JPH1062257A - Automatic pixel defect correction device for infrared two-dimensional sensor camera system - Google Patents
Automatic pixel defect correction device for infrared two-dimensional sensor camera systemInfo
- Publication number
- JPH1062257A JPH1062257A JP23718196A JP23718196A JPH1062257A JP H1062257 A JPH1062257 A JP H1062257A JP 23718196 A JP23718196 A JP 23718196A JP 23718196 A JP23718196 A JP 23718196A JP H1062257 A JPH1062257 A JP H1062257A
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- pixel
- infrared
- dimensional
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- 230000007547 defect Effects 0.000 title claims abstract description 26
- 230000002950 deficient Effects 0.000 claims abstract description 31
- 230000035945 sensitivity Effects 0.000 claims abstract description 20
- 238000003860 storage Methods 0.000 abstract description 3
- 238000003384 imaging method Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000003702 image correction Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
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Abstract
(57)【要約】
【課題】 赤外線2次元センサーカメラシステムにおけ
る欠陥画素による画像データの自動的補正。
【解決手段】 2次元センサーユニット1は、レンズ5
を介して補正のための被写体としての均一平均熱源6の
2次元熱画像を撮像しこの撮像データは、バスラインを
介して各構成と接続されたCPU4の制御の下にフレー
ムメモリ3に格納される。CPU4はフレームメモリ3
に格納されたフレーム単位の撮像データのうち、所定の
スレッショルドを超えない低感度のものを欠陥画素とし
て抽出し、その補正値とアドレスとを欠陥補正/感度補
正回路2に送出して欠陥補正を行わせ、更に所定温度に
おける出力の不揃い補正(オフセット補正)と、高低2
温度の出力差補正(ゲイン補正)を施させてフレームメ
モリ3に格納せしめる。
(57) [Summary] [Problem] To automatically correct image data by defective pixels in an infrared two-dimensional sensor camera system. A two-dimensional sensor unit includes a lens.
, A two-dimensional thermal image of the uniform average heat source 6 as a subject for correction is captured, and the captured data is stored in the frame memory 3 under the control of the CPU 4 connected to each component via the bus line. You. CPU 4 is a frame memory 3
Out of the frame-by-frame imaging data stored in the storage unit, the low-sensitivity data that does not exceed a predetermined threshold is extracted as a defective pixel, and its correction value and address are sent to the defect correction / sensitivity correction circuit 2 to perform defect correction. And a correction of output irregularity at a predetermined temperature (offset correction)
A temperature output difference correction (gain correction) is performed and stored in the frame memory 3.
Description
【0001】[0001]
【発明の属する技術分野】本発明は、赤外線2次元セン
サーカメラシステムにおける自動画素欠陥補正装置に関
し、特に画素感度が所定のスレッショルド以下の欠陥画
素の補正を自動的に行うことを可能とした赤外線2次元
センサーカメラシステムにおける自動画素欠陥補正装置
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic pixel defect correction apparatus in an infrared two-dimensional sensor camera system, and more particularly to an infrared ray two-dimensional sensor camera system capable of automatically correcting a defective pixel having a pixel sensitivity equal to or lower than a predetermined threshold. The present invention relates to an automatic pixel defect correction device in a three-dimensional sensor camera system.
【0002】[0002]
【従来の技術】被写体の2次元熱画像を生成する2次元
赤外線センサーカメラシステムでは、例えば(横)16
0×(縦)120個のセンサ配列からなる赤外線2次元
センサを使用している。しかしながら、各赤外線センサ
の出力には、個体差によるバラツキがあるので、赤外線
センサ出力をそのまま表示すると画素間のバラツキが発
生するため、表示の際のバラツキを均一にするための補
正機能を内蔵しており、出荷前に調整している。このよ
うな熱画像の均一性を確保するための補正としては、所
定温度における各赤外線検出素子の出力の不揃いに基づ
くオフセット値を補正するオフセット補正及び高低2つ
の温度における赤外線検出素子の出力の差、すなわちゲ
インの不揃いを補正するゲイン補正が行われている。2. Description of the Related Art In a two-dimensional infrared sensor camera system for generating a two-dimensional thermal image of a subject, for example, (horizontal) 16
An infrared two-dimensional sensor having an array of 0 × (vertical) 120 sensors is used. However, since the output of each infrared sensor has variations due to individual differences, if the infrared sensor output is displayed as it is, the variation between pixels will occur.Therefore, there is a built-in correction function to make the variation at the time of display uniform. And adjusted before shipping. As the correction for ensuring the uniformity of the thermal image, there are an offset correction for correcting an offset value based on an irregular output of each infrared detection element at a predetermined temperature and a difference between outputs of the infrared detection elements at two high and low temperatures. That is, gain correction is performed to correct irregularities in gain.
