaged using the wave incident angle θ _L , the true defect image 14 is displayed on the display 102 at the position represented by (Equation 1), and the ghost image is displayed at the position represented by (Equation 2). 14 g is displayed on the display 102.

Therefore, it is easy to make an error when recognizing a true defect image from a visualized image.

An object of the present invention is to provide an ultrasonic image processing method and apparatus for eliminating a ghost image and displaying only a true defect image 14.

[0015]

The first means as a method for achieving the above object is to transmit longitudinal ultrasonic waves obliquely to the surface of the inspection object within the inspection object and return to the transmission position. The ultrasonic echo is received, the transmission position is scanned, and transmission and reception are repeated. From the position data of the transmission position and the elapsed time from the transmission of ultrasonic waves to the reception, the sound velocity of the longitudinal wave and transverse wave of the inspection object and incidence The angle is used to calculate the position of the reflection source in the inspection object, and the reflection source calculated using the sound velocity of the longitudinal wave and the incident angle, and the reflection source calculated using the sound velocity of the transverse wave and the incident angle are used. By comparison, it is an image processing method of ultrasonic reflection source that visualizes only the reflection source at the same position or close position.By this method, the ghost image is erased and only the true reflection source image is obtained. The effect of displaying can be obtained.

Similarly, in the second means, in the first means, when there is an attenuation region where the transverse wave does not pass through the inspection object, the ultrasonic wave transmission position when the transverse wave is reflected by the reflection source visualized by the first means is set. From the elapsed time until the transmitted transverse ultrasonic wave is reflected by the reflection source and returns to the transmission position, the position of the ghost image is calculated using the sound velocity and the incident angle of the longitudinal wave, and the ghost image of the ghost image is calculated. An ultrasonic wave characterized by visualizing a reflection source which does not exist in the vicinity and which is present in the shadow of the transverse wave in the attenuation region or the attenuation region in the reflection source calculated by using the sound velocity and the incident angle of the longitudinal wave. It is a video processing method of a reflection source. According to this method, in addition to the effect of the first means,
The effect that the reflection source in the attenuation region where the transverse ultrasonic waves do not pass can also be visualized can be obtained.

Similarly, in the third means, in the first means or the second means, the shape of the object to be inspected is known in advance, and the position of the reflection source calculated using the sound velocity and the incident angle of the longitudinal or transverse waves is An image processing method for an ultrasonic reflection source characterized by calculating the position of the reflection source assuming that a longitudinal wave or a transverse wave is reflected at the boundary of the inspection object when it is outside the inspection object. In addition to the function and effect of the first means or the second means, the function and effect of being able to visualize the reflection source also with respect to the ultrasonic echo returned from the reflection source after ultrasonic waves are reflected at the boundary of the inspection target Is obtained.

Similarly, the fourth means is characterized in that, in any one of the first to third means, the fourth means includes a process of visualizing the contour or a part of the contour of the inspection object. According to this method, it is possible to visually recognize the position of the reflection source with respect to the inspection object, in addition to the effect of any one of the first means to the third means. The effect that can be obtained is obtained.

Similarly, the fifth means includes, in any one of the first to fourth means, a step of measuring the sound velocity of a longitudinal wave and a transverse wave to be inspected, the ultrasonic wave reflection source. According to this method,
In addition to the effect of any one of the first means to the fourth means, the effect of being able to visualize the reflection source can be obtained even for the inspection target whose sound velocity is unknown.

Similarly, in the sixth means, in any one of the first to fifth means, the ultrasonic wave transmitted from the transmission position and returned to the transmission position within a specific period. An image processing method for an ultrasonic reflection source, characterized by measuring only the elapsed time of an echo. According to this method, in addition to the effect of any one of the first to fifth means, Then, since only the elapsed time of the ultrasonic echo returning to the transmission position within a certain specific period is measured, it is possible to obtain an effect that only a desired specific reflection image can be visualized.

Similarly, in the seventh means, in any one of the first means to the sixth means, the ultrasonic wave is transmitted from the transmission position and returned to the transmission position with a certain specific power. A method for processing an image of a reflection source of ultrasonic waves, characterized in that only the elapsed time of an echo is measured. According to this method, in addition to the effect of any one of the first to sixth means, As a result, it is possible to obtain the effect that only the elapsed time of the ultrasonic echo returning to the transmission position with a certain specific power can be measured and only the desired specific reflection image can be visualized.

The eighth means as a device for achieving the above object is a means for transmitting a longitudinal ultrasonic wave obliquely to the surface of the inspection object within the inspection object, and an ultrasonic echo returned to the transmission position. A means for receiving, a means for scanning the transmission position, a means for measuring the transmission position and the elapsed time from the transmission of ultrasonic waves to the reception, and a sound velocity and incidence of longitudinal and transverse waves of the inspection object from the transmission position and the elapsed time. Angles are used to calculate the position of the reflection source in the inspection object, and comparison is made between the reflection sources calculated using the acoustic velocities of the longitudinal and transverse waves and the incident angle, and reflections at the same position or close to each other. And a means for visualizing only the source, which is an image processing apparatus for an ultrasonic reflection source, comprising the method of the first means, which is capable of eliminating a ghost image. Providing a device that displays only the true reflection source image The effect of wear can be obtained.

