JPH09503611A - マイクロ波プラズマ反応器 - Google Patents
マイクロ波プラズマ反応器Info
- Publication number
- JPH09503611A JPH09503611A JP7501806A JP50180695A JPH09503611A JP H09503611 A JPH09503611 A JP H09503611A JP 7501806 A JP7501806 A JP 7501806A JP 50180695 A JP50180695 A JP 50180695A JP H09503611 A JPH09503611 A JP H09503611A
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- JP
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- Prior art keywords
- electrode
- chamber
- microwave
- plasma reactor
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004020 conductor Substances 0.000 claims abstract description 27
- 238000007789 sealing Methods 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 27
- 230000005684 electric field Effects 0.000 claims description 26
- 230000004888 barrier function Effects 0.000 claims description 14
- 239000000110 cooling liquid Substances 0.000 claims description 11
- 238000001816 cooling Methods 0.000 claims description 10
- 230000005855 radiation Effects 0.000 claims description 9
- 239000007788 liquid Substances 0.000 claims description 6
- 238000003825 pressing Methods 0.000 claims description 6
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 230000001105 regulatory effect Effects 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 claims description 2
- 210000002381 plasma Anatomy 0.000 description 162
- 230000005284 excitation Effects 0.000 description 12
- 239000000463 material Substances 0.000 description 6
- 238000005530 etching Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 238000000576 coating method Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 230000005672 electromagnetic field Effects 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000565 sealant Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 239000000498 cooling water Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229920002313 fluoropolymer Polymers 0.000 description 1
- 238000012994 industrial processing Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
- H01J37/32211—Means for coupling power to the plasma
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/511—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using microwave discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.マイクロ波エネルギーにより励起してプラズマにする気体を入れる室と、 2つの面を有し、かつ一方の面からマイクロ波エネルギーを該室内に放射して 、該放射面の近くにプラズマを形成する、該室内に配置された電極と、 プラズマを形成するためのエネルギーを提供する2つの電極面の他方にマイク ロ波エネルギーを導入する手段と、 を含むマイクロ波プラズマ反応器。 2.該電極が円盤形であることを特徴とする、請求の範囲第1項に記載のマイク ロ波プラズマ反応器。 3.該マイクロ波エネルギーを導入する手段が同軸導体を含むことを特徴とする 、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 4.該電極に中心同軸導体が電気的に結合されていることを特徴とする、請求の 範囲第3項に記載のマイクロ波プラズマ反応器。 5.マイクロ波エネルギーを導入する該手段が、該同軸導体にマイクロ波エネル ギーを伝導するマイクロ波導波路を含むことを特徴とする、請求の範囲第3項に 記載のマイクロ波プラズマ反応器。 6.さらに、大気圧以下の圧力で作動する該室を真空にする手段を含むことを特 徴とする、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 7.さらに、該室を大気から密封する手段を含むことを特徴と する、請求の範囲第6項に記載のマイクロ波プラズマ反応器。 8.該室を密封する該手段が、マイクロ波エネルギーをそれに通過させる誘電体 密封手段を含むことを特徴とする、請求の範囲第7項に記載のマイクロ波プラズ マ反応器。 