【0003】上述したオフセット補正及びゲイン補正
は、赤外線2次元センサーの含む数多くの赤外線センサ
間の画素感度のバラツキ補正として、特に欠陥画素が存
在しなくとも実施される。しかしながら、ある赤外線セ
ンサの画素感度が所定のスレッショルドを下廻り、他の
赤外線センサの画素感度に比して著しく低くて欠陥画素
である場合には、撮像された2次元熱画像の含む欠陥画
素対応の画素アドレスに対しては、上述したオフセット
補正およびゲイン補正を劣化なく実行させるための補正
値を付与しなければならない。このため、スレッショル
ドを超えない欠陥画素の抽出を、出荷前はもとより、経
時変化に対応して随時確認することが必要となる。従来
は、このような画素欠陥補正は手動で行われている。[0003] The above-described offset correction and gain correction are performed as a correction of variation in pixel sensitivity among a number of infrared sensors including an infrared two-dimensional sensor, even if there is no defective pixel. However, if the pixel sensitivity of a certain infrared sensor is lower than a predetermined threshold and is significantly lower than the pixel sensitivity of another infrared sensor and the pixel is defective, the defective pixel corresponding to the defective pixel included in the captured two-dimensional thermal image is used. A correction value for executing the above-described offset correction and gain correction without deterioration must be given to the pixel address. For this reason, it is necessary to check the extraction of defective pixels that do not exceed the threshold not only before shipment but also at any time in response to aging. Conventionally, such pixel defect correction is performed manually.
【0004】図2は、従来の画素欠陥補正操作の説明図
である。2次元センサーカメラシステムには、画素欠陥
補正のための処理機能が内蔵され、補正のためのキー押
下によって補正処理が行われる。この場合、図2に示す
ように、均一平面熱源を被写体とした熱画像101上の
欠陥画素を目視により確認し、確認した画素にカーソル
102を整合させ、補正のためのキーを押下する操作に
よって欠陥画素のアドレス記憶と、その補正とが行われ
ていた。FIG. 2 is an explanatory diagram of a conventional pixel defect correction operation. The two-dimensional sensor camera system has a built-in processing function for pixel defect correction, and correction processing is performed by pressing a key for correction. In this case, as shown in FIG. 2, a defective pixel on the thermal image 101 with the uniform planar heat source as a subject is visually confirmed, the cursor 102 is aligned with the confirmed pixel, and a key for correction is pressed. The address storage of the defective pixel and its correction have been performed.
【0005】[0005]
【発明が解決しようとする課題】上述した従来の赤外線
2次元センサーカメラシステムにおける画素欠陥は、欠
陥画素を目視によって確認し、さらに補正処理は手動操
作によって行っていたため、欠陥画素の補正の正確性と
迅速性とに欠けるという問題点があった。The pixel defect in the above-described conventional infrared two-dimensional sensor camera system is such that the defective pixel is visually checked, and the correction process is performed by a manual operation. And lack of quickness.
【0006】本発明の目的は、上述した問題点を解決
し、欠陥画素の正確性と迅速性とを確保した赤外線2次
元センサーカメラシステムにおける自動画素欠陥補正装
置を提供することにある。SUMMARY OF THE INVENTION It is an object of the present invention to provide an automatic pixel defect correction apparatus for an infrared two-dimensional sensor camera system which solves the above-mentioned problems and ensures the accuracy and speed of defective pixels.
