JPH096018A - Cleaning method for photoconductor substrate - Google Patents
Cleaning method for photoconductor substrateInfo
- Publication number
- JPH096018A JPH096018A JP14868695A JP14868695A JPH096018A JP H096018 A JPH096018 A JP H096018A JP 14868695 A JP14868695 A JP 14868695A JP 14868695 A JP14868695 A JP 14868695A JP H096018 A JPH096018 A JP H096018A
- Authority
- JP
- Japan
- Prior art keywords
- cleaning
- substrate
- washing liquid
- substrates
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Photoreceptors In Electrophotography (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は、電子写真式の複写
機、プリンタ、ファクシミリ等に用いられる感光体にお
いて、感光層を支持する感光体用基体の洗浄法に関する
ものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of cleaning a substrate for a photosensitive member which supports a photosensitive layer in a photosensitive member used in electrophotographic copying machines, printers, facsimiles and the like.
【0002】[0002]
【従来の技術】上記のような感光体は、アルミニウム
(その合金を含む)管のような基体にOPC等の薄膜の
感光層が塗工されて形成されてなる。このような薄膜の
感光層を薄くかつ均一な厚さに塗工するためには、基体
として、素管に切削、引き抜き、しごき、研磨等の加工
を施して鏡面に仕上げたものを使用し、さらに基体表面
に付着した加工油、切り粉、粉塵等を十分に洗浄して除
去する必要がある。2. Description of the Related Art A photoreceptor as described above is formed by coating a thin photosensitive layer such as OPC on a substrate such as an aluminum (including its alloy) tube. In order to apply such a thin photosensitive layer to a thin and uniform thickness, as the substrate, use a tube that has been processed into a mirror surface by cutting, drawing, ironing, polishing, etc. Further, it is necessary to sufficiently wash and remove the processing oil, cutting chips, dust, etc. adhering to the surface of the substrate.
【0003】一方、基体の洗浄剤としては、従来フロン
等のハロゲン化炭化水素が多く使用されてきたが、地球
環境保護の立場から、オゾン層を破壊しない炭化水素
系、水系、準水系の洗浄剤が使用されることが多くなっ
ている。On the other hand, halogenated hydrocarbons such as chlorofluorocarbon have been often used as a cleaning agent for substrates, but from the standpoint of protecting the global environment, hydrocarbon-based, water-based and semi-water-based cleaning that does not destroy the ozone layer. Agents are increasingly used.
【0004】しかし、これらの洗浄剤は前述のハロゲン
化炭化水素に比べると洗浄力が弱いために、単に洗浄液
中に基体を浸漬するだけでなく、洗浄力を高めるべく、
キャビテーション効果を利用した超音波洗浄、ジェット
ノズルなどによる洗浄液の高圧噴射、ブラシやブレード
などによるコスリ洗浄などの種々の洗浄法が採用されて
いる。However, since these cleaning agents have weaker cleaning power than the above-mentioned halogenated hydrocarbons, in order to enhance the cleaning power in addition to simply immersing the substrate in the cleaning liquid,
Various cleaning methods such as ultrasonic cleaning utilizing the cavitation effect, high-pressure injection of cleaning liquid with a jet nozzle, and cosmetic cleaning with a brush or blade have been adopted.
【0005】[0005]
【発明が解決しようとする課題】しかしながら、前述の
各洗浄法は、いずれも感光体用基体に付着した残油や切
り粉の両者をムラなく確実に除去できるものではなかっ
た。その結果、加工油が残留していると感光層塗工時に
塗工液が撥じかれてムラになり、また切り粉や粉塵が残
留したまま感光体が形成されると一様帯電時に漏電の起
点となり、いずれも画像品質が低下するという問題点が
あった。However, none of the above-mentioned cleaning methods can reliably and uniformly remove both residual oil and cutting chips attached to the photoreceptor substrate. As a result, if the processing oil remains, the coating liquid is repelled during coating of the photosensitive layer and becomes uneven, and if the photoconductor is formed with cutting chips and dust remaining, the leakage of electric current will occur during uniform charging. This is a starting point, and in each case, there is a problem that the image quality is deteriorated.
