JPH11214955A - Surface acoustic wave device - Google Patents

Surface acoustic wave device

Info

Publication number
JPH11214955A
JPH11214955A JP10017096A JP1709698A JPH11214955A JP H11214955 A JPH11214955 A JP H11214955A JP 10017096 A JP10017096 A JP 10017096A JP 1709698 A JP1709698 A JP 1709698A JP H11214955 A JPH11214955 A JP H11214955A
Authority
JP
Japan
Prior art keywords
acoustic wave
surface acoustic
resin layer
conductive resin
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10017096A
Other languages
Japanese (ja)
Other versions
JP3439975B2 (en
Inventor
Ikuo Ohara
郁夫 尾原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP01709698A priority Critical patent/JP3439975B2/en
Publication of JPH11214955A publication Critical patent/JPH11214955A/en
Application granted granted Critical
Publication of JP3439975B2 publication Critical patent/JP3439975B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/682Shapes or dispositions thereof comprising holes having chips therein
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/685Shapes or dispositions thereof comprising multiple insulating layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps

Landscapes

  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

(57)【要約】 【課題】 外来の電磁波を極力遮蔽することができ、従
来のように金属製カバーを不要とし、低背位化及び低コ
スト化が可能でしかも従来よりさらに耐湿性を向上させ
信頼性の非常に優れた弾性表面波装置を提供すること。 【解決手段】 圧電基板1aの下面に弾性表面波を発生
させる励振電極を設けて成る弾性表面波素子1をパッケ
ージ5内に収容した弾性表面波装置S1であって、圧電
基板1aの上面側に所定周波数以下の電磁波を遮断する
導電性樹脂層11を形成するとともに、該導電性樹脂層
11をパッケージ5に形成した接地用導体パターン8に
接続させたことを特徴とする。
(57) [Summary] [Problem] It is possible to shield external electromagnetic waves as much as possible, eliminating the need for a metal cover as in the past, making it possible to reduce the height and cost, and further improve the moisture resistance compared to the past. And to provide a highly reliable surface acoustic wave device. SOLUTION: A surface acoustic wave device S1 in which a surface acoustic wave element 1 having an excitation electrode for generating a surface acoustic wave provided on a lower surface of a piezoelectric substrate 1a is accommodated in a package 5, and is provided on an upper surface side of the piezoelectric substrate 1a. A conductive resin layer for blocking electromagnetic waves of a predetermined frequency or less is formed, and the conductive resin layer is connected to a grounding conductor pattern formed on a package.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、例えば電気通信分
野における携帯電話やセルラ電話等の移動体用通信機器
に高周波素子として好適に使用されるフリップチップ実
装型の弾性表面波フィルタ等の弾性表面波装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an elastic surface such as a flip-chip type surface acoustic wave filter which is preferably used as a high-frequency element in a mobile communication device such as a cellular phone or a cellular phone in the telecommunications field. Wave device.

【0002】[0002]

【従来の技術】従来のフリップチップ実装法を用いた弾
性表面波フィルタの構造例を図7〜9に断面図にて示
す。
2. Description of the Related Art FIGS. 7 to 9 are sectional views showing structural examples of a surface acoustic wave filter using a conventional flip chip mounting method.

【0003】図7に示す弾性表面波フィルタJ1は、圧
電基板1a上に櫛歯状電極や反射器電極等から成る駆動
電極1bを形成した弾性表面波素子(チップ)1をフリ
ップチップ実装によりパッケージ5内に設けたものであ
る。
A surface acoustic wave filter J1 shown in FIG. 7 is formed by mounting a surface acoustic wave element (chip) 1 having a driving electrode 1b formed of a comb-like electrode or a reflector electrode on a piezoelectric substrate 1a by flip-chip mounting. 5.

【0004】ここで、パッケージ5は基体5a、チップ
1の周縁外周部を載置する環状の積層部材5b、これよ
り広い空間を形成する環状の積層部材5c、及びこの上
部に接合部材10を介して設けられる蓋体4等から構成
され、パッケージ5の外側に電極が形成されている。
Here, the package 5 has a base 5a, an annular laminated member 5b on which the outer peripheral portion of the chip 1 is placed, an annular laminated member 5c which forms a wider space, and a joining member 10 disposed above the annular laminated member 5c. An electrode is formed outside the package 5.

