JPH10270843A - Repair method and apparatus for conductive pattern - Google Patents

Repair method and apparatus for conductive pattern

Info

Publication number
JPH10270843A
JPH10270843A JP7733597A JP7733597A JPH10270843A JP H10270843 A JPH10270843 A JP H10270843A JP 7733597 A JP7733597 A JP 7733597A JP 7733597 A JP7733597 A JP 7733597A JP H10270843 A JPH10270843 A JP H10270843A
Authority
JP
Japan
Prior art keywords
conductive
repair
repairing
conductive paste
pen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7733597A
Other languages
Japanese (ja)
Inventor
Toshihiro Suzuki
敏洋 鈴木
Masaaki Oda
正明 小田
Masatoshi Noguchi
雅敏 野口
Takahito Sakamoto
貴仁 坂本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
S C I KK
Vacuum Metallurgical Co Ltd
Graphtec Corp
Original Assignee
S C I KK
Vacuum Metallurgical Co Ltd
Graphtec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by S C I KK, Vacuum Metallurgical Co Ltd, Graphtec Corp filed Critical S C I KK
Priority to JP7733597A priority Critical patent/JPH10270843A/en
Publication of JPH10270843A publication Critical patent/JPH10270843A/en
Pending legal-status Critical Current

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
    • Y02W30/00—Technologies for solid waste management
    • Y02W30/50—Reuse, recycling or recovery technologies
    • Y02W30/82—Recycling of waste of electrical or electronic equipment [WEEE]

Landscapes

  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Laser Beam Processing (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

(57)【要約】 【課題】導電パターンの断線や欠損を能率良く機械的に
補修でき、極めて細く薄い線からなる導電パターンの補
修に適した補修方法と補修装置を提供する 【解決手段】基板2上に形成した電極等の導電パターン
が断線10や欠損11した補修箇所に、分散媒に導電性
物質の超微粒子を均一に分散した導電性ペーストを該基
板の表面に沿って自在に移動する補修ペン8を介して滴
状または線状に供給し、供給された導電性ペーストを局
所的に加熱して導電性膜とする。検出用カメラ13によ
り補修箇所を検出し、昇降自在の補修ペン8を該補修箇
所に位置させ、監視用カメラ14により監視しながら該
補修箇所に導電性ペーストを供給し、補修ペンと共に移
動する加熱手段15により供給された導電性ペーストを
局所的に加熱して導電性膜とする。
[Problem] To provide a repair method and a repair device which can efficiently and mechanically repair disconnection or loss of a conductive pattern and which is suitable for repairing a conductive pattern composed of extremely thin and thin lines. A conductive paste in which ultrafine particles of a conductive substance are uniformly dispersed in a dispersion medium is freely moved along a surface of the substrate at a repair location where a conductive pattern such as an electrode or the like formed on 2 has a disconnection 10 or a defect 11. It is supplied dropwise or linearly via the repair pen 8, and the supplied conductive paste is locally heated to form a conductive film. The repairing point is detected by the detection camera 13, and the repair pen 8, which can be moved up and down, is positioned at the repairing point, and while monitoring by the monitoring camera 14, the conductive paste is supplied to the repairing point and the heating is moved together with the repair pen The conductive paste supplied by the means 15 is locally heated to form a conductive film.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、フラットディスプ
レイパネルのガラス基板等の基板上に形成された導電パ
ターンの断線や欠損を補修する方法と装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for repairing a disconnection or a defect of a conductive pattern formed on a substrate such as a glass substrate of a flat display panel.