【0006】この発明は、前記問題点を解消することを
目的としてなされたもので、脱脂と切り粉除去の両者に
有効で、清浄度の高い基体を確実に得られる感光体用基
体の洗浄法を提供しようとするものである。The present invention has been made for the purpose of solving the above problems, and is a method for cleaning a substrate for a photoreceptor, which is effective for both degreasing and chip removal and which can surely obtain a highly clean substrate. Is to provide.
【0007】[0007]
【課題を解決するための手段】この発明に係る感光体用
基体の洗浄法は、前記目的を達成するために、感光体用
基体(1)を洗浄液(4)に浸漬するとともに、該洗浄
液(4)への低周波振動の付与および超音波照射を、同
時あるいは逐次に行うことにより、前記感光体用基体
(1)を洗浄することを特徴とするものである。また、
前記洗浄法において、低周波振動の周波数は1〜100
Hzが好ましく、超音波の周波数は20〜500kHz
が好ましい。In order to achieve the above-mentioned object, a method for cleaning a photoconductor substrate according to the present invention comprises immersing the photoconductor substrate (1) in a cleaning solution (4) and at the same time, the cleaning solution ( By applying low frequency vibration and ultrasonic irradiation to 4) simultaneously or sequentially, the photoreceptor substrate (1) is washed. Also,
In the cleaning method, the frequency of low frequency vibration is 1 to 100.
Hz is preferable, and the frequency of ultrasonic waves is 20 to 500 kHz.
Is preferred.
【0008】この発明の洗浄法に適用できる感光体用基
体(1)とは、感光ドラム用アルミニウム管をはじめと
する各種基体であり、形状や材質は問わない。The photoconductor substrate (1) applicable to the cleaning method of the present invention includes various substrates such as an aluminum tube for a photoconductor drum, and its shape and material are not limited.
【0009】この発明の洗浄法において、低周波と超音
波という周波数の全く異なる2種類の振動を用いるの
は、脱脂と切り粉除去に有効な周波数が異なるためであ
る。In the cleaning method of the present invention, two types of vibrations having different frequencies, low frequency and ultrasonic wave, are used because the frequencies effective for degreasing and chip removal are different.
【0010】即ち、低周波は、超音波のような強い指向
性をもたず広い角度に拡がりながら伝播するため、振動
は振動源から洗浄液(4)全体に拡がって三次元的な乱
流を起こして洗浄液(4)全体を攪拌する。そのため、
基体(1)表面と接触する洗浄液は絶えず入れ替わっ
て、基体(1)表面から離脱した油分による部分的な油
分の高濃度状態を速やかに解消することにより、高い脱
脂力を発揮する。また、洗浄液(4)の攪拌効果によ
り、基体(1)と振動源とを相対的に移動させる必要が
なく、また縦横に多重配置した複数の基体(1)をもム
ラなく洗浄することができる。前記低周波振動の周波数
は、1Hz未満では洗浄力に乏しく、また100Hzを
超えても洗浄力が飽和して洗浄効率が悪くなるため、1
〜100Hzの範囲で設定することが好ましい。特に好
ましい低周波振動の周波数は10〜60Hzである。That is, since the low frequency propagates while spreading over a wide angle without having strong directivity like ultrasonic waves, the vibration spreads from the vibration source to the entire cleaning liquid (4) and produces a three-dimensional turbulent flow. Raise and stir the entire washing liquid (4). for that reason,
The cleaning liquid that comes into contact with the surface of the substrate (1) is constantly replaced, and a high degreasing power is exerted by promptly eliminating the partial high-concentration state of the oil component due to the oil component separated from the surface of the substrate (1). Further, due to the stirring effect of the cleaning liquid (4), it is not necessary to move the substrate (1) and the vibration source relative to each other, and the plurality of substrates (1) vertically and horizontally arranged can be uniformly washed. . If the frequency of the low-frequency vibration is less than 1 Hz, the cleaning power is poor, and if it exceeds 100 Hz, the cleaning power is saturated and the cleaning efficiency deteriorates.
