JPH1073486A - Phosphor optical property measuring device and phosphor optical property measuring method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To measure an entire spectral radiation flux emitted from fluorescence of a phosphor sample of even a thin film or a film not so thick, by setting fluorescence-measuring integrating spheres at the side where an excitation light is projected and at the opposite side. SOLUTION: A phosphor sample 10 is let to emit light by an excitation light 2 from a light source 1. At this time, a spectral radiation illuminance EA (λ) when only an integrating sphere 4 at the side where the excitation light is projected is set is measured by a measuring device 5. A spectral radiation illuminance EB (λ) when only an integrating sphere 9 at the side opposite to the projection side is mounted is measured by a measuring device 8. A spectral radiation flux PA (λ) of fluorescence at the projection side and a spectral radiation flux PB (λ) at the opposite side are obtained according to equations PA (λ)=EA (λ).QA (λ) and PB (λ)=EB (λ).QB (λ). In the equations, the QA (λ) is a spectral efficiency of the integrating sphere 4 and QB (λ) is a spectral efficiency of the integrating sphere 9. Accordingly, the spectral radiation flux can be measured without omission.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a phosphor optical characteristic measuring device and a phosphor optical characteristic measuring method used for a fluorescent lamp and a display device.

[0002]

2. Description of the Related Art Phosphors are used in various industries, and the required optical characteristics are various, such as those relating to excitation / emission wavelengths and those relating to time characteristics of fluorescence emission. However, the luminous efficiency is the most important as the basic optical characteristic of the phosphor, and the luminous efficiency of the phosphor is determined by various methods. As a method for evaluating the luminous efficiency of a phosphor, a phosphor is irradiated with excitation light having a specific wavelength and a specific intensity, and the spectral radiance (luminance) and the spectral radiant flux (luminous flux) in a specific direction in fluorescent light emission are measured.
Is measured, the luminous efficiency of the phosphor can be determined.

[0003] In a conventional method, in a measuring device for measuring radiance (luminance) in a specific direction by irradiating excitation light having a specific wavelength and specific intensity, a comparative measurement with a standard phosphor is performed.
Instead of measuring the phosphor efficiency relatively, or measuring the radiance (luminance) in a specific direction, there is a method of relatively measuring the spectral radiant flux (luminous flux) of the fluorescent light emission using an integrating sphere. Recently, a method for measuring the absolute value of the efficiency of a phosphor has been invented (Japanese Patent Application No. 8-42573).

[0004]

However, most of the above-mentioned conventional methods measure fluorescence emission only at the excitation light incident side. Therefore, when a phosphor is evaluated, a specific thickness is required. It was necessary to compress or condense the phosphor powder. When phosphors are actually used, since the phosphors are used in a thin film or in a thin state, the fluorescent light is emitted on the excitation light incident side and on the opposite side. In an apparatus that measures fluorescence emission only on the excitation light incident side, the luminous efficiency in a state where an actual phosphor is used cannot be measured accurately.

Further, an apparatus for measuring the spectral radiance (luminance) in a specific direction on the incident side of the excitation light and on the side opposite to the excitation light is used. Since the light distribution characteristics (spatial distribution characteristics of spectral radiance (luminance)) are governed by the thickness of the sample and the particle size of the phosphor, the sample thickness and the particle size of the phosphor are not objective. Could not be evaluated.

[0006]

In order to solve the above-mentioned problems, an integrating sphere for measuring fluorescence emission on the excitation light projection side and an integrating sphere for measuring fluorescence emission on the side opposite to the excitation light, having specific shapes, are used. According to the specific measurement procedure, the inner wall spectral irradiance (illuminance) of the integrating sphere for measuring the fluorescence emission on the excitation light projection side and the integrating sphere for measuring the fluorescence emission on the side opposite to the excitation light generated by the fluorescence emission on the excitation light projection side is measured. By performing a specific calculation based on the measured value of and the spectral efficiency of the integrating sphere, a spectral radiant flux corresponding to the fluorescence emission energy can be obtained, and the above problem can be solved.

When a spectral radiant flux P (λ) is incident at an arbitrary position and in an arbitrary direction on an integrating sphere having a spectral efficiency of Q (λ), it is uniform on the inner wall surface of the integrating sphere due to mutual reflection in the integrating sphere. A high spectral irradiance E (λ). At this time,
Q (λ), P (λ), and E (λ) can be expressed by (Equation 7).

(Equation 7) P (λ) = E (λ) · Q (λ) In equation (7), the spectral irradiance E (λ) is uniform on the inner wall surface of the integrating sphere. The spectral radiation flux P (λ) incident on the integrating sphere can be obtained from (Equation 7) by providing a photometric window inside and measuring the spectral irradiance E (λ) on the photometric window from the photometric window. it can. Q (λ) can be theoretically determined from the design conditions of the integrating sphere, the inner wall surface reflectance, and the like. The spectral reflectance of the inner wall is ρ (λ), the spectral efficiency of an integrating sphere having an area s _i and a window of reflectance ρ _i (λ) (i = 1, 2,... N; n> 0) Q (λ) can be obtained by (Equation 8).

(Equation 8) Q (λ) = q1 / q2 where q1 = ρ ′ (λ) and q2 = S · {1−ρ ′ (λ)}.

Here, ρ ′ (λ) is the average reflectance of the inner wall surface of the integrating sphere, and can be obtained by the following equation.