Similarly, in the ninth means, in the eighth means, when there is an attenuation region in which the transverse wave does not pass through the inspection object, the ultrasonic wave is transmitted when the transverse wave is reflected by the reflection source visualized by the apparatus of the eighth means. Position, means for calculating the position of the ghost image using the sound velocity and incident angle of the longitudinal wave from the elapsed time until the transmitted transverse ultrasonic wave is reflected by the reflection source and returns to the transmission position; A reflection source which does not exist in the vicinity of the ghost image and which is present in the shadow of the attenuation region or the transverse wave of the attenuation region and is calculated using the sound velocity and the incident angle of the longitudinal wave. An image processing device for an ultrasonic wave reflection source, characterized in that, in addition to the function and effect of the eighth means, this device also forms an image of a reflection source in an attenuation region where transverse ultrasonic waves do not pass. Therefore, the recognition of the reflection source can be established. Effect of providing a device which can be obtained.

Similarly, the tenth means is the eighth means or the ninth means.
In the means, the shape of the inspection object is known in advance,
If the position of the reflection source calculated using the sound velocity and the incident angle of the longitudinal wave or the transverse wave is outside the inspection object, a method for calculating the position of the reflection source assuming that the longitudinal wave or the transverse wave is reflected at the boundary of the inspection object is provided. An image processing apparatus for an ultrasonic wave reflection source, which is characterized in that, in addition to the function and effect of the eighth means or the ninth means, the ultrasonic wave is reflected at the boundary of the inspection object. The ultrasonic echoes returned from the reflection source can also be visualized by replacing the position of the reflection source within the inspection target, so even if the reflection source is searched for on the reflection path, the position of the reflection source can be determined. It is possible to obtain an effect that an image can be accurately visualized at a position within the inspection target.

Similarly, the eleventh means is the eighth to tenth means.
In any one of the above-mentioned means, there is provided an image processing apparatus for an ultrasonic reflection source, characterized in that it includes means for measuring the sound velocity of a longitudinal wave and a transverse wave to be inspected. In addition to the function and effect of any one of the means to the tenth means, an action of being able to visualize the reflection source of the ultrasonic wave in the inspection target having an unknown sound velocity can be obtained in advance. It is possible to obtain an effect that an ultrasonic reflection source can be imaged without preparing sound velocity data regarding ultrasonic waves, or for an inspection target made of an unknown material.

Similarly, the twelfth means includes the eighth means to the eleventh means.
In any one of the means, characterized by comprising means for measuring the elapsed time of the ultrasonic echo that returns to the transmission position within a certain period after the ultrasonic wave is incident from the transmission position According to this device, in addition to the action and effect of any one of the eighth to eleventh means, the ultrasonic wave is returned to the transmission position within a certain period. Since the action of visualizing only the specific reflection source by measuring the elapsed time of the incoming ultrasonic echo can be obtained, the effect that only the reflection source within the desired specific range can be visualized can be obtained.

Similarly, the thirteenth means includes the eighth means to the twelfth means.
In any one of the means up to, means for injecting an ultrasonic wave from the transmission position, a means for measuring the elapsed time of the ultrasonic echo returning to the transmission position with a certain specific power, According to this device, in addition to the effect of any one of the eighth means to the twelfth means, a certain power is provided to the transmitting position. Due to the action of measuring the elapsed time of the returning ultrasonic echo and visualizing only the specific reflection source, it is possible to obtain the effect that only the specific reflection source having the desired reflection power can be visualized.

[0028]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

<First Embodiment> FIG. 1 shows a first embodiment of the present invention.

FIG. 1 is a block diagram of a device according to the first embodiment of the present invention and an inspection target.

The object to be inspected is the steel plate 3, and the defect 6 exists inside. The thickness of this steel plate 3 is d, the longitudinal sound velocity is V _L and the transverse sound velocity is V _S.

The inspection apparatus comprises a longitudinal wave oblique probe 1 for transmitting a longitudinal ultrasonic wave 10 (incident angle θ _L ) and a transverse ultrasonic wave 9 (incident angle θ _S ) to the steel plate 3, and a longitudinal wave in the x direction. A motor 62a that scans the bevel probe 1, a motor 62b that scans the longitudinal wave bevel probe 1 in the y-direction, a scanning device 60 that includes encoders 64a and 64b, and pulses transmitted from the encoders 64a and 64b. Counters 35a and 35b for counting, a control device 34, a trigger generator 33, an oscillator 30, and a receiver 3
1, the gate circuit 32, the A / D converter 40, the memory 42, the storage medium 38, the shape of the steel plate 3, the longitudinal wave sound velocity and the transverse wave sound velocity of the steel plate 3, and the incidence of the longitudinal wave bevel probe 1. The data storage unit 46 that stores the angle, the initial position, the resolution of the encoder, and the like, the image data calculation device 44, and the image display device 3
6.

Next, the inspection procedure will be described with reference to FIGS.
This will be described with reference to FIG.

FIG. 5 shows a control algorithm of the control device 34.

FIG. 6 shows the signal f received by the receiver 31.
(t) and the gate signal G (t) generated by the gate circuit 32.
And the signal g (t) that the A / D converter 40 performs A / D conversion.

The waveform 50 is the pulse voltage generated by the oscillator 30, the waveform 54 is the echo inside the shoe of the longitudinal wave bevel probe 1, and the waveform 52 is the longitudinal ultrasonic wave 10 or the transverse ultrasonic wave 9 reflected by the defect 6. The reflected echo is returned to the longitudinal wave bevel probe 1.