【0007】[0007]
【課題を解決するための手段】本発明は、上記の目的を
達成するために次のような手段構成を有する。本発明の
装置は、赤外線2次元センサーカメラシステムの自動画
素欠陥補正装置において、均一平面熱源を被写体として
赤外線2次元センサで撮像した2次元熱画像データの含
む画像欠陥の生起源たる欠陥画素を、画素感度が所定の
スレッショルド以下の画素特定に基づいて抽出し、抽出
した欠陥画素に対する補正値を自動的に設定して欠陥画
素の影響を排除する補正を行う第1の補正手段と、前記
第1の補正手段による補正後に全画素を対象としたオフ
セット補正とゲイン補正を自動的に施して撮像した2次
元熱画像の画質の均一性を確保する補正を行う第2の補
正手段とを備えた構成を有する。The present invention has the following means in order to achieve the above object. The device of the present invention is an automatic pixel defect correction device of an infrared two-dimensional sensor camera system, wherein a defective pixel which is the origin of an image defect included in two-dimensional thermal image data captured by an infrared two-dimensional sensor with a uniform planar heat source as a subject, First correction means for extracting based on the identification of a pixel whose pixel sensitivity is equal to or lower than a predetermined threshold, and automatically setting a correction value for the extracted defective pixel to eliminate the influence of the defective pixel; And a second correction means for automatically performing offset correction and gain correction for all pixels after correction by the correction means, and performing correction for ensuring uniformity of image quality of the captured two-dimensional thermal image. Having.
【0008】また、本発明の装置は、前記第1の補正手
段による補正値は、抽出した欠陥画素の上下及び左右の
4画素の画素感度の平均値として設定する構成を有す
る。Further, the apparatus of the present invention has a configuration in which the correction value by the first correction means is set as an average value of the pixel sensitivities of the four pixels above, below, and left and right of the extracted defective pixel.
【0009】[0009]
【発明の実施の形態】赤外線2次元センサーカメラシス
テムにおける従来の自動画素欠陥補正は、オペレータの
目視による欠陥画素の特定を前提とし、特定した欠陥画
素の画素アドレスに対して、システム内蔵の補正機能を
手動操作で駆動して実行していたので、補正の正確性と
迅速性とに欠けるという問題点があった。DESCRIPTION OF THE PREFERRED EMBODIMENTS Conventional automatic pixel defect correction in an infrared two-dimensional sensor camera system is based on the premise that a defective pixel is specified visually by an operator, and a correction function built in the system is applied to the pixel address of the specified defective pixel. Has been driven and executed by manual operation, so that there has been a problem that accuracy and speed of correction are lacking.
【0010】本発明では、取得した2次元熱画像を格納
するフレームメモリの画像データを調べることより自動
的に欠陥画素の画像アドレスを特定し、この欠陥画素に
対応した補正値を自動的に設定したのちオフセット補正
とゲイン補正とを施すことにより、画像生成における均
一性を確保する補正の正確性と迅速性を著しく増大する
ことを実施の形態としている。According to the present invention, the image address of the defective pixel is automatically specified by examining the image data of the frame memory storing the acquired two-dimensional thermal image, and the correction value corresponding to the defective pixel is automatically set. In the embodiment, after the offset correction and the gain correction are performed, the accuracy and speed of the correction for securing uniformity in image generation are significantly increased.
【0011】[0011]
【実施例】次に、本発明について図面を参照して詳細に
説明する。図1は、本発明の一実施例の構成を示すブロ
ック図である。図1に示す実施例は、赤外線センサを2
次元配列し、かつCCD等の出力回路と組合わせて成る
2次元センサーユニット1と、全画素を対象とするオフ
セット補正及びゲイン補正を含む感度補正に加えて欠陥
画素に対する補正を施す欠陥補正/感度補正回路2と、
2次元センサーユニット1で取得した2次元熱画素デー
タを所定のフレーム単位で格納するフレームメモリ3
と、全画素を対象とするオフセット補正及びゲイン補正
のための補正プログラムと欠陥画素に対する補正値算出
のためのプログラムとを内蔵して欠陥補正/感度補正回
路2に対する補正制御を行うとともに、共有のバスライ
ンを介して各構成要素と接続し、全体動作を制御するC
PU4と、レンズ5とを備え、図1には尚、レンズ5を
介して2次元センサーユニット1に補正のための均一熱
分布被写体を提供する均一平面熱源6を併記して示す。Next, the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram showing the configuration of one embodiment of the present invention. The embodiment shown in FIG.