【0002】[0002]

【従来の技術】従来、プラズマディスプレイパネルや液
晶ディスプレイパネルの製造工程に於いて、ガラス基板
上に直接或いは絶縁膜を介して電極用の導電細線をパタ
ーン状に形成することが行われている。このあと、形成
された導電パターンに断線や抵抗値を変えてしまう欠損
などの有無を検査し、合格品が次工程に送られて次の処
理が施される。導電パターンは基板の用途によって異な
り、その形成には基板の寸法や導電細線の線幅によりド
ライプロセス、ウエットプロセス、スクリーン印刷法等
が使用される。スクリーン印刷法では、線幅が100ミ
クロンより広い場合、メタルオーガニックもしくは厚膜
ペーストを使用してパターンを印刷し、これを焼結して
導電パターンを形成している。また、薄くしかも70ミ
クロン以下の狭幅の細線をスクリーン印刷法により形成
するため、ニッケル、アルミニウム等の金属超微粒子を
炭素数5以上のアルコール類の分散媒に均一に分散させ
た金属ペーストを使用して導電パターンを印刷し、これ
を焼結することも提案されている(特開平3−2918
27号公報)。
2. Description of the Related Art Conventionally, in the process of manufacturing a plasma display panel or a liquid crystal display panel, conductive thin wires for electrodes are formed in a pattern on a glass substrate directly or via an insulating film. Thereafter, the formed conductive pattern is inspected for disconnection or a defect that changes the resistance value, and a passed product is sent to the next step to be subjected to the next process. The conductive pattern varies depending on the use of the substrate, and a dry process, a wet process, a screen printing method, or the like is used for forming the conductive pattern depending on the dimensions of the substrate and the line width of the conductive fine wire. In the screen printing method, when the line width is larger than 100 microns, a pattern is printed using a metal organic or thick film paste, and this is sintered to form a conductive pattern. In addition, in order to form thin and narrow lines of 70 μm or less by screen printing, use a metal paste in which ultrafine metal particles such as nickel and aluminum are uniformly dispersed in a dispersion medium of alcohols having 5 or more carbon atoms. Printing a conductive pattern and sintering the conductive pattern has also been proposed (Japanese Patent Laid-Open No. Hei 3-2918).
No. 27).

【0003】[0003]

【発明が解決しようとする課題】導電パターンを形成す
るまでの間に多くの製造工程を経ており、上記検査によ
り不良品となった例えば1000×1350mmのフラットディ
スプレイ用基板を破棄することは、多額の損失が発生し
てコスト高の原因となる。そのため導電パターンの断線
や欠損した箇所を顕微鏡で見ながらそこに針先に付けた
前記厚膜ペーストを付着させ加熱して人手で補修するこ
とが試みられたが、近時のように線幅が70ミクロン以
下と狭く、厚さも数十ミクロンで抵抗値の小さいドライ
プロセス製の導電パターンでは、補修箇所が太く厚くな
りやすくその補修が容易でない。補修の結果、導電パタ
ーンの厚みが部分的に厚くなると、次の工程で絶縁膜な
どを形成したときにその厚い部分の絶縁膜が薄くなって
電気特性が劣性化するので好ましくない。
[0005] Discarding a flat display substrate of, for example, 1000 x 1350 mm, which has gone through many manufacturing steps before forming a conductive pattern and which has become defective due to the above inspection, is very expensive. Loss occurs, which causes an increase in cost. Therefore, while observing the broken or missing portion of the conductive pattern with a microscope, it was attempted to apply the thick film paste attached to the needle tip thereto and heat and repair it manually, but as recently, the line width was reduced. In the case of a conductive pattern made of a dry process that is as narrow as 70 microns or less, has a thickness of several tens of microns, and has a small resistance value, the repaired portion tends to be thick and thick, and the repair is not easy. If the thickness of the conductive pattern is partially increased as a result of the repair, it is not preferable because when the insulating film or the like is formed in the next step, the insulating film in the thick portion becomes thin and the electrical characteristics deteriorate.

【0004】本発明は、導電パターンの断線や欠損を能
率良く機械的に補修でき、極めて細く薄い線からなる導
電パターンの補修に適した補修方法と補修装置を提供す
ることを目的とするものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a repair method and a repair apparatus which can efficiently and mechanically repair a disconnection or a defect in a conductive pattern, and which is suitable for repairing a conductive pattern composed of extremely thin and thin lines. is there.