It is preferable to set in the range of -100 Hz. A particularly preferable frequency of low-frequency vibration is 10 to 60 Hz.
【0011】また、超音波は、キャビテーション効果に
より、主として基体(1)表面に付着した切り粉や粉塵
をたたき落とすようにしてこれらを除去するのに効果が
ある。このような超音波の周波数は、20kHz未満で
は、洗浄力に乏しく、また500kHzを超えるとキャ
ビテーション効果が強すぎて基体(1)表面に損傷を与
えるため、20〜500kHzの範囲で設定することが
好ましい。特に好ましい超音波の周波数は25〜100
kHzである。The ultrasonic waves are effective in removing the cutting chips and dust adhering to the surface of the substrate (1) mainly by knocking them off due to the cavitation effect. If the frequency of such an ultrasonic wave is less than 20 kHz, the cleaning power is poor, and if it exceeds 500 kHz, the cavitation effect is too strong to damage the surface of the substrate (1), so that it should be set in the range of 20 to 500 kHz. preferable. Particularly preferable ultrasonic frequency is 25 to 100.
kHz.
【0012】上述した洗浄液(4)に対する低周波振動
の付与および超音波照射は、同時に行っても良く、また
これらを同一槽あるいは別の槽で逐次的に行っても良
い。どちらを採用しても総合的な洗浄力に差はないが、
同時に行う方が洗浄時間を短縮できる利点がある。ま
た、逐次的に行う場合にどちらを先に行っても良いが、
超音波照射を先に行って切り粉や粉塵を予め除去した方
が、低周波振動洗浄液の汚染を少なくし、汚染物の再付
着を少なくできるため、超音波照射を行ったのちに低周
波振動を行うことが好ましい。The above-mentioned application of low-frequency vibration and ultrasonic irradiation to the cleaning liquid (4) may be carried out simultaneously, or these may be carried out sequentially in the same tank or different tanks. Whichever is adopted, there is no difference in overall cleaning power,
Performing them at the same time has an advantage that the cleaning time can be reduced. Also, when performing sequentially, either may be performed first,
It is possible to reduce the contamination of the low-frequency vibration cleaning liquid and the reattachment of contaminants by performing the ultrasonic irradiation first to remove the cutting chips and dust in advance. Is preferably performed.
【0013】この発明の洗浄法を実施するに際しては、
低周波振動の付与方式および超音波の照射方式は限定さ
れるものではなく、各種洗浄装置を適宜組み合わせて使
用すれば良い。例えば、低周波振動を付与する装置とし
て、図1に示す振動攪拌機(5)を使用する方法を例示
できる。この振動攪拌機(5)は、モータ(6)で発生
させた振動を支柱(7)を介して洗浄液(4)に浸漬さ
せた振動羽根(8)に伝えることにより洗浄液(4)を
振動攪拌するものである。なお、この振動攪拌機(5)
では、洗浄液(4)全体の均一攪拌をより確実なものと
するために、振動源である振動羽根(8)が深さ方向に
複数個連結されている。また、超音波照射方式として
は、図2(a)に示す投げ込み型、(b)の接着型、
(c)の振動伝達子型等を例示できる。なお、図2
(a)(b)(c)において、(10)は洗浄槽、(2
0)は被洗浄物、(30)は振動子、(40)は振動伝
達子、(50)は洗浄液である。In carrying out the cleaning method of the present invention,
The method of applying low-frequency vibration and the method of irradiating ultrasonic waves are not limited, and various cleaning devices may be appropriately combined and used. For example, a method of using the vibration stirrer (5) shown in FIG. 1 as an apparatus for imparting low frequency vibration can be exemplified. The vibration stirrer (5) vibrates and stirs the cleaning liquid (4) by transmitting the vibration generated by the motor (6) to the vibrating blade (8) immersed in the cleaning liquid (4) through the support (7). It is a thing. In addition, this vibration stirrer (5)
In order to ensure the uniform stirring of the entire cleaning liquid (4), a plurality of vibrating blades (8), which are vibration sources, are connected in the depth direction. In addition, as the ultrasonic wave irradiation method, the throwing type shown in FIG. 2A, the adhesive type shown in FIG.