[0011]

(Equation 1)

Therefore, when the excitation light is made incident on the phosphor to emit fluorescence, the integrating sphere is mounted only on the excitation light incident side, and the spectral irradiance on the inner wall surface of the integrating sphere is measured. The spectral radiant flux of the fluorescence emission on the excitation light incident side can be measured by Expression 7). At this time, in order to prevent the excitation light from being blocked by the integrating sphere, an excitation light inlet is provided on the wall of the integrating sphere on the excitation light incident side, which is an optical path of the excitation light when the integrating sphere phosphor sample is mounted. Similarly, by installing an integrating sphere only on the side opposite to the excitation light incident side, the spectral radiant flux of the fluorescent light emission on the side opposite to the excitation light incident side can be measured.

The calibration of the device for measuring the spectral irradiance on the inner wall surface of the integrating sphere and the measurement of the efficiency of the integrating sphere on the excitation light incident side and on the side opposite to the excitation light incident side can be performed individually. Can also be calibrated.
When Expression (7) is replaced with the spectral radiant flux P (λ) and the spectral irradiance measurement output i (λ) in the integrating sphere, Expression (9) is obtained.

(Equation 9) P (λ) = i (λ) · K (λ) In Equation (9), K (λ) comprehensively includes the integrating sphere efficiency and the device coefficient of the spectral irradiance measuring device. This is the device coefficient of the integrating sphere. Therefore, by determining K (λ) in advance, the spectral irradiance measurement output i (λ) is measured,
The spectral radiant flux P (λ) can be determined. In order to obtain K (λ), if the spectral irradiance measurement output i (λ) when P (λ) measured in advance is made incident on the inner wall surface of the integrating sphere, (1)
0).

(Equation 10) K (λ) = P (λ) / i (λ) The integrating sphere on the excitation light incident side is an integrating sphere A, the integrating sphere on the opposite side to the excitation light incident side is an integrating sphere B, and If the integrating sphere only attached to the phosphor sample of the integrating sphere inner wall surface illuminance each E _a (λ), and E _B (λ). Further, the illuminances on the inner wall surface of the integrating sphere when the integrating sphere A and the integrating sphere B are mounted at the same time are E ′ _A (λ) and E ′ _B (λ).

At this time, E ′ _A (λ) is the spectral amount of the incident light of the spectral radiant flux from the integrating sphere B transmitted from the phosphor sample, in addition to the spectral radiant flux of the fluorescent light emission on the excitation light incident side. Irradiance is increased. E ' _B (λ) is E'
Contrary to _A (λ), in addition to the spectral radiant flux of the fluorescence emission on the side opposite to the excitation light incident side, the spectral irradiance corresponding to the incidence of the spectral radiant flux from the integrating sphere A transmitted from the phosphor sample Are increased, and these are represented by (Equation 11).

(Equation 11) E ′ _A (λ) = E _A (λ) + ｛(E ′ _B (λ) · τ (λ) ·
_{s com) / Q A (λ} )} E 'B (λ) = E B (λ) + {(E' A (λ) · τ (λ) ·
s _com ) / Q _B (λ)｝ where τ (λ) represents the spectral transmittance of the phosphor sample, and s _com is the fluorescence emission measurement when integrating sphere A and integrating sphere B are attached to the phosphor sample. The area of the common transmissive part of the mouth. In other words, the area of the integrating sphere A and the area of the integrating sphere B that transmits the transmitted light flux of the phosphor sample are shown. Therefore, the spectral transmittance τ (λ) of the phosphor sample is (1
From (Expression 1), it can be expressed by (Expression 12).

(Equation 12) τ (λ) = {Q _A (λ) · (E ′ _A (λ) −E _A (λ))} / ｛s
_com · E ′ _B (λ)} or τ (λ) = {Q _B (λ) · (E ′ _B (λ) −E _B (λ))} / ｛s
_com · E ' _A (λ)｝ (where τ (λ) is the spectral transmittance of the phosphor sample, s
_com is the area of the common transmission portion of the fluorescence emission measurement port when integrating sphere A and integrating sphere B are attached to the phosphor sample, E
_A (λ) is the spectral irradiance on the inner wall surface of the integrating sphere A when only the integrating sphere A is mounted on the phosphor sample, and E ′ _A (λ) is that the integrating sphere A and the integrating sphere B are simultaneously used as the phosphor sample. Spectral irradiance on the inner wall surface of the integrating sphere A when mounted, E _B (λ) is the spectral irradiance on the inner wall surface of the integrating sphere B when only the integrating sphere B is mounted on the phosphor sample, E ′ _B (λ) is the spectral irradiance on the inner wall of the integrating sphere B when the integrating sphere A and the integrating sphere B are simultaneously mounted on the phosphor sample.

From the equation (12), the measurement accuracy can be improved by taking the arithmetic mean of each τ (λ) as expressed by the equation (2).

In the equation (2), calibration of an apparatus for measuring the spectral irradiance of the inner wall surface of the integrating sphere on the excitation light incident side and on the side opposite to the excitation light incident side, measurement of the integrating sphere efficiency, and s _com
Can be measured individually, but can be determined collectively by the following procedure. Spectral transmittance is t (λ)
The diffuse transmission plate is replaced instead of the phosphor sample, by using the light from a fluorescent emission wavelength, instead of projecting an excitation light, E _A (lambda) in the above _{means, E 'A (λ),} E B ( When λ) and E ′ _B (λ) are measured, the relationship of (Expression 13) is established from the expression (12).