【0005】また、チップ1の下面に形成された信号用
電極2は、このようなパッケージ5内に形成された信号
用電極7及びフリップチップ接合用電極9にバンプ3を
介して接続されている。なお、図中6はバンプ接合用導
電性接着材である。
The signal electrodes 2 formed on the lower surface of the chip 1 are connected to the signal electrodes 7 and the flip-chip bonding electrodes 9 formed in the package 5 via the bumps 3. . Incidentally, reference numeral 6 in the drawing denotes a conductive adhesive for bump bonding.

【0006】図8に示す弾性表面波フィルタJ2は、図
7の弾性表面波フィルタJ1における積層部材5c,接
合部材10の代わりに、溶接用金属環状体5eでもって
金属製の蓋体4を接合したものであり、さらに、積層部
材5bのパッケージ5内における占有面積を小さくして
チップ1の周縁部外周を載置させないようにしたもので
ある。
A surface acoustic wave filter J2 shown in FIG. 8 joins a metal lid 4 with a welding metal annular body 5e instead of the laminated member 5c and the joining member 10 in the surface acoustic wave filter J1 of FIG. Further, the area occupied by the laminated member 5b in the package 5 is reduced so that the outer periphery of the peripheral portion of the chip 1 is not mounted.

【0007】図9に示す弾性表面波フィルタJ3は、図
7の弾性表面波フィルタJ1における積層部材5c,接
合部材10の代わりに、溶接用金属環状体5eでもって
蓋体4を接合したものである。
A surface acoustic wave filter J3 shown in FIG. 9 has a cover 4 joined by a metal ring 5e for welding instead of the laminated member 5c and the joining member 10 in the surface acoustic wave filter J1 of FIG. is there.

【0008】このように、従来のフリップチップ実装型
の弾性表面波フィルタは、チップに形成された入出力パ
ッド部に、ワイヤーボンドを施してパッケージとの電気
的接続を取る代りに、入出力パッド部にAuまたはCu
等の金属製のバンプを形成し、バンプを導電性接着剤も
しくははんだ等とすることによりチップをパッケージ内
に接続する構造を有している。
As described above, in the conventional flip chip surface acoustic wave filter, the input / output pad portion formed on the chip is wire-bonded to make electrical connection with the package. Au or Cu
And the like, and a bump is made of a conductive adhesive or solder to connect the chip to the inside of the package.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、これま
でのフリップチップ実装の主な課題は、チップの下面側
に構成した弾性表面波素子の金属膜電極を半田もしくは
導電性接着剤等で汚染・短絡させないことであり、パッ
ケージ内の気密構造や外来雑音の防止構造についてはほ
とんど考慮されることがなく、また適正になされてこな
かった。しかも、従来のフリップチップ実装は、専ら低
面積化手段としてが用いられてきたにすぎず、パッケー
ジの低背位化や装置全体の低コスト化を向上させるもの
でもなかった。
However, the main problem of the flip chip mounting is that the metal film electrode of the surface acoustic wave element formed on the lower surface side of the chip is contaminated and short-circuited by solder or conductive adhesive. Therefore, the hermetic structure in the package and the structure for preventing external noise are hardly taken into consideration and have not been properly performed. Moreover, the conventional flip-chip mounting has been used only as a means for reducing the area, and has not improved the height of the package or the cost of the entire device.

【0010】なお、外来雑音(特に外来の電磁波)の遮
蔽を必要としない弾性表面波装置において、低背位構造
を目的として樹脂による埋め込み構造を持たせた装置が
提案されているものの、樹脂を気密構造材とした場合に
耐湿性に問題があった。なおまた、疎水性樹脂を使用し
た充填構造も提案されているが、このような樹脂構造だ
けでは耐湿性は不十分であった。
In a surface acoustic wave device which does not require shielding of external noise (especially external electromagnetic waves), a device having a resin embedded structure for the purpose of a low profile structure has been proposed. There was a problem with the moisture resistance when using an airtight structure material. Further, a filling structure using a hydrophobic resin has also been proposed, but such a resin structure alone was insufficient in moisture resistance.

【0011】そこで、本発明では外来の電磁波を極力遮
蔽することができ、従来のように金属製カバーを不要と
し、低背位化及び低コスト化が可能でしかも従来よりさ
らに耐湿性を向上させ信頼性の非常に優れた弾性表面波
装置を提供することを目的とする。
Therefore, in the present invention, external electromagnetic waves can be shielded as much as possible, so that a metal cover is not required as in the prior art, and the height and cost can be reduced, and the moisture resistance can be further improved. It is an object of the present invention to provide a surface acoustic wave device having extremely excellent reliability.