FIG. 7 shows the data format in the storage medium.

First, the controller 34 causes the counters 35a, 3
The count values N _x and N _y of 5b are reset to zero.

The control device 34 issues a command to the scanning device 60 to drive the x-direction scanning motor 62a to scan the longitudinal wave bevel probe 1 in the x direction.

When the longitudinal wave bevel probe 1 is scanned in the x direction,
A pulse is generated from the encoder 64a.

The counter 35a counts the pulses,
Write the number of pulses into the count value.

The controller 34 constantly monitors the count value of the counter 35a, and the count value N _x is N, 2N, 3
When N ... (N is an arbitrary integer), the control device 34 issues a command to the trigger generator 33, and the trigger generator 33 inputs an external trigger to the oscillator 30 and the gate circuit 32.

That is, the trigger generator 33 outputs an external trigger every time the longitudinal wave bevel probe 1 is scanned at a certain interval.

When the count value N _{x of the} counter 35a becomes N, an external trigger is input to the oscillator 30 and the gate circuit 32, and the oscillator 30 outputs the pulse voltage 5 as shown in FIG.
0 is generated, and the gate circuit 32 inputs the gate signals G (t) and g (t) as shown in FIG. 6 to the A / D converter 40.

Here, g (t) is the received signal f (t) within the time of the gate signal G (t), and is a signal obtained by subtracting the gate signal G (t) from the received signal f (t). .

The A / D converter 40 starts A / D conversion of the signal g (t) at the rise of the gate signal G (t).

The A / D converter 40 records the propagation time T up to the maximum value of the A / D converted signal g (t) in the memory 42.

However, when no waveform appears in the signal g (t), zero is recorded in the memory 42. This T is the time until the ultrasonic wave enters the steel plate 3 and returns to the longitudinal wave bevel probe 1.

As the A / D converter having such a function, for example, STR8100D manufactured by Sonics Co. is used.

The controller 34 counts the count values N _x of the counters 35a and 35b when a command is issued to the trigger generator 33,
N _y and the time T stored in the memory 42 are stored in the storage medium 38.
In the format shown in FIG.

However, when T is zero, nothing is stored in the storage medium 38.

Next, when the count value N _x of the counter 35a becomes 2N, the control device 34 similarly issues a command to the trigger generator 33, inputs an external trigger to the oscillator 30 and the gate circuit 32 at the same time, and outputs the same command. Signal processing is repeated.

In this way, the longitudinal wave bevel probe 1 is scanned in the x direction, and T can be measured at a certain scanning interval.

When the scanning in the x direction is completed, the scanning device 60
To drive the y-direction scanning motor 62b to pitch the longitudinal wave bevel probe 1 in the y-direction.

The distance to pitch in the y direction is determined by the counter 35.
It is determined by monitoring the count value of b.

Then, the longitudinal wave oblique probe 1 is scanned in the x direction.

In this way, the control unit 34 controls the data storage unit 4
X of the longitudinal wave bevel probe 1 using the shape data of the steel plate 3 of No. 6
By repeating the direction scanning and the y-direction pitch, the steel plate 3
It is possible to measure T for the entire surface of.

Next, the procedure for visualizing the defect 6 will be described with reference to FIGS.
This will be described with reference to FIGS. 10, 11, and 12.

FIG. 8 shows a data processing algorithm of the image data arithmetic unit 44.

As a result of inspecting the steel sheet 3 by the above inspection method, it is assumed that the flaw detection data 1 to 6 as shown in FIG. 9 are stored in the storage medium 38.

The image data arithmetic unit 44 divides the area of the steel plate 3 into minute areas M (1) to M (I) (I: area number) as shown in FIG.

Next, the image data arithmetic unit 44 uses the count values N _x and N _y recorded in the storage medium 38 and the initial position of the longitudinal wave bevel probe 1 stored in the data storage unit 46. From (x _s , y _s ) and the resolutions d _x , d _{y of the} encoders 64a, 64b, the ultrasonic wave incident position (x, y) on the steel plate 3 of the longitudinal wave bevel probe 1 is calculated by (Equation 3).

[0063]

X = x _s + d _x · N _{x y = y s + d y ·} N y ... ( Equation 3) x, y: ultrasound incident position x _s, y _s: the initial position of the incident position d _x, d _y: resolution of the encoder N _x, N _y: Count Then, the image data calculation device 44 uses the longitudinal wave bevel probe 1
From the ultrasonic wave incident position (x, y), the propagation time T, the longitudinal wave sound velocity V _{L of the} steel plate 3 and the incident angle θ _{L of the} longitudinal wave bevel probe 1 stored in the data storage unit 46, Using (Equation 4), for the flaw detection data 1 to 6, as shown in FIG.
1 to P6 are calculated.

[0064]

(Equation 4)

Positions P1 to P of the reflection source calculated by (Equation 4)
Micro regions including 6 M (i), M (j), M (k), M (l), M
Let (m) and M (n) be reflection sources.

Adjacent minute areas M (i), M (j), M (k)
And the minute areas M (l), M (m), M (n) are the same reflection source 1
Consider 4,14g.