(Equation 13) t (λ) = ｛(Q _A (λ) / s _com ) · (E ′ _A (λ) −E
_A (λ))｝ / E ′ _B (λ) or t (λ) = ｛(Q _B (λ) / s _com ) · (E ′ _B (λ) -E
_B (λ))｝ / E ′ _A (λ) (Equation 13), the device output i of the spectral radiant flux measuring means
If the relationship between (λ) and the spectral irradiance E (λ) is replaced by (Expression 14), (Expression 13) can be transformed as (Expression 15).

(Equation 14) E (λ) = k (λ) i (λ) (Equation 15) (Q _A (λ) / s _com ) (k _A (λ) / k _B (λ)) = ｛T
(λ) · i ′ _B (λ)｝ / {i ′ _A (λ) −i _A (λ))} or (Q _B (λ) / s _com ) · (k _B (λ) / k _A ( λ)) = ｛t
(λ) · i ′ _A (λ)｝ / {(i ′ _B (λ) −i _B (λ))} (Equation 15) is replaced with T _A (λ) and T _B (λ), respectively. , (15) becomes (6). Also, (Equation 2)
Can be replaced by (Equation 5). According to (Equation 5) and (Equation 6), it is not necessary to measure the spectral irradiance and only to measure the output of the spectrometry means which does not need to calibrate the spectrometry means. Spectral transmission characteristics can be measured.

[0023]

BEST MODE FOR CARRYING OUT THE INVENTION

(First Embodiment) FIG. 1 is a schematic diagram of a phosphor optical characteristic measuring apparatus according to a first embodiment of the present invention, and FIG. 2 is a phosphor optical characteristic according to the first embodiment of the present invention. It is a figure showing a measuring procedure of a measuring device.

In FIG. 1, 1 is a phosphor excitation light projection light source, 2 is a phosphor excitation light, 3 is a phosphor excitation light spectral radiant flux measuring device, 4 is an integrating sphere A, 5 is an integrating sphere A inner wall spectral radiation. Illuminance measuring device, 6 is an integrating sphere A moving device, 7 is an integrating sphere B moving device, 8 is an integrating sphere B inner wall surface spectral irradiance measuring device, 9 is an integrating sphere B, 10 is a phosphor sample, and 11 is excitation light projection. A side fluorescent light emission, 12 is an excitation light projection side opposite side fluorescent light emission, 13 is an arithmetic unit, 14 is a storage device, and 15 is a display device.

The integrating sphere A4 is provided with excitation light introduction light on the phosphor excitation light optical path 2. In addition, integrating sphere A4 and integrating sphere B
5 has a fluorescence emission measurement port having a shape and dimensions, and is located at a symmetrical position across the phosphor sample 10 when the phosphor sample 10 is measured. The size of the phosphor excitation light 2 projected from the phosphor excitation light source 1 is large enough to be in the fluorescence emission measurement port of the phosphor excitation light spectral radiant flux measuring device 3 and the integrating sphere A4.

The integrating sphere A4 can be freely attached / detached by the integrating sphere A moving device 6 and the integrating sphere B9 can be freely attached / detached by the integrating sphere B moving device 7. The ball B moving device 7 is the arithmetic device 1
3 is controlled.

The integrating sphere A inner wall surface spectral irradiance measuring device 5 measures the spectral irradiance on the integrating sphere A inner wall surface, and the integrating sphere B inner wall spectral irradiance measuring device 8 measures the spectral irradiance on the integrating sphere B inner wall surface. , Respectively, and the output is sent to the arithmetic unit 13.

The phosphor excitation light spectral radiant flux measuring device 3 can measure the spectral radiant flux of the phosphor excitation light 2 projected from the phosphor excitation light source 1, and its output is sent to the arithmetic unit 13. The storage device 14 has an integrating sphere A4 and an integrating sphere B9.
The spectral efficiency data Q _A (λ) and Q _B (λ) are stored.

First, the phosphor excitation light source 1 is turned on, and the phosphor excitation light 2 is projected on the phosphor sample 10. The phosphor excitation light spectral radiant flux measuring device 3 is placed on the optical path of the phosphor excitation light 2, measures the spectral radiant flux of the phosphor excitation light 2, and outputs the measured spectral radiant flux to the arithmetic device 13. Body excitation light 2
Are stored in the storage device 14.

Next, the phosphor excitation light spectral radiant flux measuring device 3
Is moved from the optical path of the phosphor excitation light 2 to the arithmetic unit 13
Controls the integrating sphere A moving device 6 to attach the integrating sphere A4 to the phosphor sample 10, and controls the detachable integrating sphere B moving device 7 to detach the integrating sphere B9 from the phosphor sample 10 (see FIG. 2). (State of (a)), the inner wall spectral irradiance E _A (λ) of the inner wall surface of the integrating sphere A4 by the excitation light projecting side fluorescent light emission 11 in the phosphor sample 10 is measured by the integrating sphere A inner wall spectral irradiance measuring device 5. .

