JPH11297933A - Semiconductor device for driving display body - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor device for driving a display body which allows inspection/measurement with ease in a short time. SOLUTION: A function circuit 2 for main circuit operation of a semiconductor device 8 for driving a display body, an input terminal 5 for controlling toe function circuit 2, an output terminal 10, an output circuit 4, a first power- source terminal 20 which supplies a first voltage to the output circuit 4, a second power-source terminal 22 which supplies a second voltage to the output circuit 4, an inspection circuit 16, an inspection control terminal 18 for controlling the inspection circuit 16, a third power-source terminal 26 for inspection, and a resistance element 24 for inspection, are provided.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device for driving a display element used for driving a display element typified by a liquid crystal display panel, and more particularly to a semiconductor device for driving a display element having an inspection circuit for simplifying inspection measurement. The present invention relates to a semiconductor device.

[0002]

2. Description of the Related Art Most semiconductor devices including a semiconductor device for driving a display body have a needle stand (hereinafter referred to as a stylus) for electrically connecting all input / output terminals to an external measuring device. Go and inspect and measure.

The input / output terminals of these semiconductor devices require a large-area pad for touching, and the terminals are widened so that the needles touching the input / output terminals do not contact each other. There is a need.

[0004] Due to the above factors, in a display driving semiconductor device in which a large number of input / output terminals are integrated, the input / output terminals cannot be highly integrated and the semiconductor device becomes large. There is a problem in that the number of input / output terminals that can be integrated in the apparatus is significantly limited due to the restriction on the needle stand inspection.

In order to solve this problem, as a prior art, there has been proposed a display driving semiconductor device shown in FIG. 2 which can be inspected and measured without touching most output terminals by providing an inspection circuit. .

FIG. 2 is a block diagram showing a conventional semiconductor device for driving a display provided with an inspection circuit. The configuration of a display-device-driving semiconductor device provided with an inspection circuit in a conventional example will be described below with reference to FIG.

In FIG. 2, the display driving semiconductor device 8 is a functional circuit 2 that performs the main circuit operation of the display driving semiconductor device 8.
And an input terminal 6 for inputting a signal for controlling a circuit operation of the functional circuit 2, an output terminal 10, an output circuit 4, and a first power supply terminal 20 for supplying a first voltage to the output circuit 4.
And a second power supply terminal 2 for supplying a second voltage to the output circuit.
2 and output terminals 10a, 10b,.
an inspection circuit 16 for forcibly short-circuiting n, and an inspection control terminal 1 for inputting a signal for controlling the inspection circuit 16.
8.

Next, a method of inspecting and measuring a display device driving semiconductor device having an inspection circuit according to a conventional example will be described with reference to FIG.

The inspection and measurement method described below is the first method.
And the second measurement technique, and the order does not matter, but both measurement techniques must be performed. Hereinafter, the first measurement method and the second measurement method will be sequentially described.

First, a first measurement technique will be described.

First, the first power terminal 20, the second power terminal 22, the input terminal 6, and the inspection control terminal 18 are stapled, and the output terminals 10a, 10b,.
In this case, only one output terminal 10a is touched.

Subsequently, a first voltage is supplied to the first power supply terminal 20 and a second voltage is supplied to the second power supply terminal 22.

Next, output terminals 10a, 10b,.
10n inputs an input signal that outputs the first voltage to the input terminal 6, operates the functional circuit 2, controls the output circuit 4, and outputs the first signal to the output terminals 10a, 10b,. Output voltage.

Here, the output terminals 10a, 10b,.
The voltage value of the output terminal 10a touching only one of the 10n is measured to check whether the first voltage is correctly output.

Next, a signal is input to the inspection control terminal 18 to turn on all the switching elements of the inspection circuit 16, and the inspection circuit 16 outputs the output terminals 10a, 10b,.
Short circuit.

At this time, if the display driving semiconductor device 8 is a non-defective product, the voltage values of the output terminals 10a, 10b,..., 10n are the same, so that the output terminals 10a, 10b,.
· Even if 10n is short-circuited by the inspection circuit 16, no current flows between the output terminals.

If the output terminals 10a, 10b,.
0n, if there is at least one output terminal that does not have the expected voltage value, the output terminal that does not have the expected voltage value and another output terminal that has the expected voltage value do not A short-circuit current flows between them. Therefore,
If a short-circuit current flows, it can be determined that the display driving semiconductor device 8 has some defect.