The reflection source 14 transmits the longitudinal wave reflection echo to the longitudinal wave sound velocity V.
It is calculated using _L and the longitudinal wave incident angle θ _L , and the reflection source 14g converts the transverse wave reflected echo into the longitudinal wave sound velocity V _L and the longitudinal wave incident angle θ _L.
It is calculated using.

Similarly, the image data arithmetic unit 44
The ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1, the propagation time T, and the steel plate 3 stored in the data storage unit 46.
From the longitudinal wave sound velocity V _S and the incident angle θ _{S of the} longitudinal wave bevel probe 1
Using (Equation 5), the positions P7 to P12 of the reflection source are calculated for the flaw detection data 1 to 6 as shown in FIG.

[0069]

(Equation 5)

A minute area M (o) including the positions P7 to P12,
The reflection sources are M (p), M (q), M (i), M (j), and M (k). Adjacent minute areas M (o), M (p), M (q) and minute areas M (i), M (j), M (k) are the same reflection sources 16g, 16
Is considered. The reflection source 16g converts the longitudinal wave reflection echo into the transverse wave sound velocity V.
_S is calculated by using the transverse wave incident angle θ _S , and the reflection source 16 is calculated by using the transverse wave reflected echo V _S and the transverse wave incident angle θ _S.

The image data arithmetic unit 44 compares the area numbers of the reflection sources 14 and 14g of FIG. 10 and the reflection sources 16 and 16g of FIG. 11, and selects the areas of the reflection sources 14 and 16 which are equal to or more than a certain number of area numbers. To do.

The contour of the steel plate 3 and / or the area of the reflection source 14 or the area of the reflection source 16 are shown in FIG.
The image is displayed on the image display device 36 as follows.

By processing flaw detection data in this way,
The true defect image 18 can be displayed on the image display device.

<Second Embodiment> FIG. 13 shows a second embodiment of the present invention.

FIG. 13 is a block diagram of a device according to the second embodiment of the present invention and an inspection target.

The inspection object is the steel plate 3 having the welded portion 4,
The base material has a defect 6a and the weld has a defect 6b.

The thickness of the steel plate 3 is d, the longitudinal sound velocity is V _L and the transverse sound velocity is V _S.

Longitudinal ultrasonic waves can pass through the weld, but transverse ultrasonic waves are reflected at the weld boundaries.

Therefore, the longitudinal wave reflection echo of the defect 6b can be detected by the longitudinal wave bevel probe 1, but the transverse wave reflection echo cannot be detected.

The inspection apparatus and the inspection procedure of the second embodiment are the same as those of the first embodiment, and the storage medium 38 stores data as shown in FIG.

Next, the procedure for visualizing the defect 6 will be described with reference to FIGS.
5, it will be described with reference to FIG. 16, FIG. 17, FIG. 18, FIG.

FIG. 14 shows a data processing algorithm of the image data arithmetic unit 44.

The image data arithmetic unit 44 divides the area of the steel plate 3 into minute areas M (1) to M (I) (I: area number).

Next, the image data arithmetic unit 44 calculates the ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1 on the steel plate 3 by (Equation 3).

Then, the image data arithmetic unit 44 determines the ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1 and the propagation time T.
From the longitudinal wave sound velocity V _{L of the} steel plate 3 and the incident angle θ _{L of the} longitudinal wave bevel probe 1 stored in the data storage unit 46, (Equation 4)
Is used to calculate the position of the reflection source.

As shown in FIG. 15, the reflection source 1 is defined as an area composed of a minute area including the position of the reflection source calculated by (Equation 4).
Considered 4,14g, 15.

The reflection source 14 calculates the longitudinal wave reflection echo of the defect 6a using the longitudinal wave sound velocity V _L and the longitudinal wave incident angle θ _L , and the reflection source 14g calculates the transverse wave reflection echo of the defect 6a. It is calculated using V _L and the longitudinal wave incident angle θ _L , and the reflection source 15 is the one that calculates the longitudinal wave reflection echo of the defect 6b using the longitudinal wave sound velocity V _L and the longitudinal wave incident angle θ _L.

Similarly, the image data arithmetic unit 44
The ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1, the propagation time T, and the steel plate 3 stored in the data storage unit 46.
From the longitudinal wave sound velocity V _S and the incident angle θ _{S of the} longitudinal wave bevel probe 1
The position of the reflection source is calculated using (Equation 5).

As shown in FIG. 16, the reflection source 1 is defined as an area composed of a minute area including the position of the reflection source calculated by (Equation 5).
It is considered to be 6, 16 g and 17 g.

The reflection source 16 calculates the transverse wave reflection echo of the defect 6a using the transverse wave sound velocity V _S and the transverse wave incident angle θ _S , and the reflection source 16g calculates the longitudinal wave reflection echo of the defect 6a into the transverse wave sound velocity V _S , It is calculated by using the transverse wave incident angle θ _S , and the reflection source 17g is calculated by using the transverse wave sound velocity V _S and the transverse wave incident angle θ _S of the longitudinal wave reflection echo of the defect 6b.

The image data arithmetic unit 44 includes the reflection sources 14, 14g, 15 of FIG. 15 and the reflection sources 16, 16g of FIG.
The area numbers of 17g are compared, and the reflection sources 14 and 16 which are equal to or larger than a certain number of area numbers are selected.
The reflected image 18 is selected as shown in FIG.