【0012】[0012]

【課題を解決するための手段】上記課題を解決するため
に、本発明の弾性表面波装置は、圧電基板の下面に弾性
表面波を発生させる励振電極を設けて成る弾性表面波素
子をパッケージ内に収容した弾性表面波装置であって、
前記圧電基板の上面側に所定周波数以下の電磁波を遮断
する導電性樹脂層を形成するとともに、該導電性樹脂層
を前記パッケージに形成した接地用導体パターンに接続
させたことを特徴とする。
In order to solve the above-mentioned problems, a surface acoustic wave device according to the present invention includes a surface acoustic wave element having an excitation electrode for generating a surface acoustic wave on a lower surface of a piezoelectric substrate in a package. A surface acoustic wave device housed in
A conductive resin layer for blocking electromagnetic waves of a predetermined frequency or less is formed on the upper surface of the piezoelectric substrate, and the conductive resin layer is connected to a grounding conductor pattern formed on the package.

【0013】また、圧電基板と導電性樹脂層との間、及
び/又は導電性樹脂層の上面側に、金属薄膜及び/又は
疎水性樹脂層を配したことを特徴とする。これにより耐
湿性を向上させるとともに低背位化を向上させることが
できる。
[0013] A metal thin film and / or a hydrophobic resin layer may be provided between the piezoelectric substrate and the conductive resin layer and / or on the upper surface side of the conductive resin layer. As a result, it is possible to improve the moisture resistance and improve the lowering of the height.

【0014】[0014]

【発明の実施の形態】以下に、本発明に係る弾性表面波
装置の一実施形態について図面に基づいて詳細に説明す
る。まず、図1及び図2に本発明に係る弾性表面波フィ
ルタの基本構造を断面図にて示す。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a surface acoustic wave device according to the present invention will be described below in detail with reference to the drawings. First, FIGS. 1 and 2 are sectional views showing the basic structure of a surface acoustic wave filter according to the present invention.

【0015】図1に示す弾性表面波フィルタS1は、ニ
オブ酸リチウム(LiNbO3 )、タンタル酸リチウム
(LiTaO3 )、四ホウ酸リチウム(Li2
4 7 )、または、La3 Ga5.5 Nb0.5 14等のラ
ンガサイト型単結晶などから成る圧電基板1aの下面
に、櫛歯状の励振電極やその両側に設けた反射器電極等
から成る駆動電極の複数を格子型やラダー型回路に接続
した電極パターン1bを設けた弾性表面波素子(チッ
プ)1を、フリップチップ実装によりパッケージ5内に
収容したものである。
The surface acoustic wave filter S1 shown in FIG. 1 is composed of lithium niobate (LiNbO 3 ), lithium tantalate (LiTaO 3 ), and lithium tetraborate (Li 2 B).
On the lower surface of a piezoelectric substrate 1a made of a langasite-type single crystal such as 4 O 7 ) or La 3 Ga 5.5 Nb 0.5 O 14 , a comb-shaped excitation electrode and reflector electrodes provided on both sides thereof are provided. A surface acoustic wave element (chip) 1 provided with an electrode pattern 1b in which a plurality of drive electrodes are connected to a lattice-type or ladder-type circuit is accommodated in a package 5 by flip-chip mounting.

【0016】ここで、パッケージ5はガラスセラッミク
スまたはアルミナ(Al2 3 )等のセラミックスから
成る基体5a、これと同様な部材で構成されチップ1の
周縁外周部を載置する環状の積層部材5b、同様な部材
で積層部材5bより広い空間を形成する環状の積層部材
5cから構成され、このパッケージ5の内側及び外側に
接地用の導体パターン8が平面状またはキャスタレーシ
ョン状に形成されている。また、パッケージ5の内側、
すなわち、基体5aの上面の所定領域にも信号用電極7
及びフリップチップ接合用電極9が形成されている。
The package 5 is composed of a base member 5a made of glass ceramics or ceramics such as alumina (Al 2 O 3 ), and a ring-shaped laminated member which is made of the same material as the base member 5a and on which the outer peripheral portion of the chip 1 is mounted. 5b, an annular laminated member 5c that forms a space wider than the laminated member 5b with similar members, and a conductor pattern 8 for grounding is formed inside or outside the package 5 in a planar or castellated shape. . Also, inside the package 5,
That is, the signal electrode 7 is also provided in a predetermined area on the upper surface of the base 5a.
And an electrode 9 for flip chip bonding.

