JPH0984351A - Power converter - Google Patents
Power converterInfo
- Publication number
- JPH0984351A JPH0984351A JP7236336A JP23633695A JPH0984351A JP H0984351 A JPH0984351 A JP H0984351A JP 7236336 A JP7236336 A JP 7236336A JP 23633695 A JP23633695 A JP 23633695A JP H0984351 A JPH0984351 A JP H0984351A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- parallel
- faulty
- conversion device
- parallels
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Emergency Protection Circuit Devices (AREA)
- Supply And Distribution Of Alternating Current (AREA)
- Rectifiers (AREA)
Abstract
(57)【要約】
【課題】 アームが複数個の並列接続された半導体素子
から成る電力変換装置において、半導体素子の故障並列
数に応じた運転を可能とし運転を停止させない。
【解決手段】 前記半導体素子の故障並列数を判別する
素子故障判別回路6と、該素子故障判別回路6に応答し
前記半導体素子の故障並列数に応じて前記電力変換装置
の電流基準値を下げる電流基準変更回路13と、前記素
子故障判別回路6に応答し前記電力変換装置を過電流か
ら保護する過電流保護回路の保護レベルを前記半導体素
子の故障並列数に応じて下げる過電流レベル変更回路1
1ー3を具備し、前記半導体素子の故障並列数に応じて
前記電力変換装置の出力電流を低下させると共に過電流
保護レベルも低下させることを特徴とした電力変換装
置。
(57) Abstract: In a power conversion device in which an arm is composed of a plurality of semiconductor elements connected in parallel, the operation can be performed according to the number of faulty parallel semiconductor elements and the operation is not stopped. SOLUTION: An element failure determination circuit 6 for determining the number of failure parallels of the semiconductor element, and a current reference value of the power converter is lowered in response to the element failure determination circuit 6 according to the number of failure parallels of the semiconductor element. An overcurrent level changing circuit that responds to the current reference changing circuit 13 and the element failure determination circuit 6 and lowers the protection level of the overcurrent protection circuit that protects the power converter from an overcurrent according to the number of faulty parallel semiconductor devices. 1
A power conversion device comprising 1-3, which lowers an output current of the power conversion device and also lowers an overcurrent protection level in accordance with the number of faulty parallels of the semiconductor element.
Description
【0001】[0001]
【発明の属する技術分野】本発明は、電力変換装置を構
成する各アームが少くとも複数個の並列接続された半導
体素子から成り例えば、交流を直流に変換する直流アー
ク炉及び電気分解等に用いられる電源設備用の大電流の
電力変換装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is composed of at least a plurality of semiconductor elements connected in parallel in each arm constituting an electric power converter, and is used, for example, in a DC arc furnace for converting AC into DC and electrolysis. The present invention relates to a large-current power conversion device for power supply equipment.
【0002】[0002]
【従来の技術】図4は、電力変換装置としてサイリスタ
整流装置を例にして示した従来例を示す構成図である。
図4において、1は交流母線、2は電源設備を遮断する
遮断器、3はサイリスタ整流装置(以下、単に整流器と
記す)用の変圧器、4は変圧器の交流を直流に変換する
整流器で、ブリッジ接続された各アームは複数個の並列
接続されたサイリスタ(以下、半導体素子と記す)で構
成されている。5は整流器4の直流回路に接続されてい
る負荷、6は半導体素子の故障並列数を判別する素子故
障判別回路、7は整流器4の出力電流値を設定する電流
基準設定器、8は整流器4の出力電流を検出する電流検
出器、9は電流基準設定器7で設定した電流基準信号I
Ref と、電流検出器8で検出した電流帰還信号IF.B.が
印加され、整流器4の出力電流を一定に保つ制御を行う
定電流制御回路、10は定電流制御回路9の制御信号に
より整流器4の半導体素子のゲートを制御するゲート制
御回路、11は過電流の保護レベルを設定する過電流保
護レベル設定器11ー1と、電流検出器8で検出した整
流器4の出力電流IF.B.とレベル設定器11ー1で設定
した値とを比較し、過電流検出信号を出力する比較演算
器11ー2から成る過電流保護回路、12は素子故障判
別回路6にて検出された故障信号と過電流保護回路11
にて検出した過電流信号により保護連動を行う保護回路
であり、重故障の場合遮断器2を遮断し、システムを保
護している。2. Description of the Related Art FIG. 4 is a block diagram showing a conventional example in which a thyristor rectifier is used as an example of a power converter.
