JPH1114320A - Dimension measuring device - Google Patents
Dimension measuring deviceInfo
- Publication number
- JPH1114320A JPH1114320A JP18736697A JP18736697A JPH1114320A JP H1114320 A JPH1114320 A JP H1114320A JP 18736697 A JP18736697 A JP 18736697A JP 18736697 A JP18736697 A JP 18736697A JP H1114320 A JPH1114320 A JP H1114320A
- Authority
- JP
- Japan
- Prior art keywords
- wire
- optical measuring
- measuring means
- light
- plane
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
(57)【要約】
【課題】 複数の光学測定手段を近接して設置すること
を可能として、線材の同一断面に近い断面の形状や寸法
を正確に測定する。
【解決手段】 光学測定手段M1は、平面光L1を線材
Wに対してこれを横切るように照射して線材Wの影像を
CCDイメージセンサ36により捉える。光学測定手段
M1は線材Wの周囲に90度角度を変えて二つ配置さ
れ、これら光学測定手段を、平面光L1,L2の厚み分
dだけずらして位置させて、各光学測定手段の平面光L
1,L2が互いに重ならないようにする。
(57) [Problem] To enable a plurality of optical measuring means to be installed close to each other and to accurately measure the shape and dimensions of a cross section of the wire rod that is close to the same cross section. SOLUTION: An optical measuring unit M1 irradiates a plane light L1 to the wire W so as to cross the wire W and captures a shadow image of the wire W by a CCD image sensor 36. Two optical measuring means M1 are arranged around the wire W at an angle of 90 degrees, and these optical measuring means are shifted by the thickness d of the plane lights L1 and L2, and the plane light of each optical measuring means is shifted. L
1 and L2 do not overlap each other.
Description
【0001】[0001]
【発明の属する技術分野】本発明は線材等の対象物に光
を照射してその影像を捉えることにより断面形状や外径
を測定する寸法測定装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dimension measuring apparatus for measuring a sectional shape and an outer diameter by irradiating an object such as a wire with light and capturing an image of the image.
【0002】[0002]
【従来の技術】圧延線材の断面形状をオンラインで測定
するために、例えば特開平7−35517号公報には以
下のような光学式寸法測定装置が示されている。これ
は、円板の中心に線材を通し、当該円板の板面の一方の
半径側に、発光源からの発散光を平行光に変換するため
の集光レンズを設けるとともに、他方の半径側に、上記
線材を横切った際の影を含む平行光を受光素子上に結像
させる結像レンズを設けている。本測定装置によれば、
円板を回転させて線材に対する平行光の照射角度を変え
つつ、受光素子上での影像の幅から各照射角度における
線材径を知り、これを線材の全周について行うことによ
り、その断面形状を測定することができる。2. Description of the Related Art In order to measure the cross-sectional shape of a rolled wire rod on-line, for example, Japanese Patent Application Laid-Open No. 7-35517 discloses the following optical dimension measuring apparatus. This involves passing a wire through the center of the disk, providing a condensing lens for converting divergent light from a light emitting source into parallel light on one radial side of the plate surface of the disk, and providing the other radial side Further, an image forming lens for forming an image on a light receiving element of parallel light including a shadow when the light passes through the wire is provided. According to this measurement device,
While changing the irradiation angle of the parallel light to the wire by rotating the disk, the diameter of the wire at each irradiation angle is known from the width of the image on the light receiving element, and this is performed for the entire circumference of the wire, so that the cross-sectional shape is obtained. Can be measured.
【0003】ところで、円板の回転速度を適当な範囲に
抑えつつ、高速で通過する線材の断面形状を測定するた
めに、特願平8−82445号では、発光源、集光レン
ズ、結像レンズ、および受光素子から構成される光学測
定手段を円板上に角度を変えて複数設けることが提案さ
れている。例えば、図4に示すように、角度を90度異
ならせて二つの光学測定手段M1´,M2´を設けれ
ば、円板の回転速度を同じにしても、2倍の速度で断面
形状を測定することができる。なお、図4中、31は発
光源たる発光ダイオード、32は集光レンズ、35は結
像レンズ、36は受光素子たるCCDイメージセンサで
あり、黒色領域は線材Wによって生じる影である。In order to measure the cross-sectional shape of a wire passing at high speed while keeping the rotation speed of a disk within an appropriate range, Japanese Patent Application No. 8-82445 discloses a light emitting source, a condenser lens, It has been proposed to provide a plurality of optical measuring means composed of a lens and a light receiving element on a disk at different angles. For example, as shown in FIG. 4, if the two optical measuring means M1 'and M2' are provided at different angles by 90 degrees, the sectional shape can be doubled at twice the speed even if the rotation speed of the disk is the same. Can be measured. In FIG. 4, reference numeral 31 denotes a light emitting diode serving as a light emitting source, 32 denotes a condenser lens, 35 denotes an image forming lens, 36 denotes a CCD image sensor as a light receiving element, and a black area denotes a shadow generated by the wire W.