The vibration transmitter type of (c) can be exemplified. Note that FIG.
In (a), (b) and (c), (10) is a cleaning tank, and (2)
0) is the object to be cleaned, (30) is a vibrator, (40) is a vibration transmitter, and (50) is a cleaning liquid.
【0014】なお、この洗浄法で使用する洗浄剤の種類
は特に限定されず、ハロゲン化炭化水素よりも洗浄力の
弱い炭化水素系、水系、準水系の洗浄剤を使用しても良
好な洗浄効果を得ることができる。The type of cleaning agent used in this cleaning method is not particularly limited, and good cleaning is possible even if a hydrocarbon-based, water-based or semi-water-based cleaning agent having a weaker cleaning power than halogenated hydrocarbons is used. The effect can be obtained.
【0015】[0015]
【作用】この発明の洗浄法では、低周波振動が洗浄液
(4)全体を攪拌するため、基体(1)表面と接触する
洗浄液は絶えず入れ替わる。そのため、感光体用基体
(1)表面から離脱した油分による部分的な油分の高濃
度状態は速やかに解消され、主として脱脂に効果があ
る。一方、超音波照射は、キャビテーション効果により
基体(1)表面の付着物をたたき落とすのに有効である
ため、主として切り粉や粉塵を除去する効果がある。従
って、異なる周波数の振動を組み合わせることにより、
残油および切り粉や粉塵の両方を総合的に洗浄除去する
ことができる。In the cleaning method of the present invention, the low-frequency vibration agitates the entire cleaning liquid (4), so that the cleaning liquid contacting the surface of the substrate (1) is constantly replaced. Therefore, the partial high-concentration state of the oil component due to the oil component released from the surface of the photoconductor substrate (1) is promptly eliminated, which is mainly effective for degreasing. On the other hand, the ultrasonic irradiation is effective in knocking off the deposits on the surface of the substrate (1) due to the cavitation effect, and is therefore effective mainly in removing cutting chips and dust. Therefore, by combining vibrations of different frequencies,
Both residual oil and cutting chips and dust can be comprehensively washed and removed.
【0016】また、前記洗浄法において、低周波振動の
周波数が1〜100Hzであるとき、また超音波の周波
数が20〜500kHzであるときに、それぞれ最も高
い洗浄効果が獲られる。In the cleaning method, the highest cleaning effect is obtained when the frequency of the low frequency vibration is 1 to 100 Hz and when the frequency of the ultrasonic wave is 20 to 500 kHz.
【0017】[0017]
【実施例】次に、この発明の感光体用基体の洗浄法の具
体的実施例について説明する。EXAMPLES Next, specific examples of the method for cleaning a substrate for a photoreceptor of the present invention will be described.
【0018】供試体には、感光ドラム用基体として用い
られる円筒管で、JISA3003アルミニウム合金か
らなる外径30mm×内径28.5mm×長さ254mmの無
切削管(ED管)を用いた。この基体は、押出素管を引
き抜いて形成した長尺管を前記長さに切断したものであ
って、基体表面には加工油および切り粉が多数付着して
いる。As the test piece, there was used a non-cutting tube (ED tube) which is a cylindrical tube used as a substrate for a photosensitive drum and which is made of JISA3003 aluminum alloy and has an outer diameter of 30 mm × an inner diameter of 28.5 mm × a length of 254 mm. This substrate is obtained by cutting a long tube formed by pulling out an extruded raw tube to the above length, and a large amount of processing oil and cutting chips are attached to the surface of the substrate.
