JPS4893276A - - Google Patents
Info
- Publication number
- JPS4893276A JPS4893276A JP48015482A JP1548273A JPS4893276A JP S4893276 A JPS4893276 A JP S4893276A JP 48015482 A JP48015482 A JP 48015482A JP 1548273 A JP1548273 A JP 1548273A JP S4893276 A JPS4893276 A JP S4893276A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6324—Formation by anodic treatments, e.g. anodic oxidation
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6938—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides
- H10P14/6939—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal
- H10P14/69391—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal the material containing aluminium, e.g. Al2O3
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/049—Equivalence and options
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/053—Field effect transistors fets
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/106—Masks, special
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/118—Oxide films
Landscapes
- Electrodes Of Semiconductors (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US22479672A | 1972-02-09 | 1972-02-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4893276A true JPS4893276A (ja) | 1973-12-03 |
| JPS5147587B2 JPS5147587B2 (ja) | 1976-12-15 |
Family
ID=22842251
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48015482A Expired JPS5147587B2 (ja) | 1972-02-09 | 1973-02-07 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3775262A (ja) |
| JP (1) | JPS5147587B2 (ja) |
| DE (1) | DE2303574B2 (ja) |
| FR (1) | FR2171219B1 (ja) |
| GB (1) | GB1351923A (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5384460A (en) * | 1976-12-29 | 1978-07-25 | Fujitsu Ltd | Munufacture of semiconductor device |
| JPS54164193A (en) * | 1978-03-23 | 1979-12-27 | Olsson Kjell I | Method and device for measuring surface tension |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3987538A (en) * | 1973-12-26 | 1976-10-26 | Texas Instruments Incorporated | Method of making devices having closely spaced electrodes |
| US3929529A (en) * | 1974-12-09 | 1975-12-30 | Ibm | Method for gettering contaminants in monocrystalline silicon |
| US4157610A (en) * | 1976-12-20 | 1979-06-12 | Tokyo Shibaura Electric Co., Ltd. | Method of manufacturing a field effect transistor |
| US4136434A (en) * | 1977-06-10 | 1979-01-30 | Bell Telephone Laboratories, Incorporated | Fabrication of small contact openings in large-scale-integrated devices |
| JPS5812365A (ja) * | 1981-07-15 | 1983-01-24 | Japan Electronic Ind Dev Assoc<Jeida> | 薄膜トランジスタ及びその製造方法 |
| JPS5844033A (ja) * | 1981-09-11 | 1983-03-14 | 富士写真光機株式会社 | 内視鏡用アダプタ−型処置具導入装置 |
| DE3229205A1 (de) * | 1982-08-05 | 1984-02-09 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Halbleiterbauelement und ein verfahren zu dessen herstellung |
| JPS6142140A (ja) * | 1984-07-30 | 1986-02-28 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 自己整合構造の形成方法 |
| US5289030A (en) | 1991-03-06 | 1994-02-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device with oxide layer |
| JP2794678B2 (ja) * | 1991-08-26 | 1998-09-10 | 株式会社 半導体エネルギー研究所 | 絶縁ゲイト型半導体装置およびその作製方法 |
| USRE36314E (en) * | 1991-03-06 | 1999-09-28 | Semiconductor Energy Laboratory Co., Ltd. | Insulated gate field effect semiconductor devices having a LDD region and an anodic oxide film of a gate electrode |
| JP2717237B2 (ja) | 1991-05-16 | 1998-02-18 | 株式会社 半導体エネルギー研究所 | 絶縁ゲイト型半導体装置およびその作製方法 |
| US5650338A (en) * | 1991-08-26 | 1997-07-22 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming thin film transistor |
| US6624450B1 (en) | 1992-03-27 | 2003-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for forming the same |
| US5576225A (en) * | 1992-05-09 | 1996-11-19 | Semiconductor Energy Laboratory Co., Ltd. | Method of forming electric circuit using anodic oxidation |
| US5441618A (en) * | 1992-11-10 | 1995-08-15 | Casio Computer Co., Ltd. | Anodizing apparatus and an anodizing method |
| TW297142B (ja) | 1993-09-20 | 1997-02-01 | Handotai Energy Kenkyusho Kk | |
| TW299897U (en) | 1993-11-05 | 1997-03-01 | Semiconductor Energy Lab | A semiconductor integrated circuit |
| US5798281A (en) * | 1995-11-08 | 1998-08-25 | Texas Instruments Incorporated | Method for stressing oxide in MOS devices during fabrication using first and second opposite potentials |
| US5780347A (en) * | 1996-05-20 | 1998-07-14 | Kapoor; Ashok K. | Method of forming polysilicon local interconnects |
| US6370502B1 (en) * | 1999-05-27 | 2002-04-09 | America Online, Inc. | Method and system for reduction of quantization-induced block-discontinuities and general purpose audio codec |
| KR100358056B1 (ko) * | 1999-12-27 | 2002-10-25 | 주식회사 하이닉스반도체 | 반도체 소자의 게이트 산화막 형성방법 |
| US7060622B2 (en) * | 2002-09-27 | 2006-06-13 | Oki Electric Industry Co., Ltd. | Method of forming dummy wafer |
| US20120132529A1 (en) * | 2010-11-30 | 2012-05-31 | Katholieke Universiteit Leuven, K.U.Leuven R&D | Method for precisely controlled masked anodization |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3351825A (en) * | 1964-12-21 | 1967-11-07 | Solitron Devices | Semiconductor device having an anodized protective film thereon and method of manufacturing same |
| DE1919563A1 (de) * | 1969-04-17 | 1970-10-29 | Siemens Ag | Verfahren zum Herstellen von mit Gallium diffundierten Zonen in Halbleiterkristallen |
| US3634203A (en) * | 1969-07-22 | 1972-01-11 | Texas Instruments Inc | Thin film metallization processes for microcircuits |
| JPS4939873B1 (ja) * | 1969-10-15 | 1974-10-29 |
-
1972
- 1972-02-09 US US00224796A patent/US3775262A/en not_active Expired - Lifetime
-
1973
- 1973-01-25 DE DE19732303574 patent/DE2303574B2/de not_active Withdrawn
- 1973-01-29 GB GB438473A patent/GB1351923A/en not_active Expired
- 1973-02-07 JP JP48015482A patent/JPS5147587B2/ja not_active Expired
- 1973-02-07 FR FR7304240A patent/FR2171219B1/fr not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5384460A (en) * | 1976-12-29 | 1978-07-25 | Fujitsu Ltd | Munufacture of semiconductor device |
| JPS54164193A (en) * | 1978-03-23 | 1979-12-27 | Olsson Kjell I | Method and device for measuring surface tension |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2303574B2 (de) | 1976-07-29 |
| GB1351923A (en) | 1974-05-15 |
| DE2303574A1 (de) | 1973-08-23 |
| FR2171219B1 (ja) | 1978-02-10 |
| FR2171219A1 (ja) | 1973-09-21 |
| US3775262A (en) | 1973-11-27 |
| JPS5147587B2 (ja) | 1976-12-15 |