9.さらに、該室を密封する該手段が、該電極に対して該誘電体密封手段を密封 する手段を含むことを特徴とする、請求の範囲第8項に記載のマイクロ波プラズ マ反応器。 10.該電極に対して該誘電体密封手段を密封する該手段が、該誘電体密封手段 に対して該電極を押し付ける手段を含むことを特徴とする、請求の範囲第9項に 記載のマイクロ波プラズマ反応器。 11.該押し付け手段が、該基板に機械的に結合されたスプリング手段を含むこ とを特徴とする、請求の範囲第10項に記載のマイクロ波プラズマ反応器。 12.該誘電体密封手段が比較的低電界の領域内に配置されることを特徴とする 、請求の範囲第8項に記載のマイクロ波プラズマ反応器。 13.該誘電体密封手段が、他方の電極面において、電極の中心に近い比較的高 電界の領域からプラズマ形成気体を遮断して、他方の電極面の近くのプラズマ形 成を防止するために、該電極の周縁の近くにあることを特徴とする、請求の範囲 第12項に記載のマイクロ波プラズマ反応器。 14.さらに、該電極放射面の近くに比較的薄い細長いプラズマを発生する手段 を含むことを特徴とする、請求の範囲第1項に記載のマイクロ波プラズマ反応器 。 15.該電極放射面が平らであることを特徴とする、請求の範 囲第14項に記載のマイクロ波プラズマ反応器。 16.比較的薄い細長いプラズマを発生する該手段が、該電極放射面と該室の間 に不均一な間隙を含むことを特徴とする、請求の範囲第14項に記載のマイクロ 波プラズマ反応器。 17.該不均一な間隙が、該電極の周縁から中心に向かっておおまかに増加する 間隙を含むことを特徴とする、請求の範囲第16項に記載のマイクロ波プラズマ 反応器。 18.該電極放射面が、少なくとも幅1/2波長の距離だけ離れることを特徴と する、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 19.該電極放射面の周縁が、該室から1/2波長以下の距離だけ離れることを 特徴とする、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 20.該電極放射面の中心が、該室から1波長以下の距離だけ離れることを特徴 とする、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 21.さらに、該室内に励起する気体を導入する手段を含むことを特徴とする、 請求の範囲第1項に記載のマイクロ波プラズマ反応器。 22.さらに、該電極を冷却する手段を含むことを特徴とする、請求の範囲第1 項に記載のマイクロ波プラズマ反応器。 23.該電極を冷却する該手段が、該電極に冷却液を流す手段を含むことを特徴 とする、請求の範囲第22項に記載のマイクロ波プラズマ反応器。 24.該電極に冷却液を流す該手段が、該電極内にあり、かつ該電極放射面から 離れた液体室を含むことを特徴とする、請求 の範囲第23項に記載のマイクロ波プラズマ反応器。 25.さらに、該電極放射面から該液体室内の冷却液への熱の流れを調整する手 段を含むことを特徴とする、請求の範囲第24項に記載のマイクロ波プラズマ反 応器。 26.熱の流れを調整する該手段が、該冷却液室と該電極放射面の間の該電極内 に気体を供給する手段を含むことを特徴とする、請求の範囲第25項に記載のマ イクロ波プラズマ反応器。 27.熱の流れを調整する該手段が、気体の圧力を変化させる手段を含むことを 特徴とする、請求の範囲第26項に記載のマイクロ波プラズマ反応器。 28.さらに、該電極放射面と該室の間に定常波を形成する手段を含むことを特 徴とする、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 29.該2つの電極面のうちの他方が、該室から1/2波長以下の距離だけ離れ ることを特徴とする、請求の範囲第1項に記載のマイクロ波プラズマ反応器。 30.該2つの電極面のうちの他方が、該室から1/4波長の距離だけ離れるこ とを特徴とする、請求の範囲第29に記載のマイクロ波プラズマ反応器。 31.該室が、マイクロ波キャビティを含むことを特徴とする、請求の範囲第1 項に記載のマイクロ波プラズマ反応器。 32.該マイクロ波キャビティが、該室と同一の容積であることを特徴とする、 請求の範囲第31項に記載のマイクロ波プラズマ反応器。 33.該マイクロ波キャビティが、該室よりも小さく該室内に含まれることを特 徴とする、請求の範囲第31項に記載のマイ クロ波プラズマ反応器。 34.該キャビティの一部が、該室を越えて延びることを特徴とする、請求の範 囲第31項に記載のマイクロ波プラズマ反応器。 35.マイクロ波エネルギーにより励起してプラズマにする気体を入れる室と、 気体プラズマを発生させるマイクロ波電界を入れるキャビティと、 2つの面を有し、かつ一方の面からマイクロ波エネルギーを放射して、該放射 面の近くにプラズマを形成する、該キャビティ内に配置された電極と、 プラズマを形成するためのエネルギーを提供する2つの電極面の他方にマイク ロ波エネルギーを導入する手段と、 を含むマイクロ波プラズマ反応器。 36.該マイクロ波キャビティが、該室と同一の容積であることを特徴とする、 請求の範囲第32項に記載のマイクロ波プラズマ反応器。 37.該マイクロ波キャビティが、該室よりも小さく該室内に含まれることを特 徴とする、請求の範囲第33項に記載のマイクロ波プラズマ反応器。 38.該キャビティの一部が、該室を越えて延びることを特徴とする、請求の範 囲第34項に記載のマイクロ波プラズマ反応器。 39.マイクロ波エネルギーにより励起してプラズマにする気体を入れるほぼ円 筒形の室と、 その周縁において該室から1/2波長以下の距離だけ離れた 放射面を有し、かつその周縁において該室から1/4波長の距離だけ離れた放射 線受信面を有する該室内の円盤形の電極と、 該電極に電気的かつ機械的に結合された管状中心導体を含む同軸マイクロ波導 体と、 該電極放射線受信面と該室の聞の環状誘電体障壁と、 該誘電体障壁に対して該電極を密封するために、該中心導体を通して該電極に 圧力を加える手段と、 該管状中心導体を介して該電極を冷却する手段と、 該電極放射面の近くにプラズマを形成するために、該室内に気体を導入する手 段と、 を含むマイクロ波プラズマ反応器。 40.マイクロ波エネルギーにより励起してプラズマにする気体を入れる室と、 該室内の電極と、 該室内において該電極の片側にプラズマを発生させる手段と、 該室内において該室を大気から密封するために該電極によって該プラズマから 遮蔽された誘電体障壁手段と、 を含むマイクロ波プラズマ反応器。