【0017】また、チップ1の下面には電極パターン1
bに接続された信号用電極2が形成され、この信号用電
極はパッケージ5側の信号用電極及びフリップチップ接
合用電極9にバンプ3を介して接続されている。
An electrode pattern 1 is provided on the lower surface of the chip 1.
The signal electrode 2 connected to the electrode b is formed, and the signal electrode is connected to the signal electrode on the package 5 side and the flip-chip bonding electrode 9 via the bump 3.

【0018】さらに、チップ1の裏面側(圧電基板1a
の上面側)には、圧電基板1aの上面及び側面を完全に
覆う導電性樹脂層11が滴下または射出による形成法に
より形成されている。この導電性樹脂層11は、厚さが
1mm以下程度で10Ω・cm以下の抵抗値を有するもので
あり、例えばエポキシ系、ウレタン系、シリコン系、又
はポリイミド系等の樹脂中に所定のアスペクト比及び分
布を成す導電性フィラーが分散されており、導電性樹脂
層11の厚みや導電性フィラーのアスペクト比等により
決定される所定周波数以下(所定波長以上:λ/3以
上、なお、λは弾性表面波の波長)の電磁波を遮断する
役割を果たす。ここで、導電性フィラーとしては、A
u、またはAg、またはAg−Pd合金、またはNi等
の例えばフレーク状フィラーを使用するとよい。このフ
レーク状フィラーの粒径を適宜設定することにより所定
周波数以下の電磁波を遮断させることが可能となる。
Further, the back side of the chip 1 (piezoelectric substrate 1a)
A conductive resin layer 11 that completely covers the upper surface and side surfaces of the piezoelectric substrate 1a is formed on the upper surface side of the piezoelectric substrate 1a by a dropping or injection forming method. The conductive resin layer 11 has a thickness of about 1 mm or less and a resistance value of 10 Ω · cm or less. For example, the conductive resin layer 11 has a predetermined aspect ratio in a resin such as an epoxy-based, urethane-based, silicon-based, or polyimide-based resin. And a conductive filler forming a distribution is dispersed, and is not more than a predetermined frequency (not less than a predetermined wavelength: not less than λ / 3, where λ is elasticity) determined by the thickness of the conductive resin layer 11, the aspect ratio of the conductive filler, and the like. (Wavelength of surface wave). Here, as the conductive filler, A
For example, u, or Ag, or an Ag-Pd alloy, or Ni, for example, a flake-like filler may be used. By appropriately setting the particle size of the flake-like filler, it is possible to block electromagnetic waves of a predetermined frequency or less.

【0019】この弾性表面波フィルタS1によれば、導
電性樹脂層をパッケージの内外に形成した接地用導体パ
ターンに接続するようにしたので、チップ1の裏面より
飛び込んで来る所定周波数以下の電磁波を遮断すること
ができ、外来雑音の影響のない良好なフィルタ特性を有
する弾性表面波フィルタを提供することができる。
According to the surface acoustic wave filter S1, the conductive resin layer is connected to the grounding conductor pattern formed inside and outside the package. It is possible to provide a surface acoustic wave filter that can be cut off and has good filter characteristics without the influence of external noise.

【0020】図2に示す弾性表面波フィルタS2は、図
1に示す弾性表面波フィルタS1とチップ1の保持構造
を変えたものであり、積層部材5bの空間形成領域を広
くとり、その空間内にチップ1を納めることにより、バ
ンプ形成精度が十分に取れない場合に有効な構成とする
ことができる。
The surface acoustic wave filter S2 shown in FIG. 2 is different from the surface acoustic wave filter S1 shown in FIG. 1 in the structure for holding the chip 1, and has a large space forming area of the laminated member 5b. By placing the chip 1 in the above, an effective configuration can be obtained when the bump formation accuracy cannot be sufficiently obtained.

【0021】図3に示す弾性表面波フィルタS3は、図
2に示す弾性表面波フィルタS2のチップ1の裏面側の
構成をさらに発展させたものであり、導電性樹脂層11
の上面を金属薄膜やウレタン系樹脂やシリコーン樹脂等
の疎水性樹脂層12を介在させることにより、耐湿性を
向上させたものである。この構成によれば、特に硬化後
にポーラスとなりやすい導電性樹脂層11の上面を疎水
性の層でオーバーコートすることにより、導電性樹脂層
11を通じて入ってくる水分を極力遮断することがで
き、信頼性の優れた弾性表面波フィルタを提供すること
ができる。
The surface acoustic wave filter S3 shown in FIG. 3 is a further development of the surface acoustic wave filter S2 shown in FIG.
The moisture resistance is improved by interposing a hydrophobic resin layer 12 such as a metal thin film, a urethane-based resin, or a silicone resin on the upper surface. According to this configuration, in particular, the moisture entering through the conductive resin layer 11 can be cut off as much as possible by overcoating the upper surface of the conductive resin layer 11 which is likely to become porous after curing with a hydrophobic layer. A surface acoustic wave filter having excellent properties can be provided.