In FIG. 4, 1 is an AC bus, 2 is a circuit breaker for shutting off power supply equipment, 3 is a transformer for a thyristor rectifier (hereinafter, simply referred to as rectifier), and 4 is a rectifier for converting AC of the transformer into DC. Each bridge-connected arm is composed of a plurality of parallel-connected thyristors (hereinafter referred to as semiconductor elements). Reference numeral 5 is a load connected to the DC circuit of the rectifier 4, 6 is an element failure determination circuit for determining the number of faulty parallel semiconductor elements, 7 is a current reference setting apparatus for setting the output current value of the rectifier 4, and 8 is the rectifier 4 Of the current reference signal I set by the current reference setting unit 7
Ref and the current feedback signal IF.B. detected by the current detector 8 are applied, and the constant current control circuit 10 performs control for keeping the output current of the rectifier 4 constant. 4 is a gate control circuit for controlling the gate of the semiconductor device, 11 is an overcurrent protection level setter 11-1 for setting the overcurrent protection level, and the output current IF.B. of the rectifier 4 detected by the current detector 8. Is compared with the value set by the level setter 11-1 and outputs an overcurrent detection signal, which is an overcurrent protection circuit composed of a comparison calculator 11-2, and 12 is a failure signal detected by the element failure determination circuit 6. And overcurrent protection circuit 11
This is a protection circuit that performs protection interlocking by the overcurrent signal detected in 1. In case of a serious failure, the circuit breaker 2 is cut off to protect the system.
【0003】[0003]
【発明が解決しようとする課題】素子故障が発生すると
整流器4の故障アームの並列数が減少しているので、素
子故障の発生しているアームの健全な半導体素子の電流
分担値が大きくなる。従って、健全素子だけでは整流器
4の定格出力を出力するのは困難である為1並列数の素
子故障時でも定格出力が継続できるように冗長(通常1
個の冗長数)を持たせることが必要であった。When an element failure occurs, the number of parallel failed arms of the rectifier 4 decreases, so that the current sharing value of a healthy semiconductor element of the arm in which the element failure occurs increases. Therefore, since it is difficult to output the rated output of the rectifier 4 only with sound elements, there is a redundancy (usually 1
It was necessary to have a redundant number of pieces).
【0004】又、2並列数の素子故障時は定格出力が継
続出来ない為、重故障扱いとし、システム停止する必要
があった。本発明の目的は、冗長数無しとし、1並列数
素子故障、2並列数素子故障、3並列数素子故障の様に
半導体素子の故障が発生した場合でも、半導体素子の故
障並列数に応じて、整流器4の出力電流を低下させて運
転を継続でき、又、冗長数が有る場合でも、冗長数まで
は半導体素子の故障が発生しても出力電流を低下させず
運転を継続し、冗長数を越えた半導体素子の故障が発生
した場合、半導体素子の故障並列数に応じて整流器4の
出力電流を低下させて運転を継続できる電力変換装置を
提供することにある。Further, since the rated output cannot be continued when the number of elements in two parallels fails, it is necessary to treat it as a serious failure and stop the system. An object of the present invention is to provide no redundant number, and even if a semiconductor element failure such as 1 parallel number element failure, 2 parallel number element failure, or 3 parallel number element failure occurs, depending on the number of semiconductor element failure parallels. , The operation can be continued by reducing the output current of the rectifier 4, and even if there is a redundant number, the output current is not reduced and the operation is continued up to the redundant number even if a semiconductor element failure occurs. It is an object of the present invention to provide a power conversion device capable of continuing the operation by decreasing the output current of the rectifier 4 in accordance with the number of faulty parallel semiconductor devices when the fault of the semiconductor devices exceeds the above.