A two-dimensional sensor unit 1 arranged in a two-dimensional manner and combined with an output circuit such as a CCD, and a defect correction / sensitivity for correcting a defective pixel in addition to sensitivity correction including offset correction and gain correction for all pixels A correction circuit 2;
A frame memory 3 for storing the two-dimensional thermal pixel data acquired by the two-dimensional sensor unit 1 in a predetermined frame unit
A correction program for offset correction and gain correction for all pixels and a program for calculating a correction value for defective pixels are built in, and the correction control for the defect correction / sensitivity correction circuit 2 is performed. C that connects to each component via a bus line and controls the overall operation
FIG. 1 also shows a uniform planar heat source 6 that includes a PU 4 and a lens 5 and provides a uniform heat distribution subject for correction to the two-dimensional sensor unit 1 via the lens 5.
【0012】その1の補正は、2次元熱画像データに含
まれる欠陥画素対応の画素欠陥に対する補正である。カ
ップルチェッカ等の均一平面熱分布を提供する被写体と
しての均一平面熱源をレンズ5、2次元センサーユニッ
ト1により撮像した2次元熱画像データは、バスライン
を介してCPU4の制御の下にフレームメモリ3にフレ
ーム単位で格納される。CPU4は、フレームメモリ3
に格納されるフレーム単位ごとの2次元熱画像データに
対して、所定のスレッショルドを超えない画素感度のも
のを欠陥画素として画素アドレスを特定し、当該欠陥画
素の前後、左右の4画素の画素感度の平均値を求めて、
これをあるべき推定画素感度を表現する補正値として設
定し、この補正値を欠陥補正/感度補正回路2に欠陥画
素の画素アドレスとともに供給して、2次元センサーユ
ニット1からの入力に対する画素欠陥補正を可能ならし
める。The first correction is a correction for a pixel defect corresponding to a defective pixel included in the two-dimensional thermal image data. Two-dimensional thermal image data obtained by imaging a uniform planar heat source as a subject providing a uniform planar heat distribution, such as a couple checker, with the lens 5 and the two-dimensional sensor unit 1 is transmitted to the frame memory 3 under the control of the CPU 4 via the bus line. Is stored in frame units. The CPU 4 stores the frame memory 3
For the two-dimensional thermal image data for each frame unit stored in the pixel address, a pixel address having a pixel sensitivity not exceeding a predetermined threshold is specified as a defective pixel, and pixel sensitivities of four pixels before, after, left and right of the defective pixel are determined. Find the average value of
This is set as a correction value representing an estimated pixel sensitivity that should be present, and this correction value is supplied to the defect correction / sensitivity correction circuit 2 together with the pixel address of the defective pixel to correct the pixel defect with respect to the input from the two-dimensional sensor unit 1. Make it possible.
【0013】その2の補正は、2次元センサーユニット
1の含む個々の赤外線センサ間の感度のバラツキの補正
である。この補正は、前述したその1の補正に引続いて
行われることにより、補正の精度が著しく増大する。こ
の補正は、2次元センサーユニット1の有する各センサ
ーユニット間の感度バラツキの補正を対象とし、CPU
の内蔵プログラムの制御の下にフレームメモリ3から読
み出されるフレーム単位の2次元熱画像データを対象と
して欠陥補正/感度補正回路2で行われ、補正された2
次元画像データはフレームメモリ3に格納される。The second correction is a correction of sensitivity variations among the individual infrared sensors included in the two-dimensional sensor unit 1. Since this correction is performed subsequently to the above-described first correction, the accuracy of the correction is significantly increased. This correction is intended for correction of sensitivity variations among the sensor units of the two-dimensional sensor unit 1 and is performed by the CPU.