The presence or absence of the short-circuit current is determined by the first power supply terminal 2
0, an ammeter is inserted between a power supply device (not shown) for supplying a first voltage from outside the display driving semiconductor device 8 and the first power supply terminal 20, or a second power supply terminal 22
The current can be measured by inserting an ammeter between a power supply device (not shown) for supplying a second voltage from outside of the display driving semiconductor device 8 and the second power supply terminal 22.

If the short-circuit current does not flow, output terminal 1
, 10n output the same voltage value, and the output terminal 10a was contacted with a stylus to confirm that the voltage value was the first voltage. After all, it can be confirmed that all of the output terminals 10a, 10b,..., 10n output the first voltage correctly.

In the above measurement, the output terminals 10a, 10b,
,..., 10n were output with the first voltage, but this time, the output terminals 10a, 10b,.
The same measurement is performed by outputting the second voltage to all of n.

Further, output terminals 10a, 10b,.
., 10n output the first voltage or output terminals 10a, 10b,..., 10n output the second voltage according to the input signal. If there are a plurality of ways, the measurement described above is repeated for all of the ways in which the functional circuit 2 operates.

By performing the first measuring method as described above,
.., 10n, and whether all the operation functions of the functional circuit 2 are good or not, and control of all the switch elements of the output circuit 4 to the off state. Whether or not there is a leak failure in the off state, and further, that there is no short circuit failure between the wiring supplying the first voltage and the wiring supplying the second voltage inside the display driving semiconductor device 8. The inspection can be confirmed.

The first measurement method is assumed to be normal, that is, all the switch elements constituting the output circuit 16 and all the switch elements constituting the output circuit 4 are turned on. Whether the control is possible, whether the conduction characteristics in the ON state are good or not, and other defects of the display driving semiconductor device that cannot be checked and checked by the first measuring method can be checked and checked by the second measuring method.

Hereinafter, the second measuring method will be described.

First, a stylus is touched to the same terminal as the stylus used in the first measurement method. In the second measuring method, the output terminal 10a
It is not necessary to touch the output terminal 10a, but in this case, the output terminal 10a is also touched in order to share the stylus jig with the first measurement method.

Subsequently, a first voltage is supplied to the first power supply terminal 20, and a second voltage is supplied to the second power supply terminal 22.

Next, the output terminals 10a, 10b,.
10n, a signal is input to the input terminal 6 so that only the output terminal 10a outputs the first voltage, and all the other output terminals output the second voltage. Control.

In this state, a signal is input to the inspection control terminal 18 to turn on all the switching elements of the inspection circuit 16, and the inspection circuit 16 outputs the output terminals 10a, 10b,.
Short-circuit 10n.

At this time, when the display driving semiconductor device 8 is normal, a short-circuit current flows between the output terminal 10a and all the other output terminals.

The presence or absence of the short-circuit current is determined by the first power supply terminal 2
0, an ammeter is inserted between a power supply device (not shown) for supplying a first voltage from outside the display driving semiconductor device 8 and the first power supply terminal 20, or a second power supply terminal 22
The current can be measured by inserting an ammeter between a power supply device (not shown) for supplying a second voltage from outside of the display driving semiconductor device 8 and the second power supply terminal 22.

If the short-circuit current value obtained by the above measurement is an expected value, the functional circuit 2 functions normally as intended, and the switching elements 11a and 15a connected to the output terminal 10a are turned on. Operation and element characteristics are normal, and the first element from the first power supply terminal to the switch element 11a is
It can be confirmed that there is no disconnection failure in the wiring path of the voltage of.

In the above measurement, the output terminals for exclusively outputting the first voltage are sequentially changed one by one from the output terminal 10a to the output terminals 10b, 10c,..., 10n, and the same measurement is repeated. As a result, 10b, 10
, 10n connected to the respective terminals of the switch elements 11b, 11c,.
.., 15n, and on the wiring path of the first voltage from the first power supply terminal to each of the switch elements 11b, 11c,. Confirm that there is no disconnection failure. As described above, the second voltage is output to the output terminals other than the output terminal that outputs the first voltage.

Further, this time, the relationship between the first voltage and the second voltage in the above measurement is exchanged, and the second voltage is output exclusively to one specific output terminal, and the other output terminals are output. By performing all the measurements described so far in such a manner as to output the first voltage, 10a, 10b,.
・ Switch element 13 connected to each terminal of 10n
, 13n and switch elements 15a, 1
, 15n, and the switching characteristics of the switching element 1 from the second power supply terminal.
It is confirmed that there is no disconnection failure in the wiring path of the second voltage reaching each of 3a, 13b,..., 13n.