【0005】[0005]
【課題を解決するための手段】前記目的を達成するため
に、請求項1に対応する発明は、各アームが少くとも複
数個の並列接続された半導体素子から成る電力変換装置
において、前記半導体素子の故障並列数を判別する素子
故障判別回路と、該素子故障判別回路に応答し前記半導
体素子の故障並列数に応じて前記電力変換装置の電流基
準値を下げる電流基準変更回路と、前記素子故障判別回
路に応答し前記電力変換装置を過電流から保護する過電
流保護回路の保護レベルを前記半導体素子の故障並列数
に応じて下げる過電流レベル変更回路を具備し、前記半
導体素子の故障並列数に応じて前記電力変換装置の出力
電流を低下させると共に過電流保護レベルも低下させる
ことを特徴としたものである。In order to achieve the above object, the invention according to claim 1 provides a power conversion device in which each arm comprises at least a plurality of semiconductor elements connected in parallel. An element failure determination circuit for determining the number of failure parallels, a current reference changing circuit that responds to the element failure determination circuit and decreases the current reference value of the power conversion device according to the number of failure parallels of the semiconductor element, and the element failure A faulty parallel number of the semiconductor element, which is provided with an overcurrent level changing circuit which responds to the discrimination circuit and lowers a protection level of the overcurrent protection circuit for protecting the power converter from an overcurrent according to the faulty parallel number of the semiconductor element. According to the above, the output current of the power conversion device is reduced and the overcurrent protection level is also reduced.
【0006】又、請求項2に対応する発明は、各アーム
が少くとも複数個の並列接続された半導体素子から成る
電力変換装置において、前記半導体素子の故障並列数を
判別する素子故障判別回路と、該素子故障判別回路に応
答し前記半導体素子の故障並列数に応じて前記電力変換
装置の出力電流の検出値を上げる電流検出値変更回路を
具備し、該電流検出値変更回路の出力を前記電力変換装
置の出力電流を制御する定電流制御回路へ電流帰還信号
として与えると共に、前記電力変換装置を過電流から保
護する過電流保護回路にも与え、前記半導体素子の故障
並列数に応じて前記電力変換装置の出力電流を低下させ
ると共に過電流保護レベルも低下させることを特徴とし
ている。According to a second aspect of the present invention, in an electric power conversion device in which each arm is composed of at least a plurality of semiconductor elements connected in parallel, an element failure determination circuit for determining the number of failure parallel connections of the semiconductor elements. A current detection value changing circuit for increasing the detection value of the output current of the power conversion device according to the number of faulty parallels of the semiconductor element in response to the element failure determining circuit, and outputting the output of the current detection value changing circuit. It is given as a current feedback signal to a constant current control circuit that controls the output current of the power conversion device, and is also given to an overcurrent protection circuit that protects the power conversion device from overcurrent. It is characterized in that the output current of the power conversion device is reduced and the overcurrent protection level is also reduced.
【0007】更に、請求項3に対応する発明は、各ア―
ムが少くとも複数個の並列接続された半導体素子から成
る電力変換装置において、前記半導体素子の故障並列数
を判別する素子故障判別回路と、該素子故障判別回路に
応答し前記半導体素子の故障並列数に応じて前記電力変
換装置の出力電流の検出値を上げる電流検出値変更回路
と、前記素子故障判別回路に応答し前記電力変換装置を
過電流から保護する過電流保護回路の保護レベルを前記
半導体素子の故障並列数に応じて下げる過電流レベル変
更回路を具備し、前記電流検出値変更回路の出力を前記
電力変換装置の出力電流を制御する定電流制御回路へ電
流帰還信号として与え、前記半導体素子の故障並列数に
応じて前記電力変換装置の出力電流を低下させると共に
過電流保護レベルも低下させることを特徴としたもので
ある。Further, the invention according to claim 3 is the
In a power converter comprising at least a plurality of semiconductor elements connected in parallel, an element failure determination circuit for determining the number of failure parallels of the semiconductor element, and a failure parallel of the semiconductor element in response to the element failure determination circuit. The current detection value changing circuit for increasing the detection value of the output current of the power conversion device according to the number, and the protection level of the overcurrent protection circuit for protecting the power conversion device from overcurrent in response to the element failure determination circuit. The semiconductor device includes an overcurrent level changing circuit that lowers according to the number of faulty parallel semiconductor devices, and outputs the output of the current detection value changing circuit as a current feedback signal to a constant current control circuit that controls the output current of the power conversion device. It is characterized in that the output current of the power conversion device is reduced and the overcurrent protection level is also reduced according to the number of faulty parallel semiconductor devices.