The measuring device 5 for spectral irradiance on the inner wall surface of the integrating sphere A outputs the data on the spectral irradiance E _A (λ) to the arithmetic unit 13, and the arithmetic device 13 stores the data on the spectral irradiance E _A (λ). 14 is stored. Similarly, the arithmetic device 13 controls the integrating sphere A moving device 6 and the integrating sphere B moving device 7 to move the integrating sphere A4 and the integrating sphere B9 (the state shown in FIG. The inner wall spectral irradiance E _B (λ) of the integrating sphere B due to the fluorescent light emission 12 on the side opposite to the excitation light projecting side of the sample 10 is measured by the integrating sphere B inner wall spectral irradiance measuring device 8, and the integrating sphere B inner wall spectral analysis is performed. The irradiance measuring device 8 calculates the data of the spectral irradiance E _B (λ) by the arithmetic unit 1.
3 and the arithmetic unit 13 stores the data of the spectral irradiance E _B (λ) in the storage unit 14.

The arithmetic unit 13 stores the spectral irradiance measurement data E _A (λ) and E _B stored in the storage unit 14.
By using (λ) and the integrating sphere spectral efficiency data Q _A (λ) and Q _B (λ), the following equation (1) is used to calculate the spectral radiant flux data P _A ( λ) and the spectral radiant flux data P _B (λ) of the fluorescent light emission 12 on the side opposite to the excitation light projection side are obtained and stored in the storage device 14. The display device 15 is a storage device 14
The spectral radiant flux data of the phosphor excitation light 2 and the spectral radiant flux data P of the fluorescent light emission 11 on the excitation light projection side stored in
_A (λ) and the spectral radiant flux data P _B (λ) of the fluorescent light emission 12 on the side opposite to the excitation light projection side are displayed.

As described above, in the present embodiment, even if the sample is a thin film or a phosphor sample having a small thickness, the total spectral radiant flux of the fluorescence emitted from the phosphor sample can be measured without fail. It is possible to obtain the phosphor efficiency with high accuracy.

Further, it is possible to evaluate a phosphor in a practical use form, such as a thin film or a phosphor having a small thickness, and the present invention enables an optimum design for utilizing a phosphor.

As the inner wall surfaces of the integrating sphere A and the integrating sphere B, it is preferable to use a diffuse reflection material having a low reflectance characteristic in the excitation light wavelength band and a high reflectance characteristic in the fluorescence emission band. .

As a material used for the inner wall surfaces of the integrating sphere A and the integrating sphere B, alumina (Al ₂ O ₃ ) is preferably used.

A light-shielding plate having the same material as that of the inner wall surface of the integrating sphere may be provided in front of the light receiving windows of the spectral irradiance measuring devices of the integrating spheres A and B.

(Second Embodiment) FIG. 3 shows a second embodiment of the present invention.
It is a figure which shows the measurement procedure of the fluorescent substance optical characteristic measuring apparatus which is Embodiment of this invention. The second embodiment has the device configuration and the operation procedure described in the first embodiment, and performs a specific operation by adding a procedure described below, thereby obtaining the fluorescence emission of the phosphor sample. The spectral transmission characteristics of the phosphor sample can be measured simultaneously with the characteristics.

The storage device 14 stores area data s _com of the fluorescence emission measurement port common to the integrating sphere A4 and the integrating sphere B9.

Firstly, according to the procedure described in the first embodiment, the spectral radiant flux measurement data of the phosphor excitation light, spectral irradiance measurement data E _A (lambda), and measuring the E _B (lambda), the operation , And obtain the spectral radiant flux data P _A (λ) and P _B (λ).

Next, the arithmetic unit 13 controls the integrating sphere A moving device 6 and the integrating sphere B moving device 7 to move the integrating sphere A4 and the integrating sphere B9 (the state shown in FIG. 3). Inner wall spectral irradiance E ' _A (λ) of integrating sphere A4 and integrating sphere B
The inner wall spectral irradiance E ′ _B (λ) of No. 9 is measured by the integrating sphere A inner wall spectral irradiance measuring device 5 and the integrating sphere B inner wall spectral irradiance measuring device 8, respectively, and output to the arithmetic unit 13. Then, the arithmetic unit 13 stores the E ′ _A (λ) and E ′ _B (λ) data in the storage device 14.

The arithmetic unit 13 calculates the spectral irradiance measurement data E _A (λ), E _B (λ), and E ′ _A stored in the storage device 14.
(λ), E ′ _B (λ) and integrating sphere spectral efficiency data Q _A (λ), Q
_{By using B} (λ) and the area data s _com of the fluorescence emission measurement port of the integrating sphere, the following equation (2) is calculated to obtain the spectral transmittance data τ (λ) of the phosphor sample 10 and store it. Device 14
To memorize.

The display device 15 stores the spectral radiant flux data of the phosphor excitation light 2, the spectral radiant flux data P _A (λ) of the excitation light emitting side fluorescent light emission 11, and the excitation light projection stored in the storage device 14. Radiant flux data P of fluorescence emission 12 on the opposite side
_B (λ), spectral transmittance data τ (λ) of the phosphor sample 10
Is displayed.

As described above, in this embodiment, in addition to the effects of the first embodiment, the spectral transmittance of the phosphor sample at the time of fluorescence emission can be simultaneously measured.

(Third Embodiment) FIG. 4 shows a third embodiment of the present invention.
It is a figure which shows the calibration procedure of the phosphor optical characteristic measuring apparatus which is embodiment of 1st Embodiment.