【0022】図4に示す弾性表面波フィルタS4は、図
1に示す弾性表面波フィルタS1の構成に図3に示す弾
性表面波フィルタS3のチップ1の裏面側の積層構造を
適用させたものであり、耐湿性については弾性表面波フ
ィルタS3と同様な作用効果を奏する。
The surface acoustic wave filter S4 shown in FIG. 4 is obtained by applying the laminated structure on the back side of the chip 1 of the surface acoustic wave filter S3 shown in FIG. 3 to the configuration of the surface acoustic wave filter S1 shown in FIG. There is an effect similar to that of the surface acoustic wave filter S3 in terms of moisture resistance.

【0023】図5に示す弾性表面波フィルタS5は、図
1に示す弾性表面波フィルタS1のチップ1の裏面側の
構成を発展させたものであり、圧電基板1aの上面及び
側面を完全に覆う疎水性樹脂層12を厚さ50〜100
μm 程度に設け、さらにこの疎水性樹脂層12上に外来
雑音を遮断する導電性樹脂層11を設け、この導電性樹
脂層11上に疎水性樹脂層12を厚さ150〜500μ
m 度に設けることにより、チップ1の裏面側に直接、導
電性樹脂層11を設けることを防止し、これによりチッ
プ1の主面への導電性樹脂の汚染をより効果的に防止で
きる。なお、チップ1の裏面側における応力緩和のため
には、疎水性樹脂層12にウレタン系の樹脂を使用する
とよい。
The surface acoustic wave filter S5 shown in FIG. 5 is an extension of the configuration of the surface acoustic wave filter S1 shown in FIG. 1 on the back side of the chip 1, and completely covers the top and side surfaces of the piezoelectric substrate 1a. The hydrophobic resin layer 12 has a thickness of 50 to 100.
.mu.m, and a conductive resin layer 11 for blocking external noise is provided on the hydrophobic resin layer 12, and the hydrophobic resin layer 12 is formed on the conductive resin layer 11 to a thickness of 150 to 500 .mu.m.
By providing the conductive resin layer 11 at m degrees, it is possible to prevent the conductive resin layer 11 from being directly provided on the back surface side of the chip 1, and thereby it is possible to more effectively prevent the conductive surface of the chip 1 from being contaminated with the conductive resin. In order to relieve the stress on the back side of the chip 1, it is preferable to use a urethane resin for the hydrophobic resin layer 12.

【0024】図6に示す弾性表面波フィルタS6は、図
5に示す弾性表面波フィルタS5のチップ1の裏面側を
改良したものであり、導電性樹脂層11と疎水性樹脂層
12との間にアルミニウム等の金属薄膜を成膜すること
により、樹脂の透湿性による水分の浸入をさらに良好に
防止させることができる。
The surface acoustic wave filter S6 shown in FIG. 6 is obtained by improving the back side of the chip 1 of the surface acoustic wave filter S5 shown in FIG. By forming a metal thin film of aluminum or the like on the surface, infiltration of moisture due to the moisture permeability of the resin can be more favorably prevented.

【0025】なお、本発明の弾性表面波装置は、上記構
成の弾性表面波フィルタに限定されるものではなく、弾
性表面波共振器等にも適用でき、また、圧電基板と導電
性樹脂層との間、及び/又は導電性樹脂層の上面側に、
金属薄膜及び/又は疎水性樹脂層を配していればよく、
特に構成部材の種類及びチップの裏面(上面)側の層構
成について、本発明の要旨を逸脱しない範囲で適宜変更
実施が可能である。
The surface acoustic wave device of the present invention is not limited to the surface acoustic wave filter having the above-described structure, but can be applied to a surface acoustic wave resonator or the like. Between, and / or on the upper surface side of the conductive resin layer,
It is sufficient that a metal thin film and / or a hydrophobic resin layer are provided,
In particular, the types of the constituent members and the layer configuration on the back (top) side of the chip can be appropriately changed and implemented without departing from the gist of the present invention.