【0008】更に又、請求項4に対応する発明は、請求
項1乃至請求項3のいずれかに対応する発明において、
素子故障判別回路が、半導体素子の故障並列数の限界を
判別した際には前記電力変換装置の運転を停止すること
を特徴としている。Furthermore, the invention corresponding to claim 4 is the invention corresponding to any one of claims 1 to 3,
The element failure determination circuit is characterized in that the operation of the power conversion device is stopped when the limit of the number of failure parallel connections of the semiconductor elements is determined.
【0009】[0009]
【発明の実施の形態】以下、図4と同一部に同一符号を
付して示す図1乃至図3を参照して本発明を説明する。
尚、図1乃至図3において、図4と同一符号のものは、
同一機能持ったものであるから、その説明は省略する。BEST MODE FOR CARRYING OUT THE INVENTION The present invention will be described below with reference to FIGS. 1 to 3 in which the same parts as those in FIG.
In addition, in FIGS. 1 to 3, the same reference numerals as those in FIG.
Since they have the same function, their explanation is omitted.
【0010】図1は請求項1に対応する発明の一実施例
を示す構成図である。図1におい、13は素子故障判別
回路6により検出した半導体素子の故障並列数に応じて
電流基準設定器7で設定した電流基準値IRef に、
[(並列数−故障並列数)/並列数]=(健全並列数/
並列数)を乗じ、Iset とし、半導体素子の健全並列数
で流せる電流値に電流基準値を下げる電流基準変更回路
である。11は、過電流保護レベルを素子故障判別回路
6からの故障並列数に応じて下げる過電流レベル変更回
路11ー4と、変更された過電流保護レベルと電流検出
器8で検出された整流器4の出力電流IF.B.を比較演算
し過電流信号を出力する比較演算器11ー2から成る過
電流保護回路である。FIG. 1 is a block diagram showing an embodiment of the invention corresponding to claim 1. In FIG. In FIG. 1, 13 is a current reference value IRef set by the current reference setting unit 7 according to the number of semiconductor device failure parallels detected by the device failure determination circuit 6,
[(Number of parallels-Number of fault parallels) / Number of parallels] = (Number of healthy parallels /
It is a current reference changing circuit that lowers the current reference value to the current value that can be passed by the healthy parallel number of semiconductor elements by multiplying by Iset. Reference numeral 11 denotes an overcurrent level changing circuit 11-4 that lowers the overcurrent protection level according to the number of fault parallels from the element failure determination circuit 6, and the changed overcurrent protection level and the rectifier 4 detected by the current detector 8. Is an overcurrent protection circuit including a comparison calculator 11-2 for comparing and calculating the output current IF.B.
【0011】ここで、並列数が10P(並列数10個)
のアームで構成された整流器4が電流基準設定器7でI
Ref =1PU(100%)に設定して運転している時
に、例えば、1P(並列数1個)の故障が発生すると電
流基準変更回路13の出力は、Iset =IRef ×(9/
10)=(9/10)IRef となり、定電流制御回路9
により整流器4の出力電流IF.B.は90%に低下する。Here, the parallel number is 10P (the parallel number is 10).
The rectifier 4 composed of the arms of
When operating with Ref = 1PU (100%), for example, if a failure of 1P (the number of parallels is 1) occurs, the output of the current reference changing circuit 13 is Iset = IRef x (9 /
10) = (9/10) IRef, and the constant current control circuit 9
This reduces the output current IF.B. of the rectifier 4 to 90%.
【0012】又、過電流レベル変更回路11ー4により
半導体素子が9P(並列数9個)の場合の過電流保護レ
ベルに、過電流の保護レベルが低下させられるので、半
導体素子が9P(並列数9個)時の過電流保護ができ
る。Further, since the overcurrent protection level is lowered by the overcurrent level changing circuit 11-4 to the overcurrent protection level in the case where the number of semiconductor elements is 9P (9 in parallel), the semiconductor elements are connected in 9P (parallel). (Over several 9) can be protected against overcurrent.
【0013】同様に、故障並列数が2P(並列数2個)
の故障が発生するとIF.B.は80%に低下し、過電流保
護レベルも8P(並列数8個)時の値に低下させている
ので半導体素子が8P時の過電流保護ができる。Similarly, the number of parallel faults is 2P (two parallel numbers).