The image data arithmetic unit 44 calculates the position and the propagation time of the longitudinal wave bevel probe 1 when the transverse wave is reflected at the position of the center of gravity of the micro area for all the micro areas of the reflection source 18. The position and propagation time of the longitudinal wave bevel probe 1, and the longitudinal wave sound velocity V _{L of the} steel plate 3 stored in the data storage unit 46.
And the longitudinal wave incident angle θ _L , the position of the reflection source is calculated using (Equation 4), and a region including a minute region including the calculated position of the reflection source is regarded as the reflection source 18g as shown in FIG. .

The image data arithmetic unit 44 compares the area numbers of the reflection sources 14g, 15 in the welded portion of FIG. 15 and the reflection source 18g of FIG. To be elected.

Then, both the area of the reflection source 18 and the area of the reflection source 15, and the contours of the steel plate 3 and the welded portion are displayed on the image display device 36 as shown in FIG.

By processing flaw detection data in this way,
The true defect images 15 and 18 can be displayed on the image display device.

<Third Embodiment> FIG. 21 shows a third embodiment of the present invention.

FIG. 21 is a block diagram and an inspection target of the apparatus of the third embodiment of the present invention.

The inspection apparatus and inspection procedure of the third embodiment are the same as those of the first embodiment, and the storage medium 38 stores data as shown in FIG.

However, in the third embodiment, the propagation time T of the echo directly reflected from the defect 6 and the echo reflected from the defect 6 by skipping 1 at the bottom surface of the steel plate 3 is stored in the storage medium 38 as data.

Next, the procedure for visualizing the defect 6 will be described with reference to FIGS.
3, using FIG. 24 and FIG. 25.

FIG. 22 shows a data processing algorithm of the image data arithmetic unit 44.

The image data arithmetic unit 44 divides the area of the steel plate 3 into minute areas M (1) to M (I) (I: area number).

Next, the image data calculation device 44 calculates the ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1 on the steel plate 3 by (Equation 3).

Then, the image data arithmetic unit 44 determines the ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1 and the propagation time T.
From the longitudinal wave sound velocity V _{L of the} steel plate 3 and the incident angle θ _{L of the} longitudinal wave bevel probe 1 stored in the data storage unit 46, (Equation 4)
Is used to calculate the position of the reflection source.

The position of the reflection source calculated by (Equation 4) is the steel plate 3
If it is out of the region of, the position of the reflection source is moved to a position symmetrical with respect to the boundary of the steel plate 3.

As shown in FIG. 23, the area formed by a minute area including the position of the reflection source calculated by (Equation 4) is reflected by the reflection source 1 as shown in FIG.
Consider 4,14g.

The reflection source 14 calculates the longitudinal wave echo directly reflected from the defect 6 and the longitudinal wave echo reflected by skipping 1 at the bottom surface using the longitudinal wave sound velocity V _L and the longitudinal wave incident angle θ _L. The reflection source 14g calculates the transverse wave echo directly reflected from the defect 6 and the transverse wave echo reflected by skipping 1 at the bottom surface using the longitudinal wave sound velocity V _L and the longitudinal wave incident angle θ _L. Similarly, the image data calculation device 44 uses the ultrasonic wave incident position (x, y) of the longitudinal wave bevel probe 1, the propagation time T, and the transverse wave of the steel plate 3 stored in the data storage unit 46. speed of sound V _S
And the incident angle θ _{S of the} transverse wave bevel probe 1 is used to calculate the position of the reflection source using (Equation 5).

The position of the reflection source calculated by (Equation 5) is the steel plate 3
If it is out of the region of, the position of the reflection source is moved to a position symmetrical with respect to the boundary of the steel plate 3.

As shown in FIG. 24, the area formed by a minute area including the position of the reflection source calculated by (Equation 5) is reflected by the reflection source 1 as shown in FIG.
Consider 6,16g.

The reflection source 16 is calculated by using the transverse wave sound velocity V _S and the transverse wave incident angle θ _S to calculate the transverse wave echo directly reflected from the defect 6 and the transverse wave echo reflected by skipping 1 at the bottom surface. Is a longitudinal wave echo directly reflected from the defect 6 and a longitudinal wave echo reflected by skipping 1 at the bottom surface using the transverse wave sound velocity V _S and the transverse wave incident angle θ _S. The image data arithmetic unit 44 is the reflection sources 14 and 14g of FIG.
And the area numbers of the reflection sources 16 and 16g in FIG. 24 are compared, and the area numbers are equal to or larger than a certain number.
6 is selected, and either or both of the area of the reflection source 14 and the area of the reflection source 16 is selected as the reflection source 18.

Then, the area of the reflection source 18 and the contour of the steel plate 3 are displayed on the image display device 36 as shown in FIG.

By processing the flaw detection data in this way,
The flaw detection data of the reflection echo skipped by 1 on the bottom surface can be image-processed, and the true defect image 18 can be displayed on the image display device.

<Fourth Embodiment> FIG. 26 shows a fourth embodiment of the present invention.

FIG. 26 is a block diagram and an inspection target of the apparatus according to the fourth embodiment of the present invention.

The inspection target is the steel plate 3, and the defect 6 exists inside.

The thickness of this steel plate 3 is d, and the longitudinal wave velocity,
Transverse wave velocity is unknown.