【0004】[0004]
【発明が解決しようとする課題】上記のように複数の光
学測定手段M1´,M2´を設ける場合、これらを線材
Wの長手方向で可能な限り接近させた方が同一断面に近
い断面での外径を得ることができる。しかし、従来の光
学測定手段を互いに接近させると、図4の矢印で示すよ
うに、光学測定手段M1´の平行光が線材Wの表面で反
射して光学測定手段M2のCCDイメージセンサ36へ
入射し、外径測定に誤差を生じることがある。これを図
5で説明する。In the case where a plurality of optical measuring means M1 'and M2' are provided as described above, it is preferable that the optical measuring means M1 'and M2' be as close as possible in the longitudinal direction of the wire W in a section close to the same section. Outer diameter can be obtained. However, when the conventional optical measuring means are brought closer to each other, the parallel light of the optical measuring means M1 'is reflected on the surface of the wire W and enters the CCD image sensor 36 of the optical measuring means M2, as shown by the arrow in FIG. However, an error may occur in the outer diameter measurement. This will be described with reference to FIG.
【0005】図5はCCDイメージセンサの出力信号の
経時変化を示すもので、図5(A)の1スキャン内で信
号レベルが低下する領域Dが線材Wの影像に対応する部
分で、その幅Swが線材Wの外径に比例している。とこ
ろが、他の光学測定手段からの反射光が入光すると、図
5(B)に示すように、信号レベルが低下すべき領域D
内で、反射光により信号レベルがノイズ的に高くなる。
特に、当該領域Dの両端部でこのような信号レベルの上
昇を生じると、領域幅Swが変動するために正確な線材
径の測定ができない。この問題は特にステンレス系線材
のような反射率の高い線材の場合に甚だしくなる。FIG. 5 shows the change over time of the output signal of the CCD image sensor. In FIG. 5A, the area D where the signal level decreases in one scan corresponds to the image of the wire W and its width. Sw is proportional to the outer diameter of the wire W. However, when the reflected light from the other optical measuring means enters, as shown in FIG.
Within, the signal level becomes high like noise due to the reflected light.
In particular, if such an increase in the signal level occurs at both ends of the region D, the region width Sw fluctuates, so that accurate measurement of the wire diameter cannot be performed. This problem is particularly serious in the case of a wire having a high reflectance such as a stainless steel wire.
【0006】そこで、本発明はこのような課題を解決す
るもので、複数の光学測定手段を近接して設置すること
を可能として、対象物の同一断面に近い断面の形状を正
確に測定できるようにした寸法測定装置を提供すること
を目的とする。Therefore, the present invention solves such a problem, and enables a plurality of optical measuring means to be installed close to each other so that the shape of a cross section close to the same cross section of an object can be accurately measured. It is an object of the present invention to provide a dimension measuring device.
【0007】[0007]
【課題を解決するための手段】上記目的を達成するた
め、本発明では、平面光(L1,L2)を対象物(W)
に対してこれを横切るように照射して対象物(W)の影
像を受光素子(36)により捉える光学測定手段(M
1,M2)を、対象物(W)の周囲に角度を変えて複数
配置し、これら光学測定手段(M1,M2)を、上記平
面光(L1,L2)の厚み分(d)だけずらして位置さ
せて、各光学測定手段(M1,M2)の平面光(L1,
L2)が互いに重ならないようにする。In order to achieve the above object, according to the present invention, plane light (L1, L2) is applied to an object (W).
The optical measuring means (M) which irradiates the light beam across the object and captures an image of the object (W) by the light receiving element (36).