【0005】[0005]

【課題を解決するための手段】本発明では、上記の目的
を達成すべく、基板上に形成した電極等の導電パターン
が断線や欠損した補修箇所に、分散媒に導電性物質の超
微粒子を均一に分散した導電性ペーストを該基板の表面
に沿って自在に移動する補修ペンを介して滴状または線
状に供給し、供給された導電性ペーストを局所的に加熱
して導電性膜とすることにより補修するようにした。該
補修箇所を検出用カメラにより検出し、昇降自在に構成
した該補修ペンを該補修箇所に位置させ、監視用カメラ
により監視しながら該補修箇所に該導電性ペーストを滴
状もしくは線状に供給し、該補修ペンと共に移動するラ
ンプ、レーザービーム等の加熱手段により供給された導
電性ペーストを局所的に加熱して導電性膜とすると、上
記目的を一層適切に達成できる。
According to the present invention, in order to achieve the above object, ultrafine particles of a conductive substance are dispersed in a dispersion medium at a repaired portion where a conductive pattern such as an electrode formed on a substrate is broken or missing. A uniformly dispersed conductive paste is supplied in the form of drops or lines via a repair pen that moves freely along the surface of the substrate, and the supplied conductive paste is locally heated to form a conductive film and To repair it. The repair point is detected by a detection camera, and the repair pen, which is configured to be movable up and down, is positioned at the repair point, and the conductive paste is supplied to the repair point in a drop or linear manner while being monitored by a monitoring camera. If the conductive paste supplied by a heating means such as a lamp or a laser beam that moves together with the repair pen is locally heated to form a conductive film, the above object can be achieved more appropriately.

【0006】上記補修方法は、補修すべき導電パターン
を有する基板の板面に沿って自在に移動する移動台を設
け、該移動台に、該導電パターンが断線や欠損した補修
箇所を検出する検出用カメラと、昇降装置により補修箇
所に向けて昇降され且つ分散媒に導電性物質の超微粒子
を均一に分散した導電性ペーストを該補修箇所へ供給す
る補修ペンと、該補修ペンからの導電性ペーストの供給
状況を監視する監視用カメラと、供給された導電性ペー
ストを局所的に加熱するランプ、レーザービーム等の加
熱手段を搭載した補修装置により的確に実施できる。ま
た、該移動台を該基板の補修箇所の位置を特定する信号
に基づき作動する駆動装置により移動し、該移動台に該
補修箇所の補修後の導通検査を行う昇降自在の導通検査
装置を設けることが好ましい。
In the above repairing method, a movable table is provided which freely moves along a surface of a substrate having a conductive pattern to be repaired, and the movable table is provided with a detecting means for detecting a repaired portion where the conductive pattern is broken or missing. Camera, a repair pen that is raised and lowered by the lifting device toward the repair location and supplies a conductive paste in which ultrafine particles of a conductive substance are uniformly dispersed in a dispersion medium to the repair location, and a conductive pen from the repair pen. It can be accurately performed by a monitoring camera for monitoring the supply state of the paste and a repair device equipped with a heating means such as a lamp and a laser beam for locally heating the supplied conductive paste. Further, the movable base is moved by a driving device that operates based on a signal specifying the position of the repaired portion of the substrate, and the movable platform is provided with a continuity inspection device that can be moved up and down to perform a continuity inspection after the repaired portion is repaired. Is preferred.

【0007】[0007]