【0026】[0026]

【実施例】図3に示す弾性表面波フィルタS3におい
て、基板として42°回転YカットX方向伝搬のリチウ
ムタンタレート(LiTaO3 )単結晶からなる圧電基
板上に、櫛歯状電極から成る励振電極及びその両側に設
けた反射器電極で構成された弾性表面波共振子の複数を
格子型回路に接続し、これら共振子の接続用共通電極及
びバンプ形成用共通電極を配してなるチップをガラスセ
ラミックスまたはAl2 3 のセラッミク製パッケージ
内にフリップチップボンディングで接続した。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In a surface acoustic wave filter S3 shown in FIG. 3, an excitation electrode composed of a comb-shaped electrode is formed on a piezoelectric substrate composed of a single crystal of lithium tantalate (LiTaO 3 ) propagating in a 42 ° rotated Y-cut X direction as a substrate. A chip formed by connecting a plurality of surface acoustic wave resonators constituted by reflector electrodes provided on both sides thereof to a lattice circuit, and arranging a common electrode for connection of these resonators and a common electrode for bump formation is made of glass. It was connected by flip chip bonding in a ceramic or Al 2 O 3 ceramic package.

【0027】ここで、チップは中心周波数が約900M
Hz帯であり、励振電極の電極指は60対、交差幅15
λ(λ:弾性表面波の波長)、電極の材質は蒸着によっ
て成膜したアルミニウムを用い、その厚みは410nm
とした。また、電極指幅及び電極指間距離はそれぞれ1
μm であった。また、バンプとしてAuを用いた。
Here, the chip has a center frequency of about 900M.
Hz band, 60 pairs of excitation electrodes, 15
λ (λ: wavelength of surface acoustic wave), the material of the electrode is aluminum formed by vapor deposition, and the thickness is 410 nm.
And The electrode finger width and the electrode finger distance are each 1
μm. Au was used as a bump.

【0028】なお、移動体通信端末機等に使用する目的
で、機械的強度に高い信頼性を求められる場合、前述の
アルミニウムの電極膜厚みをバンプ形成用の共通電極部
のみ約1μm 程度に厚く設計する場合もある。
When high reliability is required for mechanical strength for the purpose of use in a mobile communication terminal or the like, the thickness of the above-mentioned aluminum electrode film is increased to about 1 μm only for the common electrode portion for bump formation. It may be designed.

【0029】なおまた、チップとパッケージとの間隔
は、使用する導電性樹脂の粘度によって許容範囲は異な
るが、フリップチップ実装時に使用するダイボンディン
グ装置の機械的位置精度が約300μm 程度である事を
考慮すると、使用する導電性樹脂の粘度は100cp以
上であれば問題が無いため、この実施例では厚さ0.2
mmのシリコーン樹脂を用いた。
Although the allowable distance between the chip and the package differs depending on the viscosity of the conductive resin to be used, the mechanical position accuracy of the die bonding apparatus used at the time of flip chip mounting is about 300 μm. Considering this, there is no problem if the viscosity of the conductive resin used is 100 cp or more.
mm silicone resin was used.

【0030】また、導電性樹脂に分散させる導電性フィ
ラーはAuを用い、その平均粒径を約100μm 程度と
した。また、フィラー間の隙間は最大で100μm 程度
であると考えられ、樹脂の導電性が損なわれない限り、
フィラー間の距離から外来雑音の遮断周波数は、f=3
×108 /(1×10-4×3)=1000(GHz)
(電磁波の速度を3×108 m/秒、遮断周波数を1/
3波長とした)となり、1000GHz以下の周波数の
雑音を遮断することができ、十分に高周波まで遮断特性
を確保できた。
Au was used as the conductive filler dispersed in the conductive resin, and its average particle size was about 100 μm. Also, the gap between the fillers is considered to be about 100 μm at the maximum, and unless the conductivity of the resin is impaired,
From the distance between the fillers, the cutoff frequency of the external noise is f = 3
× 10 8 / (1 × 10 −4 × 3) = 1000 (GHz)
(Electromagnetic wave speed 3 × 10 8 m / sec, cutoff frequency 1 /
(Three wavelengths), so that noise having a frequency of 1000 GHz or less could be cut off, and cutoff characteristics could be sufficiently secured up to high frequencies.