Is performed by the defect correction / sensitivity correction circuit 2 for the two-dimensional thermal image data in units of frames read out from the frame memory 3 under the control of the built-in program.
The dimensional image data is stored in the frame memory 3.
【0014】オフセット補正及びゲイン補正それ自体
は、例えば低温と高温での2温度が得られる均一平面熱
源を用意し、それぞれの温度ごとの均一平面熱画像を画
面一杯にデフォーカスした所定数フレームを対象とし、
これらからノイズを除去した熱画像の周辺部をカットし
た中心部の平均値から得られる低温と高温のデータを基
準値とし、各画素ごとにゲイン(傾き)とオフセット
(温度差)を所定の計算式により求め、全画素ごとの補
正値を記憶媒体に書き込んでおく等の公知の手法で実行
される。こうして、自動的な画素欠陥補正を含む画像補
正を、著しく正確かつ迅速に行うことができる。For offset correction and gain correction itself, for example, a uniform plane heat source capable of obtaining two temperatures of low and high temperatures is prepared, and a predetermined number of frames in which a uniform plane thermal image for each temperature is defocused to the full screen are prepared. Subject to
The gain (slope) and offset (temperature difference) are calculated for each pixel by using low-temperature and high-temperature data obtained from the average value of the central part obtained by cutting the peripheral part of the thermal image from which noise has been removed as reference values. The correction is performed by a known method, such as by using a formula, and writing the correction value for each pixel in a storage medium. In this way, image correction, including automatic pixel defect correction, can be performed significantly more accurately and quickly.
【0015】[0015]
【発明の効果】以上説明したように本発明は、赤外線2
次元センサーカメラシステムにおいて、取得したフレー
ムごとの2次元熱画像データの含む欠陥画素対応の熱画
像欠陥に対して自動的に補正を施すことを可能とするこ
とにより、補正処理の正確性と迅速性を著しく増大しう
る効果を有する。As described above, according to the present invention, the infrared rays 2
In a two-dimensional sensor camera system, it is possible to automatically correct thermal image defects corresponding to defective pixels included in the acquired two-dimensional thermal image data for each frame, thereby improving the accuracy and speed of the correction process. Has an effect that can be significantly increased.
【図1】本発明の一実施例の構成を示すブロック図であ
る。FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.
【図2】従来の画素欠陥補正操作の説明図である。FIG. 2 is an explanatory diagram of a conventional pixel defect correction operation.
1 2次元センサーユニット 2 欠陥補正/感度補正回路 3 フレームメモリ 4 CPU 5 レンズ 6 均一平面熱源 Reference Signs List 1 2D sensor unit 2 Defect correction / sensitivity correction circuit 3 Frame memory 4 CPU 5 Lens 6 Uniform planar heat source
Claims (2)
元センサで撮像した2次元熱画像データの含む画像欠陥
の生起源たる欠陥画素を、画素感度が所定のスレッショ
ルド以下の画素特定に基づいて抽出し、抽出した欠陥画
素に対する補正値を自動的に設定して欠陥画素の影響を
排除する補正を行う第1の補正手段と、前記第1の補正
手段による補正後に全画素を対象としたオフセット補正
とゲイン補正を自動的に施して撮像した2次元熱画像の
画質の均一性を確保する補正を行う第2の補正手段とを
備えることを特徴とする赤外線2次元センサーカメラシ
ステムの自動画素欠陥補正装置。1. A defective pixel which is a source of an image defect included in two-dimensional thermal image data captured by an infrared two-dimensional sensor with a uniform planar heat source as a subject is extracted based on the identification of a pixel having a pixel sensitivity equal to or lower than a predetermined threshold. A first correction unit for automatically setting a correction value for the extracted defective pixel to perform a correction for eliminating the influence of the defective pixel, and an offset correction for all pixels after the correction by the first correction unit. An automatic pixel defect correction apparatus for an infrared two-dimensional sensor camera system, comprising: a second correction unit for automatically performing gain correction and performing correction for ensuring uniformity of image quality of a captured two-dimensional thermal image. .