If the failure occurs, the IF.B. is lowered to 80% and the overcurrent protection level is also lowered to the value at 8P (8 in parallel), so that the semiconductor element can be protected against overcurrent at 8P.
【0014】このように、請求項1に対応する発明によ
れば、故障並列素子数1個又は2個になっても、故障並
列素子数に応じて整流器の出力電流を下げることによ
り、運転を継続することができる。これにより冗長数無
が可能になるので小形で安価な信頼性の高い整流器を提
供できる。As described above, according to the invention according to claim 1, even if the number of failed parallel elements is 1 or 2, the operation is performed by decreasing the output current of the rectifier according to the number of failed parallel elements. You can continue. This makes it possible to provide a redundant rectifier, so that it is possible to provide a small-sized, inexpensive and highly reliable rectifier.
【0015】図2は請求項2に対応する発明の一実施例
を示す構成図である。図2において、14は素子故障判
別回路6により検出した素子故障の数に応じて電流検出
器8で検出した値IF.B.に[並列数/(並列数−故障並
列数)]=(並列数/健全並列数)を乗じ、Id とし、
半導体素子の故障並列数分電流検出信号の値を上げる電
流検出値変更回路である。FIG. 2 is a block diagram showing an embodiment of the invention corresponding to claim 2. In FIG. In FIG. 2, 14 is the value IF.B. detected by the current detector 8 according to the number of element failures detected by the element failure determination circuit 6 [number of parallels / (number of parallels-number of parallels in failure)] = (parallel Number / healthy parallel number) to obtain Id,
It is a current detection value changing circuit for increasing the value of the current detection signal by the number of faulty parallel semiconductor devices.
【0016】例えば、アームを構成する半導体素子の並
列数が10P(並列数が10個)の整流器4において、
故障並列数が1P(並列数1個)の故障が発生すると電
流基準設定器7の設定IRef =1PU(100%)の場
合、Id =IF.B.×(10/9)=(10/9)IF.B.
となり、定電流制御回路9によりId は100%の値を
保つので整流器4の出力電流IF.B.は90%に低下す
る。又、過電流保護レベルはId に対して設定している
ので、IF.B.が変化することから整流器4の定格に対し
ては、過電流保護レベルは低下していることになる。従
って、半導体素子が9P(並列数9個)時の過電流保護
ができる。For example, in the rectifier 4 in which the number of parallel semiconductor elements forming the arm is 10P (the number of parallels is 10),
When a fault with a parallel number of 1P (parallel number of 1) occurs, if IRef = 1PU (100%) of the current reference setting unit, Id = IF.B. x (10/9) = (10/9 ) IF.B.
Since the constant current control circuit 9 keeps Id at 100%, the output current IF.B. of the rectifier 4 drops to 90%. Further, since the overcurrent protection level is set for Id, the IF.B. changes, so that the overcurrent protection level is lowered with respect to the rating of the rectifier 4. Therefore, overcurrent protection can be performed when the number of semiconductor elements is 9P (9 in parallel).
【0017】同様に、故障並列数が2P(並列数2個)
の故障が発生するとIF.B.は80%に低下し、過電流保
護レベルも8P(並列数8個)時の値に低下し、半導体
素子が8P(並列数8個)時の過電流保護ができる。Similarly, the number of parallel faults is 2P (two parallel numbers).
If a failure occurs, the IF.B. will drop to 80%, the overcurrent protection level will also drop to the value at 8P (8 in parallel), and the overcurrent protection when the semiconductor element is 8P (8 in parallel). You can
【0018】以上、述べたように請求項2に対応する発
明によれば、故障並列数1個又は2個になっても故障並
列素子数に応じて整流器4の出力電流を下げると共に過
電流保護レベルも下がることにより請求項1に対応する
発明と同様な効果を得ることができる。As described above, according to the invention corresponding to claim 2, even if the number of parallel faults is one or two, the output current of the rectifier 4 is reduced according to the number of faulty parallel elements, and overcurrent protection is performed. By lowering the level, the same effect as that of the invention according to claim 1 can be obtained.