【発明の実施の形態】本発明の実施の形態を図面に基づ
き説明すると、図1は本発明の方法の実施に使用したフ
ラットディスプレイパネルの導電パターンの補修装置の
1例で、同図に於いて、符号1は補修台を示す。該補修
台1上には着脱自在にフラットディスプレイパネルを構
成するガラスの基板2が載置され、該補修台1の上面の
対向両側に設けた平行な1対の案内杆3、3に横杆4の
両端を移動自在に支持し、リニヤモータ等の精密駆動モ
ータ5により該横杆4が該案内杆3に沿って移動される
ようにした。また、該横杆4に、精密駆動モータ6によ
り1対の案内杆3、3′に沿って該横杆4の移動方向と
直交方向に移動される移動台7を設けて、精密モータ1
2で1対の案内杆3″,3″に沿って該横杆4の上下方
向に移動する移動台7′に補修ペン8を取り付け、各モ
ータ5、6、12の駆動を制御装置19が制御すること
により基板2の板面に沿ってX−Yプロッターの如く所
定位置へ該移動台7′が移動する。該基板2の板面に
は、例えば図2に示すような線幅100μm、間隔10
0μmでアルミニウムの細線からなる導電パターンが形
成され、該細線に図示のように断線10や欠損11の導
通不良個所を生じた場合、この箇所を該補修ペン8によ
り正規の導通が得られるように補修する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to the drawings. FIG. 1 shows an example of an apparatus for repairing a conductive pattern of a flat display panel used for carrying out the method of the present invention. Reference numeral 1 indicates a repair table. A glass substrate 2 constituting a flat display panel is removably mounted on the repair table 1, and a pair of parallel guide rods 3, 3 provided on opposite upper sides of the upper surface of the repair table 1 are provided. 4 are movably supported at both ends, and the horizontal rod 4 is moved along the guide rod 3 by a precision drive motor 5 such as a linear motor. Further, the horizontal rod 4 is provided with a moving table 7 which is moved by a precision drive motor 6 along a pair of guide rods 3 and 3 'in a direction orthogonal to the moving direction of the horizontal rod 4, and the precision motor 1
The repair pen 8 is attached to the movable base 7 'which moves in the vertical direction of the horizontal rod 4 along the pair of guide rods 3 ", 3" in Step 2, and the control device 19 controls the driving of the motors 5, 6, 12 by the control pen 19. Under the control, the movable table 7 'moves to a predetermined position like an XY plotter along the plate surface of the substrate 2. For example, a line width of 100 μm and an interval of 10 μm as shown in FIG.
When a conductive pattern made of a thin aluminum wire is formed at 0 μm, and a defective conduction portion such as a disconnection 10 or a defect 11 occurs in the fine wire as shown in FIG. To repair.

【0008】該補修ペン8のペン先を導通不良個所すな
わち補修箇所に接近させ、ペン先からバルブで制御した
導電性ペーストを供給することにより導電性を補修する
もので、導電性ペーストは、例えば粒径が0.1μm以下
のニッケル、アルミニウム、タンタル、タングステン、
インジウム、マンガン、コバルト、クロム、シリコン、
金、銀、銅、亜鉛、錫、又はこれらの合金又は酸化物又
は複合酸化物もしくはこれらを含む化合物の超微粒子
を、分散媒、例えばローズオイル、テルビネオール、シ
トロネロール、ゲラニオール、ネロール、フェネチルア
ルコール等のアルコール類の1種以上を含有する溶媒、
或いは酢酸エチル、オレイン酸エチル、酢酸ブチル、グ
リセリド、トルエン、キシレン、メチルエチルケトン、
アセトンの1種以上を含有する有機分散媒に均一に分散
させて製造される。
[0008] The repairing pen 8 is brought into close contact with a defective conduction point, that is, a repaired portion, and a conductive paste controlled by a valve is supplied from the pen tip to repair the conductivity. Nickel, aluminum, tantalum, tungsten with a particle size of 0.1 μm or less,
Indium, manganese, cobalt, chromium, silicon,
Gold, silver, copper, zinc, tin, or ultrafine particles of alloys or oxides or composite oxides or compounds containing these, dispersion media, such as rose oil, terbineol, citronellol, geraniol, nerol, phenethyl alcohol and the like A solvent containing one or more alcohols,
Or ethyl acetate, ethyl oleate, butyl acetate, glyceride, toluene, xylene, methyl ethyl ketone,
It is manufactured by uniformly dispersing in an organic dispersion medium containing at least one kind of acetone.

