JPH11142474A - 平板状被検査体試験用補助装置及びその製造方法 - Google Patents

平板状被検査体試験用補助装置及びその製造方法

Info

Publication number
JPH11142474A
JPH11142474A JP9325183A JP32518397A JPH11142474A JP H11142474 A JPH11142474 A JP H11142474A JP 9325183 A JP9325183 A JP 9325183A JP 32518397 A JP32518397 A JP 32518397A JP H11142474 A JPH11142474 A JP H11142474A
Authority
JP
Japan
Prior art keywords
substrate
auxiliary device
bump electrode
projection
protrusion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9325183A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11142474A5 (de
Inventor
Yoshie Hasegawa
義栄 長谷川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP9325183A priority Critical patent/JPH11142474A/ja
Publication of JPH11142474A publication Critical patent/JPH11142474A/ja
Publication of JPH11142474A5 publication Critical patent/JPH11142474A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP9325183A 1997-11-12 1997-11-12 平板状被検査体試験用補助装置及びその製造方法 Pending JPH11142474A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9325183A JPH11142474A (ja) 1997-11-12 1997-11-12 平板状被検査体試験用補助装置及びその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9325183A JPH11142474A (ja) 1997-11-12 1997-11-12 平板状被検査体試験用補助装置及びその製造方法

Publications (2)

Publication Number Publication Date
JPH11142474A true JPH11142474A (ja) 1999-05-28
JPH11142474A5 JPH11142474A5 (de) 2005-06-23

Family

ID=18173942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9325183A Pending JPH11142474A (ja) 1997-11-12 1997-11-12 平板状被検査体試験用補助装置及びその製造方法

Country Status (1)

Country Link
JP (1) JPH11142474A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020025024A (ko) * 2000-09-27 2002-04-03 나까무라 쇼오 인쇄회로기판 및 그 제조방법
KR101974931B1 (ko) * 2018-05-03 2019-05-03 주식회사 티에프이 반도체 패키지 테스트용 소켓 모듈

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020025024A (ko) * 2000-09-27 2002-04-03 나까무라 쇼오 인쇄회로기판 및 그 제조방법
KR101974931B1 (ko) * 2018-05-03 2019-05-03 주식회사 티에프이 반도체 패키지 테스트용 소켓 모듈

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