【0019】洗浄は、トリクロロエタンまたは水系界面
活性剤のいずれかの洗浄液を用いて、後述の方法により
行った。また、いずれの方法においても、図1に示すよ
うに、感光ドラム用基体(1)は複数個を網状の台
(2)上に立設した支持棒(図示せず)に中空部を挿通
せしめて縦横複数列に立設状態に多重配置し、この状態
で洗浄液(4)中に浸漬するとともに、洗浄槽(3)へ
の出し入れを行った。The washing was carried out by the method described below using a washing liquid of either trichloroethane or an aqueous surfactant. Further, in any of the methods, as shown in FIG. 1, a plurality of photosensitive drum substrates (1) are inserted into a hollow portion through a supporting rod (not shown) which is erected on a mesh base (2). Multiple vertical and horizontal rows were vertically arranged, and in this state they were immersed in the cleaning liquid (4) and put into and out of the cleaning tank (3).
【0020】[トリクロロエタン洗浄(実施例1〜3、
比較例1、3〜5、9〜11)]2段階の浸漬洗浄とそ
の後の蒸気洗浄との合計3段階で洗浄を行った。[Trichloroethane cleaning (Examples 1 to 3,
Comparative Examples 1, 3 to 5 and 9 to 11)] The cleaning was carried out in a total of 3 steps of two steps of immersion cleaning and subsequent steam cleaning.
【0021】第1段階では、感光ドラム用基体(1)を
40℃の温浴中に60秒間浸漬した。In the first stage, the photosensitive drum substrate (1) was immersed in a warm bath at 40 ° C. for 60 seconds.
【0022】第2段階では、図1に示すように、室温
(25℃)の洗浄液(4)中に浸漬するとともに、浸漬
のみ、あるいは洗浄槽(3)内に配置した振動攪拌機
(5)および超音波発振子(9)により、表1に示す周
波数の低周波振動または超音波照射、またはその両方に
より、60秒間洗浄した。前記振動攪拌機(5)は、振
動モータ(6)で発生させた振動を、2本の支柱(7)
を介して、洗浄槽(3)の深さ方向に連結した5枚の振
動羽根(8)に伝え、洗浄液(4)に三次元的な乱流を
発生させることにより洗浄液(4)を攪拌するものであ
り、洗浄槽(3)の側面近くに配置した。また、前記超
音波発振子(9)は投げ込み型のものを使用し、これを
洗浄槽(3)底面に配置し、その真上に複数の感光ドラ
ム用基体(1)を浸漬した。In the second stage, as shown in FIG. 1, the liquid is immersed in the cleaning liquid (4) at room temperature (25 ° C.), and only the immersion or the vibration stirrer (5) arranged in the cleaning tank (3) and The ultrasonic oscillator (9) was used for cleaning for 60 seconds by low-frequency vibration having a frequency shown in Table 1 and / or ultrasonic irradiation. The vibrating stirrer (5) uses the vibration generated by the vibrating motor (6) to form two columns (7).
Through the vibrating blades (8) connected in the depth direction of the cleaning tank (3) to generate a three-dimensional turbulent flow in the cleaning liquid (4), thereby stirring the cleaning liquid (4). It was placed near the side of the washing tank (3). The ultrasonic oscillator (9) used was a throw-in type, which was placed on the bottom of the cleaning tank (3), and a plurality of photosensitive drum substrates (1) were immersed right above it.
【0023】第3段階では、60秒間トリクロロエタン
による蒸気洗浄を行うとともに、感光ドラム用基体
(1)を乾燥させた。In the third step, steam cleaning with trichloroethane was carried out for 60 seconds, and the photosensitive drum substrate (1) was dried.
【0024】[水系洗浄(実施例4〜8、比較例2、比
較例6〜8、12〜14)]旭化成(株)製の界面活性
剤「エリーズK−1000」の3%水溶液を洗浄液と
し、2段階の浸漬洗浄とその後の水洗の3段階で洗浄し
た。[Water-based cleaning (Examples 4 to 8, Comparative Example 2, Comparative Examples 6 to 8 and 12 to 14)] A 3% aqueous solution of the surfactant "Ellies K-1000" manufactured by Asahi Kasei Co., Ltd. was used as a cleaning liquid. The washing was performed in three stages of two-stage immersion washing and subsequent water washing.