【0009】該移動台7′は、図1又は図3に示したよ
うに、前記移動台7に設けた微動装置12により横杆4
に対して上下に微動可能に取り付けられ、該移動台7′
には、該補修ペン8以外に補修箇所を検出する検出用固
体撮像カメラ13、該補修ペン8からの導電性ペースト
の供給状態を監視する監視用固体撮像カメラ14、局部
的に加熱して供給された導電性ペーストを焼結させるた
めのレーザーガンからなる加熱手段15、及び補修箇所
の補修後に触針によりその導通状態を検査する導通検査
装置16を搭載した。
As shown in FIG. 1 or FIG. 3, the movable base 7 'is moved by a fine movement device 12 provided on the movable base 7,
Is mounted to be vertically movable with respect to
In addition to the repair pen 8, a solid-state detection camera 13 for detecting a repaired portion other than the repair pen 8, a monitoring solid-state imaging camera 14 for monitoring the supply state of the conductive paste from the repair pen 8, and a locally heated supply A heating means 15 comprising a laser gun for sintering the conductive paste thus obtained, and a continuity inspection device 16 for inspecting the continuity state by a stylus after repairing a repaired portion were mounted.

【0010】該補修ペン8は移動台7′にアクチュエー
タ17により上下昇降自在に設けられ、その昇降動に同
期してペン制御ユニット18がバルブを制御し、高圧空
気で導電性ペーストを補修箇所に供給する。図示のもの
では監視用固体撮像カメラ14を2本用意し、その一方
で描画状態を監視すると共にもう一方で供給状態を監視
するようにした。該監視用固体撮像カメラ14はペン制
御ユニット18に接続され、その監視情報に応じて適正
に修正動作を行うよう該ユニット18が制御する。ま
た、該横杆4の前後方向の移動、該移動台7の左右方向
の移動、及び該移動台7′の上下方向の移動は、補修す
べき基板2の補修箇所の位置を特定する信号が入力され
た駆動制御ユニット19により制御され、その移動位置
の確認を行うべく検出用固体撮像カメラ13が撮影した
画像情報が該駆動制御ユニット19に入力される。補修
箇所の位置信号には、製造工程に於いて基板2を検査し
たときの検査情報が利用される。
The repair pen 8 is provided on a movable base 7 'so as to be vertically movable by an actuator 17, and a pen control unit 18 controls a valve in synchronization with the vertical movement of the repair pen 8 so that conductive paste is applied to the repair location by high-pressure air. Supply. In the illustrated example, two monitoring solid-state imaging cameras 14 are prepared, one of which monitors a drawing state and the other monitors a supply state. The monitoring solid-state imaging camera 14 is connected to a pen control unit 18, and the unit 18 controls so as to appropriately perform a correction operation according to the monitoring information. In addition, the movement of the horizontal rod 4 in the front-rear direction, the movement of the carriage 7 in the left-right direction, and the movement of the carriage 7 ′ in the up-down direction are caused by signals specifying the position of the repaired portion of the substrate 2 to be repaired. The input drive control unit 19 is controlled to input image information captured by the detection solid-state imaging camera 13 to confirm the movement position of the drive control unit 19. Inspection information when inspecting the substrate 2 in the manufacturing process is used as the position signal of the repaired portion.