【0019】図3は請求項3に対応する発明の一実施例
を示す構成図である。図3において、14は図2と同様
に、素子故障判別回路6により検出した素子故障の数に
応じて電流検出器8で検出した値IF.B.に[並列数/
(並列数−故障並列数)]=(並列数/健全並列数)を
乗じ、Id とし、半導体素子の故障並列数分電流検出信
号の値を上げる電流検出値変更回路である。FIG. 3 is a block diagram showing an embodiment of the invention corresponding to claim 3. In FIG. In FIG. 3, as in FIG. 2, 14 indicates the value IF.B. detected by the current detector 8 according to the number of element failures detected by the element failure determination circuit 6 [the number of parallel /
(Parallel number-fault parallel number)] = (parallel number / healthy parallel number) to obtain Id, and the current detection value changing circuit increases the value of the current detection signal by the fault parallel number of the semiconductor element.
【0020】又、11は図1と同様に、過電流保護レベ
ルを素子故障判別回路6からの故障並列数に応じて下げ
る過電流レベル変更回路11ー4と、変更された過電流
保護レベルと電流検出器8で検出された整流器4の出力
電流IF.B.を比較演算し過電流信号を出力する比較演算
器11ー2から成る過電流保護回路である。Further, as in FIG. 1, reference numeral 11 denotes an overcurrent level changing circuit 11-4 which lowers the overcurrent protection level in accordance with the number of fault parallels from the element fault discriminating circuit 6 and a changed overcurrent protection level. It is an overcurrent protection circuit composed of a comparison calculator 11-2 which compares the output current IF.B. of the rectifier 4 detected by the current detector 8 and outputs an overcurrent signal.
【0021】ここで、並列数が10P(並列数10個)
のア―ムで構成された整流器4が電流基準設定器7でI
Ref =1PU(100%)に設定して運転している時
に、例えば、1P(並列数1個)の故障が発生すると、
Id =IF.B.×(10/9)=(10/9)IF.B.とな
り、定電流制御回路9によりId は100%の値を保つ
ので整流器4の出力電流IF.B.は90%に低下する 又、過電流レベル変更回路11ー4により半導体素子が
9P(並列数9個)の場合の過電流保護レベルに、過電
流の保護レベルが低下させられるので、半導体素子が9
P(並列数9個)時の過電流保護ができる。Here, the parallel number is 10P (the parallel number is 10).
The rectifier 4 composed of the arm of
When operating with Ref = 1PU (100%), for example, if a failure of 1P (1 parallel number) occurs,
Id = IF.B. × (10/9) = (10/9) IF.B. Since the constant current control circuit 9 keeps Id at 100%, the output current IF.B. of the rectifier 4 is 90. In addition, the overcurrent protection level is lowered to the overcurrent protection level when the semiconductor element is 9P (9 in parallel) by the overcurrent level changing circuit 11-4.
Overcurrent protection at P (9 in parallel) is possible.
【0022】同様に、故障並列数が2P(並列数2個)
の故障が発生するとIF.B.は80%に低下し、過電流保
護レベルも8P(並列数8個)時の値に低下させている
ので半導体素子が8P時の過電流保護ができる。Similarly, the fault parallel number is 2P (parallel number 2).
If the failure occurs, the IF.B. is lowered to 80% and the overcurrent protection level is also lowered to the value at 8P (8 in parallel), so that the semiconductor element can be protected against overcurrent at 8P.
【0023】このように、請求項3に対応する発明によ
れば、故障並列数1個又は2個になっても故障並列素子
数に応じて整流器4の出力電流を下げると共に過電流保
護レベルも下がることにより請求項1に対応する発明と
同様な効果を得ることができる。As described above, according to the invention according to claim 3, even if the number of faulty parallels is 1 or 2, the output current of the rectifier 4 is reduced according to the number of faulty parallel elements, and the overcurrent protection level is also increased. By lowering, it is possible to obtain the same effect as that of the invention according to claim 1.