Finally, after inputting a signal to the inspection control terminal to turn off all the switching elements in the inspection circuit 16,
Output terminal 1 as in the beginning of the second measurement method.
.., 10n, the first voltage is sequentially and exclusively output, and the second voltage is output to all the other output terminals. Is measured. In this measurement, if the short-circuit current does not flow, all the switching elements in the inspection circuit 16 can be controlled to be correctly turned off as controlled, and the inspection can be confirmed that there is no leak failure in the off state.

By performing the second measuring method as described above,
.., 10n connected to each of the output terminals 4a, 10b,..., 10n. Control of the elements to ON and the quality of the element characteristics in the ON state, the fact that the switch elements constituting the inspection circuit 16 can be controlled correctly, and the element characteristics in the ON state and the OFF state are normal, and the output circuit 4 That there is no disconnection failure of the wiring between the
It is possible to inspect and confirm that there is no disconnection failure in the wiring from each of the first power supply terminal and the second power supply terminal to the output circuit.

By performing both of the above-described first and second measurement techniques, almost all output terminals can be connected to the conventional display driving semiconductor device 8 shown in FIG. Inspection and measurement can be performed without touching the probe.

[0037]

In the inspection measurement for the conventional example shown in FIG. 2, the following complicated procedure is required to perform one current measurement and to judge the quality of the measured value.

That is, an input signal is supplied to the input terminal 6 to operate the functional circuit 2 and the output circuit 10 as desired.
Next, a signal is given to the test control terminal 18 to
Is operated to short-circuit all of the output terminals 10, and then the current value is measured, and the measured current value is compared with the expected current value to determine pass / fail.

As described above, a complicated procedure is required, so that current measurement cannot be performed quickly every time. In addition, the above-described current measurement needs to be performed for the number of times corresponding to all of the operation functions of the functional circuit 2 and the resulting operation of the output circuit 4. In practice, a very large number of current measurements are required.

As described above, the conventional display device driving semiconductor device shown in FIG. 2 has a serious problem that the inspection and measurement take an extremely long time.

In order to reduce the inspection time as much as possible,
There is also a problem that it is necessary to perform high-speed and high-accuracy current measurement, and that an extremely expensive measuring device must be used.

An object of the present invention is to solve the above-mentioned problems and to provide a display-driving semiconductor device capable of performing inspection and measurement easily and in a short time.

[0043]

A functional circuit for performing main circuit operations of a semiconductor device for driving a display, an input terminal for controlling the functional circuit, an output terminal, an output circuit, and an output circuit include a first circuit. A first power supply terminal for supplying a second voltage to the output circuit; a second power supply terminal for supplying a second voltage to the output circuit;
A semiconductor device for driving a display body includes an inspection control terminal for controlling the inspection circuit, a third power supply terminal for inspection, and a resistance element for inspection.

[0044]

Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 is a block diagram showing a display driving semiconductor device according to an embodiment of the present invention. First,
The configuration of the display driving semiconductor device according to the embodiment of the present invention will be described with reference to FIG.

In FIG. 1, the display driving semiconductor device 8 is a functional circuit 2 that performs the main circuit operation of the display driving semiconductor device 8.
And an input terminal 6 for inputting a signal for controlling a circuit operation of the functional circuit 2, an output terminal 10, an output circuit 4, and a first circuit for supplying a first voltage to the output circuit 4 at times other than inspection and measurement. Power supply terminal 20, a second power supply terminal 22 for supplying a second voltage to the output circuit 4, and output terminals 10a, 1
, 10n, a control terminal 18 for inputting a signal for controlling the test circuit 16, a resistive element 24 for test, Sometimes the third voltage that supplies the first voltage to the output circuit 4
And the power supply terminal 26 of FIG.

Next, a description will be given of an inspection and measurement method for the display device driving semiconductor device shown in FIG. 1 according to the present invention.

The inspection and measurement method described below is the first method.
And the second measurement technique, and the order does not matter, but both measurement techniques must be performed. Hereinafter, the first measurement method and the second measurement method will be sequentially described.

First, the first measuring method will be described. First, the third power supply terminal 26, the second power supply terminal 22, the input terminal 6, and the inspection control terminal 18 are touched, and one of the output terminals 10a, 10b,. Here, only the output terminal 10a is touched.

Subsequently, a first voltage is supplied to the third power supply terminal 26 and a second voltage of the second power supply terminal 22 is supplied.

Next, the output terminals 10a, 10b,.
10n inputs an input signal that outputs the first voltage to the input terminal 6, operates the functional circuit 2, controls the output circuit 4, and outputs the first signal to the output terminals 10a, 10b,. Output voltage.