In FIG. 4, reference numeral 4 denotes an integrating sphere A, 5 denotes a spectral irradiance measuring device for the inner wall of the integrating sphere A, 8 denotes a spectral irradiance measuring device for the inner wall of the integrating sphere B, 9 denotes an integrating sphere B, 13 denotes an arithmetic unit,
14 is a storage device, 15 is a display device, 16 is a fluorescent light emission wavelength light projection light source, 17 is a fluorescent light emission wavelength light, 18
Is a fluorescent light emission wavelength light spectral radiation flux measuring device.

The size of the phosphor fluorescence emission wavelength light 17 projected from the phosphor fluorescence emission wavelength light projection light source 16 is large enough to enter the phosphor fluorescence emission wavelength light spectral radiant flux measuring device 18. The third embodiment has the device configuration and the operation procedure described in the first embodiment or the second embodiment.

The feature of the third embodiment is that the procedure described in the first embodiment or the second embodiment measures the spectral irradiance on the inner wall surface of the integrating sphere (operation 1). Instead of using the method, the output of the photodetector of the spectral irradiance measuring device attached to the integrating sphere is measured, and the spectral radiant flux of the fluorescent light emission is obtained using the calculation represented by (Equation 3). form or instead of performing the calibration measurement and the integrating sphere spectral efficiency of spectral irradiance measurement apparatus according to the second embodiment, device coefficient in (equation 3) data _{K a (λ), K B} (λ)
Is performed using the calibration device having the configuration shown in FIG. 4 according to the procedure described below.

First, the fluorescent light emission wavelength light projection light source 16
Is turned on, and the phosphor fluorescence emission wavelength light 17 is projected onto the inner wall surface from the excitation light introduction port of the integrating sphere A4 (FIG. 4A).
State). Phosphor fluorescence emission wavelength light spectral radiation flux measuring device 1
8 is placed on the optical path of the phosphor fluorescence emission wavelength light 17 and measures the spectral radiant flux P (λ) of the phosphor fluorescence emission wavelength light 17;
The data is output to the arithmetic unit 13, and the arithmetic unit 13 stores the spectral radiant flux data P (λ) in the storage unit 14.

Next, after moving the phosphor fluorescence emission wavelength light spectral radiant flux measuring device 18 from the optical path of the phosphor fluorescence emission wavelength light 17, the device output i of the integrating sphere A inner wall surface spectral irradiance measurement device 5 is obtained. Measure _A (λ). The integrating sphere A inner wall spectral irradiance measuring device 5 outputs the data of i _A (λ) to the arithmetic device 13, and the arithmetic device 13 stores the data i _A (λ) in the storage device 14.

Next, phosphor fluorescent emission light 17 is projected onto the inner wall surface from the fluorescent emission measurement port of the integrating sphere B9 (the state shown in FIG. 4B), and the spectral irradiance measuring device for the inner wall of the integrating sphere B is measured. The device output i _B (λ) of No. 8 is measured.

Integrating sphere B inner wall surface spectral irradiance measuring device 8
Outputs the data of i _B (λ) to the arithmetic unit 13, and the arithmetic unit 13 stores the data i _B (λ) in the storage unit 14.

The arithmetic unit 13 uses the spectral radiant flux data P (λ) and the spectral irradiance measuring device output data i _A (λ) and i _B (λ) stored in the storage device 14. hand,
By performing an operation represented by (Equation 4), the integrating sphere A4 and the integrating sphere B9
The device coefficient data K _A (λ) and K _B (λ) are obtained and stored in the storage device 14.

When measuring a fluorescent sample, instead of measuring the spectral irradiance on the inner wall surface of the integrating sphere in the measurement procedure described in the first or second embodiment, a spectral irradiance measuring device is used. Measure the device output and (1
The measurement of the phosphor sample can be performed by the procedure of obtaining the spectral radiant flux of the fluorescent light emission by performing the calculation of (Expression 3) instead of the calculation of Expression (3).

As described above, in the present embodiment, in addition to the effects of the first embodiment and the effects of the second embodiment, the calibration data necessary for measuring the spectral radiant flux of the fluorescent light emission of the phosphor is obtained. It can be obtained by a simple procedure. In addition, since the device calibration can be performed collectively in the measurement device system, the measurement accuracy can be improved.

(Fourth Embodiment) FIG. 5 shows a fourth embodiment of the present invention.
It is a figure which shows the calibration procedure of the phosphor optical characteristic measuring apparatus which is embodiment of 1st Embodiment.

In FIG. 5, reference numeral 4 denotes an integrating sphere A, 5 denotes a spectral irradiance measuring device for the inner wall surface of the integrating sphere A, 8 denotes a spectral irradiance measuring device for the inner wall surface of the integrating sphere B, 9 denotes an integrating sphere B, and 16 denotes a fluorescent phosphor. Emission wavelength light projection light source, 17 is phosphor fluorescence emission wavelength light, 1
9 is a diffuse transmission plate. The diffuse transmission plate 19 has a spectral transmittance characteristic t (λ) and is stored in the storage device 14.

The fourth embodiment has the device configuration and the operation procedure described in the second or third embodiment. The feature of the fourth embodiment is that the second embodiment
(Equation 2) according to the third or third embodiment.
Calculating the spectral transmittance τ (λ) of the phosphor sample by performing the operation (Equation 5) instead of the operation (5), and measuring the spectral irradiance according to the second or third embodiment. Instead of performing the calibration of the sphere, measuring the spectral efficiency of the integrating sphere, and measuring the area of the fluorescence emission measurement port of the integrating sphere, the apparatus coefficient data T _A (λ) and T _B (λ) in (Equation 5) will be described below. According to the procedure, the calibration is performed using the calibration device having the device configuration of FIG.