【0011】以上の構成の補修装置を使用して補修する
方法を説明すると、まず導電パターンの補修すべき箇所
が検出された基板2を補修台1の上に載せ、その補修箇
所の位置信号を駆動制御ユニット19に入力する。そし
て駆動制御ユニット19から出力される移動信号により
精密駆動モータ5、6が補修箇所上に移動台7を移動さ
せ、検出用固体撮像カメラ13で認識された所定位置に
移動台7′に設置された補修ペン8が停止したところで
ペン制御ユニット18が補修ペン8から導電性ペースト
を補修箇所に滴下する。補修箇所が断線であるか欠損で
あるかは検査情報により予め分かり、その情報と検出用
固体撮像カメラ13の情報に基づき細線の修復に適した
動きを補修ペン8に与えるように駆動制御ユニット19
が該移動台7、7′が前後左右に微細に動かす制御を行
う。例えば、補修箇所が断線であれば細線の幅方向にモ
ータ5またはモータ6で該移動台7を移動させることで
補修ペン8を移動させ、モータ12で該移動台7′を上
下させ基板2の厚さに対応した高さに固定し、アクチュ
エータ17で補修ペン8を基板2の表面の形状に追従し
た2度の上下を行い、図4のように導電性ペーストを滴
下20し、欠損であるときは細線の長さ方向に移動して
図5のように何度か滴下する方法で修正を行う。あるい
は、補修ペン8を降下させ導電性ペーストを供給しなが
ら補修箇所に沿って移動させ、図6又は図7のように線
状に描画する方法で修正を行う。
A method of repairing using the repairing apparatus having the above structure will be described. First, a substrate 2 on which a portion of a conductive pattern to be repaired is detected is placed on a repairing table 1, and a position signal of the repaired portion is obtained. Input to the drive control unit 19. Then, the precision drive motors 5 and 6 move the movable table 7 over the repair location by the movement signal output from the drive control unit 19, and are mounted on the movable table 7 'at a predetermined position recognized by the solid-state imaging camera 13 for detection. When the repair pen 8 stops, the pen control unit 18 drops the conductive paste from the repair pen 8 to the repair location. Whether the repaired part is broken or missing is previously known from the inspection information, and the drive control unit 19 is configured to give the repair pen 8 a motion suitable for repairing the fine line based on the information and the information of the solid-state imaging camera 13 for detection.
Controls the fine movement of the carriages 7, 7 'back and forth and left and right. For example, if the repair location is broken, the repair pen 8 is moved by moving the movable table 7 with the motor 5 or the motor 6 in the width direction of the thin line, and the movable table 7 ′ is moved up and down with the motor 12 to The height is fixed to the height corresponding to the thickness, and the repair pen 8 is moved up and down twice following the shape of the surface of the substrate 2 by the actuator 17, and the conductive paste is dropped 20 as shown in FIG. In some cases, the correction is performed by moving the fine line in the length direction and dripping it several times as shown in FIG. Alternatively, the repair pen 8 is lowered and moved along the repair location while supplying the conductive paste, and correction is performed by a method of drawing linearly as shown in FIG. 6 or FIG.

【0012】この供給された導電性ペーストを局部的な
加熱手段15からのレーザービームにより焼結させる
と、導電性ペーストの分散媒が蒸発して導電性膜とな
り、断線や欠損が修復され、導電パターンが導通状態或
いは所定の抵抗値に復帰し、不良品であった基板2を破
棄することなく製品化できる。補修箇所が確実に導通さ
れ電気抵抗値が所定値にあるかどうかは、移動台7′に
アクチュエータ17′によって昇降自在に設けられた触
針式の導通検査装置16を補修箇所に当てることにより
検査される。
When the supplied conductive paste is sintered by the laser beam from the local heating means 15, the dispersion medium of the conductive paste evaporates to form a conductive film, and the disconnection or defect is repaired. The pattern returns to a conductive state or a predetermined resistance value, and the defective substrate 2 can be commercialized without being discarded. Whether or not the repaired portion is reliably conducted and the electric resistance value is at a predetermined value is inspected by applying a stylus-type continuity inspection device 16 provided on the movable base 7 'so as to be movable up and down by an actuator 17' to the repaired portion. Is done.

【0013】補修に使用する導電性ペーストの固形成分
は、粒径が0.1ミクロン以下の超微粒子であるので、導
電パターンの狭い補修箇所を薄く補修することができ
る。また、該加熱手段15には、補修箇所以外の加熱を
避けるため熱を集中できるレーザービームを使用し、そ
の補修直後に加熱することが移動台7の移動時間を省略
する上で好ましい。
Since the solid component of the conductive paste used for repair is ultrafine particles having a particle size of 0.1 μm or less, a repair portion having a narrow conductive pattern can be repaired thinly. In addition, it is preferable to use a laser beam capable of concentrating heat in the heating means 15 in order to avoid heating other than the repaired portion, and to heat immediately after the repair in order to save the moving time of the movable table 7.

【0014】なお、上記実施例では検出用および監視用
カメラとして固体撮像カメラを使用したが、これに限定
されるものではなく、一般的なテレビカメラでもよい。
In the above embodiment, a solid-state imaging camera is used as a detection and monitoring camera. However, the present invention is not limited to this, and a general television camera may be used.