【0031】また、この導電性樹脂層上にアルミニウム
の金属薄膜を蒸着法により0.5μm 程度の厚みにオー
バーコートし、耐湿性を著しく向上させることができ
た。なお、この金属薄膜の厚みは最低0.1μm 程度あ
れば耐湿性を十分に向上させることができる。好適には
0.1〜0.8μm とする。
Further, a thin metal film of aluminum was overcoated on the conductive resin layer to a thickness of about 0.5 μm by a vapor deposition method, so that the moisture resistance could be remarkably improved. If the thickness of the metal thin film is at least about 0.1 μm, the moisture resistance can be sufficiently improved. Preferably, the thickness is 0.1 to 0.8 μm.

【0032】[0032]

【発明の効果】本発明の弾性表面波装置によれば、導電
性樹脂層をパッケージの内外に形成した接地用導体パタ
ーンに接続するようにしたので、チップの裏面より飛び
込んで来る所定波長以上の電磁波を遮断することがで
き、外来雑音の影響のない特性の良好な弾性表面波装置
を提供することができる。
According to the surface acoustic wave device of the present invention, the conductive resin layer is connected to the grounding conductor pattern formed inside and outside the package. It is possible to provide a surface acoustic wave device that can block electromagnetic waves and has good characteristics without the influence of external noise.

【0033】また、圧電基板と導電性樹脂層の間、及び
/又は導電性樹脂層の上面側に、金属薄膜及び/又は疎
水性樹脂層を設けたので、特に硬化後にポーラスとなり
やすい導電性樹脂層を通じて入ってくる水分を極力遮断
することができ、耐湿性に優れ信頼性の高い弾性表面波
装置を提供することができる。
In addition, since a metal thin film and / or a hydrophobic resin layer are provided between the piezoelectric substrate and the conductive resin layer and / or on the upper surface side of the conductive resin layer, the conductive resin is particularly likely to become porous after curing. Moisture entering through the layer can be cut off as much as possible, and a highly reliable surface acoustic wave device having excellent moisture resistance can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る弾性表面波装置の一実施形態を説
明する断面図である。
FIG. 1 is a cross-sectional view illustrating one embodiment of a surface acoustic wave device according to the present invention.

【図2】本発明に係る弾性表面波装置の他の実施形態を
説明する断面図である。
FIG. 2 is a sectional view illustrating another embodiment of the surface acoustic wave device according to the present invention.

【図3】本発明に係る弾性表面波装置の他の実施形態を
説明する断面図である。
FIG. 3 is a cross-sectional view illustrating another embodiment of the surface acoustic wave device according to the present invention.

【図4】本発明に係る弾性表面波装置の他の実施形態を
説明する断面図である。
FIG. 4 is a sectional view illustrating another embodiment of the surface acoustic wave device according to the present invention.

【図5】本発明に係る弾性表面波装置の他の実施形態を
説明する断面図である。
FIG. 5 is a cross-sectional view illustrating another embodiment of the surface acoustic wave device according to the present invention.

【図6】本発明に係る弾性表面波装置の他の実施形態を
説明する断面図である。
FIG. 6 is a cross-sectional view illustrating another embodiment of the surface acoustic wave device according to the present invention.

【図7】従来のフリップチップ実装が施された弾性表面
波装置の一例を説明する断面図である。
FIG. 7 is a cross-sectional view illustrating an example of a conventional surface acoustic wave device on which flip chip mounting is performed.

【図8】従来のフリップチップ実装が施された弾性表面
波装置の一例を説明する断面図である。
FIG. 8 is a cross-sectional view illustrating an example of a conventional surface acoustic wave device on which flip chip mounting is performed.

【図9】従来のフリップチップ実装が施された弾性表面
波装置の一例を説明する断面図である。
FIG. 9 is a cross-sectional view illustrating an example of a conventional surface acoustic wave device on which flip chip mounting is performed.

【符号の説明】[Explanation of symbols]

1:チップ(弾性表面波素子) 1a:圧電基板 1b:駆動電極 2:ボンディング用電極 3:バンプ 5:パッケージ 5a:基体 5b,5c:積層部材 6:バンプ接合用導電性接着剤 7:信号用電極 8:接地用電極(接地用導体パターン) 9:フリップチップ接合用電極、 11:導電性樹脂層 12:疎水性樹脂層 13:金属薄膜 S1〜S6:弾性表面波装置 1: chip (surface acoustic wave element) 1a: piezoelectric substrate 1b: drive electrode 2: bonding electrode 3: bump 5: package 5a: substrate 5b, 5c: laminated member 6: conductive adhesive for bump bonding 7: signal Electrode 8: Grounding electrode (grounding conductor pattern) 9: Flip chip bonding electrode 11: Conductive resin layer 12: Hydrophobic resin layer 13: Metal thin film S1 to S6: Surface acoustic wave device