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/072,272 US5556475A (en) | 1993-06-04 | 1993-06-04 | Microwave plasma reactor |
| US08/072,272 | 1994-03-29 | ||
| US08/219,208 | 1994-03-29 | ||
| US08/219,208 US5501740A (en) | 1993-06-04 | 1994-03-29 | Microwave plasma reactor |
| PCT/US1994/005619 WO1994029494A1 (en) | 1993-06-04 | 1994-05-19 | Microwave plasma reactor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09503611A true JPH09503611A (ja) | 1997-04-08 |
| JP3483147B2 JP3483147B2 (ja) | 2004-01-06 |
Family
ID=26753185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50180695A Expired - Fee Related JP3483147B2 (ja) | 1993-06-04 | 1994-05-19 | マイクロ波プラズマ反応器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5501740A (ja) |
| EP (1) | EP0737256B1 (ja) |
| JP (1) | JP3483147B2 (ja) |
| DE (1) | DE69426463T2 (ja) |
| WO (1) | WO1994029494A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002541672A (ja) * | 1999-04-12 | 2002-12-03 | マトリックス インテグレイテッド システムズ インコーポレイテッド | 遠隔式プラズマ発生装置 |
| JP2014510392A (ja) * | 2011-01-27 | 2014-04-24 | アプライド マテリアルズ インコーポレイテッド | ヒータを備え急速に温度変化する基板支持体 |
Families Citing this family (371)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0726593A1 (en) * | 1995-02-13 | 1996-08-14 | Applied Materials, Inc. | A high power, plasma-based, reactive species generator |
| US6132550A (en) * | 1995-08-11 | 2000-10-17 | Sumitomo Electric Industries, Ltd. | Apparatuses for desposition or etching |
| US5895548A (en) * | 1996-03-29 | 1999-04-20 | Applied Komatsu Technology, Inc. | High power microwave plasma applicator |
| US5788799A (en) * | 1996-06-11 | 1998-08-04 | Applied Materials, Inc. | Apparatus and method for cleaning of semiconductor process chamber surfaces |
| DE19802971C2 (de) | 1998-01-27 | 1999-12-02 | Fraunhofer Ges Forschung | Plasmareaktor |
| US6374831B1 (en) | 1999-02-04 | 2002-04-23 | Applied Materials, Inc. | Accelerated plasma clean |
| JP4057198B2 (ja) * | 1999-08-13 | 2008-03-05 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
| RU2225684C2 (ru) * | 2000-03-06 | 2004-03-10 | Аозт "Дигазкрон" | Свч-плазмохимический реактор |
| US20030047138A1 (en) * | 2001-09-11 | 2003-03-13 | Ceramoptec Industries, Inc. | Spiral gas flow plasma reactor |
| US6707017B2 (en) * | 2002-05-16 | 2004-03-16 | Rayth On Company | High-power microwave window |
| NL1025155C2 (nl) * | 2003-12-30 | 2005-07-04 | Draka Fibre Technology Bv | Inrichting voor het uitvoeren van PCVD, alsmede werkwijze voor het vervaardigen van een voorvorm. |
| JP2005235464A (ja) * | 2004-02-17 | 2005-09-02 | Toshio Goto | プラズマ発生装置 |
| RU2299929C2 (ru) * | 2005-08-11 | 2007-05-27 | ООО "Оптосистемы" | Свч плазменный реактор |
| JP2008305736A (ja) * | 2007-06-11 | 2008-12-18 | Tokyo Electron Ltd | プラズマ処理装置、プラズマ処理装置の使用方法およびプラズマ処理装置のクリーニング方法 |
| RU2361376C2 (ru) * | 2007-07-10 | 2009-07-10 | Ооо "Твинн" | Способ генерации объемной плазмы |