In the inspection device, the vibrator 81 has an inclination of θ _i ,
A longitudinal wave bevel probe 1 having a longitudinal sound velocity of V _i in the shoe;
The longitudinal wave vertical probe 2a, the transverse wave vertical probe 2b, the switch 70, the motor 62a for scanning the longitudinal wave bevel probe 1 in the x direction, and the longitudinal wave bevel probe 1 in the y direction. Scanning motor 6
2b, a scanning device 60 including encoders 64a and 64b
And counters 35a and 35b for counting the pulses transmitted from the encoders 64a and 64b, and a controller 34,
A trigger generator 33, an oscillator 30, a receiver 31, a gate circuit 32, an A / D converter 40, a memory 42,
Storage medium 38, shape of steel plate 3, longitudinal sound velocity V in shoe
_i , the inclination θ _i of the transducer 81 of the longitudinal wave bevel probe 1, the data storage unit 46 in which the resolution of the encoder and the like are stored, the image data calculation device 44, and the image display device 36. .

Next, the inspection procedure is shown in FIG. 26, FIG. 27, and FIG.
This will be described with reference to FIG.

FIG. 28 shows a control algorithm of the control device 34.

29 and 30, the oscillator 30 is connected to the longitudinal wave vertical probe 2a and the transverse wave vertical probe 2b, and when the pulse voltage 50 is transmitted from the oscillator 30, the longitudinal wave vertical probe is shown. 2a and a transverse wave multiple echo 53 and a transverse wave multiple echo 55 received by the transverse wave vertical probe 2b.

First, the longitudinal wave vertical probe 2a and the transverse wave vertical probe 2b are set on the steel plate 3.

The switch 30 connects the oscillator 30 to the vertical wave vertical probe 2a.

The controller 34 issues a command to the trigger generator 33, and the trigger generator 33 causes the oscillator 30 and the gate circuit 32 to operate.
Input an external trigger to.

When an external trigger is input to the oscillator 30, the oscillator 30 generates a pulse voltage 50 as shown in FIG. 29 and the gate circuit 32 has a gate signal G as shown in FIG.
Input (t) and g (t) to the A / D converter.

Here, g (t) is the received signal f (t) within the time of the gate signal G (t), and is the signal obtained by subtracting the gate signal G (t) from the received signal f (t). .

The A / D converter starts A / D conversion of the signal g (t) at the rise of the gate signal G (t).

The A / D converter uses the A / D converted signal g
(t) is recorded in the memory 42.

The control device 34 determines the round-trip time t _L of the longitudinal ultrasonic waves from the data in the memory 42.

From this t _L, the longitudinal wave sound velocity V _L of the steel plate 3 is obtained by (Equation 6), and the incident angle θ _L of the longitudinal ultrasonic waves on the steel sheet 3 is obtained by (Equation 7).

[0130]

V _L = 2d / t _L (Equation 6) t _L : Round-trip time of longitudinal ultrasonic wave

[0131]

(Equation 7)

Next, the switch 7 connects the oscillator 30 to the transverse wave vertical probe 2b.

The controller 34 issues a command to the trigger generator 33, and the trigger generator 33 causes the oscillator 30 and the gate circuit 32 to operate.
Input an external trigger to.

When an external trigger is input to the oscillator 30, the oscillator 30 generates a pulse voltage 50 as shown in FIG. 30, and the gate circuit 32 has a gate signal G as shown in FIG.
Input (t) and g (t) to the A / D converter.

Here, g (t) is the received signal f (t) within the time of the gate signal G (t), and is a signal obtained by subtracting the gate signal G (t) from the received signal f (t). .

The A / D converter starts A / D conversion of the signal g (t) at the rising edge of the gate signal G (t).

The A / D converter outputs an A / D converted signal g
(t) is recorded in the memory 42.

The controller 34 determines the round-trip time t _S of the transverse ultrasonic waves from the data in the memory 42.

From this t _S, the transverse wave sound velocity V _S of the steel plate 3 is obtained by (Equation 8), and the incident angle θ _S of the transverse wave ultrasonic wave at the steel sheet 3 is obtained by (Equation 9).

[0140]

[Expression 8] V _S = 2d / t _S (Equation 8) t _S : Round-trip time of transverse ultrasonic waves

[0141]

[Equation 9]

Next, by connecting the oscillator 30 and the longitudinal wave bevel probe 1 with the switch 7 and performing the same processing as in the first embodiment, the data shown in FIG. Remembered

Using the data of FIG. 8 and V _L , θ _L , V _S , and θ _S obtained from (Equation 6), (Equation 7), (Equation 8), (Equation 9),
The defect 6 can be visualized on the image display device 36 by performing the same visualization process as in the first embodiment.

<Fifth Embodiment> FIGS. 31 and 32 show the fifth embodiment of the present invention.

The fifth embodiment of the present invention is the A / D converter 40 according to any one of the first to fourth embodiments.
Has a function of recording the peak value h of the A / D converted signal g (t) in the memory 42, and records the data shown in FIG. 33 in the recording medium 38.

The image data calculation device 44 visually recognizes the reflection echo intensity from the defect by displaying the defect image on the image display device while changing the color or density according to the size of the crest value h. Can be done.

[0147]

According to the invention of claim 1, it is possible to provide a method of eliminating a ghost image and visualizing only a true reflection source image.

According to the second aspect of the present invention, it is possible to provide a method of visualizing the reflection source in the attenuation region where the transverse ultrasonic waves do not pass.

