JPH10176902A5 - - Google Patents
Info
- Publication number
- JPH10176902A5 JPH10176902A5 JP1996336986A JP33698696A JPH10176902A5 JP H10176902 A5 JPH10176902 A5 JP H10176902A5 JP 1996336986 A JP1996336986 A JP 1996336986A JP 33698696 A JP33698696 A JP 33698696A JP H10176902 A5 JPH10176902 A5 JP H10176902A5
- Authority
- JP
- Japan
- Prior art keywords
- styluses
- vibration
- attached
- detection elements
- piezoelectric element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Description
【００３４】
次に、本発明の第５実施形態を図７から図９に基づいて説明する。
第５実施形態は第２実施形態に比べて圧電素子の構造が相違するもので、他の構造は第２実施形態と同じである。
図７には本発明の第５実施形態にかかるタッチ信号プローブの全体構成が示されている。
図７において、第５実施形態のタッチ信号プローブは、前記支持ピン１と、この支持ピン１の先端部に取り付けられた取付体３２と、この取付体３２に取り付けられた前記第１及び第２のスタイラス３，４と、これらのスタイラス３，４の近傍において取付体３２に取り付けられた圧電素子３４とを備えた構成である。[0034]
Next, a fifth embodiment of the present invention will be described with reference to FIGS.
The fifth embodiment differs from the second embodiment in the structure of the piezoelectric element, but the other structures are the same as those of the second embodiment.
FIG. 7 shows the overall configuration of a touch signal probe according to a fifth embodiment of the present invention.
In Figure 7, the touch signal probe of the fifth embodiment is configured to include the support pin 1, an attachment body 32 attached to the tip of the support pin 1, the first and second styluses 3 and 4 attached to the attachment body 32, and a piezoelectric element 34 attached to the attachment body 32 in the vicinity of these styluses 3 and 4.
【００３９】
この構成の第５実施形態では、第１実施形態の(1)(2)(4)と同様の作用効果を奏する他に、第１の加振・検出素子３４Ｅ，３４Ｆと、第２の加振・検出素子３４Ｇ，３４Ｈとを同一圧電素子の表面電極を少なくとも４分割して構成し、かつ、取付体３２のＺ軸と直交する外面３２Ｃに配置したから、スタイラス３，４が取り付けられる取付体３２の外面３２Ａ，３２Ｂに加振・検出素子を取り付ける必要がないので、スタイラス３，４の太さが制限されないだけでなく、加振・検出素子を構成する圧電素子３４の加工が容易となる。[0039]
In the fifth embodiment having this configuration, in addition to achieving the same effects as those of (1), (2), and (4) of the first embodiment, the first vibration/detection elements 34E, 34F and the second vibration/detection elements 34G, 34H are formed by dividing the surface electrode of the same piezoelectric element into at least four parts, and are arranged on the outer surface 32C of the mounting body 32 that is perpendicular to the Z axis. Therefore, there is no need to attach the vibration/detection elements to the outer surfaces 32A, 32B of the mounting body 32 to which the styluses 3, 4 are attached. This not only means that there are no restrictions on the thickness of the styluses 3, 4, but also makes it easier to process the piezoelectric elements 34 that make up the vibration/detection elements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33698696A JP3650496B2 (en) | 1996-12-17 | 1996-12-17 | Touch signal probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33698696A JP3650496B2 (en) | 1996-12-17 | 1996-12-17 | Touch signal probe |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10176902A JPH10176902A (en) | 1998-06-30 |
| JPH10176902A5 true JPH10176902A5 (en) | 2004-12-02 |
| JP3650496B2 JP3650496B2 (en) | 2005-05-18 |
Family
ID=18304430
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP33698696A Expired - Fee Related JP3650496B2 (en) | 1996-12-17 | 1996-12-17 | Touch signal probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3650496B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3197860B2 (en) | 1997-12-24 | 2001-08-13 | 株式会社ミツトヨ | Touch signal probe |
| GB2336433B (en) | 1998-04-14 | 2002-02-06 | Mitutoyo Corp | Touch signal probe |
| US6832877B2 (en) * | 2000-05-29 | 2004-12-21 | Kabushiki Kaisya Advance | Dental measuring and machining system |
| KR102880023B1 (en) * | 2025-03-18 | 2025-11-10 | 김윤오 | Gauge for measuring machining dimensions of a workpiece |
-
1996
- 1996-12-17 JP JP33698696A patent/JP3650496B2/en not_active Expired - Fee Related
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