出した欠陥画素の上下及び左右の4画素の画素感度の平
均値として設定するものであることを特徴とする請求項
1記載の赤外線2次元センサーカメラシステムの自動画
素欠陥補正装置。2. The infrared ray according to claim 1, wherein the correction value set by the first correction unit is set as an average value of pixel sensitivities of four pixels above, below, and left and right of the extracted defective pixel. Automatic pixel defect correction device for 2D sensor camera system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23718196A JPH1062257A (en) | 1996-08-20 | 1996-08-20 | Automatic pixel defect correction device for infrared two-dimensional sensor camera system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23718196A JPH1062257A (en) | 1996-08-20 | 1996-08-20 | Automatic pixel defect correction device for infrared two-dimensional sensor camera system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH1062257A true JPH1062257A (en) | 1998-03-06 |
Family
ID=17011581
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23718196A Pending JPH1062257A (en) | 1996-08-20 | 1996-08-20 | Automatic pixel defect correction device for infrared two-dimensional sensor camera system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1062257A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2385225A (en) * | 2002-01-31 | 2003-08-13 | Samsung Thales Co Ltd | Defect detecting method in infrared thermal imaging system. |
| JP2007174112A (en) * | 2005-12-20 | 2007-07-05 | Sumitomo Electric Ind Ltd | Far-infrared imaging device and output value correction method |
| US7978383B2 (en) | 2005-12-20 | 2011-07-12 | Fujitsu Semiconductor Limited | Image processing circuit and image processing method |
| WO2012137316A1 (en) * | 2011-04-06 | 2012-10-11 | トヨタ自動車株式会社 | Thermal image smoothing method, surface temperature-measuring method, and surface temperature-measuring device |
| CN103033270A (en) * | 2012-12-17 | 2013-04-10 | 无锡艾立德智能科技有限公司 | Thermal infrared imager inhomogeneous correction coefficient generation and control method |
| US20140324392A1 (en) * | 2013-04-24 | 2014-10-30 | Seiko Epson Corporation | Physical quantity detection circuit, physical quantity detector, electronic apparatus and moving object |
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1996
- 1996-08-20 JP JP23718196A patent/JPH1062257A/en active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2385225A (en) * | 2002-01-31 | 2003-08-13 | Samsung Thales Co Ltd | Defect detecting method in infrared thermal imaging system. |
| KR100423061B1 (en) * | 2002-01-31 | 2004-03-12 | 삼성탈레스 주식회사 | Method for detecting defect in thermal image system |
| GB2385225B (en) * | 2002-01-31 | 2004-05-19 | Samsung Thales Co Ltd | Defect detecting method in infrared thermal imaging system |
| JP2007174112A (en) * | 2005-12-20 | 2007-07-05 | Sumitomo Electric Ind Ltd | Far-infrared imaging device and output value correction method |
| US7978383B2 (en) | 2005-12-20 | 2011-07-12 | Fujitsu Semiconductor Limited | Image processing circuit and image processing method |
| WO2012137316A1 (en) * | 2011-04-06 | 2012-10-11 | トヨタ自動車株式会社 | Thermal image smoothing method, surface temperature-measuring method, and surface temperature-measuring device |
| JP5655941B2 (en) * | 2011-04-06 | 2015-01-21 | トヨタ自動車株式会社 | Thermal image smoothing method, surface temperature measuring method, and surface temperature measuring apparatus |
| US9129368B2 (en) | 2011-04-06 | 2015-09-08 | Toyota Jidosha Kabushiki Kaisha | Thermal image smoothing method, surface temperature-measuring method, and surface temperature-measuring device |
| CN103033270A (en) * | 2012-12-17 | 2013-04-10 | 无锡艾立德智能科技有限公司 | Thermal infrared imager inhomogeneous correction coefficient generation and control method |
| US20140324392A1 (en) * | 2013-04-24 | 2014-10-30 | Seiko Epson Corporation | Physical quantity detection circuit, physical quantity detector, electronic apparatus and moving object |
| US10545165B2 (en) * | 2013-04-24 | 2020-01-28 | Seiko Epson Corporation | Physical quantity detection circuit, physical quantity detector, electronic apparatus and moving object |
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