According to the third aspect of the present invention, it is possible to provide a method of visualizing a reflection source even for an ultrasonic echo reflected from the boundary of the object to be inspected and returning from the reflection source.

According to the invention of claim 4, it is possible to provide a method capable of visually recognizing the position of the reflection source with respect to the inspection object.

According to the fifth aspect of the present invention, it is possible to provide a method of visualizing the reflection source even for an inspection target whose sound velocity is unknown.

According to the inventions of claims 6 and 7, it is possible to provide a method for visualizing only a specific reflection image.

According to the eighth aspect of the invention, the effect that the ghost image can be erased and only the true reflection source image can be displayed is obtained.

According to the ninth aspect of the invention, it is possible to obtain the effect that the reflection source in the attenuation region where the transverse ultrasonic waves do not pass can also be visualized.

According to the tenth aspect of the invention, it is possible to obtain an effect that the reflection source can be visualized even for the ultrasonic echo reflected by the boundary of the inspection object and returned from the reflection source.

According to the eleventh aspect of the invention, it is possible to obtain the effect that the reflection source can be imaged even for an inspection target whose sound velocity is unknown.

According to the inventions of claims 12 and 13,
Only a specific reflection image can be visualized.

[Brief description of drawings]

FIG. 1 is a configuration block diagram of an apparatus according to a first embodiment of the present invention.

FIG. 2 is a schematic perspective view of a conventional inspection device using a longitudinal wave.

FIG. 3 is a waveform diagram showing an ultrasonic waveform received in a conventional inspection.

FIG. 4 is a data format diagram recorded in a conventional inspection.

FIG. 5 is a flowchart showing a control algorithm of the first embodiment.

FIG. 6 is a waveform diagram showing a received waveform of a receiver and an output waveform of a gate circuit.

FIG. 7 is a data format diagram in a storage medium.

FIG. 8 is a flowchart of a data processing algorithm of the first embodiment.

FIG. 9 is a data format diagram in a storage medium.

FIG. 10 is a diagram showing a result of calculating the position of a defect assuming that flaw detection data is a longitudinal wave reflection echo.

FIG. 11 is a diagram showing a result of calculating the position of a defect assuming that flaw detection data is a transverse wave reflection echo.

FIG. 12 is a diagram showing a defect image existing in a steel sheet and a contour of the steel sheet.

FIG. 13 is a configuration block diagram of an apparatus showing a second embodiment of the present invention.

FIG. 14 is a flowchart showing a data processing algorithm of the second embodiment.

FIG. 15 is a diagram showing a result of calculating the position of a defect assuming that flaw detection data is a longitudinal wave reflection echo.

FIG. 16 is a diagram showing a result of calculating the position of a defect assuming that flaw detection data is a transverse wave reflection echo.

17 is a diagram in which defects at the same position or in the vicinity are selected and displayed by comparing FIGS. 15 and 16. FIG.

18 is a diagram showing a ghost image calculated from the defect image of FIG.

FIG. 19 is a diagram showing a defect image existing in a welded portion.

FIG. 20 is a diagram showing a defect image existing in a steel sheet and a contour of the steel sheet.

FIG. 21 is a configuration block diagram of an apparatus showing a third embodiment of the present invention.

FIG. 22 is a flowchart showing a data processing algorithm of the third embodiment.

FIG. 23 is a diagram showing a result of calculating the position of a defect assuming that flaw detection data is a longitudinal wave reflection echo.

FIG. 24 is a diagram showing a result of calculating the position of a defect on the assumption that flaw detection data is a transverse wave reflection echo.

FIG. 25 is a diagram showing a defect image existing in a steel sheet and a contour of the steel sheet.

FIG. 26 is a configuration block diagram of an apparatus showing a fourth embodiment of the present invention.

FIG. 27 is a conceptual diagram of a longitudinal wave bevel probe.

FIG. 28 is a flowchart showing a control algorithm of the fourth embodiment.

FIG. 29 is a waveform diagram showing an ultrasonic waveform transmitted / received by a vertical wave vertical probe.

FIG. 30 is a waveform diagram showing an ultrasonic waveform transmitted / received by a transverse wave vertical probe.

FIG. 31 is a waveform diagram showing a received waveform of a receiver and an output waveform of a gate circuit.

FIG. 32 is a data format diagram in a storage medium.

[Explanation of Codes] 1 ... Longitudinal wave oblique probe, 2a ... Longitudinal wave vertical probe, 2b ... Transverse wave vertical probe, 3 ... Steel plate, 4 ... Welded portion, 6 ... Defect, 9 ...
Transverse ultrasonic wave, 10 ... Longitudinal wave ultrasonic wave, 30 ... Oscillator, 31 ...
Receiver, 32 ... Gate circuit, 33 ... Trigger generator, 34
... control device, 35a, 35b ... counter, 36 ... image display device, 38 ... storage medium, 40 ... A / D converter, 42 ...
Memory, 44 ... Image data arithmetic unit, 46 ... Data storage unit, 60 ... Scanning device, 62a, 62b ... Motor, 64
a, 64b ... encoder, 70 ... switch, 80 ... shoe, 81 ... transducer, 100 ... Computer, 102 ... display, 104 ... storage device, 106 ... ultrasonic flaw detector, theta _S ... incident angle of transverse waves, theta _L ... the angle of incidence of the longitudinal waves, V _S
... transverse wave sound velocity, V _L ... longitudinal wave sound velocity, T ... propagation time, T _S ... transverse wave propagation time, _TL ... longitudinal wave propagation time, h ... crest value.