【0024】請求項1乃至請求項3に対応する発明は、
原理的には健全な半導体素子並列数が1つまで運転が可
能であるが、負荷条件等から制約を受けるので、健全な
半導体素子並列数に限界を設け、限界以下の並列数にな
った場合電力変換装置の運転を停止させれば、効率の良
い運転が可能である。この限界値はシステムにより種々
異るが、半導体素子の全並列数の5〜30%程度の並列
数の故障まで運転が可能と考えられる。従って、電力変
換装置の定格出力の70%〜95%まで運転を継続し、
限界値を越えた時、電力変換装置を停止させることによ
って、システムを効率良く有効に活用することができ
る。The inventions corresponding to claims 1 to 3 are:
In principle, it is possible to operate up to one healthy semiconductor device parallel number, but since there are restrictions due to load conditions, etc., a limit is set on the healthy semiconductor device parallel number, and if the parallel number is less than the limit. If the operation of the power converter is stopped, efficient operation is possible. Although this limit value varies depending on the system, it is considered that the operation can be performed up to a failure of 5 to 30% of the total number of parallel semiconductor devices. Therefore, the operation is continued up to 70% to 95% of the rated output of the power converter,
By stopping the power conversion device when the limit value is exceeded, the system can be used efficiently and effectively.
【0025】[0025]
【発明の効果】以上説明のように本発明によれば、電力
変換装置のアームが並列接続された複数個の半導体素子
で構成される場合、故障並列数に応じて電力変換装置の
出力電流を制限すると共に故障並列数に応じて電力変換
装置の過電流保護レベルも下げることによって、故障並
列数の限界まで安全に運転を継続出来る。As described above, according to the present invention, when the arm of the power conversion device is composed of a plurality of semiconductor elements connected in parallel, the output current of the power conversion device is changed according to the number of faulty parallel connections. By limiting and also lowering the overcurrent protection level of the power converter according to the number of parallel failures, the safe operation can be continued up to the limit of the number of parallel failures.
【図1】請求項1に対応する発明の電力変換装置の一実
施例を示す構成図。FIG. 1 is a configuration diagram showing an embodiment of a power conversion device of the invention corresponding to claim 1. FIG.
【図2】請求項2に対応する発明の電力変換装置の一実
施例を示す構成図。FIG. 2 is a configuration diagram showing an embodiment of a power conversion device of the invention corresponding to claim 2;
【図3】請求項3に対応する発明の電力変換装置の一実
施例を示す構成図。FIG. 3 is a configuration diagram showing an embodiment of a power conversion device of the invention corresponding to claim 3;
【図4】従来の電力変換装置の構成図。FIG. 4 is a configuration diagram of a conventional power conversion device.
1 …交流母線 2 …遮
断器 3 …整流器用変圧器 4 …整
流器 5 …負荷 6 …素
子故障判別回路 7 …電流基準設定器 8 …電
流検出器 9 …定電流制御回路 10 …ゲ
ート制御回路 11 …過電流保護回路 11−1…過
電流レベル設定器 11―2…比較演算器 11―3…過
電流レベル変更回路 12 …保護回路 13 …電
流基準変更回路 14 …電流検出値変更回路1 ... AC bus 2 ... Circuit breaker 3 ... Rectifier transformer 4 ... Rectifier 5 ... Load 6 ... Element failure determination circuit 7 ... Current reference setting device 8 ... Current detector 9 ... Constant current control circuit 10 ... Gate control circuit 11 ... Overcurrent protection circuit 11-1 ... Overcurrent level setter 11-2 ... Comparison calculator 11-3 ... Overcurrent level change circuit 12 ... Protection circuit 13 ... Current reference change circuit 14 ... Current detection value change circuit
Claims (4)
接続された半導体素子から成る電力変換装置において、
前記半導体素子の故障並列数を判別する素子故障判別回
路と、該素子故障判別回路に応答し前記半導体素子の故
障並列数に応じて前記電力変換装置の電流基準値を下げ
る電流基準変更回路と、前記素子故障判別回路に応答し
前記電力変換装置を過電流から保護する過電流保護回路
の保護レベルを前記半導体素子の故障並列数に応じて下
げる過電流レベル変更回路を具備し、前記半導体素子の
故障並列数に応じて前記電力変換装置の出力電流を低下
させると共に過電流保護レベルも低下させることを特徴
とした電力変換装置。1. A power converter in which each arm comprises at least a plurality of semiconductor elements connected in parallel,
An element failure determination circuit for determining the failure parallel number of the semiconductor element, and a current reference changing circuit that responds to the element failure determination circuit and lowers the current reference value of the power converter according to the failure parallel number of the semiconductor element, The semiconductor device includes an overcurrent level changing circuit that responds to the device failure determination circuit and lowers a protection level of an overcurrent protection circuit that protects the power conversion device from an overcurrent according to the number of parallel faults of the semiconductor device. A power conversion device, characterized in that the output current of the power conversion device is reduced in accordance with the number of faulty parallel connections and the overcurrent protection level is also reduced.