First, the diffusion transmission plate 19 is mounted on the fluorescence emission measurement port of the integrating sphere A4. At this time, only the integrating sphere A4 is mounted on the diffusion transmission plate 19. The phosphor fluorescence emission wavelength light projection light source 16 is turned on, and the phosphor fluorescence emission wavelength light 17 is made to enter the integrating sphere A4 from the excitation light introduction port of the integrating sphere A4, and is placed on the diffusion transmission plate 19 from the fluorescence emission measurement port. By projecting (state of FIG. 5A), the device output i _A (λ) of the integrating sphere A inner wall surface spectral irradiance measuring device 5 is measured. The integrating sphere A inner wall spectral irradiance measurement device 5 outputs the data of the i _A (lambda) to the arithmetic unit 13, arithmetic unit 13 data i _A (lambda)
Is stored in the storage device 14.

Next, the integrating sphere A4 is detached from the diffusion transmission plate 19, and the fluorescence emission measurement port of the integration sphere B9 is connected to the diffusion transmission plate 19.
(The state shown in FIG. 5B), and the device output i _B (λ) is measured by the integrating sphere B inner wall surface spectral irradiance measuring device 8. The integrating sphere B inner wall spectral irradiance measuring device 8 is i _B (λ)
Is output to the arithmetic unit 13, and the arithmetic unit 13 stores the data i _B (λ) in the storage unit 14.

Next, the integrating sphere A4 is again moved to the diffusion transmission plate 19.
The mounting (the state of FIG. 5 (c)), an integrating sphere unit output i of A in wall spectral irradiance measurement device 5 _'A (lambda) and the device output i by integrating sphere B inner wall spectral irradiance measurement device 8' _B (λ) is measured, and i ′ _A (λ) and i ′ _B (λ) are similarly stored in the storage device 14.
To memorize.

Then, the arithmetic unit 13 outputs the spectral irradiance measurement device output data i stored in the storage device 14.
_A (λ), i _B (λ), i ′ _A (λ), i ′ _B (λ), and diffuse transmission plate 1
By using the spectral transmittance data t (λ) of No. 9 and the equation (6), the device coefficient data T _A (λ) and T _B (λ) of the integrating sphere A4 and the integrating sphere B9 are obtained. The information is stored in the storage device 14.

When measuring the spectral transmittance of the fluorescent sample, instead of measuring the spectral irradiance on the inner wall surface of the integrating sphere in the measurement procedure described in the second or third embodiment, the spectral irradiance is measured. Measure the device output of the measuring device,
The spectral transmittance of the phosphor sample can be measured by the procedure of performing the calculation of (Expression 5) instead of the calculation of (Expression 2).

As described above, according to the present embodiment, the second
In addition to the effects of the third embodiment and the third embodiment, calibration data required for measuring the spectral transmittance of the phosphor can be obtained by a simple procedure. In addition, since the device calibration can be performed collectively in the measurement device system, the measurement accuracy can be improved.

[0065]

As described above, according to the first aspect of the present invention, even if the sample is a thin film or a phosphor sample having a relatively small thickness, the entire spectral radiant flux of fluorescence emitted from the phosphor sample is not lost. It can be measured and the phosphor efficiency can be determined with high accuracy. Further, it is possible to evaluate a phosphor in a practical use form such as a thin film or a phosphor having a small thickness, and the present invention enables an optimum design for utilizing a phosphor.

The second invention provides, in addition to the effects of the first invention,
The spectral transmittance of the phosphor sample at the time of fluorescence emission can be measured simultaneously.

According to the third invention, in addition to the effects of the first invention and the second invention, calibration data required for measuring the spectral radiant flux of the fluorescent light emission of the phosphor can be obtained by a simple procedure. it can. In addition, since the device calibration can be performed collectively in the measurement device system, the measurement accuracy can be improved.

According to the fourth aspect, in addition to the effects of the second and third aspects, calibration data required for measuring the spectral transmittance of the phosphor can be obtained by a simple procedure. In addition, since the device calibration can be performed collectively in the measurement device system,
Measurement accuracy can be improved.

[Brief description of the drawings]

FIG. 1 is a schematic diagram of a phosphor optical characteristic measuring apparatus according to a first embodiment of the present invention.

FIGS. 2A and 2B are diagrams showing a measurement procedure of a phosphor optical characteristic measuring apparatus according to a first embodiment of the present invention.

FIG. 3 is a diagram showing a measurement procedure of a phosphor optical characteristic measuring apparatus according to a second embodiment of the present invention.

FIGS. 4A and 4B are diagrams showing a calibration procedure of a phosphor optical characteristic measuring apparatus according to a third embodiment of the present invention.

FIGS. 5A to 5C are diagrams showing a calibration procedure of a phosphor optical characteristic measuring apparatus according to a fourth embodiment of the present invention.