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Atsushi Watanabe 7-2-1, Omika-cho, Hitachi-shi, Ibaraki Hitachi, Ltd.

Claims (13)

[Claims] 1. A longitudinal ultrasonic wave is obliquely transmitted to a surface of an inspection object, an ultrasonic echo returned to a transmission position is received, the transmission position is scanned, and the transmission and reception are performed. Repeat the position data of the transmission position and the elapsed time from the transmission of the ultrasonic waves to the reception, using the sound velocity and the incident angle of the longitudinal wave and the transverse wave of the inspection target, the reflection in the inspection target. The position of the source is calculated, the reflection source calculated using the sound velocity and the incident angle of the longitudinal wave, and the reflection source calculated using the sound velocity and the incident angle of the transverse wave are compared, and the same position or An image processing method for an ultrasonic reflection source, comprising the step of visualizing only the reflection source at a close position. 2. The transmission position of ultrasonic waves when a transverse wave is reflected by a reflection source imaged by the method according to claim 1, and a transmission position when a transverse wave does not pass through the inspection object. Calculate the position of the ghost image using the sound velocity and the incident angle of the longitudinal wave from the elapsed time until the reflected ultrasonic wave is reflected by the reflection source and returns to the transmission position, and exists in the vicinity of the ghost image. Ultrasonic wave characterized by including a process of visualizing a reflection source calculated by utilizing the sound velocity and incident angle of a longitudinal wave, which is present in the attenuation region or a shadow of a transverse wave in the attenuation region Image processing method of the reflection source of the camera. 3. The shape of the object to be inspected according to claim 1 or 2, wherein the position of the reflection source calculated using the sound velocity and the incident angle of the longitudinal wave or the transverse wave is outside the object to be inspected. In the case of (1), the method for processing an image of a reflection source of ultrasonic waves, comprising the step of calculating the position of the reflection source assuming that a longitudinal wave or a transverse wave is reflected at the boundary of the inspection object. 4. The image processing method for an ultrasonic reflection source according to claim 1, 2, or 3, further comprising a processing step of imaging a contour or a part of the contour of an inspection target. . 5. The image processing of an ultrasonic reflection source according to any one of claims 1 to 4, further comprising a step of measuring a sound velocity of a longitudinal wave and a transverse wave to be inspected. Method. 6. The elapsed time of an ultrasonic echo that returns to a transmission position within a certain specific period after transmitting an ultrasonic wave from the transmission position according to any one of claims 1 to 5. An image processing method for an ultrasonic reflection source, characterized in that it comprises a process of measuring only 7. The elapsed time of an ultrasonic echo according to any one of claims 1 to 6, which transmits an ultrasonic wave from a transmission position and returns to the transmission position with a certain specific power. An image processing method for an ultrasonic reflection source, characterized in that it comprises a process of measuring only 8. A means for transmitting a longitudinal ultrasonic wave in an inspection object obliquely to the surface of the inspection object, a means for receiving an ultrasonic echo returned to a transmission position, and a means for scanning the transmission position. , Means for measuring an elapsed time from the transmission position and the transmission of the ultrasonic waves to the reception, using the sound velocity and the incident angle of the longitudinal wave and the transverse wave of the inspection target from the transmission position and the elapsed time. , A means for calculating the position of the reflection source of the ultrasonic wave in the inspection object, and the reflection source calculated using the sound velocity and the incident angle of the longitudinal wave and the transverse wave, the same position or close position And an image processing device for an ultrasonic reflection source, comprising: 9. The transmission position of ultrasonic waves when a transverse wave is reflected by a reflection source visualized by the apparatus according to claim 8, and a transmission when the attenuation region where the transverse wave does not pass exists in the inspection object. Means for calculating the position of the ghost image using the sound velocity and the incident angle of the longitudinal wave from the elapsed time until the reflected transverse ultrasonic wave is reflected by the reflection source and returns to the transmission position; A reflection source that does not exist in the vicinity and that is calculated using the sound velocity of the longitudinal wave and the incident angle and that exists in the shadow of the attenuation region or the transverse wave of the attenuation region, and means for visualizing Image processing device for ultrasonic reflection source. 10. The shape of the object to be inspected according to claim 8 or 9, and the position of the reflection source calculated by using the sound velocity of the longitudinal wave or the transverse wave and the incident angle is outside the object to be inspected. In the above case, the ultrasonic wave reflection source image processing apparatus is provided with means for calculating the position of the reflection source assuming that the longitudinal wave or the transverse wave is reflected at the boundary of the inspection object. 11. Claim 8 or claim 9 or claim 1.
0, an image processing apparatus for an ultrasonic reflection source, comprising means for measuring the sound velocities of the longitudinal wave and the transverse wave to be inspected. 12. The method according to any one of claims 8 to 11, wherein an ultrasonic wave is incident from a transmission position,
An image processing apparatus for an ultrasonic wave reflection source, comprising means for measuring an elapsed time of an ultrasonic wave echo returning to the transmission position within a specific period. 13. The elapsed time of an ultrasonic echo according to any one of claims 8 to 12, wherein an ultrasonic wave is incident from a transmission position and returns to the transmission position with a certain specific power. An image processing device for an ultrasonic reflection source, characterized in that it is provided with means for measuring