【0015】[0015]

【発明の効果】以上のように本発明によるときは、基板
上の導電パターンの補修箇所に、基板に沿って移動自在
の補修ペンにより分散媒に導電性物質の超微粒子を均一
に分散した導電性ペーストを滴状または線状に供給し、
供給された導電性ペーストを局所的に加熱して導電性膜
とすることにより補修するので、線幅が狭く且つ薄い導
電パターンの断線や欠損をその線幅や厚さを余り増大す
ることなく補修でき、検出用カメラにより補修箇所を検
出してそこに昇降自在の補修ペンを位置させ、監視用カ
メラにより監視しながら該補修箇所に上記導電性ペース
トを供給し、該補修ペンと共に移動する局部的な加熱手
段により供給された導電性ペーストを加熱して導電性膜
とすることにより、自動的に正確にその補修を行え、こ
うした方法は請求項3、4の構成の装置により的確に実
施できる等の効果がある。
As described above, according to the present invention, a conductive pattern in which ultrafine particles of a conductive substance are uniformly dispersed in a dispersion medium by a repair pen movable along the substrate is provided at a repaired portion of the conductive pattern on the substrate. The conductive paste in the form of drops or lines,
Since the supplied conductive paste is repaired by locally heating it to form a conductive film, it can repair broken or broken conductive patterns with a narrow line width without increasing the line width or thickness much. The repairing pen is detected by the detection camera, and the repair pen which can be moved up and down is positioned there, and while monitoring by the monitoring camera, the conductive paste is supplied to the repairing part and moved locally together with the repair pen. By heating the conductive paste supplied by a suitable heating means to form a conductive film, the repair can be performed automatically and accurately, and such a method can be carried out more accurately by the apparatus having the structure of claims 3 and 4. Has the effect.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態を示す斜視図FIG. 1 is a perspective view showing an embodiment of the present invention.

【図2】導電パターンの拡大図FIG. 2 is an enlarged view of a conductive pattern.

【図3】図1の要部の拡大断面図FIG. 3 is an enlarged sectional view of a main part of FIG. 1;

【図4】断線の補修状態の説明図(滴下補修)FIG. 4 is an explanatory diagram of a repair state of a disconnection (drop repair).

【図5】欠損の補修状態の説明図(滴下補修)FIG. 5 is an explanatory view of a repair state of a defect (drop repair).

【図6】断線の補修状態の説明図(線状補修)FIG. 6 is an explanatory view of a repair state of a disconnection (linear repair).

【図7】欠損の補修状態の説明図(線状補修)FIG. 7 is an explanatory view of a repair state of a defect (linear repair).

【符号の説明】[Explanation of symbols]

1 補修台、2 基板、7・7′ 移動台、8 補修ペ
ン、10 断線、11欠損、13 検出用固体撮像カメ
ラ、14 監視用固体撮像カメラ、15 加熱手段、1
6 導通検査装置、17・17′ アクチュエータ、
Reference Signs List 1 repair table, 2 boards, 7.7 'moving table, 8 repair pen, 10 disconnection, 11 loss, 13 solid-state imaging camera for detection, 14 solid-state imaging camera for monitoring, 15 heating means, 1
6 Continuity inspection device, 17.17 'actuator,