1, M2) are arranged around the object (W) at different angles, and these optical measuring means (M1, M2) are shifted by the thickness (d) of the plane light (L1, L2). And the plane light (L1, L2) of each optical measuring means (M1, M2).
L2) do not overlap each other.
【0008】本発明においては、対象物に対して平面光
を照射するようにして、光学測定手段を上記平面光の厚
みだけずらして位置させたから、一の光学測定手段の平
面光が対象物に反射して生じる反射光が、他の光学測定
手段の平面光に混入することはなく、対象物の断面形状
を正確に測定できる。そして、円形断面の平行光を使用
する従来の装置に比して、光学測定手段の位置を互いに
近接させることができるから、対象物の同一断面に近い
断面の形状を測定することができる。In the present invention, since the object is irradiated with plane light and the optical measuring means is shifted by the thickness of the plane light, the plane light of one optical measuring means is applied to the object. The reflected light generated by the reflection does not mix with the plane light of the other optical measuring means, and the cross-sectional shape of the object can be accurately measured. Since the positions of the optical measuring means can be made closer to each other as compared with a conventional apparatus using parallel light having a circular cross section, the shape of a cross section of the object close to the same cross section can be measured.
【0009】なお、平面光は、例えば円形断面の平行光
をスリットに通す等により生成される。また、受光素子
の前方に平面光の断面形状に等しいスリットを設けれ
ば、対象物の表面で反射光が散乱されるような場合で
も、反射光の混入を確実に防止することができる。The plane light is generated by, for example, passing parallel light having a circular cross section through a slit. Further, if a slit having a shape equal to the cross-sectional shape of the plane light is provided in front of the light receiving element, even if the reflected light is scattered on the surface of the target object, it is possible to reliably prevent the reflected light from being mixed.
【0010】[0010]
【発明の実施の形態】図1に寸法測定装置の全体垂直断
面図を示す。図において、固定台1上には厚肉筒状の保
持部11が水平姿勢で設けられ、当該保持部11内に回
転筒2が配設されて、軸方向の二箇所に設けたベアリン
グ21により支持されている。回転筒2の一端外周には
プーリ22が嵌着され、このプーリ22には図略の駆動
モータから延びるベルト23が懸架されて回転筒2を一
定速度で回転させている。対象物たる圧延後の線材Wは
回転筒2の筒内中心を水平方向へ貫通している。FIG. 1 is an overall vertical sectional view of a dimension measuring apparatus. In the drawing, a thick-walled cylindrical holding portion 11 is provided on a fixed base 1 in a horizontal posture, and a rotating cylinder 2 is disposed in the holding portion 11, and a bearing 21 provided at two positions in an axial direction is provided. Supported. A pulley 22 is fitted around one end of the rotary cylinder 2, and a belt 23 extending from a drive motor (not shown) is suspended on the pulley 22 to rotate the rotary cylinder 2 at a constant speed. The rolled wire W as an object passes through the center of the rotary cylinder 2 in the horizontal direction.
【0011】回転筒2の一端には、カバー241で覆わ
れ、中心を線材Wが貫通している大径の円板部24が形
成され、その板面には図2に示すように、90度位置を
異ならせて交差するように二つの光学測定手段M1,M
2が設けられている。各光学測定手段M1,M2はそれ
ぞれ、円板部24の中心を通る線材Wに対して、当該円
板部24の板面の一方の半径側に、発光源としての発光
ダイオード31と、これより発する発散光を円形断面の
平行光へ変換するための集光レンズ32と、平行光を後
述するような一定厚の平面光L1,L2にするスリット
部材33とを有するとともに、他方の半径側には、上記
線材Wを横切った際に生じる影(図中の黒色領域)を含
んだ平面光L1,L2のみを通過させるスリット部材3
4と、平面光L1,L2が入射する結像レンズ35と、
この結像レンズ35によって受光面上に影像が生じさせ
られる受光素子としてのCCDイメージセンサ36とを
有している。なお、平面光L1,L2は線材Wの前後で
透明なガラス窓37を通過している。At one end of the rotary cylinder 2, there is formed a large-diameter disk portion 24 which is covered by a cover 241 and has a wire W penetrating the center thereof. Optical measuring means M1 and M2 so as to intersect at different degrees
2 are provided. Each of the optical measuring means M1 and M2 is provided with a light emitting diode 31 as a light emitting source on one radial side of the plate surface of the disk portion 24 with respect to the wire W passing through the center of the disk portion 24. A condensing lens 32 for converting the emitted divergent light into parallel light having a circular cross section, and a slit member 33 for converting the parallel light into plane light L1 and L2 having a constant thickness as described later, and on the other radial side Is a slit member 3 that allows only plane light L1 and L2 including a shadow (black area in the figure) generated when the wire W is crossed to pass through
4, an imaging lens 35 on which the plane lights L1 and L2 are incident,
The imaging lens 35 has a CCD image sensor 36 as a light receiving element that forms a shadow image on a light receiving surface. The plane lights L1 and L2 pass through the transparent glass window 37 before and after the wire W.