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 phosphor excitation light projection light source 2 phosphor excitation light 3 phosphor excitation light spectral radiant flux measuring device 4 integrating sphere A 5 integrating sphere A inner wall spectral irradiance measuring device 6 integrating sphere A moving device 7 integrating sphere B moving device 8 Integrating sphere B inner wall surface spectral irradiance measuring device 9 Integrating sphere B 10 Phosphor sample 11 Excitation light projection side fluorescence emission 12 Excitation light projection side opposite side fluorescence emission 13 Operation device 14 Storage device 15 Display device

Claims (5)

[Claims] A phosphor excitation wavelength light beam projection light source unit;
Radiant flux of light emitted from the phosphor excitation wavelength light beam projection light source unit
Measuring means, at least the excitation light inlet and the excitation projection side
Has a fluorescent emission measurement port and photometric window for introducing fluorescent light
The spectral efficiency is Q _A(λ) and the integrating sphere A
The spectral irradiance E on the inner wall of the integrating sphere A from the photometric window
_A(λ) for measuring spectral irradiance, and the integral
The moving means A of the sphere A and at least the opposite side of the excitation projection side
Has a fluorescence emission port and photometric window for introducing fluorescence emission
Spectral efficiency is Q_B(λ) and the integrating sphere B
Spectral irradiance E on the inner wall of the integrating sphere B from the photometric window
_B(λ) for measuring spectral irradiance, and the integral
Moving means B for the ball B, an arithmetic device, a storage device, and a display device
Measurement of phosphor optical characteristics characterized by comprising
An apparatus, wherein the phosphor excitation wavelength light beam projection light source unit emits a fluorescent light.
When the pull is emitted, only the integrating sphere A is fired.
Spectral irradiance measurement means when attached to optical body sample
Spectral irradiance on the inner wall of the integrating sphere A measured from A
E_A(λ) and only the integrating sphere B is attached to the phosphor sample
Before measurement by the spectral irradiance measurement means B
Spectral irradiance E on the inner wall of the integrating sphere B_B(λ) and measure
From equation (1), the fluorescence emission spectral radiant flux is calculated by the arithmetic unit.
A phosphor optical characteristic measuring device characterized by the following characteristics: (Equation 1) P_A(λ) = E_A(λ) Q_A(λ) P_B(λ) = E_B(λ) Q_B(λ) (where P_A(λ) is the fluorescence emission spectral emission on the excitation light projection side
Bunch, E_A(λ) indicates that only integrating sphere A was attached to the phosphor sample.
Irradiance on the inner wall surface of the integrating sphere A, Q _A(λ)
Is the spectral efficiency of the integrating sphere A, P_B(λ) is the side opposite to the excitation light projection side
Fluorescence emission spectral radiant flux of E_B(λ) is fluorescence of only integrating sphere B
Spectroscopy on inner wall of integrating sphere B when attached to body sample
Irradiance, Q_B(λ) is the spectral efficiency of the integrating sphere B). 2. The spectral irradiance E ′ _A (λ) on the inner wall of the integrating sphere A measured by the spectral irradiance measuring means A when the integrating sphere A and the integrating sphere B are simultaneously mounted on the phosphor sample. ,
Measuring the spectral irradiance E ′ _B (λ) on the inner wall of the integrating sphere B measured by the spectral irradiance measuring means B when the integrating sphere A and the integrating sphere B are simultaneously attached to the phosphor sample;
2. The phosphor optical characteristic measuring apparatus according to claim 1, wherein the transmission characteristic of the phosphor sample is obtained from the equation (2) by an arithmetic unit. (Equation 2) τ (λ) = 0.5 × (1 / s _com ) × [{Q _A (λ) ·
_{(E 'A (λ) -E} A (λ)) / E' B (λ)} + {Q B (λ) · (E 'B (λ) -
E _B (λ)) / E ′ _A (λ)}] (where τ (λ) is the spectral transmittance of the phosphor sample, s
_com is the area of the common transmission portion of the fluorescence emission measurement port when integrating sphere A and integrating sphere B are attached to the phosphor sample, E
_A (λ) is the spectral irradiance on the inner wall of the integrating sphere A when only the integrating sphere A is attached to the phosphor sample, and E ′ _A (λ) is the integrating sphere A and the integrating sphere B as the phosphor sample at the same time. The spectral irradiance on the inner wall surface of the integrating sphere A when mounted, and E _B (λ) is the spectral irradiance on the inner wall surface of the integrating sphere B when only the integrating sphere B is mounted on the phosphor sample, E ′ _B (λ) is the spectral irradiance on the inner wall of the integrating sphere B when the integrating sphere A and the integrating sphere B are simultaneously mounted on the phosphor sample. 3. The calculation used for measuring the spectral radiant flux (3)
A phosphor optical characteristic measuring apparatus characterized by using the following equation (1), wherein the apparatus coefficient K _A (λ) of the integrating sphere _A and the integrating sphere B
The device coefficient K _B (λ) is obtained by: a fluorescent light emission wavelength light beam projection light source unit; and a radiant flux measurement unit for the fluorescent light emission wavelength light beam projection light source unit. The apparatus has a phosphor optical characteristic measuring device constituting means, and emits a light beam whose spectral radiant flux measured by the radiant flux measuring means is P (λ) from an excitation light introduction port or a fluorescence emission measuring port. The device output i of the spectral radiant flux measuring means A and B when the light is projected on the inner wall surface of the integrating sphere A and the integrating sphere B by the fluorescence emission wavelength light beam projection light source unit.