【0025】第1段階では、感光ドラム用基体(1)を
50℃の温浴中に60秒間浸漬するとともに、表1に示
す条件で、浸漬のみ、低周波振動または超音波照射、あ
るいはその両方により、60秒間洗浄した。また、実施
例7、8では、低周波振動の付与と超音波照射とを各6
0秒間逐次的に行った。なお、洗浄装置については、上
述のトリクロロエタン洗浄に用いたものと同じであるか
ら、説明は省略する。In the first step, the photosensitive drum substrate (1) was immersed in a warm bath at 50 ° C. for 60 seconds and, under the conditions shown in Table 1, immersion only, low-frequency vibration or ultrasonic irradiation, or both. It was washed for 60 seconds. In addition, in Examples 7 and 8, the application of low-frequency vibration and the irradiation of ultrasonic waves were each performed 6 times.
Sequentially for 0 seconds. The cleaning device is the same as that used for the above-mentioned trichloroethane cleaning, and therefore its explanation is omitted.
【0026】第2段階では、第1段階に引き続いて同じ
50℃の温浴中に60秒間浸漬した。In the second stage, following the first stage, it was immersed in the same 50 ° C. hot bath for 60 seconds.
【0027】第3段階では、イオン交換水で30秒間シ
ャワー水洗して洗浄液を除去した。In the third step, the washing liquid was removed by showering with ion-exchanged water for 30 seconds.
【0028】次いで、上述の方法で洗浄した感光ドラム
用基体(1)を水切りした後、熱風で乾燥させた。Next, the photosensitive drum substrate (1) washed by the above method was drained and then dried with hot air.
【0029】このようにしてトリクロロエタンおよび水
系洗浄を行った各感光ドラム用基体について、脱脂率お
よび切り粉の除去状態について評価した。脱脂率は、基
体を墨汁水溶液中に浸漬して引き上げた際の濡れ面積率
により評価した。また、切り粉の除去状態は、残留切り
粉量を目視観察して評価した。表1にこれらの評価結果
を示す。The degreasing rate and the removal state of the cutting chips were evaluated for each of the photosensitive drum substrates thus washed with trichloroethane and water. The degreasing rate was evaluated by the wetted area rate when the substrate was dipped in an aqueous solution of India ink and pulled up. The state of removal of cutting chips was evaluated by visually observing the amount of residual cutting chips. Table 1 shows these evaluation results.
【0030】[0030]
【表1】 [Table 1]
【0031】表1の結果から明らかなように、この発明
の方法によれば、低周波振動による攪拌と超音波照射を
同時または逐次に行うことにより、脱脂および切り粉除
去の両方に効果があることを確認できた。As is clear from the results shown in Table 1, according to the method of the present invention, stirring by low frequency vibration and ultrasonic irradiation are performed simultaneously or sequentially, which is effective in both degreasing and chip removal. I was able to confirm that.
【0032】[0032]
【発明の効果】以上説明したように、この発明に係る感
光体用基体の洗浄方法は、感光体用基体を洗浄液に浸漬
するとともに、該洗浄液への低周波振動の付与および超
音波照射を、同時あるいは逐次に行うことにより、前記
感光体用基体を洗浄するものであるから、低周波振動に
よる脱脂と超音波照射による切り粉や粉塵の除去が組み
合わさって、高い洗浄力が得られる。その結果、比較的
洗浄力の弱い洗浄剤を使用しても清浄度の高い感光ドラ
ム用基体が得られ、ひいては基体表面に薄く均一な感光
体層の形成が可能となり、画像品質の向上を図ることが
できる。As described above, the method for cleaning a substrate for a photoconductor according to the present invention comprises immersing the substrate for a photoconductor in a cleaning solution, applying low-frequency vibration to the cleaning solution, and irradiating ultrasonic waves to the cleaning solution. Since the substrate for the photoconductor is cleaned by performing it simultaneously or sequentially, the degreasing by low frequency vibration and the removal of cutting chips and dust by ultrasonic irradiation are combined to obtain a high cleaning power. As a result, a photosensitive drum substrate having a high degree of cleanliness can be obtained even when a cleaning agent having a relatively weak cleaning power is used, and a thin and uniform photosensitive layer can be formed on the substrate surface, thereby improving the image quality. be able to.