【0012】図1において、円板部24に対向する保持
部11の一端には大径の歯車12が固定されており、こ
の歯車12の外周に小径の歯車13が噛合している(図
2)。歯車13は円板部24の板面に設けた発電機38
の回転軸の先端に取り付けられており、回転筒2、すな
わち円板部24が回転すると、これに伴って歯車13が
歯車12の外周を自転しつつ移動して発電が行われる。
この発電電力は各光学測定手段M1,M2の発光ダイオ
ード31へ供給される。In FIG. 1, a large-diameter gear 12 is fixed to one end of the holding portion 11 facing the disk portion 24, and a small-diameter gear 13 meshes with the outer periphery of the gear 12 (FIG. 2). ). The gear 13 is a generator 38 provided on the plate surface of the disk portion 24.
When the rotating cylinder 2, that is, the disk portion 24 rotates, the gear 13 moves while rotating around the outer periphery of the gear 12, thereby generating power.
The generated power is supplied to the light emitting diodes 31 of the optical measuring means M1 and M2.
【0013】回転筒2の中間部外周には、リング板25
が複数嵌着してあり、これらリング板25は、保持部1
1の内周面に形成されたリング状の凹溝14内にそれぞ
れ位置している。リング板25の板面とこれに対向する
凹溝14の溝面にはそれぞれコイルがプリント形成され
て(図示略)回転トランスを構成しており、この回転ト
ランスを介してCCDイメージセンサ36からの出力信
号が無接触で固定台1側へ取り出される。なお、ガラス
窓37を設けた部分を除いて、線材Wの周囲には断熱管
41,42が設けられている。A ring plate 25 is provided on the outer periphery of the intermediate portion of the rotary cylinder 2.
Are fitted, and these ring plates 25
1 are respectively located in ring-shaped concave grooves 14 formed on the inner peripheral surface. Coils are printed on the plate surface of the ring plate 25 and the groove surface of the concave groove 14 opposed to the ring plate 25 to form a rotary transformer (not shown). The output signal is taken out to the fixed base 1 side without contact. Except for the portion where the glass window 37 is provided, heat insulating tubes 41 and 42 are provided around the wire W.
【0014】図3には光学測定手段M1の斜視図を示
す。図において、発光ダイオード31から発せられた発
散光は集光レンズ32によって円形断面の平行光に変換
されてスリット部材33に入射する。スリット部材33
には一定幅(例えば10mm)の長方形スリット331
が形成されており、上記平行光はスリット331を通過
することによって、当該スリット331と同断面の一定
厚dの平面光L1になる。平面光L1は途中で線材Wを
横切り、この時生じる線材Wの影(図中の黒色領域)を
含んでスリット部材34に入射する。スリット部材34
には上記スリット部材33と同形のスリット341が形
成されており、平面光L1は当該スリット341を通過
した後、結像レンズ35によってCCDイメージセンサ
36の受光面上へ入射させられる。一方、光学測定手段
M2においても同様の構成で一定厚dの平面光L2が形
成されており、この平面光L2は図3に示すように、線
材Wを通過する部分で光学測定手段M1の平面光L1と
交差するとともに、本実施形態では、互いに重ならない
ように線材Wの長手方向へずれている。この際、各平面
光L1,L2は既述のように一定厚dの長方形断面をし
ているから、その厚み分だけ位置をずらすことにより両
平面光L1,L2は互いに重ならず、平面光L2の、線
材Wでの反射光が平面光L1に混入することが防止され
る。FIG. 3 is a perspective view of the optical measuring means M1. In the figure, divergent light emitted from a light emitting diode 31 is converted into parallel light having a circular cross section by a condenser lens 32 and enters a slit member 33. Slit member 33
Has a rectangular slit 331 having a constant width (for example, 10 mm).