Measured _A (lambda) and i _B (lambda), obtaining the (Equation 4) becomes device coefficient of the integrating sphere A performs calculation to the processing unit K _A (lambda) and the device coefficient of the integrating sphere B K _B (lambda) 3. The phosphor optical characteristic measuring device according to claim 1, further comprising a phosphor optical characteristic measuring device calibrating means. (Equation _{3) P A (λ) =} i A (λ) · K A (λ) P B (λ) = i B (λ) · K B (λ) ( wherein, P _A (lambda) is the excitation light Fluorescence emission spectral radiant flux on the projection side, i _A (λ) is the device output of spectral irradiance measuring means A when only integrating sphere A is mounted on the phosphor sample, K
_A (λ) is the device coefficient of the integrating sphere A, P _B (λ) is the fluorescence emission spectral radiant flux on the side opposite to the excitation light projecting side, and i _B (λ) is the case where only the integrating sphere B is attached to the phosphor sample. , The device output of the spectral irradiance measuring means B, K _B (λ) is the device coefficient of the integrating sphere B). (Equation 4) K _A (λ) = P (λ) / i _A (λ) K _B (λ) = P (λ) / i _B (λ) (where P (λ) is incident on the integrating sphere. Spectral radiant flux, i
_A (λ) is the device output of the spectral irradiance measuring means A when P (λ) is irradiated on the inner wall surface of the integrating sphere A, K _A (λ) is the device coefficient of the integrating sphere A, i _B (λ) Is P (λ) on the inner wall of integrating sphere A
Device output of the spectral irradiance measuring means B when irradiating
K _B (λ) is the device coefficient of the integrating sphere B). 4. An apparatus for measuring optical properties of a phosphor, wherein the apparatus for measuring optical properties of the phosphor according to claim 2 uses (Equation 5) as an operation for obtaining a spectral transmittance. Coefficient T _A (λ) and device coefficient T _{B of} integrating sphere _B
As means for obtaining (λ), there is provided a phosphor optical property measuring device constituting means comprising a phosphor fluorescent emission wavelength light beam projection light source unit, and a diffuse transmittance having a spectral transmittance of t (λ). Replace the plate in place of the phosphor sample,
When the fluorescent wavelength light is projected onto the diffused transmission plate by the phosphor fluorescent wavelength light beam projecting light source unit instead of the excitation light beam, the output i _A ( λ), i ′ _A (λ), i _B (λ), and i ′ _B (λ) are measured, and the device coefficient T _A (λ) of the integrating sphere A and the integration 3. The phosphor optical characteristic measuring device according to claim 2, wherein the device coefficient T _B (λ) of the sphere B is obtained. (Equation 5) τ (λ) = 0.5 × [{T _A (λ) · (i ′ _A (λ) −i _A (λ)) /
i ′ _B (λ)} + {T _B (λ) · (i ′ _B (λ) −i _B (λ)) / i ′ _A (λ)}] (where τ (λ) is a phosphor sample Spectral transmittance of T
_A (λ) is the device coefficient of the integrating sphere A, T _B (λ) is the device coefficient of the integrating sphere A, and i _A (λ) is the inner wall surface of the integrating sphere A when only the integrating sphere A is mounted on the phosphor sample. The above output of the spectral irradiance measuring means, i ′ _A (λ) is the output of the spectral irradiance measuring means on the inner wall of the integrating sphere A when the integrating sphere A and the integrating sphere B are simultaneously attached to the phosphor sample, i _B (λ) is the output of the spectral irradiance measuring means on the inner wall surface of the integrating sphere B when only the integrating sphere B is mounted on the phosphor sample, and i ′ _B (λ) is the phosphor of the integrating sphere A and the integrating sphere B simultaneously. Output of the spectral irradiance measuring means on the inner wall surface of the integrating sphere B when attached to the sample). (Equation 6) T _A (λ) = {t (λ) · i ′ _B (λ)} / (i ′ _A (λ) −i
_{A (λ)) T B (} λ) = {t (λ) · i 'A (λ)} / (i' B (λ) -i
_B (λ)) (where t (λ) is the spectral transmittance of the diffuse transmission plate, i _A (λ)
Is the output of the spectral irradiance measuring means on the inner wall surface of the integrating sphere A when only the integrating sphere A is mounted on the diffusion transmitting plate, and i ' _A (λ) is the mounting of the integrating sphere A and the integrating sphere B simultaneously on the diffusion transmitting plate. Output of the spectral irradiance measuring means on the inner wall surface of the integrating sphere A when the
i _B (λ) is the output of the spectral irradiance measuring means on the inner wall of the integrating sphere B when only the integrating sphere B is mounted on the diffuse transmission plate, i ′ _B
(λ) is the output of the spectral irradiance measuring means on the inner wall surface of the integrating sphere B when the integrating sphere A and the integrating sphere B are simultaneously mounted on the diffuse transmission plate. 5. When a fluorescent sample is emitted by projecting a phosphor excitation wavelength light beam, the spectral efficiency is Q
The spectral irradiance E _A (λ) on the inner wall surface of the integrating sphere A measured when only the integrating sphere A of _A (λ) is attached to the phosphor sample, and the spectral efficiency is Q _B (λ). were measured and certain integrating sphere B only phosphor spectral irradiance E of the sample on the integrating sphere B the inner wall surface to be measured when was mounted _{B (λ), P a (} λ) = E a (λ) _{· Q a (λ) P B} (λ) = E B (λ) · Q B (λ) phosphor optical characteristic measuring method and obtains the fluorescence emission spectral radiant flux by calculation.