JPH11183806A - コンフォーカル顕微鏡 - Google Patents

コンフォーカル顕微鏡

Info

Publication number
JPH11183806A
JPH11183806A JP9363924A JP36392497A JPH11183806A JP H11183806 A JPH11183806 A JP H11183806A JP 9363924 A JP9363924 A JP 9363924A JP 36392497 A JP36392497 A JP 36392497A JP H11183806 A JPH11183806 A JP H11183806A
Authority
JP
Japan
Prior art keywords
information
objective lens
microscope
optical path
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9363924A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11183806A5 (2
Inventor
Katsumi Ogino
克美 荻野
Tatsu Nakamura
竜 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP9363924A priority Critical patent/JPH11183806A/ja
Publication of JPH11183806A publication Critical patent/JPH11183806A/ja
Publication of JPH11183806A5 publication Critical patent/JPH11183806A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
JP9363924A 1997-12-18 1997-12-18 コンフォーカル顕微鏡 Pending JPH11183806A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9363924A JPH11183806A (ja) 1997-12-18 1997-12-18 コンフォーカル顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9363924A JPH11183806A (ja) 1997-12-18 1997-12-18 コンフォーカル顕微鏡

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006252989A Division JP4428370B2 (ja) 2006-09-19 2006-09-19 コンフォーカル顕微鏡

Publications (2)

Publication Number Publication Date
JPH11183806A true JPH11183806A (ja) 1999-07-09
JPH11183806A5 JPH11183806A5 (2) 2005-07-21

Family

ID=18480533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9363924A Pending JPH11183806A (ja) 1997-12-18 1997-12-18 コンフォーカル顕微鏡

Country Status (1)

Country Link
JP (1) JPH11183806A (2)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000031576A1 (de) * 1998-11-19 2000-06-02 Leica Microsystems Heidelberg Gmbh Verfahren zur einstellung der systemparameter eines laserscanmikroskops
JP2001356272A (ja) * 2000-06-12 2001-12-26 Olympus Optical Co Ltd 画像取得方法及び走査型光学顕微鏡
JP2002023063A (ja) * 2000-07-07 2002-01-23 Nikon Corp 紫外線顕微鏡及びその制御方法
JP2002258162A (ja) * 2001-03-05 2002-09-11 Olympus Optical Co Ltd 画像取得装置
JP2002267933A (ja) * 2001-03-13 2002-09-18 Olympus Optical Co Ltd レーザ顕微鏡
JP2003005084A (ja) * 2001-06-21 2003-01-08 Olympus Optical Co Ltd 顕微鏡制御装置、顕微鏡制御方法、及び顕微鏡制御プログラム
JP2003021791A (ja) * 2001-07-06 2003-01-24 Nikon Corp 顕微鏡システム
EP1139139A3 (de) * 2000-03-28 2003-12-17 Leica Microsystems Heidelberg GmbH Verfahren zur Detektion und Analyse eines Objekts
EP1243958A3 (de) * 2001-03-13 2005-01-05 Leica Microsystems Heidelberg GmbH Verfahren zum Justieren eines Mikroskops und Mikroskop mit Einrichtung zum Justieren des Lichtstrahls
EP1669740A1 (en) * 2004-12-10 2006-06-14 Olympus Corporation Microscope apparatus, sensitivity setting method for photo detector, control unit, and storage medium
JP2006171028A (ja) * 2004-12-10 2006-06-29 Olympus Corp レーザ走査顕微鏡および光検出器の感度設定方法
JP2007047754A (ja) * 2005-07-11 2007-02-22 Olympus Corp レーザ走査型顕微鏡およびレーザ走査型顕微鏡の画像取得方法
JP2007101910A (ja) * 2005-10-05 2007-04-19 Yokogawa Electric Corp 共焦点顕微鏡
JP2007206388A (ja) * 2006-02-02 2007-08-16 Olympus Corp 走査型共焦点レーザ顕微鏡、及びその制御方法、並びにプログラム
KR101006624B1 (ko) 2007-12-27 2011-01-07 올림푸스 가부시키가이샤 공초점 현미경
JP2011100058A (ja) * 2009-11-09 2011-05-19 Olympus Corp レーザ走査型顕微鏡

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000031576A1 (de) * 1998-11-19 2000-06-02 Leica Microsystems Heidelberg Gmbh Verfahren zur einstellung der systemparameter eines laserscanmikroskops
EP1139139A3 (de) * 2000-03-28 2003-12-17 Leica Microsystems Heidelberg GmbH Verfahren zur Detektion und Analyse eines Objekts
JP2001356272A (ja) * 2000-06-12 2001-12-26 Olympus Optical Co Ltd 画像取得方法及び走査型光学顕微鏡
JP2002023063A (ja) * 2000-07-07 2002-01-23 Nikon Corp 紫外線顕微鏡及びその制御方法
JP2002258162A (ja) * 2001-03-05 2002-09-11 Olympus Optical Co Ltd 画像取得装置
EP1243958A3 (de) * 2001-03-13 2005-01-05 Leica Microsystems Heidelberg GmbH Verfahren zum Justieren eines Mikroskops und Mikroskop mit Einrichtung zum Justieren des Lichtstrahls
JP2002267933A (ja) * 2001-03-13 2002-09-18 Olympus Optical Co Ltd レーザ顕微鏡
JP2003005084A (ja) * 2001-06-21 2003-01-08 Olympus Optical Co Ltd 顕微鏡制御装置、顕微鏡制御方法、及び顕微鏡制御プログラム
JP2003021791A (ja) * 2001-07-06 2003-01-24 Nikon Corp 顕微鏡システム
EP1669740A1 (en) * 2004-12-10 2006-06-14 Olympus Corporation Microscope apparatus, sensitivity setting method for photo detector, control unit, and storage medium
JP2006171028A (ja) * 2004-12-10 2006-06-29 Olympus Corp レーザ走査顕微鏡および光検出器の感度設定方法
JP2007047754A (ja) * 2005-07-11 2007-02-22 Olympus Corp レーザ走査型顕微鏡およびレーザ走査型顕微鏡の画像取得方法
JP2007101910A (ja) * 2005-10-05 2007-04-19 Yokogawa Electric Corp 共焦点顕微鏡
JP2007206388A (ja) * 2006-02-02 2007-08-16 Olympus Corp 走査型共焦点レーザ顕微鏡、及びその制御方法、並びにプログラム
KR101006624B1 (ko) 2007-12-27 2011-01-07 올림푸스 가부시키가이샤 공초점 현미경
JP2011100058A (ja) * 2009-11-09 2011-05-19 Olympus Corp レーザ走査型顕微鏡

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