Is formed, and the parallel light passes through the slit 331 to become a plane light L1 having the same cross section as the slit 331 and a constant thickness d. The plane light L1 traverses the wire W on the way, and enters the slit member 34 including the shadow (black area in the figure) of the wire W generated at this time. Slit member 34
Is formed with a slit 341 having the same shape as the slit member 33. After passing through the slit 341, the plane light L1 is made incident on the light receiving surface of the CCD image sensor 36 by the imaging lens 35. On the other hand, also in the optical measuring means M2, a plane light L2 having a constant thickness d is formed in the same configuration, and the plane light L2 is transmitted through the wire W at the plane of the optical measuring means M1 as shown in FIG. In the present embodiment, the wires W intersect with the light L1 and are shifted in the longitudinal direction of the wires W so as not to overlap with each other. At this time, since each of the plane lights L1 and L2 has a rectangular cross section having a constant thickness d as described above, the plane lights L1 and L2 do not overlap each other by shifting the position by the thickness, and the plane lights L1 and L2 do not overlap each other. Light reflected by the wire W of L2 is prevented from being mixed into the plane light L1.
【0015】したがって、本実施形態では、両光学測定
手段M1,M2の位置を線材Wの長手方向へ平面光L
1,L2の厚み分dだけ僅かにずらすのみで、互いに他
の光学測定手段からの反射光の混入が防止され、線材径
を確実に測定することができる。このように、従来のよ
うな円形断面の平行光を使用するのに比して、本実施形
態では一定厚の平面光を使用しているから、両光学測定
手段M1,M2を接近して位置させることができ、これ
ら光学測定手段M1,M2で測定される線材径は線材W
の同一断面に近い断面のものとなって、線材Wの断面形
状をより正確に把握することができる。Therefore, in the present embodiment, the positions of the two optical measuring means M1 and M2 are adjusted in the longitudinal direction of the wire W by the plane light L.
By slightly shifting the thickness by 1, d2, the reflection light from other optical measuring means can be prevented from being mixed with each other, and the wire diameter can be reliably measured. As described above, compared with the case of using parallel light having a circular cross section as in the related art, the present embodiment uses plane light of a constant thickness, so that the two optical measuring means M1 and M2 are located close to each other. The wire diameter measured by these optical measuring means M1 and M2 is the wire W
Of the wire W can be grasped more accurately.
【0016】なお、上記実施形態において、圧延時のヒ
ケ等により通常は線材表面には種々の角度の面が形成さ
れており、反射光が散乱されるおそれがある。したがっ
て、他の光学測定手段からの反射光の入射を確実に防止
するにはスリット部材34を設けた方が好ましい。そし
て、このスリット部材34は可能な限り線材Wに近い位
置に設けた方が効果がある。In the above embodiment, the surface of the wire is usually formed at various angles due to sink marks during rolling, and the reflected light may be scattered. Therefore, it is preferable to provide the slit member 34 in order to reliably prevent the reflected light from entering from other optical measuring means. It is more effective to provide the slit member 34 as close to the wire W as possible.
【0017】平面光L1,L2を生成するには必ずしも
上記実施形態のような構成を採用する必要はなく、例え
ば、発光ダイオードを直線状に多数配置して、これら発
光ダイオードから発する発散光をシリンドリカルレンズ
で一定厚の平面光に変換するような構成としても良い。In order to generate the plane lights L1 and L2, it is not always necessary to adopt the configuration as in the above embodiment. For example, a large number of light emitting diodes are arranged in a straight line, and the divergent light emitted from these light emitting diodes is cylindrical. A configuration in which a lens converts the light into planar light having a constant thickness may be used.
【0018】上記実施形態では光学測定手段を二つ設け
たが、三つ以上設けることもできる。また、光学測定手
段は必ずしも回転する円板上に設けられる必要はなく、
線材の周囲に角度をおいて固定されていても良い。さら
に、対象物は線材に限られるものではない。In the above embodiment, two optical measuring means are provided, but three or more optical measuring means may be provided. Also, the optical measuring means does not necessarily need to be provided on a rotating disk,
It may be fixed at an angle around the wire. Further, the object is not limited to a wire.