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 圧電基板の下面に弾性表面波を発生させ
る励振電極を設けて成る弾性表面波素子をパッケージ内
に収容した弾性表面波装置であって、前記圧電基板の上
面側に所定周波数以下の電磁波を遮断する導電性樹脂層
を形成するとともに、該導電性樹脂層を前記パッケージ
に形成した接地用導体パターンに接続させたことを特徴
とする弾性表面波装置。
1. A surface acoustic wave device in which a surface acoustic wave element comprising an excitation electrode for generating a surface acoustic wave is provided on a lower surface of a piezoelectric substrate and housed in a package. A surface acoustic wave device, wherein a conductive resin layer for blocking electromagnetic waves is formed, and the conductive resin layer is connected to a grounding conductor pattern formed on the package.
【請求項2】 前記圧電基板と前記導電性樹脂層との
間、及び/又は前記導電性樹脂層の上面側に、金属薄膜
及び/又は疎水性樹脂層を配したことを特徴とする請求
項1に記載の弾性表面波装置。
2. A metal thin film and / or a hydrophobic resin layer is disposed between the piezoelectric substrate and the conductive resin layer and / or on the upper surface side of the conductive resin layer. 2. The surface acoustic wave device according to 1.
JP01709698A 1998-01-29 1998-01-29 Surface acoustic wave device Expired - Fee Related JP3439975B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP01709698A JP3439975B2 (en) 1998-01-29 1998-01-29 Surface acoustic wave device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP01709698A JP3439975B2 (en) 1998-01-29 1998-01-29 Surface acoustic wave device

Publications (2)

Publication Number Publication Date
JPH11214955A true JPH11214955A (en) 1999-08-06
JP3439975B2 JP3439975B2 (en) 2003-08-25

Family

ID=11934483

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Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003174344A (en) * 2001-12-07 2003-06-20 Samsung Electro Mech Co Ltd Method for manufacturing surface acoustic wave filter package
WO2003084061A1 (en) * 2002-03-29 2003-10-09 Fujitsu Media Devices Limited Mounting method of surface acoustic wave element and surface acoustic wave device having resin-sealed surface acoustic wave element
KR20040015688A (en) * 2002-08-13 2004-02-19 후지쓰 메디아 데바이스 가부시키가이샤 Acoustic wave device and method of producing the same
JP2005252335A (en) * 2004-03-01 2005-09-15 Matsushita Electric Ind Co Ltd Integrated circuit device and manufacturing method thereof
WO2007038022A3 (en) * 2005-09-28 2007-10-25 Honeywell Int Inc Reduced stress on saw die with surrounding support structures
JP2009088908A (en) * 2007-09-28 2009-04-23 Murata Mfg Co Ltd Elastic wave device
US7528522B2 (en) 2003-07-07 2009-05-05 Fujitsu Media Devices Limited Surface acoustic wave device, package for the device, and method of fabricating the device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19548062A1 (en) 1995-12-21 1997-06-26 Siemens Matsushita Components Electrical component, in particular component working with surface acoustic waves - SAW component - and a method for its production

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003174344A (en) * 2001-12-07 2003-06-20 Samsung Electro Mech Co Ltd Method for manufacturing surface acoustic wave filter package
WO2003084061A1 (en) * 2002-03-29 2003-10-09 Fujitsu Media Devices Limited Mounting method of surface acoustic wave element and surface acoustic wave device having resin-sealed surface acoustic wave element
US7239068B2 (en) 2002-03-29 2007-07-03 Fujitsu Media Devices Limited Method for mounting surface acoustic wave element and surface acoustic wave device having resin-sealed surface acoustic wave element
KR20040015688A (en) * 2002-08-13 2004-02-19 후지쓰 메디아 데바이스 가부시키가이샤 Acoustic wave device and method of producing the same
US7528522B2 (en) 2003-07-07 2009-05-05 Fujitsu Media Devices Limited Surface acoustic wave device, package for the device, and method of fabricating the device
JP2005252335A (en) * 2004-03-01 2005-09-15 Matsushita Electric Ind Co Ltd Integrated circuit device and manufacturing method thereof
WO2007038022A3 (en) * 2005-09-28 2007-10-25 Honeywell Int Inc Reduced stress on saw die with surrounding support structures
JP2009088908A (en) * 2007-09-28 2009-04-23 Murata Mfg Co Ltd Elastic wave device

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