【0033】また、前記洗浄法において、低周波振動の
周波数を1〜100Hzにした場合や、超音波の周波数
を20〜500kHzに設定した場合は、特に高い洗浄
効果を得ることができる。In the cleaning method, particularly high cleaning effect can be obtained when the low frequency vibration frequency is set to 1 to 100 Hz or the ultrasonic frequency is set to 20 to 500 kHz.
【図1】この発明に係る感光体用基体の洗浄法の一実施
例を示す斜視図である。FIG. 1 is a perspective view showing an embodiment of a cleaning method for a photoreceptor substrate according to the present invention.
【図2】(a)は超音波の照射方式の一例を示す断面
図、(b)は他の例を示す断面図、(c)はさらに他の
例を示す一部切り欠き斜視図である。2A is a sectional view showing an example of an ultrasonic wave irradiation method, FIG. 2B is a sectional view showing another example, and FIG. 2C is a partially cutaway perspective view showing another example. .
1…感光体用基体(感光ドラム用基体) 4…洗浄液 1 ... Substrate for photoconductor (photosensitive drum substrate) 4 ... Cleaning liquid
Claims (3)
漬するとともに、該洗浄液(4)への低周波振動の付与
および超音波照射を、同時あるいは逐次に行うことによ
り、前記感光体用基体(1)を洗浄することを特徴とす
る感光体用基体の洗浄法。1. A photosensitive body (1) is immersed in a cleaning liquid (4), and low-frequency vibration is applied to the cleaning liquid (4) and ultrasonic wave irradiation is performed simultaneously or sequentially to obtain the photosensitive material. A method for cleaning a photoconductor substrate, which comprises cleaning the body substrate (1).
zに設定して洗浄を行う請求項1に記載の感光体用基体
の洗浄法。2. The frequency of the low frequency vibration is 1 to 100H.
The method for cleaning a photoreceptor substrate according to claim 1, wherein cleaning is performed by setting z.
zに設定して洗浄を行う請求項1または2に記載の感光
体用基体の洗浄法。3. The frequency of the ultrasonic wave is 20 to 500 kHz.
The cleaning method for a photoreceptor substrate according to claim 1, wherein cleaning is performed by setting z.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14868695A JP3549285B2 (en) | 1995-06-15 | 1995-06-15 | Substrate cleaning method and cleaning apparatus, high-clean substrate manufacturing method and high-clean substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14868695A JP3549285B2 (en) | 1995-06-15 | 1995-06-15 | Substrate cleaning method and cleaning apparatus, high-clean substrate manufacturing method and high-clean substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH096018A true JPH096018A (en) | 1997-01-10 |
| JP3549285B2 JP3549285B2 (en) | 2004-08-04 |
Family
ID=15458340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14868695A Expired - Lifetime JP3549285B2 (en) | 1995-06-15 | 1995-06-15 | Substrate cleaning method and cleaning apparatus, high-clean substrate manufacturing method and high-clean substrate |
Country Status (1)
| Country | Link |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09206713A (en) * | 1996-02-07 | 1997-08-12 | Furontetsuku:Kk | Washing method and washing device |
| CN104624555A (en) * | 2015-02-14 | 2015-05-20 | 合肥誉联信息科技有限公司 | Automatic cleaning device for flange disk type spare part |
-
1995
- 1995-06-15 JP JP14868695A patent/JP3549285B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09206713A (en) * | 1996-02-07 | 1997-08-12 | Furontetsuku:Kk | Washing method and washing device |
| CN104624555A (en) * | 2015-02-14 | 2015-05-20 | 合肥誉联信息科技有限公司 | Automatic cleaning device for flange disk type spare part |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3549285B2 (en) | 2004-08-04 |
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