【0019】[0019]
【発明の効果】以上のように、本発明の寸法測定装置に
よれば、測定に平面光を使用したことにより、複数の光
学測定手段を近接して設置することが可能であるから、
対象物の同一断面に近い断面の外径ないし形状を正確に
測定することができる。As described above, according to the dimension measuring apparatus of the present invention, a plurality of optical measuring means can be set close to each other by using plane light for measurement.
It is possible to accurately measure the outer diameter or shape of a cross section close to the same cross section of the object.
【図1】本発明の一実施形態を示す、寸法測定装置の全
体垂直断面図である。FIG. 1 is an overall vertical sectional view of a dimension measuring device, showing an embodiment of the present invention.
【図2】回転筒円板部の正面図である。FIG. 2 is a front view of a rotating cylinder disk portion.
【図3】光学測定手段の斜視図である。FIG. 3 is a perspective view of an optical measuring unit.
【図4】従来の光学測定手段の概略構成図である。FIG. 4 is a schematic configuration diagram of a conventional optical measuring means.
【図5】CCDイメージセンサの出力信号波形図であ
る。FIG. 5 is an output signal waveform diagram of the CCD image sensor.
31…発光ダイオード、32…集光レンズ、33,34
…スリット部材、35…結像レンズ、L1,L2…平面
光、M1,M2…光学測定手段、W…線材(対象物)。31: light emitting diode, 32: condenser lens, 33, 34
... Slit member, 35 ... Imaging lens, L1, L2 ... Plane light, M1, M2 ... Optical measuring means, W ... Wire (object).
Claims (1)
うに照射して前記対象物の影像を受光素子により捉える
光学測定手段を、前記対象物の周囲に角度を変えて複数
配置し、これら光学測定手段を、前記平面光の厚み分だ
けずらして位置させて、各光学測定手段の平面光が互い
に重ならないようにしたことを特徴とする寸法測定装
置。1. A plurality of optical measuring means for irradiating plane light to an object so as to traverse the object and capturing an image of the object by a light receiving element are arranged around the object at different angles, The optical measuring means is shifted by the thickness of the plane light so that the plane lights of the optical measuring means do not overlap each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18736697A JPH1114320A (en) | 1997-06-26 | 1997-06-26 | Dimension measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18736697A JPH1114320A (en) | 1997-06-26 | 1997-06-26 | Dimension measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH1114320A true JPH1114320A (en) | 1999-01-22 |
Family
ID=16204747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18736697A Pending JPH1114320A (en) | 1997-06-26 | 1997-06-26 | Dimension measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1114320A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013099981A1 (en) * | 2011-12-27 | 2013-07-04 | シーシーエス株式会社 | Linear light irradiation device |
| CN105203037A (en) * | 2015-09-21 | 2015-12-30 | 长飞光纤光缆股份有限公司 | Device for on-line measurement of diameter of prefabricated rod |
| JP2018044812A (en) * | 2016-09-13 | 2018-03-22 | 株式会社Vrc | Three-dimensional scanner |
| CN108885084A (en) * | 2016-04-01 | 2018-11-23 | 施洛伊尼格控股股份公司 | combination sensor |
| JP2020030126A (en) * | 2018-08-23 | 2020-02-27 | 株式会社デンソー | Angle detecting device and angle detecting method |
-
1997
- 1997-06-26 JP JP18736697A patent/JPH1114320A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013099981A1 (en) * | 2011-12-27 | 2013-07-04 | シーシーエス株式会社 | Linear light irradiation device |
| JPWO2013099981A1 (en) * | 2011-12-27 | 2015-05-11 | シーシーエス株式会社 | Line light irradiation device |
| CN105203037A (en) * | 2015-09-21 | 2015-12-30 | 长飞光纤光缆股份有限公司 | Device for on-line measurement of diameter of prefabricated rod |
| CN108885084A (en) * | 2016-04-01 | 2018-11-23 | 施洛伊尼格控股股份公司 | combination sensor |
| JP2018044812A (en) * | 2016-09-13 | 2018-03-22 | 株式会社Vrc | Three-dimensional scanner |
| JP2020030126A (en) * | 2018-08-23 | 2020-02-27 | 株式会社デンソー | Angle detecting device and angle detecting method |
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