Here, the output terminals 10a, 10b,.
The voltage value of the output terminal 10a touching only one of the 10n is measured to check whether the first voltage is correctly output.

Next, a signal is input to the inspection control terminal 18 to turn on all the switching elements of the inspection circuit 16, and the inspection circuit 16 outputs the output terminals 10a, 10b,.
Short circuit.

At this time, if the display driving semiconductor device 8 is a non-defective product, the voltage values of the output terminals 10a, 10b,..., 10n are the same, so that the output terminals 10a, 10b,.
· Even if 10n is short-circuited by the inspection circuit 16, no current flows between the output terminals.

If the output terminals 10a, 10b,.
0n, if there is at least one output terminal that does not have the expected voltage value, the output terminal that does not have the expected voltage value and another output terminal that has the expected voltage value do not A short-circuit current flows between them. Therefore,
If a short-circuit current flows, it can be determined that the display driving semiconductor device 8 has some defect.

Conversely, if the short-circuit current does not flow, it can be understood that the output terminals 10a, 10b,..., 10n output the same voltage value, and the output terminal 10a is stapled to change the voltage value. Since the first voltage has been confirmed, it can be confirmed that all of the output terminals 10a, 10b,..., 10n output the first voltage correctly.

Since the short-circuit current flows through the third power supply terminal 26, the resistance element 24, and the second power supply terminal 22, the presence or absence of the short-circuit current and the value of the short-circuit current depend on the resistance value and the short-circuit current value of the resistance element 24. The potential difference generated between both ends of the resistance element 24 in response to the first power terminal 20 and the third power terminal 26
The inspection can be confirmed by measuring the potential difference between the terminals.

In the above measurement, the output terminals 10a, 10b,
,..., 10n were output with the first voltage, but this time, the output terminals 10a, 10b,.
The same measurement is performed by outputting the second voltage to all of n.

Further, output terminals 10a, 10b,.
., 10n output the first voltage or output terminals 10a, 10b,..., 10n output the second voltage according to the input signal. If there are a plurality of ways, the measurement described above is repeated for all of the ways in which the functional circuit 2 operates.

By performing the first measuring method as described above,
.., 10n, and whether all the operation functions of the functional circuit 2 are good or not, and control of all the switch elements of the output circuit 4 to the off state. Whether or not there is a leak failure in the off state, and further, that there is no short circuit failure between the wiring supplying the first voltage and the wiring supplying the second voltage inside the display driving semiconductor device 8. The inspection can be confirmed.

It is to be noted that the first measurement method is assumed to be normal, that is, all the switch elements constituting the output circuit 16 and all the switch elements constituting the output circuit 4 are turned on. Whether the control is possible, whether the conduction characteristics in the ON state are good or not, and other defects of the display driving semiconductor device that cannot be checked and checked by the first measuring method can be checked and checked by the second measuring method.

Hereinafter, the second measurement technique will be described.

First, a stylus is touched to the same terminal as the stylus used in the first measuring method. In the second measuring method, the output terminal 10a
It is not necessary to touch the output terminal 10a, but in this case, the output terminal 10a is also touched in order to share the stylus jig with the first measurement method.

Next, the output terminals 10a, 10b,.
10n, a signal is input to the input terminal 6 so that only the output terminal 10a outputs the first voltage, and all the other output terminals output the second voltage. Control.

In this state, a signal is input to the inspection control terminal 18 to turn on all the switching elements of the inspection circuit 16, and the inspection circuit 16 outputs the output terminals 10a, 10b,.
Short-circuit 10n.

At this time, if the display driving semiconductor device 8 is normal, a short-circuit current flows between the output terminal 10a and all the other output terminals.

Since the short-circuit current flows through the third power supply terminal 26, the resistance element 24, and the second power supply terminal 22, the presence or absence of the short-circuit current and the value of the short-circuit current depend on the resistance value and the short-circuit current value of the resistance element 24. Inspection can be confirmed by measuring a potential difference generated between both ends of the resistance element 24 as a potential difference between the first power supply terminal 20 and the third power supply terminal 26 in response.

If the potential difference obtained by the above measurement is an expected value, the short-circuit current value is normal and the function circuit 2
Functions normally as intended, the switching element 11a and the switching element 15a connected to the output terminal 10a turn on and the element characteristics are normal, and the first element from the first power supply terminal to the switching element 11a It can be confirmed that there is no disconnection failure in the voltage wiring path.