───────────────────────────────────────────────────── フロントページの続き (72)発明者 小田 正明 千葉県山武郡山武町横田516番地 真空冶 金株式会社内 (72)発明者 野口 雅敏 神奈川県横浜市戸塚区品濃町503番10号 グラフテック株式会社内 (72)発明者 坂本 貴仁 山梨県中巨摩郡若草町藤田1647−2 株式 会社エスシーアイ内 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Masaaki Oda 516 Yokota, Sanmu-cho, Sanmu-gun, Chiba Prefecture Inside Vacuum Metallurgy Co., Ltd. In-house (72) Inventor Takahito Sakamoto 1647-2 Fujita, Wakakusa-cho, Nakakoma-gun, Yamanashi Pref.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】基板上に形成した電極等の導電パターンが
断線や欠損した補修箇所に、分散媒に導電性物質の超微
粒子を均一に分散した導電性ペーストを該基板の表面に
沿って自在に移動する補修ペンを介して滴状または線状
に供給し、供給された導電性ペーストを局所的に加熱し
て導電性膜とすることを特徴とする導電パターンの補修
方法。
1. A conductive paste, in which ultrafine particles of a conductive substance are uniformly dispersed in a dispersion medium, is freely applied along a surface of a substrate at a repaired portion where a conductive pattern such as an electrode formed on the substrate is broken or broken. A method for repairing a conductive pattern, characterized in that the conductive paste is supplied in the form of a drop or a line via a repair pen that moves to a conductive film, and the supplied conductive paste is locally heated to form a conductive film.
【請求項2】検出用カメラにより上記補修箇所を検出
し、昇降自在に構成した上記補修ペンを該補修箇所に位
置させ、監視用カメラにより監視しながら該補修箇所に
上記導電性ペーストを滴状または線状に供給し、該補修
ペンと共に移動するランプ、レーザービーム等の加熱手
段により供給された導電性ペーストを局所的に加熱して
導電性膜とすることを特徴とする請求項1に記載の導電
パターンの補修方法。
2. The repairing point is detected by a detection camera, and the repairing pen configured to be movable up and down is positioned at the repairing point, and the conductive paste is dropped on the repairing point while being monitored by a monitoring camera. The method according to claim 1, wherein the conductive paste supplied in a linear manner and heated by a heating means such as a lamp or a laser beam that moves together with the repair pen is locally heated to form a conductive film. For repairing conductive patterns.
【請求項3】補修すべき導電パターンを有する基板の板
面に沿って自在に移動する移動台を設け、該移動台に、
該導電パターンが断線や欠損した補修箇所を検出する検
出用カメラと、昇降装置により補修箇所に向けて昇降さ
れ且つ分散媒に導電性物質の超微粒子を均一に分散した
導電性ペーストを該補修箇所へ供給する補修ペンと、該
補修ペンからの導電性ペーストの供給状況を監視する監
視用カメラと、供給された導電性ペーストを局所的に加
熱するランプ、レーザービーム等の加熱手段を搭載した
ことを特徴とする導電パターンの補修装置。
3. A moving table that freely moves along a surface of a substrate having a conductive pattern to be repaired, wherein the moving table includes:
A detection camera for detecting a repaired part where the conductive pattern is broken or missing, and a conductive paste which is raised and lowered by the lifting device toward the repaired part and in which ultrafine particles of a conductive substance are uniformly dispersed in a dispersion medium. A repair pen to be supplied to the repair pen, a monitoring camera for monitoring the supply status of the conductive paste from the repair pen, and a heating means such as a lamp and a laser beam for locally heating the supplied conductive paste. An apparatus for repairing a conductive pattern, comprising:
【請求項4】上記移動台は上記基板の補修箇所の位置を
特定する信号に基づき作動する駆動装置により移動さ
れ、該移動台に該補修箇所の補修後の導通検査を行う昇
降自在の導通検査装置を設けたことを特徴とする請求項
3に記載の導電パターンの補修装置。
4. A continuity test which can be moved up and down to perform a continuity test after repairing the repaired portion on the movable table by moving the movable table by a driving device which operates based on a signal specifying a position of the repaired portion on the substrate. The device for repairing a conductive pattern according to claim 3, further comprising a device.
JP7733597A 1997-03-28 1997-03-28 Repair method and apparatus for conductive pattern Pending JPH10270843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7733597A JPH10270843A (en) 1997-03-28 1997-03-28 Repair method and apparatus for conductive pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7733597A JPH10270843A (en) 1997-03-28 1997-03-28 Repair method and apparatus for conductive pattern

Publications (1)

Publication Number Publication Date
JPH10270843A true JPH10270843A (en) 1998-10-09

Family

ID=13631062

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7733597A Pending JPH10270843A (en) 1997-03-28 1997-03-28 Repair method and apparatus for conductive pattern

Country Status (1)

Country Link
JP (1) JPH10270843A (en)

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