接続された半導体素子から成る電力変換装置において、
前記半導体素子の故障並列数を判別する素子故障判別回
路と、該素子故障判別回路に応答し前記半導体素子の故
障並列数に応じて前記電力変換装置の出力電流の検出値
を上げる電流検出値変更回路を具備し、該電流検出値変
更回路の出力を前記電力変換装置の出力電流を制御する
定電流制御回路へ電流帰還信号として与えると共に、前
記電力変換装置を過電流から保護する過電流保護回路に
も与え、前記半導体素子の故障並列数に応じて前記電力
変換装置の出力電流を低下させると共に過電流保護レベ
ルも低下させることを特徴とした電力変換装置。2. A power converter in which each arm comprises at least a plurality of semiconductor elements connected in parallel,
An element failure discriminating circuit for discriminating the number of faulty parallels of the semiconductor element, and a current detection value change responsive to the element faulty discriminating circuit to increase the detection value of the output current of the power converter according to the number of faulty parallels of the semiconductor element An overcurrent protection circuit for protecting the power converter from an overcurrent while providing an output of the current detection value changing circuit as a current feedback signal to a constant current control circuit for controlling an output current of the power converter. Also, the power conversion device is characterized in that the output current of the power conversion device is reduced and the overcurrent protection level is also reduced according to the number of faulty parallels of the semiconductor element.
接続された半導体素子から成る電力変換装置において、
前記半導体素子の故障並列数を判別する素子故障判別回
路と、該素子故障判別回路に応答し前記半導体素子の故
障並列数に応じて前記電力変換装置の出力電流の検出値
を上げる電流検出値変更回路と、前記素子故障判別回路
に応答し前記電力変換装置を過電流から保護する過電流
保護回路の保護レベルを前記半導体素子の故障並列数に
応じて下げる過電流レベル変更回路を具備し、前記電流
検出値変更回路の出力を前記電力変換装置の出力電流を
制御する定電流制御回路へ電流帰還信号として与え、前
記半導体素子の故障並列数に応じて前記電力変換装置の
出力電流を低下させると共に過電流保護レベルも低下さ
せることを特徴とした電力変換装置。3. A power converter in which each arm comprises at least a plurality of semiconductor elements connected in parallel,
An element failure discriminating circuit for discriminating the number of faulty parallels of the semiconductor element, and a current detection value change responsive to the element faulty discriminating circuit to increase the detection value of the output current of the power converter according to the number of faulty parallels of the semiconductor element A circuit, and an overcurrent level changing circuit that responds to the element failure determination circuit and reduces a protection level of an overcurrent protection circuit that protects the power converter from an overcurrent according to the number of faulty parallels of the semiconductor element. The output of the current detection value changing circuit is given as a current feedback signal to a constant current control circuit that controls the output current of the power conversion device, and the output current of the power conversion device is reduced according to the number of faulty parallels of the semiconductor elements. A power conversion device characterized by lowering the overcurrent protection level.
導体素子の故障並列数の限界を判別した際には前記電力
変換装置の運転を停止することを特徴とした請求項1乃
至請求項3のいずれかに記載の電力変換装置。4. The device according to claim 1, wherein the element failure determination circuit stops the operation of the power conversion device when the limit of the number of faulty parallels of the semiconductor element is determined. The power converter according to claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7236336A JPH0984351A (en) | 1995-09-14 | 1995-09-14 | Power converter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7236336A JPH0984351A (en) | 1995-09-14 | 1995-09-14 | Power converter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0984351A true JPH0984351A (en) | 1997-03-28 |
Family
ID=16999302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7236336A Pending JPH0984351A (en) | 1995-09-14 | 1995-09-14 | Power converter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0984351A (en) |
-
1995
- 1995-09-14 JP JP7236336A patent/JPH0984351A/en active Pending
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