| US10378106B2 (en) | 2008-11-14 | 2019-08-13 | Asm Ip Holding B.V. | Method of forming insulation film by modified PEALD |
| US9394608B2 (en) | 2009-04-06 | 2016-07-19 | Asm America, Inc. | Semiconductor processing reactor and components thereof |
| US8802201B2 (en) | 2009-08-14 | 2014-08-12 | Asm America, Inc. | Systems and methods for thin-film deposition of metal oxides using excited nitrogen-oxygen species |
| GB201021855D0 (en) | 2010-12-23 | 2011-02-02 | Element Six Ltd | Microwave power delivery system for plasma reactors |
| GB201021860D0 (en) | 2010-12-23 | 2011-02-02 | Element Six Ltd | A microwave plasma reactor for diamond synthesis |
| GB201021865D0 (en) | 2010-12-23 | 2011-02-02 | Element Six Ltd | A microwave plasma reactor for manufacturing synthetic diamond material |
| GB201021913D0 (en) | 2010-12-23 | 2011-02-02 | Element Six Ltd | Microwave plasma reactors and substrates for synthetic diamond manufacture |
| JP5913362B2 (ja) | 2010-12-23 | 2016-04-27 | エレメント シックス リミテッド | 合成ダイヤモンド材料のドーピングの制御 |
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| JPH02277776A (ja) * | 1989-04-18 | 1990-11-14 | Matsushita Electric Ind Co Ltd | プラズマ処理装置 |
| US5061838A (en) * | 1989-06-23 | 1991-10-29 | Massachusetts Institute Of Technology | Toroidal electron cyclotron resonance reactor |
| SE465100B (sv) * | 1989-06-30 | 1991-07-22 | Inst Mikroelektronik Im | Foerfarande och anordning foer att i en kallvaeggsreaktor behandla en kiselskiva |
| US5078851A (en) * | 1989-07-26 | 1992-01-07 | Kouji Nishihata | Low-temperature plasma processor |
| US5131992A (en) * | 1990-01-08 | 1992-07-21 | The United States Of America, As Represented By The Secretary Of The Interior | Microwave induced plasma process for producing tungsten carbide |
| KR910016054A (ko) * | 1990-02-23 | 1991-09-30 | 미다 가쓰시게 | 마이크로 전자 장치용 표면 처리 장치 및 그 방법 |
| US5342472A (en) * | 1991-08-12 | 1994-08-30 | Tokyo Electron Limited | Plasma processing apparatus |
-
1994
- 1994-03-29 US US08/219,208 patent/US5501740A/en not_active Expired - Lifetime
- 1994-05-19 JP JP50180695A patent/JP3483147B2/ja not_active Expired - Fee Related
- 1994-05-19 DE DE69426463T patent/DE69426463T2/de not_active Expired - Lifetime
- 1994-05-19 WO PCT/US1994/005619 patent/WO1994029494A1/en not_active Ceased
- 1994-05-19 EP EP94919170A patent/EP0737256B1/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002541672A (ja) * | 1999-04-12 | 2002-12-03 | マトリックス インテグレイテッド システムズ インコーポレイテッド | 遠隔式プラズマ発生装置 |
| JP2014510392A (ja) * | 2011-01-27 | 2014-04-24 | アプライド マテリアルズ インコーポレイテッド | ヒータを備え急速に温度変化する基板支持体 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO1994029494A1 (en) | 1994-12-22 |
| EP0737256A4 (en) | 1996-12-27 |
| EP0737256A1 (en) | 1996-10-16 |
| DE69426463T2 (de) | 2001-07-19 |
| JP3483147B2 (ja) | 2004-01-06 |
| DE69426463D1 (de) | 2001-01-25 |
| EP0737256B1 (en) | 2000-12-20 |
| US5501740A (en) | 1996-03-26 |
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