In the above measurement, the output terminals for exclusively outputting the first voltage are sequentially changed one by one from the output terminal 10a to the output terminals 10b, 10c,..., 10n, and the same measurement is repeated. As a result, 10b, 10
, 10n connected to the respective terminals of the switch elements 11b, 11c,.
, 15n, and the on-state operations and element characteristics of all of the switching elements 11b, 11c,..., 11n from the first power supply terminal. Confirm that there is no disconnection failure. As described above, the second voltage is output to the output terminals other than the output terminal that outputs the first voltage.

Further, this time, the relationship between the first voltage and the second voltage in the above measurement is exchanged, and the second voltage is output exclusively to one specific output terminal, and the other output terminals are output. By performing all the measurements described so far in such a manner as to output the first voltage, 10a, 10b,.
・ Switch element 13 connected to each terminal of 10n
, 13n and switch elements 15a, 1
, 15n, and the switching characteristics of the switching element 1 from the second power supply terminal.
It is confirmed that there is no disconnection failure in the wiring path of the second voltage reaching each of 3a, 13b,..., 13n.

Finally, after inputting a signal to the inspection control terminal to turn off all the switching elements in the inspection circuit 16,
Output terminal 1 as in the beginning of the second measurement method.
0n, 10a,..., And 10n, the first voltage is sequentially and exclusively output, and the second voltage is output to all the other output terminals. The presence or absence is determined by measuring a potential difference between the third power supply terminal 26 and the second power supply terminal 22. If it is determined in this measurement that the short-circuit current does not flow, all the switch elements in the inspection circuit 16 can be controlled to be correctly turned off as controlled, and the inspection can be confirmed that there is no leak defect in the off state.

By performing the second measuring method as described above,
.., 10n connected to each of the output terminals 4a, 10b,..., 10n. Control of the elements to ON and the quality of the element characteristics in the ON state, the fact that the switch elements forming the inspection circuit 16 can be controlled correctly, and the element characteristics in the ON state and the OFF state are normal, and the output circuit 4 That there is no disconnection failure of the wiring between the
It is possible to inspect and confirm that there is no disconnection failure in the wiring from each of the first power supply terminal and the second power supply terminal to the output circuit.

By performing both of the first measuring method and the second measuring method described above, most output terminals can be connected to the display driving semiconductor device 8 of the present invention shown in FIG. On the other hand, it is possible to perform the inspection measurement without touching the stylus and without performing the time-consuming and time-consuming current measurement.

Since the current measurement is unnecessary, the control of the functional circuit 2 and the output circuit 4 by the above-mentioned series of signal inputs, the measurement of the potential difference, and the judgment of the quality are all performed by the operation of the input pattern generator (not shown). Can be performed as a continuous inspection and measurement operation at high speed and without interruption.

That is, the current measurement was carried out by performing a very large number of current measurements in the conventional example shown in FIG. 2 by using a functional test method and apparatus capable of performing inspection measurement at high speed in synchronization with the operation of the pattern generator. It is possible to make an inspection measurement equivalent to the above.

For this reason, by employing the configuration of the display device driving semiconductor device of the present invention, the problem that the inspection and measurement, which is a problem of the conventional display device driving semiconductor device, takes an extremely long time is solved. Is done.

As described above, the switch elements used in the present embodiment can be all constituted by transistor elements, and can therefore be formed in a display device driving semiconductor device. Further, a resistance element which is one element of the configuration of the display driving semiconductor device according to the present invention can be formed in the display driving semiconductor device as a semiconductor element.

[0077]

As described above, the inspection and measurement of the display driving semiconductor device can be performed easily and within a short time, so that the labor and time required for the inspection and measurement of the display driving semiconductor device can be greatly reduced. .

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a display driving semiconductor device of the present invention.

FIG. 2 is a block diagram showing a configuration of a display driving semiconductor device including an inspection circuit according to a conventional technique.

[Explanation of symbols]

 2 Functional Circuit 4 Output Circuit 6 Input Terminal 8 Display Device Driving Semiconductor Device 10 Output Terminal 16 Inspection Circuit 18 Inspection Control Terminal 20 First Power Terminal 22 Second Power Terminal 24 Resistance Element 26 Third Power Terminal

Claims (1)

[Claims] A first circuit for supplying a first voltage to a function circuit for performing a main circuit operation of the display device driving semiconductor device, an input terminal for controlling the function circuit, an output terminal, an output circuit, and the output circuit; A first power supply terminal, a second power supply terminal for supplying a second voltage to the output circuit, an inspection circuit, an inspection control terminal for controlling the inspection circuit, and a third power supply terminal for inspection And a resistance element for inspection.